CN101303499B - Liquid crystal display panel apparatus and test method thereof - Google Patents

Liquid crystal display panel apparatus and test method thereof Download PDF

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Publication number
CN101303499B
CN101303499B CN200810127648XA CN200810127648A CN101303499B CN 101303499 B CN101303499 B CN 101303499B CN 200810127648X A CN200810127648X A CN 200810127648XA CN 200810127648 A CN200810127648 A CN 200810127648A CN 101303499 B CN101303499 B CN 101303499B
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common electrode
electrode tip
electrode wire
diode
liquid crystal
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CN101303499A (en
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潘盈豪
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AU Optronics Corp
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AU Optronics Corp
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Abstract

The invention discloses a liquid crystal display (LCD) panel device and a testing method thereof. The LCD panel device comprises a pixel array, a first common electrode tip, a second common electrode tip, a plurality of first current direction components and a plurality of second current direction components. The pixel array comprises a plurality of common electrode wires. Each first current direction component is connected in series between a first side of each common electrode wire and the first common electrode tip; each second current direction component is connected in series between a second side of each common electrode wire and the first common electrode tip. The second common electrode tip is connected between each first current direction component and the first side of each common electrode wire. The current passing though each common electrode wire during testing is towards a single direction so as to detect the faults of the common electrode wires.

