CN203705582U - Test circuit for open circuit of conducting circuit - Google Patents
Test circuit for open circuit of conducting circuit Download PDFInfo
- Publication number
- CN203705582U CN203705582U CN201420075069.6U CN201420075069U CN203705582U CN 203705582 U CN203705582 U CN 203705582U CN 201420075069 U CN201420075069 U CN 201420075069U CN 203705582 U CN203705582 U CN 203705582U
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- circuit
- voltage
- voltage comparator
- conducting wire
- test
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Abstract
The utility model discloses a test circuit for open circuit of a conducting circuit. The test circuit comprises a pair of testing terminals, a reference potential circuit, a voltage comparator and an indicating circuit, wherein the pair of testing terminals is used for outputting a tested voltage aiming at two selected points matched with a target circuit; the reference potential circuit outputs a reference voltage; an input end of the voltage comparator respectively accesses the tested voltage and the reference voltage, and sends out a switching value; and the indicating circuit comprises a driving unit and an indicating unit which is connected with the driving unit through a switching circuit, and the switching circuit is connected with the voltage comparator and is triggered by the switching value. According to the test circuit, the open circuit defect can be tested in a relatively accurate manner.
Description
Technical field
The utility model relates to a kind of test circuit for conducting wire out of circuit test.
Background technology
The general reference that opens circuit circuit does not have that Closing Switch, wire do not connect, electrical appliance burns out or there is no mounted state, and namely circuit disconnects somewhere.Opening circuit herein instructs electric line to disconnect this state.
The detection of opening circuit at present to be adopted as multimeter select the whether test of conducting of two points, this test operation relatively trouble of getting up, and individual bigger than normal, it operates follows operating personnel's experience to have much relations.
Adopt the restriction of carrying out out of circuit test and can be subject to tested object as multimeter, as ITO(nano indium tin) conducting film, form the sense wire (touch sensor) as contact panel thereon by processing procedure, sense wire width is relatively narrow, and protect mutually intersection, adopt multimeter to measure not only reconnaissance and forbidden, and easily damage the ITO conducting film that Thickness Ratio is thinner.
On the other hand, processing procedure quality be not only open circuit (resistance infinity) can simply judge, when resistance exceedes preset value often, just think product defectiveness, but the precision of multimeter is not high, especially measure the contact resistance producing, and the defect of multimeter itself, cause and cannot accurately judge whether target site exists product defects.
Summary of the invention
The test circuit that provides a kind of conducting wire to open circuit is provided the purpose of this utility model, can be relatively accurate test out open defect.
The technical solution adopted in the utility model is:
The test circuit opening circuit in conducting wire, comprising:
A pair of calibrating terminal, for for 2 selected points of objective circuit coupling, exports a tested voltage;
Reference potential circuit, exports a reference voltage;
Voltage comparator, input end accesses respectively tested voltage and reference voltage, sends a switching value; And
Indicating circuit, comprises driver element and the indicating member that is connected this driving power by on-off circuit, and wherein on-off circuit connects described voltage comparator and triggered by described switching value.
Can find out from said structure, build take voltage comparator as core according to the utility model, can compare the size of two voltages, and the result of output after relatively drives indicating circuit, voltage ratio has highly sensitive feature than single absolute value measurement, does not need to read concrete value, weakens with the engagement state relevance of calibrating terminal, operation is relatively more directly simple, and avoids the damage to measurand.
The test circuit opening circuit in above-mentioned conducting wire, a kind of structure of simplification is, described on-off circuit is a triode, the base stage of this triode connects described voltage comparator, collector connects driver element, and emitter connects indicating member, utilizes the switching characteristic of triode, simple in structure, can simplify overall structure.
In the structure of further simplifying, described indicating member is light emitting diode, charactron or audio output unit.
The test circuit opening circuit in above-mentioned conducting wire, described reference potential circuit is the bleeder circuit based on resistance in series, one Nodes of its series connection is drawn described reference voltage, and access "+" pin of voltage comparator, by resistors match and adjustment, in the face of different tests, there is more intense adaptability.
The test circuit opening circuit in above-mentioned conducting wire, a kind of structure of simplification is, and the resistance of described bleeder circuit has two, and reference voltage is drawn from the node between two resistance.
The test circuit opening circuit in above-mentioned conducting wire, also comprise pull-up circuit, this pull-up circuit is the pull-up circuit based on resistance in series, the tested voltage of calibrating terminal output is added in a node of pull-up circuit, by drawing in feeble signal, and adapt to different tested objects by the coupling of resistance with adjusting.
