CN104318881A - Impedance testing circuit, integrated driving circuit and display device - Google Patents
Impedance testing circuit, integrated driving circuit and display device Download PDFInfo
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- CN104318881A CN104318881A CN201410643549.2A CN201410643549A CN104318881A CN 104318881 A CN104318881 A CN 104318881A CN 201410643549 A CN201410643549 A CN 201410643549A CN 104318881 A CN104318881 A CN 104318881A
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Abstract
The embodiment of the invention discloses an impedance testing circuit, an integrated driving circuit and a display device, and relates to the electrical field. The impedance range of complex routing can be tested. The two ends of a first branch circuit of the impedance testing circuit are connected with a first signal input end and a second signal input end. The first branch circuit comprises a first unit and a second unit. A connecting point between the first unit and the second unit is a first node. The impedance of the first unit is fixed, and the impedance of the second unit is adjustable. The first end of a second branch circuit is connected with the first signal input end or the second signal input end. In the testing process, the second end of the second branch circuit is connected with the first end of a circuit to be tested, and the second end of the circuit to be tested is connected with the second signal input end or the first signal input end. A connecting point between the circuit to be tested and the second branch circuit is a second node. The impedance of the second branch circuit is fixed, and the impedance of the second branch circuit is equal to that of the first unit. The first node is connected with one input end of a comparator, and the second node is connected with the other input end of the comparator.
Description
Technical field
The present invention relates to electricity field, particularly relate to a kind of testing impedance circuit and integrated drive electronics.
Background technology
In order to drive the normal display of display device, display device needs to comprise printed circuit board (PCB), the integrated drive electronics and various complicated cablings etc. be positioned on substrate, wherein, the effect of cabling is the connection realized between printed circuit board (PCB) and integrated drive electronics, and then control integration driving circuit output drive signal is in the structures such as the grid line on substrate and data line.
Exemplarily, when display device is mobile phone, above-mentioned cabling comprises the trace portions being positioned at flexible PCB (FPC) and the ITO trace portions be positioned on substrate, and now, the overall impedance of the cabling between printed circuit board (PCB) and integrated drive electronics is R
fPC+ R
fOG+ R
iTO+ R
cOG, wherein, R
fPCfor being positioned at the resistance of the trace portions of flexible PCB, R
fOGfor being positioned at the trace portions of flexible PCB (FPC) and being positioned at the resistance of coupling part of the ITO trace portions on substrate, R
iTOfor being positioned at the resistance of the ITO trace portions on substrate, R
cOGfor being positioned at the resistance of the coupling part of ITO trace portions on substrate and integrated drive electronics.
In prior art, only by the mode of reserved vacant cabling, use multimeter test R
fPC+ R
fOGimpedance, be positioned at ITO trace portions on substrate by microscopic examination and the coupling part of the ITO trace portions that is positioned on substrate and integrated drive electronics whether intact, and cannot R be drawn
fPC+ R
fOG+ R
iTO+ R
cOGwithin the scope that the normal display whether being in display device needs.
Summary of the invention
Technical matters to be solved by this invention is to provide a kind of testing impedance circuit, integrated drive electronics and display device, can the impedance ranges of testing complex cabling.
For solving the problems of the technologies described above, embodiments providing a kind of testing impedance circuit, adopting following technical scheme:
A kind of testing impedance circuit, comprises the first branch road, the second branch road and comparer;
The two ends of described first branch road connect the first signal input part and secondary signal input end respectively, described first branch road comprises first module and the second unit of series connection mutually, the tie point of described first module and described second unit is first node, the impedance of described first module is fixed, the impedance adjustable of described second unit;
The first end of described second branch road connects described first signal input part or described secondary signal input end, in test process, second end of described second branch road connects the first end of circuit to be tested, second end of described circuit to be tested connects described secondary signal input end or described first signal input part, the tie point of described circuit to be tested and described second branch road is Section Point, the impedance of described second branch road is fixed, and the impedance of described second branch road equals the impedance of described first module;
Described first node connects an input end of described comparer, and described Section Point connects another input end of described comparer.
