GB0717520D0 - Inspection system - Google Patents

Inspection system

Info

Publication number
GB0717520D0
GB0717520D0 GBGB0717520.1A GB0717520A GB0717520D0 GB 0717520 D0 GB0717520 D0 GB 0717520D0 GB 0717520 A GB0717520 A GB 0717520A GB 0717520 D0 GB0717520 D0 GB 0717520D0
Authority
GB
United Kingdom
Prior art keywords
inspection system
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
GBGB0717520.1A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mettler Toledo Safeline X Ray Ltd
Original Assignee
Mettler Toledo Safeline X Ray Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mettler Toledo Safeline X Ray Ltd filed Critical Mettler Toledo Safeline X Ray Ltd
Priority to GBGB0717520.1A priority Critical patent/GB0717520D0/en
Publication of GB0717520D0 publication Critical patent/GB0717520D0/en
Priority to PCT/GB2008/003012 priority patent/WO2009030923A1/en
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T7/00—Details of radiation-measuring instruments
    • G01T7/005—Details of radiation-measuring instruments calibration techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
GBGB0717520.1A 2007-09-08 2007-09-08 Inspection system Ceased GB0717520D0 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
GBGB0717520.1A GB0717520D0 (en) 2007-09-08 2007-09-08 Inspection system
PCT/GB2008/003012 WO2009030923A1 (en) 2007-09-08 2008-09-08 Inspection system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB0717520.1A GB0717520D0 (en) 2007-09-08 2007-09-08 Inspection system

Publications (1)

Publication Number Publication Date
GB0717520D0 true GB0717520D0 (en) 2007-10-17

Family

ID=38640472

Family Applications (1)

Application Number Title Priority Date Filing Date
GBGB0717520.1A Ceased GB0717520D0 (en) 2007-09-08 2007-09-08 Inspection system

Country Status (2)

Country Link
GB (1) GB0717520D0 (en)
WO (1) WO2009030923A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2711694A1 (en) * 2012-09-21 2014-03-26 Mettler-Toledo Safeline X-Ray Limited Method of operating a radiographic inspection system with a modular conveyor chain
ES2584153T3 (en) * 2013-06-27 2016-09-26 Mettler-Toledo Safeline X-Ray Limited Operating procedure of a radiographic inspection system with a modular conveyor chain

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55145481A (en) * 1979-04-28 1980-11-13 Canon Inc Mos image sensor
US6175383B1 (en) * 1996-11-07 2001-01-16 California Institute Of Technology Method and apparatus of high dynamic range image sensor with individual pixel reset
CN1276870A (en) * 1997-10-10 2000-12-13 模拟技术公司 CT target detection using surface normals
US8009206B2 (en) * 2001-01-11 2011-08-30 Melexis Tessenderlo Nv Adaptive sensitivity control, on a pixel-by-pixel basis, for a digital imager
US7242429B1 (en) * 2002-01-03 2007-07-10 Smal Camera Technologies Method for cancellation of the effect of charge feedthrough on CMOS pixel output
US7400709B2 (en) * 2005-09-30 2008-07-15 Mettler-Toledo Safeline X-Ray Limited X-ray inspection system

Also Published As

Publication number Publication date
WO2009030923A1 (en) 2009-03-12

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Legal Events

Date Code Title Description
AT Applications terminated before publication under section 16(1)