CN212364537U - Test system for testing power supply IC efficiency - Google Patents
Test system for testing power supply IC efficiency Download PDFInfo
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- CN212364537U CN212364537U CN202020820841.8U CN202020820841U CN212364537U CN 212364537 U CN212364537 U CN 212364537U CN 202020820841 U CN202020820841 U CN 202020820841U CN 212364537 U CN212364537 U CN 212364537U
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Abstract
The utility model discloses a test system for testing the efficiency of a power supply IC, which comprises a computer, a programmable power supply, a programmable multimeter, a programmable electronic load, a test interface board and a controller; the programmable power supply, the programmable electronic load, the programmable multimeter and the power supply IC to be tested are all connected to the test interface board; the test interface board is used for connecting a power supply IC to be tested, establishing a test loop from a programmable power supply to the input end of the power supply IC to be tested and establishing a test loop from an electronic load to the output end of the power supply IC to be tested; and the program-controlled multimeter is switched to test the voltage and the current of the input end and the output end of the power supply IC to be tested; the computer controls the operation of the program-controlled power supply, the program-controlled universal meter and the program-controlled electronic load and records the test result; and the computer is connected with the controller to control the switching of the program-controlled multimeter test items of the test interface board. The utility model discloses can carry out efficiency test to power IC automatically high-efficient high data volume ground.
Description
Technical Field
The utility model belongs to the technical field of the circuit, specifically relate to a test system for testing power IC efficiency.
Background
The manual efficiency test of the power supply IC needs to operate a power supply, an electronic load, universal meters and record data simultaneously, the operation is complicated (if four universal meters are needed to measure variables such as input voltage, input current, output voltage and output current simultaneously), the test data volume is small, the efficiency is low, errors are easy to occur, and therefore an automatic test system for testing the efficiency of the power supply IC needs to be designed.
SUMMERY OF THE UTILITY MODEL
For the realization to the automatic test of power IC efficiency, the utility model provides a following technical scheme:
a test system for testing the efficiency of a power supply IC comprises a computer, a program-controlled power supply, a program-controlled multimeter, a program-controlled electronic load, a test interface board and a controller;
the test interface board comprises an input sampling resistor, an output sampling resistor, a plurality of wiring terminals and a plurality of switch pairs:
the connection terminal includes: a current input positive terminal, a current input negative terminal, a current output positive terminal, a current output negative terminal, a voltage input positive terminal, a voltage input negative terminal, a voltage output positive terminal and a voltage output negative terminal, a measurement positive terminal and a measurement negative terminal;
the switch pair includes: a first switch pair, a second switch pair, a third switch pair and a fourth switch pair; the first switch pair comprises a first switch and a second switch which are linked, and the second switch pair comprises a third switch and a fourth switch which are linked; the third switch pair comprises a fifth switch and a sixth switch which are linked, and the fourth switch pair comprises a seventh switch and an eighth switch which are linked;
the input sampling resistor is bridged between the current input positive terminal and the current input negative terminal;
the output sampling resistor is bridged between the current output positive terminal and the current output negative terminal;
the measuring positive terminal is used for being connected with an input positive electrode of the program-controlled multimeter, is connected with a current input positive terminal through a first switch, is connected with a voltage input positive terminal through a third switch, is connected with a voltage output positive terminal through a fifth switch, and is connected with a current output positive terminal through a seventh switch;
the measuring negative terminal is used for being connected with an input negative electrode of the program-controlled multimeter, is connected with the current input negative terminal through a second switch, is connected with the voltage input negative terminal through a fourth switch, is connected with the voltage output negative terminal through a sixth switch, and is connected with the current output negative terminal through an eighth switch;
the current input positive terminal is connected with the output end of the programmable power supply; the current input negative terminal is connected with the input end of the power supply IC; the grounding end of the program control power supply is connected with the grounding end of the power supply IC;
the current output positive terminal is connected with the output end of the power supply IC; the current output negative terminal is connected with the input end of the programmable electronic load; the grounding end of the program-controlled electronic load is connected with the grounding end of the power supply IC;
the computer is connected with the program-controlled power supply, the program-controlled universal meter and the program-controlled electronic load, and is used for performing operation control on the program-controlled power supply, the program-controlled universal meter and the program-controlled electronic load and recording a test result; the computer is connected with the controller, and the controller is used for controlling the switching of all switches on the test interface board.
Further, the controller is disposed on the test interface board and configured to control a switch pair of the test interface board to be selectively turned on.
Further, the switch is a relay or an MOS tube.
The technical effects are as follows:
the utility model discloses a test system through programmable power supply, programme-controlled electronic load and single programme-controlled universal meter, realizes carrying out comprehensive control and continuous test to power IC's input/output's voltage, electric current to carry out efficiency test to power IC automatically high-efficient high data volume ground.
Drawings
Fig. 1 is a schematic block diagram of the present invention.