Described first module comprises the first resistance, and described second unit comprises the second resistance, the 3rd resistance, the 4th resistance, the 5th resistance, the 6th resistance, the first switch, second switch, the 3rd switch and the 4th switch;
The first end of described first resistance connects described first signal input part, second end of described first resistance connects the first end of described second resistance, second end of described second resistance connects the first end of described 3rd resistance, second end of described 3rd resistance connects the first end of described 4th resistance, second end of described 4th resistance connects the first end of described 5th resistance, second end of described 5th resistance connects the first end of described 6th resistance, and the second end of described 6th resistance connects described secondary signal input end;
The two ends of described first switch connect first end and second end of described second resistance respectively, the two ends of described second switch connect first end and second end of described 3rd resistance respectively, the two ends of described 3rd switch connect first end and second end of described 4th resistance respectively, and the two ends of described 4th switch connect first end and second end of described 5th resistance respectively.
Described first module comprises the first resistance, and described second unit comprises the second resistance, the 3rd resistance, the 4th resistance, the 5th resistance, the 6th resistance, the first switch, second switch, the 3rd switch and the 4th switch;
The first end of described first resistance connects described first signal input part, second end of described first resistance connects the first end of described second resistance, second end of described second resistance connects the first end of described 3rd resistance, second end of described 3rd resistance connects the first end of described 4th resistance, second end of described 4th resistance connects the first end of described 5th resistance, second end of described 5th resistance connects the first end of described 6th resistance, and the second end of described 6th resistance connects described secondary signal input end;
The two ends of described first switch connect the first end of described second resistance and the first end of described 6th resistance respectively, the two ends of described second switch connect the first end of described 3rd resistance and the first end of described 6th resistance respectively, the two ends of described 3rd switch connect the first end of described 4th resistance and the first end of described 6th resistance respectively, and the two ends of described 4th switch connect the first end of described 5th resistance and the first end of described 6th resistance respectively.
Described second branch road comprises the 7th resistance, and the first end of described 7th resistance connects described first signal input part, and the second end of described 7th resistance connects described circuit to be tested, and the resistance of described 7th resistance equals the resistance of described first resistance.
The resistance of described second resistance, described 3rd resistance, described 4th resistance and described 5th resistance is 10ohm, and the resistance of described 6th resistance is 80ohm.
The voltage of described first signal input part is 1.8V, described secondary signal input end grounding.
Described first switch, described second switch, described 3rd switch and described 4th switch are thin film transistor (TFT).
Described comparer is voltage comparator, and described first node connects "+" input end of described voltage comparator, and described Section Point connects "-" input end of voltage comparator.
Described testing impedance circuit also comprises two test probes, in test process, second end of described second branch road connects the first end of described circuit to be tested by a described test probe, test probe described in another connects described first signal input part or described secondary signal input end for making the second end of described circuit to be tested.
Embodiments provide a kind of testing impedance circuit as above, when using the impedance of the complicated cabling of this testing impedance circuit test, the signal exported by comparer can determine the magnitude relationship of the voltage of first node and Section Point, impedance due to the second branch road equals the impedance of first module, and then magnitude relationship between the impedance of second unit and the impedance of circuit to be tested can be drawn, in addition, due to the impedance adjustable of second unit, therefore can by regulating the impedance of second unit, when test second unit has multiple different impedance, the change of the signal that comparer exports, and then the magnitude relationship obtained between the impedance of second unit and the impedance of circuit to be tested, and then draw the impedance ranges of circuit to be tested.
Further, the embodiment of the present invention additionally provides a kind of integrated drive electronics, adopts following technical scheme:
A kind of integrated drive electronics, comprises the testing impedance circuit described in above any one.
First resistance and the 7th resistance are the internal resistance of integrated drive electronics.
Described integrated drive electronics also comprises mode selective structure, and described mode selective structure is in testing impedance pattern or drive singal output mode for regulating described integrated drive electronics.
In addition, the embodiment of the present invention additionally provides a kind of display device, and described display device comprises the integrated drive electronics described in above any one.
Accompanying drawing explanation
In order to be illustrated more clearly in the embodiment of the present invention or technical scheme of the prior art, below the accompanying drawing used required in describing embodiment is briefly described, apparently, accompanying drawing in the following describes is only some embodiments of the present invention, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to these accompanying drawings.
Fig. 1 is the circuit diagram of the first the testing impedance circuit in the embodiment of the present invention;
Fig. 2 is the circuit diagram of the second testing impedance circuit in the embodiment of the present invention.
