CN103559128A - Power-on and power-off test circuit and power-on and power-off test device - Google Patents
Power-on and power-off test circuit and power-on and power-off test device Download PDFInfo
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- CN103559128A CN103559128A CN201310516415.XA CN201310516415A CN103559128A CN 103559128 A CN103559128 A CN 103559128A CN 201310516415 A CN201310516415 A CN 201310516415A CN 103559128 A CN103559128 A CN 103559128A
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Abstract
The invention is applicable to the field of electronics, and provides a power-on and power-off test circuit and device. The circuit comprises at least one power supply, a control unit, at least one test selection switch, a power control unit and at least one controllable switch unit, the power supplies are used for providing work power voltage and test power voltage, the control unit is used for converting instructions outputted by a control terminal into a power-on test instruction signal and a test selection signal, the test selection switches are connected or disconnected under control of the test selection signal and outputting the power-on test instruction signal in connection, the power control unit is used for selectively outputting one or more test power voltage, and the controllable switch units are connected or disconnected under control of the power-on test instruction signal and performing power-on test for a device to be tested by the aid of the test power voltage in connection. Connection or disconnection of the controllable switch units are controlled by the aid of the instructions, automatic multi-circuit power-on and power-off test of the device to be tested is realized, and the power-on and power-off test circuit is low in test cost, small in size and high in efficiency.
Description
Technical field
The invention belongs to electronic applications, relate in particular to a kind of power-on and power-off test circuit and power-on and power-off proving installation.
Background technology
After software development, need, by certain vehicle equipment, it is carried out to power-on and power-off test, to verify the realization of its function, and the effect realizing, at present classic method testing software need to cut off or closed power supply completes the upper and lower electricity of Devices to test conventionally manually, automaticity is low, or test by LABVIEW software, but, LABVIEW software cannot be realized instruction and control, price is too high again, therefore and can only realize the test of two-way power-on and power-off, cause that testing cost is high, scheme is complicated, efficiency is low.
Summary of the invention
The object of the embodiment of the present invention is to provide a kind of test circuit of automatic control power-on and power-off, be intended to solve software test and cannot realize robotization, and testing cost is high, scheme is complicated, inefficient problem.
The embodiment of the present invention is achieved in that a kind of test circuit of automatic control power-on and power-off, it is characterized in that, described circuit is connected with Devices to test with control terminal, and described circuit comprises:
At least one power supply, for providing working power voltage and testing power supply voltage;
Control module, for the instruction of described control terminal output is converted into power on test instruction signal and test selection signal, the control end of described control module is connected with the output terminal of described control terminal, and the power end of described control module is connected with the output terminal of described power supply;
At least one test selection switch, for conducting or shutoff under the control of described test selection signal, and when conducting the output test instruction signal that powers on, the control end of described test selection switch is connected with the test selection output terminal of described control module, and the input end of described test selection switch is connected with the test instruction output terminal that powers on of described control module;
Power control unit, exports one or more described testing power supply voltage for selecting, and the input end of described power control unit is connected with the output terminal of one or more described power supplys;
At least one controllable switch unit, for conducting or shutoff under the control of the test instruction signal that powers on, and when conducting, utilize described testing power supply voltage to carry out upper electrical testing to described Devices to test, the control end of described controllable switch unit is connected with the output terminal of described test selection switch, the input end of described controllable switch unit is connected with the output terminal of described power control unit, and the output terminal of described controllable switch unit is connected with the power end of described Devices to test;
Described test selection switch equates with the quantity of described controllable switch unit.
Further, described control module is the MCU based on ARM framework, and the control end of described control module, test selection output terminal and the test instruction output terminal that powers on are serial data communication interface.
Further, the test selection output terminal of described control module and the test instruction output terminal that powers on are GPIO interface.
Further, described control module and described Devices to test all by 232,485 or TTL agreement carry out data transmission.
Further, described test selection switch is N-type metal-oxide-semiconductor, the grid of described N-type metal-oxide-semiconductor is the control end of described test selection switch, and the drain electrode of described N-type metal-oxide-semiconductor is the input end of described test selection switch, and the grid of described N-type metal-oxide-semiconductor is the output terminal of described test selection switch.
