CN106054474A - Liquid crystal display panel and liquid crystal display panel circuit monitoring method - Google Patents
Liquid crystal display panel and liquid crystal display panel circuit monitoring method Download PDFInfo
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- CN106054474A CN106054474A CN201610368448.8A CN201610368448A CN106054474A CN 106054474 A CN106054474 A CN 106054474A CN 201610368448 A CN201610368448 A CN 201610368448A CN 106054474 A CN106054474 A CN 106054474A
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136286—Wiring, e.g. gate line, drain line
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136254—Checking; Testing
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Mathematical Physics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Liquid Crystal (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
The invention provides a liquid crystal display panel and a liquid crystal display panel circuit monitoring method. A TFT array substrate is additionally provided with a CF common electrode testing pad and a monitoring test pad, and the method can determine whether there is a short circuit fault between a non-COM signal WOA region line and an upper board CF_COM or not according to the monitored resistance and current differences between the CF common electrode testing pad and the monitoring test pad. Once there is the short circuit fault, caused by the PV damages, between the non-COM signal WOA region line and the upper board CF_COM, a piece with a problem can be intercepted, so as to prevent the piece from flowing to a next process and causing the waste of materials and yield, thereby improving the production efficiency, reducing the production cost, and improving the quality of the liquid crystal display panel. Moreover, after the testing of the liquid crystal display panel, the joint of a circuit set in a short circuit rod region with the circuits (a CF common electrode lead and a lead in an array external wiring region) is cut off through laser, and the liquid crystal display panel can operate normally later.
Description
Technical field
The present invention relates to field of liquid crystal display, especially relate to one and can monitor not common electrode WOA cabling and CF_
Display panels the most short-circuit between COM and display panels path monitoring method.
Background technology
Display panels is the topmost element of liquid crystal display, the structure of common display panels be by
One colored filter (Color Filter, CF) substrate, a thin film transistor (TFT) (Thin Film Transistor, TFT) array
The liquid crystal layer (Liquid Crystal Layer) that substrate and is configured between two substrates is constituted, and its operation principle is logical
Cross on two panels glass substrate apply driving voltage to control the rotation of the liquid crystal molecule of liquid crystal layer, by backlight module provide light
Line reflects generation image.The manufacture of display panels comprises array (array) processing procedure, panel (panel) processing procedure and mould
Block (module) processing procedure, each processing procedure can carry out testing to get rid of defective products after terminating.Counter plate internal wiring detects, and
Time pinpoint the problems and repair, this process is referred to as panel test (Cell Test).In order to reduce faceplate section display panels
The difficulty of picture detection and reduce cost of equipment, one of method known to current industry is to use shorting bar (short-circuit rods)
Mode.Outside being provided with on the tft array substrate of display panels with connection to be tested on viewing area and CF substrate
Enclose measurement circuit.When carrying out panel test, it will usually short-circuit rods is set on tft array substrate by circuit to be tested respectively
Short circuit, is then electrically connected by corresponding testing cushion, completes test assignment.
It is said that in general, in order to make upper and lower base plate public electrode (COM) current potential consistent, typically can be at the CF of tft array substrate
Beat multiple gold size point on public electrode (CF_COM) lead-in wire, and turn on for upper and lower base plate current potential at the place's of getting ready coating gold size.This
Gold size coating separately need to be carried out with sealed plastic box (Seal) coating, and the activity duration is longer, and production capacity loss (loss) is bigger.At present, Au-
In-Seal (gold size mixes coating with sealed plastic box) technology can be greatly decreased the activity duration because of it, and minimizing causes because of Au point glue
Whirl coating short circuit (short) problem and increasingly favored by industry.But this technology also brings some hidden danger and risk, example simultaneously
As connected up (Wire on array, WOA) outside the non-COM signal array on tft array substrate between district's cabling and upper plate CF_COM
Short circuit problem.WOA district cabling is many, densely distributed, walks line impedence to effectively reduce, and alleviates the frauds such as RC delay and undercharge
End, this region cabling is typically designed as double-layer metal structure.The outer wiring region film layer structure of existing array is as it is shown in figure 1, up and down
It is SiNx protective layer 13 between substrate M1, M2, is topmost PV protective layer 14.In Au-in-Seal technology application process, as
Really the PV floor in the WOA district of sealed plastic box process once damages, and easily causes the short circuit between WOA district cabling and upper plate CF_COM to ask
Topic, thus cause and the most seriously show that (between such as constant voltage high level VGH and CF_COM, short circuit can cause big electric current to burn to abnormal problem
Screen).
