CN104508495B - 自动分析装置的控制方法 - Google Patents

自动分析装置的控制方法 Download PDF

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Publication number
CN104508495B
CN104508495B CN201380040386.2A CN201380040386A CN104508495B CN 104508495 B CN104508495 B CN 104508495B CN 201380040386 A CN201380040386 A CN 201380040386A CN 104508495 B CN104508495 B CN 104508495B
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China
Prior art keywords
sample
cleaning
suction nozzle
mentioned
sample dispensing
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Chinese (zh)
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CN104508495A (zh
Inventor
安居晃启
时枝仁
折桥敏秀
斋藤佳明
铃木直人
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Hitachi Ltd
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Hitachi Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/025—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having a carousel or turntable for reaction cells or cuvettes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1004—Cleaning sample transfer devices

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  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
CN201380040386.2A 2012-08-02 2013-07-25 自动分析装置的控制方法 Active CN104508495B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2012-171677 2012-08-02
JP2012171677 2012-08-02
PCT/JP2013/070215 WO2014021195A1 (ja) 2012-08-02 2013-07-25 自動分析装置

Publications (2)

Publication Number Publication Date
CN104508495A CN104508495A (zh) 2015-04-08
CN104508495B true CN104508495B (zh) 2016-06-29

Family

ID=50027873

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201380040386.2A Active CN104508495B (zh) 2012-08-02 2013-07-25 自动分析装置的控制方法

Country Status (5)

Country Link
US (2) US9891240B2 (enExample)
EP (1) EP2881742B8 (enExample)
JP (2) JP6219281B2 (enExample)
CN (1) CN104508495B (enExample)
WO (1) WO2014021195A1 (enExample)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016130962A1 (en) 2015-02-13 2016-08-18 Abbott Laboratories Automated storage modules for diagnostic analyzer liquids and related systems and methods
JP6674702B2 (ja) * 2015-08-26 2020-04-01 株式会社日立ハイテク 自動分析装置
JP6611569B2 (ja) * 2015-11-24 2019-11-27 キヤノンメディカルシステムズ株式会社 自動分析装置
US11231433B2 (en) * 2016-02-24 2022-01-25 Hitachi High-Tech Corporation Automatic analyzer and cleaning method
JP6887880B2 (ja) * 2017-05-30 2021-06-16 日本電子株式会社 自動分析装置及びプログラム
JP7118646B2 (ja) * 2018-01-12 2022-08-16 キヤノンメディカルシステムズ株式会社 自動分析装置、及び洗浄方法
JP6876650B2 (ja) * 2018-03-30 2021-05-26 日本電子株式会社 自動分析装置および自動分析方法
WO2020230451A1 (ja) * 2019-05-13 2020-11-19 株式会社日立ハイテク 自動分析装置、及びその洗浄方法
WO2021079645A1 (ja) * 2019-10-24 2021-04-29 株式会社日立ハイテク 自動分析装置および試薬の分注方法
CN115004039B (zh) * 2020-02-07 2025-09-30 株式会社日立高新技术 自动分析系统、控制装置及清洗方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101013139A (zh) * 2006-01-30 2007-08-08 株式会社东芝 自动分析装置和探头清洗方法
JP2010060550A (ja) * 2008-08-08 2010-03-18 Olympus Corp 検体分注方法および分析装置
CN101688877A (zh) * 2007-05-11 2010-03-31 贝克曼考尔特公司 喷嘴清洗方法、喷嘴清洗装置及自动分析装置
CN102112882A (zh) * 2008-08-07 2011-06-29 株式会社日立高新技术 自动分析装置
JP2011220928A (ja) * 2010-04-13 2011-11-04 Toshiba Corp 自動分析装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06130072A (ja) * 1992-10-14 1994-05-13 Hitachi Ltd 自動分析装置
CA2132270A1 (en) * 1993-10-28 1995-04-29 Erich Lerch Automatic pipetting apparatus having a cleaning device
JP3448436B2 (ja) * 1996-08-21 2003-09-22 日本電子株式会社 生化学自動分析装置における洗浄装置
DE10120756C1 (de) * 2001-04-27 2002-12-05 Evotec Ag Verfahren zur Verbesserung der Betriebssicherheit von Dosiereinrichtungen
DE10207499A1 (de) * 2002-02-22 2003-09-25 Evotec Ag Verfahren zum Reinigen von Fluidabgabeeinrichtungen und Reinigungsvorrichtung
US20030223472A1 (en) * 2002-05-29 2003-12-04 Ravalico Patricia H. Clinical tester wash and method
JP4976870B2 (ja) * 2006-01-30 2012-07-18 株式会社東芝 自動分析装置及びプローブ洗浄方法
JP2008002897A (ja) * 2006-06-21 2008-01-10 Olympus Corp 分注装置および自動分析装置
JP2008180538A (ja) * 2007-01-23 2008-08-07 Olympus Corp 分析装置
JP2010216876A (ja) * 2009-03-13 2010-09-30 Beckman Coulter Inc 分析装置および分注プローブ洗浄方法
JP2011163909A (ja) * 2010-02-09 2011-08-25 Beckman Coulter Inc 自動分析装置および分注手段の洗浄方法
JP6202742B2 (ja) * 2011-10-18 2017-09-27 株式会社日立ハイテクノロジーズ 自動分析装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101013139A (zh) * 2006-01-30 2007-08-08 株式会社东芝 自动分析装置和探头清洗方法
CN101688877A (zh) * 2007-05-11 2010-03-31 贝克曼考尔特公司 喷嘴清洗方法、喷嘴清洗装置及自动分析装置
CN102112882A (zh) * 2008-08-07 2011-06-29 株式会社日立高新技术 自动分析装置
JP2010060550A (ja) * 2008-08-08 2010-03-18 Olympus Corp 検体分注方法および分析装置
JP2011220928A (ja) * 2010-04-13 2011-11-04 Toshiba Corp 自動分析装置

Also Published As

Publication number Publication date
EP2881742B8 (en) 2020-07-22
JP2017223713A (ja) 2017-12-21
US10962558B2 (en) 2021-03-30
EP2881742A4 (en) 2016-04-06
WO2014021195A1 (ja) 2014-02-06
JPWO2014021195A1 (ja) 2016-07-21
US9891240B2 (en) 2018-02-13
JP6585134B2 (ja) 2019-10-02
US20150204895A1 (en) 2015-07-23
CN104508495A (zh) 2015-04-08
US20180128847A1 (en) 2018-05-10
JP6219281B2 (ja) 2017-10-25
EP2881742B1 (en) 2020-05-20
EP2881742A1 (en) 2015-06-10

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