Further, described power control unit comprises:
The first conduction module and the second conduction module;
The first input end of described power control unit is connected with the first input end of described the first conduction module with the first output terminal of described power control unit simultaneously, the second input end of described power control unit is connected with the second output terminal of described power control unit and the second input end of described the first conduction module simultaneously, the second output terminal of described power control unit is also connected with the first input end of described the second conduction module with the output terminal of described the first conduction module simultaneously, the 3rd input end of described power control unit is connected with the 3rd output terminal of described power control unit and the second input end of described the second conduction module simultaneously, the 3rd output terminal of described power control unit is also connected with the output terminal of described the second conduction module.
Further, described controllable switch unit is relay, the coil-end of described relay is the control end of described controllable switch unit, the input end that the common port of described relay is described controllable switch unit, the output terminal that the Chang Kaiduan of described relay is described controllable switch unit.
Further, described power supply is a plurality of, is respectively the first power supply and second source;
The output terminal of described the first power supply and described second source is connected with the second input end with the first input end of described power control unit respectively.
Further, described test selection switch and described controllable switch unit are a plurality of;
The control end of a plurality of test selection switches is all connected with one or more test selection output terminals of described control module, the input end of a plurality of test selection switches is all connected with one or more test instruction output terminals that power on of described control module, the output terminal of a plurality of test selection switches is connected with the control end of a plurality of controllable switch unit respectively, the input end of a plurality of controllable switch unit is connected with a plurality of output terminals of described power control unit respectively, and the output terminal of a plurality of controllable switch unit is connected with the power end of a plurality of Devices to tests respectively.
Another object of the embodiment of the present invention is to provide a kind of proving installation that adopts the power-on and power-off of above-mentioned power-on and power-off test circuit.
The embodiment of the present invention is controlled controllable switch unit closure or is turn-offed by instruction, realizes the automatic test to Devices to test power-on and power-off, without buying software, testing cost is low, and can carry out multi-channel test simultaneously, and proving installation is simple, volume is little, and testing efficiency is high.
Accompanying drawing explanation
The structural drawing of the power-on and power-off test circuit that Fig. 1 provides for the embodiment of the present invention;
The structural drawing of the power-on and power-off test circuit of the identical voltage of multichannel that Fig. 2 provides for the embodiment of the present invention;
Fig. 3 provides the structural drawing of the power-on and power-off test circuit of the two kinds of voltages in San road for the embodiment of the present invention;
Fig. 4 provides the structure of the power-on and power-off test circuit of the three kinds of voltages in San road for the embodiment of the present invention;
Fig. 5 provides the structural drawing of power control unit in the power-on and power-off test circuit of the three kinds of voltages in San road for the embodiment of the present invention.
Embodiment
In order to make object of the present invention, technical scheme and advantage clearer, below in conjunction with drawings and Examples, the present invention is further elaborated.Should be appreciated that specific embodiment described herein, only in order to explain the present invention, is not intended to limit the present invention.
The embodiment of the present invention is controlled controllable switch unit closure or is turn-offed by instruction, realizes the automatic test to Devices to test power-on and power-off, without buying software, testing cost is low, and can carry out multi-channel test simultaneously, and proving installation is simple, volume is little, and testing efficiency is high.
Below in conjunction with specific embodiment, realization of the present invention is described in detail:
Fig. 1 shows the structure of the power-on and power-off test circuit that the embodiment of the present invention provides, and for convenience of explanation, only shows part related to the present invention.
As one embodiment of the invention, this power-on and power-off test circuit can be applied in the proving installation of various power-on and power-off.
This power-on and power-off test circuit 1 is connected with Devices to test 2 with control terminal PC, and this circuit comprises:
At least one power supply 11, for providing working power voltage and testing power supply voltage;
As one embodiment of the invention, this control module 12 can adopt the Machine based on ARM(Advanced RISC) the MCU(Micro Controller Unit of framework) realize, the control end of control module 12, test selection output terminal and the test instruction output terminal that powers on all can adopt serial data communication interface, especially applicable universal input/output (General Purpose Input Output, GPIO) interface, control module 12 and Devices to test 2 all can adopt 232,485 or TTL agreement carry out data transmission.Certainly, control module 12 also can adopt the circuit that resolution element forms to realize.