Description of reference numerals:
1-the first branch road; 11-first module; 12-second unit;
2-the second branch road; 3-circuit to be tested.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, be clearly and completely described the technical scheme in the embodiment of the present invention, obviously, described embodiment is the present invention's part embodiment, instead of whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art, not making the every other embodiment obtained under creative work prerequisite, belong to the scope of protection of the invention.
The embodiment of the present invention provides a kind of testing impedance circuit, uses this testing impedance circuit can the impedance ranges of testing complex cabling.
Particularly, as depicted in figs. 1 and 2, this testing impedance circuit comprises the first branch road 1, second branch road 2 and comparer C.Wherein, the two ends of the first branch road 1 connect the first signal input part Input1 and secondary signal input end Input2 respectively, first branch road 1 comprises first module 11 and the second unit 12 of series connection mutually, the tie point of first module 11 and second unit 12 is first node P, the impedance of first module 11 is fixed, the impedance adjustable of second unit 12.The first end of the second branch road 2 connects the first signal input part Input1 or secondary signal input end Input2, in test process, second end of the second branch road 2 connects the first end of circuit 3 to be tested, second end of circuit 3 to be tested connects secondary signal input end Input2 or the first signal input part Input1, the tie point of circuit 3 to be tested and the second branch road 2 is Section Point Q, the impedance of the second branch road 2 is fixed, and the impedance of the second branch road 2 equals the impedance of first module 11.First node P connects an input end of comparer C, and Section Point Q connects another input end of comparer C.
It should be noted that, from the rudimentary knowledge of circuit, the voltage of the first signal input part Input1 must be not equal to the voltage of secondary signal input end Input2.In addition, the first end of the second branch road 2 connects the first signal input part Input1 or secondary signal input end Input2, second end of circuit 3 to be tested connects secondary signal input end Input2 or the first signal input part Input1, refer to, when the first end of the second branch road 2 connects the first signal input part Input1, the second end of circuit 3 to be tested connects secondary signal input end Input2; When the first end of the second branch road 2 connects secondary signal input end Input2, the second end of circuit 3 to be tested connects the first signal input part Input1.
Exemplarily, when connecting the first signal input part Input1 with the first end of the second branch road 2, it is example that second end of circuit 3 to be tested connects secondary signal input end Input2, specifically describes the process of the impedance ranges using the complicated cabling of above-mentioned testing impedance circuit test.
Particularly, in test process, first the first end of circuit 3 to be tested is connected to the second end of the second branch road 2, the second end of circuit 3 to be tested connects secondary signal input end Input2; Then the signal determination first node P exported according to comparer C and the magnitude relationship of voltage of Section Point Q, impedance due to the second branch road 2 equals the impedance of first module 11, therefore, the magnitude relationship between the impedance of second unit 12 and the impedance of circuit to be tested 3 can be drawn; Again, regulate the impedance of second unit 12, when test second unit 12 has multiple different impedance, the change of the signal that comparer C exports, draw the magnitude relationship between the impedance of circuit 3 to be tested and the different impedances of second unit 12, finally, draw the impedance ranges of circuit to be tested.
For the ease of it will be appreciated by those skilled in the art that the testing impedance circuit that two kinds of embodiments providing as depicted in figs. 1 and 2 are concrete.
As shown in Figure 1, first module 11 comprises the first resistance R1, and second unit 12 comprises the second resistance R2, the 3rd resistance R3, the 4th resistance R4, the 5th resistance R5, the 6th resistance R6, the first switch T1, second switch T2, the 3rd switch T3 and the 4th switch T4.
Wherein, the first end of the first resistance R1 connects the first signal input part Input1, second end of the first resistance R1 connects the first end of the second resistance R2, second end of the second resistance R2 connects the first end of the 3rd resistance R3, second end of the 3rd resistance R3 connects the first end of the 4th resistance R4, second end of the 4th resistance R4 connects the first end of the 5th resistance R5, and second end of the 5th resistance R5 connects the first end of the 6th resistance R6, and second end of the 6th resistance R6 connects secondary signal input end Input2.
The two ends of the first switch T1 connect first end and second end of the second resistance R2 respectively, the two ends of second switch T2 connect first end and second end of the 3rd resistance R3 respectively, the two ends of the 3rd switch T3 connect first end and second end of the 4th resistance R4 respectively, and the two ends of the 4th switch T4 connect first end and second end of the 5th resistance R5 respectively.
