CN103454794B - Lighting test jig and liquid crystal panel method of testing - Google Patents
Lighting test jig and liquid crystal panel method of testing Download PDFInfo
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- CN103454794B CN103454794B CN201310404897.XA CN201310404897A CN103454794B CN 103454794 B CN103454794 B CN 103454794B CN 201310404897 A CN201310404897 A CN 201310404897A CN 103454794 B CN103454794 B CN 103454794B
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2203/00—Function characteristic
- G02F2203/69—Arrangements or methods for testing or calibrating a device
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- Liquid Crystal (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
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Abstract
The invention discloses a kind of lighting test jig, for the lighting test operation in liquid crystal panel processing technique, described lighting test jig includes, the first conductive layer; And multiple conducting metal portions of the spaced arrangement being arranged on described first conductive layer and multiple insulation division, it is electrically connected with each other by described first conductive layer between the plurality of conducting metal portion; Wherein said conducting metal portion is higher than described insulation division; The invention also discloses and a kind of use the method that liquid crystal panel is carried out lighting test by measurement jig as previously mentioned. The present invention can be effectively reduced the False Rate of lighting test, has the drawback that real liquid crystal panel defect or the defect of measurement jig detected by confirming rapidly.
Description
Technical field
The present invention relates to a kind of measurement jig, particularly a kind of measurement jig carrying out lighting test in the liquid crystal panel course of processing, and use the method that liquid crystal panel tested by this measurement jig.
Background technology
Liquid crystal display, or claim LCD(LiquidCrystalDisplay), for the display device of planar ultra-thin, it is made up of a number of colour or monochrome pixels, is positioned over light source or reflecting surface front. Liquid crystal display power consumption is very low, and has high image quality, volume feature little, lightweight, and therefore extremely everybody favors, and becomes the main flow of display. Current liquid crystal display is with thin film transistor (TFT) (ThinFilmTransistor, TFT) liquid crystal display is main, and generally the making of Thin Film Transistor-LCD can be roughly divided into three parts: thin film transistor (TFT) array (TFTArray) preparation process and color filter preparation engineering, liquid crystal display assembling (LCCellAssembly) preparation process, LCD MODULE (LiquidCrystalModule, LCM) preparation process.
Liquid crystal panel is in the process made, it is necessary to carrying out multiple testing procedure, one of them critically important testing procedure is exactly that liquid crystal cell cut is tested (CellTest), confirmation liquid crystal cell whether existing defects. this test process is before this to liquid crystal panel input test signal so that it is pixel presents color, then passes through whether well defect detecting device observes each pixel one by one, and this process is called lighting test (Light-onTest). current factory is when producing in enormous quantities, in order to save cost, adopt the lighting test mode of short-circuiting bar (ShortingBar) more, all of data signal (Date) terminal generally can be interconnected to form a Date signal receiving end by ShortingBar lighting test mode, for scanning signal (Gate), then the Gate signal terminal of odd-numbered line is interconnected to form a Gate signal receiving end, the Gate signal terminal of even number line is interconnected to form the 2nd Gate signal receiving end, this test mode cost is low, measurement jig easily makes, but the defect that can detect is less,Further, owing to the quantity of signal terminal is a lot, it is possible that the situation of loose contact when being connected with each other by terminal, adopting ShortingBar lighting test mode to also exist bad for ShortingBar peripheral wiring, to be mistaken for liquid crystal panel bad.
