CN110320463A - A kind of device and method for realizing Devices to test intelligence Aging control - Google Patents
A kind of device and method for realizing Devices to test intelligence Aging control Download PDFInfo
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- CN110320463A CN110320463A CN201910600103.4A CN201910600103A CN110320463A CN 110320463 A CN110320463 A CN 110320463A CN 201910600103 A CN201910600103 A CN 201910600103A CN 110320463 A CN110320463 A CN 110320463A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
- G01R31/2817—Environmental-, stress-, or burn-in tests
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2825—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere in household appliances or professional audio/video equipment
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Abstract
This application provides a kind of device and method for realizing Devices to test intelligence Aging control, are applied to electronic technology field, are difficult to independent device under test progress Aging control for solving the problems, such as that current Devices to test such as TV or mainboard senile experiment exist.The device includes: including microcontrol processor, storage unit, power supply, input unit, it is characterized in that, it further include switch selecting unit and switch unit, the storage unit, the power supply, the input unit and the switch selecting unit one end connect with the microcontrol processor, the other end of the switch selecting unit connects one end of the switch unit, and the other end of the switch unit connects Devices to test.The application realizes the independent control of the aging to separate unit or more Devices to test by the energization and power-off of each Devices to test of control switch selecting unit control access.
Description
Technical field
The present invention relates to electronic technology field more particularly to a kind of device for realizing Devices to test intelligence Aging control and sides
Method.
Background technique
With the continuous development of science and technology, the type of smart television is also more and more, and function also becomes increasingly complex.In order to ensure
The smart television or mainboard of production are more safe and reliable, and the smart television just produced or mainboard would generally be put by each manufacturer
Degradation is carried out under specific environment, the aging that traditional degradation generally controls different Devices to test by manually is surveyed
Examination, this not only low efficiency, is also easy to human error occur, and the switch of existing market is difficult to independent simultaneously control the old of Devices to test
Change test.
As it can be seen that current Devices to test such as TV or mainboard senile experiment, which exist, is difficult to independent device under test progress aging
The problem of control.
Summary of the invention
For this purpose, the present invention provides a kind of device and method for realizing Devices to test intelligence Aging control, to solve existing skill
The technical issues of independent device under test carries out Aging control is difficult in art.
A kind of device for realizing Devices to test intelligence Aging control, including it is microcontrol processor, storage unit, power supply, defeated
Enter unit, which is characterized in that further include switch selecting unit and switch unit, the storage unit, the power supply, the input
One end of unit and the switch selecting unit is connect with the microcontrol processor, the other end of the switch selecting unit
One end of the switch unit is connected, the other end of the switch unit connects Devices to test；
The power supply, for being selected for the microcontrol processor, the storage unit, the input unit and the switch
Select unit power supply；
The storage unit, the address for storage switch unit；
The input unit refers to for receiving the testing time of test instruction and the Devices to test, and by the test
It enables and the testing time is input to the microcontrol processor；
The microcontrol processor, when for according to test instruction, the address of the switch unit and the test
Between generate the level controling signal of corresponding switch unit, and the level controling signal is sent to switch selecting unit；
The switch selecting unit, for generating different low and high levels according to the level controling signal, by described
Low and high level controls the closing or opening in the switch unit to inductive switch；
The switch unit, for controlling each electricity in corresponding Devices to test according to the level signal of the switch selecting unit
Road powering on or powering off.
A method of realizing Devices to test intelligence Aging control, comprising:
Receive test instruction and the testing time of the Devices to test, the Devices to test of input；
The ground of switch unit is determined according to the test object in the test position of the Devices to test and the test instruction
Location；
According to the mapping relations of the address of the preconfigured switch unit and the switch unit, corresponding open is selected
Close unit；
The closing time that switch unit is corresponded in the address is determined according to the testing time；
By the state of the cut-off/close of the middle switch unit of level controling signal control selections and closure when
Between, complete the burn-in test to the Devices to test.
