JPH06160898A - Inspection method for liquid crystal display panel - Google Patents

Inspection method for liquid crystal display panel

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Publication number
JPH06160898A
JPH06160898A JP30730092A JP30730092A JPH06160898A JP H06160898 A JPH06160898 A JP H06160898A JP 30730092 A JP30730092 A JP 30730092A JP 30730092 A JP30730092 A JP 30730092A JP H06160898 A JPH06160898 A JP H06160898A
Authority
JP
Japan
Prior art keywords
liquid crystal
display panel
crystal display
electrode
scan
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP30730092A
Other languages
Japanese (ja)
Inventor
Hidetomo Sukenori
英智 助則
Yusuke Nakagawa
裕介 中川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP30730092A priority Critical patent/JPH06160898A/en
Publication of JPH06160898A publication Critical patent/JPH06160898A/en
Withdrawn legal-status Critical Current

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  • Liquid Crystal (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

PURPOSE:To accurately and easily detect a short circuit between scanning electrodes, as to an inspection method for a liquid crystal display panel for inspecting the trouble of the short circuit between the scanning electrodes. CONSTITUTION:At an inspection time, an inspection control circuit 16 for alternately supplying a driving signal having a different phase at every scanning line is connected with the scanning electrode 12c of the liquid crystal display panel 11 so as to see the brightness of the liquid crystal display panel 11. The brightness on the short-circuited part is increased, so that the presence or absence of the short circuit and the short-circuited position are recognized by seeing the brightness of the liquid crystal display panel 11.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は液晶表示パネルの検査方
法に係り、特に、走査電極間の短絡障害を検査する液晶
表示パネルの検査方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a liquid crystal display panel inspecting method, and more particularly to a liquid crystal display panel inspecting method for inspecting a short circuit between scanning electrodes.

【0002】液晶表示パネルにはデータ電極及び走査電
極がマトリクス状に配線されており、異なる走査線を形
成する走査電極間は絶縁状態に保持する必要がある。し
かし、隣接する走査電極間のピッチは非常に短く、短絡
しやすい。このため、走査電極間の短絡を検査する必要
がある。
Data electrodes and scanning electrodes are wired in a matrix in a liquid crystal display panel, and it is necessary to maintain an insulating state between the scanning electrodes forming different scanning lines. However, the pitch between adjacent scan electrodes is very short, and a short circuit is likely to occur. Therefore, it is necessary to inspect for a short circuit between the scan electrodes.

【0003】[0003]

【従来の技術】図7はTFT(薄膜トランジスタ)型カ
ラー液晶表示パネルの概略構成図を示す。液晶パネル1
はTFT基板2とコモン電極基板3とを所定の間隔に保
持して、その周囲をシール材4で封止し、TFT基板2
とコモン基板3との間に液晶5を充填した構成とされて
いる。
2. Description of the Related Art FIG. 7 is a schematic block diagram of a TFT (thin film transistor) type color liquid crystal display panel. LCD panel 1
Holds the TFT substrate 2 and the common electrode substrate 3 at a predetermined interval and seals the periphery thereof with a sealing material 4.
The liquid crystal 5 is filled between the common substrate 3 and the common substrate 3.

【0004】TFT基板2上には液晶5に電圧を印加す
るための画素電極2a,画素電極2aの印加電圧を制御
する薄膜トランジスタ(TFT)2b,薄膜トランジス
タ2bに制御信号を供給するためにマトリクス状に配線
された走査電極2c,データ電極2dが平坦化層2eと
共に形成されている。コモン電極基板3には多色カラー
フィルタ3a,共通電位に保持されるコモン電極3bが
凹凸を平坦化する平坦化層3cと共に形成されている。
A pixel electrode 2a for applying a voltage to the liquid crystal 5, a thin film transistor (TFT) 2b for controlling the voltage applied to the pixel electrode 2a, and a matrix for supplying a control signal to the thin film transistor 2b are formed on the TFT substrate 2. Wiring scan electrodes 2c and data electrodes 2d are formed together with the flattening layer 2e. On the common electrode substrate 3, a multicolor color filter 3a and a common electrode 3b held at a common potential are formed together with a flattening layer 3c for flattening unevenness.