Now, all switches all non-conducting time, the resistance of second unit 12 is the resistance sum of the second resistance R2, the 3rd resistance R3, the 4th resistance R4, the 5th resistance R5 and the 6th resistance R6; During the first switch T1 conducting, the resistance of second unit 12 is the resistance sum of the 3rd resistance R3, the 4th resistance R4, the 5th resistance R5 and the 6th resistance R6; When the first switch T1 and second switch T2 conducting, the resistance of second unit 12 is the resistance sum of the 4th resistance R4, the 5th resistance R5 and the 6th resistance R6; When the first switch T1, second switch T2 and the 3rd switch T3 conducting, the resistance of second unit 12 is the resistance sum of the 5th resistance R5 and the 6th resistance R6; During the equal conducting of the first switch T1, second switch T2, the 3rd switch T3 and the 4th switch T4, the resistance of second unit 12 is the resistance of the 6th resistance R6.It should be noted that, the conducting situation of switch is not limited to above several, and those skilled in the art can select several switch conduction and concrete which switch conduction according to actual needs, and then regulates the resistance of second unit 12.
Further, the second branch road 2 comprises the 7th resistance R7, and the first end of the 7th resistance R7 connects the first signal input part Input1, and the resistance that second end of the 7th resistance R7 connects circuit the 3, seven resistance R7 to be tested equals the resistance of the first resistance R1.
As shown in Figure 2, first module 11 comprises the first resistance R1, and second unit 12 comprises the second resistance R2, the 3rd resistance R3, the 4th resistance R4, the 5th resistance R5, the 6th resistance R6, the first switch T1, second switch T2, the 3rd switch T3 and the 4th switch T4.
Wherein, the first end of the first resistance R1 connects the first signal input part Input1, second end of the first resistance R1 connects the first end of the second resistance R2, second end of the second resistance R2 connects the first end of the 3rd resistance R3, second end of the 3rd resistance R3 connects the first end of the 4th resistance R4, second end of the 4th resistance R4 connects the first end of the 5th resistance R5, and second end of the 5th resistance R5 connects the first end of the 6th resistance R6, and second end of the 6th resistance R6 connects secondary signal input end Input2.
The two ends of the first switch T1 connect the first end of the second resistance R2 and the first end of the 6th resistance R6 respectively, the two ends of second switch T2 connect the first end of the 3rd resistance R3 and the first end of the 6th resistance R6 respectively, the two ends of the 3rd switch T3 connect the first end of the 4th resistance R4 and the first end of the 6th resistance R6 respectively, and the two ends of the 4th switch T4 connect the first end of the 5th resistance R5 and the first end of the 6th resistance R6 respectively.
Now, all switches all non-conducting time, the resistance of second unit 12 is the resistance sum of the second resistance R2, the 3rd resistance R3, the 4th resistance R4, the 5th resistance R5 and the 6th resistance R6; During the first switch T1 conducting, the resistance of second unit 12 is the resistance of the 6th resistance R6; During second switch T2 conducting, the resistance of second unit 12 is the resistance sum of the second resistance R2 and the 6th resistance R6; During the 3rd switch T3 conducting, the resistance of second unit 12 is the resistance sum of the second resistance R2, the 3rd resistance R3 and the 6th resistance R6; During the 4th switch T4 conducting, the resistance of second unit 12 is the resistance sum of the second resistance R2, the 3rd resistance R3, the 4th resistance R4 and the 6th resistance R6; All switches all non-conducting time, the resistance of second unit 12 is the resistance sum of the second resistance R2, the 3rd resistance R3, the 4th resistance R4, the 5th resistance R5 and the 6th resistance R6.It should be noted that, the conducting situation of switch is not limited to above several, and those skilled in the art can select several switch conduction and concrete which switch conduction according to actual needs, and then regulates the resistance of second unit 12.
Further, the second branch road 2 comprises the 7th resistance R7, and the first end of the 7th resistance R7 connects the first signal input part, and the resistance that second end of the 7th resistance R7 connects circuit the 3, seven resistance R7 to be tested equals the resistance of the first resistance R1.
It should be noted that, embodiment of the present invention middle impedance test circuit is not limited to above two kinds, in actual test process, those skilled in the art can also regulate the number of the resistance of the resistance in second unit 12 and number, switch according to above content, thus obtain and need the resistance adjustable extent of second unit 12, to realize more accurately determining the objects such as the impedance ranges of circuit to be tested.
