CN112415253A - Circuit and system for testing working current of circuit board - Google Patents
Circuit and system for testing working current of circuit board Download PDFInfo
- Publication number
- CN112415253A CN112415253A CN202011280175.4A CN202011280175A CN112415253A CN 112415253 A CN112415253 A CN 112415253A CN 202011280175 A CN202011280175 A CN 202011280175A CN 112415253 A CN112415253 A CN 112415253A
- Authority
- CN
- China
- Prior art keywords
- switch
- ammeter
- circuit board
- timing
- controlled
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
- G01R1/206—Switches for connection of measuring instruments or electric motors to measuring loads
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The embodiment of the invention discloses a circuit and a system for testing the working current of a circuit board. Wherein, test circuit includes: the device comprises a circuit board to be tested, an ammeter and a timing switch module, wherein the ammeter meets the preset precision requirement; the circuit board to be tested and the ammeter are connected in series to form a test path, and a first switch end and a second switch end in the timing switch module are connected with the ammeter in parallel; the timing switch module is used for connecting the first switch end and the second switch end to short-circuit the ammeter when the test path is switched from a disconnection state to a connection state; and after the time for short-circuiting the ammeter reaches a preset time length, disconnecting the first switch end and the second switch end so as to measure the working current of the circuit board to be measured through the ammeter. According to the technical scheme of the embodiment of the invention, the ammeter is in short circuit when the circuit board to be tested is started, so that the normal starting of the circuit board to be tested is ensured, and the high-precision current test in a low-power-consumption mode is realized.
Description
Technical Field
The embodiment of the invention relates to a current testing technology, in particular to a circuit and a system for testing the working current of a circuit board.
Background
With the use of the internet of things equipment becoming more and more extensive, obtaining the running state and the power consumption of the internet of things equipment becomes an important index for evaluating the running state of the internet of things equipment, and therefore, the low-power-consumption current of the internet of things equipment becomes an important link for testing the core board of the internet of things.
In the prior art, a common method is to connect an ammeter or a multimeter into a circuit to measure a current value, but since some core boards of the internet of things have a high working current at startup, for example, 50 milliamperes, and a low current at low power consumption mode, for example, 60 microamperes, the core boards must first enter a normal startup mode to enter the low power consumption mode. In the market, the ammeter with the general measuring range larger than 50 milliamperes has the precision which cannot reach microampere level, the ammeter with the precision which reaches microampere level has the measuring range which cannot reach 50 milliamperes, so that when a high-precision ammeter is selected, the current flowing through a core board is too small due to too low measuring range, the ammeter cannot be started normally, and when an ammeter with a large measuring range is selected, the ammeter has insufficient precision, and the measured current data has no large reference value.
Disclosure of Invention
The embodiment of the invention provides a circuit board working current testing circuit and a system, when a circuit board to be tested is started, an ammeter is in short circuit by using a relay, and the ammeter is connected in series into a testing passage when the circuit board to be tested enters a low power consumption mode, so that the normal starting of the circuit board to be tested is ensured, and the high-precision current testing under the low power consumption mode is realized.
In a first aspect, an embodiment of the present invention provides a circuit board operating current testing circuit, where the circuit board operating current testing circuit includes: the device comprises a circuit board to be tested, an ammeter and a timing switch module, wherein the ammeter meets a preset precision requirement;
the circuit board to be tested and the ammeter are connected in series to form a test path, and a first switch end and a second switch end in the timing switch module are connected with the ammeter in parallel;
the timing switch module is used for connecting the first switch end and the second switch end to short-circuit the ammeter when the test path is switched from a disconnection state to a connection state; and after the time for short-circuiting the ammeter reaches a preset time length, disconnecting the first switch end and the second switch end so as to measure the working current of the circuit board to be measured through the ammeter.
In a second aspect, an embodiment of the present invention further provides a test system for a working current of a circuit board, where the test system includes: the device comprises at least two circuit boards to be tested, at least two ammeters, at least two controlled switches and a timing trigger device, wherein the ammeters meet the preset precision requirement;
the timing trigger device is respectively connected with the at least two controlled switches, each circuit board to be tested is respectively connected with the corresponding ammeter in series to form at least two testing paths, and a first switch end and a second switch end in each controlled switch are respectively connected with the corresponding ammeter in the testing paths in parallel;
the timing trigger device is used for sending a closing control signal to at least one controlled switch when the at least two test paths are switched from an open state to a power-on state, and sending an opening control signal to the controlled switch after the time for short-circuiting the ammeter reaches a preset time length;
the controlled switch is used for connecting the first switch end and the second switch end when receiving a closing control signal, and disconnecting the first switch end and the second switch end when receiving an opening control signal.