In order to prevent defective products from flowing into client, reduce the wasting of resources in factory, non-COM during Au-in-Seal is believed
Number between WOA district cabling and upper plate CF_COM short circuit problem prevent become particularly important with monitoring.
Summary of the invention
It is an object of the invention to, it is provided that a kind of display panels and display panels path monitoring method, monitoring
During Au-in-Seal, the non-COM signal WOA district cabling caused because non-COM signal WOA district PV is damaged and upper plate CF_
Short circuit between COM, while promoting display panels quality, improves production efficiency, reduces production cost.
For achieving the above object, the invention provides a kind of display panels, including tft array substrate and CF substrate,
Described tft array substrate is provided with: a plurality of CF public electrode lead-in wire and many strip arrays outer wiring region lead-in wire, described a plurality of CF is public
Contact conductor is corresponding with the CF public electrode on described CF substrate, described many strip arrays outer wiring region lead-in wire and described tft array
Not common electrode signal array on substrate outer wiring region cabling is corresponding；Connect up short outside one CF public electrode short-circuit rods and an array
Road bar, described a plurality of CF public electrode lead-in wire is electrically connected at described CF public electrode short-circuit rods, connects up outside described many strip arrays
District's lead-in wire is electrically connected at the outer short-circuit bar of described array；One CF public electrode testing cushion and a monitoring and test pad, described CF
Public electrode testing cushion is electrically connected at described CF public electrode short-circuit rods, and described monitoring and test pad is electrically connected at described array
Outer short-circuit bar；By monitoring electric current, the difference of resistance between described CF public electrode testing cushion and described monitoring and test pad, sentence
Whether short circuit between the cabling of the outer wiring region of disconnected described not common electrode signal array and described CF public electrode.
For achieving the above object, present invention also offers a kind of display panels path monitoring method, described liquid crystal
Show that panel includes tft array substrate and CF substrate；Comprise the steps: that (1) arranges a CF on described tft array substrate public
Electric pole short circuit bar and the outer short-circuit bar of an array, by a plurality of CF common electrical corresponding with the CF public electrode on described CF substrate
Pole lead-in wire be electrically connected at described CF public electrode short-circuit rods, by with the not common electrode signal battle array on described tft array substrate
Arrange many strip arrays corresponding to outer wiring region cabling outer wiring region lead-in wire and be electrically connected at the outer short-circuit bar of described array；(2) exist
One CF public electrode testing cushion and a monitoring and test pad, described CF public electrode testing cushion electricity are set on described tft array substrate
Property be connected to described CF public electrode short-circuit rods, described monitoring and test pad is electrically connected at the outer short-circuit bar of described array；(3)
Monitor electric current, the difference of resistance between described CF public electrode testing cushion and described monitoring and test pad, it is judged that described not common electrode
Signal array is outer the most short-circuit between wiring region cabling and CF public electrode.
It is an advantage of the current invention that display panels and display panels path monitoring method that the present invention provides,
By setting up CF public electrode testing cushion and monitoring and test pad, according to the CF public electrode testing cushion monitored and monitoring and test pad
Between resistance, current difference, it is possible to determine that whether short circuit between non-COM signal WOA district's cabling and upper plate CF_COM.Once find because of non-
Short circuit between COM signal WOA district PV is damaged and causes non-COM signal WOA district's cabling and upper plate CF_COM, can block problem sheet
Cut, in case fluid stopping enters subsequent processing, cause material and production capacity waste, thus improve production efficiency, reduce production cost, simultaneously
Promote display panels quality.And after display panels is completed, utilize laser by CF public electrode lead-in wire and array
The circuits such as outer wiring region lead-in wire cut off with the join of corresponding short circuit bar, and display panels is follow-up still can normally be shown.