Exemplarily, when circuit 4 to be tested be printed circuit board (PCB) on mobile phone and the cabling between integrated drive electronics time, even if with above-mentioned two kinds of testing impedance circuit test R
fPC+ R
fOG+ R
iTO+ R
cOGtime, owing to usually requiring R
fPC+ R
fOG+ R
iTO+ R
cOGimpedance ranges be 100+/-10ohm, therefore, in the embodiment of the present invention, preferably the resistance of the second resistance R2, the 3rd resistance R3, the 4th resistance R4 and the 5th resistance R5 is 10ohm, the resistance of the 6th resistance R6 is 80ohm, thus the resistance of second unit 12 can be made can be 80ohm, 90ohm, 100ohm, 110ohm and 120ohm.
In addition, at R
fPC+ R
fOG+ R
iTO+ R
cOGimpedance ranges test process in, preferably the voltage of the first signal input part Input1 is 1.8V, secondary signal input end Input2 ground connection.
Alternatively, the first switch T1, the second switch T2 that mention in above all embodiments, the 3rd switch T3 and the 4th switch T4 are thin film transistor (TFT).Now, the source electrode of thin film transistor (TFT) is connected the two ends needing conducting, grid connection signal input end respectively with drain electrode, and the signal inputted by signal input part controls conducting and the cut-off of thin film transistor (TFT).
Alternatively, as depicted in figs. 1 and 2, the comparer C in the embodiment of the present invention is preferably voltage comparator, and first node connects "+" input end of voltage comparator, and Section Point connects "-" input end of voltage comparator.When "+" input terminal voltage higher than "-" input terminal voltage time, voltage comparator export high level; When "+" input terminal voltage lower than "-" input terminal voltage time, voltage comparator output low level.Now, testing impedance circuit test R is as shown in Figure 1 used
fPC+ R
fOG+ R
iTO+ R
cOGimpedance ranges, and the resistance of the second resistance R2, the 3rd resistance R3, the 4th resistance R4 and the 5th resistance R5 is 10ohm, when the resistance of the 6th resistance R6 is 80ohm, if any one switch conduction, the resistance of second unit 12 is 110ohm, and comparer C1 output low level, then illustrate R
fPC+ R
fOG+ R
iTO+ R
cOGbe less than 110ohm; Any three switch conductions, the resistance of second unit 12 is 90ohm, and comparer C1 exports high level, then R is described
fPC+ R
fOG+ R
iTO+ R
cOGbe greater than 90ohm; Now, R
fPC+ R
fOG+ R
iTO+ R
cOGstandard resistance range meet actual needs.
In addition, testing impedance circuit shown in Fig. 1 and Fig. 2 also comprises two test probe (not shown)s, in test process, second end of the second branch road 2 connects the first end of circuit 3 to be tested by a test probe, another test probe connects the first signal input part Input1 or secondary signal input end Input2 for making the second end of circuit 3 to be tested.
Also it should be noted that, resistance and reactance are collectively referred to as impedance, when each electricity component in the first branch road 1 and the second branch road 2 is resistance, when the first branch road 1 two ends are direct current signal, can test the resistance of circuit 3 to be tested; When each electricity component in the first branch road 1 and the second branch road 2 is electric capacity, when the first branch road 1 two ends are AC signal, the reactance of circuit 3 to be tested can also be tested.
Embodiments provide a kind of testing impedance circuit as above, when using the impedance of the complicated cabling of this testing impedance circuit test, the signal exported by comparer can determine the magnitude relationship of the voltage of first node and Section Point, impedance due to the second branch road equals the impedance of first module, and then magnitude relationship between the impedance of second unit and the impedance of circuit to be tested can be drawn, in addition, due to the impedance adjustable of second unit, therefore can by regulating the impedance of second unit, when test second unit has multiple different impedance, the change of the signal that comparer exports, and then the magnitude relationship obtained between the impedance of second unit and the impedance of circuit to be tested, and then draw the impedance ranges of circuit to be tested.
In addition, the embodiment of the present invention additionally provides a kind of integrated drive electronics, and this integrated drive electronics comprises the testing impedance circuit described in any one embodiment above.Now, the first resistance R1 and the 7th resistance R7 is the internal resistance of integrated drive electronics.