At least one test selection switch 13, for conducting or shutoff under the control of test selection signal, and when conducting the output test instruction signal that powers on, the control end of this test selection switch 13 is connected with the test selection output terminal of control module 12, and the input end of test selection switch 13 is connected with the test instruction output terminal that powers on of control module 12;
As one embodiment of the invention, test selection switch 13 can adopt semiconductor switch device to realize, for example metal-oxide-semiconductor or triode, if test selection switch 13 is N-type metal-oxide-semiconductor, the grid of this N-type metal-oxide-semiconductor is the control end of test selection switch 13, the drain electrode of N-type metal-oxide-semiconductor is the input end of test selection switch 13, the grid of N-type metal-oxide-semiconductor is the output terminal of test selection switch 13, when if those skilled in the art are easy to learn test selection switch 13 for P type metal-oxide-semiconductor and triode according to the corresponding relation of N-type metal-oxide-semiconductor and test selection switch 13 ports, the corresponding relation of its port.
As one embodiment of the invention, this power control unit 15 can be built selection circuit by metal-oxide-semiconductor or other semiconductor switchs as required, also can adopt the integrated chip with multichannel selection function to realize, and specifically describes referring to subsequent embodiment.
At least one controllable switch unit 14, for conducting or shutoff under the control of the test instruction signal that powers on, and when conducting, utilize testing power supply voltage to carry out upper electrical testing to Devices to test 2, the control end of this controllable switch unit 14 is connected with the output terminal of test selection switch 13, the input end of controllable switch unit 14 is connected with the output terminal of power control unit 15, and the output terminal of controllable switch unit 14 is connected with the power end of Devices to test 2;
As one embodiment of the invention, controllable switch unit 14 can adopt relay to realize, and in conjunction with Fig. 1, the coil-end of relay is the control end of controllable switch unit 14, the common port of relay is the input end of controllable switch unit 14, the output terminal that the Chang Kaiduan of relay 14 is controllable switch unit.
Test selection switch 13 equates with the quantity of controllable switch unit 14.
In embodiments of the present invention, control terminal PC carries out automatized script file, and instruction is exported to and controlled control module 12, after control module 12 powers on, the instruction of control terminal PC is converted into test selection signal, control 13 conductings of test selection switch, and the test instruction signal that powers on when conducting, control module 12 being generated passes to controllable switch unit 14, controllable switch unit 14 conducting under the control of the test instruction signal that powers on, supply voltage to Devices to test 2 out-put supply control module 15 outputs, to realize upper electrical testing, and by control module 12, control test selection switch 13 and turn-off, thereby controllable switch unit 14 is disconnected, stop 2 power supplies to Devices to test and realize lower electrical testing.
Should expect, the power-on and power-off that can simultaneously carry out the different voltages of many groups to a plurality of Devices to tests by a plurality of power supplys that different voltages are provided are according to actual needs tested, or when the operating voltage of control module needs is different with the voltage of upper electrical testing, also can increase accordingly number of power sources.
The embodiment of the present invention is controlled controllable switch unit closure or is turn-offed by instruction, realizes the automatic test to Devices to test power-on and power-off, without buying software, testing cost is low, and can carry out multi-channel test simultaneously, and proving installation is simple, volume is little, and testing efficiency is high.
Fig. 2 shows the structure of the power-on and power-off test circuit of the identical voltage of multichannel that the embodiment of the present invention provides, and for convenience of explanation, only shows part related to the present invention.
As one embodiment of the invention, this power-on and power-off test circuit 1 can adopt a power supply a plurality of Devices to tests to be carried out to power-on and power-off test simultaneously, now, can corresponding increase test selection switch and the quantity of controllable switch unit, referring to Fig. 2.
A plurality of Devices to tests are carried out to principle of work that upper and lower electrical measurement establishes with identical to the principle of work of a Devices to test test simultaneously, refer to above-described embodiment, repeat no more herein.
Fig. 3 shows the structure that the embodiment of the present invention provides the power-on and power-off test circuit of the two kinds of voltages in San road, for convenience of explanation, only shows part related to the present invention.