In embodiments of the present invention, by microcontrol processor by it is received test instruction and the Devices to test test
Time is converted to the level controling signal of corresponding switch unit, and is controlled by switch selecting unit according to the level controling signal
The closing or opening of corresponding switch unit is closed switch unit always according to the level controling signal or in certain a period of time
It carves and disconnects, since different switch units can access different Devices to test, so that intelligence aging control provided by the invention
The device and method of system can realize the independent control of the aging to separate unit or more Devices to test.
Detailed description of the invention
In order to illustrate the technical solution of the embodiments of the present invention more clearly, below by institute in the description to the embodiment of the present invention
Attached drawing to be used is needed to be briefly described, it should be apparent that, the accompanying drawings in the following description is only some implementations of the invention
Example, for those of ordinary skill in the art, without any creative labor, can also be according to these attached drawings
Obtain other attached drawings.
Fig. 1 is the modular structure schematic diagram of the circuit provided in one embodiment of the invention；
Fig. 2 is the modular structure schematic diagram of the circuit provided in another embodiment of the present invention；
Fig. 3 is the modular structure schematic diagram of the circuit provided in further embodiment of this invention；
Fig. 4 is the modular structure schematic diagram of the circuit provided in yet another embodiment of the invention；
Fig. 5 is the electrical block diagram of the switch selecting unit provided in one embodiment of the invention；
Fig. 6 is the schematic diagram of the switch matrix relationship provided in one embodiment of the invention；
Fig. 7 is the switch unit electrical block diagram provided in one embodiment of the invention；
Fig. 8 is the switch unit electrical block diagram provided in another embodiment of the present invention；
Fig. 9 is the flow chart of the method for the realization Devices to test intelligence Aging control provided in one embodiment of the invention；
Figure 10 is the idiographic flow schematic diagram of step 20 in Fig. 1 of the embodiment of the present invention；
Figure 11 is the idiographic flow schematic diagram of step 30 in Fig. 1 of the embodiment of the present invention；
Figure 12 is the flow chart of the method for the realization Devices to test intelligence Aging control provided in another embodiment of the present invention；
Figure 13 is the idiographic flow schematic diagram of step 60 in Figure 12 of the embodiment of the present invention.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are some of the embodiments of the present invention, instead of all the embodiments.Based on this hair
Embodiment in bright, every other implementation obtained by those of ordinary skill in the art without making creative efforts
Example, shall fall within the protection scope of the present invention.
Realization of the invention is described in detail below in conjunction with specific attached drawing:
Fig. 1 shows the device that Devices to test intelligence Aging control is realized provided by one embodiment of the invention, in order to just
In explanation.Only the parts related to this embodiment are shown, and details are as follows:
As shown in Figure 1, the device provided by the present invention for realizing Devices to test intelligence Aging control includes: microcontroller processing
Device 101, storage unit 102, power supply 103, input unit 104 further include switch selecting unit 105 and switch unit 106.
Wherein, the storage unit 102, the power supply 103, the input unit 104 and the switch selecting unit 105
One end connect with the microcontrol processor 101, the other end of the switch selecting unit 105 connects the switch unit
The other end of 106 one end, the switch unit 106 connects Devices to test 107.
Specifically, the power supply 103, for being the microcontrol processor 101, the storage unit 102, the input
Unit 104 and the switch selecting unit 105 are powered；The storage unit 102, the address for storage switch unit 106；Institute
State input unit 104, for receive test instruction and the Devices to test 107 testing time, and by the test instruct and
The testing time is input to the microcontrol processor 101；The microcontrol processor 101, for being referred to according to the test
It enables, the level controling signal of the corresponding switch unit 106 of the address of the switch unit 106 and the testing time generation, and will
The level controling signal is sent to switch selecting unit 105；The switch selecting unit 105, for according to the level control
Signal processed generates different low and high levels, controls the closure in the switch unit 106 to inductive switch by the low and high level
Or it disconnects；The switch unit 106, for controlling corresponding Devices to test according to the level signal of the switch selecting unit 105
Each circuit powering on or powering off in 107.
