CN103323963A - Display module, detection circuit of display module and manufacturing method thereof - Google Patents
Display module, detection circuit of display module and manufacturing method thereof Download PDFInfo
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- CN103323963A CN103323963A CN2013102786067A CN201310278606A CN103323963A CN 103323963 A CN103323963 A CN 103323963A CN 2013102786067 A CN2013102786067 A CN 2013102786067A CN 201310278606 A CN201310278606 A CN 201310278606A CN 103323963 A CN103323963 A CN 103323963A
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1345—Conductors connecting electrodes to cell terminals
- G02F1/13452—Conductors connecting driver circuitry and terminals of panels
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136254—Checking; Testing
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- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
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- Mathematical Physics (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
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Abstract
The invention provides a display module, a detection circuit of the display module and a manufacturing method thereof, and relates to the technical field of displaying. The detection circuit of the display module comprises at least one set of test points and at least one test line corresponding to the set of the test points; each set of the test points at least includes a first test point and a second test point, and the first and second test points are arranged on a driver board, a flexible printed circuit board or a display panel respectively; two ends of the test line are respectively connected with the first and second test points; resistance between the first and second test points is detected to determine whether the driver board, the flexible printed circuit board and the display panel are connected normally or not. By the detection circuit of the display module, detection processes can be simplified, and cost can be lowered.
Description
Technical field
The present invention relates to the display technique field, relate in particular to testing circuit that shows module and preparation method thereof, show module.
Background technology
At TFT-LCD(Thin Film Transistor-Liquid Crystal Display, the Thin Film Transistor (TFT) liquid crystal display) in the manufacture process, generally include: form TFT(Thin Film Transistor, thin film transistor (TFT) at glass substrate) circuit, pixel electrode and necessary lead-in wire and various mark (being Array technique); Form liquid crystal cell, set up complete optical system (being Cell technique); Assembling driving circuit and backlight form the independently module of standard external interface (being Module technique-module technique).Wherein, will carry out one-time detection (Array Test) after Array technique, this detection is that the Array semi-manufacture are tested, and the result of test is mainly used in embodying yields and the state of arts of Array technique, for Cell input method provides foundation, provide test reference for cell test simultaneously.Prior art by welding procedure of hot pressing, uses conducting resinl that liquid crystal cell and external drive plate are linked together in carrying out the module technological process.In the thermal compression welding process, need exactitude position, the driver circuit terminal on the liquid crystal cell and the terminal of external drive circuit are linked together one to one.
Behind the sweating heat compression technology, need to check that whether each circuit connects normal method is behind backlight in the assembling, carry out the picture inspection, perhaps whether contraposition is normal by the microscopic examination terminal.When showing that module displays is unusual, just need to carry out failure analysis, prior art is in the process of carrying out failure analysis, often be after color membrane substrates is removed, the flush away liquid crystal, signal on the hot-wire array substrate, and judge whether drive plate normally is connected with array base palte, and this causes checking that technique is more loaded down with trivial details, cost is higher.
Summary of the invention
Embodiments of the invention provide a kind of testing circuit that shows module and preparation method thereof, show module, can simplify inspection technique, reduce cost.
For achieving the above object, embodiments of the invention adopt following technical scheme:
The embodiment of the invention provides a kind of testing circuit that shows module, comprises at least one group of test point, and at least one piece p-wire corresponding with described at least one group of test point,
Every group of test point comprises the first test point and the second test point at least, and described the first test point and the second test point are arranged at respectively on drive plate, flexible PCB or the display panel;
The two ends of described p-wire respectively with described the first test point be connected test point and be connected;
Wherein, by detecting the resistance between described the first test point and described the second test point, determine whether to connect between described drive plate, flexible PCB and the display panel normal.
Described the first test point and described the second test point all are arranged on the described drive plate.
Described p-wire is " U " shape, and described p-wire is arranged on described drive plate, flexible PCB and the display panel.
Be provided with connecting line between every group of test point.
Described every group of test point also comprises the 3rd test point, and described the first test point is arranged on the drive plate, and described the second test point is arranged on the display panel, and described the 3rd test point is arranged on the flexible circuit, and described p-wire is through described the 3rd test point;
Wherein, by detecting the resistance between described the first test point and described the 3rd test point, determine whether to be connected between described drive plate and the flexible PCB normal, by detecting the resistance between described the 3rd test point and the second test point, determine whether to be connected between described flexible PCB and the display panel normal.