Accompanying drawing explanation
Fig. 1, existing array outer wiring region film layer structure schematic diagram；
Fig. 2, the structural representation of display panels one embodiment of the present invention.
Detailed description of the invention
The display panels and the display panels path monitoring method that there is provided the present invention below in conjunction with the accompanying drawings are done in detail
Describe in detail bright.
With reference to Fig. 2, the structural representation of display panels one embodiment of the present invention.Described LCD
Plate includes tft array substrate 201 and CF substrate 202, and described tft array substrate 201 is provided with: a plurality of CF public electrode goes between
(CF_COM Lead) 221 and many strip arrays outer wiring region lead-in wire (non-COM signal WOA Lead) 222, a CF public electrode short circuit
Bar (CF_COM shorting bar) 241 and the outer short-circuit bar (WOA shorting bar) 242 of an array, and, a CF
Public electrode testing cushion (CF_COM Pad) 261 and a monitoring and test pad (Detect Pad) 262.
Wherein, tft array substrate 201 is provided with to be measured with on liquid crystal panel viewing area (not shown) and CF substrate 202
The peripheral test line areas of examination connection.Peripheral test line areas includes module chip on film (COF) crimp region 22, a plurality of
Short-circuit rods and panel test pad district 26.Module is located at by a plurality of CF public electrode lead-in wire 221 and many strip arrays outer wiring region lead-in wire 222
Chip on film crimp region 22；Panel test pad district 26 is located at by CF public electrode testing cushion 261 and monitoring and test pad 262；CF is public
Common electrode short-circuit rods 241 and the outer short-circuit bar 242 of array are located at module chip on film crimp region 22 and panel test pad district
26 is peripheral.
A plurality of CF public electrode lead-in wire 221 is corresponding with the CF public electrode on CF substrate 201, and the outer wiring region of many strip arrays is drawn
Line 222 is corresponding with the outer wiring region of the not common electrode signal array on tft array substrate 202 cabling.A plurality of CF public electrode draws
Line 221 is all electrically connected at CF public electrode short-circuit rods 241, and many strip arrays outer wiring region lead-in wire 222 is all electrically connected at array
Outer short-circuit bar 242.CF public electrode testing cushion 261 is electrically connected at CF public electrode short-circuit rods 241, monitoring and test pad
262 are electrically connected at the outer short-circuit bar 242 of array.By between monitoring CF public electrode testing cushion 261 and monitoring and test pad 262
Electric current, the difference of resistance, it is judged that the most short-circuit between the cabling of the outer wiring region of not common electrode signal array and CF public electrode.Tool
Body is: be shorted together by a plurality of CF public electrode lead-in wire 221 employing CF public electrode short-circuit rods 241 by CF_COM, and even
It is connected to CF public electrode testing cushion 261；By non-COM signal WOA district cabling by many strip arrays outer wiring region lead-in wire 222 employing battle array
Arrange outer short-circuit bar 242 to be shorted together, and be connected to monitoring and test pad 262；If monitoring CF public electrode testing cushion 261
And between monitoring and test pad 262, resistance the least (less than predetermined threshold value) or electric current are very big (more than predetermined threshold value), then can be determined that
Non-COM signal WOA district cabling has at least one cabling and upper plate CF_COM short circuit.Once find short circuit, can be by problem sheet
Intercept, in case fluid stopping enters subsequent processing, cause material and production capacity waste.
After display panels is completed, CF public electrode short-circuit rods 241 and the outer short-circuit bar 242 of an array exist
By laser cutting, (that is, utilization swashs in laser cutting (Laser cut) region 27 between tft array substrate 201 and CF substrate 202
The join of all short-circuit rods and the circuit such as CF public electrode lead-in wire and array outer wiring region lead-in wire is cut off by light), liquid crystal display
Panel is follow-up still can normally be shown.
In the present embodiment, it is illustrated that Pad such as " A/B/C " is general Pad during panel test section shorting bar test,
It is red line testing cushion (Red Pad), green line testing cushion (Green Pad), blue line testing cushion (Blue in data wire (Source) side
Pad)；It is odd number testing cushion (Odd Pad), even number testing cushion (Even Pad), simulation common port survey in scan line (Gate) side
Examination pad (Acom Pad)；CF_com is the test Pad drawn on CF_com Lead on COF；Detect is non-COM on COF
The test Pad drawn on signal WOA Lead.
