CN103676243A - Array substrate assembly, measurement method of array substrate assembly and display device - Google Patents
Array substrate assembly, measurement method of array substrate assembly and display device Download PDFInfo
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- CN103676243A CN103676243A CN201310722566.0A CN201310722566A CN103676243A CN 103676243 A CN103676243 A CN 103676243A CN 201310722566 A CN201310722566 A CN 201310722566A CN 103676243 A CN103676243 A CN 103676243A
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Abstract
The invention provides an array substrate assembly, a detection method of the array substrate assembly and a display device, and belongs to the technical field of display. By means of the array substrate assembly, the problem that in the prior art, grid line delayed signals of an array substrate driven by a double-edge array grid can not be measured. The array substrate assembly comprises a plurality of first signal lines and a plurality of second signal lines, wherein the first signal lines and the second signal lines are crossed; the first ends of the first signal lines are connected with a first drive unit, the second ends of the first signal lines are connected with a second drive unit, and one end of each second signal line extends to a printed circuit board, wherein the ends, extending to the printed circuit board, of the second signal lines are reserved as detection points. The detection method includes the first step of selecting the first signal lines to be detected and selecting one second signal line as a first detection line, wherein the first signal lines and the first detection line are crossed at a first crossed position and the first signal lines and the first detection line are connected at the first crossed position, and the second step of using the detection point to detect the first signal lines to be detected. The display device comprises the array substrate assembly.
Description
Technical field
The invention belongs to display technique field, be specifically related to a kind of array base palte assembly and measuring method and display device.
Background technology
At Thin Film Transistor-LCD (Thin Film Transistor Liquid Crystal Display, be called for short TFT-LCD) in, array grid drives (Gate Driver IC on Array, GOA) directly gate driver circuit to be produced on to a kind of technology on array base palte.This technology is directly produced on gate driver circuit around the viewing area of array base palte, can further reduce the frame size of display device, and reduce production process, thus the integrated level of raising TFT-LCD panel, can make display panel more frivolous, and then also reduce cost of products.
The bilateral Driving technique of display panel is on array base palte, to make two groups of gate driver circuits.Bilateral Driving technique can improve that monolateral Driving technique exists to the thin film transistor (TFT) bad problem of charging, thereby promote the display quality of display panel.
Fig. 1 is the structural representation of the array base palte of the bilateral driving of available technology adopting and array grid Driving technique, and first signal line 4, is also grid line, its two ends be connected to simultaneously array gate drive circuit unit 1 ' on.Meanwhile, in order to coordinate Dummy GOA(redundant array grid to drive) design of unit, display panel be designed with up and down Dummy Pixel(redundant sub-pixels) and redundancy data line 5 ' and redundancy grid line 4 '.But in order to prevent that it from impacting picture quality, on Dummy Pixel, do not design TFT.
Inventor finds that in prior art, at least there are the following problems: for the display panel that adopts bilateral driving and array grid Driving technique, the two ends of grid line are connected with GOA circuit simultaneously, its end cannot be connected with test point, thereby cannot normally measure the signal delay situation of grid line.Meanwhile, in design owing to not designing TFT in Dummy Pixel, thereby even if the end of redundancy grid line is drawn test point, also cannot normally measure the signal delay situation of grid line.
Summary of the invention
Technical matters to be solved by this invention comprises, the problem that the grid line signal delay of the array base palte driving for the bilateral array grid of employing of the prior art cannot be measured, a kind of array base palte assembly and measuring method and display device are provided, and it can detect the delay situation of above-mentioned grid line signal.
The technical scheme that solution the technology of the present invention problem adopts is a kind of detection method of array base palte assembly, described array base palte comprises many cross one another first signal lines and secondary signal line, the first end of described first signal line is connected with the first driver element, the second end is connected with the second driver element, one end of secondary signal line extends to printed circuit board (PCB), and being reserved as test point, described detection method comprises the steps:
Choose first signal line to be detected, choosing a secondary signal line is the first detection line, and first signal line and the first detection line intersect mutually at the first infall, and at the first infall by first signal line and the first detection line conducting;
Applying described test point detects first signal line to be detected.
Preferably, described conducting is the first infall laser bonding conducting at first signal line to be detected and the first detection line.