The embodiment of the invention provides a kind of demonstration module, comprises drive plate, flexible PCB and display panel, also comprises:
Be arranged at the testing circuit of the demonstration module with above-mentioned arbitrary feature on described drive plate, flexible PCB and the display panel.
The embodiment of the invention also provides a kind of method for making that shows the module testing circuit, comprising:
At drive plate, flexible PCB or display panel at least one group of test point at least one is set, every group of test point comprises the first test point and the second test point;
At described drive plate at least one the first sub-p-wire is set, at described flexible PCB at least one the second sub-p-wire is set, at described display panel at least one the 3rd sub-p-wire is set, the two ends of the p-wire that the described first sub-p-wire, the second sub-p-wire and the 3rd sub-p-wire consist of respectively with described the first test point be connected test point and be connected;
Behind the sweating heat compression technology, detect the resistance between described the first test point and described the second test point, determine whether to connect between described drive plate, flexible PCB and the display panel normal.
Described the first test point and described the second test point all are arranged on the described drive plate.
Described p-wire is " U " shape, and described p-wire is arranged on described drive plate, flexible PCB and the display panel.
Be provided with connecting line between every group of test point.
The method for making of described demonstration module testing circuit also comprises:
At described flexible PCB the 3rd test point is set, described the first test point is arranged on the drive plate, and described the second test point is arranged on the display panel, and described p-wire is through described the 3rd test point;
Detect the resistance between described the first test point and described the 3rd test point, determine whether to be connected between described drive plate and the flexible PCB normal, by detecting the resistance between described the 3rd test point and the second test point, determine whether to be connected between described flexible PCB and the display panel normal.
Testing circuit of the demonstration module that the embodiment of the invention provides and preparation method thereof, show module, the testing circuit that shows module comprises at least one group of test point, and with at least one group of at least one p-wire that test point is corresponding, every group of test point comprises the first test point and the second test point at least, the first test point and the second test point are arranged at respectively drive plate, on flexible PCB or the display panel, the two ends of p-wire respectively with the first test point be connected test point and be connected, wherein, by detecting the resistance between the first test point and the second test point, determine drive plate, whether connect normal between flexible PCB and the display panel.By this scheme, behind welding procedure of hot pressing, by detecting the resistance between the first test point and the second test point, determine whether p-wire connects normally, thereby determine whether to connect between drive plate, flexible PCB and the display panel normal, compared with prior art, simplify inspection technique, reduced cost.
Description of drawings
In order to be illustrated more clearly in the embodiment of the invention or technical scheme of the prior art, the below will do to introduce simply to the accompanying drawing of required use in embodiment or the description of the Prior Art, apparently, accompanying drawing in the following describes only is some embodiments of the present invention, for those of ordinary skills, under the prerequisite of not paying creative work, can also obtain according to these accompanying drawings other accompanying drawing.
Fig. 1 is the testing circuit structural representation one of the demonstration module of the embodiment of the invention;
Fig. 2 is the testing circuit structural representation two of the demonstration module of the embodiment of the invention;
Fig. 3 is the testing circuit structural representation three of the demonstration module of the embodiment of the invention;
Fig. 4 is the testing circuit structural representation four of the demonstration module of the embodiment of the invention;
Fig. 5 is the testing circuit structural representation five of the demonstration module of the embodiment of the invention;
Fig. 6 is the testing circuit structural representation six of the demonstration module of the embodiment of the invention;
Fig. 7 is the testing circuit structural representation seven of the demonstration module of the embodiment of the invention;
Fig. 8 is the testing circuit structural representation eight of the demonstration module of the embodiment of the invention;
Fig. 9 is the testing circuit structural representation nine of the demonstration module of the embodiment of the invention;
Figure 10 is the testing circuit structural representation ten of the demonstration module of the embodiment of the invention;
Figure 11 is the testing circuit structural representation 11 of the demonstration module of the embodiment of the invention;
Figure 12 is the testing circuit structural representation 12 of the demonstration module of the embodiment of the invention;
Figure 13 is the method for making schematic flow sheet of the demonstration module testing circuit of the embodiment of the invention.
Each element is among the figure: 1, drive plate; 2, flexible PCB; 3, display panel; 4, the testing circuit that shows module; 40, the first test point; 41, the second test point; 42, p-wire; 420, the first sub-p-wire; 421, the second sub-p-wire; 422, the 3rd sub-p-wire; 43, connecting line.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the invention, the technical scheme in the embodiment of the invention is clearly and completely described, obviously, described embodiment only is the present invention's part embodiment, rather than whole embodiment.Based on the embodiment among the present invention, those of ordinary skills belong to the scope of protection of the invention not making the every other embodiment that obtains under the creative work prerequisite.