Further, integrated drive electronics can also comprise mode selective structure, and mode selective structure is in testing impedance pattern or drive singal output mode for regulating integrated drive electronics.Wherein, when display device normally shows, integrated drive electronics is in drive singal output mode, now for the electricity component work of output drive signal; When needing the overall impedance of the cabling in test display apparatus between printed circuit board (PCB) and integrated drive electronics, integrated drive electronics is in testing impedance pattern, now, and the electricity component work in testing impedance circuit.
Finally, the embodiment of the present invention additionally provides a kind of display device, and this display device comprises above-described integrated drive electronics.Particularly, this display device can be: any product or parts with Presentation Function such as liquid crystal panel, Electronic Paper, organic electroluminescence display panel, mobile phone, panel computer, televisor, display, notebook computer, digital album (digital photo frame), navigating instrument.
Through the above description of the embodiments, those skilled in the art can be well understood to the mode that the present invention can add required common hardware by software and realize, and can certainly pass through hardware, but in a lot of situation, the former is better embodiment.Based on such understanding, technical scheme of the present invention can embody with the form of software product the part that prior art contributes in essence in other words, this computer software product is stored in the storage medium that can read, as the floppy disk of computing machine, hard disk or CD etc., comprise some instructions and perform method described in each embodiment of the present invention in order to make a computer equipment (can be personal computer, server, or the network equipment etc.).
The above; be only the specific embodiment of the present invention, but protection scope of the present invention is not limited thereto, is anyly familiar with those skilled in the art in the technical scope that the present invention discloses; change can be expected easily or replace, all should be encompassed within protection scope of the present invention.Therefore, protection scope of the present invention should be as the criterion with the protection domain of described claim.
Claims (13)
1. a testing impedance circuit, is characterized in that, comprises the first branch road, the second branch road and comparer;
The two ends of described first branch road connect the first signal input part and secondary signal input end respectively, described first branch road comprises first module and the second unit of series connection mutually, the tie point of described first module and described second unit is first node, the impedance of described first module is fixed, the impedance adjustable of described second unit;
The first end of described second branch road connects described first signal input part or described secondary signal input end, in test process, second end of described second branch road connects the first end of circuit to be tested, second end of described circuit to be tested connects described secondary signal input end or described first signal input part, the tie point of described circuit to be tested and described second branch road is Section Point, the resistance of described second branch road is fixed, and the impedance of described second branch road equals the impedance of described first module;
Described first node connects an input end of described comparer, and described Section Point connects another input end of described comparer.
2. testing impedance circuit according to claim 1, is characterized in that,
Described first module comprises the first resistance, and described second unit comprises the second resistance, the 3rd resistance, the 4th resistance, the 5th resistance, the 6th resistance, the first switch, second switch, the 3rd switch and the 4th switch;
The first end of described first resistance connects described first signal input part, second end of described first resistance connects the first end of described second resistance, second end of described second resistance connects the first end of described 3rd resistance, second end of described 3rd resistance connects the first end of described 4th resistance, second end of described 4th resistance connects the first end of described 5th resistance, second end of described 5th resistance connects the first end of described 6th resistance, and the second end of described 6th resistance connects described secondary signal input end;
The two ends of described first switch connect first end and second end of described second resistance respectively, the two ends of described second switch connect first end and second end of described 3rd resistance respectively, the two ends of described 3rd switch connect first end and second end of described 4th resistance respectively, and the two ends of described 4th switch connect first end and second end of described 5th resistance respectively.
3. testing impedance circuit according to claim 1, is characterized in that,
Described first module comprises the first resistance, and described second unit comprises the second resistance, the 3rd resistance, the 4th resistance, the 5th resistance, the 6th resistance, the first switch, second switch, the 3rd switch and the 4th switch;
The first end of described first resistance connects described first signal input part, second end of described first resistance connects the first end of described second resistance, second end of described second resistance connects the first end of described 3rd resistance, second end of described 3rd resistance connects the first end of described 4th resistance, second end of described 4th resistance connects the first end of described 5th resistance, second end of described 5th resistance connects the first end of described 6th resistance, and the second end of described 6th resistance connects described secondary signal input end;
The two ends of described first switch connect the first end of described second resistance and the first end of described 6th resistance respectively, the two ends of described second switch connect the first end of described 3rd resistance and the first end of described 6th resistance respectively, the two ends of described 3rd switch connect the first end of described 4th resistance and the first end of described 6th resistance respectively, and the two ends of described 4th switch connect the first end of described 5th resistance and the first end of described 6th resistance respectively.