Preferably, described detection method, before the described test point of application detects first signal line to be detected, also comprises:
First signal line to be detected is being cut off between the first driver element and the first infall or between the second driver element and the first infall.
Preferably, described in, be cut to and use laser cutting.
Preferably, described first signal line is grid line, and secondary signal line is data line or redundancy data line;
Or
First signal line is data line, and secondary signal line is any one in grid line, redundancy grid line or public electrode wire;
Or
First signal line is public electrode wire, and secondary signal line is data line or redundancy data line.
The measuring method of array base palte assembly of the present invention, by by first signal line and secondary signal in its infall conducting, driver element, to first signal line input detection signal, is realized the detection to the RST of first signal line by secondary signal line.Therefore, the measuring method of array base palte assembly of the present invention can solve above-mentioned problems of the prior art, and when realizing signal line detection, the normal use that can also keep array base palte, has also reduced production cost to a certain extent.
The technical scheme that solution the technology of the present invention problem adopts is a kind of array base palte assembly, comprise many cross one another first signal lines and secondary signal line, the first end of described first signal line is connected with the first driver element, the second end is connected with the second driver element, one end of secondary signal line extends to printed circuit board (PCB), wherein, one end that extends to printed circuit board (PCB) of secondary signal line is reserved as test point.
Preferably,
Described first signal line is grid line, and secondary signal line is data line or redundancy data line; Or
First signal line is data line, and secondary signal line is any one in grid line, redundancy grid line or public electrode wire;
Or
First signal line is public electrode wire, and secondary signal line is data line or redundancy data line.
One end that extends to printed circuit board (PCB) of the secondary signal line of array base palte assembly of the present invention is reserved with test point, so RST of the first signal line on easier detection arrays substrate, and can keep the intact of array base palte, reduce to a certain extent production cost.
The technical scheme that solution the technology of the present invention problem adopts is a kind of display device, comprises above-mentioned array base palte assembly.
Display device of the present invention comprises above-mentioned array base palte assembly, and therefore, the production cost of display device reduces.
Accompanying drawing explanation
Fig. 1 is the structural representation of the array base palte of the bilateral driving of existing employing;
Fig. 2 is the instrumentation plan of array base palte assembly of the bilateral driving of employing of embodiments of the invention 1.
Wherein Reference numeral is: 1, the first driver element; 1 ', array gate drive circuit unit; 3, array base palte; 4, first signal line; 4 ', redundancy grid line; 5, secondary signal line; 5 ', redundancy data line; 6, test point; 7, printed circuit board (PCB); 8, the second driver element; 9, the first infall.
Embodiment
For making those skilled in the art understand better technical scheme of the present invention, below in conjunction with the drawings and specific embodiments, the present invention is described in further detail.
Embodiment 1:
The present embodiment provides a kind of detection method of array base palte assembly, can be used for detecting the signal delay situation be located at the signal wire on array base palte, also can be for detection of the signal of the signal wire situation such as conducting whether.As shown in Figure 2, described array base palte 3 comprises many cross one another first signal lines 4 and secondary signal line 5, the first end of described first signal line 4 is connected with the first driver element 1, the second end is connected with the second driver element 8, one end of secondary signal line 5 extends to printed circuit board (PCB) 7, and is reserved as test point 6.Take below and detect first signal line 4 and describe for example, specifically detection method comprises the steps:
Choose first signal line 4 to be detected, choosing a secondary signal line 5 is the first detection line, and first signal line 4 and the first detection line intersect mutually at the first infall 9, and at the first infall 9 by first signal line 4 and the first detection line conducting; Applying 6 pairs of first signal lines 4 to be detected of described test point detects.
Particularly, by the first driver element 1 or the second driver element 8, give first signal line 4 input detection signals, when detection signal is delivered to the first infall 9 and the first detection line conducting, signal is delivered to test point 6, thereby formation detection path, and then can realize the detection to the RST of first signal line 4.Obviously, in order to realize the detection to first signal line 4 length, the position of the first infall 9 should be away from the driver element of giving first signal line 4 input detection signals.Such as give first signal line 4 input detection signals by the first driver element 1, should be as far as possible away from the first driver element as the secondary signal line 5 of the first detection line, thus can detect the RST of the first signal line 4 of length.