【0005】薄膜トランジスタ2bのソースは画素電極
2a,ゲートは走査電極2c,ドレインはデータ電極2
dに接続される。薄膜トランジスタ2bは走査電極2c
の電圧レベルに応じてオン・オフし、データ電極2dの
電圧の画素電極2aへの供給を制御する。
The source of the thin film transistor 2b is a pixel electrode 2a, the gate is a scan electrode 2c, and the drain is a data electrode 2.
connected to d. The thin film transistor 2b is the scanning electrode 2c.
It is turned on / off according to the voltage level of 2 to control the supply of the voltage of the data electrode 2d to the pixel electrode 2a.

【0006】液晶5は画素電極2aとコモン電極3bと
の間に印加される電圧に応じて状態が変化し、光を透過
又は拡散させる。液晶表示パネル1は薄膜トランジスタ
2bにより各画素電極2aの印加電圧を制御することに
より画素電極2a毎に液晶5の状態を変化させ、光の透
過を制御して、表示制御を行なう。
The liquid crystal 5 changes its state according to the voltage applied between the pixel electrode 2a and the common electrode 3b, and transmits or diffuses light. The liquid crystal display panel 1 changes the state of the liquid crystal 5 for each pixel electrode 2a by controlling the voltage applied to each pixel electrode 2a by the thin film transistor 2b, and controls the transmission of light to perform display control.

【0007】この種の液晶表示パネル1では通常、図7
(B)に示すように画素電極2aに対して薄膜トランジ
スタ2b及び走査電極2cを二系統用意し、一方の薄膜
トランジスタ2b又は走査電極2cに不良が生じた場
合、他方の薄膜トランジスタ2b及び走査電極2cで駆
動可能とし歩留り低下を防止する、いわゆる冗長を行っ
ている。このとき、一つの画素電極2aの両側にその画
素電極2aを駆動する走査電極2cが配線される。
In the liquid crystal display panel 1 of this type, normally, as shown in FIG.
As shown in (B), two systems of the thin film transistor 2b and the scanning electrode 2c are prepared for the pixel electrode 2a, and when a defect occurs in one thin film transistor 2b or the scanning electrode 2c, the other thin film transistor 2b and the scanning electrode 2c are driven. The so-called redundancy is performed to make it possible and prevent the yield from decreasing. At this time, the scanning electrodes 2c for driving the pixel electrodes 2a are arranged on both sides of one pixel electrode 2a.

【0008】このため、互いに隣接する走査電極2cの
間隔dは約10μm とかなり小さい値となり、走査電極
2c間で短絡が発生しやすい。従って、走査電極2c間
で短絡が発生していないかどうか検査する必要がある。
Therefore, the distance d between the scanning electrodes 2c adjacent to each other is as small as about 10 .mu.m, and a short circuit easily occurs between the scanning electrodes 2c. Therefore, it is necessary to inspect whether a short circuit has occurred between the scan electrodes 2c.

【0009】走査電極2c間の短絡の検査には従来、自
動検査装置が用いられており、走査電極2cの実際のパ
ターンを一画素電極2aの単位毎に光学的に検出し、隣
接する走査電極2c間に所定の間隔が保持されているか
否かを判別することにより行なわれていた。
Conventionally, an automatic inspection device has been used for inspecting a short circuit between the scan electrodes 2c, and the actual pattern of the scan electrodes 2c is optically detected for each unit of one pixel electrode 2a, and the adjacent scan electrodes are detected. It is performed by determining whether or not a predetermined interval is maintained between 2c.

【0010】[0010]

【発明が解決しようとする課題】しかるに、従来の液晶
表示パネルの検査方法は自動検査装置を用い、走査電極
のパターンを画素単位で、光学的に検出し、走査電極間
の短絡を検査しており、例えば、90万画素のパネルの
検査に20〜30分程度の時間を要し、検査に多大な時
間を要する等の問題点があった。
However, the conventional method for inspecting a liquid crystal display panel uses an automatic inspection device to optically detect the pattern of the scanning electrodes pixel by pixel and inspect for a short circuit between the scanning electrodes. However, there is a problem that, for example, it takes about 20 to 30 minutes to inspect a panel of 900,000 pixels, and it takes a lot of time to inspect.

【0011】本発明は上記の点に鑑みてなされたもの
で、走査電極間の短絡を高精度でかつ容易に検査できる
液晶表示パネルの検査方法を提供することを目的とす
る。
The present invention has been made in view of the above points, and an object of the present invention is to provide a method for inspecting a liquid crystal display panel, which can inspect a short circuit between scanning electrodes with high accuracy and easily.

