CN209070021U - A kind of capacitance test circuit - Google Patents

A kind of capacitance test circuit Download PDF

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Publication number
CN209070021U
CN209070021U CN201821331016.0U CN201821331016U CN209070021U CN 209070021 U CN209070021 U CN 209070021U CN 201821331016 U CN201821331016 U CN 201821331016U CN 209070021 U CN209070021 U CN 209070021U
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Prior art keywords
variable connector
tester
capacitance
capacitor
cable
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CN201821331016.0U
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Chinese (zh)
Inventor
张俊
张杨
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CETC 32 Research Institute
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CETC 32 Research Institute
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Abstract

The utility model provides a kind of capacitance test circuit, comprising: variable connector controller, computer, capacitor leakage current tester, LCR tester and high temperature ageing plate;The variable connector controller is installed on the high temperature ageing plate, the variable connector controller connects the computer by first communications cable, the computer connects the capacitor leakage current tester and the LCR tester by second communications cable, and the capacitor leakage current tester passes through test cable respectively with the LCR tester and connects the variable connector controller.The utility model circuit structure is simple, low in cost, directly using high temperature ageing plate as the carrier of capacity measurement, without dismantling capacitor from high temperature ageing plate, avoiding multiple dismounting may cause the consequences such as loss and the damage of capacitor, improve the reliability of test result.