In the technical scheme of the embodiment of the invention, the test circuit of the working current of the circuit board comprises a circuit board to be tested, an ammeter and a timing switch module, wherein the circuit board to be tested and the ammeter are connected in series to form a test path, a first switch end and a second switch end in the timing switch module are connected with the ammeter in parallel, the timing switch module is used for connecting the first switch end and the second switch end to short-circuit the ammeter when the test path is switched from a disconnected state to a powered state, and, after the short-circuit ammeter reaches the preset time length, the connection between the first switch end and the second switch end is disconnected, so as to measure the working current of the circuit board to be measured by the ammeter, solve the problem that the measuring range and the precision of the ammeter in the prior art can not meet the use requirement at the same time, the circuit board to be tested is ensured to be normally started, and meanwhile, the high-precision test of the current in the low-power-consumption mode is realized.
Drawings
Fig. 1 is a schematic structural diagram of a circuit board operating current testing circuit according to a first embodiment of the present invention;
FIG. 2 is a schematic structural diagram of a circuit board operating current testing circuit according to a second embodiment of the present invention;
fig. 3 is a schematic structural diagram of a circuit board operating current testing circuit according to a third embodiment of the present invention;
fig. 4 is a schematic structural diagram of a system for testing operating current of a circuit board according to a fourth embodiment of the present invention.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be further noted that, for the convenience of description, only some of the structures related to the present invention are shown in the drawings, not all of the structures.
Example one
Fig. 1 is a schematic structural diagram of a circuit for testing a working current of a circuit board in an embodiment of the present invention, where the technical scheme of this embodiment is suitable for a case of performing a current test in a circuit with a large initial current, a small current to be tested, and a high precision requirement, and is particularly suitable for an internet of things core board, that is, a Microcontroller Unit (MCU) core board in an internet of things device. The test circuit includes: the circuit board to be tested comprises a circuit board 1 to be tested, an ammeter 2 and a timing switch module 3, wherein the ammeter 2 meets the preset precision requirement.
In this embodiment, when a general ammeter is used for current measurement under the condition that a large current flows in the starting process of the circuit board 1 to be tested and a small current flows when the circuit board 1 enters the low power consumption mode to work, if the ammeter with a large measuring range is selected, the circuit board 1 to be tested can be ensured to be normally started, but when the circuit board enters the low power consumption mode, the testing precision is low, and the testing data has no reference value; if the ammeter with a small measuring range is selected, although the requirement on the measurement accuracy can be met, the current flowing through the ammeter is small, so that the circuit board to be measured 1 connected with the ammeter in series cannot be started normally. To solve the above problem, the test circuit provided in this embodiment includes a circuit board 1 to be tested, an ammeter 2 and a time switch module 3, where the measurement accuracy of the ammeter 2 meets a preset accuracy requirement, for example, when the current of the circuit board to be tested is about 6 microamperes in a low power consumption mode, the accuracy of the ammeter is in microampere level. The timing switch module 3 is connected in parallel with the ammeter 2 to realize short circuit of the ammeter 2 in the starting process of the circuit board 1 to be tested, so that the circuit board 1 to be tested is normally started.
Optionally, the accuracy of ammeter 2 is in microamperes. Optionally, the intensity of the starting current of the circuit board 1 to be tested during normal starting is higher than the microampere level, for example, the milliamp or ampere level. For example, for a core board with a low power consumption operating current of about 6 microamperes and a starting operating current of about 50 milliamperes, an ammeter with a measuring range of 50 microamperes and an accuracy of 0.1 microamperes may be used.
The circuit board 1 to be tested and the ammeter 2 are connected in series to form a test path, and the first switch end 321 and the second switch end 322 in the timing switch module 3 are connected in parallel with the ammeter 2.
The circuit board 1 to be tested and the ammeter 2 are connected in series to form a current testing path, and the timing switch module 3 is connected in parallel with the ammeter 2 through the first switch end 321 and the second switch end 322 to control the ammeter 2 to be connected to the testing path when the current of the path needs to be measured, so that the normal starting of the circuit board 1 to be tested is not affected. It should be understood that the test path may include other possible components besides the circuit board 1 to be tested and the ammeter 2, and the present application is not limited thereto.
The timing switch module 3 is configured to connect the first switch end 321 and the second switch end 322 to short-circuit the ammeter 2 when the test path is switched from the off state to the on state; and after the time for short-circuiting the ammeter 2 reaches a preset time length, disconnecting the first switch end 321 and the second switch end 322 to measure the working current of the circuit board to be measured through the ammeter 2.
