CN104111416A - Test circuit used for intelligent power module and test method thereof - Google Patents
Test circuit used for intelligent power module and test method thereof Download PDFInfo
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- CN104111416A CN104111416A CN201310311882.9A CN201310311882A CN104111416A CN 104111416 A CN104111416 A CN 104111416A CN 201310311882 A CN201310311882 A CN 201310311882A CN 104111416 A CN104111416 A CN 104111416A
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Abstract
The invention belongs to the technical field of a power semiconductor test, and provides a test circuit used for an intelligent power module and a test method thereof. After the intelligent power module is accessed to an interface module, a test control module controls multiple switches in a switch array module according to model number and parameter test requirements of the intelligent power module so that corresponding connection and disconnection are realized. The connection and disconnection states of the multiple switches are corresponding to the model number and parameter test requirements of the intelligent power module. The test control module drives a parameter test module to output an excitation signal to be loaded to the intelligent power module via the switch array module and the interface module, and a response signal outputted by the intelligent power module is detected by the parameter test module via the interface module and the switch array module and corresponding electrical parameters are recorded so that an objective that intelligent power modules with different model numbers are compatible on the basis of realization of different electrical parameter tests on the intelligent power module, and a test function is substantially expanded.
Description
Technical field
The invention belongs to power semiconductor technical field of measurement and test, relate in particular to a kind of test circuit for Intelligent Power Module and method of testing.
Background technology
Intelligent Power Module is a kind of hydrid integrated circuit that power semiconductor device, gate driver circuit and holding circuit etc. are integrated in one, and it is widely used in the fields such as frequency-conversion domestic electric appliances, inverter and industrial electric automation.
Intelligent Power Module, as the core devices in electronic system, often works under the environment of high voltage, large electric current, and the quality of its performance directly affects the reliability of electronic system.Therefore, every electric parameter of Intelligent Power Module is tested, rejected underproof product, there is outbalance meaning for the reliability that improves system.But, because the parameter of Intelligent Power Module is more, and model is different, prior art is generally, according to the inner structure of Intelligent Power Module and external pin definition, it is carried out to special test circuit design, test function is solidified single, be difficult for carrying out Function Extension, between the test circuit of the Intelligent Power Module of different model, do not possess versatility.
Therefore, prior art exists cannot provide a kind of test circuit for Intelligent Power Module to realize the electric parameter of accurate detection Intelligent Power Module and to be convenient to the problem of Function Extension with the Intelligent Power Module of compatible different model.
Summary of the invention
The object of the present invention is to provide a kind of test circuit for Intelligent Power Module, be intended to realize the electric parameter of accurate detection Intelligent Power Module, and be convenient to the Intelligent Power Module of Function Extension with compatible different model.
The present invention is a kind of test circuit for Intelligent Power Module of realizing like this, and described test circuit comprises:
Interface module, switch arrays module, testing control module and parameter testing module;
Described interface module is used for accessing described Intelligent Power Module, described switch arrays module is connected with described interface module, described testing control module and described parameter testing module, described testing control module is also connected with described parameter testing module, in described switch arrays module, comprise multiple switches, the on off operating mode of described multiple switches is corresponding with the model of described Intelligent Power Module and parameter testing demand;
Access after described interface module in described Intelligent Power Module, described testing control module realizes corresponding break-make according to the multiple switches in switch arrays module described in the model of described Intelligent Power Module and the control of parameter testing demand, described testing control module drives described parameter testing module output drive signal to be loaded on described Intelligent Power Module by described switch arrays module and described interface module again, and detect the response signal that described Intelligent Power Module exports and record corresponding electric parameter by described interface module and described switch arrays module by described parameter testing module.
The present invention also provides a kind of method of testing based on the above-mentioned test circuit for Intelligent Power Module, and described method of testing comprises the following steps:
By Intelligent Power Module access interface module;
Testing control module realizes corresponding break-make according to the multiple switches in the model of described Intelligent Power Module and parameter testing demand gauge tap array module;
Described testing control module drives parameter testing module output drive signal to be loaded on described Intelligent Power Module by described switch arrays module and described interface module;
Described parameter testing module is detected the response signal that described Intelligent Power Module exports and is recorded corresponding electric parameter by described interface module and described switch arrays module.