As one embodiment of the invention, this power-on and power-off test circuit 1 can also adopt a plurality of power supplys that multiple voltage is provided, and for a plurality of Devices to tests provide different voltage simultaneously, carries out power-on and power-off test, is specially:
The first power supply 111 and second source 112 provide respectively the voltage of 5V and 12V, and the output terminal of the first power supply 111 and second source 112 is connected with the second input end with the first input end of power control unit 15 respectively;
In embodiments of the present invention, when to a plurality of power supply of power control unit 15 input, the first output terminal of power control unit 15 is by controllable switch unit 141 to first Devices to test 21 output the first testing power supply voltages, and the second output terminal of power control unit 15 and the 3rd output terminal are exported the second testing power supply voltages by controllable switch unit 142,143 to the second Devices to test 22, the 3rd Devices to test 23 respectively.Fig. 4 shows the structure that the embodiment of the present invention provides the power-on and power-off test circuit of the three kinds of voltages in San road, for convenience of explanation, only shows part related to the present invention.
As one embodiment of the invention, this power-on and power-off test circuit 1 adopts three power supplys that three kinds of voltages are provided, and for three Devices to tests provide different voltage simultaneously, carries out power-on and power-off test, is specially:
The first power supply 111, second source 112 and the 3rd power supply 113 provide respectively the voltage of 5V, 12V and 24V, and the output terminal of the first power supply 111, second source 112 and the 3rd power supply 113 is connected with first input end, the second input end and the 3rd input end of power control unit 15 respectively;
In embodiments of the present invention, the first power supply 111 is control module 12 power supplies, and for the first Devices to test 21 provides the first testing power supply voltage, second source 112 and the 3rd power supply 113 are respectively the second Devices to test 22 and the 3rd Devices to test 23 provides the second testing power supply voltage and the 3rd testing power supply voltage.
If while having more controllable switch unit (N) to be connected with power control unit 15, corresponding with power control unit 15 first connects to N output terminal, and M power supply exported respectively M supply voltage by first of power control unit 15 to M output terminal, and M+1 output terminal to the N output terminal of power control unit 15 is exported M the voltage that power supply is corresponding.
The three drive test examinations of take are example, and the structure of power control unit 15 is referring to Fig. 5, and this power control unit 15 comprises:
The first conduction module 151 and the second conduction module 152;
The first input end VIN1 of power control unit 15 is connected with the first input end of the first conduction module 151 with the first output terminal VOUT1 of power control unit 15 simultaneously, the second input end VIN2 of power control unit 15 is connected with the second input end of the first conduction module 151 with the second output terminal VOUT2 of power control unit 15 simultaneously, the second output terminal VOUT2 of power control unit 15 is also connected with the first input end of the second conduction module 152 with the output terminal of the first conduction module 151 simultaneously, the 3rd input end VIN3 of power control unit 15 is connected with the second input end of the second conduction module 152 with the 3rd output terminal VOUT3 of power control unit 15 simultaneously, the 3rd output terminal VOUT3 of power control unit 15 is also connected with the output terminal of the second conduction module 152.
As one embodiment of the invention, the first conduction module 151 and the second conduction module 152 can adopt multiple implementation to realize as a kind of function selector circuit, for example, adopt conducting gate circuit to realize, or adopt metal-oxide-semiconductor and triode combination to realize, those skilled in the art all can select different devices to realize according to real needs, and the present embodiment does not limit its syndeton.
In embodiments of the present invention, when only the first input end VIN1 of power control unit 15 being accessed to the first power supply, conducting between node a and node b, also conducting between node b and node c, therefore, the first output terminal VOUT1 of power control unit 15, the second output terminal VOUT2 and the 3rd output terminal VOUT3 all export the first supply voltage;
When the first input end VIN1 at power control unit 15 accesses the first power supply, the second input end VIN2 access second source, between node a and node b, disconnect, conducting between node b and node c, therefore, the first output terminal VOUT1 of power control unit 15 exports the first supply voltage, and the second output terminal VOUT2 and the 3rd output terminal VOUT3 all export second source voltage;
When the first input end VIN1 at power control unit 15, the second input end VIN2 and the 3rd input end VIN3 access respectively the first power supply, second source and the 3rd power supply, between node a and node b, disconnect, between node b and node c, also disconnect, the first output terminal VOUT1 of power control unit 15, the second output terminal VOUT2 and the 3rd output terminal VOUT3 export respectively the first supply voltage, second source voltage and the 3rd supply voltage.
