CN104251869B - 利用模块化传送链来操作射线照相检查系统的方法 - Google Patents

利用模块化传送链来操作射线照相检查系统的方法 Download PDF

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CN104251869B
CN104251869B CN201410302422.4A CN201410302422A CN104251869B CN 104251869 B CN104251869 B CN 104251869B CN 201410302422 A CN201410302422 A CN 201410302422A CN 104251869 B CN104251869 B CN 104251869B
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segment
image
conveyer chain
modularization
radiation
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CN104251869A (zh
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X·王
N·J·金
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Mettler Toledo Safeline X Ray Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T7/00Details of radiation-measuring instruments
    • G01T7/005Details of radiation-measuring instruments calibration techniques
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01VGEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/0002Inspection of images, e.g. flaw detection
    • G06T7/0004Industrial image inspection
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00Image analysis
    • G06T7/10Segmentation; Edge detection
    • G06T7/194Segmentation; Edge detection involving foreground-background segmentation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/60Specific applications or type of materials
    • G01N2223/643Specific applications or type of materials object on conveyor
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10116X-ray image
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/10Image acquisition modality
    • G06T2207/10116X-ray image
    • G06T2207/10121Fluoroscopy
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • G06T2207/30128Food products
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00Indexing scheme for image analysis or image enhancement
    • G06T2207/30Subject of image; Context of image processing
    • G06T2207/30108Industrial image inspection
    • G06T2207/30136Metal

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Molecular Biology (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Quality & Reliability (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
  • Multimedia (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
CN201410302422.4A 2013-06-27 2014-06-27 利用模块化传送链来操作射线照相检查系统的方法 Active CN104251869B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP13174101.9 2013-06-27
EP13174101.9A EP2818898B1 (en) 2013-06-27 2013-06-27 Method of operating a radiographic inspection system with a modular conveyor chain

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CN104251869A CN104251869A (zh) 2014-12-31
CN104251869B true CN104251869B (zh) 2019-06-21

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US (1) US9727961B2 (https=)
EP (1) EP2818898B1 (https=)
JP (1) JP6386811B2 (https=)
CN (1) CN104251869B (https=)
AU (1) AU2014202473B2 (https=)
CA (1) CA2852521C (https=)
ES (1) ES2584153T3 (https=)
IN (1) IN2014MU01928A (https=)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016203330A1 (en) * 2015-06-16 2016-12-22 Dylog Italia S.P.A. A non-destructive x-ray inspection machine, devices provided for such machine and method for operating the same
TWI582557B (zh) * 2015-07-15 2017-05-11 由田新技股份有限公司 印魚式線性編碼器及包含印魚式線性編碼器的光學檢測平台
TWI577973B (zh) * 2015-07-15 2017-04-11 由田新技股份有限公司 往復式線性編碼器及具有往復式線性編碼器的光學檢測平台
JP6774895B2 (ja) * 2017-03-09 2020-10-28 アンリツインフィビス株式会社 X線検査装置
JP6901294B2 (ja) * 2017-03-16 2021-07-14 アンリツ株式会社 X線検査装置
DE102017213510A1 (de) * 2017-08-03 2019-02-07 Robert Bosch Gmbh Verfahren und Vorrichtung zum Erzeugen eines maschinellen Lernsystems, und virtuelle Sensorvorrichtung
US10633194B2 (en) 2018-06-21 2020-04-28 Thermal Product Solutions Conveyance system with variable speed rollers
WO2022040511A1 (en) * 2020-08-21 2022-02-24 Elemental LED, Inc. Hinged channel system for linear lighting
CN118922711A (zh) * 2022-03-24 2024-11-08 赛默飞世尔科学测量技术有限公司 衬底合金影响补偿
DE102022114371A1 (de) 2022-06-08 2023-12-14 Krones Aktiengesellschaft Vorrichtung und Verfahren zum Inspizieren von Behältnissen mit Röntgenstrahlung
CN119343598A (zh) * 2022-06-08 2025-01-21 克朗斯股份公司 用于通过x射线辐射检测容器的设备和方法
CN116297558B (zh) * 2022-12-21 2026-03-27 上海微现检测设备有限公司 一种提升瓶装物检测精度的方法、装置及异物检测设备