Particularly as follows: be additionally provided with on the tft array substrate 201 of described display panels: a plurality of welding lead (is located at mould
Block chip on film crimp region 22), a plurality of short-circuit rods, multiple panel test pads (be located at as shown panel test pad district 26 A,
Tri-testing cushion of B, C).
When a plurality of welding lead is many data with all data wires in liquid crystal panel viewing area to short-circuit rods a plurality of time corresponding
Line short-circuit rods；The most corresponding a plurality of data lines short-circuit rods that is electrically connected at of a plurality of welding lead corresponding with all data wires is many
Individual panel test pad correspondence respectively is electrically connected at a plurality of data lines short-circuit rods.
Particularly as follows: all data wires are divided into red data line, green data line and blue data line；All red datas
The most a plurality of first welding lead 223 drawn by line, and all green data line draw the most a plurality of second welding lead 224,
The most a plurality of 3rd welding lead 225 drawn by all blue data lines.Accordingly, a plurality of data lines short-circuit rods includes: one
One data wire short-circuit rods 243, is electrically connected at all first welding corresponding with all red data line in all data wires and draws
Line 223；One second data wire short-circuit rods 244, is electrically connected at own corresponding with all green data line in all data wires
Second welding lead 224；One the 3rd data wire short-circuit rods 245, is electrically connected at all blue data lines with all data wires
Corresponding all 3rd welding leads 225.Accordingly, multiple panel test pads include: a red line testing cushion 263, are electrically connected with
In the first data wire short-circuit rods 243；One green line testing cushion 264, is electrically connected at the second data wire short-circuit rods 244；One blue line is surveyed
Examination pad 265, is electrically connected at the 3rd data wire short-circuit rods 245.
When a plurality of welding lead is multi-strip scanning with all scan lines in liquid crystal panel viewing area to short-circuit rods a plurality of time corresponding
Line short-circuit rods；The most corresponding multi-strip scanning line short-circuit rods that is electrically connected at of a plurality of welding lead corresponding with all scan lines is many
Individual panel test pad correspondence respectively is electrically connected at multi-strip scanning line short-circuit rods.
Particularly as follows: all scan lines are divided into odd-numbered scan lines, even-line interlace line and simulation common port；All odd scan
The most a plurality of first welding lead 223 drawn by line, and the most a plurality of second welding lead 224 drawn by all even-line interlace lines,
The most a plurality of 3rd welding lead 225 drawn by all simulation common ports.Accordingly, multi-strip scanning line short-circuit rods includes: one
Scan line short-circuit rods 243, is electrically connected at all first welding corresponding with all odd-numbered scan lines in all scan lines and draws
Line 223；One second scan line short-circuit rods 244, is electrically connected at corresponding the owning of even-line interlace line all with all scan lines
Second welding lead 224；One three scan line short-circuit rods 245, is electrically connected at corresponding with simulation common port in all scan lines
All 3rd welding leads 225.Accordingly, multiple panel test pads include: an odd number testing cushion 263, are electrically connected at
Scan line short-circuit rods 243；One even number testing cushion 264, is electrically connected at the second scan line short-circuit rods 244；One simulation common port
Testing cushion 265, is electrically connected at three scan line short-circuit rods 245.
After display panels is completed, the first data wire short-circuit rods, the second data wire short-circuit rods and the 3rd data wire
Short-circuit rods, or, the first scan line short-circuit rods, the second scan line short-circuit rods and three scan line short-circuit rods are the most all in laser cutting district
Territory 27 is by laser cutting (that is, utilizing laser to be cut off by the join of the circuit such as scan line or data wire with corresponding short-circuit rods), liquid
LCD panel is follow-up still can normally be shown.
