CN104318881B - A kind of testing impedance circuit, integrated drive electronics and display device - Google Patents
A kind of testing impedance circuit, integrated drive electronics and display device Download PDFInfo
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- CN104318881B CN104318881B CN201410643549.2A CN201410643549A CN104318881B CN 104318881 B CN104318881 B CN 104318881B CN 201410643549 A CN201410643549 A CN 201410643549A CN 104318881 B CN104318881 B CN 104318881B
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Abstract
The embodiment of the invention discloses a kind of testing impedance circuit, integrated drive electronics and display device, it is related to electricity field, the impedance ranges of complicated cabling can be tested.Two ends connection the first signal input part and the secondary signal input of the tie point of the testing impedance circuit, tie point includes first module and second unit, the tie point of first module and second unit is first node, and the impedance of first module is fixed, the impedance adjustable of second unit；First end connection the first signal input part or the secondary signal input of the second branch road, in test process, second end of the second branch road connects the first end of under test line, the connection of second end secondary signal input or first signal input part of under test line, the tie point of under test line and the second branch road is Section Point, second branch impedance is fixed, and the impedance of the second branch road is equal to the impedance of first module；First node connects an input of comparator, and Section Point connects another input of comparator.
Description
Technical field
The present invention relates to electricity field, more particularly to a kind of testing impedance circuit and integrated drive electronics.
Background technology
In order to drive the normal display of display device, display device needs to include printed circuit board (PCB), the collection on substrate
Into drive circuit and various complicated cablings etc., wherein, the effect of cabling is to realize printed circuit board (PCB) and integrated drive electronics
Between connection, and then control on the grid line and the structure such as data wire on integrated drive electronics output drive signal to substrate.
Exemplarily, when display device is mobile phone, above-mentioned cabling includes the cabling portion in flexible PCB (FPC)
Divide and the ITO trace portions on substrate, now, the overall impedance of the cabling between printed circuit board (PCB) and integrated drive electronics
It is RFPC+RFOG+RITO+RCOG, wherein, RFPCIt is the resistance of the trace portions in flexible PCB, RFOGIt is positioned at flexible electrical
The resistance of the coupling part of the trace portions in road plate (FPC) and the ITO trace portions on substrate, RITOIt is positioned at substrate
On ITO trace portions resistance, RCOGIt is the coupling part of ITO trace portions on substrate and integrated drive electronics
Resistance.
In the prior art, it is only capable of by way of reserving vacant cabling, R is tested using universal meterFPC+RFOGImpedance, lead to
Microscope inspection location is crossed in the ITO trace portions on substrate and the ITO trace portions on substrate and integrated drive electronics
Whether coupling part is intact, and cannot draw RFPC+RFOG+RITO+RCOGWhether model that the normal display of display device need is in
Within enclosing.
The content of the invention
The technical problems to be solved by the invention are to provide a kind of testing impedance circuit, integrated drive electronics and display dress
Put, the impedance ranges of complicated cabling can be tested.
In order to solve the above technical problems, a kind of testing impedance circuit is the embodiment of the invention provides, using following technical side
Case：
A kind of testing impedance circuit, including tie point, the second branch road and comparator；
The two ends of the tie point connect the first signal input part and secondary signal input, the tie point respectively
Including the first module being serially connected and second unit, the tie point of the first module and the second unit is first segment
Point, the impedance of the first module is fixed, the impedance adjustable of the second unit；
First end connection first signal input part or the secondary signal input of second branch road, test
During, the second end of second branch road connects the first end of under test line, the second end connection of the under test line
The tie point of the secondary signal input or first signal input part, the under test line and second branch road
Be Section Point, the impedance of second branch road is fixed, and second branch road impedance be equal to the first module impedance；
The first node connects an input of the comparator, and the Section Point connects the another of the comparator
One input.
The first module include first resistor, the second unit include second resistance, 3rd resistor, the 4th resistance,
5th resistance, the 6th resistance, first switch, second switch, third switch and the 4th switch；
The first end of the first resistor connects first signal input part, the second end connection institute of the first resistor
The first end of second resistance is stated, the second end of the second resistance connects the first end of the 3rd resistor, the 3rd resistor
The second end connect the first end of the 4th resistance, the second end of the 4th resistance connects the first of the 5th resistance
End, the second end of the 5th resistance connects the first end of the 6th resistance, and the second end connection of the 6th resistance is described
Secondary signal input；
The two ends of the first switch connect first end and second end of the second resistance respectively, the second switch
Two ends connect first end and second end of the 3rd resistor respectively, and the two ends of the 3rd switch connect the 4th electricity respectively
The first end of resistance and the second end, the two ends of the 4th switch connect first end and second end of the 5th resistance respectively.