【0012】[0012]

【課題を解決するための手段】本発明はコモン電極が形
成されたコモン電極基板と、画素電極及び画素電極にス
イッチング素子を介して接続され、画素電極に走査ライ
ン毎に電圧を印加する複数の走査電極が形成された画素
電極基板とで液晶を挟持してなる液晶表示パネルで、複
数の走査電極間の短絡を検査する液晶表示パネルの検査
方法において、前記複数の走査電極には奇数走査ライン
と偶数走査ラインとで位相の異なる信号を夫々の走査電
極の両端に供給し、前記スイッチング素子を順次オンに
することにより前記液晶パネルを駆動させ、前記液晶表
示パネルの輝度を検出することにより前記走査電極間の
短絡を検査してなる。
According to the present invention, a common electrode substrate on which a common electrode is formed is connected to a pixel electrode and a plurality of pixel electrodes via a switching element, and a plurality of voltages are applied to the pixel electrode for each scanning line. In a liquid crystal display panel in which a liquid crystal is sandwiched between a pixel electrode substrate on which scan electrodes are formed, a method of inspecting a liquid crystal display panel for inspecting a short circuit between a plurality of scan electrodes, wherein the plurality of scan electrodes have odd scan lines By supplying signals having different phases between the scanning lines and even scanning lines to both ends of each scanning electrode and sequentially turning on the switching elements, the liquid crystal panel is driven, and by detecting the brightness of the liquid crystal display panel, Inspecting for short circuit between scan electrodes.

【0013】[0013]

【作用】互いに隣接する走査電極には位相の異なる信号
が夫々の走査電極の両端に供給される。
In the scanning electrodes adjacent to each other, signals having different phases are supplied to both ends of each scanning electrode.

【0014】隣接する走査電極間に不必要な短絡があれ
ば、互いに隣接する走査電極間には電位差があるため、
短絡部の電圧が低下し、短絡部における輝度が他部分と
異なる。従って、液晶表示パネル上の輝度を見ることに
より短絡の有無と位置が検知可能になる。
If there is an unnecessary short circuit between the adjacent scan electrodes, there is a potential difference between the adjacent scan electrodes.
The voltage at the short-circuited portion is reduced, and the brightness at the short-circuited portion is different from that at other portions. Therefore, it is possible to detect the presence or absence of a short circuit and the position by observing the brightness on the liquid crystal display panel.

【0015】[0015]

【実施例】図1は本発明の一実施例の概略構成図を示
す。同図中、11は液晶表示パネルを示す。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 is a schematic block diagram of an embodiment of the present invention. In the figure, 11 indicates a liquid crystal display panel.

【0016】液晶パネル11はTFT基板12とコモン
電極基板13とを所定の間隔に保持して、その周囲をシ
ール材14で封止し、TFT基板12とコモン基板13
との間に液晶15を充填した構成とされている。
The liquid crystal panel 11 holds the TFT substrate 12 and the common electrode substrate 13 at a predetermined interval and seals the periphery thereof with a sealing material 14, and the TFT substrate 12 and the common substrate 13 are sealed.
The liquid crystal 15 is filled in between.

【0017】TFT基板12上には液晶15に電圧を印
加するための画素電極12a,画素電極12aの印加電
圧を制御する薄膜トランジスタ(TFT)12b,薄膜
トランジスタ12bに制御信号を供給するためにマトリ
クス状に配線された走査電極12c,データ電極12d
が平坦化層12eと共に形成されている。コモン電極基
板13には多色カラーフィルタ13a,共通電位に保持
されるコモン電極13bが凹凸を平坦化する平坦化層1
3cと共に形成されている。
A pixel electrode 12a for applying a voltage to the liquid crystal 15, a thin film transistor (TFT) 12b for controlling the voltage applied to the pixel electrode 12a, and a matrix for supplying a control signal to the thin film transistor 12b are formed on the TFT substrate 12. Wiring scan electrode 12c and data electrode 12d
Are formed together with the flattening layer 12e. The common electrode substrate 13 has a multicolor color filter 13a, and a common electrode 13b held at a common potential has a flattening layer 1 for flattening unevenness.
It is formed together with 3c.

