CN103454794A - Lighting test fixture and liquid crystal display panel testing method - Google Patents
Lighting test fixture and liquid crystal display panel testing method Download PDFInfo
- Publication number
- CN103454794A CN103454794A CN201310404897XA CN201310404897A CN103454794A CN 103454794 A CN103454794 A CN 103454794A CN 201310404897X A CN201310404897X A CN 201310404897XA CN 201310404897 A CN201310404897 A CN 201310404897A CN 103454794 A CN103454794 A CN 103454794A
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- Prior art keywords
- liquid crystal
- sweep signal
- crystal panel
- lighting test
- conducting metal
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- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 61
- 238000012360 testing method Methods 0.000 title claims abstract description 54
- 239000002184 metal Substances 0.000 claims abstract description 36
- 229910052751 metal Inorganic materials 0.000 claims abstract description 36
- 238000009413 insulation Methods 0.000 claims abstract description 22
- 238000012545 processing Methods 0.000 claims abstract description 3
- 238000005259 measurement Methods 0.000 claims description 24
- 238000003825 pressing Methods 0.000 claims description 8
- 239000000463 material Substances 0.000 claims description 7
- 239000004020 conductor Substances 0.000 claims description 6
- 238000010998 test method Methods 0.000 claims description 6
- 229910052802 copper Inorganic materials 0.000 claims description 3
- 229910052737 gold Inorganic materials 0.000 claims description 3
- 230000007547 defect Effects 0.000 abstract description 38
- 238000000034 method Methods 0.000 description 16
- 210000004027 cell Anatomy 0.000 description 5
- 238000002360 preparation method Methods 0.000 description 4
- 239000010409 thin film Substances 0.000 description 4
- 210000002858 crystal cell Anatomy 0.000 description 3
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000007812 deficiency Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2203/00—Function characteristic
- G02F2203/69—Arrangements or methods for testing or calibrating a device
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- Engineering & Computer Science (AREA)
- Liquid Crystal (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
Abstract
The invention discloses a lighting test fixture which is used for light testing operation in the liquid crystal display panel processing. The lighting test fixture comprises a first conducting layer, a plurality of electric conduction metal parts and a plurality of insulation parts which are arrayed at intervals on the first conducting layer; the electric conduction metal parts are mutually electrically connected through the first conducting layer; the electric conduction metal parts are higher than the insulation parts. The invention also discloses a liquid crystal display panel lighting testing method which uses the test fixture. According to the lighting text fixture and the lighting testing method, the misjudgment rate of a lighting test is effectively reduced, and the condition that the detected defect is a real liquid crystal display panel defect or a test fixture defect can be rapidly identified.
Description
Technical field
The present invention relates to a kind of measurement jig, particularly a kind of measurement jig that carries out lighting test in the liquid crystal panel process, and the method for using this measurement jig to be tested liquid crystal panel.
Background technology
Liquid crystal display, or claim LCD(Liquid Crystal Display), be the display device of planar ultra-thin, it is comprised of colour or the monochrome pixels of some, is positioned over light source or reflecting surface the place ahead.The liquid crystal display power consumption is very low, and has high image quality, little, the lightweight characteristics of volume, and therefore extremely everybody favors, and becomes the main flow of display.Liquid crystal display is with thin film transistor (TFT) (Thin Film Transistor at present, TFT) liquid crystal display is main, and the making of general Thin Film Transistor-LCD can roughly be divided into three parts: thin film transistor (TFT) array (TFT Array) preparation process and color filter preparation engineering, liquid crystal display assembling (LC Cell Assembly) preparation process, LCD MODULE (Liquid Crystal Module, LCM) preparation process.
Liquid crystal panel, in the process of making, need to carry out a plurality of check programs, and one of them very important check program is exactly that the liquid crystal cell that cutting is completed is tested (Cell Test), confirms whether liquid crystal cell exists defect.This test process, before this to the liquid crystal panel input test signal, makes its pixel present color, whether well then by defect detecting device, observes one by one each pixel, and this process is called lighting test (Light-on Test).Factory is when producing in enormous quantities at present, in order to save cost, the lighting test modes that adopt short-circuiting bar (Shorting Bar) more, Shorting Bar lighting test mode generally can be interconnected to form a Date signal receiving end by all data-signals (Date) terminal, for sweep signal (Gate), the Gate signal terminal of odd-numbered line is interconnected to form to a Gate signal receiving end, the Gate signal terminal of even number line is interconnected to form to the 2nd Gate signal receiving end, this test mode cost is low, measurement jig is easily made, but the defect that can detect is less, and, because the quantity of signal terminal is a lot, the situation of loose contact may appear when terminal is interconnected, adopt Shorting Bar lighting test mode to exist that bad to be mistaken for liquid crystal panel bad by Shorting Bar peripheral wiring.