In this embodiment, the timing switch module 3 is configured to connect the first switch end 321 and the second switch end 322 when the user accesses the circuit board 1 to be tested to the test access, that is, when the test access is switched from the off state to the on state, at this time, the ammeter 2 is short-circuited, which does not affect the normal start of the circuit board 1 to be tested, and at the same time, the timing switch module 3 starts timing according to the set time length, and after the timing is finished, disconnects the first switch end 321 and the second switch end 322, so that the ammeter 2 is accessed to the test access, and measures the operating current of the circuit board 1 to be tested in the low power consumption mode.
Optionally, the timing time (i.e. the preset time length) of the timing switch module 3 is set according to the time from the power-on start of the circuit board 1 to be tested to the low power consumption mode. For example, the preset time length may be greater than or equal to the time from the power-on start of the circuit board 1 to be tested to the low power consumption mode. For example, the time from the power-on start to the low power consumption mode of the circuit board 1 to be tested may be an average value of the time from the power-on start to the low power consumption mode measured multiple times.
In the technical scheme of the embodiment of the invention, the test circuit of the working current of the circuit board comprises a circuit board to be tested, an ammeter and a timing switch module, wherein the circuit board to be tested and the ammeter are connected in series to form a test path, a first switch end and a second switch end in the timing switch module are connected with the ammeter in parallel, the timing switch module is used for connecting the first switch end and the second switch end to short-circuit the ammeter when the test path is switched from a disconnected state to a powered state, and disconnecting the first switch terminal and the second switch terminal after the short-circuit ammeter reaches a preset time length, so as to measure the working current of the circuit board to be measured by the ammeter, solve the problem that the measuring range and the precision of the ammeter in the prior art can not meet the use requirement at the same time, the circuit board to be tested is ensured to be normally started, and meanwhile, the high-precision test of the current in the low-power-consumption mode is realized.
Example two
Fig. 2 is a schematic structural diagram of a circuit board operating current testing circuit according to a second embodiment of the present invention, where the circuit board operating current testing circuit includes: the circuit board testing device comprises a circuit board to be tested 1, an ammeter 2 and a timing switch module 3, wherein the ammeter 2 meets the preset precision requirement;
the circuit board 1 to be tested and the ammeter 2 are connected in series to form a test path, and a first switch end 321 and a second switch end 322 in the timing switch module 3 are connected in parallel with the ammeter 2;
the timing switch module 3 is configured to connect the first switch end 321 and the second switch end 322 to short-circuit the ammeter 2 when the test path is switched from the off state to the on state; and after the time for short-circuiting the ammeter 2 reaches a preset time length, disconnecting the first switch end 321 and the second switch end 322 to measure the working current of the circuit board to be measured through the ammeter 2.
Wherein, the time switch module 3 includes: a timing trigger device 31 and a controlled switch 32, wherein the timing trigger device 31 is connected to a control terminal of the controlled switch 32, and the controlled switch 32 includes the first switch terminal 321 and the second switch terminal 322.
In this embodiment, a specific structure included in the timing switch module 3 is provided, and includes a timing trigger device 31 and a controlled switch 32, where the timing trigger device 31 is connected to a control terminal of the controlled switch 32 and can provide a control signal for the controlled switch 32, and the controlled switch 32 includes a first switch terminal 321 and a second switch terminal 322, which are respectively connected to two terminals of the ammeter and are used to open and close according to the control signal provided by the timing trigger device 31, so as to realize short-circuiting and connection of the ammeter 2.
The timing trigger device 31 is configured to send a closing control signal to the controlled switch 32 when the test path is switched from the open state to the power-on state, and send an opening control signal to the controlled switch 32 after the time for shorting the ammeter 2 reaches a preset time length.
The timing trigger device 31 is specifically configured to send a close control signal to the control terminal of the controlled switch 32 when a user accesses the circuit to be tested 1 to form a test path, so as to short-circuit the ammeter 2 during the starting process of the circuit to be tested, and send an open control signal to the controlled switch 32 after the time for short-circuiting the ammeter 2 reaches a preset time length, so as to access the ammeter 2 to the test path, and measure the working current of the circuit to be tested 1 in the low power consumption mode.
The controlled switch 32 is configured to connect the first switch terminal 321 and the second switch terminal 322 when receiving a close control signal, and disconnect the first switch terminal 321 and the second switch terminal 322 when receiving an open control signal.
The controlled switch 32 is specifically configured to, when receiving a closing control signal sent by the timing trigger device 31, connect the first switch end 321 and the second switch end 322 to short-circuit the ammeter 2, and when receiving an opening control signal, disconnect the connection between the first switch end 321 and the second switch end 322 to connect the ammeter 2 to the test path to perform a current test.