Described display panels includes between tft array substrate and CF substrate.Described display panels circuit
Monitoring method comprises the steps: S31: arrange on described tft array substrate outside a CF public electrode short-circuit rods and an array
Short-circuit bar, is electrically connected at described by a plurality of CF public electrode lead-in wire corresponding with the CF public electrode on described CF substrate
CF public electrode short-circuit rods, by corresponding with the outer wiring region of the not common electrode signal array on described tft array substrate cabling
Many strip arrays outer wiring region lead-in wire is electrically connected at the outer short-circuit bar of described array；S32: arrange one on tft array substrate
CF public electrode testing cushion and a monitoring and test pad, CF public electrode testing cushion is electrically connected at CF public electrode short-circuit rods, prison
Survey testing cushion and be electrically connected at the outer short-circuit bar of array；S33: electricity between monitoring CF public electrode testing cushion and monitoring and test pad
Stream, the difference of resistance, it is judged that not common electrode signal array is outer the most short-circuit between wiring region cabling and CF public electrode.Wherein,
The execution of step S31 and step S32 is without sequencing.
Particularly as follows: use CF public electrode short-circuit rods to be shorted together by a plurality of CF public electrode lead-in wire CF_COM,
And it is connected to CF public electrode testing cushion；Non-COM signal WOA district cabling is used array by many strip arrays outer wiring region lead-in wire
Outer short-circuit bar is shorted together, and is connected to monitoring and test pad；If monitoring CF public electrode testing cushion and monitoring and test
Between pad, resistance the least (less than predetermined threshold value) or electric current are very big (more than predetermined threshold value), then can be determined that non-COM signal WOA district
Cabling has at least one cabling and upper plate CF_COM short circuit.Once find short circuit, problem sheet can be intercepted, in case fluid stopping enters
Subsequent processing, causes material and production capacity waste.
After display panels is completed, utilize laser by lines such as CF public electrode lead-in wire and array outer wiring region lead-in wires
Road cuts off with the join of corresponding short circuit bar, and display panels is follow-up still can normally be shown.That is, liquid crystal of the present invention
Display floater path monitoring method farther includes after step S33, S34: after LCD board test terminates, and utilizes
The join of all short-circuit rods with respective lead is cut off by laser.
The above is only the preferred embodiment of the present invention, it is noted that for the ordinary skill people of the art
Member, under the premise without departing from the principles of the invention, it is also possible to make some improvements and modifications, these improvements and modifications also should be regarded as
Protection scope of the present invention.
Claims (10)
1. a display panels, including tft array substrate and CF substrate, it is characterised in that set on described tft array substrate
Have:
A plurality of CF public electrode lead-in wire and many strip arrays outer wiring region lead-in wire, described a plurality of CF public electrode lead-in wire and described CF base
CF public electrode on plate is corresponding, described many strip arrays outer wiring region lead-in wire and the not common electrode on described tft array substrate
Signal array outer wiring region cabling is corresponding；
One CF public electrode short-circuit rods and the outer short-circuit bar of an array, described a plurality of CF public electrode lead-in wire is electrically connected at institute
Stating CF public electrode short-circuit rods, described many strip arrays outer wiring region lead-in wire is electrically connected at the outer short-circuit bar of described array；
One CF public electrode testing cushion and a monitoring and test pad, it is public that described CF public electrode testing cushion is electrically connected at described CF
Electric pole short circuit bar, described monitoring and test pad is electrically connected at the outer short-circuit bar of described array；
By monitoring electric current, the difference of resistance between described CF public electrode testing cushion and described monitoring and test pad, it is judged that described non-
Whether short circuit between the cabling of the outer wiring region of common electrode signal array and described CF public electrode.
2. display panels as claimed in claim 1, it is characterised in that if monitor described CF public electrode testing cushion with
Between described monitoring and test pad, resistance is more than predetermined threshold value less than predetermined threshold value or electric current, then judge described not common electrode signal
Array outer wiring region cabling has at least one cabling and the short circuit of described CF public electrode.
3. display panels as claimed in claim 1, it is characterised in that be additionally provided with on described tft array substrate:
A plurality of welding lead, described a plurality of welding lead is corresponding with all data wires in liquid crystal panel viewing area；
A plurality of data lines short-circuit rods, described a plurality of welding lead correspondence respectively is electrically connected at described a plurality of data lines short-circuit rods；
Multiple panel test pads, the plurality of panel test pad correspondence respectively is electrically connected at described a plurality of data lines short-circuit rods.