Therefore, the liquid crystal panel that adopts Shorting Bar lighting test mode defect to be detected generally can adopt the lighting test mode of 1G1D further to confirm, what this test mode was different from Shorting Bar mode is, the Gate signal is divided into to the sweep signal receiving end G1 of more groups, G2, Gn, as shown in Figure 1, the liquid crystal cell cut comprises liquid crystal panel zone 10 and pressing zone 20, be provided with a plurality of data-signal terminals 201 and a plurality of sweep signal terminal 202 on pressing zone 20, for data-signal and sweep signal being linked into to the pixel cell of liquid crystal panel, wherein, all data-signal terminals 201 are interconnected to form a Date signal receiving end D, sweep signal terminal 202 is divided into the sweep signal receiving end G1 of many groups, G2, Gn, each group sweep signal receiving end comprises 300～800 sweep signal terminals 202, generally can use at present a plane conducting resinl 30 that each group sweep signal terminal is interconnected.Adopt the plane conducting resinl to connect signal terminal and can exist loose contact to cause the problem of line simulator, have situation about judging by accident.
Summary of the invention
Deficiency in view of the prior art existence, the invention provides a kind of lighting test jig, and the method for using this measurement jig to be tested liquid crystal panel, can effectively reduce the False Rate of lighting test, confirm that rapidly detected defect is real liquid crystal panel defect or the defect of measurement jig.
To achieve these goals, the present invention has adopted following technical scheme:
A kind of lighting test jig, the lighting test operation for the liquid crystal panel processing technology comprises:
The first conductive layer;
Be arranged at a plurality of conducting metal sections and a plurality of insulation division that arrange space on described the first conductive layer, mutually be electrically connected by described the first conductive layer between described a plurality of conducting metal section; Wherein said conducting metal section is higher than described insulation division.
Preferably, the material of described the first conductive layer is conducting resinl.
Preferably, described conducting metal section is than the high 0～1mm of described insulation division.
Preferably, described conducting metal section and described insulation division are strip structure.
Preferably, between described a plurality of conducting metal section and there is respectively identical width between a plurality of insulation division.
Preferably, described conducting metal section has identical width with described insulation division.
Preferably, the material of described conducting metal section is the wear-resistant conductive material, and described wear-resistant conductive material is Cu or Au.
Another aspect of the present invention is to provide a kind of liquid crystal panel method of testing, and the method comprising the steps of:
(1) provide a liquid crystal panel, described liquid crystal panel comprises liquid crystal panel zone and pressing zone, be provided with a plurality of data-signal terminals and a plurality of sweep signal terminal on described pressing zone, for data-signal and sweep signal being linked into to the pixel cell of liquid crystal panel;
(2) all data-signal terminals are interconnected to form to a Date signal receiving end D, the receiving end of group sweep signal more than all sweep signal terminals are divided into G1, G2 ... Gn, each group sweep signal receiving end adopts measurement jig as above that sweep signal terminal wherein is electrically connected mutually, wherein, the conducting metal section in described measurement jig and described relative connection of sweep signal terminal;
(3) data-signal is input to described Date signal receiving end D, by sweep signal be input to sweep signal receiving end G1, G2 ... Gn, carry out lighting test to described liquid crystal panel.
Preferably, each group sweep signal terminal receiving end comprises 300～800 sweep signal terminals.
Preferably, the sweep signal in step (3) be input to one by one sweep signal receiving end G1, G2 ... in Gn.
The present invention can reduce the False Rate of lighting test effectively, confirms that rapidly detected defect is real liquid crystal panel defect or the defect of measurement jig.
The accompanying drawing explanation
Fig. 1 is existing a kind of schematic diagram that liquid crystal panel is carried out to lighting test, wherein adopts a plane conducting resinl that the sweep signal terminal is interconnected.
Fig. 2 is the front view of the measurement jig in one embodiment of the invention.
Fig. 3 is the vertical view of measurement jig as shown in Figure 2.