【0018】図2は本発明の一実施例の要部の平面図、
図3は本発明の一実施例の動作波形図を示す。図2に示
すように走査電極12cは冗長のため夫々画素電極12
aを挟むように二又に分岐していて夫々が薄膜トランジ
スタ12bを介して画素電極12aと結合している。ま
た、TFT基板12には画素電極12a下部に画素電極
12a間とに容量を形成するための容量電極(Cs)1
2fが形成される。
FIG. 2 is a plan view of an essential part of one embodiment of the present invention,
FIG. 3 shows an operation waveform diagram of an embodiment of the present invention. As shown in FIG. 2, since the scanning electrodes 12c are redundant, each pixel electrode 12
It is bifurcated so as to sandwich a, and each is connected to the pixel electrode 12a via the thin film transistor 12b. Further, on the TFT substrate 12, a capacitor electrode (Cs) 1 for forming a capacitor between the pixel electrodes 12a below the pixel electrodes 12a.
2f is formed.

【0019】薄膜トランジスタ12bのソースは画素電
極12a,ゲートは走査電極12c,ドレインはデータ
電極12dに接続される。薄膜トランジスタ12bは走
査電極12cの電圧レベルに応じてオン・オフし、デー
タ電極12dの電圧の画素電極12aへの供給を制御す
る。
The source of the thin film transistor 12b is connected to the pixel electrode 12a, the gate is connected to the scan electrode 12c, and the drain is connected to the data electrode 12d. The thin film transistor 12b is turned on / off according to the voltage level of the scan electrode 12c, and controls the supply of the voltage of the data electrode 12d to the pixel electrode 12a.

【0020】液晶15は画素電極12aとコモン電極1
3bとの間に印加される電圧に応じて状態が変化し、光
を透過又は拡散させる。液晶表示パネル11は薄膜トラ
ンジスタ12bにより各画素電極12aの印加電圧を制
御することにより画素電極12a毎に液晶15の状態を
変化させ、光の透過を制御して、表示制御を行なう。
The liquid crystal 15 includes a pixel electrode 12a and a common electrode 1
The state changes depending on the voltage applied between the light source 3b and the light source 3b, and transmits or diffuses light. The liquid crystal display panel 11 changes the state of the liquid crystal 15 for each pixel electrode 12a by controlling the voltage applied to each pixel electrode 12a by the thin film transistor 12b, and controls the transmission of light to perform display control.

【0021】検査時には液晶表示パネル11には検査制
御回路16が接続される。検査制御回路16は走査電極
12cの両端Ta,Tb及びデータ電極12dと接続さ
れ、検査時に必要となる駆動信号を供給する。検査制御
回路16は走査電極(12c-1)の一方の端子(Ta-
1)と他方の端子(Tb-1)とには、図3(B)に示す
ように位相(正負)、周波数、振幅が一定の第1の駆動
信号、例えば、onレベル=15V,offレベル=−
15V,周波数30Hz,パルス幅300μs の信号を
入力し、走査電極(12c-1)に隣接する走査電極(1
2c-2)の一方の端子(Ta-2)と他方の端子(Tb-
2)とには、図3(C)に示すように第1の駆動信号に
対し、位相のずれた第2の駆動信号、例えば位相が30
0μs ずれた信号を入力する。また、検査制御回路16
はデータ電極12dには、図3(A)に示すようにon
レベル=5V,offレベル=−5V,周波数30Hz
の駆動信号を入力する。
At the time of inspection, the inspection control circuit 16 is connected to the liquid crystal display panel 11. The inspection control circuit 16 is connected to both ends Ta and Tb of the scan electrode 12c and the data electrode 12d, and supplies a drive signal necessary for the inspection. The inspection control circuit 16 is connected to one terminal (Ta- of the scan electrodes 12c-1).
1) and the other terminal (Tb-1), as shown in FIG. 3B, a first drive signal having a constant phase (positive / negative), frequency, and amplitude, for example, on level = 15V, off level. =-
A signal of 15 V, frequency of 30 Hz, and pulse width of 300 μs is input, and the scan electrode (1c) adjacent to the scan electrode (12c-1) is input.
2c-2) one terminal (Ta-2) and the other terminal (Tb-
As shown in FIG. 3C, the second drive signal has a phase difference from the first drive signal, for example, a phase of 30).
Input signals with a shift of 0 μs. In addition, the inspection control circuit 16
Is turned on to the data electrode 12d as shown in FIG.
Level = 5V, off level = -5V, frequency 30Hz
Input the drive signal of.