Description

Liquid crystal display faceplate device and method of testing thereof
Technical field
The present invention is about a kind of liquid crystal display faceplate device and method of testing thereof, especially for detecting common electrode wire whether defective liquid crystal display faceplate device and method of testing thereof.
Background technology
LCD has been widely used in display application now owing to have advantages such as slimming, in light weight, low power consumption and low radiation.LCD mainly comprises liquid crystal panel and backlight module, utilizes backlight module that the light source of liquid crystal panel is provided, and with electric signal control liquid crystal panel liquid crystal molecule direction, with show image.
Because the quality of liquid crystal panel can directly influence its display quality, therefore, after liquid crystal panel is made, generally need test, in the hope of finding whether defectiveness exists for keeping and guaranteeing the stable of liquid crystal panel quality.
Fig. 1 shows the pixel array circuit figure of existing liquid crystal panel.In one liquid crystal display faceplate device 10, sweep trace 12 and data line 13 are respectively at laterally and vertically interweave and be connected to form a pel array 11 that comprises a plurality of pixel cells 19.In addition, common electrode wire 14 also is connected in laterally forming with a plurality of pixel cells 19.Pixel cell 19 comprises pixel electrode 15, and storage capacitors 16 is connected between common electrode wire 14 and the pixel electrode 15.In addition, TFT transistor 17 is connected in sweep trace 12, common electrode wire 14 and data line 13.
When the defect test that carries out the panel pixel array, array common electrode tip 18 adopts the mode of bilateral conducting to be connected to common electrode wire 14, that is the two ends of same common electrode wire 14 all are connected to array common electrode tip 18, the signal that is transmitted with receiving array common electrode tip 18.In addition, this common electrode wire 14 also receives the input of IC signal, and the module stage after it is used to test receives the usefulness of common electrode signal.
With reference to Fig. 2, the direction of current when wherein arrow shows the common electrode test.Because array common electrode tip 18 adopts the mode of bilateral conducting to be connected to common electrode wire 14, the flow direction of measuring current will be by the two ends of common electrode wire 14 to the third side to inflow.By this existing structure, if form open circuit (open) because of defectiveness in the common electrode wire 14, because of electric current is to be flowed into by two ends in the flow direction of common electrode wire 14, thus can't measure and find the open circuit defect in the common electrode wire 14, and then influence the quality of panel shipment.
Summary of the invention
For addressing the above problem, the invention provides a liquid crystal display faceplate device and method of testing thereof, can detect whether defectiveness of common electrode wire, to guarantee the panel workmanship.
According to a first aspect of the invention, it discloses a liquid crystal display faceplate device.This liquid crystal display faceplate device comprises a pel array, one first common electrode tip, one second common electrode tip, a plurality of first direction of current assembly and a plurality of second direction of current assembly.This pel array comprises many common electrode wire.Respectively this first direction of current component string is connected between first side and this first common electrode tip of this common electrode wire respectively; Respectively this second direction of current component string is connected between second side and this first common electrode tip of this common electrode wire respectively.This second common electrode tip is connected in this first direction of current assembly respectively and respectively between first side of this common electrode wire.Second common electrode tip provides a test signal during test, and the electric current that makes this common electrode wire respectively of flowing through is towards single direction, to detect the defective of this common electrode wire.
In one embodiment of the invention, this first and second direction of current assembly is a diode, and wherein this first direction of current component limitations electric current must not flow to this first common electrode tip through this first direction of current assembly by this second common electrode tip; This second direction of current component limitations electric current must not flow to this first common electrode tip through this second direction of current assembly by second side of this common electrode wire.In view of the above, in when test, electric current by first effluent of common electrode wire to second side.
According to a second aspect of the invention, it discloses the method for testing of a liquid crystal display faceplate device.This display panels comprises a pel array and one first common electrode tip.This method of testing is used to detect the defective of the common electrode wire of this pel array, and it comprises following steps: (a) distinctly be connected in series one first direction of current assembly between first side and this first common electrode tip of this common electrode wire respectively; (b) distinctly be connected in series one second direction of current assembly between second side and this first common electrode tip of this common electrode wire respectively; (c) provide one second common electrode tip to be electrically connected on this first direction of current assembly respectively and respectively between first side of this common electrode wire; And (d) test the time applies different voltages respectively in this first common electrode tip and this second common electrode tip, and second common electrode tip provides a test signal, makes to flow through the electric current of this common electrode wire respectively towards single direction.
According to the present invention, can solve effectively during test that prior art adopts bilateral conducting and the problem that can't detect the defective of common electrode wire, and design of the present invention need not change the driving voltage of the IC input common electrode after testing, but and still normal operation.
Description of drawings
Understand the present invention and advantage thereof for more complete, with reference to narration below in conjunction with the accompanying drawing of following,
Fig. 1 is the synoptic diagram of existing liquid crystal display faceplate device;
Fig. 2 is the current direction synoptic diagram of the common electrode of existing liquid crystal display faceplate device;
Fig. 3 is the synoptic diagram of liquid crystal display faceplate device of the present invention;
Fig. 4 is the current direction synoptic diagram of the common electrode of liquid crystal display faceplate device of the present invention;
Fig. 5 is that the common electrode of liquid crystal display faceplate device of the present invention has the current direction synoptic diagram when opening a way; And
Fig. 6 is the method for testing synoptic diagram of liquid crystal display faceplate device of the present invention.
[primary clustering symbol description]
10 liquid crystal display faceplate devices, 11 pel arrays
12 sweep traces, 13 data lines
14 common electrode wire, 15 pixel electrodes
16 storage capacitors 17TFT transistors
18 array common electrode tip, 19 pixel cells
20 liquid crystal display faceplate devices, 21 pel arrays
22 sweep traces, 23 data lines
24 common electrode wire, 25 pixel electrodes
26 storage capacitors 27TFT transistors
28 first common electrode tip, 29 pixel cells
30 second common electrode tip, 32 direction of current assemblies
34 direction of current assemblies, 36 open-circuit positions
601~604 steps
Embodiment
Below go through the making and the use of this present preferred embodiment.But, should be appreciated that to the invention provides many applicable inventive concepts that it can be implemented under various concrete conditions.The specific embodiment of this discussion has only illustrated the concrete mode of making and use this invention, does not limit the scope of the invention.