Embodiment
As previously mentioned, purpose of the present invention provides a kind of lighting test jig, and the method for using this measurement jig to be tested liquid crystal panel, and described lighting test jig comprises, the first conductive layer; And be arranged at a plurality of conducting metal sections and a plurality of insulation division that arrange space on described the first conductive layer, between described a plurality of conducting metal section, by described the first conductive layer, mutually be electrically connected; Wherein said conducting metal section is higher than described insulation division.Described lighting test jig can reduce the False Rate of lighting test effectively, confirms that rapidly detected defect is real liquid crystal panel defect or the defect of measurement jig.
Below will to using by reference to the accompanying drawings embodiment, the present invention will be further described.
Consult Fig. 2 and Fig. 3, the lighting test jig in the present embodiment comprises: the first conductive layer 401; And be arranged at a plurality of conducting metal sections 402 and a plurality of insulation division 403 that arrange space on described the first conductive layer 401, between described a plurality of conducting metal section 402, by described the first conductive layer 401, mutually be electrically connected; Wherein said conducting metal section 402 is higher than described insulation division 403, and wherein, described conducting metal section 402 is than the high 0～1mm of described insulation division 403.
Wherein, the material of described the first conductive layer 401 is conducting resinl, and the material of described conducting metal section 402 is the wear-resistant conductive material, and described wear-resistant conductive material can be Cu or Au; In this enforcement, the material of conducting metal section 402 is Cu.
Wherein, described conducting metal section 402 and described insulation division 403 are strip structure, between described a plurality of conducting metal section 402 and have identical width between a plurality of insulation division 403, further, described conducting metal section 402 has identical width with described insulation division 403.
The method of using measurement jig as above to carry out lighting test to liquid crystal panel comprises step:
(1) provide a liquid crystal panel, consult Fig. 1, described liquid crystal panel comprises liquid crystal panel zone 10 and pressing zone 20, be provided with a plurality of data-signal terminals 201 and a plurality of sweep signal terminal 202 on described pressing zone 20, for data-signal and sweep signal being linked into to the pixel cell of liquid crystal panel;
(2) all data-signal terminals are interconnected to form to a Date signal receiving end D, the receiving end of group sweep signal more than all sweep signal terminals are divided into G1, G2 ... Gn, each group sweep signal receiving end adopts measurement jig as above that sweep signal terminal 202 wherein is electrically connected mutually, wherein, the connection relative to described sweep signal terminal 202 of the conducting metal section 402 in described measurement jig;
(3) data-signal is input to described Date signal receiving end D, by sweep signal be input to sweep signal receiving end G1, G2 ... Gn, carry out lighting test to described liquid crystal panel.
When liquid crystal panel zone corresponding to a certain spot scan signal terminal wherein being detected and defect occurs, provide the lighting test jig dislocation to connect the present embodiment, if defect point is not followed the movement of measurement jig and is moved, and illustrates that this defect point is real liquid crystal panel defect; If defect point moves along with the movement of measurement jig, illustrate that this defect point is not real liquid crystal panel defect.Take sweep signal receiving end G1 is tested as example, suppose when testing for the first time, the 10th conducting metal section of lighting test jig is connected with the 10th the sweep signal terminal of sweep signal receiving end G1, finds that defect appears in the 10th liquid crystal panel zone corresponding to sweep signal terminal; Now the lighting test jig dislocation is connected, the 10th conducting metal section of lighting test jig is connected with the 15th the sweep signal terminal of sweep signal receiving end G1, if defect point is not followed the movement of measurement jig and is moved, still be shown as the 10th liquid crystal panel zone corresponding to sweep signal terminal and defect occurs, illustrate that this defect point is real liquid crystal panel defect; If defect point moves along with the movement of measurement jig, be shown as the 15th liquid crystal panel zone corresponding to sweep signal terminal and defect occurs, illustrate that this defect point is not real liquid crystal panel defect.The process that dislocation connect to be confirmed can repeat repeatedly, and thus, the lighting test jig that the present embodiment provides and method of testing, can confirm that detected defect is real liquid crystal panel defect or the defect of measurement jig rapidly.
Wherein, each group sweep signal terminal receiving end comprises 300～800 sweep signal terminals 202.
Wherein, the sweep signal in step (3) be input to one by one sweep signal receiving end G1, G2 ... in Gn.
The present invention can reduce the False Rate of lighting test effectively, confirms that rapidly detected defect is real liquid crystal panel defect or the defect of measurement jig.