【0022】第1及び第2の駆動信号を入力した場合、
走査電極12c-1,12c-2が15Vのとき、薄膜トラ
ンジスタ12bがon状態となり、データ電極12dの
信号が画素に書き込まれる。走査電極12c-1,12c
-2が−15Vのときは薄膜トランジスタ12bがoff
状態となり、画素の電圧は保持される。
When the first and second drive signals are input,
When the scanning electrodes 12c-1 and 12c-2 are at 15V, the thin film transistor 12b is turned on, and the signal of the data electrode 12d is written in the pixel. Scan electrodes 12c-1, 12c
When -2 is -15V, thin film transistor 12b is off
Then, the voltage of the pixel is held.

【0023】次に検査方法について、説明する。図4に
本発明の一実施例の要部の等価回路、図5に本発明の一
実施例の動作説明図を示す。
Next, the inspection method will be described. FIG. 4 shows an equivalent circuit of a main part of one embodiment of the present invention, and FIG. 5 shows an operation explanatory diagram of one embodiment of the present invention.

【0024】走査電極12c-1とそれに隣接する走査電
極12c-2との間に短絡がなければ、図4(A)に示す
ように走査電極12c-1の両端Ta-1,Tb-1には+1
5Vの電圧が印加され、走査電極12c-1に接続された
すべての薄膜トランジスタ12b-1がオンになる。これ
により走査電極12c-1に接続された画素電極12a-1
には+5Vの電圧が印加され、液晶表示パネル11がノ
ーマリホワイト(液晶印加電圧0Vのとき白表示)であ
れば、黒表示となる。
If there is no short circuit between the scan electrode 12c-1 and the scan electrode 12c-2 adjacent thereto, as shown in FIG. 4 (A), both ends Ta-1 and Tb-1 of the scan electrode 12c-1 are connected. Is +1
A voltage of 5 V is applied and all the thin film transistors 12b-1 connected to the scan electrode 12c-1 are turned on. Thereby, the pixel electrode 12a-1 connected to the scanning electrode 12c-1
Is applied with a voltage of +5 V, and if the liquid crystal display panel 11 is normally white (white display when the liquid crystal applied voltage is 0 V), black display is performed.

【0025】また、このとき、走査電極12c-2の両端
Ta-2,Tb-2には−15Vの電圧が印加され、走査電
極12c-2に接続された薄膜トランジスタ12b-2がオ
フになる。これにより画素電極12a-2には前の周期の
電圧−5Vが保持されたままとなり、黒表示となる。
At this time, a voltage of -15 V is applied to both ends Ta-2 and Tb-2 of the scanning electrode 12c-2, and the thin film transistor 12b-2 connected to the scanning electrode 12c-2 is turned off. As a result, the pixel electrode 12a-2 keeps the voltage of -5 V in the previous cycle held, and black display is performed.

【0026】従って、走査電極12c間のいずれにも短
絡がない場合には液晶表示パネル11の全面が黒表示と
なる。
Therefore, when there is no short circuit between the scanning electrodes 12c, the entire surface of the liquid crystal display panel 11 is displayed in black.

【0027】走査電極12c-1とそれに隣接する走査電
極12c-2とに短絡がある場合には図4(B)に示すよ
うな等価回路となる。
When there is a short circuit between the scan electrode 12c-1 and the scan electrode 12c-2 adjacent thereto, the equivalent circuit is as shown in FIG. 4 (B).

【0028】図中において、r1 は端子Ta-1,Ta-2
から短絡箇所P0 迄の抵抗値、r2は端子Tb-1,Tb-
2から短絡箇所P0 迄の抵抗値であり、抵抗値r1 ,r
2 は短絡箇所P0 の位置によって異なる。
In the figure, r 1 is terminals Ta-1 and Ta-2.
To the short-circuit point P 0 , r 2 is the terminal Tb-1, Tb-
The resistance value from 2 to the short-circuited point P 0 , and the resistance values r 1 , r
2 depends on the position of the short-circuited point P 0 .

【0029】走査電極12c-1と12c-2に前記第1,
第2の駆動信号が入力されると、短絡箇所P0 で走査電
極12c-1の電圧+15Vが走査電極12c-2の電圧−
15Vで相殺され、電圧は0Vとなり、端子Ta-1,T
b-1は+15Vに保持される。
The first and second scanning electrodes 12c-1 and 12c-2 are provided on the scanning electrodes 12c-1 and 12c-2.
When the second drive signal is input, the voltage +15 V of the scan electrode 12c-1 at the short-circuited point P 0 is the voltage − of the scan electrode 12c-2 −.
Canceled by 15V, the voltage becomes 0V, and terminals Ta-1, T
b-1 is held at + 15V.

