CN107591117A - The method of testing and test system of display panel - Google Patents
The method of testing and test system of display panel Download PDFInfo
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- CN107591117A CN107591117A CN201710881323.XA CN201710881323A CN107591117A CN 107591117 A CN107591117 A CN 107591117A CN 201710881323 A CN201710881323 A CN 201710881323A CN 107591117 A CN107591117 A CN 107591117A
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Abstract
The embodiment of the invention discloses a kind of method of testing of display panel, including：High level signal is exported to the corresponding thin film transistor (TFT) by the control signal input to control the thin film transistor (TFT) to open；First test point is reached via the input, output end and the corresponding periphery cabling of the thin film transistor (TFT) by the test signal that the second test point inputs；Test obtains the test resistance value between the second test point and the first test point；Whether within a preset range to judge the difference of the test resistance value and standard electric resistance；If it is, the periphery cabling corresponding to the test resistance not breaking signal is obtained, if it is not, then obtaining the signal of the periphery cabling open circuit corresponding to the test resistance.The embodiment of the invention also discloses a kind of test circuit of display panel and the test system of display panel.Using the present invention, there is the advantages of effectively can testing the periphery cabling in display panel.
Description
Technical field
The present invention relates to display technology field, more particularly to the method for testing and test system of a kind of display panel.
Background technology
With the rapid development of Display Technique, touch display panel is widely received and used by people, such as intelligence
Energy mobile phone, tablet personal computer etc. have used touch display panel.Touch display panel is hardened by touch panel and LCD
It is integrated so that liquid crystal display panel is provided simultaneously with showing and perceives the function of touch input.
Touch display panel can be divided into resistance-type, condenser type, optical profile type, four kinds of acoustic wave according to induction technology difference, at present
The touching technique of main flow is condenser type.Touch display panel can be divided into according to structure difference：Built-in touch display panel and
External hanging type touch display panel.Wherein, external hanging type touch display panel is separately to produce touch panel with liquid crystal display panel,
Then be bonded together into the display panel with touch function, external hanging type touch display panel exist cost of manufacture it is higher,
The shortcomings of light transmission rate is relatively low, module is thicker.Built-in touch display panel is that touch panel function is embedded into liquid crystal panel
It is interior so that liquid crystal panel is provided simultaneously with showing and perceives the function of touch input, compared to external hanging type touch display panel, has
The advantages that cost is relatively low, thinner thickness, favored by major panel producer.Further, built-in touch display panel according to
The different of position in circuit insertion liquid crystal panel are touched again to be divided into：Touch circuit is in liquid crystal cell mo(u)ld top half (On-Cell), another kind
Circuit is touched at liquid crystal cell inner mold (In-Cell).Compared with On-Cell touch display panels, In-Cell touch display panel energy
The more lightening of panel is enough realized, is used for vast mobile phone production firm, has been evolved into the main development side of following touching technique
To.
Prior art in order to realize narrow frame, In-Cell touch display panels or other display panels (here with
Illustrated exemplified by In-cell touch display panels) start the scheme that consideration is considered as COF (Chip On FPC), COF side
Case, as its name suggests, refers to one IC chip is produced on FPC (Flexible Printed Circuit, flexible PCB)
Kind technology, can preferably realize narrow frame.In order to prevent COF material wastes, touched flexible PCB is pressed to In-Cell
, it is necessary to test the path open circuit that periphery cabling is touched in In-Cell touch display panels, so before touching display panel
And because COF has just been applied in display panel, prior art is broken to the path for touching periphery cabling and other periphery cablings
The also no effective manner in road is tested.
The content of the invention
Technical problem to be solved of the embodiment of the present invention is, there is provided a kind of method of testing of display panel and test system
System.Effectively the periphery cabling in display panel can be tested.