The first module include first resistor, the second unit include second resistance, 3rd resistor, the 4th resistance,
5th resistance, the 6th resistance, first switch, second switch, third switch and the 4th switch；
The first end of the first resistor connects first signal input part, the second end connection institute of the first resistor
The first end of second resistance is stated, the second end of the second resistance connects the first end of the 3rd resistor, the 3rd resistor
The second end connect the first end of the 4th resistance, the second end of the 4th resistance connects the first of the 5th resistance
End, the second end of the 5th resistance connects the first end of the 6th resistance, and the second end connection of the 6th resistance is described
Secondary signal input；
The two ends of the first switch connect the first end of the second resistance and the first end of the 6th resistance respectively,
The two ends of the second switch connect the first end of the 3rd resistor and the first end of the 6th resistance, the described 3rd respectively
The two ends of switch connect the first end of the 4th resistance and the first end of the 6th resistance, the two of the 4th switch respectively
End connects the first end of the 5th resistance and the first end of the 6th resistance respectively.
Second branch road includes the 7th resistance, and the first end of the 7th resistance connects first signal input part,
Second end of the 7th resistance connects the under test line, and the resistance of the 7th resistance is equal to the resistance of the first resistor
Value.
The resistance of the second resistance, the 3rd resistor, the 4th resistance and the 5th resistance is 10ohm,
The resistance of the 6th resistance is 80ohm.
The voltage of first signal input part is 1.8V, the secondary signal input end grounding.
The first switch, the second switch, the 3rd switch and the 4th switch are thin film transistor (TFT).
The comparator is voltage comparator, and the first node connects the "+" input of the voltage comparator, described
Section Point connects the "-" input of voltage comparator.
The testing impedance circuit also includes two test probes, and in test process, the second end of second branch road leads to
The first end that a test probe connects the under test line is crossed, another described test probe is described to be measured for making
Try the connection of the second end first signal input part or the secondary signal input of circuit.
A kind of testing impedance circuit as described above is the embodiment of the invention provides, it is multiple using the testing impedance circuit test
During the impedance of miscellaneous cabling, the signal exported by comparator is that the size of the voltage that can determine that first node and Section Point is closed
System, because the impedance of the second branch road is equal to the impedance of first module, and then can be derived that the impedance of second unit and line to be tested
Magnitude relationship between the impedance on road, further, since the impedance adjustable of second unit, therefore can be by adjusting second unit
Impedance, when test second unit has multiple difference impedances, the change of the signal of comparator output, and then obtain second unit
Magnitude relationship between impedance and the impedance of under test line, and then draw the impedance ranges of under test line.
Further, the embodiment of the present invention additionally provides a kind of integrated drive electronics, adopts the following technical scheme that：
A kind of integrated drive electronics, including the testing impedance circuit described in any of the above.
First resistor and the 7th resistance are the internal resistance of integrated drive electronics.
The integrated drive electronics also includes mode selective structure, and the mode selective structure is used to adjust the integrated drive
Dynamic circuit is in testing impedance pattern or drive signal output mode.
Additionally, the embodiment of the present invention additionally provides a kind of display device, the display device includes that any of the above is described
Integrated drive electronics.
Brief description of the drawings
In order to illustrate more clearly about the embodiment of the present invention or technical scheme of the prior art, embodiment will be described below
Needed for the accompanying drawing to be used be briefly described, it should be apparent that, drawings in the following description are only more of the invention
Embodiment, for those of ordinary skill in the art, on the premise of not paying creative work, can also be attached according to these
Figure obtains other accompanying drawings.
Fig. 1 is the circuit diagram of the first the testing impedance circuit in the embodiment of the present invention；
Fig. 2 is second circuit diagram of testing impedance circuit in the embodiment of the present invention.
Description of reference numerals：
1-tie point；11-first module；12-second unit；
2-the second branch road；3-under test line.
Specific embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete
Site preparation is described, it is clear that described embodiment is a part of embodiment of the invention, rather than whole embodiments.Based on this hair
Embodiment in bright, the every other implementation that those of ordinary skill in the art are obtained under the premise of creative work is not made
Example, belongs to the scope of protection of the invention.