【0030】図5(A)にこのときの走査ライン方向上
の位置に対する走査電極電圧の特性を示す。図5(A)
に示す如く、短絡位置P0 で電圧は最小となり、両端子
Ta-1,Tb-1に向かって+15Vまで徐々に増加する
特性を示す。図5(B)に横軸を位置に対する画素電圧
の特性を示す。図5(B)は図5(A)と同様な特性を
示し、短絡位置P0 の画素電圧は最小となる。図5
(C)に液晶パネル11がノーマリホワイト(電圧が0
Vのとき白表示になる)で、コモン電極を0Vとしたと
きの位置に対する輝度の特性を示す。図5(C)に示す
ように輝度は短絡位置P0 で高くなる。
FIG. 5A shows the characteristics of the scanning electrode voltage with respect to the position on the scanning line direction at this time. Figure 5 (A)
As shown in FIG. 5 , the voltage becomes the minimum at the short-circuit position P 0 and gradually increases to +15 V toward both terminals Ta-1 and Tb-1. FIG. 5B shows the characteristic of the pixel voltage with respect to the position on the horizontal axis. FIG. 5B shows the same characteristics as FIG. 5A, and the pixel voltage at the short-circuit position P 0 becomes the minimum. Figure 5
In (C), the liquid crystal panel 11 is normally white (voltage is 0
The white characteristic is displayed at V), and the luminance characteristics with respect to the position when the common electrode is 0 V are shown. As shown in FIG. 5C, the brightness is high at the short circuit position P 0 .

【0031】従って、第1,第2の駆動信号を電極12
c-1と12c-2に入力したとき、輝度の変化を目視によ
り検知することにより、走査電極12c-1と12c-2間
の短絡の有無とその位置P0 を知ることができる。
Therefore, the first and second drive signals are applied to the electrode 12
When the change is input to c-1 and 12c-2, the change in brightness can be visually detected to determine the presence or absence of a short circuit between the scan electrodes 12c-1 and 12c-2 and the position P 0 thereof.

【0032】このような方法によれば、従来の検査時間
の1/2 以下とすることができる。
According to such a method, the inspection time can be reduced to 1/2 or less of the conventional inspection time.

【0033】なお、本実施例では目視により輝度の変化
を検出し、短絡位置を検知しているが、液晶表示パネル
11の表示画面の輝度をカメラ等で検出し、画像処理す
ることにより自動化も容易に行ない得る。
In this embodiment, the change in brightness is visually detected to detect the short-circuited position. However, the brightness of the display screen of the liquid crystal display panel 11 is detected by a camera or the like and image processing is performed to automate the process. You can do it easily.

【0034】図6に本発明の他の実施例の要部の平面図
を示す。同図中、図1,図2と同一構成部分には同一符
号を付し、その説明は省略する。
FIG. 6 shows a plan view of the essential part of another embodiment of the present invention. In the figure, the same components as those in FIGS. 1 and 2 are designated by the same reference numerals, and the description thereof will be omitted.

【0035】本実施例では隣接する走査電極12c-1と
12c-2の短絡検査のため図6(A)に示す如く、画素
電極12a,薄膜トランジスタ12b,走査電極12
c,データ電極12dの形成時に走査電極12c-1,1
2c-2の左端、右端部近傍を覆う絶縁膜17a-1,17
a-2,17b-1,17b-2を予め形成しておく。
In this embodiment, as shown in FIG. 6A, the pixel electrode 12a, the thin film transistor 12b, and the scan electrode 12 are used for short-circuit inspection of the adjacent scan electrodes 12c-1 and 12c-2.
c, scan electrodes 12c-1, 1 when forming the data electrode 12d
Insulating films 17a-1 and 17 for covering the left end and the right end of 2c-2
a-2, 17b-1, and 17b-2 are formed in advance.