Fig. 3 is for illustrating liquid crystal display faceplate device of the present invention.In one liquid crystal display faceplate device 20, sweep trace 22 and data line 23 are respectively at laterally and vertically interweave and be connected to form a pel array 21 that comprises a plurality of pixel cells 29.In addition, common electrode wire 24 also laterally is being connected with a plurality of pixel cells 29 formation.Pixel cell 29 comprises pixel electrode 25, and storage capacitors 26 is connected between common electrode wire 24 and the pixel electrode 25.In addition, TFT transistor 27 is connected in sweep trace 22, common electrode wire 24 and data line 23.
First common electrode tip 28 is connected to the two ends of common electrode wire 24, that is the two ends of same common electrode wire 24 all are connected to first common electrode tip 28.This common electrode wire 24 also connect the IC signal input part with acceptance test after the common electrode signal of module stage.
Except that the above-mentioned design that is similar to existing first common electrode tip 28, second common electrode tip 30 is connected in the first side A of common electrode wire 24.
In addition, serial connection direction of current assembly 32 between the first side A of each common electrode wire 24 and first common electrode tip 28.Further, second common electrode tip 30 is connected between the first side A of the first direction of current assembly 32 and common electrode wire 24.Serial connection direction of current assembly 34 between the second side B of each common electrode wire 24 and first common electrode tip 28.In present embodiment, this direction of current assembly 32 and 34 can comprise at least one diode, and wherein the positive pole of direction of current assembly 32 connects first common electrode tip 28, and its negative pole then connects the first side A of common electrode wire 24; The positive pole of direction of current assembly 34 connects first common electrode tip 28, and its negative pole then connects the second side B of common electrode wire 24.Because of diode has the characteristic that positive bias conducting and negative bias are ended, thus 32 restrictions of direction of current assembly respectively the electric current of this common electrode wire 24 must not flow to first common electrode tip 28 through direction of current assembly 32 by second common electrode tip 30; The direction of current assembly 34 restrictions respectively electric current of this common electrode wire 24 must not flow to first common electrode tip 28 through direction of current assembly 34 by the second side B of common electrode wire 24.
Among one embodiment, the voltage of first common electrode tip 28 is-25V that the voltage of second common electrode tip 30 is-15V.The first side A in common electrode wire 24, the voltage level of first common electrode tip 28 is less than the voltage level of second common electrode tip 30, that is to say that the two ends of direction of current assembly 32 are the reverse blas state at this moment, so direction of current assembly 32 is closed condition (turn-off).The electric current of second common electrode tip 30 will can't be flowed to first common electrode tip 28 by 32 restrictions of direction of current assembly.Similar situation, the second side B in common electrode wire 24, the voltage level of first common electrode tip 28 is less than the voltage level of the second side B of common electrode wire 24, that is to say, the two ends of direction of current assembly 34 are the reverse blas state at this moment, so direction of current assembly 34 is closed condition (turn-off).The electric current of common electrode wire 24 will can't be flowed to first common electrode tip 28 by 34 restrictions of direction of current assembly.Thus, provide a test signal by second common electrode tip 30 during test, the electric current of feasible each common electrode wire 24 of flowing through all flows to single direction, shown in arrow among Fig. 4.In view of the above, the electric current of the common electrode wire of proving installation of the present invention all flows to single direction (the first side A by common electrode wire 24 flows to the second side B), has now when adopting bilateral driving to design so can effectively solve, and can't detect the problem of common electrode wire open circuit.
As shown in Figure 5, when common electrode wire 24 defectiveness in the viewing area takes place, when for example opening a way (Fig. 5 illustration one open-circuit position 36), because the test signal that second common electrode tip 30 provides can only flow to the second side B by the first side A of common electrode wire 24, test signal can't flow through open end, also can't flow into pel array 21, in view of the above, can successfully detect the defective of common electrode wire 24 by the second side B of common electrode wire 24.After test is finished, outer first common electrode tip 28 and second common electrode tip 30 of panel will be cut off.The driving voltage of normal IC input common electrode for example is+5V, so it is not subjected to the influence of direction of current assembly 32 and 34, but normal transmission to common electrode wire 24, thereby the panel both sides have all received the common electrode signal, do not light the result and do not influence.
Present embodiment provides the direction of current of second common electrode tip 30 with direction of current assembly 32,34 restriction test signals, in the present embodiment, direction of current assembly 32,34 is closed condition (turn-off), right the present invention is not as limit, the technology personage that this area has common knowledge also can suitably dispose the voltage of the direction of current assembly 32,34 and first common electrode tip 28 and the voltage of second common electrode tip 30 according to the needs that in fact use.
Fig. 6 is the method for testing of a liquid crystal display faceplate device of the present invention.The display panels 20 that described here display panels is as described above.Please in the lump with reference to figure 5 and Fig. 6, this method of testing is used to detect the defective of the common electrode wire 24 of pel array 21, and it comprises following steps:
Step 601: be connected in series the first direction of current assembly 32 respectively between the first side A and first common electrode tip 28 of each common electrode wire 24;
Step 602: be connected in series the second direction of current assembly 34 respectively between the second side B and first common electrode tip 28 of each common electrode wire 24;
Step 603: provide between the first side A that second electrode tip 30 is electrically connected on each first direction of current assembly 32 and each common electrode wire 24; And
Step 604: when a test phase, provide different voltage value signals in first common electrode tip 28 and second common electrode tip 30 respectively, the electric current of feasible each common electrode wire 24 of flowing through is towards single direction.
In step 604, provide different voltage value signals when first common electrode tip 28 and second common electrode tip 30, second common electrode tip 30 can be a test signal, and the voltage level of first common electrode tip 28 is less than the voltage level of the test signal of second common electrode tip 30, and the electric current that therefore can further limit each common electrode wire 24 of flowing through flows to the second side B by the first side A of common electrode wire 24.
Though the present invention discloses as above with preferred embodiment; right its is not in order to limit the present invention; under the situation that does not deviate from spirit of the present invention and essence thereof; those of ordinary skill in the art work as can make various corresponding changes and distortion according to the present invention, but these corresponding changes and distortion all should belong to the protection domain of the appended claim of the present invention.

