CN106054474B - Liquid crystal display panel and liquid crystal display panel path monitoring method - Google Patents
Liquid crystal display panel and liquid crystal display panel path monitoring method Download PDFInfo
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- CN106054474B CN106054474B CN201610368448.8A CN201610368448A CN106054474B CN 106054474 B CN106054474 B CN 106054474B CN 201610368448 A CN201610368448 A CN 201610368448A CN 106054474 B CN106054474 B CN 106054474B
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136286—Wiring, e.g. gate line, drain line
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136254—Checking; Testing
Abstract
Liquid crystal display panel and liquid crystal display panel path monitoring method provided by the invention, by adding CF public electrode testing cushion and monitoring and test pad on tft array substrate, according to resistance, current difference between the CF public electrode testing cushion monitored and monitoring and test pad, it is possible to determine that whether short-circuit between non-COM signal WOA area's cabling and upper plate CF_COM.Once it was found that short-circuit between non-COM signal WOA area's cabling and upper plate CF_COM due to caused by PV breakage, problem piece can be intercepted, enter subsequent processing to prevent fluid stopping, material and production capacity is caused to waste, to improve production efficiency, reduce production cost, while promoting liquid crystal display panel quality.And after liquid crystal display panel is completed, the join of the routes such as wiring region lead outside route set by short-circuit rods region and CF public electrode lead and array is cut off using laser, liquid crystal display panel is subsequent still can normally to be shown.
Description
Technical field
The present invention relates to field of liquid crystal display, can monitor not common electrode WOA cabling and CF_ more particularly, to one kind
Between COM whether short circuit liquid crystal display panel and liquid crystal display panel path monitoring method.
Background technique
Liquid crystal display panel is the most important constituent element of liquid crystal display, the structure of common liquid crystal display panel be by
One colored filter (Color Filter, CF) substrate, a thin film transistor (TFT) (Thin Film Transistor, TFT) array
Substrate and the liquid crystal layer (Liquid Crystal Layer) that is configured between two substrates are constituted, its working principle is that logical
It crosses and applies driving voltage on two panels glass substrate to control the rotation of the liquid crystal molecule of liquid crystal layer, the light that backlight module is provided
Line reflects generation image.The manufacture of liquid crystal display panel includes array (array) processing procedure, panel (panel) processing procedure and mould
Block (module) processing procedure will do it test after each processing procedure to exclude defective products.Panel itself route is detected, and
When find the problem and repaired, which is known as panel test (Cell Test).In order to reduce faceplate section liquid crystal display panel
Picture detection difficulty and reduce cost of equipment, at present method well known to industry first is that using shorting bar (short-circuit rods)
Mode.Be provided on the tft array substrate of liquid crystal display panel connect under test line on viewing area and CF substrate it is outer
Enclose measurement circuit.When carrying out panel test, it will usually short-circuit rods are set on tft array substrate and distinguish route to be tested
It is shorted, is then electrically connected by corresponding testing cushion, complete test assignment.
In general, in order to keep upper and lower base plate public electrode (COM) current potential consistent, it generally can be in the CF of tft array substrate
Multiple gold size points are beaten on public electrode (CF_COM) lead, and are coated gold size at the place of getting ready and be connected for upper and lower base plate current potential.This
Gold size coating need to coat with sealant (Seal) and separate progress, and the activity duration is longer, and it is larger that (loss) is lost in production capacity.Currently, Au-
In-Seal (gold size is mixed coating with sealant) technology is because the activity duration can be greatly decreased in it, caused by reducing because of Au dispensing
Whirl coating short circuit (short) problem and increasingly by industry favor.But this technology also brings some hidden danger and risk, example simultaneously
As being routed (Wire on array, WOA) outside the non-COM signal array on tft array substrate between area's cabling and upper plate CF_COM
Short circuit problem.The area WOA cabling is more, densely distributed, in order to which line impedence is effectively reduced away, mitigates the disadvantages such as RC delay and undercharge
End, this region cabling are typically designed as double-layer metal structure.The outer wiring region film layer structure of existing array is as shown in Figure 1, up and down
It is SiNx protective layer 13 between substrate M1, M2, is topmost PV protective layer 14.During Au-in-Seal technical application, such as
The PV floor in the area WOA that fruit sealant is passed through easily causes the short circuit between the area WOA cabling and upper plate CF_COM to be asked once damaging
Topic, to cause extremely seriously to show that (such as short circuit can cause high current to be burnt to abnormal problem between constant pressure high level VGH and CF_COM
Screen).
Defective products flows into client in order to prevent, reduces the wasting of resources in factory, and COM non-during Au-in-Seal is believed
Number between the area WOA cabling and upper plate CF_COM short circuit problem prevent become particularly important with monitoring.
Summary of the invention
The object of the present invention is to provide a kind of liquid crystal display panel and liquid crystal display panel path monitoring method, monitorings
During Au-in-Seal, non-COM signal WOA area's cabling and upper plate CF_ because caused by non-COM signal WOA area PV is damaged
It is short-circuit between COM, while promoting liquid crystal display panel quality, production efficiency is improved, reduces production cost.
To achieve the above object, the present invention provides a kind of liquid crystal display panel, including tft array substrate and CF substrate,
The tft array substrate is equipped with: a plurality of CF public electrode lead and the outer wiring region lead of a plurality of array, a plurality of CF are public
Contact conductor is corresponding with the CF public electrode on the CF substrate, the outer wiring region lead of a plurality of array and the tft array
The outer wiring region cabling of not common electrode signal array on substrate is corresponding；It is routed outside one CF public electrode short-circuit rods and an array short
Road bar, a plurality of CF public electrode lead are electrically connected at the CF public electrode short-circuit rods, are routed outside a plurality of array
Area's lead is electrically connected at the outer short-circuit bar of the array；One CF public electrode testing cushion and a monitoring and test pad, the CF
Public electrode testing cushion is electrically connected at the CF public electrode short-circuit rods, and the monitoring and test pad is electrically connected at the array
Outer short-circuit bar；By monitoring the difference of electric current, resistance between the CF public electrode testing cushion and the monitoring and test pad, sentence
It is whether short-circuit between the cabling and the CF public electrode of the outer wiring region of the not common electrode signal array that breaks.
To achieve the above object, the present invention also provides a kind of liquid crystal display panel path monitoring method, the liquid crystals
Show that panel includes tft array substrate and CF substrate；It is public to include the following steps: that a CF is arranged in (1) on the tft array substrate
Electric pole short circuit bar and the outer short-circuit bar of an array, by a plurality of CF common electrical corresponding with the CF public electrode on the CF substrate
Pole lead is electrically connected at the CF public electrode short-circuit rods, by with the not common electrode signal battle array on the tft array substrate
It arranges the outer wiring region lead of the corresponding a plurality of array of outer wiring region cabling and is electrically connected at the outer short-circuit bar of the array；(2) exist
One CF public electrode testing cushion and a monitoring and test pad, the CF public electrode testing cushion electricity are set on the tft array substrate
Property be connected to the CF public electrode short-circuit rods, the monitoring and test pad is electrically connected at the outer short-circuit bar of the array；(3)
The difference for monitoring electric current, resistance between the CF public electrode testing cushion and the monitoring and test pad judges the not common electrode
It is whether short-circuit between the outer wiring region cabling of signal array and CF public electrode.
It is an advantage of the current invention that liquid crystal display panel provided by the invention and liquid crystal display panel path monitoring method,
By adding CF public electrode testing cushion and monitoring and test pad, according to the CF public electrode testing cushion and monitoring and test pad monitored
Between resistance, current difference, it is possible to determine that between non-COM signal WOA area's cabling and upper plate CF_COM whether short circuit.Once it was found that because non-
It is short-circuit between non-COM signal WOA area's cabling and upper plate CF_COM caused by COM signal WOA area PV breakage, problem piece can be blocked
It cuts, enters subsequent processing to prevent fluid stopping, material and production capacity is caused to waste, to improve production efficiency, reduce production cost, simultaneously
Promote liquid crystal display panel quality.And after liquid crystal display panel is completed, using laser by CF public electrode lead and array
The routes such as outer wiring region lead are cut off with the corresponding join for being shorted bar, and liquid crystal display panel is subsequent still can normally to be shown.
Detailed description of the invention
Fig. 1, the outer wiring region film layer structure schematic diagram of existing array；
Fig. 2, the structural schematic diagram of one embodiment of liquid crystal display panel of the present invention.
Specific embodiment
Liquid crystal display panel provided by the invention and liquid crystal display panel path monitoring method are done in detail with reference to the accompanying drawing
It describes in detail bright.
With reference to Fig. 2, the structural schematic diagram of one embodiment of liquid crystal display panel of the present invention.The LCD display
Plate includes tft array substrate 201 and CF substrate 202, and the tft array substrate 201 is equipped with: a plurality of CF public electrode lead
(CF_COM Lead) 221 and the outer wiring region lead (non-COM signal WOA Lead) 222 of a plurality of array, a CF public electrode short circuit
Bar (CF_COM shorting bar) 241 and the outer short-circuit bar (WOA shorting bar) 242 of an array, and, a CF
Public electrode testing cushion (CF_COM Pad) 261 and a monitoring and test pad (Detect Pad) 262.
Wherein, be provided on tft array substrate 201 with it is to be measured on liquid crystal display panel viewing area (not shown) and CF substrate 202
Try the peripheral test line areas of connection.Peripheral test line areas includes module flip chip (COF) crimp region 22, a plurality of
Short-circuit rods and panel test pad area 26.A plurality of CF public electrode lead 221 and the outer wiring region lead 222 of a plurality of array are set to module
Flip chip crimp region 22；CF public electrode testing cushion 261 and monitoring and test pad 262 are set to panel test and pad area 26；CF is public
Common electrode short-circuit rods 241 and the outer short-circuit bar 242 of array are set to module flip chip crimp region 22 and panel test pad area
26 peripheries.
A plurality of CF public electrode lead 221 is corresponding with the CF public electrode on CF substrate 201, and the outer wiring region of a plurality of array is drawn
Line 222 is corresponding with the outer wiring region cabling of the not common electrode signal array on tft array substrate 202.A plurality of CF public electrode draws
Line 221 is electrically connected at CF public electrode short-circuit rods 241, and the outer wiring region lead 222 of a plurality of array is electrically connected at array
Outer short-circuit bar 242.CF public electrode testing cushion 261 is electrically connected at CF public electrode short-circuit rods 241, monitoring and test pad
262 are electrically connected at the outer short-circuit bar 242 of array.By between monitoring CF public electrode testing cushion 261 and monitoring and test pad 262
Whether the difference of electric current, resistance judges short-circuit between the cabling and CF public electrode of wiring region outside not common electrode signal array.Tool
Body are as follows: be shorted together CF_COM using CF public electrode short-circuit rods 241 by a plurality of CF public electrode lead 221, and even
It is connected to CF public electrode testing cushion 261；Non- COM signal WOA area's cabling is used into battle array by wiring region lead 222 outside a plurality of array
It arranges outer short-circuit bar 242 to be shorted together, and is connected to monitoring and test pad 262；If monitoring CF public electrode testing cushion 261
262 resistance very littles (being less than preset threshold) are padded with monitoring and test or electric current is very big (being greater than preset threshold), then can be determined that
There are at least one cabling and upper plate CF_COM short circuit in the non-area COM signal WOA cabling.Once it was found that short circuit, can be by problem piece
It intercepts, enters subsequent processing to prevent fluid stopping, material and production capacity is caused to waste.
After liquid crystal display panel is completed, CF public electrode short-circuit rods 241 and the outer short-circuit bar 242 of an array exist
The laser cutting region 27 (Laser cut) between tft array substrate 201 and CF substrate 202 is by laser cutting (that is, using swashing
Light cuts off the join of the routes such as wiring region lead outside all short-circuit rods and CF public electrode lead and array), liquid crystal display
Panel is subsequent still can normally to be shown.
In the present embodiment, it is illustrated that the Pad such as " A/B/C " are general Pad when panel test section shorting bar is tested,
It is red line testing cushion (Red Pad), green line testing cushion (Green Pad), blue line testing cushion (Blue in the data line side (Source)
Pad)；It is odd number testing cushion (Odd Pad), even number testing cushion (Even Pad), simulates common end survey in the scan line side (Gate)
Examination pad (Acom Pad)；CF_com is the test Pad drawn on CF_com Lead from COF；Detect is the non-COM from COF
The test Pad drawn on signal WOA Lead.
Specifically: be additionally provided on the tft array substrate 201 of the liquid crystal display panel: a plurality of welding lead (is set to mould
Block flip chip crimp region 22), a plurality of short-circuit rods, multiple panel test pads (as shown set on panel test pad area 26 A,
B, tri- testing cushions of C).
When a plurality of welding lead and all data lines in liquid crystal display panel viewing area to it is corresponding when a plurality of short-circuit rods be a plurality of data
Line short-circuit rods；A plurality of welding lead corresponding with all data lines, which respectively corresponds, is electrically connected at multiple data lines short-circuit rods, more
A panel test pad, which respectively corresponds, is electrically connected at multiple data lines short-circuit rods.
Specifically: all data lines are divided into red data line, green data line and blue data line；All red datas
Line draws corresponding a plurality of first welding lead 223, and all green data lines draw corresponding a plurality of second welding lead 224,
All blue data lines draw corresponding a plurality of third welding lead 225.Correspondingly, multiple data lines short-circuit rods include: one
One data line short-circuit rods 243 are electrically connected at all first welding corresponding with red data lines all in all data lines and draw
Line 223；One second data line short-circuit rods 244 are electrically connected at corresponding with green data lines all in all data lines all
Second welding lead 224；One third data line short-circuit rods 245 are electrically connected at and blue data lines all in all data lines
Corresponding all third welding leads 225.Correspondingly, multiple panel test pads include: a red line testing cushion 263, it is electrically connected
In the first data line short-circuit rods 243；One green line testing cushion 264 is electrically connected at the second data line short-circuit rods 244；One blue line is surveyed
Pad 265 is tried, third data line short-circuit rods 245 are electrically connected at.
When a plurality of welding lead and all scan lines in liquid crystal display panel viewing area to it is corresponding when a plurality of short-circuit rods be multi-strip scanning
Line short-circuit rods；A plurality of welding lead corresponding with all scan lines, which respectively corresponds, is electrically connected at multi-strip scanning line short-circuit rods, more
A panel test pad, which respectively corresponds, is electrically connected at multi-strip scanning line short-circuit rods.
Specifically: all scan lines are divided into odd-numbered scan lines, even-line interlace line and simulation common end；All odd scans
Line draws corresponding a plurality of first welding lead 223, and all even-line interlace lines draw corresponding a plurality of second welding lead 224,
Draw corresponding a plurality of third welding lead 225 in all simulation common ends.Correspondingly, multi-strip scanning line short-circuit rods include: one
Scan line short-circuit rods 243 are electrically connected at all first welding corresponding with odd-numbered scan lines all in all scan lines and draw
Line 223；One second scan line short-circuit rods 244 are electrically connected at corresponding with even-line interlace lines all in all scan lines all
Second welding lead 224；One third scan line short-circuit rods 245 are electrically connected at corresponding with common end is simulated in all scan lines
All third welding leads 225.Correspondingly, multiple panel test pads include: an odd number testing cushion 263, it is electrically connected at
Scan line short-circuit rods 243；One even number testing cushion 264 is electrically connected at the second scan line short-circuit rods 244；One simulation common end
Testing cushion 265 is electrically connected at third scan line short-circuit rods 245.
After liquid crystal display panel is completed, the first data line short-circuit rods, the second data line short-circuit rods and third data line
Short-circuit rods, or, the first scan line short-circuit rods, the second scan line short-circuit rods and third scan line short-circuit rods are also in laser cutting area
Domain 27 is by laser cutting (that is, being cut off the join of the routes such as scan line or data line and corresponding short-circuit rods using laser), liquid
LCD panel is subsequent still can normally to be shown.
The liquid crystal display panel includes between tft array substrate and CF substrate.The liquid crystal display panel route
Monitoring method includes the following steps: S31: being arranged outside a CF public electrode short-circuit rods and an array on the tft array substrate
A plurality of CF public electrode lead corresponding with the CF public electrode on the CF substrate is electrically connected at described by short-circuit bar
CF public electrode short-circuit rods, will be corresponding with wiring region cabling outside the not common electrode signal array on the tft array substrate
The outer wiring region lead of a plurality of array is electrically connected at the outer short-circuit bar of the array；S32: one is arranged on tft array substrate
CF public electrode testing cushion and a monitoring and test pad, CF public electrode testing cushion are electrically connected at CF public electrode short-circuit rods, prison
It surveys testing cushion and is electrically connected at the outer short-circuit bar of array；S33: electricity between monitoring CF public electrode testing cushion and monitoring and test pad
Whether the difference of stream, resistance judges short-circuit between the outer wiring region cabling of not common electrode signal array and CF public electrode.Wherein,
The execution of step S31 and step S32 is without sequencing.
Specifically: CF_COM is shorted together by a plurality of CF public electrode lead using CF public electrode short-circuit rods,
And it is connected to CF public electrode testing cushion；Non- COM signal WOA area's cabling is used into array by wiring region lead outside a plurality of array
Outer short-circuit bar is shorted together, and is connected to monitoring and test pad；If monitoring CF public electrode testing cushion and monitoring and test
Resistance very little (being less than preset threshold) or electric current are very big (being greater than preset threshold) between pad, then can be determined that the non-area COM signal WOA
There are at least one cabling and upper plate CF_COM short circuit in cabling.Once it was found that short circuit, problem piece can be intercepted, enter to prevent fluid stopping
Subsequent processing causes material and production capacity to waste.
After liquid crystal display panel is completed, using laser by the lines such as wiring region lead outside CF public electrode lead and array
Road and the corresponding join for being shorted bar are cut off, and liquid crystal display panel is subsequent still can normally to be shown.That is, liquid crystal of the present invention
Display panel path monitoring method further comprises S34 after step S33: after liquid crystal display panel test, being utilized
Laser cuts off all short-circuit rods and the join of respective lead.
The above is only a preferred embodiment of the present invention, it is noted that for the ordinary skill people of the art
Member, various improvements and modifications may be made without departing from the principle of the present invention, these improvements and modifications also should be regarded as
Protection scope of the present invention.
Claims (10)
1. a kind of liquid crystal display panel, including tft array substrate and CF substrate, which is characterized in that set on the tft array substrate
Have:
A plurality of CF public electrode lead and the outer wiring region lead of a plurality of array, a plurality of CF public electrode lead and the CF base
CF public electrode on plate is corresponding, the not common electrode on the outer wiring region lead of a plurality of array and the tft array substrate
The outer wiring region cabling of signal array is corresponding；
One CF public electrode short-circuit rods and the outer short-circuit bar of an array, a plurality of CF public electrode lead are electrically connected at institute
CF public electrode short-circuit rods are stated, the outer wiring region lead of a plurality of array is electrically connected at the outer short-circuit bar of the array；
One CF public electrode testing cushion and a monitoring and test pad, it is public that the CF public electrode testing cushion is electrically connected at the CF
Electric pole short circuit bar, the monitoring and test pad are electrically connected at the outer short-circuit bar of the array；
By monitoring the difference of electric current, resistance between the CF public electrode testing cushion and the monitoring and test pad, judge described non-
It is whether short-circuit between the cabling and the CF public electrode of the outer wiring region of common electrode signal array.
2. liquid crystal display panel as described in claim 1, which is characterized in that if monitor the CF public electrode testing cushion with
Resistance is less than preset threshold between the monitoring and test pad or electric current is greater than preset threshold, then determines the not common electrode signal
There are at least one cabling and CF public electrode short circuit in the outer wiring region cabling of array.
3. liquid crystal display panel as described in claim 1, which is characterized in that be additionally provided on the tft array substrate:
A plurality of welding lead, a plurality of welding lead are corresponding with all data lines in liquid crystal display panel viewing area；
Multiple data lines short-circuit rods, a plurality of welding lead, which respectively corresponds, is electrically connected at the multiple data lines short-circuit rods；
Multiple panel test pads, the multiple panel test pad, which respectively corresponds, is electrically connected at the multiple data lines short-circuit rods.
4. liquid crystal display panel as claimed in claim 3, which is characterized in that
The multiple data lines short-circuit rods include: one first data line short-circuit rods be electrically connected at it is all red in all data lines
Corresponding all first welding leads of color data line, one second data line short-circuit rods are electrically connected to be owned with all data lines
Corresponding all second welding leads of green data line, a third data line short-circuit rods are electrically connected at and institute in all data lines
There are the corresponding all third welding leads of blue data line；
The multiple panel test pad includes: that a red line testing cushion is electrically connected at the first data line short-circuit rods, a green line
Testing cushion is electrically connected at the second data line short-circuit rods, and a blue line testing cushion is electrically connected at the third data line short circuit
Bar.
5. liquid crystal display panel as described in claim 1, which is characterized in that the tft array substrate and the CF substrate it
Between further include:
A plurality of welding lead, a plurality of welding lead are corresponding with all scan lines in liquid crystal display panel viewing area；
Multi-strip scanning line short-circuit rods, a plurality of welding lead, which respectively corresponds, is electrically connected at the multi-strip scanning line short-circuit rods；
Multiple panel test pads, the multiple panel test pad, which respectively corresponds, is electrically connected at the multi-strip scanning line short-circuit rods.
6. liquid crystal display panel as claimed in claim 5, which is characterized in that
The multi-strip scanning line short-circuit rods include: that one first scan line short-circuit rods are electrically connected at and surprises all in all scan lines
Corresponding all first welding leads of number scan line, one second scan line short-circuit rods are electrically connected to be owned with all scan lines
Corresponding all second welding leads of even-line interlace line, a third scan line short-circuit rods are electrically connected at and mould in all scan lines
The quasi- corresponding all third welding leads in common end；
The multiple panel test pad includes: that an odd number testing cushion is electrically connected at the first scan line short-circuit rods；One even number
Testing cushion is electrically connected at the second scan line short-circuit rods；One simulation common end testing cushion is electrically connected at the third scanning
Line short-circuit rods.
7. the liquid crystal display panel as described in any one of claim 1,3 or 5, which is characterized in that all short-circuit rods and corresponding
The join of lead is after liquid crystal display panel is tested by laser cutting.
8. a kind of liquid crystal display panel path monitoring method, the liquid crystal display panel includes tft array substrate and CF substrate；Its
It is characterized in that, includes the following steps:
(1) short-circuit bar outside a CF public electrode short-circuit rods and an array is set on the tft array substrate, will with it is described
The corresponding a plurality of CF public electrode lead of CF public electrode on CF substrate is electrically connected at the CF public electrode short-circuit rods, will
Wiring region lead outside a plurality of array corresponding with wiring region cabling outside the not common electrode signal array on the tft array substrate
It is electrically connected at the outer short-circuit bar of the array；
(2) a CF public electrode testing cushion and a monitoring and test pad, the CF public electrode are set on the tft array substrate
Testing cushion is electrically connected at the CF public electrode short-circuit rods, the monitoring and test pad be electrically connected at outside the array be routed it is short
Road bar；
(3) difference for monitoring electric current, resistance between the CF public electrode testing cushion and the monitoring and test pad, judges the non-public affairs
It is whether short-circuit between the outer wiring region cabling of common electrode signal array and CF public electrode.
9. liquid crystal display panel path monitoring method as claimed in claim 8, which is characterized in that step (3) further comprises:
If monitoring, resistance is less than preset threshold between the CF public electrode testing cushion and the monitoring and test pad or electric current is greater than in advance
If threshold value, then determine there is at least one cabling and the CF common electrical in the outer wiring region cabling of the not common electrode signal array
Extremely short road.
10. liquid crystal display panel path monitoring method as claimed in claim 8, which is characterized in that after step (3) further
It include: to be cut off all short-circuit rods and the join of respective lead using laser after liquid crystal display panel test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610368448.8A CN106054474B (en) | 2016-05-27 | 2016-05-27 | Liquid crystal display panel and liquid crystal display panel path monitoring method |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610368448.8A CN106054474B (en) | 2016-05-27 | 2016-05-27 | Liquid crystal display panel and liquid crystal display panel path monitoring method |
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| Publication Number | Publication Date |
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| CN106054474A CN106054474A (en) | 2016-10-26 |
| CN106054474B true CN106054474B (en) | 2019-05-03 |
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| CN106652967B (en) * | 2017-03-21 | 2019-12-24 | 厦门天马微电子有限公司 | Display panel, display device and driving method applied to display panel |
| CN107908052A (en) * | 2017-11-06 | 2018-04-13 | 深圳市华星光电技术有限公司 | Liquid crystal panel structure |
| CN107886883B (en) * | 2017-12-05 | 2021-04-30 | Tcl华星光电技术有限公司 | Circuit and method for detecting common electrode wiring short circuit |
| CN109407434B (en) | 2018-11-22 | 2020-11-24 | 武汉华星光电技术有限公司 | Liquid crystal display device having a plurality of pixel electrodes |
| CN110187529A (en) * | 2019-05-22 | 2019-08-30 | 深圳市华星光电半导体显示技术有限公司 | Display panel processing method and display panel processing system |
| CN113485052B (en) * | 2021-06-30 | 2023-04-25 | 惠科股份有限公司 | Display panel and manufacturing method thereof |
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