The present invention comprises interface module by employing, switch arrays module, the test circuit of testing control module and parameter testing module carries out electrical parameters measure to Intelligent Power Module, after Intelligent Power Module access interface module, testing control module realizes corresponding break-make according to the multiple switches in the model of Intelligent Power Module and parameter testing demand gauge tap array module, the on off operating mode of the plurality of switch is corresponding with the model of Intelligent Power Module and parameter testing demand, testing control module drives parameter testing module output drive signal to be loaded on Intelligent Power Module by switch arrays module and interface module again, and detect the response signal that Intelligent Power Module exports and record corresponding electric parameter by interface module and switch arrays module by parameter testing module, thereby on the basis of Intelligent Power Module being realized to different electrical parameters measures, reach the object of the Intelligent Power Module of compatible different model, make test function obtain significant expansion.
Brief description of the drawings
Fig. 1 is the modular structure figure of the test circuit for Intelligent Power Module that provides of the embodiment of the present invention;
Fig. 2 is the example structure figure of the test circuit for Intelligent Power Module that provides of the embodiment of the present invention;
Fig. 3 is the realization flow figure of the method for testing of the test circuit based on Intelligent Power Module that provides of the embodiment of the present invention;
Fig. 4 is the related test philosophy figure of method of testing of the test circuit based on Intelligent Power Module that provides of the embodiment of the present invention.
Embodiment
In order to make object of the present invention, technical scheme and advantage clearer, below in conjunction with drawings and Examples, the present invention is further elaborated.Should be appreciated that specific embodiment described herein, only in order to explain the present invention, is not intended to limit the present invention.
The embodiment of the present invention comprises interface module by employing, switch arrays module, the test circuit of testing control module and parameter testing module carries out electrical parameters measure to Intelligent Power Module, after Intelligent Power Module access interface module, testing control module realizes corresponding break-make according to the multiple switches in the model of Intelligent Power Module and parameter testing demand gauge tap array module, the on off operating mode of the plurality of switch is corresponding with the model of Intelligent Power Module and parameter testing demand, testing control module drives parameter testing module output drive signal to be loaded on Intelligent Power Module by switch arrays module and interface module again, and detect the response signal that Intelligent Power Module exports and record corresponding electric parameter by interface module and switch arrays module by parameter testing module, thereby on the basis of Intelligent Power Module being realized to different electrical parameters measures, reach the object of the Intelligent Power Module of compatible different model, make test function obtain significant expansion.
Fig. 1 shows the modular structure of the test circuit for Intelligent Power Module that the embodiment of the present invention provides, and for convenience of explanation, only shows part related to the present invention, and details are as follows:
Test circuit 100 for Intelligent Power Module comprises interface module 101, switch arrays module 102, testing control module 103 and parameter testing module 104.
Interface module 101 is for accessing Intelligent Power Module 200, switch arrays module 102 is connected with interface module 101, testing control module 103 and parameter testing module 104, testing control module 103 is also connected with parameter testing module 104, in switch arrays module 102, comprise multiple switches, the on off operating mode of the plurality of switch is corresponding with model and the parameter testing demand of Intelligent Power Module 200.
After Intelligent Power Module 200 access interface modules 101, testing control module 103 realizes corresponding break-make according to the multiple switches in the model of Intelligent Power Module 200 and parameter testing demand gauge tap array module 102, testing control module 103 drives parameter testing module 104 output drive signals to be loaded on Intelligent Power Module 200 by switch arrays module 102 and interface module 101 again, and is detected the response signal that Intelligent Power Module 200 exports and recorded corresponding electric parameter by interface module 101 and switch arrays module 102 by parameter testing module 104.
Further, interface module 101 is specially direct insertion slot, during by Intelligent Power Module 200 access interface module 101, each pin of Intelligent Power Module 200 is inserted to this direct insertion slot at needs.
Further, switch arrays module 102 specifically comprises many laterally wirings, many are longitudinally connected up and multiple switch, the quantity of described multiple switches equals the product of described many quantity that laterally connect up and described many quantity that longitudinally connect up, described many are laterally connected up and are connected with interface module 101, described many are longitudinally connected up and are connected with parameter testing module 104, every in described many horizontal wirings is laterally connected with and described many multiple switches that the quantity longitudinally connecting up is identical in wiring, and the each switch in described and many multiple switches that longitudinally quantity of wiring is identical also connects described many longitudinally each longitudinally wiring in wiring, the first end of the each switch in described multiple switch is connected respectively laterally wiring and a longitudinally wiring with the second end.