The embodiment of the invention provides a kind of testing circuit that shows module, comprises at least one group of test point, and at least one piece p-wire corresponding with described at least one group of test point,
Every group of test point comprises the first test point and the second test point at least, and described the first test point and the second test point are arranged at respectively on drive plate, flexible PCB or the display panel;
The two ends of described p-wire respectively with described the first test point be connected test point and be connected;
Wherein, by detecting the resistance between described the first test point and described the second test point, determine whether to connect between described drive plate, flexible PCB and the display panel normal.
The testing circuit of the demonstration module that the embodiment of the invention provides comprises multiple implementation, below, by way of example its implementation is described respectively:
In the first implementation, as shown in Figure 1, show that module comprises drive plate 1, flexible PCB 2 and display panel 3, the testing circuit 4 that shows module, comprise at least one group of test point, every group of test point comprises the first test point 40 and the second test point 41 at least, and at least one piece p-wire 42 corresponding with described at least one group of test point, every group of test point all is arranged on the drive plate 1, the two ends of p-wire 42 respectively with described the first test point 40 be connected test point 41 and be connected, described p-wire 42 can be " U " shape, and described p-wire 42 is arranged in described drive plate 1, on flexible circuit 2 plates and the display panel 3.
Particularly, p-wire 42 comprises three parts: first is as shown in Figure 2 the first sub-p-wire 420 on the drive plate 1 of being arranged at; Second portion is as shown in Figure 3 the second sub-p-wire 421 on the flexible PCB 2 of being arranged at; Third part is as shown in Figure 4 the 3rd sub-p-wire 422 on the display panel 3 of being arranged at.
When adopting welding procedure of hot pressing that drive plate 1 and flexible PCB 2 are linked together, and when flexible PCB 2 and display panel 3 linked together, the first sub-p-wire 420 and the second sub-p-wire 421, the second sub-p-wire 421 and the 3rd sub-p-wire 422 were all by anisotropy conductiving glue exactitude position thermal compression welding together.
And then, by detecting the resistance between described the first test point and described the second test point, determine whether to connect between described drive plate, flexible PCB and the display panel normal.Detection method can be particularly, two probes of the instrument (such as multimeter etc.) of test resistance are contacted respectively the first test point 40 and the second test point 41, namely can detect the resistance of the resistance (being p-wire 42) between the first test point 40 and described the second test point 41.If the resistance that tests out is bigger than normal or open circuit, the connection existing problems between the corresponding drive plate of this p-wire, flexible PCB and the display panel are described then.
Further, be provided with connecting line 43 between every group of test point, as shown in Figure 5.
At this moment, if detect the first test point of first group of test point and the resistance between last the second test point of organizing test point, then can judge that whether the connection between whole drive plate, flexible PCB and the display panel has problems, and has further simplified detecting step by once testing.
In the second implementation, similar with above-mentioned the first implementation, show that module comprises drive plate 1, flexible PCB 2 and display panel 3, the testing circuit 4 that shows module, comprise at least one group of test point, every group of test point comprises the first test point 40 and the second test point 41 at least, and at least one piece p-wire 42 corresponding with described at least one group of test point, wherein, every group of test point all is arranged on the display panel 3, the two ends of p-wire 42 respectively with described the first test point 40 be connected test point 41 and be connected, described p-wire 42 is " U " shape, described p-wire 42 is arranged in described drive plate 1, on flexible PCB 2 and the display panel 3, specifically as shown in Figure 6.
Wherein, the method for testing of the method for test resistance and above-mentioned the first implementation is similar, repeats no more herein.
Further, be provided with connecting line between every group of test point, as shown in Figure 7.
Similarly, if detect the first test point of first group of test point and the resistance between last the second test point of organizing test point, then can judge that whether the connection between whole drive plate, flexible PCB and the display panel has problems, and has simplified detecting step by once testing.
