CN209895333U

CN209895333U - Power supply testing device for hard disk backboard of server

Info

Publication number: CN209895333U
Application number: CN201920993816.7U
Authority: CN
Inventors: 廖明超
Original assignee: Suzhou Wave Intelligent Technology Co Ltd
Current assignee: Suzhou Wave Intelligent Technology Co Ltd
Priority date: 2019-06-28
Filing date: 2019-06-28
Publication date: 2020-01-03
Anticipated expiration: 2029-06-28

Abstract

The utility model provides a server hard disk backplate power testing arrangement, the device include a plurality of load boards, the load board on be provided with the first test circuit who is used for testing the 12V power to and be used for testing the second test circuit of 5V power, and be used for switching over first test circuit and second test circuit's change over switch. Heavy electronic loads are completely abandoned in the process of testing static or dynamic current, the carrying of a testing environment is facilitated, and more effective and convenient testing can be carried out on the multi-port hard disk backboard.

Description

Power supply testing device for hard disk backboard of server

Technical Field

The utility model discloses server technical field, concretely relates to server hard disk backplate power testing arrangement.

Background

With the development of cloud computing applications, informatization gradually covers various fields of society. People's daily life and daily life are more and more communicated through the network, and the network data volume is also increasing continuously. The number of hard disks, which are containers of data, is also increasing. Many large capacity storage servers are in operation to meet the demands for storage, processing and service of increasing amounts of data. Therefore, the reliability verification of the power supply of the hard disk backplane in the server becomes more important. The test of the hard disk backboard power supply is an important ring; a significant portion of the failures in server hard disks are due to power supply instability. The power supply test and verification of the hard disk backboard with multiple hard disks in the current server system are very difficult due to the fact that the number of the hard disks is too variable.

Fig. 1 is a schematic diagram of an electrical structure of a backplane of a general server hard disk. A hard disk array consisting of 12 hard disks takes 12V and 5V of electricity on a power panel directly through a power supply line. When the hard disk backboard is tested, 12V and 5V on each hard disk interface on the backboard are required to be connected to an electronic load through cables respectively, and then the backboard is electrified to carry out related power supply test.

The above test method has the following defects:

1. the test environment is complicated to build:

in the whole test process, heavy electronic loads, oscilloscopes and other equipment are needed, and a soldering iron is needed to solder the power supply pin of each hard disk interface on the backboard to the cable, and then the power supply pin is connected to the electronic loads through the cable. If the number of the hard disks on the backboard is small, the method can be used, but if the number of the hard disk interfaces on the backboard of the storage type server is large, the test method is complex; but also requires multiple electronic loads.

2. The testing efficiency is low:

due to the fact that cables need to be welded in the testing process, electronic loads need to be connected, and 12V and 5V need to be connected with the testing respectively, the testing efficiency is low.

SUMMERY OF THE UTILITY MODEL

The utility model aims to solve the technical problem that to the not enough of above-mentioned prior art, provide a server hard disk backplate power testing arrangement.

The utility model provides a technical scheme that its technical problem adopted is:

the embodiment of the utility model provides a server hard disk backplate power testing arrangement, the device include a plurality of load boards, the load board on be provided with:

a first test circuit for testing a 12V power supply; and

the second test circuit is used for testing the 5V power supply; and

and a switch for switching the first test circuit and the second test circuit.

Furthermore, the first test circuit comprises an operational amplifier U1, a positive input end of the operational amplifier U1 is connected with a switch, a negative input end of the operational amplifier U1 is connected with a source electrode of a MOS transistor Q1, an output end of the operational amplifier U1 is connected with a grid electrode of a MOS transistor Q1 through a resistor R0, the source electrode of the MOS transistor Q1 is grounded through a resistor R1, and a drain electrode of the MOS transistor Q1 is connected with a 12V power supply.

Preferably, the operational amplifier U1 adopts TI OPA690 or Meixin MAX9651AUA +.

Preferably, the MOS transistor Q1 is an N-type enhancement mode fet.

Preferably, the first test circuit is connected with the 12V power interface through a gold finger.

Furthermore, the second test circuit comprises an operational amplifier U2, a positive input end of the operational amplifier U2 is connected with a switch, a negative input end of the operational amplifier U2 is connected with a source electrode of a MOS transistor Q2, an output end of the operational amplifier U2 is connected with a grid electrode of a MOS transistor Q2 through a resistor R3, the source electrode of the MOS transistor Q2 is grounded through a resistor R2, and a drain electrode of the MOS transistor Q2 is connected with a 5V power supply.

Preferably, the second test circuit is connected with the 5V power interface through a golden finger.

Preferably, the operational amplifier U2 adopts TI OPA690 or Meixin MAX9651AUA +.