Wherein, switch array module 102 being carried out to pcb board when wiring, can by described many laterally wiring and described many longitudinally wiring be arranged at top layer and the bottom of pcb board, as shown in Figure 2, described many are laterally connected up that (label in Fig. 2 is H
1, H
2, H
3h
n, n is positive integer) in every laterally wiring connect one to one with every a line pin of above-mentioned direct insertion slot (being interface module 101), described many longitudinally wiring (label in Fig. 2 is Z
1, Z
2, Z
3z
m, m is positive integer) in every longitudinally wiring connect one to one with each test pin of parameter testing module 104, (label in Fig. 2 is S to multiple switches
1, S
2, S
3s
k, k is positive integer, the first end of the each switch in k=n × m) and the second end be connected respectively one laterally wiring and one longitudinally connect up, for example: switch S A
1first end be connected respectively horizontal wiring H with the second end
1with longitudinal wiring Z
1.
In addition, for many that comprise in above-mentioned switch arrays module 102 laterally wirings, many longitudinal wirings and multiple switch, this is actually a kind of Redundancy Design, object is that the expansion (as the Intelligent Power Module of more electric parameter or different model is detected) for test function provides condition, so the modules that switch arrays module 102 is used in test circuit 100 provides wiring to connect to be combined to form a test circuit completing; Above-mentioned multiple switches can be relay or semiconductor switch, wherein, semiconductor switch can be specially metal-oxide-semiconductor, triode, IGBT(Insulated Gate Bipolar Transistor, insulated gate bipolar transistor) or other possess the semiconductor devices of switching characteristic.
Further, testing control module 103 is to comprise central processing unit and the control platform based on LabVIEW system, it is according to the on off operating mode of multiple switches in the test philosophy gauge tap array module 102 corresponding with the type of Intelligent Power Module 200 and parameter testing demand, and controls parameter testing module 104 to realize corresponding test purpose.
Further, parameter testing module 104 comprises the proving installations such as variable voltage source, direct voltage source, resistance R L, pulse voltage source, voltage table, reometer and oscilloprobe, wherein, the quantity of variable voltage source, direct voltage source, resistance R L, pulse voltage source can be multiple, and the resistance of resistance R L can be 100 kilohms.For example, as shown in Figure 2, in the time carrying out electrical parameters measure, need to adopt variable voltage source U1, regulated power supply U2, direct supply I1, resistance R L and voltage table M1, the both positive and negative polarity of variable voltage source U1 is two longitudinally wirings of connecting valve array module 102 respectively, the both positive and negative polarity of regulated power supply U2 is also two longitudinally wirings of connecting valve array module 102 respectively, the first end of resistance R L connects the positive pole of direct supply I1, a longitudinally wiring of the second end connecting valve array module 102 of resistance R L, the two poles of the earth of voltage table M1 are two longitudinally wirings of connecting valve array module 102 respectively.
In embodiments of the present invention, by interface module 101, switch arrays module 102, the test circuit 100 that testing control module 103 and parameter testing module 104 form carries out electrical parameters measure to Intelligent Power Module 200, realize corresponding break-make by testing control module 103 according to the multiple switches in the model of Intelligent Power Module 200 and parameter testing demand gauge tap array module 102, testing control module 103 drives parameter testing module 104 to send pumping signal by switch arrays module 102 and interface module 101 to Intelligent Power Module 200 again, then the response signal that parameter testing module 104 is exported Intelligent Power Module 200 by switch arrays module 102 and interface module 101 again detects and records corresponding electric parameter, thereby realize the electrical parameters measure of the Intelligent Power Module 200 of compatible different model, can realize neatly different test function expansions, and can effectively shorten the research and development time.In addition, whole test circuit 100 is simple in structure, is easy to safeguard.
Fig. 3 shows the realization flow of the method for testing based on the above-mentioned test circuit for Intelligent Power Module that the embodiment of the present invention provides, and for convenience of explanation, only shows part related to the present invention, and details are as follows:
In step S1, by Intelligent Power Module access interface module.
In step S2, testing control module realizes corresponding break-make according to the multiple switches in the model of Intelligent Power Module and parameter testing demand gauge tap array module.
