CN103676243B - Array substrate assembly, measurement method of array substrate assembly and display device - Google Patents
Array substrate assembly, measurement method of array substrate assembly and display device Download PDFInfo
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- CN103676243B CN103676243B CN201310722566.0A CN201310722566A CN103676243B CN 103676243 B CN103676243 B CN 103676243B CN 201310722566 A CN201310722566 A CN 201310722566A CN 103676243 B CN103676243 B CN 103676243B
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- line
- holding wire
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- signal line
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Abstract
The invention provides an array substrate assembly, a detection method of the array substrate assembly and a display device, and belongs to the technical field of display. By means of the array substrate assembly, the problem that in the prior art, grid line delayed signals of an array substrate driven by a double-edge array grid can not be measured. The array substrate assembly comprises a plurality of first signal lines and a plurality of second signal lines, wherein the first signal lines and the second signal lines are crossed; the first ends of the first signal lines are connected with a first drive unit, the second ends of the first signal lines are connected with a second drive unit, and one end of each second signal line extends to a printed circuit board, wherein the ends, extending to the printed circuit board, of the second signal lines are reserved as detection points. The detection method includes the first step of selecting the first signal lines to be detected and selecting one second signal line as a first detection line, wherein the first signal lines and the first detection line are crossed at a first crossed position and the first signal lines and the first detection line are connected at the first crossed position, and the second step of using the detection point to detect the first signal lines to be detected. The display device comprises the array substrate assembly.
Description
Technical field
The invention belongs to display technology field is and in particular to a kind of array base palte assembly and its measuring method and display fill
Put.
Background technology
In Thin Film Transistor-LCD（Thin Film Transistor Liquid Crystal Display, letter
Claim TFT-LCD）In, it is directly by gate driver circuit system that Array gate drives (Gate Driver IC on Array, GOA)
Make a kind of technology on array base palte.Gate driver circuit is directly produced on around the viewing area of array base palte by this technology,
The frame size of display device can be reduced further, and decrease production process, thus improving the integrated of TFT-LCD panel
Degree, can make display floater more frivolous, and then also reduce product cost.
The bilateral actuation techniques of display floater are to make two groups of gate driver circuits on array base palte.Bilateral actuation techniques
The bad problem that thin film transistor (TFT) is charged that monolateral actuation techniques exist can be improved, thus lifting the display product of display floater
Matter.
Fig. 1 is the structural representation of the array base palte adopting bilateral driving and Array gate actuation techniques in prior art,
First holding wire 4, namely grid line, its two ends is simultaneously connected on Array gate drive circuit unit 1 '.Meanwhile, in order to coordinate
Dummy GOA（Redundant array raster data model）The design of unit, display floater be designed with Dummy Pixel up and down（Superfluous
After image element）And redundancy data line 5 ' and redundancy grid line 4 '.But in order to prevent it from picture quality is impacted, Dummy
TFT is not designed on Pixel.
Inventor finds that in prior art, at least there are the following problems：Drive skill for using bilateral driving and Array gate
The display floater of art, the two ends of grid line are connected with GOA circuit simultaneously, and its end cannot connect with test point, thus cannot be normal
The signal delay situation of measurement grid line.Meanwhile, do not design TFT due in Dummy Pixel in design, thus redundancy grid line
Even if test point is drawn in end, also cannot normally measure the signal delay situation of grid line.
Content of the invention
The technical problem to be solved includes, for the battle array being driven using bilateral Array gate of the prior art
The problem that the gate line signals delay of row substrate cannot measure, provides a kind of array base palte assembly and its measuring method and display dress
Put, it can detect the delay situation of above-mentioned gate line signals.
Solve present invention problem and be employed technical scheme comprise that a kind of detection method of array base palte assembly, described battle array
Row substrate includes a plurality of cross one another first holding wire and secondary signal line, the first end of described first holding wire and the first drive
Moving cell connects, and the second end is connected with the second driver element, and one end of secondary signal line extends to printed circuit board (PCB), and is reserved as
Test point, described detection method comprises the steps：
Choose the first holding wire to be detected, choosing a secondary signal line is the first detection line, the first holding wire and the
One detection line intersects in the first infall, and turns on the first holding wire and the first detection line in the first infall；
Apply described test point that the first holding wire to be detected is detected.
Preferably, described conducting is the first infall laser in the first holding wire to be detected and the first detection line
Welding conducting.