【0036】検査時には図6(B)に示す如く、検査制
御回路16に接続されたショートバー18a-1,18a
-2,18b-1,18b-2により駆動信号を走査電極12
c-1,12c-2に供給する。ショートバー18b-1は走
査電極12c-1の右端部に形成された絶縁膜17b-1に
よって走査電極12c-1と接続され、走査電極12c-2
には接続しない構成とされている。ショートバー18b
-2は走査電極12c-2の右端部に形成された絶縁膜17
b-2によって走査電極12c-2と接続され、走査電極1
2c-1に接続しない構成とされている。ショートバー1
8a-1は走査電極12c-2及びCs電極12fの左端部
に形成された絶縁膜17a-1によって走査電極12c-1
と接続され、走査電極12c-2及びCs電極12fに接
続しない構成とされている。ショートバー18a-2は走
査電極12c-1及びCs電極12fの左端部に形成され
た絶縁膜17a-2によって走査電極12c-2と接続さ
れ、走査電極12c-1及びCs電極12fに接続しない
構成とされている。
At the time of inspection, as shown in FIG. 6B, the short bars 18a-1 and 18a connected to the inspection control circuit 16 are provided.
-2, 18b-1, 18b-2 drive signal to scan electrode 12
Supply to c-1, 12c-2. The short bar 18b-1 is connected to the scan electrode 12c-1 by an insulating film 17b-1 formed on the right end portion of the scan electrode 12c-1, and the scan electrode 12c-2.
It is configured not to connect to. Short bar 18b
-2 is an insulating film 17 formed on the right end of the scanning electrode 12c-2
b-2 is connected to the scan electrode 12c-2, and the scan electrode 1
2c-1 is not connected. Short bar 1
8a-1 is a scanning electrode 12c-1 formed by an insulating film 17a-1 formed at the left end of the scanning electrode 12c-2 and the Cs electrode 12f.
Is connected to the scanning electrode 12c-2 and the Cs electrode 12f. The short bar 18a-2 is connected to the scan electrode 12c-2 by the insulating film 17a-2 formed on the left end of the scan electrode 12c-1 and the Cs electrode 12f, but is not connected to the scan electrode 12c-1 and the Cs electrode 12f. It is said that.

【0037】以上の構成とすることにより4本のショー
トバー18a-1,18a-2,18b-1,18b-2の着脱
により容易に検査が行なえることになる。
With the above structure, the inspection can be easily performed by attaching and detaching the four short bars 18a-1, 18a-2, 18b-1, 18b-2.

【0038】[0038]

【発明の効果】上述の如く、本発明によれば、液晶表示
パネル全面の輝度を検出するだけで走査電極間の短絡を
検査することができるため、容易に検査が可能となり、
検査時間を短縮できると共に、実際の短絡により液晶表
示パネルに生じる現象を検出しているため、高精度の検
査が可能となる等の特長を有する。
As described above, according to the present invention, the short circuit between the scanning electrodes can be inspected only by detecting the brightness of the entire surface of the liquid crystal display panel, and therefore the inspection can be easily performed.
The inspection time can be shortened, and since the phenomenon that occurs in the liquid crystal display panel due to an actual short circuit is detected, the inspection can be performed with high accuracy.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例の概略構成図である。FIG. 1 is a schematic configuration diagram of an embodiment of the present invention.

【図2】本発明の一実施例の要部の平面図である。FIG. 2 is a plan view of an essential part of an embodiment of the present invention.

【図3】本発明の一実施例の信号波形図である。FIG. 3 is a signal waveform diagram according to an embodiment of the present invention.

【図4】本発明の一実施例の要部の等価回路図である。FIG. 4 is an equivalent circuit diagram of a main part of an embodiment of the present invention.

【図5】本発明の一実施例の動作を説明するための図で
ある。
FIG. 5 is a diagram for explaining the operation of the embodiment of the present invention.

【図6】本発明の他の実施例の要部の平面図である。FIG. 6 is a plan view of an essential part of another embodiment of the present invention.

【図7】液晶表示パネルの概略構成図である。FIG. 7 is a schematic configuration diagram of a liquid crystal display panel.