The test circuit opening circuit in above-mentioned conducting wire, for improving sensitivity and antijamming capability, also comprise the positive-feedback circuit that accesses described voltage comparator, this positive-feedback circuit input connects the output terminal of voltage comparator, and output connects power positive end of voltage comparator.
Accompanying drawing explanation
Fig. 1 is the circuit theory diagrams of the test circuit that opens circuit according to a kind of conducting wire of the present utility model.
Embodiment
Because scheme is relatively simple, with a specific embodiment, design of the present utility model is described below, disclose best effect.
With reference to explanation accompanying drawing 1, its core is a voltage comparator, certainly be generally encapsulated as a chip structure, conventionally contain multiple inputs and multiple output, in this case, can select to only have the voltage comparator chip of a pair of input and output, also can select the voltage comparator chip of many groups input and output, as LM339, when can carrying out multiple target, measure simultaneously.
Voltage comparator is that input signal is differentiated and circuit relatively, what Fig. 1 circuit middle part isosceles triangle represented is the graphical symbol of voltage comparator, it has power pins, the pin of isosceles triangle top in figure (connecting VCC) and following pin (being ground connection in figure).The left side is input pin, and the right is output pin.
Voltage comparator can be regarded as enlargement factor and approaches the operational amplifier of " infinity ".
The function of voltage comparator: the relatively size of two voltages (with the high or low level of output voltage, representing the magnitude relationship of two input voltages):
As shown in the figure, when "+" input terminal voltage higher than "-" when input end, voltage comparator is output as high level;
When "+" input terminal voltage lower than "-" when input end, voltage comparator is output as low level.
Because the output of comparer only has low level and high level two states, so integrated transporting discharging wherein is often operated in inelastic region.From circuit structure, amplifier, often in open loop situations, is again that the conversion in order to make comparer output state is quicker, to improve response speed, generally in circuit, accesses positive feedback.Specifically, referring to accompanying drawing 1, in figure, the circuit at resistance R 6 places, picks out from the output pin of voltage comparator, and feedback end connects the power positive end of voltage comparator.
In circuit, except resistance R 6, also have 5 resistance, wherein resistance R 1 ~ R4 obtaining for voltage comparator source signal.Be described below respectively:
A pair of calibrating terminal, indicates S1 in figure, negative pole end ground connection, formation output signal falls in positive terminal voltage-to-ground, then use resistance R 3 and resistance R 4 and power supply VCC to carry out drawing on voltage, resistance R 4 forms pull-up resistor, by adjusting resistance R3 and resistance R 4 to adapt to different tested objects.
Another is to resistance, and namely 2 of resistance R 1 and resistance R are for reference point position is provided, and output connects "+" pin of voltage comparator.
Resistance R 1 and resistance R 2 are connected, and by dividing potential drop, set the current potential of "+" pin.
Two resistance cascaded structures are fairly simple, can meet the setting of respective nodes current potential completely by adjusting simultaneously.
A level of voltage comparator output, be called a switching value, for trigger switch circuit, and then drive indicating member, on-off circuit numerous and complicated, comparative maturity, selects a triode at this, simple in structure, its connected mode is as shown in Fig. 1 the right, base stage connects described voltage comparator, and collector connects driver element, and emitter connects indicating member.
In figure, resistance R 5 is given collector voltages, with matched load, and the namely resistance of indicating member.
About indicating member, can select any in sound and light alarm, as the light on and off of LED lamp or hummer, toy trumpet, audible sound judges whether to open circuit.Complexity a bit, can adopt charactron or LCD screen display to show result a little.Due to relatively simple for structure, can select the simple components as hummer.
Claims (7)
1. the test circuit that open circuit in conducting wire, is characterized in that, comprising:
A pair of calibrating terminal, for for 2 selected points of objective circuit coupling, exports a tested voltage;
Reference potential circuit, exports a reference voltage;
Voltage comparator, input end accesses respectively tested voltage and reference voltage, sends a switching value; And
Indicating circuit, comprises driver element and the indicating member that is connected this driving power by on-off circuit, and wherein on-off circuit connects described voltage comparator and triggered by described switching value.
2. the test circuit that open circuit in conducting wire according to claim 1, is characterized in that, described on-off circuit is a triode, and the base stage of this triode connects described voltage comparator, and collector connects driver element, and emitter connects indicating member.
3. the test circuit that open circuit in conducting wire according to claim 1 and 2, is characterized in that, described indicating member is light emitting diode, charactron or audio output unit.