Preferably, described detection method is applying described test point that the first holding wire to be detected is carried out detecting it
Before, also include：
By the first holding wire to be detected between the first driver element and the first infall or the second driver element with
Cut off between first infall.
Preferably, described being cut to uses laser cutting.
Preferably, described first holding wire is grid line, and secondary signal line is data wire or redundancy data line；
Or
First holding wire is data wire, and secondary signal line is any one in grid line, redundancy grid line or public electrode wire；
Or
First holding wire is public electrode wire, and secondary signal line is data wire or redundancy data line.
The measuring method of the array base palte assembly of the present invention, by by the first holding wire and secondary signal in its infall
Conducting, driver element gives the first holding wire input detection signal, realizes the signal feelings to the first holding wire by secondary signal line
The detection of condition.Therefore, the measuring method of the array base palte assembly of the present invention can solve the problem that above-mentioned problems of the prior art,
While realizing signal line is detected, the normal use of array base palte can also be kept, also reduce to a certain extent
Production cost.
Solve present invention problem and be employed technical scheme comprise that a kind of array base palte assembly, intersect including a plurality of
The first holding wire and secondary signal line, the first end of described first holding wire is connected with the first driver element, the second end and the
Two driver elements connect, and one end of secondary signal line extends to printed circuit board (PCB), and wherein, electricity is printed in extending to of secondary signal line
One end of road plate is reserved as test point.
Preferably,
Described first holding wire is grid line, and secondary signal line is data wire or redundancy data line；Or
First holding wire is data wire, and secondary signal line is any one in grid line, redundancy grid line or public electrode wire；
Or
First holding wire is public electrode wire, and secondary signal line is data wire or redundancy data line.
One end extending to printed circuit board (PCB) of the secondary signal line of the array base palte assembly of the present invention is reserved with test point,
The RST of first holding wire array base palte on is therefore more readily detected, and the intact of array base palte can be kept, necessarily
Production cost is reduced on degree.
Solve present invention problem and be employed technical scheme comprise that a kind of display device, including above-mentioned array base palte group
Part.
The display device of the present invention includes above-mentioned array base palte assembly, and therefore, the production cost of display device reduces.
Brief description
Fig. 1 is the structural representation of the existing array base palte using bilateral driving；
Fig. 2 is the instrumentation plan of the array base palte assembly using bilateral driving of embodiments of the invention 1.
Wherein reference is：1st, the first driver element；1 ', Array gate drive circuit unit；3rd, array base palte；4th,
One holding wire；4 ', redundancy grid line；5th, secondary signal line；5 ', redundancy data line；6th, test point；7th, printed circuit board (PCB)；8th, second
Driver element；9th, the first infall.
Specific embodiment
For making those skilled in the art more fully understand technical scheme, below in conjunction with the accompanying drawings and specific embodiment party
Formula is described in further detail to the present invention.
Embodiment 1：
The present embodiment provides a kind of detection method of array base palte assembly, can be used for detecting the signal on array base palte
Whether the signal delay situation of line is it is also possible to situations such as turn on for the signal of signal lines.As shown in Fig. 2 described array
Substrate 3 includes a plurality of cross one another first holding wire 4 and secondary signal line 5, the first end and first of described first holding wire 4
Driver element 1 connects, and the second end is connected with the second driver element 8, and one end of secondary signal line 5 extends to printed circuit board (PCB) 7, and
It is reserved as test point 6.Taking detect the first holding wire 4 as a example illustrate below, concrete detection method comprises the steps：
Choose the first holding wire 4 to be detected, choosing a secondary signal line 5 is the first detection line, the first holding wire 4 He
First detection line intersects in the first infall 9, and turns on the first holding wire 4 and the first detection line in the first infall 9；
Apply described test point 6 that first holding wire 4 to be detected is detected.
Specifically, input detection signal, detection to the first holding wire 4 by the first driver element 1 or the second driver element 8
Signal transmission is turned on to during the first infall 9 with the first detection line, and signal transmission is to test point 6, thus forming detection path, enters
And it is capable of the detection of the RST to the first holding wire 4.Obviously, greater length of to the first holding wire 4 in order to realize
Detection, the position of the first infall 9 should be away from the driver element inputting detection signal to the first holding wire 4.Such as pass through first
Driver element 1 inputs detection signal to the first holding wire 4, then the secondary signal line 5 as the first detection line should be far as possible from
First driver element, such that it is able to detect to the RST of greater length of first holding wire 4.