In order to solve the above-mentioned technical problem, first aspect of the embodiment of the present invention provides a kind of test side of display panel
Method, the display panel include：
A plurality of periphery cabling；
Multiple pressing contacts, it corresponds with the periphery cabling and electrically connected, its be used to being formed the first test point with
Whether measurement jig connection is breaking to test the periphery cabling；
Control signal input, it is used to access high level or low level；
At least one test signal input, it is used for input test signal, and it is used to form the second test point；
Multiple thin film transistor (TFT)s, its control terminal electrically connect with the control signal input, a pair of its output end difference 1
It should be electrically connected with the periphery cabling, its input electrically connects with the second test point；The method of testing includes：
It is described to control to the corresponding thin film transistor (TFT) that high level signal is exported by the control signal input
Thin film transistor (TFT) is opened；
By the test signal that the second test point inputs via the input, output end of the thin film transistor (TFT) and corresponding
The periphery cabling reaches the first test point；
Test obtains the test resistance value between the second test point and the first test point；
Whether within a preset range to judge the difference of the test resistance value and standard electric resistance；
If it is, the periphery cabling corresponding to the test resistance not breaking signal is obtained, if it is not, then obtaining
The signal of periphery cabling open circuit corresponding to the test resistance.
In the embodiment of first aspect present invention one, the number of first test point is one, and multiple pressings are touched
Point short circuit forms first test point.
In the embodiment of first aspect present invention one, the number of the test signal input, the number of the second test point,
The number all same of test resistance.
In the embodiment of first aspect present invention one, multiple pressing contacts connect film probe to be correspondingly formed respectively
Multiple first test points.
In the embodiment of first aspect present invention one, the preset range is less than or equal to the mark corresponding to 10%
Quasi- resistance value.
Second aspect of the present invention embodiment provides a kind of test circuit of display panel, including：
A plurality of periphery cabling；
Multiple pressing contacts, its electrical connection corresponding with the periphery cabling, its be used to being formed the first test point with test
Tool is connected to test the periphery cabling；
Control signal input, it is used for incoming control signal；
At least one test signal input, it is used for input test signal, and the test signal input is used to be formed
Second test point；
Multiple thin film transistor (TFT)s, its control terminal electrically connect with the control signal input, its output end respectively correspond to
The periphery cabling electrical connection, its input are used to electrically connect with the second test point；Wherein,
When the control signal input accesses high level, the thin film transistor (TFT) conducting, passes through second test point
The test signal of input reaches first via the input, output end and the corresponding periphery cabling of the thin film transistor (TFT) and surveyed
Pilot is to be tested.
In the embodiment of second aspect of the present invention one, the number of first test point is one, and multiple pressings are touched
Point short circuit forms first test point.
In the embodiment of second aspect of the present invention one, multiple pressing contacts connect film probe to be correspondingly formed respectively
Multiple first test points.
Third aspect present invention embodiment provides a kind of test circuit of display panel, including above-mentioned display panel
Test circuit；Wherein, the test system also includes：
Opening unit, it is used to exporting high level signal by the control signal input all described thin to control
Film transistor is opened；
Test signal input block, it is used for brilliant via the film by the test signal that second test point inputs
The input, output end of body pipe and the corresponding periphery cabling reach the first test point；
Resistance test unit, it is used to test the test resistance obtained between the second test point and corresponding first test point
Value；
Judging unit, whether within a preset range it be used to judging the difference of the test resistance value and standard electric resistance；
Processing unit, if it is yes that it, which is used for the judged result judged, obtain described where the test resistance
The intact signal of periphery cabling, if the judged result judged is no, obtain the side periphery line where the test resistance
The signal of section open circuit.
In the embodiment of third aspect present invention one, the preset range is the standard electric resistance less than or equal to 10%.
Implement the embodiment of the present invention, have the advantages that：
Because the method for testing of the display panel includes：High level signal is accessed to corresponding by control signal input
Thin film transistor (TFT) to control the thin film transistor (TFT) to open；By the second test point input test signal via thin film transistor (TFT)
Input, output end and corresponding periphery cabling reach the first test point；Test obtains the second test point and the first test point
Between test resistance value；Whether within a preset range to judge the difference of the test resistance value and standard electric resistance；If it is,
The intact signal of periphery cabling corresponding to the test resistance is then obtained, if it is not, then obtaining the week corresponding to the test resistance
The signal of side cabling open circuit.It is whether breaking so as to obtain corresponding periphery cabling by test resistance value, subsequently enter one
Step can press flexible PCB onto the pressing contacts not being connected with those breaking periphery cablings, so as to prevent thing
The waste of material, cost can be reduced.