Therefore, ShortingBar lighting test mode is adopted to detect that the liquid crystal panel of defect generally can adopt the lighting test mode of 1G1D to further confirm that, this test mode and ShortingBar mode the difference is that, Gate signal is divided into the scanning signal receiving end G1 of more groups, G2, ... Gn, as shown in Figure 1, the liquid crystal cell cut includes liquid crystal panel region 10 and pressing region 20, pressing region 20 is provided with multiple data signal terminal 201 and multiple scanning signal terminal 202, for data signal and scanning signal are linked in the pixel cell of liquid crystal panel, wherein, all of data signal terminal 201 is interconnected to form a Date signal receiving end D, scan signal terminal 202 and be then divided into the scanning signal receiving end G1 of many groups, G2, ... Gn, each group of scanning signal receiving end includes 300��800 scanning signal terminals 202, a multiplanar conductive glue 30 generally can be used at present to scan signal terminal by each group be connected with each other. adopt multiplanar conductive glue connection signal terminal can there is loose contact and cause the problem of line simulator, there is the situation of erroneous judgement.
Summary of the invention
In view of the deficiency that prior art exists, the invention provides a kind of lighting test jig, and use the method that liquid crystal panel tested by this measurement jig, the False Rate of lighting test can be effectively reduced, detected by confirming rapidly, have the drawback that real liquid crystal panel defect or the defect of measurement jig.
To achieve these goals, present invention employs following technical scheme:
A kind of lighting test jig, for the lighting test operation in liquid crystal panel processing technique, including:
First conductive layer;
Multiple conducting metal portions of the spaced arrangement being arranged on described first conductive layer and multiple insulation division, be electrically connected with each other by described first conductive layer between the plurality of conducting metal portion; Wherein said conducting metal portion is higher than described insulation division.
Preferably, the material of described first conductive layer is conducting resinl.
Preferably, described conducting metal portion 0��1mm higher than described insulation division.
Preferably, described conducting metal portion and described insulation division are strip structure.
Preferably, it is respectively provided with identical width between the plurality of conducting metal portion and between multiple insulation division.
Preferably, described conducting metal portion and described insulation division have identical width.
Preferably, the material in described conducting metal portion is wear-resistant conductive material, and described wear-resistant conductive material is Cu or Au.
Another aspect of the present invention is to provide a kind of liquid crystal panel method of testing, and the method comprising the steps of:
(1) liquid crystal panel is provided, described liquid crystal panel includes liquid crystal panel region and pressing region, described pressing region is provided with multiple data signal terminal and multiple scanning signal terminal, for being linked in the pixel cell of liquid crystal panel by data signal and scanning signal;
(2) all of data signal terminal is interconnected to form a Date signal receiving end D, all of scanning signal terminal is divided into many group scanning signal receiving end G1, G2 ... Gn, each group of scanning signal receiving end adopts measurement jig as above to be electrically connected with each other by scanning signal terminal therein, wherein, the conducting metal portion in described measurement jig is relative with described scanning signal terminal connects;
(3) data signal is input to described Date signal receiving end D, scanning signal is input to scanning signal receiving end G1, G2 ... Gn, described liquid crystal panel is carried out lighting test.
Preferably, each group of scanning signal terminal receiving terminal includes 300��800 scanning signal terminals.
Preferably, the scanning signal in step (3) is to be input to one by one in scanning signal receiving end G1, G2 ... Gn.
The present invention can be effectively reduced the False Rate of lighting test, has the drawback that real liquid crystal panel defect or the defect of measurement jig detected by confirming rapidly.
Accompanying drawing explanation
Fig. 1 is existing a kind of schematic diagram that liquid crystal panel carries out lighting test, wherein adopts a multiplanar conductive glue to be connected with each other by scanning signal terminal.
Fig. 2 is the front view of the measurement jig in one embodiment of the invention.
Fig. 3 is the top view of measurement jig as shown in Figure 2.
Detailed description of the invention
As it was previously stated, it is an object of the invention to provide a kind of lighting test jig, and using the method that liquid crystal panel tested by this measurement jig, described lighting test jig includes, the first conductive layer; And multiple conducting metal portions of the spaced arrangement being arranged on described first conductive layer and multiple insulation division, it is electrically connected with each other by described first conductive layer between the plurality of conducting metal portion; Wherein said conducting metal portion is higher than described insulation division. Described lighting test jig can be effectively reduced the False Rate of lighting test, has the drawback that real liquid crystal panel defect or the defect of measurement jig detected by confirming rapidly.