Detailed Description
To further illustrate the embodiments, the present invention provides the accompanying drawings. The accompanying drawings, which are incorporated in and constitute a part of this disclosure, illustrate embodiments of the invention and, together with the description, serve to explain the principles of the embodiments. With these references, one of ordinary skill in the art will appreciate other possible embodiments and advantages of the present invention. Elements in the figures are not drawn to scale and like reference numerals are generally used to indicate like elements.
The present invention will now be further described with reference to the accompanying drawings and detailed description.
As shown in fig. 1, the utility model discloses a test system for testing power supply IC efficiency, which comprises a PC 1, a programmable power supply 2, a programmable multimeter 3, a programmable electronic load 4, a test interface board 5 and a controller 6;
the connection terminal includes: a current input positive terminal Iin +, a current input negative terminal Iin-, a current output positive terminal Iout +, a current output negative terminal Iout-, a voltage input positive terminal Vin +, a voltage input negative terminal Vin-, a voltage output positive terminal Vout +, and a voltage output negative terminal Vout-, a measurement positive terminal M + and a measurement negative terminal M-;
the switch pair includes: a first switch pair, a second switch pair, a third switch pair and a fourth switch pair; the first switch pair comprises ganged switches K1/K2, the second switch pair comprises ganged switches K3/K4; the third switch pair comprises ganged switches K5/K6, the fourth switch pair comprises ganged switches K7/K8;
an input sampling resistor Rs1 is connected between the current input positive terminal Iin + and the current input negative terminal Iin-in a bridge mode;
the output sampling resistor Rs2 is connected between the positive terminal Iout + of the current output and the negative terminal Iout-of the current output in a bridge mode;
the measurement positive terminal M + is used for being connected with an input positive electrode M + of the program-controlled multimeter 3, is connected with a current input positive terminal Iin + through a switch K1, is connected with a voltage input positive terminal Vin + through a switch K3, is connected with a voltage output positive terminal through a switch K5, and is connected with a current output positive terminal Iout + through a switch K7;
the measurement negative terminal M-is used for being connected with an input negative electrode M-of the program-controlled multimeter 3, is connected with a current input negative terminal Iin-through a switch K2, is connected with a voltage input negative terminal Vin-through a switch K4, is connected with a voltage output negative terminal Vout-through a switch K6 and is connected with a current output negative terminal Iout-through a switch K8;
the current input positive terminal Iin + is connected with the output end V of the programmable power supply 2; the current input negative terminal Iin-is connected with the input end VIN of the power supply IC; the ground terminal GND of the programmable power supply 2 is connected with the input ground terminal GND of the power supply IC;
the current output positive terminal Iout + is connected with the output end VOUT of the power supply IC; the current output negative terminal Iout-is connected with the input end IN of the programmable electronic load 4; the grounding end GND of the program-controlled electronic load 4 is connected with the grounding end GND of the power supply IC;
the PC 1 is connected with the program-controlled power supply 2, the program-controlled universal meter 3 and the program-controlled electronic load 4, and is used for controlling the operation of the program-controlled power supply 2, the program-controlled universal meter 3 and the program-controlled electronic load 4 and recording a test result; the PC 1 is connected with the controller 6, and the controller 6 is used for controlling the switch switching of the test interface board, thereby completing the automatic test.
The control method comprises the following steps:
the system wiring method comprises the following steps: the output end V of the programmable power supply 2 is connected with an Iin + channel of the test interface board 5, the Iin-channel is connected with the input end VIN of the power supply IC, and the grounding end GND of the programmable power supply 2 is connected with the grounding end GND of the power supply IC; the output end VOUT of the power supply IC is connected with Iout + of the test interface board 5, the Iout-is connected with the input end IN of the program-controlled electronic load 4, and the grounding end GND of the program-controlled electronic load 4 is connected with the grounding end GND of the power supply IC; the Vin + of the test interface board 5 is connected with the input end VIN of the power IC, and the Vin-is connected with the ground end GND of the power IC; vout + of the test interface board 5 is connected with the output terminal VOUT of the power IC, and Vout-is connected with the ground terminal GND of the power IC;
the PC 1 controls the programmable power supply 2 to output different output voltages corresponding to the IC requirements, and controls the programmable electronic load 4 to draw different output currents corresponding to the IC requirements.
The PC 1 controls a controller 6 (such as a singlechip) to close a switch K1/K2 and measures voltage Vsi at two ends of an input sampling resistor Rs1 through a program-controlled multimeter 3, so that input current Iin is Vsi/Rs 1; the control controller 6 closes the switch K3/K4 and measures the input end voltage Vin of the power supply IC through the program-controlled multimeter 3; the control controller 6 closes the switch K5/K6 and measures the voltage Vout of the output end of the power supply IC through the program-controlled multimeter 3; the controller 6 is controlled to close the switch K7/K8 and measure the voltage Vso at the two ends of the output sampling resistor Rs2 through the program-controlled multimeter 3, so that the output current Iout is Vso/Rs 2; the PC records and collects data of the program-controlled power supply 2, the program-controlled multimeter 3 and the program-controlled electronic load 4, and finally calculates single-point efficiency Vout Iout/Vin Iin; all required Vin voltages and Iout currents are traversed, efficiency of all points can be acquired, and the PC 1 automatically generates a report and stores files.