Brief description of the drawings
In order to illustrate more clearly about the embodiment of the present invention or technical scheme of the prior art, below will be to embodiment or existing
There is the required accompanying drawing used in technology description to be briefly described, it should be apparent that, drawings in the following description are only this
Some embodiments of invention, for those of ordinary skill in the art, on the premise of not paying creative work, can be with
Other accompanying drawings are obtained according to these accompanying drawings.
Fig. 1 is the schematic diagram of one embodiment of the invention display panel；
Fig. 2 is the flow chart of the method for testing of one embodiment of the invention display panel；
Fig. 3 is the schematic diagram of another embodiment of the present invention display panel；
Fig. 4 is the partial block diagram of the test system of one embodiment of the invention display panel；
Shown by reference numeral：
110- peripheries cabling；120- presses contact；130- control signal inputs；140- test signal inputs；150-
Thin film transistor (TFT)；160- p-wires；170th, 270- measurement jigs；171- conducting resinls；271- film probes；AA- viewing areas；310-
Opening unit；320- test signal input blocks；330- resistance test units；340- judging units；350- processing units.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete
Site preparation describes, it is clear that described embodiment is only part of the embodiment of the present invention, rather than whole embodiments.It is based on
Embodiment in the present invention, those of ordinary skill in the art are obtained every other under the premise of creative work is not made
Embodiment, belong to the scope of protection of the invention.
The term " comprising " and " having " occurred in present specification, claims and accompanying drawing and their any changes
Shape, it is intended that cover non-exclusive include.Such as contain the process of series of steps or unit, method, system, product or
The step of equipment is not limited to list or unit, but alternatively also include the step of not listing or unit, or it is optional
Ground is also included for the intrinsic other steps of these processes, method, product or equipment or unit.In addition, term " first ", " the
Two " and " the 3rd " etc. are for distinguishing different objects, and are not intended to describe specific order.
The embodiment of the present invention provides a kind of method of testing of display panel, refers to Fig. 1, and the display panel includes a plurality of
Periphery cabling 110, multiple pressing contacts 120, control signal input 130, at least one test signal input 140 and multiple
Thin film transistor (TFT) 150.The a plurality of periphery cabling 110 is used to connect the unit in the viewing area AA of display panel, described
Unit be used for sense user whether display panel, in order to prevent COF material wastes, it is necessary to detect a plurality of periphery cabling 110
It is whether breaking；The end one-to-one corresponding of multiple pressing contacts 120 and the periphery cablings 110 electrically connects, specially with the week
End electrical connection of the side cabling 110 away from viewing area AA, in the present embodiment, multiple pressing contacts 120 have two concentration zones,
One pressing concentration zones of contact 120 is located at the left side in Fig. 1, and the pressing concentration zones of contact 120 are located at the right side in Fig. 1, institute
Pressing contact 120 is stated to be separated from each other settings, multiple pressing contacts 120 be used for the first test point of formation with measurement jig
170 connections, it is whether breaking to test the periphery cabling 110 by measurement jig 170；Control signal input 130 is used to connect
Enter high level or low level turning on or off for control thin film transistor (TFT) 150, when accessing high level, corresponding film
Transistor 150 is opened, and now periphery cabling 110 can be tested, when accessing low level, corresponding thin film transistor (TFT)
150 disconnect, and now periphery cabling 110 can be used for transmission signal；At least one test signal input 140 is used to input respectively
Test signal, in the present embodiment, the number of the test signal input 140 is two, so as to which test signal is also two,
Described two test signal inputs 140 are used to form two the second test points；The control terminal of multiple thin film transistor (TFT)s 150 and control
Signal input part 130 processed is electrically connected, and its output end corresponds respectively to be electrically connected with periphery cabling 110, in the present embodiment for
Electrically connected with the one end of periphery cabling 110 away from pressing contact 120, the input of the thin film transistor (TFT) 150 and the second test
Point electrical connection, in Fig. 1, the number of the thin film transistor (TFT) 150 is identical with the number of periphery cabling, is 16 and (is in figure
Signal, in practical structures number it is more than these).Include incorporated by reference to the method for testing referring to Fig. 1 and Fig. 2, the display panel：
S110：High level signal is exported to corresponding thin film transistor (TFT) 150 to control by control signal input 130
Thin film transistor (TFT) 150 is stated to open；
, it is necessary to corresponding thin film transistor (TFT) 150 be opened, to facilitate test signal before testing periphery cabling 110
Input for testing whether corresponding periphery cabling 110 disconnects, in the present embodiment, pass through the control signal input 130
High level signal is exported to corresponding thin film transistor (TFT) 150 to control the unlatching of the thin film transistor (TFT) 150, behind convenient
The input of test signal.