Below will in conjunction with accompanying drawing embodiment, the present invention will be further described.
Consulting Fig. 2 and Fig. 3, the lighting test jig in the present embodiment includes: the first conductive layer 401; And multiple conducting metal portions 402 of the spaced arrangement being arranged on described first conductive layer 401 and multiple insulation division 403, it is electrically connected with each other by described first conductive layer 401 between the plurality of conducting metal portion 402; Wherein said conducting metal portion 402 is higher than described insulation division 403, wherein, and described conducting metal portion 402 0��1mm higher than described insulation division 403.
Wherein, the material of described first conductive layer 401 is conducting resinl, and the material in described conducting metal portion 402 is wear-resistant conductive material, and described wear-resistant conductive material can be Cu or Au; In this embodiment, the material in conducting metal portion 402 is Cu.
Wherein, described conducting metal portion 402 and described insulation division 403 are strip structure, having identical width between the plurality of conducting metal portion 402 and between multiple insulation division 403, further, described conducting metal portion 402 has identical width with described insulation division 403.
The method that liquid crystal panel is carried out lighting test by measurement jig as above is used to include step:
(1) liquid crystal panel is provided, consult Fig. 1, described liquid crystal panel includes liquid crystal panel region 10 and pressing region 20, described pressing region 20 is provided with multiple data signal terminal 201 and multiple scanning signal terminal 202, for being linked in the pixel cell of liquid crystal panel by data signal and scanning signal;
(2) all of data signal terminal is interconnected to form a Date signal receiving end D, all of scanning signal terminal is divided into many group scanning signal receiving end G1, G2 ... Gn, each group of scanning signal receiving end adopts measurement jig as above to be electrically connected with each other by scanning signal terminal 202 therein, wherein, the conducting metal portion 402 in described measurement jig is relative with described scanning signal terminal 202 connects;
(3) data signal is input to described Date signal receiving end D, scanning signal is input to scanning signal receiving end G1, G2 ... Gn, described liquid crystal panel is carried out lighting test.
When there is defect in the liquid crystal panel region detecting that certain point therein scanning signal terminal is corresponding, the present embodiment provide lighting test jig dislocation connect, if defect point is not followed the movement of measurement jig and moved, then illustrate that this defect point is real liquid crystal panel defect; If defect point moves along with the movement of measurement jig, then illustrate that this defect point is not real liquid crystal panel defect. So that scanning signal receiving end G1 is tested, assume when carrying out testing for the first time, the 10th of lighting test jig conducting metal portion is connected with the 10th article of scanning signal terminal of scanning signal receiving end G1, it has been found that defect occurs in the 10th article of liquid crystal panel region scanning signal terminal corresponding; Now lighting test jig dislocation is connected, the 10th of lighting test jig conducting metal portion is connected with the 15th article of scanning signal terminal of scanning signal receiving end G1, if defect point is not followed the movement of measurement jig and is moved, also it is displayed as the 10th article of liquid crystal panel region corresponding to scanning signal terminal and defect occurs, then illustrate that this defect point is real liquid crystal panel defect; If defect point moves along with the movement of measurement jig, it is shown as the 15th article of liquid crystal panel region corresponding to scanning signal terminal and defect occurs, then illustrate that this defect point is not real liquid crystal panel defect. Dislocation connect confirm process can repeat repeatedly, thus, the present embodiment provide lighting test jig and method of testing, it is possible to rapidly confirm detected by have the drawback that real liquid crystal panel defect or the defect of measurement jig.
Wherein, each group of scanning signal terminal receiving terminal includes 300��800 scanning signal terminals 202.
Wherein, the scanning signal in step (3) is to be input to one by one in scanning signal receiving end G1, G2 ... Gn.