In the third implementation, as shown in Figure 8, show that module comprises drive plate 1 flexible PCB 2 and display panel 3, the testing circuit 4 that shows module, comprise at least one group of test point, every group of test point comprises the first test point 40 and the second test point 41 at least, and at least one piece p-wire 42 corresponding with described at least one group of test point, wherein, the first test point 40 of every group of test point all is arranged on the drive plate 1, the second test point 41 of every group of test point all is arranged on the display panel 3, the two ends of p-wire 42 respectively with described the first test point 40 be connected test point 41 and be connected, described p-wire 42 can be " I " shape, and described p-wire 42 is arranged in described drive plate 1, on flexible circuit 2 plates and the display panel 3.
Particularly, p-wire 42 comprises three parts: first is as shown in Figure 9 the first sub-p-wire 420 on the drive plate 1 of being arranged at; Second portion is as shown in figure 10 the second sub-p-wire 421 on the flexible PCB 2 of being arranged at; Third part is as shown in figure 11 the 3rd sub-p-wire 422 on the display panel 3 of being arranged at.
When adopting welding procedure of hot pressing that drive plate 1 and flexible PCB 2 are linked together, and when flexible PCB 2 and display panel 3 linked together, the first sub-p-wire 420 and the second sub-p-wire 421, the second sub-p-wire 421 and the 3rd sub-p-wire 422 were all by anisotropy conductiving glue exactitude position thermal compression welding together.And then, by detecting the resistance between described the first test point and described the second test point, determine whether to connect between described drive plate, flexible PCB and the display panel normal.
Detection method can be particularly, two probes of the instrument (such as multimeter etc.) of test resistance are contacted respectively the first test point 40 and the second test point 41, namely can detect the resistance of the resistance (being p-wire 42) between the first test point 40 and described the second test point 41.If test resistance is bigger than normal or open circuit, then be connected with problem between corresponding drive plate, flexible PCB and the display panel of explanation.
Further, be provided with connecting line 43 between every group of test point.As shown in figure 12, when the resistance between the second test point of the first test point that detects first group of test point and last group test point, can by once testing to judge between whole drive plate, flexible PCB and the display panel to connect whether problem is arranged, simplify detecting step.
Need to prove; part implementation in the multiple implementation that above-mentioned three kinds of implementations only list for the embodiment of the invention; the arrangement method of other and the testing circuit of technical scheme of the present invention under same design should be all within protection scope of the present invention, and the present invention repeats no more.
It is worthy of note, above-mentioned the first implementation is preferred implementation, this be because, the drive plate size is larger, be easy to arrange test point and test point is detected, connect up around the display panel that often size is less in the zone, be not easy to arrange test point and test point is detected.
Further, described every group of test point also comprises the 3rd test point, and described the first test point is arranged on the drive plate, and described the second test point is arranged on the display panel, described the 3rd test point is arranged on the flexible circuit, and described p-wire is through described the 3rd test point;
Wherein, by detecting the resistance between described the first test point and described the 3rd test point, determine whether to be connected between described drive plate and the flexible PCB normal, by detecting the resistance between described the 3rd test point and the second test point, determine whether to be connected between described flexible PCB and the display panel normal.
The testing circuit of the demonstration module that the embodiment of the invention provides, comprise at least one group of test point, and with at least one group of at least one p-wire that test point is corresponding, every group of test point comprises the first test point and the second test point at least, the first test point and the second test point are arranged at respectively drive plate, on flexible PCB or the display panel, the two ends of p-wire respectively with the first test point be connected test point and be connected, wherein, by detecting the resistance between the first test point and the second test point, determine drive plate, whether connect normal between flexible PCB and the display panel.By this scheme, behind welding procedure of hot pressing, by detecting the resistance between the first test point and the second test point, determine whether p-wire connects normally, thereby determine whether to connect between drive plate, flexible PCB and the display panel normal, compared with prior art, simplify inspection technique, reduced cost.
The embodiment of the invention provides a kind of method for making that shows the module testing circuit, it is characterized in that, comprising:
At drive plate, flexible PCB or display panel at least one group of test point at least one is set, every group of test point comprises the first test point and the second test point;
At described drive plate at least one the first sub-p-wire is set, at described flexible PCB at least one the second sub-p-wire is set, at described display panel at least one the 3rd sub-p-wire is set, the two ends of the p-wire that the described first sub-p-wire, the second sub-p-wire and the 3rd sub-p-wire consist of respectively with described the first test point be connected test point and be connected;
Behind the sweating heat compression technology, detect the resistance between described the first test point and described the second test point, determine whether to connect between described drive plate, flexible PCB and the display panel normal.
As shown in figure 13, the embodiment of the invention provides a kind of method for making that shows the module testing circuit, specifically comprises step:
S101, at drive plate, flexible PCB or display panel at least one group of test point at least one is set, every group of test point comprises the first test point and the second test point.
