CN104614937B - 压印设备 - Google Patents

压印设备 Download PDF

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Publication number
CN104614937B
CN104614937B CN201510101359.2A CN201510101359A CN104614937B CN 104614937 B CN104614937 B CN 104614937B CN 201510101359 A CN201510101359 A CN 201510101359A CN 104614937 B CN104614937 B CN 104614937B
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CN
China
Prior art keywords
light
optical system
substrate
mould
label
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201510101359.2A
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English (en)
Chinese (zh)
Other versions
CN104614937A (zh
Inventor
前田普教
三浦圣也
三岛和彦
箕田贤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
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Canon Inc
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Application filed by Canon Inc filed Critical Canon Inc
Publication of CN104614937A publication Critical patent/CN104614937A/zh
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Publication of CN104614937B publication Critical patent/CN104614937B/zh
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Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G03F9/7003Alignment type or strategy, e.g. leveling, global alignment
    • G03F9/7042Alignment for lithographic apparatus using patterning methods other than those involving the exposure to radiation, e.g. by stamping or imprinting
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y40/00Manufacture or treatment of nanostructures
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0002Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F9/00Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
    • G03F9/70Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
    • G03F9/7088Alignment mark detection, e.g. TTR, TTL, off-axis detection, array detector, video detection

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Multimedia (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Shaping Of Tube Ends By Bending Or Straightening (AREA)
  • Mechanical Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Optics & Photonics (AREA)
CN201510101359.2A 2011-05-17 2012-05-17 压印设备 Active CN104614937B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2011110587A JP5637931B2 (ja) 2011-05-17 2011-05-17 インプリント装置、インプリント方法およびデバイス製造方法
JP2011-110587 2011-05-17
CN201210153656.8A CN102789127B (zh) 2011-05-17 2012-05-17 压印设备、压印方法和装置制造方法

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
CN201210153656.8A Division CN102789127B (zh) 2011-05-17 2012-05-17 压印设备、压印方法和装置制造方法

Publications (2)

Publication Number Publication Date
CN104614937A CN104614937A (zh) 2015-05-13
CN104614937B true CN104614937B (zh) 2019-07-23

Family

ID=47154561

Family Applications (2)

Application Number Title Priority Date Filing Date
CN201510101359.2A Active CN104614937B (zh) 2011-05-17 2012-05-17 压印设备
CN201210153656.8A Active CN102789127B (zh) 2011-05-17 2012-05-17 压印设备、压印方法和装置制造方法

Family Applications After (1)

Application Number Title Priority Date Filing Date
CN201210153656.8A Active CN102789127B (zh) 2011-05-17 2012-05-17 压印设备、压印方法和装置制造方法

Country Status (5)

Country Link
US (2) US9188855B2 (enExample)
JP (1) JP5637931B2 (enExample)
KR (3) KR101524338B1 (enExample)
CN (2) CN104614937B (enExample)
TW (2) TWI496190B (enExample)

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JP5938218B2 (ja) * 2012-01-16 2016-06-22 キヤノン株式会社 インプリント装置、物品の製造方法およびインプリント方法
JP6188382B2 (ja) 2013-04-03 2017-08-30 キヤノン株式会社 インプリント装置および物品の製造方法
DE102013207243B4 (de) * 2013-04-22 2019-10-02 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung und verfahren zur herstellung einer struktur aus aushärtbarem material durch abformung
JP5909210B2 (ja) * 2013-07-11 2016-04-26 キヤノン株式会社 インプリント装置及び物品の製造方法
JP6541328B2 (ja) * 2013-11-26 2019-07-10 キヤノン株式会社 検出装置、インプリント装置、および物品の製造方法
EP2916172A1 (en) * 2014-02-13 2015-09-09 Chemence, Inc. Improvements in the manufacture of craft stamps
SG10201603103UA (en) 2015-04-30 2016-11-29 Canon Kk Imprint device, substrate conveying device, imprinting method, and method for manufacturing article
US10386737B2 (en) * 2015-06-10 2019-08-20 Canon Kabushiki Kaisha Imprint apparatus and method for producing article
JP6748461B2 (ja) * 2016-03-22 2020-09-02 キヤノン株式会社 インプリント装置、インプリント装置の動作方法および物品製造方法
CN112639623B (zh) * 2018-08-20 2024-05-14 Asml荷兰有限公司 用于测量对准标记的位置的设备和方法
CN113815304B (zh) * 2020-06-19 2023-08-29 陈竹 基于丝网印刷技术的同步对花板材、板材同步对花系统及方法
CN115799146B (zh) * 2023-01-30 2023-05-09 北京青禾晶元半导体科技有限责任公司 一种光学对位系统

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Also Published As

Publication number Publication date
TW201537669A (zh) 2015-10-01
US20160033884A1 (en) 2016-02-04
CN102789127B (zh) 2016-04-06
TW201250779A (en) 2012-12-16
KR20150018866A (ko) 2015-02-24
KR101540884B1 (ko) 2015-07-30
JP2012243863A (ja) 2012-12-10
US9645514B2 (en) 2017-05-09
CN102789127A (zh) 2012-11-21
JP5637931B2 (ja) 2014-12-10
US9188855B2 (en) 2015-11-17
KR20140107156A (ko) 2014-09-04
CN104614937A (zh) 2015-05-13
KR101524338B1 (ko) 2015-05-29
US20120292801A1 (en) 2012-11-22
TWI496190B (zh) 2015-08-11
KR20120128571A (ko) 2012-11-27
KR101603037B1 (ko) 2016-03-11
TWI654706B (zh) 2019-03-21

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