The present invention can be effectively reduced the False Rate of lighting test, has the drawback that real liquid crystal panel defect or the defect of measurement jig detected by confirming rapidly.
It should be noted that, in this article, the relational terms of such as first and second or the like is used merely to separate an entity or operation with another entity or operating space, and not necessarily requires or imply the relation that there is any this reality between these entities or operation or sequentially. And, term " includes ", " comprising " or its any other variant are intended to comprising of nonexcludability, so that include the process of a series of key element, method, article or equipment not only include those key elements, but also include other key elements being not expressly set out, or also include the key element intrinsic for this process, method, article or equipment. When there is no more restriction, statement " including ... " key element limited, it is not excluded that there is also other identical element in including the process of described key element, method, article or equipment.
The above is only the detailed description of the invention of the application; it should be pointed out that, for those skilled in the art, under the premise without departing from the application principle; can also making some improvements and modifications, these improvements and modifications also should be regarded as the protection domain of the application.
Claims (8)
1. a liquid crystal panel method of testing, including the step using lighting test jig that liquid crystal panel carries out lighting test, it is characterised in that described lighting test jig includes:
First conductive layer (401);Multiple conducting metal portions (402) of the spaced arrangement being arranged on described first conductive layer (401) and multiple insulation division (403), be electrically connected with each other by described first conductive layer (401) between the plurality of conducting metal portion (402); Wherein said conducting metal portion (402) is higher than described insulation division (403);
Described method of testing specifically includes step:
(1) liquid crystal panel is provided, described liquid crystal panel includes liquid crystal panel region (10) and pressing region (20), described pressing region (20) is provided with multiple data signal terminal (201) and multiple scanning signal terminal (202), for being linked in the pixel cell of liquid crystal panel by data signal and scanning signal;
(2) all of data signal terminal is interconnected to form a Date signal receiving end, all of scanning signal terminal is divided into many group scanning signal receiving end G1, G2 ... Gn, each group of scanning signal receiving end adopts described measurement jig scanning signal terminal (202) therein to be electrically connected with each other, wherein, the conducting metal portion (402) in described measurement jig is relative with described scanning signal terminal (202) connects;
(3) data signal is input to described Date signal receiving end, scanning signal is input to scanning signal receiving end G1, G2 ... Gn, described liquid crystal panel is carried out lighting test;
(4) when defect occurs in liquid crystal panel region certain point therein scanning signal terminal (202) correspondence being detected, this spot scan signal terminal (202) corresponding to defect to occur for benchmark, the position that described lighting test jig moves one or more scanning signal terminal (202) forms dislocation connection, if defect point is not followed the movement of measurement jig and moved, then this defect point is real liquid crystal panel defect; If defect point moves along with the movement of measurement jig, then this defect point is not real liquid crystal panel defect.
2. liquid crystal panel method of testing according to claim 1, it is characterised in that each group of scanning signal terminal receiving terminal includes 300��800 scannings signal terminal (202).
3. liquid crystal panel method of testing according to claim 1, it is characterised in that the scanning signal in step (3) is to be input to one by one in scanning signal receiving end G1, G2 ... Gn.
4. liquid crystal panel method of testing according to claim 1, it is characterised in that described conducting metal portion (402) 0��1mm higher than described insulation division (403).
5. liquid crystal panel method of testing according to claim 1, it is characterised in that described conducting metal portion (402) and described insulation division (403) are strip structure.
6. liquid crystal panel method of testing according to claim 5, it is characterised in that described conducting metal portion (402) and described insulation division (403) have identical width.
7. liquid crystal panel method of testing according to claim 1, it is characterised in that the material of described first conductive layer (401) is conducting resinl.