4. the testing impedance circuit according to Claims 2 or 3, is characterized in that,
Described second branch road comprises the 7th resistance, and the first end of described 7th resistance connects described first signal input part, and the second end of described 7th resistance connects described circuit to be tested, and the resistance of described 7th resistance equals the resistance of described first resistance.
5. testing impedance circuit according to claim 4, is characterized in that,
The resistance of described second resistance, described 3rd resistance, described 4th resistance and described 5th resistance is 10ohm, and the resistance of described 6th resistance is 80ohm.
6. testing impedance circuit according to claim 4, is characterized in that,
The voltage of described first signal input part is 1.8V, described secondary signal input end grounding.
7. the testing impedance circuit according to Claims 2 or 3, is characterized in that,
Described first switch, described second switch, described 3rd switch and described 4th switch are thin film transistor (TFT).
8. testing impedance circuit according to claim 1, is characterized in that, described comparer is voltage comparator, and described first node connects "+" input end of described voltage comparator, and described Section Point connects "-" input end of voltage comparator.
9. testing impedance circuit according to claim 1, it is characterized in that, also comprise two test probes, in test process, second end of described second branch road connects the first end of described circuit to be tested by a described test probe, test probe described in another connects described first signal input part or described secondary signal input end for making the second end of described circuit to be tested.
10. an integrated drive electronics, is characterized in that, comprises the testing impedance circuit as described in any one of claim 1-9.
11. integrated drive electronicss according to claim 10, is characterized in that, the first resistance and the 7th resistance are the internal resistance of integrated drive electronics.
12. integrated drive electronicss according to claim 10 or 11, it is characterized in that, also comprise mode selective structure, described mode selective structure is in testing impedance pattern or drive singal output mode for regulating described integrated drive electronics.
13. 1 kinds of display device, is characterized in that, comprise the integrated drive electronics as described in any one of claim 10-12.
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| US6566857B1 (en) * | 1999-12-20 | 2003-05-20 | Intel Corporation | Testing of digital-to-analog converters |
| US6650173B1 (en) * | 1999-11-16 | 2003-11-18 | Stmicroelectronics S.R.L. | Programmable voltage generator |
| CN1750101A (en) * | 2004-09-13 | 2006-03-22 | 凌阳科技股份有限公司 | Source driver of built-in detecting circuit and its detecting method |
| CN101430849A (en) * | 2007-11-09 | 2009-05-13 | 奇景光电股份有限公司 | Test device for display driving circuit |
| CN102511010A (en) * | 2009-09-24 | 2012-06-20 | 罗伯特·博世有限公司 | Electric circuit configuration for switching an electrical load |
| CN103116378A (en) * | 2013-01-11 | 2013-05-22 | 北京经纬恒润科技有限公司 | Analog circuit with variable resistance |
| CN203705582U (en) * | 2014-02-21 | 2014-07-09 | 山东华芯富创电子科技有限公司 | Test circuit for open circuit of conducting circuit |
-
2014
- 2014-11-10 CN CN201410643549.2A patent/CN104318881B/en not_active Expired - Fee Related
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6650173B1 (en) * | 1999-11-16 | 2003-11-18 | Stmicroelectronics S.R.L. | Programmable voltage generator |
| US6566857B1 (en) * | 1999-12-20 | 2003-05-20 | Intel Corporation | Testing of digital-to-analog converters |
| CN1750101A (en) * | 2004-09-13 | 2006-03-22 | 凌阳科技股份有限公司 | Source driver of built-in detecting circuit and its detecting method |
| CN101430849A (en) * | 2007-11-09 | 2009-05-13 | 奇景光电股份有限公司 | Test device for display driving circuit |
| CN102511010A (en) * | 2009-09-24 | 2012-06-20 | 罗伯特·博世有限公司 | Electric circuit configuration for switching an electrical load |
| CN103116378A (en) * | 2013-01-11 | 2013-05-22 | 北京经纬恒润科技有限公司 | Analog circuit with variable resistance |
| CN203705582U (en) * | 2014-02-21 | 2014-07-09 | 山东华芯富创电子科技有限公司 | Test circuit for open circuit of conducting circuit |
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| CN104318881B (en) | 2017-06-23 |
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