Further, the switch selecting unit 105 includes position switch pin and status switch pin, and the switch is single
Member includes position switch unit and state switching element, and the switch selecting unit passes through described in position switch pin connection
Position switch unit, and the state switching element is connected by the status switch pin.
Specifically, the position switch pin, for controlling the work according to the low and high level of the position switch pin
The closing or opening of bit switch unit, the test for controlling the Devices to test of station corresponding with position switch unit are enabled.The shape
State switch pin, for controlling the closure of the state switching element according to the low and high level of the status switch pin or breaking
It opens, controls the closing time in the Devices to test with the state switching element corresponding circuits；The position switch unit is used
It is enabled in the test for controlling station corresponding with the position switch unit；The state switching element, it is described to be measured for controlling
With the closing time of the state switching element corresponding circuits in equipment, the aging for controlling different circuits in the Devices to test is surveyed
Try duration.
In yet another embodiment of the present invention, described device further include: voltage conversion unit 108, the voltage turn
The one end for changing unit is connect with power supply 103, and the other end of the voltage conversion unit 108 and the second switch unit 106b connect
It connects.
Further, voltage conversion unit 108 is used for the work of voltage and the Devices to test 107 when the power supply 103
Make voltage it is not identical when, the voltage that the power supply exports is converted to the operating voltage of the Devices to test.
In one of the embodiments, when the operating voltage of the Devices to test is lower than the output voltage of the power supply,
It is metal-oxide-semiconductor switch with the second switch unit 106b of corresponding Devices to test connection.
Specifically, first switch unit 106a includes the first position switch unit and first state switch unit, wherein should
First position switch unit is for determining the first Devices to test, and first state switch unit is for controlling in the first Devices to test not
With the burn-in test time of circuit.
Specifically, second switch unit 106b includes second station switch unit and the second state switching element, wherein should
Second station switch unit is for determining the second Devices to test, and the second state switching element is for controlling in the second Devices to test not
With the burn-in test time of circuit.
In one particular embodiment of the present invention, Devices to test includes TV and mainboard, when Devices to test is mainboard etc.
When low pressure Devices to test, AC conversion is 12V/24V's by voltage conversion unit by the 220V alternating current that power supply is provided
Low-voltage DC provides power supply for mainboard aging, while corresponding second switch unit is low pressure metal-oxide-semiconductor circuit, second switch
Element circuit is as shown in Figure 8.
It should be noted that first switch unit 106a and second switch unit 106b is switch unit in Fig. 2, when to
When measurement equipment is TV, first switch unit 106a is switch shown in Fig. 7, when Devices to test is the low-voltage equipments such as mainboard,
The second switch unit 106b is low pressure metal-oxide-semiconductor shown in Fig. 8 switch.
Described device further includes timing unit 109, the timing unit and the microcontroller in one of the embodiments,
Processor 101 connects.
Specifically, the microcontrol processor 101 is also used to convert the testing time survey of corresponding switch unit 106
Duration is tried, and the length of testing speech is sent to the timing unit 109；When the timing knot for receiving the feedback of timing unit 109
When the signal of beam, the low level control signal of corresponding switch unit 106 is generated, and the low level control signal is sent
To the switch selecting unit 105.
Further, the timing unit, for controlling the circuit in the Devices to test when the microcontrol processor
When powering on, start timing；When the power-on time of the Devices to test reaches the length of testing speech, Xiang Suoshu microcontrol processor
Send the signal that timing terminates.
It further, further include monitoring input unit when device under test such as TV or mainboard carry out burn-in test
110, one end of the monitoring input unit 110 is connect with microcontrol processor 101, described to monitor the another of input unit 110
End is connect with the Devices to test 107.