In step S3, testing control module drives parameter testing module output drive signal to be loaded on Intelligent Power Module by switch arrays module and interface module.
In step S4, the response signal that parameter testing module is exported by interface module and switch arrays module detection Intelligent Power Module also records corresponding electric parameter.
Below in conjunction with the test circuit shown in Fig. 2, above-mentioned method of testing is described further:
Test circuit shown in Fig. 2 is that the threshold voltage of the logic input terminal LIN1 to Intelligent Power Module 200 detects, and according to the test philosophy figure shown in Fig. 4, method of testing is as follows:
(1) by Intelligent Power Module to be measured 200 access interface modules 101.
(2) testing control module 103 is according to the model of Intelligent Power Module 200 and logic input terminal LIN1(parameter testing demand) switch S in gauge tap array module 102
1, switch S
n+2, switch S
2n+1, switch S
3n+2, switch S
(m-4) n+3, switch S
(m-3) n+ (n-2), switch S
(m-2) n+ (n-3), switch S
(m-1) n+ (n-2)realize the test circuit that conducting is tested to form the threshold voltage of the logic input terminal LIN1 to Intelligent Power Module 200 the voltage table M1 in parameter testing module 104, direct supply I1, resistance R L, variable voltage source U1 and variable voltage source U2 are connected to the pin of Intelligent Power Module 200.
(3) testing control module 103 drives regulated power supply U2 output+15V DC voltage, direct voltage source I1 output+30V DC voltage in parameter testing module 104 to be loaded on Intelligent Power Module 200 by switch arrays module and interface module.
(4) because the forward threshold voltage of the logic input terminal LIN1 of Intelligent Power Module 200 is voltage range [0, 5V] in a certain magnitude of voltage, in the time that the voltage of logic input terminal LIN1 is increased to forward threshold voltage from 0V, can there is saltus step in the voltage between pin U and the pin N of Intelligent Power Module 200, in order to measure forward threshold voltage, the output voltage that testing control module 103 is controlled the variable voltage source U1 in parameter testing module 104 is progressively increased to 5V from 0V, the reading that simultaneously detects voltage table M1 changes, when the voltage readings of voltage table M1 is from+30V left and right saltus step during to 0V left and right, testing control module 103 is carried out record to the magnitude of voltage of variable voltage source U1, this magnitude of voltage being recorded is the forward threshold voltage of the logic input terminal LIN1 of Intelligent Power Module 200, because the negative sense threshold voltage of the logic input terminal LIN1 of Intelligent Power Module 200 is voltage range [0, 5V] in a certain magnitude of voltage, in the time that the voltage of logic input terminal LIN1 drops to negative sense threshold voltage from forward threshold voltage, can there is saltus step in the voltage between pin U and the pin N of Intelligent Power Module 200, in order to measure negative sense threshold voltage, the output voltage that testing control module 103 is controlled the variable voltage source U1 in parameter testing module 103 is progressively increased to 5V from the aforementioned magnitude of voltage being recorded, the reading that simultaneously detects voltage table M1 changes, when the voltage readings of voltage table M1 is during from the saltus step of 0V left and right to+30V left and right, testing control module 103 is carried out record to the magnitude of voltage of variable voltage source U1, this magnitude of voltage being recorded is the negative sense threshold voltage of the logic input terminal LIN1 of Intelligent Power Module 200.
Also be identical with above-mentioned method of testing for the test of other electric parameters, therefore repeat no more.Complete after all test jobs, the multiple switches in testing control module 103 meeting gauge tap array modules 102 are realized and being resetted.
In sum, the embodiment of the present invention comprises interface module by employing, switch arrays module, the test circuit of testing control module and parameter testing module carries out electrical parameters measure to Intelligent Power Module, after Intelligent Power Module access interface module, testing control module realizes corresponding break-make according to the multiple switches in the model of Intelligent Power Module and parameter testing demand gauge tap array module, the on off operating mode of the plurality of switch is corresponding with the model of Intelligent Power Module and parameter testing demand, testing control module drives parameter testing module output drive signal to be loaded on Intelligent Power Module by switch arrays module and interface module again, and detect the response signal that Intelligent Power Module exports and record corresponding electric parameter by interface module and switch arrays module by parameter testing module, thereby on the basis of Intelligent Power Module being realized to different electrical parameters measures, reach the object of the Intelligent Power Module of compatible different model, make test function obtain significant expansion.