【符号の説明】[Explanation of symbols]

11 液晶表示パネル 12 TFT基板 12a 画素電極 12b 薄膜トランジスタ 12c 走査電極 13 コモン電極基板 13a カラーフィルタ 13b コモン電極 15 液晶 11 liquid crystal display panel 12 TFT substrate 12a pixel electrode 12b thin film transistor 12c scanning electrode 13 common electrode substrate 13a color filter 13b common electrode 15 liquid crystal

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 コモン電極(13b)が形成されたコモ
ン電極基板(13)と、画素電極(12a)及び該画素
電極(12a)にスイッチング素子(12b)を介して
接続され、該画素電極(12a)に走査ライン毎に電圧
を印加する複数の走査電極(12c)が形成された画素
電極基板(12)とで液晶(15)を挟持してなる液晶
表示パネル(11)で、該複数の走査電極(12c)間
の短絡を検査する液晶表示パネルの検査方法において、 前記複数の走査電極(12c)には奇数走査ラインと偶
数走査ラインとで位相の異なる駆動信号を夫々の走査電
極の両端(Ta,Tb)に供給して、前記スイッチング
素子(12b)を順次オンすることにより、前記液晶表
示パネル(11)を駆動させ、前記液晶表示パネル(1
1)の輝度を検出することにより前記走査電極間の短絡
を検査することを特徴とする液晶表示パネルの検査方
法。
1. A common electrode substrate (13) on which a common electrode (13b) is formed, a pixel electrode (12a) and the pixel electrode (12a) connected to each other via a switching element (12b). A liquid crystal display panel (11), in which a liquid crystal (15) is sandwiched between a pixel electrode substrate (12) having a plurality of scan electrodes (12c) for applying a voltage to each scan line, and a plurality of the plurality of scan electrodes (12c). In a method of inspecting a liquid crystal display panel for inspecting a short circuit between scan electrodes (12c), drive signals having different phases between odd scan lines and even scan lines are applied to the plurality of scan electrodes (12c) at both ends of each scan electrode. (Ta, Tb) to sequentially turn on the switching elements (12b) to drive the liquid crystal display panel (11), and to drive the liquid crystal display panel (1).
A method for inspecting a liquid crystal display panel, which comprises inspecting the short circuit between the scanning electrodes by detecting the luminance of 1).
【請求項2】 前記走査電極(12c)の両端(Ta,
Tb)夫々に奇数走査ライン及び偶数走査ラインを夫々
別々に接続するショートバー(18a-1,18a-2,1
8b-1,18b-2)により前記駆動信号を前記走査電極
(12c)に供給することを特徴とする請求項1記載の
液晶表示パネルの検査方法。
2. The both ends (Ta,
Tb) Short bars (18a-1, 18a-2, 1) that connect the odd scan lines and the even scan lines separately to each other.
8. The method for inspecting a liquid crystal display panel according to claim 1, wherein the drive signal is supplied to the scanning electrodes (12c) by 8b-1, 18b-2).
JP30730092A 1992-11-17 1992-11-17 Inspection method for liquid crystal display panel Withdrawn JPH06160898A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP30730092A JPH06160898A (en) 1992-11-17 1992-11-17 Inspection method for liquid crystal display panel

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP30730092A JPH06160898A (en) 1992-11-17 1992-11-17 Inspection method for liquid crystal display panel

Publications (1)

Publication Number Publication Date
JPH06160898A true JPH06160898A (en) 1994-06-07

Family

ID=17967488

Family Applications (1)

Application Number Title Priority Date Filing Date
JP30730092A Withdrawn JPH06160898A (en) 1992-11-17 1992-11-17 Inspection method for liquid crystal display panel

Country Status (1)

Country Link
JP (1) JPH06160898A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7038484B2 (en) 2004-08-06 2006-05-02 Toshiba Matsushita Display Technology Co., Ltd. Display device
JP2010139377A (en) * 2008-12-11 2010-06-24 Oht Inc Circuit pattern inspection device and method of inspecting circuit pattern thereof
US7796222B2 (en) 2004-08-06 2010-09-14 Toshiba Matsushita Display Technology Co., Ltd. Display device, inspection method for display device, and inspection device for display device
CN106054474A (en) * 2016-05-27 2016-10-26 深圳市华星光电技术有限公司 Liquid crystal display panel and liquid crystal display panel circuit monitoring method

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7038484B2 (en) 2004-08-06 2006-05-02 Toshiba Matsushita Display Technology Co., Ltd. Display device
US7796222B2 (en) 2004-08-06 2010-09-14 Toshiba Matsushita Display Technology Co., Ltd. Display device, inspection method for display device, and inspection device for display device
JP2010139377A (en) * 2008-12-11 2010-06-24 Oht Inc Circuit pattern inspection device and method of inspecting circuit pattern thereof
CN106054474A (en) * 2016-05-27 2016-10-26 深圳市华星光电技术有限公司 Liquid crystal display panel and liquid crystal display panel circuit monitoring method

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