Specifically, the monitoring input unit 110 is for detecting each electricity in the Devices to test 107 and the Devices to test
The working condition on road, and the working condition is sent to the microcontrol processor 101.Further, the monitoring input
Unit 110 is specifically used for when the test signal and the Devices to test that are sent to the Devices to test are anti-according to the test signal
When the return path signal of feedback is consistent, judge that the Devices to test 107 is working properly, otherwise, it is different to judge that the Devices to test 107 works
Often.
It further, further include display unit 111 when device under test such as TV or mainboard carry out burn-in test,
The display unit 111 is connect with the microcontrol processor 101.
Specifically, the display unit 111 is used to show the result of the burn-in test to the Devices to test 107.
In a specific embodiment of the invention, by monitoring input unit, the working condition of Devices to test is monitored,
Common observation circuit can be by camera, the infrared diode or other interfaces that can directly with Devices to test communication of tool photoperceptivity
Circuit composition.
Controlling the Devices to test working condition such as TV ageing time and monitoring television by switch matrix with system herein is
Example, accesses test station for Devices to test, while test position being stored in system memory unit, is manually entered setting aging
System starts device under test progress burn-in test by control switch matrix after time, while passing through monitoring input-cell circuitry
The working condition of real-time monitoring Devices to test, observation circuit are arrived by the composition such as camera, infrared induction head or serial ports in system
When up to ageing time, if Devices to test does not occur exception, test passes through.Conversely, system can show abnormality test station state,
It reminds laboratory technician to handle in time simultaneously, after the completion of to be processed, can freely decide whether to continue burn-in test.
The embodiment of the present invention also provides a kind of method for realizing Devices to test intelligence Aging control, can be applied to above-mentioned reality
It applies in the realization Devices to test intelligence ageing control device of example, the burn-in test for device under test.
As shown in figure 9, the embodiment of the present invention provides a kind of method for realizing Devices to test intelligence Aging control, including following
Step:
Step 10: receiving test instruction and the testing time of the Devices to test, the Devices to test of input.
Above-mentioned Devices to test includes but is not limited to that TV, mainboard etc. need burn-in test in one of the embodiments,
Electronic equipment, for example, refrigerator, washing machine.Test instruction includes each circuit in the selection and Devices to test of Devices to test
Testing time, such as the testing time of the first circuit is 1H, the testing time of second circuit is 2H, tertiary circuit in TV
Testing time is 3H etc..
Step 20: determining that switch is single according to the test object in the test position of the Devices to test and the test instruction
The address of member.
Wherein, each test station has its corresponding address, can determine station according to the on-position of Devices to test
The address of switch unit can determine the address of state switching element according to the on-position of circuit under test in Devices to test.
Step 30: according to the mapping relations of the address of the preconfigured switch unit and the switch unit, selection
Corresponding switch unit.
Wherein, the station address of the test station and the position switch unit have one-to-one mapping relations, root
Corresponding position switch unit can be determined according to the station address of the Devices to test.
Step 40: the closing time that switch unit is corresponded in the address is determined according to the testing time.
Wherein, it according to the testing time of each circuit of the Devices to test received, controls corresponding within a certain period of time
Switch unit closing time, when the burn-in test duration of Devices to test reaches the testing time, switch is disconnected.
Step 50: by the state of the cut-off/close of the middle switch unit of level controling signal control selections and closing
The time of conjunction completes the burn-in test to the Devices to test.
Wherein, as shown in figure 5, the switch of Devices to test access station is controlled by corresponding pin, work as switch selecting unit
When the level controling signal of output is 1, then controls corresponding switch unit closure and complete then at this point, Devices to test powers on to institute
State the test of Devices to test.
In one embodiment of the invention, system controls TV ageing time by switch matrix and monitoring television waits
Measurement equipment, switch matrix as shown in FIG. 6, wherein the position switch address of each way switch unit and state in switch matrix
The low and high level signal of switch address control be used to control closure that corresponding switch unit switchs within the specific testing time with
It disconnects.