The technical scheme of the embodiment of the invention is that the test circuit of the working current of the circuit board comprises the circuit board to be tested, an ammeter and a timing switch module, wherein the timing switch module comprises a timing trigger device and a controlled switch, the timing trigger device is used for sending a closing control signal to the controlled switch when the test passage is switched from an off state to an on state, and sending an off control signal to the controlled switch after the short-circuit ammeter reaches a preset time length, wherein the controlled switch is used for connecting the first switch end and the second switch end to short-circuit the ammeter when receiving the on control signal, and when receiving the disconnection control signal, disconnecting the first switch end and the second switch end, connecting the ammeter to the test path, when the circuit board to be tested is ensured to be started, large current can flow, and meanwhile, high-precision current testing can be performed in a low-power-consumption mode.
EXAMPLE III
Fig. 3 is a schematic structural diagram of a circuit board operating current testing circuit according to a third embodiment of the present invention, where the circuit board operating current testing circuit includes: the circuit board testing device comprises a circuit board to be tested 1, an ammeter 2 and a timing switch module, wherein the ammeter 2 meets the preset precision requirement;
the circuit board 1 to be tested and the ammeter 2 are connected in series to form a test path, and a first switch end and a second switch end in the timing switch module are connected in parallel with the ammeter 2;
the timing switch module is used for connecting the first switch end and the second switch end to short-circuit the ammeter 2 when the test path is switched from the off state to the on state; and after the time for short-circuiting the ammeter 2 reaches a preset time length, disconnecting the first switch end and the second switch end so as to measure the working current of the circuit board 1 to be measured through the ammeter 2.
Wherein, the time switch module includes: the timing trigger device is connected with the control end of the controlled switch, and the controlled switch comprises the first switch end and the second switch end;
the timing trigger device is used for sending a closing control signal to the controlled switch when the test path is switched from an open state to a power-on state, and sending an opening control signal to the controlled switch after the time for short-circuiting the ammeter reaches a preset time length;
and the controlled switch is used for connecting the first switch end and the second switch end when receiving the closing control signal and disconnecting the connection between the first switch end and the second switch end when receiving the disconnecting control signal.
Wherein, the timing trigger device is a timing relay 71, and the controlled switch is a controlled relay 72; the timing relay 71 includes a power supply terminal 711, a normally open terminal 712, a normally closed terminal 713, and a common terminal 714, and the controlled relay 72 includes a control terminal 723, a normally open terminal 724, a normally closed terminal 721, and a common terminal 722.
In this embodiment, the timing trigger device is set as a timing relay 71, and the controlled switch is set as a controlled relay 72, where the timing relay 71 includes a power supply terminal 711, a normally open terminal 712, a normally closed terminal 713, and a common terminal 714, the power supply terminal 711 is used to control the timing relay 71 to be powered on, and the common terminal 714 is used to be shorted with the normally open terminal 712 or the normally closed terminal 713, so as to provide a control signal for the controlled relay 72; the controlled relay 72 includes a control terminal 723, a normally open terminal 724, a normally closed terminal 721 and a common terminal 722, the control terminal 723 is configured to receive a control signal transmitted by the common terminal 714 of the timing relay 71, and control whether the common terminal 722 is shorted with the normally open terminal 724 or the normally closed terminal 721 according to the control signal, if the common terminal 722 is shorted with the normally open terminal 724, the current meter is connected to the test path for performing a current test, and if the common terminal 722 is shorted with the normally closed terminal 721, the current meter is shorted.
The common terminal 714 of the timing relay 71 is connected to the control terminal 723 of the controlled relay 72, and the normally closed terminal 721 and the common terminal 722 of the controlled relay 72 are connected in parallel to the ammeter 2 as a first switch terminal and a second switch terminal, respectively.
The common terminal 714 of the timing relay 71 is connected to the control terminal 723 of the controlled relay 72 for providing a control signal to the controlled relay 72. The normally closed end 721 and the common end 722 of the controlled relay 72 are connected in parallel with the ammeter 2 as a first switch end and a second switch end, respectively, when the normally closed end 721 is shorted with the common end 722, that is, the first switch end and the second switch end are connected, the ammeter 2 is shorted, and when the normally open end 724 is shorted with the common end 722, that is, the first switch end and the second switch end are disconnected, the ammeter is connected in series to the test path.
Optionally, the test circuit further includes a circuit board tray 4, configured to mount the circuit board 1 to be tested, so that the circuit board 1 to be tested mounted in the circuit board tray 4 and the ammeter 2 form a test path.
In this optional embodiment, the test circuit further includes a circuit board tray 4, where the circuit board tray 4 is used to place the circuit board 1 to be tested, so that the circuit board 1 to be tested is connected to the test access.