S120:By the test signal that the second test point inputs via the input, output end of thin film transistor (TFT) 150 and right
The periphery cabling 110 answered reaches the first test point；
In the present embodiment, entered between the input of the thin film transistor (TFT) 150 and the second test point by p-wire 160
Row electrical connection, in the present embodiment, the number of second test point is two, and the number of the p-wire 160 is also two,
The number for the input of thin film transistor (TFT) 150 that each p-wire 160 connects is 8, namely the thin film transistor (TFT) 150 of half connects
A wherein p-wire 160 is connected to, the thin film transistor (TFT) 150 of half connects an other p-wire 160, the test letter in addition
Number reach the first test via p-wire 160, the input, output end of thin film transistor (TFT) 150 and corresponding periphery cabling 110
Point.
S130:Test obtains the test resistance value between the second test point and the first test point；
In the present embodiment, it can also be multiple that the number of test resistance value, which can be one, and here, described first surveys
The number of pilot is one, and particularly, multiple pressing short circuits of contact 120 form first test point, in this implementation
In example, the pressing concentration zones of contact 120 in left side are by conducting resinl 171 by all short circuits of pressing contact 120 in this region one
To rise, all pressing contacts 120 in this region are shorted together by the pressing concentration zones of contact 120 on right side by conducting resinl 171,
Then left side short circuit pressing the concentration zones of contact 120 and right side short circuit the concentration zones of pressing contact 120 by wire short circuit one
Rise.In the present embodiment, the number of the second test point is two, as the number of test signal input 140.Continuing with ginseng
See Fig. 1, because the number of the first test point is one, the number of the second test point is two, the test resistance value obtained from
Number be also two, one of test resistance value is resistance value corresponding to 8 parallel connections of periphery cabling 110, another survey
Examination resistance value is resistance value corresponding to other 8 periphery cablings 110 parallel connection.Certainly, in other embodiments of the invention, according to
The number for the test resistance value that first test point, the difference of the second test point are obtained also can be different therewith.
S140：Whether within a preset range to judge the difference of the test resistance value and standard electric resistance；
In the present embodiment, there are two test resistance values, corresponding to have two standard electric resistances, two standard electric resistances
It is the corresponding resistance value in parallel without 8 periphery cablings 110 of open circuit, is known.When 8 periphery cablings 110 have open circuit,
Now corresponding test resistance value can significantly increase, and can exceed corresponding standard electric resistance, by whether judging both differences
Within a preset range and then judge whether 8 periphery cablings 110 have open circuit, in the present embodiment, the preset range is
Less than or equal to the standard electric resistance corresponding to 10%, for example, 10% corresponding standard electric resistance, 9% pair
The standard electric resistance answered, the 8% corresponding standard electric resistance, the 7% corresponding standard electric resistance, 6%
The corresponding standard electric resistance, the 5% corresponding measuring resistance, the 4% corresponding measuring resistance, 3% pair
The measuring resistance answered, 2% corresponding described measuring resistance etc..
S150:If it is, obtain periphery cabling 110 corresponding to the test resistance not breaking signal；If it is not, then
Obtain the signal of the open circuit of side periphery cabling 110 where the test resistance.