Understandably, the selection of supply voltage can be set according to the actual requirements, is not defined as 5V, 12V, 24V herein.
The quantity of power supply does not limit yet, but is preferably in six, because power supply is too much by causing the circuit of power control unit 15 too complicated, with increasing circuit area.
As one embodiment of the present invention, can also realize the long-range of power-on and power-off test is controlled by Long-distance Control control terminal PC.
Another object of the embodiment of the present invention is to provide a kind of proving installation that adopts the automatic control power-on and power-off of above-mentioned power-on and power-off test circuit.
The embodiment of the present invention is connected with PC by serial ports, then by PC output order, control controllable switch unit closure or turn-off, to realize the automatic test to Devices to test power-on and power-off, without buying software, testing cost is low, and can carry out multi-channel test simultaneously, and proving installation is simple, volume is little, and testing efficiency is high.
These are only preferred embodiment of the present invention, not in order to limit the present invention, all any modifications of doing within the spirit and principles in the present invention, be equal to and replace and improvement etc., within all should being included in protection scope of the present invention.
Claims (10)
1. a power-on and power-off test circuit, is characterized in that, described circuit is connected with Devices to test with control terminal, and described circuit comprises:
At least one power supply, for providing working power voltage and testing power supply voltage;
Control module, for the instruction of described control terminal output is converted into power on test instruction signal and test selection signal, the control end of described control module is connected with the output terminal of described control terminal, and the power end of described control module is connected with the output terminal of described power supply;
At least one test selection switch, for conducting or shutoff under the control of described test selection signal, and when conducting the output test instruction signal that powers on, the control end of described test selection switch is connected with the test selection output terminal of described control module, and the input end of described test selection switch is connected with the test instruction output terminal that powers on of described control module;
Power control unit, exports one or more described testing power supply voltage for selecting, and the input end of described power control unit is connected with the output terminal of one or more described power supplys;
At least one controllable switch unit, for conducting or shutoff under the control of the test instruction signal that powers on, and when conducting, utilize described testing power supply voltage to carry out upper electrical testing to described Devices to test, the control end of described controllable switch unit is connected with the output terminal of described test selection switch, the input end of described controllable switch unit is connected with the output terminal of described power control unit, and the output terminal of described controllable switch unit is connected with the power end of described Devices to test;
Described test selection switch equates with the quantity of described controllable switch unit.
2. circuit as claimed in claim 1, is characterized in that, described control module is the MCU based on ARM framework, and the control end of described control module, test selection output terminal and the test instruction output terminal that powers on are serial data communication interface.
3. circuit as claimed in claim 2, is characterized in that, the test selection output terminal of described control module and the test instruction output terminal that powers on are GPIO interface.
4. circuit as claimed in claim 2, is characterized in that, described control module and described Devices to test all by 232,485 or TTL agreement carry out data transmission.
5. circuit as claimed in claim 1, it is characterized in that, described test selection switch is N-type metal-oxide-semiconductor, the grid of described N-type metal-oxide-semiconductor is the control end of described test selection switch, the drain electrode of described N-type metal-oxide-semiconductor is the input end of described test selection switch, and the grid of described N-type metal-oxide-semiconductor is the output terminal of described test selection switch.
6. circuit as claimed in claim 1, is characterized in that, described power control unit comprises:
The first conduction module and the second conduction module;
The first input end of described power control unit is connected with the first input end of described the first conduction module with the first output terminal of described power control unit simultaneously, the second input end of described power control unit is connected with the second output terminal of described power control unit and the second input end of described the first conduction module simultaneously, the second output terminal of described power control unit is also connected with the first input end of described the second conduction module with the output terminal of described the first conduction module simultaneously, the 3rd input end of described power control unit is connected with the 3rd output terminal of described power control unit and the second input end of described the second conduction module simultaneously, the 3rd output terminal of described power control unit is also connected with the output terminal of described the second conduction module.
7. circuit as claimed in claim 1, it is characterized in that, described controllable switch unit is relay, the coil-end of described relay is the control end of described controllable switch unit, the common port of described relay is the input end of described controllable switch unit, the output terminal that the Chang Kaiduan of described relay is described controllable switch unit.
8. circuit as claimed in claim 1, is characterized in that, described power supply is a plurality of, is respectively the first power supply and second source;
The output terminal of described the first power supply and described second source is connected with the second input end with the first input end of described power control unit respectively.
9. circuit as claimed in claim 1, is characterized in that, described test selection switch and described controllable switch unit are a plurality of;
The control end of a plurality of test selection switches is all connected with one or more test selection output terminals of described control module, the input end of a plurality of test selection switches is all connected with one or more test instruction output terminals that power on of described control module, the output terminal of a plurality of test selection switches is connected with the control end of a plurality of controllable switch unit respectively, the input end of a plurality of controllable switch unit is connected with a plurality of output terminals of described power control unit respectively, and the output terminal of a plurality of controllable switch unit is connected with the power end of a plurality of Devices to tests respectively.
10. a power-on and power-off proving installation, is characterized in that, described device comprises the power-on and power-off test circuit as described in claim 1 to 7 any one.
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| CN106501630A (en) * | 2015-09-08 | 2017-03-15 | 致茂电子(苏州)有限公司 | Multichannel testing single-board can be combined |
| CN106501630B (en) * | 2015-09-08 | 2019-03-22 | 致茂电子(苏州)有限公司 | The testing single-board of multichannel can be combined |
| CN105606988A (en) * | 2015-11-02 | 2016-05-25 | 林晓东 | Circuit tester |
| CN105258720A (en) * | 2015-11-04 | 2016-01-20 | 上海斐讯数据通信技术有限公司 | Automation testing system and method |
| CN106771748A (en) * | 2016-12-22 | 2017-05-31 | 北京东土科技股份有限公司 | A kind of test system and method for equipment power-on and power-off |
| CN106980561A (en) * | 2017-05-27 | 2017-07-25 | 郑州云海信息技术有限公司 | A kind of power-on and power-off test system and its method |
| CN108429909A (en) * | 2018-02-05 | 2018-08-21 | 济南中维世纪科技有限公司 | A kind of NVR power-off cycle automatic test approach |
| CN109284208A (en) * | 2018-09-04 | 2019-01-29 | 郑州云海信息技术有限公司 | A kind of method and system of automatic test memory power-on and power-off |
| CN109857599A (en) * | 2018-12-28 | 2019-06-07 | 北京旷视科技有限公司 | Method, apparatus, system and computer-readable medium for hardware device test |
| CN111381146A (en) * | 2018-12-28 | 2020-07-07 | 深圳市优必选科技有限公司 | Test system and test method thereof |
| CN109917218A (en) * | 2019-04-30 | 2019-06-21 | 深圳开立生物医疗科技股份有限公司 | Power-on and power-off test macro, method and the electrical equipment of electrical equipment |
| CN110988540A (en) * | 2019-12-12 | 2020-04-10 | 山东有人信息技术有限公司 | Automatic power-on and power-off testing system of Internet of things communication equipment |
| CN111551800A (en) * | 2020-04-17 | 2020-08-18 | 歌尔光学科技有限公司 | Test device and test method |
| CN111752364A (en) * | 2020-06-28 | 2020-10-09 | 杭州迪普科技股份有限公司 | Apparatus and method for controlling power switch |
| CN111983545A (en) * | 2020-08-24 | 2020-11-24 | 安徽南瑞中天电力电子有限公司 | Testing method and testing device for communication module of intelligent electric energy meter |
| CN113589092A (en) * | 2021-09-28 | 2021-11-02 | 苏州浪潮智能科技有限公司 | Fatigue machine, equipment power-on and power-off test system and power-on and power-off test method |
| CN113589092B (en) * | 2021-09-28 | 2022-01-04 | 苏州浪潮智能科技有限公司 | Fatigue machine, equipment power-on and power-off test system and power-on and power-off test method |
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