Optionally, the test circuit further includes a trigger switch 5, and the trigger switch 5 is connected to the timing relay 71;
the trigger switch 5 is triggered when the circuit board 1 to be tested is mounted on the circuit board tray 4, and provides a high level for the power supply terminal 711 of the timing relay 71.
In this optional embodiment, the test circuit further includes a trigger switch 5, specifically, the trigger switch 5 is connected to the power supply terminal 711 of the timing relay 71, and when the circuit board 1 to be tested is mounted on the circuit board tray 4, the trigger switch 5 is triggered to provide a high level for the power supply terminal 711 of the timing relay 71, so that the timing relay 71 sends a control signal to the controlled relay 72 and starts timing.
Optionally, the test circuit further includes a power supply 6, and the power supply 6 is connected to a test path formed by connecting the circuit board 1 to be tested and the ammeter 2 in series, and provides power for the test path.
In this optional embodiment, the test circuit further includes a power supply 6, and the power supply is connected to a test path formed by the circuit board 1 to be tested and the ammeter 2 connected in series, and provides power for the test path.
According to the technical scheme, the test circuit of the working current of the circuit board comprises the circuit board to be tested, an ammeter, a timing relay and a controlled relay, wherein the timing relay provides a high level for a control end of at least one controlled relay through a common end, the common end of the controlled relay is in short circuit with a normally closed end, the ammeter is in short circuit, after the time for short circuit of the ammeter reaches a preset time length, the common end of the timing relay provides a low level for at least one controlled relay, the common end of the controlled relay is disconnected with the normally closed end, the ammeter is connected into a test access to conduct current test, the ammeter can be in short circuit when the current of the circuit board to be tested is large in the starting stage, and the ammeter is connected into the test access to conduct current test when the circuit board to be tested enters a low power consumption mode.
Example four
Fig. 4 is a schematic structural diagram of a test system for a circuit board working current in a fourth embodiment of the present invention, where the technical scheme of this embodiment is suitable for a case of performing a current test in a circuit with a large initial current, a small current to be tested, and a high accuracy requirement, and the test circuit includes: the circuit board testing device comprises at least two circuit boards 1 to be tested, at least two ammeters 2, at least two controlled switches 72 and a timing trigger device 71, wherein the ammeters 2 meet preset precision requirements;
the timing trigger device 71 is respectively connected with at least two controlled switches 72, each circuit board 1 to be tested is respectively connected with the corresponding ammeter 2 in series to form at least two testing paths, and a first switch end and a second switch end in each controlled switch 72 are respectively connected with the corresponding ammeter 2 in the testing path in parallel.
In this embodiment, each circuit board 1 to be tested and each ammeter 2 are connected in series to form at least one test loop, each controlled relay 72 is connected in parallel with the ammeter of each loop through a first switch end and a second switch end, respectively, and the timing trigger device 71 is connected with the control end of each controlled relay 72.
The timing trigger device 71 is configured to send a closing control signal to at least one controlled switch 72 when at least two test paths are switched from an open state to a powered state, and send an opening control signal to the controlled switch 72 after the time for shorting the ammeter reaches a preset time length.
The controlled switch 72 is configured to connect the first switch terminal and the second switch terminal when receiving a close control signal, and disconnect the first switch terminal and the second switch terminal when receiving an open control signal.
The timing trigger device 71 is a timing relay, and the controlled switch 72 is a controlled relay; the timing relay comprises a power supply end, a normally-open end, a normally-closed end and a public end, and the controlled relay comprises a control end, a normally-open end, a normally-closed end and a public end; and a normally closed end and a common end of the controlled relay are respectively used as a first switch end and a second switch end to be connected with the ammeter 2 in parallel.
In this embodiment, the timing trigger device 71 may be a timing relay, and the controlled switches 72 may be controlled relays, each timing relay including a power supply terminal, a normally open terminal, a normally closed terminal, and a common terminal, wherein the power supply terminal provides a control level for the timing relay, and the common terminal provides a low level or a high level for the control terminal of each controlled relay 72 by being shorted with the normally open terminal or the normally closed terminal; the controlled relay 72 includes a control terminal, a normally open terminal, a normally closed terminal, and a common terminal, wherein the control terminal is used for receiving the control level sent by the timing relay 71, and the common terminal short-circuits the ammeter 2 or connects the ammeter to the test path by being short-circuited with the normally open terminal or the normally closed terminal.
The timing relay 71 is specifically configured to short-circuit the common terminal and the normally closed terminal after the power supply terminal is powered on, provide a high level for the control terminal of the at least one controlled relay 72 through the common terminal, and start timing; after the timing is finished, the common terminal is in short circuit with the normally open terminal, and a low level is provided for the at least one controlled relay 72 through the common terminal.