Particularly, take the testing circuit of the demonstration module of above-mentioned the first implementation as example, other implementation is similar with it, at drive plate at least one group of test point is set, and every group of test point comprises the first test point and the second test point.
S102, at described drive plate at least one the first sub-p-wire is set, at described flexible PCB at least one the second sub-p-wire is set, at described display panel at least one the 3rd sub-p-wire is set.
Particularly, at drive plate setting the first sub-p-wire as shown in Figure 2, at flexible PCB setting the second sub-p-wire as shown in Figure 3, at display panel setting the 3rd sub-p-wire as shown in Figure 4.
And then, the described first sub-p-wire, the second sub-p-wire and the 3rd sub-p-wire at the two ends of the p-wire that carries out consisting of behind the sweating heat compression technology respectively with described the first test point be connected test point and be connected.
S103, behind the sweating heat compression technology, detect the resistance between described the first test point and described the second test point, determine whether to connect between described drive plate, flexible PCB and the display panel normal.
When adopting welding procedure of hot pressing that drive plate and flexible PCB are linked together, and when flexible PCB and display panel linked together, the first sub-p-wire and the second sub-p-wire, the second sub-p-wire and the 3rd sub-p-wire were all by anisotropy conductiving glue with the exactitude position thermal compression welding together.
And then, by detecting the resistance between described the first test point and described the second test point, determine whether to connect between described drive plate, flexible PCB and the display panel normal.Detection method can be particularly, and with the instrument of test resistance, such as multimeter etc., two probes contact respectively the resistance that the first test point and the second test point namely can detect the resistance (being p-wire) between the first test point and described the second test point.If test resistance is bigger than normal or open circuit, then be connected with problem between corresponding drive plate, flexible PCB and the display panel of explanation.
Further, be provided with connecting line between every group of test point.As shown in Figure 4, when the resistance between the second test point of the first test point that detects first group of test point and last group test point, can by once testing to judge between whole drive plate, flexible PCB and the display panel to connect whether problem is arranged, simplify detecting step.
Further, the method for making of demonstration module testing circuit also comprises:
At described flexible PCB the 3rd test point is set, described the first test point is arranged on the drive plate, and described the second test point is arranged on the display panel, and described p-wire is through described the 3rd test point;
Detect the resistance between described the first test point and described the 3rd test point, determine whether to be connected between described drive plate and the flexible PCB normal, by detecting the resistance between described the 3rd test point and the second test point, determine whether to be connected between described flexible PCB and the display panel normal.
The method for making of the demonstration module testing circuit that the embodiment of the invention provides, be included in drive plate, in at least one group of test point at least one is set on flexible PCB or the display panel, every group of test point comprises the first test point and the second test point, at described drive plate at least one the first sub-p-wire is set, at described flexible PCB at least one the second sub-p-wire is set, at described display panel at least one the 3rd sub-p-wire is set, the described first sub-p-wire, the two ends of the p-wire that the second sub-p-wire and the 3rd sub-p-wire consist of respectively with described the first test point be connected test point and be connected, behind the sweating heat compression technology, detect the resistance between described the first test point and described the second test point, determine described drive plate, whether connect normal between flexible PCB and the display panel.By this scheme, behind welding procedure of hot pressing, by detecting the resistance between the first test point and the second test point, determine whether p-wire connects normally, thereby determine whether to connect between drive plate, flexible PCB and the display panel normal, compared with prior art, simplify inspection technique, reduced cost.
The embodiment of the invention also provides a kind of demonstration module, comprises drive plate, flexible PCB and display panel, also comprises: the testing circuit that is arranged at the demonstration module with above-mentioned arbitrary characteristics on described drive plate, flexible PCB and the display panel.
Display panel in the demonstration module that the embodiment of the invention provides can be display panels, comprises color membrane substrates and array base palte that opposing parallel arranges, and is filled in the liquid crystal between color membrane substrates and the array base palte; This display panel also can comprise array base palte for the OLED display panel, and luminous organic material and the encapsulation cover plate of evaporation on this array base palte.
The display panels that the embodiment of the invention provides can not limit for product or the present invention of section that liquid crystal display, LCD TV, digital album (digital photo frame), mobile phone, panel computer etc. have a Presentation Function.