Wherein, Devices to test corresponding with corresponding switch unit can be controlled by controlling the closing time of each switch unit
Or the burn-in test time of a certain circuit module in Devices to test.
In a specific embodiment of the invention, Devices to test includes TV, mainboard etc., accesses and surveys in Devices to test
Behind trial work position, test instruction and the testing time of Devices to test are obtained.As shown in figure 5, when Devices to test is TV, if respectively
Control access ' 1 ', ' 2 ', ' 3 ' position TV ageing time of test station is 1H, 2H, 3H.It is assumed that TV on-position switch by
Y1, Y2, Y3 control, the address for inquiring corresponding switch unit in storage unit is 001,010,011, by selecting switch unit
Corresponding Y1, Y2, Y3 output is set to height, then the control foot of switch unit is raised in corresponding diagram 7, and switch is opened, i.e., TV is opened
Voltage ageing on beginning.The ageing time set is received as 1H, 2H, 3H by input unit simultaneously, after ageing time reaches 1H, is
The switch selecting unit output that the address of system control switch unit is 001 is 0, and corresponding switch unit disconnects at this time, and TV is disconnected
Electricity, i.e. TV complete 1H burn-in test.After ageing time reaches 2H and 3H, it is 010,011 that system, which controls address, and switch is disconnected
It opens, i.e., TV completes 2H and 3H burn-in test.
It should be noted that the first switch unit is as shown in Figure 7 when carrying out burn-in test to TV.Wherein, it opens
It closes selecting unit output and is connected to the corresponding EN control foot of the first switch unit.When the level control of switch selecting unit output
When signal processed is 1, i.e., first switch unit control foot is raised, and is closed the switch, and V1 and V2 are connected, and TV powers on, when switch selects
When the level controling signal for selecting unit output is 0, i.e., first switch unit control foot is low level, and switch disconnects, and V1 does not have with V2
There are connection, TV power-off.
In another embodiment of the invention, when carrying out burn-in test to mainboard, described second switch unit such as Fig. 8 institute
Show, wherein G is grid (gate), and S is source electrode (source), and D is drain electrode (drain), and switch selecting unit output is connected to institute
Second switch unit corresponding EN control foot is stated, the closure and disconnection that low and high level is controllable metal-oxide-semiconductor is added at the end G, when opening
When the level controling signal for closing selecting unit output is 1, i.e., second switch unit control foot is raised, and is closed the switch, V1 and V2
It connects, mainboard powers on, and when the level controling signal of switch selecting unit output is 0, i.e., second switch unit control foot is low
Level, switch disconnect, and V1 is not switched on V2, mainboard power-off.
For step 20, as shown in Figure 10, can be realized by step 21 to step 22, comprising:
Step 21: the station address of the test station is determined according to the position of test station where the Devices to test；
Step 22: the state address of test mode is determined according to the on-position of circuit each in the Devices to test.
For step 21, there is corresponding test station address in the position of each test station, according to test work
The position of position determines the station address of the test station, can determine shape according to the on-position of circuit under test in Devices to test
The address of state switch unit.
For step 22, the state address of Devices to test test mode is determined according to the position of test station, according to described
State address controls the closing or opening of the corresponding state switching element.
For step 30, as described in Figure 11, can include: by step 31 to step 32 realization
Step 31: according to the mapping relations of the preconfigured station address and position switch unit, selecting corresponding work
Bit switch unit；
Step 32: according to the mapping relations of the preconfigured state address and state switching element, selecting corresponding
State switching element.
For step 31, each test station address and position switch unit have one-to-one mapping relations, according to
The corresponding test station address in the position of test station determines corresponding position switch unit.
For step 32, each test station address and state switching element have one-to-one mapping relations, according to
The position of test station determines the state switching element of Devices to test test mode, and determine in the Devices to test with it is described
The burn-in test duration of different circuits in the closing time of state switching element corresponding circuits and the Devices to test.