Preferably, described detection method is applying described test point 6 that first holding wire 4 to be detected is carried out detecting it
Before, also include：
By the first holding wire 4 to be detected between the first driver element 1 and the first infall 9 or in the second driver element
8 and first are cut off between infall 9.The selection of cut-out point position should make greater length of first holding wire 4 as far as possible
RST realizes detection.It may further be preferable that described being cut to uses laser cutting.The technology of laser cutting holding wire is
The technology known, will not be described in detail herein.
Why carry out above-mentioned cut-out, be in order in detection process, it is to avoid other signals are to the first detected signal
The detection of line 4 signal is formed to be interfered.
It is understood that the step of above-mentioned cut-out is preferred, even if do not carry out above-mentioned cut-out being also possible to
Detection, simply affect the accuracy of testing result to a certain extent.
Preferably, described conducting is to use laser in the first infall 9 of the first holding wire 4 to be detected and the first detection line
Welding conducting.It is known technology that holding wire is realized conducting by welding by application laser, is not described here in detail.
For the array base palte 3 of bilateral driving, the first wire size line 4 and secondary signal line 5 can be the signals of following classes
Line.
Preferably, described first holding wire 4 is grid line, and secondary signal line 5 is data wire or redundancy data line；
Or
First holding wire 4 is data wire, and secondary signal line 5 is any one in grid line, redundancy grid line or public electrode wire
Kind；
Or
First holding wire 4 is public electrode wire, and secondary signal line 5 is data wire or redundancy data line.
Obviously, the above-mentioned detection method for the first holding wire 4 on the array base palte using bilateral drive circuit, especially
It is applicable for use with the situation of bilateral Array gate drive circuit.Because being driven using bilateral Array gate and adopting raster data model
Chip is different, to the first holding wire 4, under this kind of situation namely when grid line is detected, due to grid line two ends all with bilateral array
Gate driver circuit is connected it is impossible to draw test point.
The measuring method of the array base palte assembly of the present embodiment, by by the first holding wire 4 and the first detection line at both
Infall turns on, and driver element inputs detection signal to the first holding wire 4, realizes to the first holding wire 4 by the first detection line
RST detection.Therefore, the measuring method of the array base palte assembly of the present embodiment can solve the problem that in above-mentioned prior art
The problem existing, while realizing signal line is detected, can also keep the normal use of array base palte, to a certain degree
On also reduce production cost.
Embodiment 2：
The present embodiment provides a kind of array base palte assembly, including a plurality of cross one another first holding wire and secondary signal
Line, the first end of described first holding wire is connected with the first driver element, and the second end is connected with the second driver element, secondary signal
One end of line extends to printed circuit board (PCB), and wherein, one end extending to printed circuit board (PCB) of secondary signal line is reserved as test point.
Preferably, described first holding wire is grid line, and secondary signal line is data wire or redundancy data line；
Or
First holding wire is data wire, and secondary signal line is any one in grid line, redundancy grid line or public electrode wire；
Or
First holding wire is public electrode wire, and secondary signal line is data wire or redundancy data line.
One end extending to printed circuit board (PCB) of the secondary signal line of the array base palte assembly of the present embodiment is reserved with test
Point, is therefore more readily detected the RST of the first holding wire on array base palte, and can keep the intact of array base palte, and one
Determine to reduce production cost in degree.
The present embodiment also provides a kind of display device, and it includes above-mentioned array base palte assembly, certainly also includes as color film base
The structure known to other such as plate, will not be described in detail herein.
Display device in the present embodiment is liquid crystal indicator, can also be Electronic Paper, mobile phone, panel computer, TV
Any product with display function such as machine, display, notebook computer, DPF, navigator or part.
It is understood that the embodiment of above principle being intended to be merely illustrative of the present and the exemplary enforcement adopting
Mode, but the invention is not limited in this.For those skilled in the art, in the essence without departing from the present invention
In the case of god and essence, various modifications and improvement can be made, these modifications and improvement are also considered as protection scope of the present invention.
Claims (8)
1. a kind of detection method of array base palte assembly, described array base palte includes a plurality of cross one another first holding wire and
Binary signal line, the first end of described first holding wire is connected with the first driver element, and the second end is connected with the second driver element, the
One end of binary signal line extends to printed circuit board (PCB), and be reserved as test point it is characterised in that described detection method include as follows
Step：
Choose the first holding wire to be detected, choosing a secondary signal line is the first detection line, and the first holding wire and first is examined
Survey line intersects in the first infall, and turns on the first holding wire and the first detection line in the first infall；
Apply described test point that the first holding wire to be detected is detected.
