CN104254902A - 离子化方法、质谱分析方法、提取方法和提纯方法 - Google Patents

离子化方法、质谱分析方法、提取方法和提纯方法 Download PDF

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Publication number
CN104254902A
CN104254902A CN201380022088.0A CN201380022088A CN104254902A CN 104254902 A CN104254902 A CN 104254902A CN 201380022088 A CN201380022088 A CN 201380022088A CN 104254902 A CN104254902 A CN 104254902A
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CN
China
Prior art keywords
liquid
substrate
probe
ionization
substance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201380022088.0A
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English (en)
Chinese (zh)
Inventor
大塚洋一
荒川隆一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Kansai University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc, Kansai University filed Critical Canon Inc
Publication of CN104254902A publication Critical patent/CN104254902A/zh
Pending legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/165—Electrospray ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0454—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for vaporising using mechanical energy, e.g. by ultrasonic vibrations

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
CN201380022088.0A 2012-03-01 2013-02-28 离子化方法、质谱分析方法、提取方法和提纯方法 Pending CN104254902A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2012-045922 2012-03-01
JP2012045922A JP5955033B2 (ja) 2012-03-01 2012-03-01 イオン化方法、質量分析方法、抽出方法及び精製方法
PCT/JP2013/001237 WO2013128933A1 (ja) 2012-03-01 2013-02-28 イオン化方法、質量分析方法、抽出方法及び精製方法

Publications (1)

Publication Number Publication Date
CN104254902A true CN104254902A (zh) 2014-12-31

Family

ID=49082144

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201380022088.0A Pending CN104254902A (zh) 2012-03-01 2013-02-28 离子化方法、质谱分析方法、提取方法和提纯方法

Country Status (5)

Country Link
US (1) US9190257B2 (enExample)
EP (1) EP2822023A4 (enExample)
JP (1) JP5955033B2 (enExample)
CN (1) CN104254902A (enExample)
WO (1) WO2013128933A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108663437A (zh) * 2018-06-19 2018-10-16 苏州芷宁信息科技有限公司 一种快速筛查标的物的方法

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JP5955032B2 (ja) 2012-03-01 2016-07-20 キヤノン株式会社 イオン化方法、質量分析方法、抽出方法及び精製方法
US9230787B2 (en) 2013-08-02 2016-01-05 Canon Kabushiki Kaisha Ionization apparatus, mass spectrometer including ionization apparatus, and image forming system
JP6339883B2 (ja) 2013-08-02 2018-06-06 キヤノン株式会社 イオン化装置、それを有する質量分析装置及び画像作成システム
WO2015019157A1 (en) * 2013-08-07 2015-02-12 Dh Technologies Development Pte. Ltd. Enhanced spray formation for liquid samples
US9390901B2 (en) * 2014-10-31 2016-07-12 Ut-Battelle, Llc System and method for liquid extraction electrospray-assisted sample transfer to solution for chemical analysis
GB201522594D0 (en) 2015-12-22 2016-02-03 Micromass Ltd Secondary ultrasonic nebulisation

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EP2017610A1 (en) * 2006-04-28 2009-01-21 University of Yamanashi Ionizing method and device by electrospray
CN101464427A (zh) * 2007-12-21 2009-06-24 清华大学 敞开式喷雾场解吸离子化方法及离子化装置

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US5945678A (en) 1996-05-21 1999-08-31 Hamamatsu Photonics K.K. Ionizing analysis apparatus
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JP4167593B2 (ja) 2002-01-31 2008-10-15 株式会社日立ハイテクノロジーズ エレクトロスプレイイオン化質量分析装置及びその方法
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6566653B1 (en) * 2002-01-23 2003-05-20 International Business Machines Corporation Investigation device and method
EP2017610A1 (en) * 2006-04-28 2009-01-21 University of Yamanashi Ionizing method and device by electrospray
CN101464427A (zh) * 2007-12-21 2009-06-24 清华大学 敞开式喷雾场解吸离子化方法及离子化装置

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PATRICK J. ROACH等: "Nanospray desorption electrospray ionization: an ambient method forliquid-extraction surface sampling in mass spectrometry", 《ANALYST》 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108663437A (zh) * 2018-06-19 2018-10-16 苏州芷宁信息科技有限公司 一种快速筛查标的物的方法

Also Published As

Publication number Publication date
EP2822023A4 (en) 2015-10-28
JP2013181841A (ja) 2013-09-12
JP5955033B2 (ja) 2016-07-20
US9190257B2 (en) 2015-11-17
WO2013128933A1 (ja) 2013-09-06
EP2822023A1 (en) 2015-01-07
US20130334030A1 (en) 2013-12-19

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SE01 Entry into force of request for substantive examination
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Effective date of registration: 20151120

Address after: Tokyo, Japan

Applicant after: Canon K. K.

Address before: Osaka

Applicant before: School Corp. Kansai University

Applicant before: Canon K. K.

AD01 Patent right deemed abandoned

Effective date of abandoning: 20170524

AD01 Patent right deemed abandoned