In an optional implementation method, the method also includes:
When the operating voltage of supply voltage and Devices to test is not identical, the voltage that the power supply exports is converted to described
The operating voltage of Devices to test.In which it is assumed that the 220V for first providing power supply is exchanged when Devices to test is the low-voltage equipments such as mainboard
Electricity is converted to 12V/24V direct current by voltage conversion unit 108, provides power supply for mainboard aging.
Specifically, when the operating voltage of the Devices to test be lower than the power supply output voltage when, will with it is corresponding to be measured
The switch unit of equipment connection is set as metal-oxide-semiconductor switch.
It should be noted that being metal-oxide-semiconductor switch by the switch unit connected with corresponding Devices to test, metal-oxide-semiconductor switch is specific
Circuit is as shown in Figure 8.
In a kind of method of Devices to test intelligence Aging control provided in an embodiment of the present invention, further includes:
Step 60: detecting the working condition of each circuit in the Devices to test and the Devices to test；
Step 70: showing the working condition of each circuit in the Devices to test working condition and the Devices to test.
For step 60, the Devices to test in burn-in test is detected, when occurring extremely, system is single by storage
The address of switch unit in member determines the corresponding position of the switch powered on of TV, so that it is determined that failure TV test station.
For step 70, if working condition of the Devices to test in burn-in test is normally, will to show in display unit
Show the time of test, if working condition of the Devices to test in burn-in test be it is abnormal, shown in display unit test it is different
Normal position, simultaneity factor issues warning, and is come out by display unit, so as to tester's analysis in time processing.
For step 60, as shown in figure 13, can be realized by step 61 to step 63, comprising:
Step 61: Xiang Suoshu Devices to test sends test signal；
Step 62: receiving the Devices to test according to the return path signal of the test signal feedback；
Step 63: when the test signal is consistent with the return path signal, judge that the Devices to test is working properly, it is no
Then, judge the Devices to test operation irregularity.
For step 61 and step 62, when correspond in access switch selecting unit the address of switch unit for 001 it is to be measured
When equipment starts aging, synchronously control monitoring input unit corresponding address is behind the address of inquiry switch unit in the memory unit
001 serial port circuit is connected, while constantly regularly sending order to Devices to test by serial ports, and receive Devices to test according to institute
State the return path signal of test signal.
For step 63, the test signal and the return path signal, when the test signal and return path signal of transmission
When being consistent, then confirm that Devices to test is working properly；Conversely, then confirming Devices to test operation irregularity.
Further, the case where test signal is consistent with return path signal be for example:
(1) the test signal sent is A, is also A according to the return path signal that test signal A is returned, can determine to be measured set
It is standby working properly；
(2) when the return path signal returned according to test signal A is B, if return path signal B meets pre-set rule
When, then it also can determine that Devices to test is working properly.
Return path signal B meets in the situation such as return path signal B of pre-set rule in one of the embodiments,
It include pre-set keyword, then the numerical value for including is within preset interval range etc. in such as return path signal B.
Wherein, for Devices to test when carrying out burn-in test, monitoring input unit can synchronize the work to the Devices to test
State is monitored, and using UART serial ports detection pattern in the present invention, can flexibly be set by serial ports and Devices to test communication
Set working condition when Devices to test burn-in test, such as standing, channel switching, channel, volume plus-minus.In addition, monitoring input
Every road serial ports switch address of unit is identical as the address of switch unit that control Devices to test is powered on and powered off, that is, controls to be measured
The address of switch address and system the control serial ports switch of device power is the same address in storage unit, is set to be measured
When standby progress burn-in test, simultaneously because Devices to test is difficult to individually control ageing time in the prior art, go out in ageing process
When existing failure, need artificial inspection on duty and cannot detect and alarm automatically, by monitoring input unit can real-time monitoring it is to be measured
The working condition of equipment can timely feedback exception information when ageing equipment occurs abnormal, convenient at tester's analysis in time
Reason, to greatly promote burn-in test efficiency.