The utility model discloses a test system can carry out comprehensive control and continuous test to power IC's input/output's voltage, electric current to generate the test report form to carry out efficiency test to power IC automatically high-efficient high data volume.
In this embodiment, the controller 6 is disposed on the test interface board 5 and is communicatively connected to the PC 1 via a serial interface.
In this embodiment, the switch on the test interface board 5 may be a relay, an MOS transistor, and the like, and both the relay and the MOS transistor can be switched on in a low-resistance state, and can be switched on or off by the controller 6 through a large current.
While the invention has been particularly shown and described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes in form and detail may be made therein without departing from the spirit and scope of the invention as defined by the appended claims.
Claims (3)
1. A test system for testing the efficiency of a power IC, comprising: the system comprises a computer, a program-controlled power supply, a program-controlled universal meter, a program-controlled electronic load, a test interface board and a controller;
the test interface board comprises an input sampling resistor, an output sampling resistor, a plurality of wiring terminals and a plurality of switch pairs:
the connection terminal includes: a current input positive terminal, a current input negative terminal, a current output positive terminal, a current output negative terminal, a voltage input positive terminal, a voltage input negative terminal, a voltage output positive terminal and a voltage output negative terminal, a measurement positive terminal and a measurement negative terminal;
the switch pair includes: a first switch pair, a second switch pair, a third switch pair and a fourth switch pair; the first switch pair comprises a first switch and a second switch which are linked, and the second switch pair comprises a third switch and a fourth switch which are linked; the third switch pair comprises a fifth switch and a sixth switch which are linked, and the fourth switch pair comprises a seventh switch and an eighth switch which are linked;
the input sampling resistor is bridged between the current input positive terminal and the current input negative terminal;
the output sampling resistor is bridged between the current output positive terminal and the current output negative terminal;
the measuring positive terminal is used for being connected with an input positive electrode of the program-controlled multimeter, is connected with a current input positive terminal through a first switch, is connected with a voltage input positive terminal through a third switch, is connected with a voltage output positive terminal through a fifth switch, and is connected with a current output positive terminal through a seventh switch;
the measuring negative terminal is used for being connected with an input negative electrode of the program-controlled multimeter, is connected with the current input negative terminal through a second switch, is connected with the voltage input negative terminal through a fourth switch, is connected with the voltage output negative terminal through a sixth switch, and is connected with the current output negative terminal through an eighth switch;
the current input positive terminal is connected with the output end of the programmable power supply; the current input negative terminal is connected with the input end of the power supply IC; the grounding end of the program control power supply is connected with the grounding end of the power supply IC;
the current output positive terminal is connected with the output end of the power supply IC; the current output negative terminal is connected with the input end of the programmable electronic load; the grounding end of the program-controlled electronic load is connected with the grounding end of the power supply IC;
the computer is connected with the program-controlled power supply, the program-controlled universal meter and the program-controlled electronic load, and is used for performing operation control on the program-controlled power supply, the program-controlled universal meter and the program-controlled electronic load and recording a test result; the computer is connected with the controller, and the controller is used for controlling the switching of all switches on the test interface board.
2. The test system for testing the efficiency of a power IC of claim 1, wherein: the controller is arranged on the test interface board and used for controlling the switch pair of the test interface board to be selected to be conducted.
3. The test system for testing the efficiency of a power IC of claim 1, wherein: the switch is a relay or an MOS tube.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020820841.8U CN212364537U (en) | 2020-05-18 | 2020-05-18 | Test system for testing power supply IC efficiency |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020820841.8U CN212364537U (en) | 2020-05-18 | 2020-05-18 | Test system for testing power supply IC efficiency |
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| Publication Number | Publication Date |
|---|---|
| CN212364537U true CN212364537U (en) | 2021-01-15 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202020820841.8U Active CN212364537U (en) | 2020-05-18 | 2020-05-18 | Test system for testing power supply IC efficiency |
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| CN (1) | CN212364537U (en) |
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- 2020-05-18 CN CN202020820841.8U patent/CN212364537U/en active Active
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Effective date of registration: 20220330 Address after: 361000 room 2401, No. 567, Haicang Avenue, Haicang District, Xiamen City, Fujian Province Patentee after: Xiamen yingmaikexin Integrated Technology Co.,Ltd. Address before: Unit 410, No. 1702, Gangzhong Road, Xiamen area, China (Fujian) pilot Free Trade Zone, Xiamen City, Fujian Province 361000 Patentee before: INMICRO (XIAMEN) MICROELECTRONIC TECHNOLOGY CO.,LTD. |