After the power supply end of the timing relay 71 is powered on, the common end and the normally closed end are in short circuit, the common end provides a high level for the control end of at least one controlled relay 72, the first switch end and the second switch end are controlled to be connected, timing is started, after timing is finished, the common end is in short circuit with the normally open end, the common end provides a low level for at least one controlled relay 72, and the first switch end and the second switch end are controlled to be disconnected.
The controlled relay 72 is specifically configured to, when the common terminal of the timing relay 71 provides a high level to the control terminal of the controlled relay 72, short-circuit the common terminal of the controlled relay with the normally closed terminal, and short-circuit the ammeter 2 connected in parallel with the controlled relay in the current test path; when the common end of the timing relay 71 provides a low level for the control end of the controlled relay 72, the common end of the controlled relay is in short circuit with the normally open end, and the ammeter 2 connected with the controlled relay in parallel in the current test path is connected to the current test path in series to test the working current of the circuit board 1 to be tested.
When the timing relay 71 provides a high level to the control end of the controlled relay 72, the common end of the controlled relay 72 is in short circuit with the normally closed end, so that the ammeter 2 in the test path is in short circuit, when the timing relay 71 provides a low level to the control end of the controlled relay 72, the common end of the controlled relay 72 is in short circuit with the normally open end, the ammeter 2 in the current test path is connected in series to the current test path, and the working current of the circuit board 1 to be tested is tested.
According to the technical scheme of the embodiment of the invention, the connection and disconnection of the first switch end and the second switch end of each controlled relay in the plurality of test paths are controlled through the timing relay, so that the short circuit of each circuit meter is realized in the starting process of the circuit board to be tested of the plurality of test paths, the current meters in each test path are connected into the test paths in series after each circuit board to be tested enters the low power consumption mode, the short circuit of each current meter is realized when the current of the circuit board to be tested of the plurality of test paths is large in the starting stage, and each current meter is connected into the test paths to carry out current test when the circuit board to be tested enters the low power consumption mode.
According to the existing working current testing tool for the core board of the Internet of things, one testing tool can only test one circuit board to be tested, so that the testing and production efficiency of the circuit board to be tested is low. By adopting the implementation mode in the embodiment of the application, one test system can test the working currents of a plurality of circuit boards to be tested in a multi-path parallel mode, so that the test efficiency is improved, and further the production efficiency of the circuit boards to be tested is improved. In addition, in practical application, the volumes of the current meter head and the relay in the embodiment of the application are small, and a plurality of paths of test paths can be arranged in a test tool with small volume, so that the test tool can be applied to the large-scale production of the core board.
It is to be noted that the foregoing is only illustrative of the preferred embodiments of the present invention and the technical principles employed. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail by the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the spirit of the present invention, and the scope of the present invention is determined by the scope of the appended claims.
Claims (10)
1. A circuit for testing operating current of a circuit board, comprising: the device comprises a circuit board to be tested, an ammeter and a timing switch module, wherein the ammeter meets a preset precision requirement;
the circuit board to be tested and the ammeter are connected in series to form a test path, and a first switch end and a second switch end in the timing switch module are connected with the ammeter in parallel;
the timing switch module is used for connecting the first switch end and the second switch end to short-circuit the ammeter when the test path is switched from a disconnection state to a connection state; and after the time for short-circuiting the ammeter reaches a preset time length, disconnecting the first switch end and the second switch end so as to measure the working current of the circuit board to be measured through the ammeter.
2. The test circuit of claim 1, wherein the timed switch module comprises: the timing trigger device is connected with the control end of the controlled switch, and the controlled switch comprises the first switch end and the second switch end;
the timing trigger device is used for sending a closing control signal to the controlled switch when the test path is switched from an open state to a power-on state, and sending an opening control signal to the controlled switch after the time for short-circuiting the ammeter reaches a preset time length;
and the controlled switch is used for connecting the first switch end and the second switch end when receiving the closing control signal and disconnecting the connection between the first switch end and the second switch end when receiving the disconnecting control signal.
3. The test circuit of claim 2, wherein the timing trigger device is a timing relay and the controlled switch is a controlled relay; the timing relay comprises a power supply end, a normally-open end, a normally-closed end and a public end, and the controlled relay comprises a control end, a normally-open end, a normally-closed end and a public end;
and the common end of the timing relay is connected with the control end of the controlled relay, and the normally closed end and the common end of the controlled relay are respectively used as a first switch end and a second switch end to be connected with the ammeter in parallel.