It should be noted that, in this article, relational terms such as the first and second grades only is used for an entity or operation are separated with another entity or operational zone, and not necessarily requires or imply between these entities or operation the relation of any this reality or sequentially of existing.And, term " comprises ", " comprising " or its any other variant are intended to contain comprising of nonexcludability, thereby make the process, method, article or the equipment that comprise a series of key elements not only comprise those key elements, but also comprise other key elements of clearly not listing, or also be included as the intrinsic key element of this process, method, article or equipment.In the situation that not more restrictions, the key element limited by statement " comprising ... ", and be not precluded within process, method, article or the equipment that comprises described key element and also have other identical element.
The above is only the application's embodiment; it should be pointed out that for those skilled in the art, under the prerequisite that does not break away from the application's principle; can also make some improvements and modifications, these improvements and modifications also should be considered as the application's protection domain.
Claims (10)
1. a lighting test jig, the lighting test operation for the liquid crystal panel processing technology, is characterized in that, comprising:
The first conductive layer (401);
Be arranged at a plurality of conducting metal sections (402) and a plurality of insulation division (403) that arrange the space on described the first conductive layer (401), mutually be electrically connected by described the first conductive layer (401) between described a plurality of conducting metal sections (402); Wherein said conducting metal section (402) is higher than described insulation division (403).
2. lighting test jig according to claim 1, is characterized in that, the material of described the first conductive layer (401) is conducting resinl.
3. lighting test jig according to claim 1, is characterized in that, described conducting metal section (402) is than the high 0～1mm of described insulation division (403).
4. lighting test jig according to claim 1, is characterized in that, described conducting metal section (402) and described insulation division (403) are strip structure.
5. lighting test jig according to claim 4, is characterized in that, between described a plurality of conducting metal sections (402) and between a plurality of insulation division (403), has respectively identical width.
6. lighting test jig according to claim 5, is characterized in that, described conducting metal section (402) has identical width with described insulation division (403).
7. lighting test jig according to claim 1, is characterized in that, the material of described conducting metal section (402) is the wear-resistant conductive material, and described wear-resistant conductive material is Cu or Au.
8. a liquid crystal panel method of testing, is characterized in that, comprises step:
(1) provide a liquid crystal panel, described liquid crystal panel comprises liquid crystal panel zone (10) and pressing zone (20), be provided with a plurality of data-signal terminals (201) and a plurality of sweep signal terminal (202) on described pressing zone (20), for data-signal and sweep signal being linked into to the pixel cell of liquid crystal panel;
(2) all data-signal terminals are interconnected to form to a Date signal receiving end D, the receiving end of group sweep signal more than all sweep signal terminals are divided into G1, G2 ... Gn, each group sweep signal receiving end adopts measurement jig as described as claim 1-7 that sweep signal terminal (202) wherein is electrically connected mutually, wherein, the connection relative to described sweep signal terminal (202) of the conducting metal section (402) in described measurement jig;
(3) data-signal is input to described Date signal receiving end D, by sweep signal be input to sweep signal receiving end G1, G2 ... Gn, carry out lighting test to described liquid crystal panel.
9. liquid crystal panel method of testing according to claim 8, is characterized in that, each group sweep signal terminal receiving end comprises 300～800 sweep signal terminals (202).