Description

A kind of capacitance test circuit
Technical field
The utility model relates to electronic circuit fields, and in particular, to a kind of capacitance test circuit.
Background technique
Capacitor is one of most popular base electronic component of electronic and electrical equipment, be widely used in circuit every Directly, lead to hand over, couple, bypass, filter etc., almost all of electronic and electrical equipment is required using capacitor.
With the rapid development of industrial technology, electronic and electrical equipment is higher and higher to the quality and quantity demand of capacitor.It is special It is not in military equipment field, it is essential for working for the screening test of capacitor, and the quality of capacitor directly influences force The reliability of device equipment, therefore country is higher and higher to the testing requirement of capacitor.It needs to carry out capacitor before capacity measurement High-temperature circulation test is needed to disassemble capacitor from high temperature ageing plate, then be surveyed to capacitor after test is completed Examination.The process is not only cumbersome, but also multiple dismounting may cause the consequences such as loss and the damage of capacitor, and by many people For uncontrollable factor interference, cause testing reliability seriously to reduce.Obviously current means of testing can no longer meet capacitor The demand of test.
Utility model content
For the defects in the prior art, the purpose of the utility model is to provide a kind of capacitance test circuits.
According to a kind of capacitance test circuit provided by the utility model, comprising: variable connector controller, computer, capacitor Leakage current tester, LCR tester and high temperature ageing plate;
The variable connector controller is installed on the high temperature ageing plate, and the variable connector controller is logical by first Believe that cable connects the computer, the computer connects the capacitor leakage current tester and described by second communications cable LCR tester, the capacitor leakage current tester and the LCR tester pass through test cable respectively and connect the variable connector Controller.
Preferably, first communications cable includes RS232 communication cable.
Preferably, second communications cable includes GPIB cable.
Preferably, the high temperature ageing plate includes 10 units, each unit includes 16 capacitor mounting portions, each unit 16 testing capacitance common ground connections of middle installation.
Preferably, the variable connector controller includes 160 path switching circuits and 170 probes, wherein 160 probes with 160 path switching circuits connect one to one, and 160 probes are pressed respectively against the top of testing capacitance in the capacitor mounting portion End, in addition 10 probes are separately connected the unit, the bottom end as testing capacitance.
A kind of capacitance test circuit provided according to the present invention, comprising: variable connector controller, computer, capacity fall off Current test instrument, LCR tester and high temperature ageing plate;
The variable connector controller is installed on the high temperature ageing plate, and the variable connector controller is logical by first Believe that cable connects the computer, the computer connects the capacitor leakage current tester and described by second communications cable LCR tester, the capacitor leakage current tester and the LCR tester pass through test cable respectively and connect the variable connector Controller;
The high temperature ageing plate includes 10 units, and each unit includes 16 capacitor mounting portions, is installed in each unit 16 testing capacitance common ground connections;
The variable connector controller includes 160 path switching circuits and 170 probes, wherein 160 probes are opened with 160 tunnels Powered-down road connects one to one, and 160 probes are pressed respectively against the top of testing capacitance in the capacitor mounting portion, in addition 10 probes are separately connected the unit, the bottom end as testing capacitance.
Preferably, first communications cable includes RS232 communication cable.
Preferably, second communications cable includes GPIB cable.
Compared with prior art, the utility model have it is following the utility model has the advantages that
The utility model circuit structure is simple, low in cost, directly using high temperature ageing plate as the load of capacity measurement Body avoids after multiple dismounting may cause loss and damage of capacitor etc. without dismantling capacitor from high temperature ageing plate Fruit improves the reliability of test result.
It is further on the basis of the utility model to be improved, so that it may to realize a plurality of types of automatic tests, greatly Testing efficiency is improved greatly, saves a large amount of time cost and human cost.
Detailed description of the invention
Upon reading the detailed description of non-limiting embodiments with reference to the following drawings, other spies of the utility model Sign, objects and advantages will become more apparent upon:
Fig. 1 is the structural schematic diagram of the utility model;
Fig. 2 is the working principle diagram of the utility model;
Fig. 3 is the utility model capacitance and the test result schematic diagram that angular dimensions is lost;
Fig. 4 is the test result schematic diagram of the utility model capacitor leakage current parameter.
Specific embodiment
The utility model is described in detail combined with specific embodiments below.Following embodiment will be helpful to this field Technical staff further understands the utility model, but does not limit the utility model in any form.It should be pointed out that ability For the those of ordinary skill in domain, without departing from the concept of the premise utility, several changes and improvements can also be made. These are all within the protection scope of the present invention.
As shown in Figure 1, a kind of capacitance test circuit provided by the utility model, comprising: variable connector controller calculates Mechanical, electrical appearance leakage current tester, LCR tester and high temperature ageing plate.
Variable connector controller is installed on high temperature ageing plate, and variable connector controller passes through first communications cable connection meter Calculation machine, computer connect capacitor leakage current tester and LCR tester by second communications cable, capacitor leakage current tester and LCR tester passes through test cable connection variable connector controller respectively.
In the present embodiment, first communications cable uses RS232 communication cable, and second communications cable uses GPIB cable.
High temperature ageing plate includes 10 units, and each unit includes 16 capacitor mounting portions, 16 installed in each unit A testing capacitance common ground connection.Variable connector controller includes 160 path switching circuits and 170 probes, wherein 160 probes with 160 path switching circuits connect one to one, and 160 probes are pressed respectively against the top of testing capacitance in a capacitor mounting portion, Other 10 probes are separately connected a unit, the bottom end as testing capacitance.The test for thus constituting 160 tunnels altogether is returned Road.
As shown in Fig. 2, the present embodiment is further improved it on the basis of above-mentioned capacitance test circuit, provide A kind of application method is as follows:
Ceramic condenser (nominal capacity 10nF, range of capacity 10%, the specified electricity that encapsulation specification for certain model is 0603 50V is pressed, leakage current carries out the test of capacitance, loss angle and leakage current no more than 0.05uA).
Step 1: testing capacitance is installed on high temperature ageing plate;
Step 2: according to shown in attached drawing 1, variable connector controller is installed on high temperature ageing plate, passes through RS232 serial ports It is connect with computer;Computer connects LCR tester and capacitor leakage current tester by GPIB cable;LCR tester and electricity The test port for holding leakage current tester is separately connected variable connector controller, forms capacitor automatization test system;
Step 3: starting variable connector controller, tester and computer are in normal operating conditions;
Step 4: testing capacitor capacity and loss angular dimensions set selection LCR tester in computer interface (E4980A), capacitance 10nF, measures criterion 10%, and computer control variable connector controller is respectively turned on 10 test cells 160 way switch circuits, while LCR tester to the test loop carry out capacity and loss angle parameter testing, successively will survey Examination data are sent to computer, and computer records test data, stores and processs, and marks to unqualified data Note.Test result is as shown in Fig. 3.The results show that the capacitance value range of measured capacitance is 9.5nF-10.6nF, angular region is lost For 1%-1.2%, meet parameter request as defined in model.
Step 5: testing capacitor leakage current parameter sets selection capacitor leakage current tester in computer interface (TH2689), charging voltage 50V, charging time 10s, charging current 1mA, acceptable criterion are set, 0.05uA is set.Charged state When, 160 way switch circuits of variable connector controller all turn on, while charging to 160 capacitors;When test mode, 160 way switch circuits of variable connector controller are all ended, and only conducting needs switching circuitry to be tested, capacity fall off current test Instrument carries out leakage current parameter testing to the capacitor of the switching circuitry, and test data is sent to computer, until all capacitors It is completed;When discharge condition, 160 way switch circuits are all turned on, and 160 capacitors pass through putting inside variable connector controller Resistance discharges.Test result is as shown in Fig. 4.The results show that the leakage current of measured capacitance is respectively less than 0.05uA, meet Parameter request as defined in model.
When carrying out capacitor leakage current parameter testing, the high efficiency of capacitor automatization test system is available to be fully demonstrated. Since 160 capacitors are to carry out charge and discharge simultaneously, the charge and discharge time only needs altogether 30s or so, the test of 160 capacitors Time is 1s/, is altogether 160s.Therefore, all capacity measurement completions only need clock more than three points.However, 160 electricity of manual testing The mean test time for holding leakage current parameter is more than two hours.To sum up comparison is it is found that effectiveness of the invention and high efficiency obtain To fully demonstrating.
In the description of the present application, it is to be understood that term " on ", "front", "rear", "left", "right", " is erected at "lower" Directly ", the orientation or positional relationship of the instructions such as "horizontal", "top", "bottom", "inner", "outside" is orientation based on the figure or position Relationship is set, description the application is merely for convenience of and simplifies description, rather than the device or element of indication or suggestion meaning are necessary It with specific orientation, is constructed and operated in a specific orientation, therefore should not be understood as the limitation to the application.
Specific embodiment of the utility model is described above.It is to be appreciated that the utility model not office It is limited to above-mentioned particular implementation, those skilled in the art can make a variety of changes or modify within the scope of the claims, This has no effect on the substantive content of the utility model.In the absence of conflict, the spy in embodiments herein and embodiment Sign can be arbitrarily combined with each other.