Preferably, the MOS transistor Q2 is an N-type enhancement mode fet.

The utility model has the advantages that:

heavy electronic loads are completely abandoned in the process of testing static or dynamic current, the carrying of a testing environment is facilitated, and more effective and convenient testing can be carried out on the multi-port hard disk backboard.

When the test point of a voltage waveform of 5V or 12V is tested through the first test circuit and the second test circuit, the voltage fluctuation condition on the hard disk can be simulated more accurately on the load board.

In the prior art, a plurality of electronic load tests are sometimes required for power supply tests of a multi-port hard disk backboard, and the way has the condition that different electronic load currents are not synchronous; the final test result is influenced, and the driving signal of each load board in the device is from the same signal source, so that the problem of current asynchronism does not exist.

Drawings

FIG. 1 illustrates the testing principle of the prior art;

FIG. 2 is a test principle in the present application;

FIG. 3 is a schematic view of a load board according to the present application;

fig. 4 is a schematic diagram of a first test circuit according to the present application.

Detailed Description

In order to clearly illustrate the technical features of the present invention, the present invention is explained in detail by the following embodiments in combination with the accompanying drawings. The following disclosure provides many different embodiments, or examples, for implementing different features of the invention. In order to simplify the disclosure of the present invention, the components and arrangements of specific examples are described below. Furthermore, the present invention may repeat reference numerals and/or letters in the various examples. This repetition is for the purpose of simplicity and clarity and does not in itself dictate a relationship between the various embodiments and/or configurations discussed. It should be noted that the components illustrated in the figures are not necessarily drawn to scale. Descriptions of well-known components and processing techniques and processes are omitted so as to not unnecessarily limit the invention.

As shown in fig. 2, an embodiment of the present invention provides a power testing device for a backplane of a hard disk of a server, where the power testing device includes a plurality of load boards, the load boards correspond to the hard disk one by one, and each load board is provided with a first testing circuit for testing a 12V power supply; and a second test circuit for testing a 5V power supply; and a changeover switch for switching the first test circuit and the second test circuit.

In the process of testing the power supply of the hard disk backboard, the interface of each hard disk is connected to the load board through a golden finger, and 12V and 5V, GND of the hard disk interface on the hard disk backboard and control signals of a related power supply are led out. On the load board, the circuit design is performed as in fig. 3, and the pins for power test and signal generator connection are reserved.

As shown in fig. 4, the first test circuit includes an operational amplifier U1, a positive input terminal of the operational amplifier U1 is connected to a switch, a negative input terminal of the operational amplifier U1 is connected to a source of a MOS transistor Q1, an output terminal of the operational amplifier U1 is connected to a gate of the MOS transistor Q1 through a resistor R0, a source of the MOS transistor Q1 is grounded through a resistor R1, and a drain of the MOS transistor Q1 is connected to a 12V power supply. The operational amplifier U1 adopts TI OPA690 or Meixin MAX9651AUA +, and the MOS tube Q1 is an N-type enhanced field effect tube.

The principle of the second test circuit is the same as that of the first test circuit, the second test circuit comprises an operational amplifier U2, the positive input end of the operational amplifier U2 is connected with a selector switch, the negative input end of the operational amplifier U2 is connected with the source electrode of an MOS tube Q2, the output end of the operational amplifier U2 is connected with the grid electrode of an MOS tube Q2 through a resistor R3, the source electrode of the MOS tube Q2 is grounded through a resistor R2, and the drain electrode of the MOS tube Q2 is connected with a 5V power supply. The operational amplifier U2 adopts TI OPA690 or Meixin MAX9651AUA +, and the MOS tube Q2 is an N-type enhanced field effect tube.

As can be seen from the circuit diagram shown in fig. 4, the operation principle of the load board is as follows: after the voltage at the two ends of the power resistor is led to the negative end of the operational amplifier to be compared with the reference voltage VREF, the output voltage controls the power MOS to work in a constant current region (amplification region) so as to control the output current of the voltage to be measured (Vtest). The current waveform (data) can be obtained indirectly by measuring the voltage across R1.

The specific steps of utilizing the device described in the present application to perform power supply testing are:

1) the gold finger of the load board is connected to the hard disk backplane in the manner of fig. 2.

2) The signal generator interfaces on the load board are cascaded in the manner of fig. 2 through coaxial cables (coaxial cable connection is suggested for ensuring signal quality); and put the on-load board signal selector to a uniform position (5V or 12V op amp).