4. The test circuit of claim 3, further comprising a circuit board tray for mounting the circuit board to be tested, so that the circuit board to be tested mounted in the circuit board tray and the ammeter form a test path.
5. The test circuit of claim 4, further comprising a trigger switch coupled to the timing relay;
the trigger switch is triggered when the circuit board to be tested is installed on the circuit board tray, and provides a high level for the power supply end of the timing relay.
6. The test circuit according to any one of claims 1 to 5, further comprising a power supply, wherein the power supply is connected to a test path formed by the circuit board to be tested and the ammeter in series connection and supplies power to the test path.
7. The test circuit of claim 1, wherein the predetermined time period is set according to a time from power-on to entering the low power consumption mode of the circuit board to be tested.
8. The test circuit of claim 1, wherein the accuracy of the current meter is on the order of microamperes.
9. A system for testing the operating current of a circuit board, comprising: the device comprises at least two circuit boards to be tested, at least two ammeters, at least two controlled switches and a timing trigger device, wherein the ammeters meet the preset precision requirement;
the timing trigger device is respectively connected with the at least two controlled switches, each circuit board to be tested is respectively connected with the corresponding ammeter in series to form at least two testing paths, and a first switch end and a second switch end in each controlled switch are respectively connected with the corresponding ammeter in the testing paths in parallel;
the timing trigger device is used for sending a closing control signal to at least one controlled switch when the at least two test paths are switched from an open state to a power-on state, and sending an opening control signal to the controlled switch after the time for short-circuiting the ammeter reaches a preset time length;
the controlled switch is used for connecting the first switch end and the second switch end when receiving a closing control signal, and disconnecting the first switch end and the second switch end when receiving an opening control signal.
10. The test system of claim 9, wherein the timing trigger device is a timing relay and the controlled switch is a controlled relay; the timing relay comprises a power supply end, a normally-open end, a normally-closed end and a public end, and the controlled relay comprises a control end, a normally-open end, a normally-closed end and a public end; a normally closed end and a common end of the controlled relay are respectively used as a first switch end and a second switch end to be connected with the ammeter in parallel;
the timing relay is specifically used for short-circuiting the public end and the normally closed end after the power supply end is powered on, providing a high level for the control end of at least one controlled relay through the public end, and starting timing; after timing is finished, the public end is in short circuit with the normally open end, and low level is provided for the at least one controlled relay through the public end;
the controlled relay is specifically configured to short-circuit the common end of the controlled relay with a normally closed end when the common end of the timing relay provides a high level to the control end of the controlled relay, and short-circuit an ammeter in a current test path, the ammeter being connected in parallel with the controlled relay; when the common end of the timing relay provides a low level for the control end of the controlled relay, the common end of the controlled relay is in short circuit with the normally open end, and an ammeter in the current test access and connected with the controlled relay in parallel is connected to the current test access in series to test the working current of the circuit board to be tested.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011280175.4A CN112415253A (en) | 2020-11-16 | 2020-11-16 | Circuit and system for testing working current of circuit board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011280175.4A CN112415253A (en) | 2020-11-16 | 2020-11-16 | Circuit and system for testing working current of circuit board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN112415253A true CN112415253A (en) | 2021-02-26 |
Family
ID=74831327
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202011280175.4A Pending CN112415253A (en) | 2020-11-16 | 2020-11-16 | Circuit and system for testing working current of circuit board |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN112415253A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116047194A (en) * | 2022-12-08 | 2023-05-02 | 宁波瑞森智能科技有限公司 | Cluster type measurement system and measurement method |
Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2932394Y (en) * | 2006-08-08 | 2007-08-08 | 天津市百利电气有限公司 | Metering device with a wide current measuring range |
| CN101676735A (en) * | 2008-09-18 | 2010-03-24 | 比亚迪股份有限公司 | Current sampling hall sensor device |