10. liquid crystal panel method of testing according to claim 8, is characterized in that, the sweep signal in step (3) be input to one by one sweep signal receiving end G1, G2 ... in Gn.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310404897.XA CN103454794B (en) | 2013-09-06 | 2013-09-06 | Lighting test jig and liquid crystal panel method of testing |
| PCT/CN2013/083367 WO2015032106A1 (en) | 2013-09-06 | 2013-09-12 | Light-on test fixture, and testing method for liquid crystal panel |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310404897.XA CN103454794B (en) | 2013-09-06 | 2013-09-06 | Lighting test jig and liquid crystal panel method of testing |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103454794A true CN103454794A (en) | 2013-12-18 |
| CN103454794B CN103454794B (en) | 2016-06-08 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201310404897.XA Expired - Fee Related CN103454794B (en) | 2013-09-06 | 2013-09-06 | Lighting test jig and liquid crystal panel method of testing |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN103454794B (en) |
| WO (1) | WO2015032106A1 (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106814478A (en) * | 2016-01-27 | 2017-06-09 | 北京瑞荣达电子技术有限公司 | Method for positioning of probe and system during liquid crystal panel lighting test |
| CN107564446A (en) * | 2017-09-30 | 2018-01-09 | 深圳市华星光电半导体显示技术有限公司 | A kind of panel lighting machine, panel lighting test system and method for testing |
| CN109916595A (en) * | 2019-03-27 | 2019-06-21 | 京东方科技集团股份有限公司 | A kind of lighting jig and big visual angle optical testing device |
| CN113077726A (en) * | 2021-03-23 | 2021-07-06 | 深圳市华星光电半导体显示技术有限公司 | Display panel and preparation method thereof |
| CN115167021A (en) * | 2022-08-05 | 2022-10-11 | 苏州华星光电技术有限公司 | Detection method and detection device for display panel |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110262097A (en) * | 2019-07-01 | 2019-09-20 | 苏州精濑光电有限公司 | A kind of lighting jig leans on position mechanism |
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| EP0066087A1 (en) * | 1981-05-26 | 1982-12-08 | International Business Machines Corporation | Inspection of unsintered single layer or multilayer ceramics using a broad area electrical contacting structure |
| JPS61250906A (en) * | 1985-04-26 | 1986-11-08 | ジェイエスアール株式会社 | Conductive elastomer sheet |
| US6144216A (en) * | 1995-04-01 | 2000-11-07 | Enplas Corporation | Electric contact apparatus for inspecting a liquid crystal display panel |
| CN201138366Y (en) * | 2008-01-10 | 2008-10-22 | 环国科技股份有限公司 | Panel test structure |
| CN102681227A (en) * | 2012-05-30 | 2012-09-19 | 深圳市华星光电技术有限公司 | Detection method for liquid crystal display panel |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| AU2003211368A1 (en) * | 2002-03-07 | 2003-09-16 | Jsr Corporation | Anisotropic conductive connector and its production method, and circuit device test instrument |
-
2013
- 2013-09-06 CN CN201310404897.XA patent/CN103454794B/en not_active Expired - Fee Related
- 2013-09-12 WO PCT/CN2013/083367 patent/WO2015032106A1/en active Application Filing
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0066087A1 (en) * | 1981-05-26 | 1982-12-08 | International Business Machines Corporation | Inspection of unsintered single layer or multilayer ceramics using a broad area electrical contacting structure |
| EP0066087B1 (en) * | 1981-05-26 | 1985-09-04 | International Business Machines Corporation | Inspection of unsintered single layer or multilayer ceramics using a broad area electrical contacting structure |
| JPS61250906A (en) * | 1985-04-26 | 1986-11-08 | ジェイエスアール株式会社 | Conductive elastomer sheet |
| US6144216A (en) * | 1995-04-01 | 2000-11-07 | Enplas Corporation | Electric contact apparatus for inspecting a liquid crystal display panel |
| CN201138366Y (en) * | 2008-01-10 | 2008-10-22 | 环国科技股份有限公司 | Panel test structure |
| CN102681227A (en) * | 2012-05-30 | 2012-09-19 | 深圳市华星光电技术有限公司 | Detection method for liquid crystal display panel |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106814478A (en) * | 2016-01-27 | 2017-06-09 | 北京瑞荣达电子技术有限公司 | Method for positioning of probe and system during liquid crystal panel lighting test |
| CN107564446A (en) * | 2017-09-30 | 2018-01-09 | 深圳市华星光电半导体显示技术有限公司 | A kind of panel lighting machine, panel lighting test system and method for testing |
| CN109916595A (en) * | 2019-03-27 | 2019-06-21 | 京东方科技集团股份有限公司 | A kind of lighting jig and big visual angle optical testing device |
| CN109916595B (en) * | 2019-03-27 | 2021-01-22 | 京东方科技集团股份有限公司 | Lighting fixture and large-visual-angle optical testing device |
| CN113077726A (en) * | 2021-03-23 | 2021-07-06 | 深圳市华星光电半导体显示技术有限公司 | Display panel and preparation method thereof |
| CN113077726B (en) * | 2021-03-23 | 2022-06-10 | 深圳市华星光电半导体显示技术有限公司 | Display panel and preparation method thereof |
| CN115167021A (en) * | 2022-08-05 | 2022-10-11 | 苏州华星光电技术有限公司 | Detection method and detection device for display panel |
| CN115167021B (en) * | 2022-08-05 | 2023-07-25 | 苏州华星光电技术有限公司 | Display panel detection method and detection device |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2015032106A1 (en) | 2015-03-12 |
| CN103454794B (en) | 2016-06-08 |
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Granted publication date: 20160608 |