8. liquid crystal panel method of testing according to claim 1, it is characterised in that the material of described conducting metal portion (402) is wear-resistant conductive material, and described wear-resistant conductive material is Cu or Au.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310404897.XA CN103454794B (en) | 2013-09-06 | 2013-09-06 | Lighting test jig and liquid crystal panel method of testing |
| PCT/CN2013/083367 WO2015032106A1 (en) | 2013-09-06 | 2013-09-12 | Light-on test fixture, and testing method for liquid crystal panel |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201310404897.XA CN103454794B (en) | 2013-09-06 | 2013-09-06 | Lighting test jig and liquid crystal panel method of testing |
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| Publication Number | Publication Date |
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| CN103454794A CN103454794A (en) | 2013-12-18 |
| CN103454794B true CN103454794B (en) | 2016-06-08 |
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| CN201310404897.XA Active CN103454794B (en) | 2013-09-06 | 2013-09-06 | Lighting test jig and liquid crystal panel method of testing |
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| CN (1) | CN103454794B (en) |
| WO (1) | WO2015032106A1 (en) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106814478A (en) * | 2016-01-27 | 2017-06-09 | 北京瑞荣达电子技术有限公司 | Method for positioning of probe and system during liquid crystal panel lighting test |
| CN107564446A (en) * | 2017-09-30 | 2018-01-09 | 深圳市华星光电半导体显示技术有限公司 | A kind of panel lighting machine, panel lighting test system and method for testing |
| CN109916595B (en) * | 2019-03-27 | 2021-01-22 | 京东方科技集团股份有限公司 | Lighting fixture and large-visual-angle optical testing device |
| CN110262097A (en) * | 2019-07-01 | 2019-09-20 | 苏州精濑光电有限公司 | A kind of lighting jig leans on position mechanism |
| CN113077726B (en) * | 2021-03-23 | 2022-06-10 | 深圳市华星光电半导体显示技术有限公司 | Display panel and preparation method thereof |
| CN115167021B (en) * | 2022-08-05 | 2023-07-25 | 苏州华星光电技术有限公司 | Display panel detection method and detection device |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0066087B1 (en) * | 1981-05-26 | 1985-09-04 | International Business Machines Corporation | Inspection of unsintered single layer or multilayer ceramics using a broad area electrical contacting structure |
| US6144216A (en) * | 1995-04-01 | 2000-11-07 | Enplas Corporation | Electric contact apparatus for inspecting a liquid crystal display panel |
| CN201138366Y (en) * | 2008-01-10 | 2008-10-22 | 环国科技股份有限公司 | Panel test structure |
| CN102681227A (en) * | 2012-05-30 | 2012-09-19 | 深圳市华星光电技术有限公司 | Detection method for liquid crystal display panel |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61250906A (en) * | 1985-04-26 | 1986-11-08 | ジェイエスアール株式会社 | Conductive elastomer sheet |
| AU2003211368A1 (en) * | 2002-03-07 | 2003-09-16 | Jsr Corporation | Anisotropic conductive connector and its production method, and circuit device test instrument |
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2013
- 2013-09-06 CN CN201310404897.XA patent/CN103454794B/en active Active
- 2013-09-12 WO PCT/CN2013/083367 patent/WO2015032106A1/en active Application Filing
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0066087B1 (en) * | 1981-05-26 | 1985-09-04 | International Business Machines Corporation | Inspection of unsintered single layer or multilayer ceramics using a broad area electrical contacting structure |
| US6144216A (en) * | 1995-04-01 | 2000-11-07 | Enplas Corporation | Electric contact apparatus for inspecting a liquid crystal display panel |
| CN201138366Y (en) * | 2008-01-10 | 2008-10-22 | 环国科技股份有限公司 | Panel test structure |
| CN102681227A (en) * | 2012-05-30 | 2012-09-19 | 深圳市华星光电技术有限公司 | Detection method for liquid crystal display panel |
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| Publication number | Publication date |
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| WO2015032106A1 (en) | 2015-03-12 |
| CN103454794A (en) | 2013-12-18 |
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