In the present embodiment, if the difference is within a preset range, then it represents that 8 week corresponding to the test resistance
Side cabling 110 is not breaking, namely corresponding 8 periphery cablings 110 are not breaking, so as to obtain corresponding periphery cabling 110
Not breaking signal；If the difference is not in the preset range, then it represents that walks on 8 peripheries corresponding to the test resistance
The open circuit of line 110, so as to obtain the signal of the open circuit of periphery cabling 110 corresponding to the test resistance.So that can by such a method
It is whether breaking to detect the periphery cabling 110 of display panel, if not breaking, flexible PCB can subsequently be pressed arrive with
On those pressing contacts 120 that breaking periphery cabling 110 does not connect,；If periphery cabling 110 has open circuit, directly by face
Plate is scrapped or subsequently those periphery cablings 110 is repaired, so as to prevent flexible PCB pressing to open circuit
On panel, the waste of material is caused.
Because the method for testing of the display panel includes：By control signal input 130 export high level signal to
Corresponding thin film transistor (TFT) 150 is to control the thin film transistor (TFT) 150 to open；By the second test point input test signal via
The input, output end of thin film transistor (TFT) 150 and corresponding periphery cabling 110 reach the first test point；Test obtains second and surveyed
Test resistance value between pilot and the first test point；Judge the test resistance value with the difference of standard electric resistance whether pre-
If in scope；If it is, the intact signal of periphery cabling 110 corresponding to the test resistance is obtained, if it is not, then being somebody's turn to do
The signal of the open circuit of periphery cabling 110 corresponding to test resistance.So as to obtain corresponding periphery by test resistance value
Whether cabling 110 is breaking, subsequently can further press flexible PCB to breaking periphery cabling 110 is not connected with those
Pressing contact 120 on, so as to prevent the waste of COF materials, cost can be reduced, and the narrow of display panel can be realized
Frame.
The electricity for the corresponding 8 periphery cablings 110 arranged side by side of test resistance value that display panel of the present embodiment based on Fig. 1 obtains
Resistance, when measuring 8 periphery cablings 110 arranged side by side and having open circuit, it can not now be measured based on test methodology above and structure
Which specific bar or those periphery cablings 110 have open circuit, in other embodiments of the invention, please in order to improve the problem
Referring to Fig. 3, it is multiple to be correspondingly formed that film probe 271 is connected respectively with the pressing contact 120 of the periphery cabling 110 electrical connection
First test point, the film probe 271 are used to be connected with measurement jig 270, the number of the film probe 271, the
The number all same of the number of one test point, the periphery cabling 110, so as to which by Fig. 2 method, multiple tests can be obtained
Resistance value, the corresponding periphery cabling 110 of each test resistance value, so as to precisely obtain each periphery cabling 110
It is whether breaking, so as to the convenient subsequently processing to breaking periphery cabling 110.
In addition, in the present embodiment, the display panel can be In-cell touch display panels or general
Display panel.When for in-cell touch display panels when, the periphery cabling for touch periphery cabling, the touch periphery
Cabling electrically connects with touch electrode.
The embodiment of the present invention also provides a kind of test circuit of display panel, refers to Fig. 1, including：
A plurality of periphery cabling 110；
Multiple pressing contacts 120, it is corresponding with the periphery cabling 110 to electrically connect, its be used to being formed the first test point with
It is connected with measurement jig 170 to test the periphery cabling 110, such as whether test the periphery cabling 110 breaking；
Control signal input 130, it is used for incoming control signal, and the control signal is, for example, high level or low electricity
It is flat；
At least one test signal input 140, it is used for input test signal, and the test signal input is used for shape
Into the second test point；
Multiple thin film transistor (TFT)s 150, its control terminal electrically connect with control signal input 130, and its output end corresponds to respectively
Electrically connected with periphery cabling 110, its input is used to electrically connect with the second test point；Wherein,
When the control signal input 130 accesses high level, the thin film transistor (TFT) 150 turns on, and passes through described second
Input, output end and the corresponding periphery cabling of the test signal of test point input via the thin film transistor (TFT) 150
110 reach the first test points to be tested.、
In the present embodiment, the quantity of first test point is one, and multiple pressing short circuits of contact 120 form one
Individual first test point.