A kind of embodiment of the present invention offer testing impedance circuit, complicated cabling can be tested using the testing impedance circuit
Impedance ranges.
Specifically, as depicted in figs. 1 and 2, the testing impedance circuit includes tie point 1, the second branch road 2 and comparator C.
Wherein, the two ends of tie point 1 connect the first signal input part Input1 and secondary signal input Input2, first respectively
Road 1 includes the first module 11 that is serially connected and second unit 12, and the tie point of first module 11 and second unit 12 is first
Node P, the impedance of first module 11 is fixed, the impedance adjustable of second unit 12.The first end of the second branch road 2 connects the first signal
Input Input1 or secondary signal input Input2, in test process, the second end of the second branch road 2 connects line to be tested
The first end on road 3, the connection of the second end secondary signal input Input2 or first signal input part of under test line 3
Input1, the tie point of the branch road 2 of under test line 3 and second is Section Point Q, and the impedance of the second branch road 2 is fixed, and second
The impedance on road 2 is equal to the impedance of first module 11.One input of first node P connection comparators C, Section Point Q connections
Another input of comparator C.
It should be noted that from the rudimentary knowledge of circuit, the voltage of the first signal input part Input1 is inevitable
In the voltage of secondary signal input Input2.In addition, the second branch road 2 first end connect the first signal input part Input1 or
Person secondary signal input Input2, the second end letters of connection secondary signal input Input2 or first of under test line 3
Number input Input1, refers to when the first end of the second branch road 2 connects the first signal input part Input1, line to be tested
Second end on road 3 connects secondary signal input Input2；When the first end of the second branch road 2 connects secondary signal input
During Input2, the second end of under test line 3 connects the first signal input part Input1.
Exemplarily, when connecting the first signal input part Input1 with the first end of the second branch road 2, under test line 3
Second end is connected as a example by secondary signal input Input2, is specifically described and is walked using above-mentioned testing impedance circuit test complexity
The process of the impedance ranges of line.
Specifically, in test process, the first end of under test line 3 is connected to the second end of the second branch road 2 first,
Second end of under test line 3 connects secondary signal input Input2；Then the signal for being exported according to comparator C determines first
The magnitude relationship of the voltage of node P and Section Point Q, because the impedance of the second branch road 2 is equal to the impedance of first module 11, because
This, you can draw the magnitude relationship between the impedance of second unit 12 and the impedance of under test line 3；Again, regulation second is single
The impedance of unit 12, when test second unit 12 has multiple difference impedances, the change of the signal of comparator C outputs draws to be measured
The magnitude relationship between the impedance and the different impedances of second unit 12 of circuit 3 is tried, finally, the impedance model of under test line is drawn
Enclose.
For the ease of it will be appreciated by those skilled in the art that the embodiment of the invention provides as depicted in figs. 1 and 2 two kinds it is specific
Testing impedance circuit.
As shown in figure 1, first module 11 includes first resistor R1, second unit 12 includes second resistance R2,3rd resistor
R3, the 4th resistance R4, the 5th resistance R5, the 6th resistance R6, first switch T1, second switch T2, the 3rd switch T3 and the 4th are opened
Close T4.
Wherein, the first end of first resistor R1 connects the first signal input part Input1, and second end of first resistor R1 connects
Connect the first end of second resistance R2, the first end of the second end connection 3rd resistor R3 of second resistance R2, the of 3rd resistor R3
Two ends connect the first end of the 4th resistance R4, and second end of the 4th resistance R4 connects the first end of the 5th resistance R5, the 5th resistance
Second end of R5 connects the first end of the 6th resistance R6, and second end of the 6th resistance R6 connects secondary signal input Input2.
The two ends of first switch T1 connect first end and second end of second resistance R2, the two ends point of second switch T2 respectively
Not Lian Jie 3rd resistor R3 first end and the second end, the 3rd switch T3 two ends connect respectively the 4th resistance R4 first end and
Second end, the two ends of the 4th switch T4 connect first end and second end of the 5th resistance R5 respectively.