In an embodiment of the present invention, by microcontrol processor by it is received test instruction and the Devices to test survey
The examination time is converted to the level controling signal of corresponding switch unit, and by switch selecting unit according to the level controling signal control
The closing or opening for making corresponding switch unit, is closed switch unit always according to the level controling signal or a certain
Moment disconnects, since different switch units can access different Devices to test, so that Aging control provided by the invention
Device can realize to the control of the autonomous intelligence of the ageing time of separate unit or more Devices to test, thus solve in the prior art to
Measurement equipment experiment there are problems that being difficult to individually controlling ageing time.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all in essence of the invention
Made any modifications, equivalent replacements, and improvements etc., should all be included in the protection scope of the present invention within mind and principle.
Claims (14)
1. a kind of device for realizing Devices to test intelligence Aging control, including microcontrol processor, storage unit, power supply, input
Unit, which is characterized in that further include switch selecting unit and switch unit, the storage unit, the power supply, the input are single
One end of the first and described switch selecting unit is connect with the microcontrol processor, and the other end of the switch selecting unit connects
One end of the switch unit is connect, the other end of the switch unit connects Devices to test；
The power supply, it is single for being selected for the microcontrol processor, the storage unit, the input unit and the switch
Member power supply；
The storage unit, the address for storage switch unit；
The input unit, for receive test instruction and the Devices to test testing time, and by the test instruct and
The testing time is input to the microcontrol processor；
The microcontrol processor, for raw according to test instruction, the address of the switch unit and the testing time
The level controling signal of pairs of inductive switch unit, and the level controling signal is sent to switch selecting unit；
The switch selecting unit passes through the height for generating different low and high levels according to the level controling signal
Level controls the closing or opening in the switch unit to inductive switch；
The switch unit, for controlling each circuit in corresponding Devices to test according to the level signal of the switch selecting unit
It powers on or powers off.
2. a kind of device for realizing Devices to test intelligence Aging control according to claim 1, which is characterized in that described to open
Closing selecting unit includes position switch pin and status switch pin, and the switch unit includes that position switch unit and state are opened
Unit is closed, the switch selecting unit connects the position switch unit by the position switch pin, and passes through the shape
State switch pin connects the state switching element；
The position switch pin, for controlling the position switch unit according to the low and high level of the position switch pin
Closing or opening, the test for controlling the Devices to test of station corresponding with position switch unit are enabled；
The status switch pin, for controlling the state switching element according to the low and high level of the status switch pin
Closing or opening controls the closing time in the Devices to test with the state switching element corresponding circuits；
The position switch unit, the test for controlling station corresponding with the position switch unit are enabled；
The state switching element, when for controlling the closure in the Devices to test with the state switching element corresponding circuits
Between, control the burn-in test duration of different circuits in the Devices to test.
3. a kind of device for realizing Devices to test intelligence Aging control according to claim 1, which is characterized in that also wrap
It includes:
One end of voltage conversion unit, the voltage conversion unit connects to power supply, the other end of the voltage conversion unit with
The switch unit connection；
Voltage conversion unit is used for when the operating voltage of the supply voltage and the Devices to test is not identical, by the power supply
The voltage of output is converted to the operating voltage of the Devices to test.
4. a kind of device for realizing Devices to test intelligence Aging control according to claim 3, which is characterized in that when described
When the operating voltage of Devices to test is lower than the output voltage of the power supply, the switch unit with the connection of corresponding Devices to test is MOS
Pipe switch.