In the present embodiment, the number of the test signal input 140 is two, the number of second test point
For two, the number of the test resistance is also two.
In addition, in other embodiments of the invention, refer to Fig. 3, the pressing contact that the periphery cabling 110 electrically connects
120 connect film probe 271 to be correspondingly formed multiple first test points, the number of the film probe 271, first respectively
The number all same of the number of test point, the periphery cabling 110, so as to be obtained by Fig. 2 method, the measurement jig
Obtain multiple test resistance values, the corresponding periphery cabling 110 of each test resistance value, so as to precisely obtain each week
Whether side cabling 110 is breaking, so as to the convenient subsequently processing to breaking periphery cabling 110.
The embodiment of the present invention also provides a kind of test system of display panel, refers to Fig. 1 and Fig. 4, including above-mentioned display
The test circuit of panel；The test system also includes：
Opening unit 310, it is used for all to control by the control signal input 130 output high level signal
Thin film transistor (TFT) 150 is opened；
Test signal input block 320, it is used for brilliant via film by the test signal that second test point inputs
The input, output end of body pipe 150 and corresponding periphery cabling 110 reach the first test point；
Resistance test unit 330, it is used to test the test electricity obtained between the second test point and corresponding first test point
Resistance；
Judging unit 340, whether the difference that it is used to judge the test resistance value and standard electric resistance is in preset range
It is interior；
Processing unit 350, if it is yes that it, which is used for the judged result judged, obtain the week where the test resistance
The intact signal of side cabling 110, if the judged result judged is no, obtain the side periphery line where the test resistance
The signal of section open circuit.
In the present embodiment, the opening unit 310, the test signal input block 320, the resistance test unit
330th, judging unit 340 and processing unit 350 can be located on measurement jig 170.
In the present embodiment, the preset range be less than or equal to the standard electric resistance corresponding to 10%, such as
For the standard electric corresponding to the standard electric resistance corresponding to the standard electric resistance corresponding to 10%, 9%, 8%
Resistance, the 7% corresponding standard electric resistance, the 6% corresponding standard electric resistance, the 5% corresponding standard
Resistance, the 4% corresponding measuring resistance, the 3% corresponding measuring resistance, the 2% corresponding measuring resistance
Deng.
It should be noted that each embodiment in this specification is described by the way of progressive, each embodiment weight
Point explanation is all difference with other embodiments, between each embodiment identical similar part mutually referring to.
For device embodiment, because it is substantially similar to embodiment of the method, so description is fairly simple, related part referring to
The part explanation of embodiment of the method.
By the description of above-described embodiment, the present invention has advantages below：
Because the method for testing of the display panel includes：High level signal is accessed to corresponding by control signal input
Thin film transistor (TFT) to control the thin film transistor (TFT) to open；By the second test point input test signal via thin film transistor (TFT)
Input, output end and corresponding periphery cabling reach the first test point；Test obtains the second test point and the first test point
Between test resistance value；Whether within a preset range to judge the difference of the test resistance value and standard electric resistance；If it is,
The intact signal of periphery cabling corresponding to the test resistance is then obtained, if it is not, then obtaining the week corresponding to the test resistance
The signal of side cabling open circuit.It is whether breaking so as to obtain corresponding periphery cabling by test resistance value, subsequently enter one
Step can press flexible PCB onto the pressing contacts not being connected with those breaking periphery cablings, so as to prevent thing
The waste of material, cost can be reduced, and the narrow frame of display panel can be realized.
Above disclosure is only preferred embodiment of present invention, can not limit the right model of the present invention with this certainly
Enclose, therefore the equivalent variations made according to the claims in the present invention, still belong to the scope that the present invention is covered.