Preferably, described detection method, before 6 pairs of first signal lines 4 to be detected of the described test point of application detect, also comprises:
First signal line 4 to be detected is being cut off between the first driver element 1 and the first infall 9 or between the second driver element 8 and the first infall 9.The selection of cut-out point position should make the more RST of the first signal line 4 of length realize detection as far as possible.Further preferably, described in, be cut to and use laser cutting.The technology of laser cutting signal wire is known technology, is not described in detail in this.
Why carrying out above-mentioned cut-out, is in testing process, avoids other signals that the detection of detected first signal line 4 signals is formed and interfered.
Be understandable that, the step of above-mentioned cut-out is preferred, even if do not carry out above-mentioned cut-out, also all can not realize detection, just affects to a certain extent the accuracy of testing result.
Preferably, described conducting is the first infall 9 laser bonding conducting at first signal line 4 to be detected and the first detection line.It is known technology that application laser is realized conducting by signal wire by welding, at this, is not described in detail.
Preferably, described first signal line 4 is grid line, and secondary signal line 5 is data line or redundancy data line;
Or
First signal line 4 is data line, and secondary signal line 5 is any one in grid line, redundancy grid line or public electrode wire;
Or
First signal line 4 is public electrode wire, and secondary signal line 5 is data line or redundancy data line.
Obviously, the above-mentioned detection method for adopting the first signal line 4 on the array base palte of bilateral driving circuit, is specially adapted to adopt the situation of bilateral array gate driver circuit.Because, adopt bilateral array grid to drive different with employing grid drive chip, to first signal line 4, under this kind of situation, be also grid line while detecting, because grid line two ends are all connected with bilateral array gate driver circuit, cannot draw test point.
The measuring method of the array base palte assembly of the present embodiment, by by first signal line 4 and the first detection line in both infall conductings, driver element, to first signal line 4 input detection signals, is realized the detection to the RST of first signal line 4 by the first detection line.Therefore, the measuring method of the array base palte assembly of the present embodiment can solve above-mentioned problems of the prior art, and when realizing signal line detection, the normal use that can also keep array base palte, has also reduced production cost to a certain extent.
Embodiment 2:
The present embodiment provides a kind of array base palte assembly, comprise many cross one another first signal lines and secondary signal line, the first end of described first signal line is connected with the first driver element, the second end is connected with the second driver element, one end of secondary signal line extends to printed circuit board (PCB), wherein, one end that extends to printed circuit board (PCB) of secondary signal line is reserved as test point.
Preferably, described first signal line is grid line, and secondary signal line is data line or redundancy data line;
Or
First signal line is data line, and secondary signal line is any one in grid line, redundancy grid line or public electrode wire;
Or
First signal line is public electrode wire, and secondary signal line is data line or redundancy data line.
One end that extends to printed circuit board (PCB) of the secondary signal line of the array base palte assembly of the present embodiment is reserved with test point, so RST of the first signal line on easier detection arrays substrate, and can keep the intact of array base palte, reduce to a certain extent production cost.
The present embodiment also provides a kind of display device, and it comprises above-mentioned array base palte assembly, certainly also comprises as other known structures such as color membrane substrates, is not described in detail in this.
Display device in the present embodiment is liquid crystal indicator, can also be any product or parts with Presentation Function such as Electronic Paper, mobile phone, panel computer, televisor, display, notebook computer, digital album (digital photo frame), navigating instrument.
Be understandable that, above embodiment is only used to principle of the present invention is described and the illustrative embodiments that adopts, yet the present invention is not limited thereto.For those skilled in the art, without departing from the spirit and substance in the present invention, can make various modification and improvement, these modification and improvement are also considered as protection scope of the present invention.
Claims (8)
1. the detection method of an array base palte assembly, described array base palte comprises many cross one another first signal lines and secondary signal line, the first end of described first signal line is connected with the first driver element, the second end is connected with the second driver element, one end of secondary signal line extends to printed circuit board (PCB), and be reserved as test point, and it is characterized in that, described detection method comprises the steps:
Choose first signal line to be detected, choosing a secondary signal line is the first detection line, and first signal line and the first detection line intersect mutually at the first infall, and at the first infall by first signal line and the first detection line conducting;
Applying described test point detects first signal line to be detected.