2. the detection method of array base palte assembly according to claim 1 is it is characterised in that described conducting is to be detected
The first holding wire and the first infall of the first detection line turned on laser welding.
3. the detection method of array base palte assembly according to claim 1 is it is characterised in that described detection method is in application
Before described test point detects to the first holding wire to be detected, also include：
By the first holding wire to be detected between the first driver element and the first infall or in the second driver element and first
Cut off between infall.
4. the detection method of array base palte assembly according to claim 3 is it is characterised in that described being cut to is cut with laser
Disconnected.
5. array base palte assembly according to claim 1 detection method it is characterised in that
Described first holding wire is grid line, and secondary signal line is data wire or redundancy data line；
Or
First holding wire is data wire, and secondary signal line is any one in grid line, redundancy grid line or public electrode wire；
Or
First holding wire is public electrode wire, and secondary signal line is data wire or redundancy data line.
6. a kind of array base palte assembly, including a plurality of cross one another first holding wire and secondary signal line, described first signal
The first end of line is connected with the first driver element, and the second end is connected with the second driver element, and one end of secondary signal line extends to
, it is characterised in that one end extending to printed circuit board (PCB) of secondary signal line is reserved as test point, application is described for printed circuit board (PCB)
Test point detects to the first holding wire to be detected.
7. array base palte assembly according to claim 6 it is characterised in that
Described first holding wire is grid line, and secondary signal line is data wire or redundancy data line；
Or
First holding wire is data wire, and secondary signal line is any one in grid line, redundancy grid line or public electrode wire；
Or
First holding wire is public electrode wire, and secondary signal line is data wire or redundancy data line.
8. a kind of display device is it is characterised in that include the array base palte assembly described in claim 6 or 7.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201310722566.0A CN103676243B (en) | 2013-12-24 | 2013-12-24 | Array substrate assembly, measurement method of array substrate assembly and display device |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201310722566.0A CN103676243B (en) | 2013-12-24 | 2013-12-24 | Array substrate assembly, measurement method of array substrate assembly and display device |
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| CN103676243A CN103676243A (en) | 2014-03-26 |
| CN103676243B true CN103676243B (en) | 2017-02-15 |
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Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104680963A (en) * | 2015-03-26 | 2015-06-03 | 京东方科技集团股份有限公司 | Detection device and detection method of display panel GOA circuit |
| CN104752442B (en) * | 2015-03-26 | 2017-08-11 | 京东方科技集团股份有限公司 | A kind of array base palte |
| CN110928018B (en) * | 2016-12-20 | 2021-05-11 | 武汉华星光电技术有限公司 | Liquid crystal display panel and display device |
| CN109119010A (en) * | 2018-08-03 | 2019-01-01 | 深圳市华星光电技术有限公司 | The detection method and display panel of array substrate horizontal drive circuit |
| CN109272912B (en) | 2018-11-30 | 2020-05-19 | 惠科股份有限公司 | Mis-charging detection method and mis-charging detection system |
| CN109459466A (en) * | 2018-12-26 | 2019-03-12 | 上海创功通讯技术有限公司 | A kind of display screen and equipment |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101303499A (en) * | 2008-07-02 | 2008-11-12 | 友达光电股份有限公司 | Liquid crystal display panel apparatus and test method thereof |
| CN101515075A (en) * | 2008-02-21 | 2009-08-26 | 精工爱普生株式会社 | Electro-optical device and electronic apparatus |
| CN102289119A (en) * | 2011-07-01 | 2011-12-21 | 深圳市华星光电技术有限公司 | Liquid crystal display and method for repairing broken line |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101326246B1 (en) * | 2006-12-12 | 2013-11-11 | 삼성디스플레이 주식회사 | Display apparatus |
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101515075A (en) * | 2008-02-21 | 2009-08-26 | 精工爱普生株式会社 | Electro-optical device and electronic apparatus |
| CN101303499A (en) * | 2008-07-02 | 2008-11-12 | 友达光电股份有限公司 | Liquid crystal display panel apparatus and test method thereof |
| CN102289119A (en) * | 2011-07-01 | 2011-12-21 | 深圳市华星光电技术有限公司 | Liquid crystal display and method for repairing broken line |
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