Now, when all switches are not turned on, the resistance of second unit 12 is second resistance R2,3rd resistor R3, the 4th
The resistance sum of resistance R4, the 5th resistance R5 and the 6th resistance R6；When first switch T1 is turned on, the resistance of second unit 12 is the
Three resistance R3, the 4th resistance R4, the resistance sum of the 5th resistance R5 and the 6th resistance R6；First switch T1 and second switch T2 lead
When logical, the resistance of second unit 12 is the 4th resistance R4, the resistance sum of the 5th resistance R5 and the 6th resistance R6；First switch
When T1, second switch T2 and the 3rd switch T3 are turned on, the resistance of second unit 12 is the resistance of the 5th resistance R5 and the 6th resistance R6
Value sum；When first switch T1, second switch T2, the 3rd switch T3 and the 4th switch T4 are both turned on, the resistance of second unit 12
It is the resistance of the 6th resistance R6.It should be noted that the conducting situation of switch is not limited to the above several, people in the art
Member can according to actual needs select several switch conductions and specific which switch conduction, and then adjust the resistance of second unit 12
Value.
Further, the second branch road 2 includes the 7th resistance R7, and the first end of the 7th resistance R7 connects the first signal input part
The second end connection under test line 3 of Input1, the 7th resistance R7, the resistance of the 7th resistance R7 is equal to the resistance of first resistor R1
Value.
As shown in Fig. 2 first module 11 includes first resistor R1, second unit 12 includes second resistance R2,3rd resistor
R3, the 4th resistance R4, the 5th resistance R5, the 6th resistance R6, first switch T1, second switch T2, the 3rd switch T3 and the 4th are opened
Close T4.
Wherein, the first end of first resistor R1 connects the first signal input part Input1, and second end of first resistor R1 connects
Connect the first end of second resistance R2, the first end of the second end connection 3rd resistor R3 of second resistance R2, the of 3rd resistor R3
Two ends connect the first end of the 4th resistance R4, and second end of the 4th resistance R4 connects the first end of the 5th resistance R5, the 5th resistance
Second end of R5 connects the first end of the 6th resistance R6, and second end of the 6th resistance R6 connects secondary signal input Input2.
The two ends of first switch T1 connect the first end of second resistance R2 and the first end of the 6th resistance R6 respectively, and second opens
The two ends for closing T2 connect the first end of 3rd resistor R3 and the first end of the 6th resistance R6, the two ends difference of the 3rd switch T3 respectively
The first end of the 4th resistance R4 and the first end of the 6th resistance R6 are connected, the two ends of the 4th switch T4 connect the 5th resistance R5 respectively
First end and the 6th resistance R6 first end.
Now, when all switches are not turned on, the resistance of second unit 12 is second resistance R2,3rd resistor R3, the 4th
The resistance sum of resistance R4, the 5th resistance R5 and the 6th resistance R6；When first switch T1 is turned on, the resistance of second unit 12 is the
The resistance of six resistance R6；When second switch T2 is turned on, the resistance of second unit 12 is the resistance of second resistance R2 and the 6th resistance R6
Value sum；When 3rd switch T3 is turned on, the resistance of second unit 12 is second resistance R2,3rd resistor R3 and the 6th resistance R6
Resistance sum；When 4th switch T4 is turned on, the resistance of second unit 12 is second resistance R2,3rd resistor R3, the 4th resistance R4
With the resistance sum of the 6th resistance R6；When all switches are not turned on, the resistance of second unit 12 is second resistance R2, the 3rd electricity
Resistance R3, the 4th resistance R4, the resistance sum of the 5th resistance R5 and the 6th resistance R6.It should be noted that the conducting situation of switch
It is not limited to the above several, several switch conductions and specifically which those skilled in the art can according to actual needs select
Switch conduction, and then adjust the resistance of second unit 12.
Further, the second branch road 2 includes the 7th resistance R7, and the first end of the 7th resistance R7 connects the first signal input
End, the second end connection under test line 3 of the 7th resistance R7, the resistance of the 7th resistance R7 is equal to the resistance of first resistor R1.
It should be noted that embodiment of the present invention middle impedance test circuit is not limited to both the above, in actual test mistake
Cheng Zhong, those skilled in the art can also according to the above can to the resistance and number of the resistance in second unit 12, open
The number of pass is adjusted, so that the resistance adjustable extent for needing second unit 12 is obtained, to realize more accurately determining treating
The purposes such as the impedance ranges of measurement circuit.
