CN106128342A - The detection method of array base palte, display device and array base palte - Google Patents
The detection method of array base palte, display device and array base palte Download PDFInfo
- Publication number
- CN106128342A CN106128342A CN201610471879.7A CN201610471879A CN106128342A CN 106128342 A CN106128342 A CN 106128342A CN 201610471879 A CN201610471879 A CN 201610471879A CN 106128342 A CN106128342 A CN 106128342A
- Authority
- CN
- China
- Prior art keywords
- holding wire
- array base
- detection
- unit
- described holding
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136254—Checking; Testing
Abstract
The invention provides the detection method of a kind of array base palte, display device and array base palte, this array base palte includes many signal line, also include with each described holding wire resistance unit one to one and with each described holding wire switch element one to one, first end of the resistance unit that the first end of each described holding wire is corresponding is connected, second end of each described holding wire is by corresponding switch element ground connection, and the second end of described resistance unit is used for applying to detect signal.The array base palte that the present invention provides, when the switching means conductive that each signal line is corresponding, each signal line switch element ground connection by its correspondence, now, can be by the second end of each resistance unit be applied detection signal such that it is able to judge whether each signal line exists damage or potential bad hidden danger.
Description
Technical field
The present invention relates to display field, particularly relate to the detection method of a kind of array base palte, display device and array base palte.
Background technology
Display panels includes that array base palte and color membrane substrates, array base palte and color membrane substrates to box and are filled wherein
Formation of liquid crystals liquid crystal panel.Generally, array base palte is provided with grid line, data wire equisignal line structure, but, work as battle array
The when of there is crackle or have little scope to corrode in the holding wire on row substrate, the liquid crystal display formed generally the most visually without
Method has observed that display is bad, but after long-time use, the defect on these signal lines may be exaggerated, and directly
Affect the use of display.
Summary of the invention
(1) to solve the technical problem that
The technical problem to be solved in the present invention is: provide a kind of array base palte, display device and the detection side of array base palte
Method, it is possible to realize the detection of holding wire in array substrate.
(2) technical scheme
For solving above-mentioned technical problem, technical scheme provides a kind of array base palte, including many signal line,
Also include and each described holding wire resistance unit one to one and opening one to one with each described holding wire
Closing unit, the first end of the resistance unit that the first end of each described holding wire is corresponding is connected, each described signal
Second end of line is by corresponding switch element ground connection, and the second end of described resistance unit is used for applying to detect signal.
Preferably, the control unit controlling each described switch element break-make is also included.
Preferably, also including detecting signal output unit, described control unit is connected with described detection signal output unit,
When described control unit controls each described switching means conductive, it is single that described control unit controls the output of described detection signal
Unit exports described detection signal to the second end of resistance unit each described.
Preferably, also include detector unit, for when described detection signal output unit is to resistance unit each described
The second end export after described detection signal, judge each by the magnitude of voltage of the first end of each described holding wire of detection
Described holding wire whether existing defects or the current value by each described holding wire of detection judge each described signal
Line whether existing defects.
Preferably, also include the driving chip being connected with each described holding wire, described driving chip include for
The display signal output unit of each described holding wire output display signal, when described control unit controls to open described in each
When closing unit disconnection, described control unit controls described display signal output unit and believes to each described holding wire output display
Number.
Preferably, described resistance unit, described detection signal output unit and described detector unit be integrated in described in drive
In dynamic chip.
Preferably, each described holding wire is grid line or data wire.
Preferably, the resistance value of the resistance unit that each described holding wire is corresponding is identical.
For solving above-mentioned technical problem, present invention also offers a kind of display device, including above-mentioned array base palte.
For solving above-mentioned technical problem, present invention also offers the detection method of a kind of array base palte, be used for detecting above-mentioned
Array base palte, described method includes:
Control each described switching means conductive, apply detection signal at the second end of resistance unit each described;
Judge whether each described holding wire exists by the magnitude of voltage of the first end of each described holding wire of detection
Defect or the current value by each described holding wire of detection judge each described holding wire whether existing defects.