Claims (13)

1. a liquid crystal display faceplate device is characterized in that, comprises:
One pel array comprises many common electrode wire;
One first common electrode tip;
A plurality of first diodes, respectively this first diode is serially connected with between first side and this first common electrode tip of this common electrode wire respectively;
A plurality of second diodes, respectively this second diode is serially connected with between second side and this first common electrode tip of this common electrode wire respectively; And
One second common electrode tip is connected in this first diode respectively and respectively between first side of this common electrode wire;
Second common electrode tip provides a test signal when wherein testing, and the electric current that makes this common electrode wire respectively of flowing through is towards single direction, to detect the defective of this common electrode wire.
2. liquid crystal display faceplate device as claimed in claim 1 is characterized in that, this first diode limits electric current must not flow to this first common electrode tip through this first diode by this second common electrode tip.
3. liquid crystal display faceplate device as claimed in claim 1 is characterized in that, this second diode limits electric current must not flow to this first common electrode tip through this second diode by second side of this common electrode wire.
4. liquid crystal display faceplate device as claimed in claim 1 is characterized in that the voltage level of this first common electrode tip is less than the voltage level of second common electrode tip during test.
5. liquid crystal display faceplate device as claimed in claim 1 is characterized in that, respectively this first diode end of connecting this first common electrode tip is connected in the IC signal input part in addition to receive the common electrode signal.
6. liquid crystal display faceplate device as claimed in claim 1 is characterized in that, the electric current of this common electrode wire respectively of flowing through is that first effluent by this common electrode wire is to second side.
7. a liquid crystal display faceplate device is characterized in that, comprises:
One pel array comprises a plurality of pixels;
One first common electrode tip;
One second common electrode tip; And
Many common electrode wire connect the common electrode of this pixel, and respectively this common electrode wire first side of extending this pel array is connected in series one first diode, and respectively this common electrode wire second side of extending this pel array is connected in series one second diode;
Wherein respectively first end of this first diode connects this first common electrode tip, respectively second end of this first diode connects respectively first side and this second common electrode tip of this common electrode wire, respectively first end of this second diode connects respectively second side of this common electrode wire, and respectively second end of this second diode connects this first common electrode tip;
Setting by this first diode and second diode, second common electrode tip provides a test signal when making test, order flow through the electric current of this common electrode wire respectively by first effluent of this common electrode wire respectively to second side, to detect the defective of this common electrode wire.
8. liquid crystal display faceplate device as claimed in claim 7 is characterized in that, this first diode limits electric current must not flow to this first common electrode tip through this first diode by this second common electrode tip.
9. liquid crystal display faceplate device as claimed in claim 7 is characterized in that, this second diode limits electric current must not flow to this first common electrode tip through this second diode by second side of this common electrode wire respectively.
10. liquid crystal display faceplate device as claimed in claim 7 is characterized in that the voltage level of this first common electrode tip is less than the voltage level of second common electrode tip during test.
11. a display panels method of testing, this display panels comprise a pel array and one first common electrode tip, are used for detecting the defective of the common electrode wire of this pel array, this method of testing comprises:
(a) be connected in series one first diode respectively between first side and this first common electrode tip of this common electrode wire respectively;
(b) be connected in series one second diode respectively between second side and this first common electrode tip of this common electrode wire respectively;
(c) provide one second common electrode tip to be electrically connected on this first diode respectively and respectively between first side of this common electrode wire; And
(d) the test time-division be you can well imagine for different magnitudes of voltage in this first common electrode tip and this second common electrode tip, and second common electrode tip provides a test signal, makes to flow through the electric current of this common electrode wire respectively towards single direction.
12. the display panels method of testing as claim 11 is characterized in that, the electric current of this common electrode wire respectively of flowing through in the step (d) is that first effluent by this common electrode wire is to second side.
13. the display panels method of testing as claim 11 is characterized in that, the voltage level of this first common electrode tip is less than the voltage level of second common electrode tip in the step (d).
CN200810127648XA 2008-07-02 2008-07-02 Liquid crystal display panel apparatus and test method thereof Active CN101303499B (en)

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CN101303499B true CN101303499B (en) 2011-07-06

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CN103345079B (en) * 2013-07-09 2016-05-04 深圳市华星光电技术有限公司 A kind of liquid crystal panel and manufacture method thereof
CN103676243B (en) * 2013-12-24 2017-02-15 京东方科技集团股份有限公司 Array substrate assembly, measurement method of array substrate assembly and display device
CN105759472A (en) * 2016-05-06 2016-07-13 深圳市华星光电技术有限公司 Panel detecting unit, array basal plate and liquid crystal display device
CN109272912B (en) * 2018-11-30 2020-05-19 惠科股份有限公司 Mis-charging detection method and mis-charging detection system

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