The above; be the specific embodiment of the present invention only, but protection scope of the present invention is not limited to this, anyly is familiar with those skilled in the art in the technical scope that the present invention discloses; can expect easily changing or replacing, all should be encompassed within protection scope of the present invention.Therefore, protection scope of the present invention should be as the criterion with the protection domain of described claim.
Claims (11)
1. a testing circuit that shows module is characterized in that, comprises at least one group of test point, and at least one piece p-wire corresponding with described at least one group of test point,
Every group of test point comprises the first test point and the second test point at least, and described the first test point and the second test point are arranged at respectively on drive plate, flexible PCB or the display panel;
The two ends of described p-wire respectively with described the first test point be connected test point and be connected;
Wherein, by detecting the resistance between described the first test point and described the second test point, determine whether to connect between described drive plate, flexible PCB and the display panel normal.
2. the testing circuit of demonstration module according to claim 1 is characterized in that, described the first test point and described the second test point all are arranged on the described drive plate.
3. the testing circuit of demonstration module according to claim 2 is characterized in that, described p-wire is " U " shape, and described p-wire is arranged on described drive plate, flexible PCB and the display panel.
4. the testing circuit of each described demonstration module is characterized in that according to claim 1-3, is provided with connecting line between every group of test point.
5. the testing circuit of demonstration module according to claim 1, it is characterized in that, described every group of test point also comprises the 3rd test point, described the first test point is arranged on the drive plate, described the second test point is arranged on the display panel, described the 3rd test point is arranged on the flexible circuit, and described p-wire is through described the 3rd test point;
Wherein, by detecting the resistance between described the first test point and described the 3rd test point, determine whether to be connected between described drive plate and the flexible PCB normal, by detecting the resistance between described the 3rd test point and the second test point, determine whether to be connected between described flexible PCB and the display panel normal.
6. one kind shows module, comprises drive plate, flexible PCB and display panel, it is characterized in that, also comprises:
Be arranged at the testing circuit such as each described demonstration module in the claim 1 to 5 on described drive plate, flexible PCB and the display panel.
7. a method for making that shows the module testing circuit is characterized in that, comprising:
At drive plate, flexible PCB or display panel at least one group of test point at least one is set, every group of test point comprises the first test point and the second test point;
At described drive plate at least one the first sub-p-wire is set, at described flexible PCB at least one the second sub-p-wire is set, at described display panel at least one the 3rd sub-p-wire is set, the two ends of the p-wire that the described first sub-p-wire, the second sub-p-wire and the 3rd sub-p-wire consist of respectively with described the first test point be connected test point and be connected;
Behind the sweating heat compression technology, detect the resistance between described the first test point and described the second test point, determine whether to connect between described drive plate, flexible PCB and the display panel normal.
8. the method for making of demonstration module testing circuit according to claim 7 is characterized in that, described the first test point and described the second test point all are arranged on the described drive plate.
9. the method for making of demonstration module testing circuit according to claim 8 is characterized in that, described p-wire is " U " shape, and described p-wire is arranged on described drive plate, flexible PCB and the display panel.
10. the method for making of each described demonstration module testing circuit is characterized in that according to claim 7-9, is provided with connecting line between every group of test point.
11. the method for making of demonstration module testing circuit according to claim 7 is characterized in that, also comprises:
At described flexible PCB the 3rd test point is set, described the first test point is arranged on the drive plate, and described the second test point is arranged on the display panel, and described p-wire is through described the 3rd test point;
Detect the resistance between described the first test point and described the 3rd test point, determine whether to be connected between described drive plate and the flexible PCB normal, by detecting the resistance between described the 3rd test point and the second test point, determine whether to be connected between described flexible PCB and the display panel normal.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2013102786067A CN103323963A (en) | 2013-07-04 | 2013-07-04 | Display module, detection circuit of display module and manufacturing method thereof |
| PCT/CN2013/089006 WO2015000264A1 (en) | 2013-07-04 | 2013-12-10 | Display module, detection circuit of display module and manufacturing method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2013102786067A CN103323963A (en) | 2013-07-04 | 2013-07-04 | Display module, detection circuit of display module and manufacturing method thereof |
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| CN103323963A true CN103323963A (en) | 2013-09-25 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN2013102786067A Pending CN103323963A (en) | 2013-07-04 | 2013-07-04 | Display module, detection circuit of display module and manufacturing method thereof |
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| Country | Link |
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| CN (1) | CN103323963A (en) |
| WO (1) | WO2015000264A1 (en) |
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| WO2015000264A1 (en) | 2015-01-08 |
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