4. the test circuit that open circuit in conducting wire according to claim 1, is characterized in that, described reference potential circuit is the bleeder circuit based on resistance in series, and a Nodes of its series connection is drawn described reference voltage, and accesses "+" pin of voltage comparator.
5. the test circuit that open circuit in conducting wire according to claim 4, is characterized in that, the resistance of described bleeder circuit has two, and reference voltage is drawn from the node between two resistance.
6. the test circuit that open circuit in conducting wire according to claim 1, is characterized in that, also comprises pull-up circuit, and this pull-up circuit is the pull-up circuit based on resistance in series, and the tested voltage of calibrating terminal output is added in a node of pull-up circuit.
7. the test circuit that open circuit in conducting wire according to claim 1, it is characterized in that, also comprise the positive-feedback circuit that accesses described voltage comparator, this positive-feedback circuit input connects the output terminal of voltage comparator, and output connects power positive end of voltage comparator.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420075069.6U CN203705582U (en) | 2014-02-21 | 2014-02-21 | Test circuit for open circuit of conducting circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420075069.6U CN203705582U (en) | 2014-02-21 | 2014-02-21 | Test circuit for open circuit of conducting circuit |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203705582U true CN203705582U (en) | 2014-07-09 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420075069.6U Expired - Fee Related CN203705582U (en) | 2014-02-21 | 2014-02-21 | Test circuit for open circuit of conducting circuit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203705582U (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104318881A (en) * | 2014-11-10 | 2015-01-28 | 京东方科技集团股份有限公司 | Impedance testing circuit, integrated driving circuit and display device |
| CN106066446A (en) * | 2016-06-29 | 2016-11-02 | 南京国电南自美卓控制系统有限公司 | A kind of multichannel analog amount input circuit break detection circuit and method |
| CN106841917A (en) * | 2017-01-19 | 2017-06-13 | 上海广为焊接设备有限公司 | Dominoes formula winding displacement test circuit and its method of testing |
| CN108896861A (en) * | 2018-08-24 | 2018-11-27 | 北京新能源汽车股份有限公司 | A kind of detection circuit and electric car in high-voltage interlocking circuit |
| CN109030916A (en) * | 2018-05-28 | 2018-12-18 | 国家电网公司 | Multifunction test pencil and cable measurement method |
| CN110261717A (en) * | 2019-07-15 | 2019-09-20 | 立讯精密工业（滁州）有限公司 | A kind of connector assembly test circuit and its test method |
| CN113341344A (en) * | 2021-05-11 | 2021-09-03 | Tcl王牌电器(惠州)有限公司 | Circuit on-off detection device |
-
2014
- 2014-02-21 CN CN201420075069.6U patent/CN203705582U/en not_active Expired - Fee Related
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104318881A (en) * | 2014-11-10 | 2015-01-28 | 京东方科技集团股份有限公司 | Impedance testing circuit, integrated driving circuit and display device |
| CN104318881B (en) * | 2014-11-10 | 2017-06-23 | 京东方科技集团股份有限公司 | A kind of testing impedance circuit, integrated drive electronics and display device |
| CN106066446A (en) * | 2016-06-29 | 2016-11-02 | 南京国电南自美卓控制系统有限公司 | A kind of multichannel analog amount input circuit break detection circuit and method |
| CN106841917A (en) * | 2017-01-19 | 2017-06-13 | 上海广为焊接设备有限公司 | Dominoes formula winding displacement test circuit and its method of testing |
| CN109030916A (en) * | 2018-05-28 | 2018-12-18 | 国家电网公司 | Multifunction test pencil and cable measurement method |
| CN108896861A (en) * | 2018-08-24 | 2018-11-27 | 北京新能源汽车股份有限公司 | A kind of detection circuit and electric car in high-voltage interlocking circuit |
| CN108896861B (en) * | 2018-08-24 | 2021-03-02 | 北京新能源汽车股份有限公司 | Detection circuit of high-voltage interlocking loop and electric automobile |
| CN110261717A (en) * | 2019-07-15 | 2019-09-20 | 立讯精密工业（滁州）有限公司 | A kind of connector assembly test circuit and its test method |
| CN113341344A (en) * | 2021-05-11 | 2021-09-03 | Tcl王牌电器(惠州)有限公司 | Circuit on-off detection device |
| CN113341344B (en) * | 2021-05-11 | 2023-02-17 | Tcl王牌电器(惠州)有限公司 | Circuit on-off detection device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140709 Termination date: 20170221 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |