CN202710672U - Power-on reliability test system - Google Patents
Power-on reliability test system Download PDFInfo
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- CN202710672U CN202710672U CN 201220165737 CN201220165737U CN202710672U CN 202710672 U CN202710672 U CN 202710672U CN 201220165737 CN201220165737 CN 201220165737 CN 201220165737 U CN201220165737 U CN 201220165737U CN 202710672 U CN202710672 U CN 202710672U
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Abstract
The utility model is suitable to the electronic circuit reliability test verification field, and provides a power-on reliability test system, comprising at least one test unit group connected with the power supplying path of a corresponding circuit group to be tested in series, wherein the circuit group to be tested comprises at least one circuit to be tested, the test unit group comprises at least one test unit connected with the power supplying path of the corresponding circuit to be tested in series, and the upper computer of the test unit group is connected through a data line. The power-on reliability test system employs an upper computer control mode; users select a corresponding test unit group and a corresponding power-on reliability test project through the upper computer, and set the time parameters of the project; relative to the prior programmable timer, the set time grade can reach a millisecond grade, and thereby the power-on reliability test system can perform frequent power on and off tests on various circuits to be tested in a minimum system of the electronic products; and furthermore, when the power-on reliability test system comprises a plurality of test unit groups, different test unit groups can be set to perform different test projects.
Description
Technical field
The utility model belongs to the reliability testing checking field of electronic circuit, relates in particular to a kind of energising reliability test system.
Background technology
Current electronic product is before dispatching from the factory, the reliability testing of need to switching on, by situations such as simulation burst power failure or power down and frequent power-on and power-off, assess the operation stability under the various energising situations of electronic product, in time find the potential risk that product may exist with this.
Prior art produces timing pip by programmable timer, realizes the energising reliability testing to electronic product.Programmable timer is divided into again the timer of domestic applications and the timer that enterprise uses.For the timer of domestic applications, when it was tested, the shortest setup times was a minute level; Timer for enterprise uses by several timers are integrated, can arrange a hour level, minute level, second level, and the shortest setup times is a second level.
Yet for each circuit-under-test in the electronic product minimum system, finishing the time that powers on from power supply input circuit-under-test to circuit-under-test is Millisecond, therefore the programmable timer that using prior art provides only can realize the cold start-up of each circuit-under-test in the minimum system or the test of warm start, and can't finish the test to the frequent power-on and power-off of each circuit-under-test in the minimum system.
The utility model content
The purpose of this utility model is to provide a kind of energising reliability test system, be intended to solve energising reliability test system that prior art provides because the shortest setup times rank of programmable timer is second level or a minute level, not being suitable for power-on time is the problem that the circuit-under-test of Millisecond carries out the test of frequent power-on and power-off.
The utility model is achieved in that a kind of energising reliability test system, and described system comprises:
Be connected at least one the test cell group on the corresponding circuit-under-test group supply access, described circuit-under-test group comprises at least one circuit-under-test, and described test cell group comprises at least one test cell that is connected on the corresponding described circuit-under-test group supply access;
Connect described test cell group by data line, according to user's the host computer that instruction is controlled the on off state of corresponding described test cell, whether powered on to control corresponding described circuit-under-test that arranges.
Further, described host computer can comprise:
Receive user's the described control platform that instruction is set and sends the control signal of the corresponding described test cell on off state of control;
The data collecting card that connects described control platform;
Connect described data collecting card, the described control signal that described control platform is sent sends to the first interface of corresponding described test cell, and described first interface connects described test cell group by described data line.
A nearlyer step ground, described control platform can be based on the control platform of Labview.
Simultaneously, described first interface can be the PCI-E interface.
In the above-mentioned energising reliability test system, described test cell can comprise:
The second interface that connects described host computer by described data line;
Connect described the second interface and be connected on the corresponding described circuit-under-test group supply access, by described host computer by described the second interface control swith state, at least one energising switch unit of whether powering on to control corresponding described circuit-under-test.
Further, described the second interface can be the general purpose interface bus interface.
Simultaneously, described energising switch unit can be relay unit.
At this moment, described at least one test cell group can be integrated in an ATE test board.
At this moment, further, described energising switch unit can comprise: relay J; One end of described relay J coil connects a direct current, and the other end of described relay J coil connects described the second interface; The switch of described relay J is a duplex switch, the moving contact of two switches all connects the power supply unit of described circuit-under-test in the described ganged switch, the normally closed contact of two switches is unsettled in the described ganged switch, and the normally opened contact of two switches connects described circuit-under-test in the described ganged switch.
A nearlyer step ground, described energising switch unit can also comprise: resistance R 1 and light emitting diode D1; The anode of described light emitting diode D1 connects a direct current by described resistance R 1, and the negative electrode of described light emitting diode D1 connects described the second interface.
Because the energising reliability test system that the utility model embodiment provides is to adopt the PC control mode, the user can be by the corresponding test cell group of upper computer selecting and corresponding energising reliability testing project, and the time parameter of energising reliability testing project arranged, with respect to existing programmable timer, the time rank that can arrange reaches Millisecond, thereby can realize each circuit-under-test in the electronic product minimum system is carried out the test of frequent power-on and power-off; In addition, when this energising reliability test system includes a plurality of test cell group, different test cell groups can be set carry out different test events, can realize the independent control of each test group, expand the application function of system.
Description of drawings
Fig. 1 is the structural drawing of the energising reliability test system that provides of the utility model embodiment;
Fig. 2 is the concrete structure figure of host computer and test cell among Fig. 1;
Fig. 3 is a kind of circuit diagram of energising switch unit 122 among Fig. 2.
Embodiment
In order to make the purpose of this utility model, technical scheme and advantage clearer, below in conjunction with drawings and Examples, the utility model is further elaborated.Should be appreciated that specific embodiment described herein only in order to explaining the utility model, and be not used in restriction the utility model.
Problem for the prior art existence, the energising reliability test system that the utility model embodiment provides is by the setting of host computer according to the user, control is connected on the on off state of the corresponding test cell on the circuit-under-test supply access, whether power on the control circuit-under-test, realize the energising reliability testing to circuit-under-test.
Fig. 1 shows the structure of the energising reliability test system that the utility model embodiment provides, and for convenience of explanation, only shows the part relevant with the utility model embodiment.
The energising reliability test system that the utility model embodiment provides comprises: be connected at least one the test cell group 12 on the corresponding circuit-under-test group supply access; By data line connecting test unit group 12, according to the user arrange instruction control the on off state of corresponding test cell in the corresponding test cell group 12, to control the host computer 11 that whether corresponding circuit-under-test powers in the corresponding circuit-under-test group.Circuit-under-test group wherein includes at least one circuit-under-test, and this circuit-under-test can be direct-flow input circuit or ac input circuit (as: power supply adaptor etc.); Correspondingly, wherein test cell group 12 comprises at least one test cell that is connected on the corresponding circuit-under-test supply access.This at least one test cell group 12 preferably is integrated on an ATE (automatic test equipment) (Automatic Test Equipment, the ATE) test board.
When adopting this energising reliability test system that circuit-under-test is switched on reliability testing, the user chooses test cell address corresponding to circuit-under-test by host computer 11, and select required energising reliability testing project, and as: frequent power-on and power-off test, timed power on/off test, cold start-up test or warm start test etc.; The time parameter of the test event of selection is set afterwards, as: power-on time, lower electricity time, power-on and power-off number of times, single test or loop test etc.Host computer 11 is according to user's setting, corresponding test cell in corresponding test cell group 12 sends control signal, control corresponding test cell and carry out switch motion according to the time parameter that arranges, finish single energising reliability testing or circulation energising reliability testing to circuit-under-test.
Because the energising reliability test system that the utility model embodiment provides is to adopt host computer 11 control modes, the user can be by the corresponding test cell group 12 of upper computer selecting and corresponding energising reliability testing project, and the time parameter of energising reliability testing project arranged, with respect to existing programmable timer, the time rank that can arrange reaches Millisecond, thereby can realize each circuit-under-test in the electronic product minimum system is carried out the test of frequent power-on and power-off; In addition, when this energising reliability test system includes a plurality of test cell group 12, different test cell group 12 can be set carry out different test events, as: utilize 12 pairs of circuit-under-test groups of a test cell group to carry out frequent power-on and power-off test; Utilize 12 pairs of circuit-under-test groups of another test cell group to carry out the timed power on/off test; Utilize again 12 pairs of circuit-under-test groups of a test cell group to carry out the cold start-up test; Utilize again 12 pairs of circuit-under-test groups of a test cell group to carry out the warm start test, can realize the independent control of each test group, expanded the application function of system.