The foregoing is only preferred embodiment of the present invention, not in order to limit the present invention, all any amendments of doing within the spirit and principles in the present invention, be equal to and replace and improvement etc., within all should being included in protection scope of the present invention.
Claims (7)
1. for a test circuit for Intelligent Power Module, it is characterized in that, described test circuit comprises:
Interface module, switch arrays module, testing control module and parameter testing module;
Described interface module is used for accessing described Intelligent Power Module, described switch arrays module is connected with described interface module, described testing control module and described parameter testing module, described testing control module is also connected with described parameter testing module, in described switch arrays module, comprise multiple switches, the on off operating mode of described multiple switches is corresponding with the model of described Intelligent Power Module and parameter testing demand;
Access after described interface module in described Intelligent Power Module, described testing control module realizes corresponding break-make according to the multiple switches in switch arrays module described in the model of described Intelligent Power Module and the control of parameter testing demand, described testing control module drives described parameter testing module output drive signal to be loaded on described Intelligent Power Module by described switch arrays module and described interface module again, and detect the response signal that described Intelligent Power Module exports and record corresponding electric parameter by described interface module and described switch arrays module by described parameter testing module.
2. test circuit as claimed in claim 1, is characterized in that, described interface module is direct insertion slot.
3. test circuit as claimed in claim 1, it is characterized in that, described switch arrays module comprises many laterally wirings, many are longitudinally connected up and multiple switch, the quantity of described multiple switches equals the product of described many quantity that laterally connect up and described many quantity that longitudinally connect up, described many are laterally connected up and are connected with described interface module, described many are longitudinally connected up and are connected with described parameter testing module, every in described many horizontal wirings is laterally connected with and described many multiple switches that the quantity longitudinally connecting up is identical in wiring, and the each switch in described and many multiple switches that longitudinally quantity of wiring is identical also connects described many longitudinally each longitudinally wiring in wiring, the first end of the each switch in described multiple switch is connected respectively laterally wiring and a longitudinally wiring with the second end.
4. test circuit as claimed in claim 3, is characterized in that, described multiple switches are relay or semiconductor switch.
5. test circuit as claimed in claim 3, is characterized in that, described semiconductor switch is metal-oxide-semiconductor, triode or insulated gate bipolar transistor.
6. test circuit as claimed in claim 1, is characterized in that, described parameter testing module comprises variable voltage source, direct voltage source, resistance R L, pulse voltage source, voltage table, reometer and oscilloprobe.
7. the method for testing based on the test circuit for Intelligent Power Module as claimed in claim 1, is characterized in that, described method of testing comprises the following steps:
By Intelligent Power Module access interface module;
Testing control module realizes corresponding break-make according to the multiple switches in the model of described Intelligent Power Module and parameter testing demand gauge tap array module;
Described testing control module drives parameter testing module output drive signal to be loaded on described Intelligent Power Module by described switch arrays module and described interface module;
Described parameter testing module is detected the response signal that described Intelligent Power Module exports and is recorded corresponding electric parameter by described interface module and described switch arrays module.