Exemplarily, when under test line 4 is the cabling between printed circuit board (PCB) and integrated drive electronics on mobile phone,
Even if with above two testing impedance circuit test RFPC+RFOG+RITO+RCOGWhen, due to usually requiring that RFPC+RFOG+RITO+RCOG's
Impedance ranges are 100+/- 10ohm, therefore, preferred second resistance R2,3rd resistor R3, the 4th resistance R4 in the embodiment of the present invention
10ohm is with the resistance of the 5th resistance R5, the resistance of the 6th resistance R6 is 80ohm, so that second unit 12
Resistance can be 80ohm, 90ohm, 100ohm, 110ohm and 120ohm.
In addition, in RFPC+RFOG+RITO+RCOGImpedance ranges test process in, preferably the first signal input part Input1's
Voltage is 1.8V, secondary signal input Input2 ground connection.
Alternatively, first switch T1, second switch T2, the 3rd switch T3 and the 4th for being mentioned in all of above implementation method
Switch T4 is thin film transistor (TFT).Now, connection needs the two ends for turning on respectively for the source electrode of thin film transistor (TFT) and drain electrode, and grid connects
Signal input part is connect, the signal being input into by signal input part controls the conducting and cut-off of thin film transistor (TFT).
Alternatively, as depicted in figs. 1 and 2, the comparator C in the embodiment of the present invention is preferably voltage comparator, first segment
The "+" input of point connection voltage comparator, Section Point connects the "-" input of voltage comparator.When "+" input terminal voltage
Higher than "-" input terminal voltage when, voltage comparator output high level；When "+" input terminal voltage is less than "-" input terminal voltage
When, voltage comparator output low level.Now, testing impedance circuit test R as shown in Figure 1 is usedFPC+RFOG+RITO+RCOG's
Impedance ranges, and second resistance R2,3rd resistor R3, the resistance of the 4th resistance R4 and the 5th resistance R5 are 10ohm, the 6th electricity
When the resistance for hindering R6 is 80ohm, if any one switch conduction, the resistance of second unit 12 is 110ohm, comparator C1 outputs
Low level, then illustrate RFPC+RFOG+RITO+RCOGLess than 110ohm；Any three switch conductions, the resistance of second unit 12 is
90ohm, comparator C1 export high level, then illustrate RFPC+RFOG+RITO+RCOGMore than 90ohm；Now, RFPC+RFOG+RITO+RCOG
Standard resistance range meet be actually needed.
Additionally, the testing impedance circuit shown in Fig. 1 and Fig. 2 also includes two test probe (not shown)s, tested
Cheng Zhong, the second end of the second branch road 2 connects the first end of under test line 3, another test probe by a test probe
The second end for making under test line 3 connects the first signal input part Input1 or secondary signal input Input2.
Also, it should be noted that resistance and reactance are collectively referred to as impedance, each electricity in the branch road 2 of tie point 1 and second
When element is resistance, when the two ends of tie point 1 are direct current signal, the resistance of under test line 3 can be tested；When tie point 1
During with each electricity component in the second branch road 2 for electric capacity, when the two ends of tie point 1 are AC signal, can also test to be measured
Try the reactance of circuit 3.
A kind of testing impedance circuit as described above is the embodiment of the invention provides, it is multiple using the testing impedance circuit test
During the impedance of miscellaneous cabling, the signal exported by comparator is that the size of the voltage that can determine that first node and Section Point is closed
System, because the impedance of the second branch road is equal to the impedance of first module, and then can be derived that the impedance of second unit and line to be tested
Magnitude relationship between the impedance on road, further, since the impedance adjustable of second unit, therefore can be by adjusting second unit
Impedance, when test second unit has multiple difference impedances, the change of the signal of comparator output, and then obtain second unit
Magnitude relationship between impedance and the impedance of under test line, and then draw the impedance ranges of under test line.
Additionally, the embodiment of the present invention additionally provides a kind of integrated drive electronics, the integrated drive electronics includes any of the above
Plant the testing impedance circuit described in implementation method.Now, first resistor R1 and the 7th resistance R7 is the interior of integrated drive electronics
Resistance.
Further, integrated drive electronics can also include mode selective structure, and mode selective structure is used to adjust integrated
Drive circuit is in testing impedance pattern or drive signal output mode.Wherein, when display device normally shows, integrated drive
Dynamic circuit is in drive signal output mode, and now the electricity component for output drive signal works；Shown when test is needed
During the overall impedance of the cabling in device between printed circuit board (PCB) and integrated drive electronics, integrated drive electronics is in testing impedance
Pattern, now, the electricity component work in testing impedance circuit.