2. the detection method of array base palte assembly according to claim 1, is characterized in that, described conducting is the first infall laser bonding conducting at first signal line to be detected and the first detection line.
3. the detection method of array base palte assembly according to claim 1, is characterized in that, described detection method, before the described test point of application detects first signal line to be detected, also comprises:
First signal line to be detected is being cut off between the first driver element and the first infall or between the second driver element and the first infall.
4. the detection method of array base palte assembly according to claim 3, is characterized in that, described in be cut to and use laser cutting.
5. the detection method of array base palte assembly according to claim 1, is characterized in that,
Described first signal line is grid line, and secondary signal line is data line or redundancy data line; Or
First signal line is data line, and secondary signal line is any one in grid line, redundancy grid line or public electrode wire;
Or
First signal line is public electrode wire, and secondary signal line is data line or redundancy data line.
6. an array base palte assembly, comprise many cross one another first signal lines and secondary signal line, the first end of described first signal line is connected with the first driver element, the second end is connected with the second driver element, one end of secondary signal line extends to printed circuit board (PCB), it is characterized in that, one end that extends to printed circuit board (PCB) of secondary signal line is reserved as test point.
7. array base palte assembly according to claim 6, is characterized in that,
Described first signal line is grid line, and secondary signal line is data line or redundancy data line; Or
First signal line is data line, and secondary signal line is any one in grid line, redundancy grid line or public electrode wire;
Or
First signal line is public electrode wire, and secondary signal line is data line or redundancy data line.
8. a display device, is characterized in that, comprises the array base palte assembly described in claim 6 or 7.
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| CN201310722566.0A CN103676243B (en) | 2013-12-24 | 2013-12-24 | Array substrate assembly, measurement method of array substrate assembly and display device |
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| CN201310722566.0A CN103676243B (en) | 2013-12-24 | 2013-12-24 | Array substrate assembly, measurement method of array substrate assembly and display device |
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Cited By (6)
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| CN104680963A (en) * | 2015-03-26 | 2015-06-03 | 京东方科技集团股份有限公司 | Detection device and detection method of display panel GOA circuit |
| CN104752442A (en) * | 2015-03-26 | 2015-07-01 | 京东方科技集团股份有限公司 | Array substrate |
| CN109119010A (en) * | 2018-08-03 | 2019-01-01 | 深圳市华星光电技术有限公司 | The detection method and display panel of array substrate horizontal drive circuit |
| CN109272912A (en) * | 2018-11-30 | 2019-01-25 | 惠科股份有限公司 | Mistake fills detection method and mistake fills detection system |
| CN109459466A (en) * | 2018-12-26 | 2019-03-12 | 上海创功通讯技术有限公司 | A kind of display screen and equipment |
| CN110928018A (en) * | 2016-12-20 | 2020-03-27 | 武汉华星光电技术有限公司 | Liquid crystal display panel and display device |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN104680963A (en) * | 2015-03-26 | 2015-06-03 | 京东方科技集团股份有限公司 | Detection device and detection method of display panel GOA circuit |
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| CN110928018A (en) * | 2016-12-20 | 2020-03-27 | 武汉华星光电技术有限公司 | Liquid crystal display panel and display device |
| CN110928018B (en) * | 2016-12-20 | 2021-05-11 | 武汉华星光电技术有限公司 | Liquid crystal display panel and display device |
| CN109119010A (en) * | 2018-08-03 | 2019-01-01 | 深圳市华星光电技术有限公司 | The detection method and display panel of array substrate horizontal drive circuit |
| CN109272912A (en) * | 2018-11-30 | 2019-01-25 | 惠科股份有限公司 | Mistake fills detection method and mistake fills detection system |
| WO2020107590A1 (en) * | 2018-11-30 | 2020-06-04 | 惠科股份有限公司 | Mischarging detection method, mischarging detection apparatus, and display apparatus |
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| CN109459466A (en) * | 2018-12-26 | 2019-03-12 | 上海创功通讯技术有限公司 | A kind of display screen and equipment |
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| CN103676243B (en) | 2017-02-15 |
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