Claims (10)
1. a kind of method of testing of display panel, it is characterised in that the display panel includes：
A plurality of periphery cabling；
Multiple pressing contacts, it corresponds with the periphery cabling and electrically connected, its be used to being formed the first test point with test
Whether tool connection is breaking to test the periphery cabling；
Control signal input, it is used to access high level or low level；
At least one test signal input, it is used for input test signal, and it is used to form the second test point；
Multiple thin film transistor (TFT)s, its control terminal electrically connect with the control signal input, its output end correspond respectively with
The periphery cabling electrical connection, its input electrically connect with the second test point；The method of testing includes：
High level signal is exported to the corresponding thin film transistor (TFT) by the control signal input to control the film
Transistor is opened；
By the test signal that the second test point inputs via the input, output end of the thin film transistor (TFT) and corresponding described
Periphery cabling reaches the first test point；
Test obtains the test resistance value between the second test point and the first test point；
Whether within a preset range to judge the difference of the test resistance value and standard electric resistance；
If it is, the periphery cabling corresponding to the test resistance not breaking signal is obtained, if it is not, then obtaining the survey
Try the signal of the periphery cabling open circuit corresponding to resistance.
2. the method for testing of display panel as claimed in claim 1, it is characterised in that the number of first test point is one
Individual, multiple pressing contact short circuits form first test point.
3. the method for testing of display panel as claimed in claim 2, it is characterised in that the number of the test signal input
Mesh, the number of the second test point, the number all same of test resistance.
4. the method for testing of display panel as claimed in claim 1, it is characterised in that multiple pressing contacts connect respectively
Film probe is to be correspondingly formed multiple first test points.
5. the method for testing of display panel as claimed in claim 1, it is characterised in that the preset range be less than or equal to
The 10% corresponding standard electric resistance.
A kind of 6. test circuit of display panel, it is characterised in that including：
A plurality of periphery cabling；
Multiple pressing contacts, its electrical connection corresponding with the periphery cabling, its be used to being formed the first test point with measurement jig
Connect to test the periphery cabling；
Control signal input, it is used for incoming control signal；
At least one test signal input, it is used for input test signal, and the test signal input is used to form second
Test point；
Multiple thin film transistor (TFT)s, its control terminal electrically connect with the control signal input, its output end respectively correspond to it is described
Periphery cabling electrical connection, its input are used to electrically connect with the second test point；Wherein,
When the control signal input accesses high level, the thin film transistor (TFT) conducting, is inputted by second test point
Test signal reach the first test point via the input, output end and the corresponding periphery cabling of the thin film transistor (TFT)
To be tested.
7. the test circuit of display panel as claimed in claim 6, it is characterised in that the number of first test point is one
Individual, multiple pressing contact short circuits form first test point.
8. the test circuit of display panel as claimed in claim 6, it is characterised in that multiple pressing contacts connect respectively
Film probe is to be correspondingly formed multiple first test points.
9. a kind of test system of display panel, it is characterised in that including the display panel described in claim 6-8 any one
Test circuit；The test system also includes：
Opening unit, it is used to export high level signal by the control signal input to control all films brilliant
Body pipe is opened；
Test signal input block, the test signal that it is used to input by second test point is via the thin film transistor (TFT)
Input, output end and the corresponding periphery cabling reach the first test point；
Resistance test unit, it is used to test the test resistance value obtained between the second test point and corresponding first test point；
Judging unit, whether within a preset range it be used to judging the difference of the test resistance value and standard electric resistance；
Processing unit, if it is yes that it, which is used for the judged result judged, obtain the periphery where the test resistance
The intact signal of cabling, if the judged result judged is no, the side periphery line segment where obtaining the test resistance breaks
The signal on road.
10. the test system of display panel as claimed in claim 9, it is characterised in that the preset range is to be less than or wait
In 10% standard electric resistance.
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| CN201710881323.XA CN107591117A (en) | 2017-09-26 | 2017-09-26 | The method of testing and test system of display panel |
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| CN201710881323.XA Pending CN107591117A (en) | 2017-09-26 | 2017-09-26 | The method of testing and test system of display panel |
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| CN113396450A (en) * | 2019-11-29 | 2021-09-14 | 京东方科技集团股份有限公司 | Side routing resistance detection method of display substrate and display substrate |
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