Preferably, the resistance value of the resistance unit that each described holding wire is corresponding is identical, described in each of detection
The magnitude of voltage of the first end of holding wire judges whether existing defects includes each described holding wire:
The magnitude of voltage of the first end of a plurality of described holding wire of detection is averaged, by the first end of each signal line
Magnitude of voltage compares with described average, for each described holding wire, if the magnitude of voltage of its first end and described average
Difference in preset range, then judges normal, otherwise, it is determined that its existing defects.
Preferably, the resistance value of the resistance unit that each described holding wire is corresponding is identical, described in each of detection
The current value of holding wire judges whether existing defects includes each described holding wire:
The current value of a plurality of described holding wire of detection is averaged, by the current value of each described holding wire with described
Average compares, and for each described holding wire, if the difference of its current value and described average is in preset range, then sentences
Disconnected normal, otherwise, it is determined that its existing defects.
(3) beneficial effect
The array base palte that the present invention provides, when the switching means conductive that each signal line is corresponding, each signal line
By the switch element ground connection of its correspondence, at this point it is possible to by the second end of each resistance unit is applied detection signal, from
And can interpolate that whether each signal line exists damage or potential bad hidden danger.
Accompanying drawing explanation
Fig. 1 is the schematic diagram of a kind of array base palte that embodiment of the present invention provides;
Fig. 2 is the schematic diagram of the another kind of array base palte that embodiment of the present invention provides.
Detailed description of the invention
Below in conjunction with the accompanying drawings and embodiment, the detailed description of the invention of the present invention is described in further detail.Hereinafter implement
Example is used for illustrating the present invention, but is not limited to the scope of the present invention.
Embodiment of the present invention provides a kind of array base palte, including many signal line, also includes and each described letter
Number line resistance unit one to one and with each described holding wire switch element one to one, each described signal
First end of the resistance unit that the first end of line is corresponding is connected, and the second end of each described holding wire is by corresponding
Switch element ground connection, the second end of described resistance unit is used for applying detecting signal.
The array base palte that embodiment of the present invention provides, when the switching means conductive that each signal line is corresponding, each
The signal line switch element ground connection by its correspondence, at this point it is possible to by the second end of each resistance unit is applied inspection
Survey signal such that it is able to judge whether each signal line exists damage or potential bad hidden danger.
Such as, for the ease of being controlled switch element, each described switch element can be N-type metal-oxide-semiconductor or p-type
Metal-oxide-semiconductor, it is preferable that above-mentioned array base palte can also include the control unit controlling each described switch element break-make.
Such as, above-mentioned holding wire can be grid line (Gate line) or the data wire (Source of array base palte of array base palte
Line).
For the array base palte in display panels, between grid lines different on it under normal circumstances or different data
Resistance value difference between line is the least, and when a wherein signal line existing defects, its resistance value also can occur significant change, with
The difference of the resistance value of other uniformity signal lines also can become big, therefore, it can the resistance value by measurement signal line, and mutually than
Relatively, it can be determined that each signal line whether existing defects, for example, it is possible to make the electricity of resistance unit corresponding to each signal line
Resistance is identical, such that it is able to the magnitude of voltage of the first end by detecting each signal line judges whether each signal line exists
Defect or judge each signal line whether existing defects by detecting the current value of each signal line.
Preferably, above-mentioned array base palte can also include detecting signal output unit and detector unit;
Wherein, described control unit is connected with described detection signal output unit, when described control unit controls each
During described switching means conductive, described control unit controls described detection signal output unit to resistance unit each described
Second end exports described detection signal;
Detector unit is for exporting institute when described detection signal output unit to the second end of resistance unit each described
After stating detection signal, whether judge each described holding wire by the magnitude of voltage of the first end of each described holding wire of detection
Existing defects or the current value by each described holding wire of detection judge each described holding wire whether existing defects.
Preferably, above-mentioned array base palte also includes the driving chip being connected with each signal line, described driving chip
Including for the display signal output unit to each described holding wire output display signal, when described control unit controls every
When one described switch element disconnects, described control unit controls described display signal output unit to each described holding wire
Output display signal.
For improving the space availability ratio of array base palte, above-mentioned detection signal output unit and described detection list further
Unit can be integrated in above-mentioned driving chip, when control unit control each switch element disconnect time, the of each signal line
Two ends are earth-free, and control unit controls to show that signal output unit, to each signal line output display signal, now, drives core
Sheet is in display pattern, shows realizing image, when control unit controls each switch element Guan Bi, and the of each signal line
Two end ground connection, control unit controls driving chip and switches to detection pattern, and in this mode, detection signal output unit is to each
Signal line output detections signal, detector unit can judge every by detecting the magnitude of voltage of the first end of each signal line afterwards
One signal line whether existing defects or judge whether each signal line deposits by detecting the current value of each signal line
In defect.
Seeing the schematic diagram that Fig. 1, Fig. 1 are a kind of array base paltes that embodiment of the present invention provides, this array base palte includes
Many signal line (the S being arranged on underlay substrate 11, S2..., Sn), also include and each signal line resistance one to one
Unit and with each signal line switch element one to one, the resistance list that the first end of each signal line is corresponding
First end of unit is connected, and the second end of each signal line is by corresponding switch element ground connection;
Such as, holding wire S1Corresponding resistance unit and switch element are respectively resistance unit K1With switch element M1, signal
Line S1The corresponding resistance unit K of the first end1The first end be connected, holding wire S1The second end by corresponding opening
Close unit M1Ground connection, holding wire S2Corresponding resistance unit and switch element are respectively resistance unit K2With switch element M2, signal
Line S2The corresponding resistance unit K of the first end2The first end be connected, holding wire S2The second end by corresponding opening
Close unit M2Ground connection ..., holding wire SnCorresponding resistance unit and switch element are respectively resistance unit KnWith switch element Mn,
Holding wire SnThe corresponding resistance unit K of the first endnThe first end be connected, holding wire SnThe second end by corresponding
Switch element MnGround connection;
This array base palte also includes controlling the control unit 2 of each switch element break-make, detection signal output unit 3 and
Detector unit 4;
Wherein, control unit 2 is connected with detection signal output unit 3, detection signal output unit 3 and each resistance list
Second end of unit is connected, and when control unit 2 controls each switching means conductive, control unit 2 controls detection signal output
Unit 3 is to the second end output detections signal of each resistance unit;
When detection signal output unit 3 is after the second end output detections signal of each resistance unit, and detector unit 4 is led to
Cross the magnitude of voltage of the first end detecting each signal line and judge each signal line whether existing defects or every by detection
The current value of one signal line judges each signal line whether existing defects;
Such as, switch element M1, switch element M2..., switch element MnMetal-oxide-semiconductor, control unit 2 and each MOS can be
The grid of pipe is connected, and for controlling the break-make of each metal-oxide-semiconductor, such as, each switch element can be N-type metal-oxide-semiconductor, when control unit 2
To the control signal that each switch element exports be low level signal time, M1~MnIt is in cut-off state, switches off, now, inspection
Survey signal output unit not output detections signal, the display driver circuit of array base palte to each holding wire output display signal with reality
Existing image shows;When control unit 2 to the control signal that each switch element exports be high level signal time, M1~MnIt is in leading
Logical state, switch Guan Bi, now, the second end ground connection of each signal line, now, the display driver circuit of array base palte stops
To each holding wire output display signal, control unit controls detection signal output unit to each resistance unit K1, resistance unit
K2..., resistance unit KnSecond end input detection signal, afterwards control unit 2 control detector unit 4 by detection each
The magnitude of voltage of the first end of holding wire judges each signal line whether existing defects or by detecting each signal line
Current value judges each signal line whether existing defects;
Such as, resistance unit K1, resistance unit K2..., resistance unit KnResistance value identical, detect signal output unit 3
The detection signal of output can be DC voltage, and such as, detection signal output unit 3 is to the second end output of each resistance unit
DC voltage VDD is C volt, for L signal line therein, the magnitude of voltage V of its first endLAs follows:
Wherein, RLIt is the resistance value of L signal line, RL' it is resistance unit K corresponding to L signal lineLResistance value;
As shown from the above formula, when this L signal line occurs damage, its resistance also can occur significant change, with it
The resistance gap of his normal holding wire also can become big, the magnitude of voltage V of its first endLThe first end with other normal holding wires
The gap of magnitude of voltage also can substantially become big, the magnitude of voltage that therefore, it can the first end by detecting each signal line judges
Whether each signal line exists damage, for example, it is possible to the magnitude of voltage of the first end of many signal line of detection is averaged, and will
The magnitude of voltage of the first end of each signal line compares with this average, for each signal line, if the electricity of its first end
The difference of pressure value and this average in preset range, then judges normal, otherwise, it is determined that its existing defects;
Similarly, it is also possible to judge whether each signal line exists by the current value of each signal line of detection scarce
Fall into, for example, it is possible to the current value of many signal line of detection is averaged, by equal with this for the current value of each described holding wire
Value compares, and for each signal line, if the difference of its current value and this average is in preset range, then judges normal,
Otherwise, it is determined that its existing defects.
Wherein, above-mentioned many signal line (S1, S2..., Sn) grid line can be, it is also possible to it is data wire;
Preferably, can be as in figure 2 it is shown, can be by above-mentioned resistance unit (K1, K2..., Kn), detection signal output single
Unit 3 and detector unit 4 are integrated in the driving chip (LCD Driver IC) 10 of array base palte, and this driving chip 10 includes
For the display signal output unit 5 to each signal line output display signal;
As in figure 2 it is shown, this driving chip 10 includes and each holding wire port one to one, respectively I/O1, I/
O2, ..., I/On, the first end of each signal line is connected to corresponding port, such as, holding wire S1The first end even
It is connected to the port I/O1 of driving chip, holding wire S2The first end be connected to the port I/O2 of driving chip ..., holding wire Sn's
First end is connected to the port I/On of driving chip;
Driving chip 10 is integrated with detection signal output unit 3 and each holding wire resistance unit one to one,
Detector unit 4 and display signal output unit 5, for each resistance unit, its first end is connected by corresponding port
To corresponding holding wire, its second end connects detection signal output unit 3, detector unit 4 can by the voltage of detection port or
Current value judges the holding wire whether existing defects of correspondence, and display signal output unit is defeated to each holding wire by corresponding port
Go out to show signal, such as, if above-mentioned many signal line (S1, S2..., Sn) grid line can be, then show signal output unit
The display signal of 5 outputs is gate signal, if above-mentioned many signal line (S1, S2..., Sn) data wire can be, then show letter
The display signal of number output unit 5 output is data signal;
For above-mentioned array base palte, when control unit 2 is low level signal to the control signal that each switch element exports
Time, M1~MnBeing in cut-off state, switch off, now, driving chip 10 is in display pattern, and detection signal therein is defeated
Going out unit 3 not output detections signal, display signal output unit 5 is divided to corresponding holding wire by each port of driving chip 10
Other output display signal, shows realizing image;When control unit 2 to the control signal that each switch element exports be high level letter
Number time, M1~MnBeing in conducting state, switch closes, now, the second end ground connection of each signal line, control to drive simultaneously
Chip 10 switches to detection pattern, and in such a mode, display signal output unit 5 stops to each holding wire output display signal,
And detect signal output unit 3 to each resistance unit K1, resistance unit K2..., resistance unit KnSecond end input detection letter
Number, detector unit 4 can judge corresponding with each port by the voltage of the detection each port of driving chip 10 or electric current afterwards
Holding wire whether existing defects.
Additionally, embodiment of the present invention additionally provides a kind of display device, including above-mentioned array base palte.Wherein, this
The display device that bright embodiment provides can be note-book computer display screen, display, TV, DPF, mobile phone, flat board
Any product with display function such as computer or parts.
Additionally, embodiment of the present invention additionally provides the detection method of a kind of array base palte, for detecting above-mentioned array
Substrate, described method includes:
Control each described switching means conductive, apply detection signal at the second end of resistance unit each described;
Judge whether each described holding wire exists by the magnitude of voltage of the first end of each described holding wire of detection
Defect or the current value by each described holding wire of detection judge each described holding wire whether existing defects.
Preferably, the resistance value of the resistance unit that each described holding wire is corresponding is identical, described in each of detection
The magnitude of voltage of the first end of holding wire judges whether existing defects includes each described holding wire:
The magnitude of voltage of the first end of a plurality of described holding wire of detection is averaged, by the first end of each signal line
Magnitude of voltage compares with described average, for each described holding wire, if the magnitude of voltage of its first end and described average
Difference in preset range, then judges normal, otherwise, it is determined that its existing defects.
Preferably, the resistance value of the resistance unit that each described holding wire is corresponding is identical, described in each of detection
The current value of holding wire judges whether existing defects includes each described holding wire:
The current value of a plurality of described holding wire of detection is averaged, by the current value of each described holding wire with described
Average compares, and for each described holding wire, if the difference of its current value and described average is in preset range, then sentences
Disconnected normal, otherwise, it is determined that its existing defects.
Embodiment of above is merely to illustrate the present invention, and not limitation of the present invention, common about technical field
Technical staff, without departing from the spirit and scope of the present invention, it is also possible to make a variety of changes and modification, therefore own
The technical scheme of equivalent falls within scope of the invention, and the scope of patent protection of the present invention should be defined by the claims.
Claims (12)
1. an array base palte, including many signal line, it is characterised in that also include and each described holding wire one_to_one corresponding
Resistance unit and with each described holding wire switch element one to one, the first end of each described holding wire with
First end of the resistance unit of its correspondence is connected, and the second end of each described holding wire is connect by corresponding switch element
Ground, the second end of described resistance unit is used for applying to detect signal.
Array base palte the most according to claim 1, it is characterised in that also include controlling each described switch element break-make
Control unit.
Array base palte the most according to claim 2, it is characterised in that also include detecting signal output unit, described control
Unit is connected with described detection signal output unit, when described control unit controls each described switching means conductive, and institute
State control unit and control described detection signal output unit to the second end output described detection letter of resistance unit each described
Number.
Array base palte the most according to claim 3, it is characterised in that also include detector unit, for when described detection letter
Number output unit is after each described, the second end of resistance unit exports described detection signal, by each described letter of detection
The magnitude of voltage of the first end of number line judges each described holding wire whether existing defects or by each described letter of detection
The current value of number line judges each described holding wire whether existing defects.
Array base palte the most according to claim 4, it is characterised in that also include and driving that each described holding wire is connected
Dynamic chip, described driving chip includes for the display signal output unit to each described holding wire output display signal,
When described control unit controls the disconnection of each described switch element, it is single that described control unit controls the output of described display signal
Unit is to each described holding wire output display signal.
Array base palte the most according to claim 5, it is characterised in that the output of described resistance unit, described detection signal is single
First and described detector unit is integrated in described driving chip.
7. according to the arbitrary described array base palte of claim 1-6, it is characterised in that each described holding wire is grid line or number
According to line.
8. according to the arbitrary described array base palte of claim 1-6, it is characterised in that the resistance that each described holding wire is corresponding
The resistance value of unit is identical.
9. a display device, it is characterised in that include the arbitrary described array base palte of claim 1-8.
10. the detection method of an array base palte, it is characterised in that require the arbitrary described array base of 1-8 for test right
Plate, described method includes:
Control each described switching means conductive, apply detection signal at the second end of resistance unit each described;
Each described holding wire whether existing defects is judged by the magnitude of voltage of the first end of each described holding wire of detection
Or judge each described holding wire whether existing defects by the current value of each described holding wire of detection.
The detection method of 11. array base paltes according to claim 10, it is characterised in that each described holding wire is corresponding
The resistance value of resistance unit identical, judged described in each by the magnitude of voltage of the first end of each described holding wire of detection
Whether existing defects includes holding wire:
The magnitude of voltage of the first end of a plurality of described holding wire of detection is averaged, by the voltage of the first end of each signal line
Value compares with described average, for each described holding wire, if the magnitude of voltage of its first end and the difference of described average
In preset range, then judge normal, otherwise, it is determined that its existing defects.
The detection method of 12. array base paltes according to claim 10, it is characterised in that each described holding wire is corresponding
The resistance value of resistance unit identical, judge that each described holding wire is by the current value of each described holding wire of detection
No existing defects includes:
The current value of a plurality of described holding wire of detection is averaged, by the current value of each described holding wire and described average
Compare, for each described holding wire, if the difference of its current value and described average is in preset range, then just judging
Often, otherwise, it is determined that its existing defects.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610471879.7A CN106128342B (en) | 2016-06-24 | 2016-06-24 | The detection method of array substrate, display device and array substrate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610471879.7A CN106128342B (en) | 2016-06-24 | 2016-06-24 | The detection method of array substrate, display device and array substrate |
Publications (2)
Publication Number | Publication Date |
---|---|
CN106128342A true CN106128342A (en) | 2016-11-16 |
CN106128342B CN106128342B (en) | 2019-08-30 |
Family
ID=57269655
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201610471879.7A Expired - Fee Related CN106128342B (en) | 2016-06-24 | 2016-06-24 | The detection method of array substrate, display device and array substrate |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN106128342B (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107342033A (en) * | 2017-08-23 | 2017-11-10 | 京东方科技集团股份有限公司 | A kind of method and apparatus of display picture detection |
CN107610629A (en) * | 2017-11-06 | 2018-01-19 | 合肥鑫晟光电科技有限公司 | The detection method of array base palte drive circuit |
WO2018219136A1 (en) * | 2017-06-02 | 2018-12-06 | 京东方科技集团股份有限公司 | Driving module used for display panel, display panel and display device |
CN109102767A (en) * | 2018-08-24 | 2018-12-28 | 昆山龙腾光电有限公司 | A kind of impedance detection circuit and liquid crystal display device |
CN109616036A (en) * | 2019-01-07 | 2019-04-12 | 重庆京东方显示技术有限公司 | Display screen monomer, display screen monomer bad position positioning system and its localization method |
WO2021139686A1 (en) * | 2020-01-06 | 2021-07-15 | 京东方科技集团股份有限公司 | Display substrate detection method and apparatus |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101769976A (en) * | 2008-12-26 | 2010-07-07 | 鸿富锦精密工业(深圳)有限公司 | Connector detection system |
CN101825782A (en) * | 2009-03-06 | 2010-09-08 | 北京京东方光电科技有限公司 | Substrate test circuit and substrate |
CN102654658A (en) * | 2011-08-03 | 2012-09-05 | 北京京东方光电科技有限公司 | TFT (thin film transistor) array substrate detecting method and device |
CN202677789U (en) * | 2012-07-16 | 2013-01-16 | 北京京东方光电科技有限公司 | Display device, display panel and detection circuit of drive current thereof |
CN103091918A (en) * | 2013-01-18 | 2013-05-08 | 北京京东方光电科技有限公司 | Array substrate, display device of array substrate and detection method of array substrate |
CN103487955A (en) * | 2013-09-02 | 2014-01-01 | 京东方科技集团股份有限公司 | Short circuit measuring method |
-
2016
- 2016-06-24 CN CN201610471879.7A patent/CN106128342B/en not_active Expired - Fee Related
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101769976A (en) * | 2008-12-26 | 2010-07-07 | 鸿富锦精密工业(深圳)有限公司 | Connector detection system |
CN101825782A (en) * | 2009-03-06 | 2010-09-08 | 北京京东方光电科技有限公司 | Substrate test circuit and substrate |
CN102654658A (en) * | 2011-08-03 | 2012-09-05 | 北京京东方光电科技有限公司 | TFT (thin film transistor) array substrate detecting method and device |
CN202677789U (en) * | 2012-07-16 | 2013-01-16 | 北京京东方光电科技有限公司 | Display device, display panel and detection circuit of drive current thereof |
CN103091918A (en) * | 2013-01-18 | 2013-05-08 | 北京京东方光电科技有限公司 | Array substrate, display device of array substrate and detection method of array substrate |
CN103487955A (en) * | 2013-09-02 | 2014-01-01 | 京东方科技集团股份有限公司 | Short circuit measuring method |
Cited By (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10977971B2 (en) | 2017-06-02 | 2021-04-13 | Hefei Boe Optoelectronics Technology Co., Ltd. | Driving module used for display panel, display panel and display device |