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101793845A (zh) * 2010-02-04 2010-08-04 上海英迈吉东影图像设备有限公司 一种煤矿皮带x射线透视检测系统和方法
CN201749091U (zh) * 2010-02-04 2011-02-16 上海英迈吉东影图像设备有限公司 一种煤矿皮带x射线透视检测系统
CN102590240A (zh) * 2012-01-16 2012-07-18 西安交通大学 工业射线检测底片数字化装置

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3768645A (en) * 1971-02-22 1973-10-30 Sunkist Growers Inc Method and means for automatically detecting and sorting produce according to internal damage
JPH03116299A (ja) * 1989-09-29 1991-05-17 Hitachi Medical Corp X線荷物検査装置
JP2001091480A (ja) * 1999-09-22 2001-04-06 Shimadzu Corp X線検査装置および充填量算出方法
DE20217559U1 (de) * 2002-11-12 2003-01-16 Heuft Systemtechnik Gmbh Vorrichtung zur Untersuchung von gefüllten Behältern mittels Röntgenstrahlen
US7215801B2 (en) 2003-06-05 2007-05-08 General Electric Company Method, system and apparatus for processing radiographic images of scanned objects
JP2007132796A (ja) * 2005-11-10 2007-05-31 Ishida Co Ltd X線検査装置およびx線検査プログラム
JP5041751B2 (ja) * 2006-07-24 2012-10-03 株式会社イシダ X線検査装置およびx線検査プログラム
GB0717520D0 (en) * 2007-09-08 2007-10-17 Mettler Toledo Safeline X Ray Inspection system
WO2009114928A1 (en) * 2008-03-17 2009-09-24 Optosecurity, Inc. Method and apparatus for assessing characteristics of liquids
US8867816B2 (en) * 2008-09-05 2014-10-21 Optosecurity Inc. Method and system for performing X-ray inspection of a liquid product at a security checkpoint
EP2256069A1 (en) * 2009-05-29 2010-12-01 Mettler-Toledo Safeline X-Ray Limited Conveyor chain for a radiographic inspection system and radiographic inspection system
CN101936924B (zh) * 2009-06-30 2012-07-04 同方威视技术股份有限公司 物品检查系统
EP2742369B1 (en) * 2011-08-12 2020-11-11 Smiths Heimann GmbH Adaptable screening checkpoint
EP2711694A1 (en) * 2012-09-21 2014-03-26 Mettler-Toledo Safeline X-Ray Limited Method of operating a radiographic inspection system with a modular conveyor chain

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101793845A (zh) * 2010-02-04 2010-08-04 上海英迈吉东影图像设备有限公司 一种煤矿皮带x射线透视检测系统和方法
CN201749091U (zh) * 2010-02-04 2011-02-16 上海英迈吉东影图像设备有限公司 一种煤矿皮带x射线透视检测系统
CN102590240A (zh) * 2012-01-16 2012-07-18 西安交通大学 工业射线检测底片数字化装置

Also Published As

Publication number Publication date
EP2818898B1 (en) 2016-04-27
CA2852521C (en) 2021-07-20
ES2584153T3 (es) 2016-09-26
AU2014202473A1 (en) 2015-01-22
CA2852521A1 (en) 2014-12-27
US20150003583A1 (en) 2015-01-01
JP2015014598A (ja) 2015-01-22
CN104251869A (zh) 2014-12-31
EP2818898A1 (en) 2014-12-31
IN2014MU01928A (https=) 2015-09-04
JP6386811B2 (ja) 2018-09-05
AU2014202473B2 (en) 2016-10-27
US9727961B2 (en) 2017-08-08

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