3) And after the connection is confirmed to be correct, electrifying the hard disk backboard, and carrying out dynamic or static current test:

and (3) testing the quiescent current: the signal generator outputs a constant given voltage (some signal generators without the function can be selected to be replaced by a clean direct current source), and the switching state of the Q1 or the Q2 is controlled by adjusting the given voltage, so that the current on the R1 or the R2 is controlled. The specific principle is as follows: after a positive input end (Vf) of the operational amplifier U2 is compared with a negative input end (R1 voltage), mosfet (Q2) is controlled to enter a constant current area, a current value corresponding to Vf is pulled out, and load pulling of the static load is achieved.

In the test process, the voltage at two ends of the resistor R1 or R2 can be measured by an oscilloscope, and then the current of 5V or 12V can be output (the maximum current for normal operation of the hard disk is recommended to be pulled). In the test process, an oscilloscope can be used for grabbing a voltage waveform of 5V or 12V and observing whether the voltage waveform conforms to the normal working voltage of the hard disk.

The principle of the dynamic current test is the same as that of the static load, except that the signal generator sets the output signal Vf to be a Pulse signal, and the corresponding current is also changed into a Pulse waveform, so that the dynamic load test is realized.

The specific implementation process is as follows: by changing the output of the signal generator into the output of the Pulse waveform (in the process, the high and low level, the frequency, the rising time and the falling time of the Pulse waveform need to be adjusted), and controlling the switching state of the Q1 or the Q2 by adjusting the given Pulse waveform, a dynamic circuit waveform is obtained on the R1 or the R2.

In the test process, the voltage at two ends of the resistor R1 or R2 is measured by an oscilloscope to observe the current 5V or 12V current (the maximum dynamic current load is recommended to be pulled according to the normal work of the hard disk). In the test process, an oscilloscope can be used for grabbing a voltage waveform of 5V or 12V and observing whether the voltage of 5V or 12V under the dynamic current condition meets the normal working voltage of the hard disk or not.

4) The above process completes one path of power supply test, at this time, the change-over switches on all the load boards can be switched to the other path, and then the test of the step 3) is repeated.

Besides the measurement, the device can also carry out cascade test on the load boards, the signal input terminals of all the load boards under the system are connected through the coaxial cable, and then the output signal of the signal generator is injected onto any one load board, so that the simultaneous load extraction of a plurality of load boards can be realized, and the current/voltage condition of the actual operation of the hard disk can be simulated.

Finally, it should be noted that: the above is only a preferred embodiment of the present invention, and it will be apparent to those skilled in the art that a plurality of improvements and decorations can be made without departing from the principle of the present invention, and these improvements and decorations are also considered as the protection scope of the present invention.

Claims

1. The power supply testing device for the hard disk backboard of the server is characterized by comprising a plurality of load boards, wherein the load boards are provided with:

a first test circuit for testing a 12V power supply; and

the second test circuit is used for testing the 5V power supply; and

and a switch for switching the first test circuit and the second test circuit.

2. The power supply testing device for the hard disk backplane of the server as claimed in claim 1, wherein the first testing circuit comprises an operational amplifier U1, a positive input terminal of the operational amplifier U1 is connected with a switch, a negative input terminal of the operational amplifier U1 is connected with a source electrode of a MOS transistor Q1, an output terminal of the operational amplifier U1 is connected with a grid electrode of a MOS transistor Q1 through a resistor R0, a source electrode of the MOS transistor Q1 is grounded through a resistor R1, and a drain electrode of the MOS transistor Q1 is connected with a 12V power supply.

3. The device for testing the power of the server hard disk backplane according to claim 2, wherein the operational amplifier U1 adopts TI OPA690 or Meixin MAX9651AUA +.

4. The device for testing the power of the server hard disk backplane according to claim 2, wherein the MOS transistor Q1 is an N-type enhancement mode fet.

5. The device for testing the power of the backboard of the hard disk of the server according to any one of claims 1 to 4, wherein the first test circuit is connected with a 12V power interface through a golden finger.

6. The power supply testing device for the hard disk backplane of the server of claim 1, wherein the second testing circuit comprises an operational amplifier U2, a positive input terminal of the operational amplifier U2 is connected with a switch, a negative input terminal of the operational amplifier U2 is connected with a source electrode of a MOS transistor Q2, an output terminal of the operational amplifier U2 is connected with a grid electrode of a MOS transistor Q2 through a resistor R3, a source electrode of the MOS transistor Q2 is grounded through a resistor R2, and a drain electrode of the MOS transistor Q2 is connected with a 5V power supply.

7. The device for testing the power of the backboard of the hard disk of the server according to claim 1 or 6, wherein the second test circuit is connected with the 5V power interface through a golden finger.

8. The device for testing the power of the hard disk backplane of the server of claim 6, wherein the operational amplifier U2 adopts TI OPA690 or Meixin MAX9651AUA +.

9. The device for testing the power of the server hard disk backplane according to claim 6, wherein the MOS transistor Q2 is an N-type enhanced field effect transistor.