WO2018219136A1 (en) * | 2017-06-02 | 2018-12-06 | 京东方科技集团股份有限公司 | Driving module used for display panel, display panel and display device |
CN107342033A (en) * | 2017-08-23 | 2017-11-10 | 京东方科技集团股份有限公司 | A kind of method and apparatus of display picture detection |
CN107342033B (en) * | 2017-08-23 | 2021-01-12 | 京东方科技集团股份有限公司 | Method and equipment for detecting display picture |
CN107610629B (en) * | 2017-11-06 | 2019-07-09 | 合肥鑫晟光电科技有限公司 | The detection method of array substrate driving circuit |
WO2019085952A1 (en) * | 2017-11-06 | 2019-05-09 | 京东方科技集团股份有限公司 | Detection method and detection apparatus for array substrate driving circuit |
US10923041B2 (en) | 2017-11-06 | 2021-02-16 | Hefei Xinsheng Optoelectronics Technology Co., Ltd. | Detection method and detection device for array substrate driving circuit |
CN107610629A (en) * | 2017-11-06 | 2018-01-19 | 合肥鑫晟光电科技有限公司 | The detection method of array base palte drive circuit |
CN109102767A (en) * | 2018-08-24 | 2018-12-28 | 昆山龙腾光电有限公司 | A kind of impedance detection circuit and liquid crystal display device |
CN109102767B (en) * | 2018-08-24 | 2021-05-28 | 昆山龙腾光电股份有限公司 | Impedance detection circuit and liquid crystal display device |
CN109616036A (en) * | 2019-01-07 | 2019-04-12 | 重庆京东方显示技术有限公司 | Display screen monomer, display screen monomer bad position positioning system and its localization method |
WO2021139686A1 (en) * | 2020-01-06 | 2021-07-15 | 京东方科技集团股份有限公司 | Display substrate detection method and apparatus |
US11594162B2 (en) | 2020-01-06 | 2023-02-28 | Hefei Xinsheng Optoelectronics Technology Co., Ltd. | Method and device for detecting display substrate |
Also Published As
Publication number | Publication date |
---|---|
CN106128342B (en) | 2019-08-30 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN106128342A (en) | The detection method of array base palte, display device and array base palte | |
CN105093593B (en) | Display base plate and its test method, display device | |
CN106933426B (en) | A kind of touch-control display panel, its test method and display device | |
US9424792B2 (en) | Test method and test device for line defect of display panel | |
CN103926767B (en) | Liquid crystal display and detection method thereof | |
WO2016106785A1 (en) | Display panel having touch function and fault detection method | |
CN103995407A (en) | Array substrate and display panel | |
US9898944B2 (en) | Detecting circuit, detecting method and display device | |
CN107329298A (en) | Lighting test circuit, array base palte and preparation method thereof, display device | |
US20120169346A1 (en) | Test device for liquid crystal display device and test method thereof | |
CN110136618B (en) | Display panel detection circuit, display device and display panel detection method | |
CN103280173B (en) | The detection device of display panels and detection method thereof | |
CN103217844A (en) | Display panel and display device | |
CN104516609A (en) | Embedded touch panel detecting and manufacturing method | |
CN103926717B (en) | The testing circuit of display floater, display floater and detection method thereof | |
CN106128351A (en) | A kind of display device | |
CN104503158B (en) | Array baseplate, liquid crystal display panel and detection method of liquid crystal display panel | |
CN103309065B (en) | The measurement circuit of display panel and method of testing thereof | |
CN103399422B (en) | Signal wire and repair line method for detecting short circuit | |
CN107025887A (en) | Display device and drive circuit therein and its driving method with test function | |
CN108873506A (en) | The test method of motherboard and motherboard | |
CN104460152B (en) | Array base palte and display device | |
CN108053788A (en) | A kind of display panel, display device and test method | |
CN101847357A (en) | Display panel, display device and test method thereof | |
CN106098007A (en) | Liquid crystal panel and control method liquid crystal panel thereof |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20190830 Termination date: 20200624 |
|
CF01 | Termination of patent right due to non-payment of annual fee |