Finally, the embodiment of the present invention additionally provides a kind of display device, and the display device includes above-described integrated drive
Dynamic circuit.Specifically, the display device can be：Liquid crystal panel, Electronic Paper, organic electroluminescence display panel, mobile phone, flat board electricity
Any product or part with display function such as brain, television set, display, notebook computer, DPF, navigator.
Through the above description of the embodiments, it is apparent to those skilled in the art that the present invention can be borrowed
Software is helped to add the mode of required common hardware to realize, naturally it is also possible to which by hardware, but the former is more preferably in many cases
Implementation method.Based on such understanding, the portion that technical scheme substantially contributes to prior art in other words
Dividing can be embodied in the form of software product, and the computer software product is stored in the storage medium that can read, and such as be counted
The floppy disk of calculation machine, hard disk or CD etc., including some instructions are used to so that computer equipment (can be personal computer,
Server, or the network equipment etc.) perform method described in each embodiment of the invention.
The above, specific embodiment only of the invention, but protection scope of the present invention is not limited thereto, and it is any
Those familiar with the art the invention discloses technical scope in, change or replacement can be readily occurred in, should all contain
Cover within protection scope of the present invention.Therefore, protection scope of the present invention should be based on the protection scope of the described claims.
Claims (13)
1. a kind of testing impedance circuit, it is characterised in that including tie point, the second branch road and comparator；
The two ends of the tie point connect the first signal input part and secondary signal input respectively, and the tie point includes
The tie point of the first module and second unit being serially connected, the first module and the second unit is first node, institute
The impedance for stating first module is fixed, the impedance adjustable of the second unit；
First end connection first signal input part or the secondary signal input of second branch road, test process
In, the second end of second branch road connects the first end of under test line, and the second end connection of the under test line is described
The tie point of secondary signal input or first signal input part, the under test line and second branch road is the
Two nodes, the resistance of second branch road is fixed, and second branch road impedance be equal to the first module impedance；
The first node connects an input of the comparator, and the Section Point connects another of the comparator
Input.
2. testing impedance circuit according to claim 1, it is characterised in that
The first module includes first resistor, and the second unit includes second resistance, 3rd resistor, the 4th resistance, the 5th
Resistance, the 6th resistance, first switch, second switch, third switch and the 4th switch；
The first end of the first resistor connects first signal input part, the second end connection of the first resistor described the
The first end of two resistance, the second end of the second resistance connects the first end of the 3rd resistor, and the of the 3rd resistor
Two ends connect the first end of the 4th resistance, and the second end of the 4th resistance connects the first end of the 5th resistance, institute
The second end for stating the 5th resistance connects the first end of the 6th resistance, the second end connection second letter of the 6th resistance
Number input；
The two ends of the first switch connect first end and second end of the second resistance, the two ends of the second switch respectively
First end and second end of the 3rd resistor are connected respectively, and the two ends of the 3rd switch connect the 4th resistance respectively
First end and the second end, the two ends of the 4th switch connect first end and second end of the 5th resistance respectively.
3. testing impedance circuit according to claim 1, it is characterised in that
The first module includes first resistor, and the second unit includes second resistance, 3rd resistor, the 4th resistance, the 5th
Resistance, the 6th resistance, first switch, second switch, third switch and the 4th switch；
The first end of the first resistor connects first signal input part, the second end connection of the first resistor described the
The first end of two resistance, the second end of the second resistance connects the first end of the 3rd resistor, and the of the 3rd resistor
Two ends connect the first end of the 4th resistance, and the second end of the 4th resistance connects the first end of the 5th resistance, institute
The second end for stating the 5th resistance connects the first end of the 6th resistance, the second end connection second letter of the 6th resistance
Number input；
The two ends of the first switch connect the first end of the second resistance and the first end of the 6th resistance respectively, described
The two ends of second switch connect the first end of the 3rd resistor and the first end of the 6th resistance, the 3rd switch respectively
Two ends connect the first end of the 4th resistance and the first end of the 6th resistance respectively, the two ends point of the 4th switch
The first end of the 5th resistance and the first end of the 6th resistance are not connected.
4. the testing impedance circuit according to Claims 2 or 3, it is characterised in that
Second branch road includes the 7th resistance, and the first end of the 7th resistance connects first signal input part, described
Second end of the 7th resistance connects the under test line, and the resistance of the 7th resistance is equal to the resistance of the first resistor.