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106841856A (en) * | 2017-01-03 | 2017-06-13 | 航天科工防御技术研究试验中心 | A kind of high power three-phase bridge driver test device |
| CN106841855A (en) * | 2017-01-03 | 2017-06-13 | 航天科工防御技术研究试验中心 | A kind of threshold parameter method of testing of high power three-phase bridge driver |
| CN108490338A (en) * | 2018-03-16 | 2018-09-04 | 广东美的制冷设备有限公司 | Test equipment, test method, computer equipment and computer readable storage medium |
| CN109375577A (en) * | 2018-10-25 | 2019-02-22 | 陕西航空电气有限责任公司 | A kind of testing stand multi-point output control system |
| CN110398661A (en) * | 2019-08-27 | 2019-11-01 | 合肥中恒微半导体有限公司 | A kind of multi-channel high-accuracy SiC power module gate pole leakage tests system |
| CN113589050A (en) * | 2021-08-02 | 2021-11-02 | 西安兵标检测有限责任公司 | Capacitor test system and test method |
| CN114113702A (en) * | 2021-11-22 | 2022-03-01 | 珠海格力电器股份有限公司 | Signal test circuit and device |
| CN115166407A (en) * | 2022-09-06 | 2022-10-11 | 广东汇芯半导体有限公司 | Test circuit and tester applying same |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08336516A (en) * | 1995-06-14 | 1996-12-24 | Hitachi Medical Corp | Medical x-ray system |
| JPH0916225A (en) * | 1995-06-27 | 1997-01-17 | Matsushita Electric Works Ltd | Programmable controller equipped with pid unit |
| CN101656466A (en) * | 2009-09-10 | 2010-02-24 | 嘉兴斯达微电子有限公司 | High-integration intelligent power module |
| CN202093137U (en) * | 2011-03-28 | 2011-12-28 | 天津瑞能电气有限公司 | Parameter test platform for intelligent power module group |
| CN102495350A (en) * | 2011-12-14 | 2012-06-13 | 杭州士兰微电子股份有限公司 | Test device and test method for testing intelligent power module |
| CN203455449U (en) * | 2013-07-23 | 2014-02-26 | 广东美的制冷设备有限公司 | Test circuit used for intelligent power module |
-
2013
- 2013-07-23 CN CN201310311882.9A patent/CN104111416B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08336516A (en) * | 1995-06-14 | 1996-12-24 | Hitachi Medical Corp | Medical x-ray system |
| JPH0916225A (en) * | 1995-06-27 | 1997-01-17 | Matsushita Electric Works Ltd | Programmable controller equipped with pid unit |
| CN101656466A (en) * | 2009-09-10 | 2010-02-24 | 嘉兴斯达微电子有限公司 | High-integration intelligent power module |
| CN202093137U (en) * | 2011-03-28 | 2011-12-28 | 天津瑞能电气有限公司 | Parameter test platform for intelligent power module group |
| CN102495350A (en) * | 2011-12-14 | 2012-06-13 | 杭州士兰微电子股份有限公司 | Test device and test method for testing intelligent power module |
| CN203455449U (en) * | 2013-07-23 | 2014-02-26 | 广东美的制冷设备有限公司 | Test circuit used for intelligent power module |
Non-Patent Citations (2)
| Title |
|---|
| 汤正道: "智能功率模块测试系统的设计及其若干问题的研究", 《中国优秀硕士学位论文全文数据库 信息科技辑》 * |
| 鲁昌华 等: "IPM的检测系统及检测方法研究", 《电子测量与仪器学报》 * |
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106841856A (en) * | 2017-01-03 | 2017-06-13 | 航天科工防御技术研究试验中心 | A kind of high power three-phase bridge driver test device |
| CN106841855A (en) * | 2017-01-03 | 2017-06-13 | 航天科工防御技术研究试验中心 | A kind of threshold parameter method of testing of high power three-phase bridge driver |
| CN106841856B (en) * | 2017-01-03 | 2019-12-17 | 航天科工防御技术研究试验中心 | testing device for high-power three-phase bridge driver |
| CN106841855B (en) * | 2017-01-03 | 2020-02-07 | 航天科工防御技术研究试验中心 | Threshold parameter testing method of high-power three-phase bridge driver |
| CN108490338A (en) * | 2018-03-16 | 2018-09-04 | 广东美的制冷设备有限公司 | Test equipment, test method, computer equipment and computer readable storage medium |
| CN108490338B (en) * | 2018-03-16 | 2020-08-04 | 广东美的制冷设备有限公司 | Test apparatus, test method, computer apparatus, and computer-readable storage medium |
| CN109375577A (en) * | 2018-10-25 | 2019-02-22 | 陕西航空电气有限责任公司 | A kind of testing stand multi-point output control system |
| CN110398661A (en) * | 2019-08-27 | 2019-11-01 | 合肥中恒微半导体有限公司 | A kind of multi-channel high-accuracy SiC power module gate pole leakage tests system |
| CN113589050A (en) * | 2021-08-02 | 2021-11-02 | 西安兵标检测有限责任公司 | Capacitor test system and test method |
| CN114113702A (en) * | 2021-11-22 | 2022-03-01 | 珠海格力电器股份有限公司 | Signal test circuit and device |
| CN114113702B (en) * | 2021-11-22 | 2022-07-22 | 珠海格力电器股份有限公司 | Signal test circuit and device |
| CN115166407A (en) * | 2022-09-06 | 2022-10-11 | 广东汇芯半导体有限公司 | Test circuit and tester applying same |
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