5. a kind of device for realizing Devices to test intelligence Aging control according to claim 3, which is characterized in that further include
Timing unit, the timing unit are connect with the microcontrol processor；
The microcontrol processor is also used to convert the testing time length of testing speech of corresponding switch unit, and by the survey
Examination duration is sent to the timing unit；When the signal that the timing for receiving timing unit feedback terminates, generate to inductive switch
The low level control signal of unit, and the low level control signal is sent to the switch selecting unit；
The timing unit, when the circuit for being controlled in the Devices to test when the microcontrol processor powers on, starting meter
When；When the power-on time of the Devices to test reaches the length of testing speech, Xiang Suoshu microcontrol processor, which sends timing, to be terminated
Signal.
6. a kind of device for realizing Devices to test intelligence Aging control according to any one of claims 1 to 5, feature exist
In further including monitoring input unit, one end of the monitoring input unit connect with microcontrol processor, and the monitoring inputs singly
The other end of member is connect with the Devices to test；
The monitoring input unit is used to detect the working condition of each circuit in the Devices to test and the Devices to test, and will
The working condition is sent to the microcontrol processor.
7. a kind of device for realizing Devices to test intelligence Aging control according to claim 6, which is characterized in that the prison
Input unit is surveyed to be specifically used for being believed when the test signal and the Devices to test that are sent to the Devices to test according to the test
The return path signal of number feedback judges that the Devices to test is working properly, otherwise, judges that the Devices to test work is different when being consistent
Often.
8. a kind of device for realizing Devices to test intelligence Aging control according to any one of claims 1 to 5, feature exist
In described device further includes display unit, and the display unit is connect with the microcontrol processor；
The display unit is used to show the result of the burn-in test to the Devices to test.
9. a kind of method for realizing Devices to test intelligence Aging control characterized by comprising
Receive test instruction and the testing time of the Devices to test, the Devices to test of input；
The address of switch unit is determined according to the test object in the test position of the Devices to test and the test instruction；
According to the mapping relations of the address of the preconfigured switch unit and the switch unit, select corresponding switch single
Member；
The closing time that switch unit is corresponded in the address is determined according to the testing time；
It is complete by the state of the cut-off/close of the middle switch unit of level controling signal control selections and the time of closure
The burn-in test of the pairs of Devices to test.
10. a kind of method for realizing Devices to test intelligence Aging control according to claim 9, which is characterized in that described
The step of determining the address of switch unit according to the test object in the test position of the Devices to test and the test instruction
Include:
The station address of the test station is determined according to the position of test station where the Devices to test；
The state address of test mode is determined according to the on-position of circuit each in the Devices to test；
The mapping relations of the address according to the preconfigured switch unit and the switch unit select corresponding open
Close unit the step of include:
According to the mapping relations of the preconfigured station address and position switch unit, corresponding position switch list is selected
Member；
According to the mapping relations of the preconfigured state address and state switching element, corresponding status switch list is selected
Member.
11. a kind of method for realizing Devices to test intelligence Aging control according to claim 9, which is characterized in that described
Method further include:
When the operating voltage of supply voltage and Devices to test is not identical, the voltage that the power supply exports is converted to described to be measured
The operating voltage of equipment.
12. a kind of method for realizing Devices to test intelligence Aging control according to claim 10, which is characterized in that described
Method further include:
When the operating voltage of the Devices to test is lower than the output voltage of the power supply, will be opened with what corresponding Devices to test connected
It closes unit and is set as metal-oxide-semiconductor switch.
13. a kind of method for realizing Devices to test intelligence Aging control according to claim 9, which is characterized in that described
Method further include:
Detect the working condition of each circuit in the Devices to test and the Devices to test；
Show the working condition of each circuit in the Devices to test working condition and the Devices to test.
14. a kind of method for realizing Devices to test intelligence Aging control according to claim 13, which is characterized in that described
Detect the working condition of each circuit in the Devices to test and the Devices to test, comprising:
Test signal is sent to the Devices to test；
The Devices to test is received according to the return path signal of the test signal feedback；
When the test signal is consistent with the return path signal, judge that the Devices to test is working properly, otherwise, described in judgement
Devices to test operation irregularity.
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