Claims (8)

1. a kind of capacitance test circuit characterized by comprising variable connector controller, computer, capacity fall off current test Instrument, LCR tester and high temperature ageing plate;
The variable connector controller is installed on the high temperature ageing plate, and the variable connector controller passes through the first communication line Cable connects the computer, and the computer connects the capacitor leakage current tester and the LCR by second communications cable Tester, the capacitor leakage current tester and the LCR tester pass through test cable respectively and connect the variable connector control Device processed.
2. capacitance test circuit according to claim 1, which is characterized in that first communications cable includes RS232 logical Interrogate cable.
3. capacitance test circuit according to claim 1, which is characterized in that second communications cable includes GPIB line Cable.
4. capacitance test circuit according to claim 1, which is characterized in that the high temperature ageing plate includes 10 units, Each unit includes 16 capacitor mounting portions, the 16 testing capacitance common ground connections installed in each unit.
5. capacitance test circuit according to claim 4, which is characterized in that the variable connector controller includes 160 tunnels Switching circuit and 170 probes, wherein 160 probes connect one to one with 160 path switching circuits, and 160 probe difference It is pressed in the top of testing capacitance in the capacitor mounting portion, in addition 10 probes are separately connected the unit, as The bottom end of testing capacitance.
6. a kind of capacitance test circuit characterized by comprising variable connector controller, computer, capacity fall off current test Instrument, LCR tester and high temperature ageing plate;
The variable connector controller is installed on the high temperature ageing plate, and the variable connector controller passes through the first communication line Cable connects the computer, and the computer connects the capacitor leakage current tester and the LCR by second communications cable Tester, the capacitor leakage current tester and the LCR tester pass through test cable respectively and connect the variable connector control Device processed;
The high temperature ageing plate includes 10 units, and each unit includes 16 capacitor mounting portions, 16 installed in each unit A testing capacitance common ground connection;
The variable connector controller includes 160 path switching circuits and 170 probes, wherein 160 probes and 160 way switch electricity Road connects one to one, and 160 probes are pressed respectively against the top of testing capacitance in the capacitor mounting portion, and in addition 10 Probe is separately connected the unit, the bottom end as testing capacitance.
7. capacitance test circuit according to claim 6, which is characterized in that first communications cable includes RS232 logical Interrogate cable.
8. capacitance test circuit according to claim 6, which is characterized in that second communications cable includes GPIB line Cable.
CN201821331016.0U 2018-08-17 2018-08-17 A kind of capacitance test circuit Active CN209070021U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201821331016.0U CN209070021U (en) 2018-08-17 2018-08-17 A kind of capacitance test circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201821331016.0U CN209070021U (en) 2018-08-17 2018-08-17 A kind of capacitance test circuit

Publications (1)

Publication Number Publication Date
CN209070021U true CN209070021U (en) 2019-07-05

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110320429A (en) * 2019-07-11 2019-10-11 南通海美电子有限公司 A kind of fuse ageing and screening method
CN110879314A (en) * 2019-12-12 2020-03-13 苏州市运泰利自动化设备有限公司 Capacitance measuring method, capacitance measuring system, electronic device, and storage medium

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110320429A (en) * 2019-07-11 2019-10-11 南通海美电子有限公司 A kind of fuse ageing and screening method
CN110879314A (en) * 2019-12-12 2020-03-13 苏州市运泰利自动化设备有限公司 Capacitance measuring method, capacitance measuring system, electronic device, and storage medium

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