4. display panels as claimed in claim 3, it is characterised in that
Described a plurality of data lines short-circuit rods includes: one first data wire short-circuit rods is electrically connected at all red with all data wires
All first welding leads that color data wire is corresponding, one second data wire short-circuit rods is electrically connected at all with all data wires
All second welding leads that green data line is corresponding, one the 3rd data wire short-circuit rods is electrically connected at and institute in all data wires
There are all 3rd welding leads that blue data line is corresponding；
The plurality of panel test pad includes: a red line testing cushion is electrically connected at described first data wire short-circuit rods, a green line
Testing cushion is electrically connected at described second data wire short-circuit rods, and a blue line testing cushion is electrically connected at described 3rd data wire short circuit
Bar.
5. display panels as claimed in claim 1, it is characterised in that described tft array substrate and described CF substrate it
Between also include:
A plurality of welding lead, described a plurality of welding lead is corresponding with all scan lines in liquid crystal panel viewing area；
Multi-strip scanning line short-circuit rods, described a plurality of welding lead correspondence respectively is electrically connected at described multi-strip scanning line short-circuit rods；
Multiple panel test pads, the plurality of panel test pad correspondence respectively is electrically connected at described multi-strip scanning line short-circuit rods.
6. display panels as claimed in claim 5, it is characterised in that
Described multi-strip scanning line short-circuit rods includes: one first scan line short-circuit rods is electrically connected at odd with institute in all scan lines
All first welding leads that number scan line is corresponding, one second scan line short-circuit rods is electrically connected at all with all scan lines
All second welding leads that even-line interlace line is corresponding, a three scan line short-circuit rods is electrically connected at and all scan line middle molds
Intend all 3rd welding leads that common port is corresponding；
The plurality of panel test pad includes: an odd number testing cushion is electrically connected at described first scan line short-circuit rods；One even number
Testing cushion is electrically connected at described second scan line short-circuit rods；One simulation common port testing cushion is electrically connected at described 3rd scanning
Line short-circuit rods.
7. the display panels as described in claim 1,3 or 5 any one, it is characterised in that all short-circuit rods are with corresponding
Lead-in wire join after LCD board test terminates by laser cutting.
8. a display panels path monitoring method, described display panels includes tft array substrate and CF substrate；Its
It is characterised by, comprises the steps:
(1) a CF public electrode short-circuit rods and the outer short-circuit bar of an array are set on described tft array substrate, will be with described
The a plurality of CF public electrode lead-in wire that CF public electrode on CF substrate is corresponding is electrically connected at described CF public electrode short-circuit rods, will
The many strip arrays outer wiring region lead-in wire corresponding with the outer wiring region of the not common electrode signal array on described tft array substrate cabling
It is electrically connected at the outer short-circuit bar of described array；
(2) a CF public electrode testing cushion and a monitoring and test pad, described CF public electrode are set on described tft array substrate
Testing cushion is electrically connected at described CF public electrode short-circuit rods, described monitoring and test pad be electrically connected at connect up outside described array short
Road bar；
(3) electric current, the difference of resistance between described CF public electrode testing cushion and described monitoring and test pad is monitored, it is judged that described non-public affairs
Common electrode signal array is outer the most short-circuit between wiring region cabling and CF public electrode.
9. display panels path monitoring method as claimed in claim 8, it is characterised in that step (3) farther includes:
If monitoring resistance between described CF public electrode testing cushion and described monitoring and test pad and being more than pre-less than predetermined threshold value or electric current
If threshold value, then judge that described not common electrode signal array outer wiring region cabling has at least one cabling and described CF common electrical
Extremely short road.
10. display panels path monitoring method as claimed in claim 8, it is characterised in that after step (3) further
Including: after LCD board test terminates, utilize laser to be cut off by the join of all short-circuit rods with respective lead.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610368448.8A CN106054474B (en) | 2016-05-27 | 2016-05-27 | Liquid crystal display panel and liquid crystal display panel path monitoring method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610368448.8A CN106054474B (en) | 2016-05-27 | 2016-05-27 | Liquid crystal display panel and liquid crystal display panel path monitoring method |
Publications (2)
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