5. testing impedance circuit according to claim 4, it is characterised in that
The resistance of the second resistance, the 3rd resistor, the 4th resistance and the 5th resistance is 10ohm, described
The resistance of the 6th resistance is 80ohm.
6. testing impedance circuit according to claim 4, it is characterised in that
The voltage of first signal input part is 1.8V, the secondary signal input end grounding.
7. the testing impedance circuit according to Claims 2 or 3, it is characterised in that
The first switch, the second switch, the 3rd switch and the 4th switch are thin film transistor (TFT).
8. testing impedance circuit according to claim 1, it is characterised in that the comparator is voltage comparator, described
First node connects the "+" input of the voltage comparator, and the Section Point connects the "-" input of voltage comparator.
9. testing impedance circuit according to claim 1, it is characterised in that also including two test probes, test process
In, the second end of second branch road connects the first end of the under test line by a test probe, another
The test probe is used to make the second end of the under test line to connect first signal input part or second letter
Number input.
10. a kind of integrated drive electronics, it is characterised in that including the testing impedance circuit as described in claim any one of 1-9.
11. integrated drive electronics according to claim 10, it is characterised in that first resistor and the 7th resistance are integrated drive
The internal resistance of dynamic circuit.
12. integrated drive electronics according to claim 10 or 11, it is characterised in that also including mode selective structure, institute
State mode selective structure and be in testing impedance pattern or drive signal output mode for adjusting the integrated drive electronics.
13. a kind of display devices, it is characterised in that including the integrated drive electronics as described in claim any one of 10-12.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410643549.2A CN104318881B (en) | 2014-11-10 | 2014-11-10 | A kind of testing impedance circuit, integrated drive electronics and display device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410643549.2A CN104318881B (en) | 2014-11-10 | 2014-11-10 | A kind of testing impedance circuit, integrated drive electronics and display device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104318881A CN104318881A (en) | 2015-01-28 |
| CN104318881B true CN104318881B (en) | 2017-06-23 |
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| US6566857B1 (en) * | 1999-12-20 | 2003-05-20 | Intel Corporation | Testing of digital-to-analog converters |
| US6650173B1 (en) * | 1999-11-16 | 2003-11-18 | Stmicroelectronics S.R.L. | Programmable voltage generator |
| CN1750101A (en) * | 2004-09-13 | 2006-03-22 | 凌阳科技股份有限公司 | Source driver of built-in detecting circuit and its detecting method |
| CN101430849A (en) * | 2007-11-09 | 2009-05-13 | 奇景光电股份有限公司 | Test device for display driving circuit |
| CN102511010A (en) * | 2009-09-24 | 2012-06-20 | 罗伯特·博世有限公司 | Electric circuit configuration for switching an electrical load |
| CN103116378A (en) * | 2013-01-11 | 2013-05-22 | 北京经纬恒润科技有限公司 | Analog circuit with variable resistance |
| CN203705582U (en) * | 2014-02-21 | 2014-07-09 | 山东华芯富创电子科技有限公司 | Test circuit for open circuit of conducting circuit |
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- 2014-11-10 CN CN201410643549.2A patent/CN104318881B/en not_active Expired - Fee Related
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
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| US6650173B1 (en) * | 1999-11-16 | 2003-11-18 | Stmicroelectronics S.R.L. | Programmable voltage generator |
| US6566857B1 (en) * | 1999-12-20 | 2003-05-20 | Intel Corporation | Testing of digital-to-analog converters |
| CN1750101A (en) * | 2004-09-13 | 2006-03-22 | 凌阳科技股份有限公司 | Source driver of built-in detecting circuit and its detecting method |
| CN101430849A (en) * | 2007-11-09 | 2009-05-13 | 奇景光电股份有限公司 | Test device for display driving circuit |
| CN102511010A (en) * | 2009-09-24 | 2012-06-20 | 罗伯特·博世有限公司 | Electric circuit configuration for switching an electrical load |
| CN103116378A (en) * | 2013-01-11 | 2013-05-22 | 北京经纬恒润科技有限公司 | Analog circuit with variable resistance |
| CN203705582U (en) * | 2014-02-21 | 2014-07-09 | 山东华芯富创电子科技有限公司 | Test circuit for open circuit of conducting circuit |
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| CN104318881A (en) | 2015-01-28 |
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