Fig. 2 is take a test cell group 12 as example, shows the concrete structure of host computer 11 and test cell group 12 among Fig. 1.
Test cell can comprise: the second interface 121 that connects host computer 11 by data line; Connect the second interface 121 and be connected on the corresponding circuit-under-test supply access, by host computer 11 by the second interface 121 gauge tap states, controlling at least one the energising switch unit 122 whether corresponding circuit-under-test power on, each energising switch unit 122 and the second interface 121 constitute a test cell.
Preferably, the second interface 121 is general purpose interface bus (General-Purpose Interface Bus, GPIB) interfaces; Energising switch unit 122 is relay units.
When Fig. 3 is relay unit with energising switch unit 122, show a kind of circuit of energising switch unit 122.
Particularly, energising switch unit 122 can comprise: relay J, and an end connection+5V direct current of relay J coil, the other end of relay J coil connects the second interface 121; The switch of relay J is a duplex switch, and the moving contact of two switches all connects the power supply unit of circuit-under-test in the ganged switch, and the normally closed contact of two switches is unsettled in the ganged switch, and the normally opened contact of two switches connects circuit-under-test in the ganged switch.
The circuit of this energising switch unit 122 is when work, and in power-on time, host computer 11 sends the low level control signal by the second interface 121, so that the coil of relay J powers on, drives the switch closure of relay J, and then power supply unit is powered to circuit-under-test; Within the lower electricity time, host computer 11 sends high-level control signal by the second interface 121, so that the coil losing electricity of relay J, the switch that drives relay J disconnects, and then power supply unit stops to power to circuit-under-test.
Further, energising switch unit 122 can also comprise resistance R 1 and light emitting diode D1.The anode of light emitting diode D1 is by resistance R 1 connection+5V direct current, and the negative electrode of light emitting diode D1 connects the second interface 121.Then host computer 11 is when sending the low level control signal by the second interface 121, and light emitting diode D1 is simultaneously luminous, so that the duty of current relay J to be provided.
Because the energising reliability test system that the utility model embodiment provides is to adopt host computer 11 control modes, the user can be by the corresponding test cell group 12 of upper computer selecting and corresponding energising reliability testing project, and the time parameter of energising reliability testing project arranged, with respect to existing programmable timer, the time rank that can arrange reaches Millisecond, thereby can realize each circuit-under-test in the electronic product minimum system is carried out the test of frequent power-on and power-off; In addition, when this energising reliability test system includes a plurality of test cell group 12, different test cell group 12 can be set carry out different test events, as: utilize 12 pairs of circuit-under-test groups of a test cell group to carry out frequent power-on and power-off test; Utilize 12 pairs of circuit-under-test groups of another test cell group to carry out the timed power on/off test; Utilize again 12 pairs of circuit-under-test groups of a test cell group to carry out the cold start-up test; Utilize again 12 pairs of circuit-under-test groups of a test cell group to carry out the warm start test, can realize the independent control of each test group, expanded the application function of system.
The above only is preferred embodiment of the present utility model; not in order to limit the utility model; all any modifications of within spirit of the present utility model and principle, doing, be equal to and replace and improvement etc., all should be included within the protection domain of the present utility model.
Claims (10)
- One kind the energising reliability test system, it is characterized in that described system comprises:Be connected at least one the test cell group on the corresponding circuit-under-test group supply access, described circuit-under-test group comprises at least one circuit-under-test, and described test cell group comprises at least one test cell that is connected on the corresponding described circuit-under-test group supply access;Connect described test cell group by data line, according to user's the host computer that instruction is controlled the on off state of corresponding described test cell, whether powered on to control corresponding described circuit-under-test that arranges.
- 2. energising reliability test system as claimed in claim 1 is characterized in that, described host computer comprises:Receive user's the described control platform that instruction is set and sends the control signal of the corresponding described test cell on off state of control;The data collecting card that connects described control platform;Connect described data collecting card, the described control signal that described control platform is sent sends to the first interface of corresponding described test cell, and described first interface connects described test cell group by described data line.