| CN102243260A (en) * | 2010-05-10 | 2011-11-16 | 东莞市创锐电子技术有限公司 | High-precision high-linearity alternating current (ac) and direct current (dc) detection apparatus |
| CN202057728U (en) * | 2011-03-31 | 2011-11-30 | 武汉工程大学 | Wide-range high-precision quick test device for direct-current resistance |
| CN103033667A (en) * | 2012-12-11 | 2013-04-10 | 工业和信息化部电子第五研究所 | Current measurement device and method |
| CN203551640U (en) * | 2013-10-31 | 2014-04-16 | 惠州市德赛西威汽车电子有限公司 | Test circuit |
| CN204536400U (en) * | 2015-04-28 | 2015-08-05 | 阳光电源股份有限公司 | A kind of current sampling circuit improving sampling precision |
| CN105259403A (en) * | 2015-11-06 | 2016-01-20 | 上海大众汽车有限公司 | Special current test system and current switching method for vehicle information system test bench |
| CN205280797U (en) * | 2015-12-21 | 2016-06-01 | 北京经纬恒润科技有限公司 | Automatic switch circuit and electric signal testing case of range |
| CN205786811U (en) * | 2016-06-06 | 2016-12-07 | 海盐新跃电器有限公司 | A kind of electric current split-core type meter of high-accuracy wide-range |
| CN106291080A (en) * | 2016-08-17 | 2017-01-04 | 云南电网有限责任公司电力科学研究院 | A kind of voltage acquisition Apparatus and method for |
-
2020
- 2020-11-16 CN CN202011280175.4A patent/CN112415253A/en active Pending
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2932394Y (en) * | 2006-08-08 | 2007-08-08 | 天津市百利电气有限公司 | Metering device with a wide current measuring range |
| CN101676735A (en) * | 2008-09-18 | 2010-03-24 | 比亚迪股份有限公司 | Current sampling hall sensor device |
| CN102243260A (en) * | 2010-05-10 | 2011-11-16 | 东莞市创锐电子技术有限公司 | High-precision high-linearity alternating current (ac) and direct current (dc) detection apparatus |
| CN202057728U (en) * | 2011-03-31 | 2011-11-30 | 武汉工程大学 | Wide-range high-precision quick test device for direct-current resistance |
| CN103033667A (en) * | 2012-12-11 | 2013-04-10 | 工业和信息化部电子第五研究所 | Current measurement device and method |
| CN203551640U (en) * | 2013-10-31 | 2014-04-16 | 惠州市德赛西威汽车电子有限公司 | Test circuit |
| CN204536400U (en) * | 2015-04-28 | 2015-08-05 | 阳光电源股份有限公司 | A kind of current sampling circuit improving sampling precision |
| CN105259403A (en) * | 2015-11-06 | 2016-01-20 | 上海大众汽车有限公司 | Special current test system and current switching method for vehicle information system test bench |
| CN205280797U (en) * | 2015-12-21 | 2016-06-01 | 北京经纬恒润科技有限公司 | Automatic switch circuit and electric signal testing case of range |
| CN205786811U (en) * | 2016-06-06 | 2016-12-07 | 海盐新跃电器有限公司 | A kind of electric current split-core type meter of high-accuracy wide-range |
| CN106291080A (en) * | 2016-08-17 | 2017-01-04 | 云南电网有限责任公司电力科学研究院 | A kind of voltage acquisition Apparatus and method for |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116047194A (en) * | 2022-12-08 | 2023-05-02 | 宁波瑞森智能科技有限公司 | Cluster type measurement system and measurement method |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US7574318B2 (en) | I/O port tester | |
| CN104569730A (en) | Cable testing system applied to minisatellite | |
| CN113514758B (en) | Chip testing method, tester and storage medium | |
| CN109490763A (en) | A kind of relay single-board universal device and test method | |
| CN112083309B (en) | Intelligent test system and method for memory plate | |
| CN104049201A (en) | Testing method, device and system for printed circuit boards | |
| CN112379251A (en) | Relay circuit fault testing system and method | |
| CN105137258A (en) | Intelligent early-warning control device for high-voltage test grounding | |
| CN112415253A (en) | Circuit and system for testing working current of circuit board | |
| JP2014106220A (en) | Inspection device and inspection method | |
| CN101769962B (en) | Electric energy meter detecting system and device for detecting contact resistance and method thereof | |
| CN107271944A (en) | A kind of full-automatic termination of program control type current transformer | |
| CN106569084A (en) | Controllable characteristic load used for cable cabling accuracy detection | |
| CN219871718U (en) | Power supply test system | |
| WO2023231279A1 (en) | Vehicle body control unit fault code test system and method | |
| JP2024507487A (en) | Communication link operating characteristics test system and test method | |
| CN115032520A (en) | Automatic remote measurement and control system for testing power management chip | |
| CN210376638U (en) | Device for testing electrical parameters of power supply of CIR equipment module | |
| CN103207342A (en) | Ground intelligent pre-warning device for overhauling test | |
| CN113900003A (en) | Chip pin disconnection detection device and detection method | |
| CN208459555U (en) | A kind of fuse test device | |
| CN106526459B (en) | High-performance radio frequency remote control automatic test system and method thereof | |
| CN111060811A (en) | Chip pin position identification module and identification method thereof | |
| CN111596201A (en) | Method for supplying power by using digital channel | |
| CN111693891A (en) | Terminal with communication module and remote diagnosis system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20210226 |
|
| RJ01 | Rejection of invention patent application after publication |