- 3. energising reliability test system as claimed in claim 2 is characterized in that, described control platform is based on the control platform of Labview.
- 4. energising reliability test system as claimed in claim 2 is characterized in that, described first interface is the PCI-E interface.
- 5. such as each described energising reliability test system of claim 1 to 4, it is characterized in that described test cell comprises:The second interface that connects described host computer by described data line;Connect described the second interface and be connected on the corresponding described circuit-under-test group supply access, by described host computer by described the second interface control swith state, at least one energising switch unit of whether powering on to control corresponding described circuit-under-test.
- 6. energising reliability test system as claimed in claim 5 is characterized in that, described the second interface is the general purpose interface bus interface.
- 7. energising reliability test system as claimed in claim 5 is characterized in that, described energising switch unit is relay unit.
- 8. energising reliability test system as claimed in claim 7 is characterized in that, described at least one test cell group is integrated in an ATE test board.
- 9. energising reliability test system as claimed in claim 7 is characterized in that, described energising switch unit comprises: relay J;One end of described relay J coil connects a direct current, and the other end of described relay J coil connects described the second interface; The switch of described relay J is a duplex switch, the moving contact of two switches all connects the power supply unit of described circuit-under-test in the described ganged switch, the normally closed contact of two switches is unsettled in the described ganged switch, and the normally opened contact of two switches connects described circuit-under-test in the described ganged switch.
- 10. energising reliability test system as claimed in claim 9 is characterized in that, described energising switch unit also comprises: resistance R 1 and light emitting diode D1;The anode of described light emitting diode D1 connects a direct current by described resistance R 1, and the negative electrode of described light emitting diode D1 connects described the second interface.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220165737 CN202710672U (en) | 2012-04-18 | 2012-04-18 | Power-on reliability test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220165737 CN202710672U (en) | 2012-04-18 | 2012-04-18 | Power-on reliability test system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202710672U true CN202710672U (en) | 2013-01-30 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201220165737 Expired - Lifetime CN202710672U (en) | 2012-04-18 | 2012-04-18 | Power-on reliability test system |
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| Country | Link |
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| CN (1) | CN202710672U (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103559128A (en) * | 2013-10-28 | 2014-02-05 | 深圳市宏电技术股份有限公司 | Power-on and power-off test circuit and power-on and power-off test device |
| CN104346982A (en) * | 2013-07-24 | 2015-02-11 | 何文辉 | Reliability test teaching device |
| CN106771748A (en) * | 2016-12-22 | 2017-05-31 | 北京东土科技股份有限公司 | A kind of test system and method for equipment power-on and power-off |
| CN110320463A (en) * | 2019-07-04 | 2019-10-11 | 深圳安时达电子服务有限公司 | A kind of device and method for realizing Devices to test intelligence Aging control |
-
2012
- 2012-04-18 CN CN 201220165737 patent/CN202710672U/en not_active Expired - Lifetime
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104346982A (en) * | 2013-07-24 | 2015-02-11 | 何文辉 | Reliability test teaching device |
| CN104346982B (en) * | 2013-07-24 | 2017-09-26 | 何文辉 | Reliability test instructional device |
| CN103559128A (en) * | 2013-10-28 | 2014-02-05 | 深圳市宏电技术股份有限公司 | Power-on and power-off test circuit and power-on and power-off test device |
| CN103559128B (en) * | 2013-10-28 | 2016-05-25 | 深圳市宏电技术股份有限公司 | A kind of power-on and power-off test circuit and power-on and power-off testing arrangement |
| CN106771748A (en) * | 2016-12-22 | 2017-05-31 | 北京东土科技股份有限公司 | A kind of test system and method for equipment power-on and power-off |
| CN110320463A (en) * | 2019-07-04 | 2019-10-11 | 深圳安时达电子服务有限公司 | A kind of device and method for realizing Devices to test intelligence Aging control |
| CN110320463B (en) * | 2019-07-04 | 2022-06-21 | 深圳安时达技术服务有限公司 | Device and method for realizing intelligent aging control of equipment to be tested |
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Legal Events
| Date | Code | Title | Description |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20130130 |