CN104215431A - Rapid tilting mirror performance testing device - Google Patents

Rapid tilting mirror performance testing device Download PDF

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Publication number
CN104215431A
CN104215431A CN201410496058.XA CN201410496058A CN104215431A CN 104215431 A CN104215431 A CN 104215431A CN 201410496058 A CN201410496058 A CN 201410496058A CN 104215431 A CN104215431 A CN 104215431A
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CN
China
Prior art keywords
mirror
module
fast anti
performance testing
testing device
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Pending
Application number
CN201410496058.XA
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Chinese (zh)
Inventor
李国会
张凯
唐淳
杨媛
雒仲祥
何忠武
向汝建
徐宏来
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Institute of Applied Electronics of CAEP
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Institute of Applied Electronics of CAEP
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Application filed by Institute of Applied Electronics of CAEP filed Critical Institute of Applied Electronics of CAEP
Priority to CN201410496058.XA priority Critical patent/CN104215431A/en
Publication of CN104215431A publication Critical patent/CN104215431A/en
Pending legal-status Critical Current

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Abstract

The invention provides a rapid tilting mirror performance testing device. The rapid tilting mirror performance testing device comprises a fast reflecting mirror, a magnifying device, a DA (digital/analog) module, a PID (proportion-integration-differentiation) module, an AD (analog/digital) module, a computer, a monitor, a detecting beam contracting system, parallel light pipes and a reflector; parallel light beams emitted by the parallel light pipes enter the detecting beam contracting system after passing through the reflector and the fast reflecting mirror; the detecting beam contracting system is connected with the monitor and the computer; signals output by the computer are input into the fast reflecting mirror after being processed through the AD module, the PID module, the DA module and the magnifying device. The rapid tilting mirror performance testing device can overcome the deficiencies of testing methods and testing devices in existing fast reflecting mirror testing and help testing all the performance parameters of the fast reflecting mirror, including dynamic range, response speed, linearity, closed-loop bandwidth, resolution and the like; meanwhile, fast reflecting mirror performance testing light paths of the method can also be used for debugging the fast reflecting mirror performance parameters, namely, matching with PID related parameters.

Description

A kind of quick titling mirror performance testing device
Technical field
What the present invention relates to is fast anti-mirror performance test field in ADAPTIVE OPTICS SYSTEMS, especially a kind of quick titling mirror performance testing device.
Background technology
In optical system, light source launch light beam through parallel beam expand device, catoptron, spectroscope and contracting bundle device etc. in transmitting procedure, because light path is longer, vibration of optical table and laser thermal effect cause mirror holder etc. to produce thermal distoftion, cause receiving target surface glazing spot rock or drift about, for target following or aiming, hot spot will be produced and depart from target, phenomenon of namely missing the target, affect pointing accuracy or target practice effect.In order to reduce rocking or drifting about of hot spot; improve pointing accuracy; in such optical system, the modes such as vibration damping, vibration isolation or cooling mirror holder often can be taked to reduce rocking of hot spot, meanwhile, also need the measure of taking the initiative; suppress rocking of hot spot; under normal circumstances, fast anti-mirror is installed in the optical path, is used for carrying out real-time closed-loop correction to optical axis; be stabilized on target location by hot spot, improve the accuracy rate of practicing shooting.And fast anti-mirror is before adding light path, need to carry out comprehensive performance parameter test, comprise dynamic range, response speed, the linearity, closed-loop bandwidth and resolution etc., effectively correct to confirm whether the performance of this fast anti-mirror can rock this hot spot or drift about.At present, in these performance parameters, some parameters adopt spectrum analyzer to test, some parameters carry out parameter matching in actual light path, and the parameter also had carries out rough test, do not set up more professional method of testing or means, simultaneously, major part spectrum analyzer price is higher, and cannot accept for general user, this is the weak point existing for prior art.
Summary of the invention
Object of the present invention, be exactly for the deficiency existing for prior art, and a kind of technical scheme of quick titling mirror performance testing device is provided, the program overcomes the defect of method of testing and proving installation in current fast anti-mirror performance test, the over-all properties parameter of fast anti-mirror can be tested, comprise dynamic range, response speed, the linearity, closed-loop bandwidth and resolution etc., simultaneously, this fast anti-mirror performance test light path also may be used for the debugging that fast anti-mirror performance is participated in the experiment, and namely mates PID correlation parameter.
This programme is achieved by the following technical measures: a kind of quick titling mirror performance testing device, includes fast anti-mirror, multiplying arrangement, D/A module, PID module, A/D module, computing machine, monitor, detection contracting beam system, parallel light tube, catoptron; Parallel light tube is launched parallel beam and after catoptron and fast anti-mirror refraction, is injected detection contracting beam system successively; Detection contracting beam system is connected with monitor and computing machine; The signal of computer export inputs fast anti-mirror successively after A/D module, PID module, D/A module and multiplying arrangement process.
Preferred as this programme: fast anti-mirror is the fast anti-mirror of voice coil loudspeaker voice coil or piezoelectric ceramics.
Preferred as this programme: the bore of parallel light tube and detection contracting beam system and the size of fast anti-mirror match.
Preferred as this programme: the focal length of detection contracting beam system and the performance parameter to be measured of fast anti-mirror match.
Preferred as this programme: detection contracting beam system includes high wideband detector and device is restrainted in contracting; High wideband detector is high precision high frame rate CMOS camera or high bandwidth PSD.
Preferred as this programme: multiplying arrangement is voltage amplifier or current amplifier; The type of multiplying arrangement and the driving type matching of fast anti-mirror.
The beneficial effect of this programme can be learnt according to describing of such scheme, because directional light incides contracting bundle detection system after catoptron and fast anti-mirror are launched in this scenario, high bandwidth detector in it realizes the position sensing to hot spot, monitor is monitored hot spot simultaneously, computer acquisition processing image information through AD conversion, PID controls and DA exports, multiplying arrangement by amplify after DA signal loading on fast anti-mirror, fast anti-mirror produces corresponding deflection, realize regulating facula position, its regulating power embodies the performance of fast anti-mirror, also fast anti-mirror performance test has namely been carried out.Switch different focal lengths, select corresponding detector, the test to dissimilar fast anti-mirror over-all properties parameter can be realized, simultaneously, this optical system for testing also can be debugged the performance parameter of fast anti-mirror, and as the performance adjustment system of fast anti-mirror, namely the coupling of the correlation parameter such as PID is arranged.
As can be seen here, the present invention compared with prior art, has outstanding substantive distinguishing features and progress significantly, and its beneficial effect implemented also is apparent.
Accompanying drawing explanation
Fig. 1 is the structural representation of the specific embodiment of the invention.
In figure, 1 is fast anti-mirror, and 2 is multiplying arrangement, and 3 is D/A module, and 4 is PID module, and 5 is A/D module, and 6 for calculating certainly, and 7 is monitor, and 8 is detection contracting beam system, and 9 is parallel light tube, and 10 is catoptron.
Embodiment
All features disclosed in this instructions, or the step in disclosed all methods or process, except mutually exclusive feature and/or step, all can combine by any way.
Arbitrary feature disclosed in this instructions (comprising any accessory claim, summary and accompanying drawing), unless specifically stated otherwise, all can be replaced by other equivalences or the alternative features with similar object.That is, unless specifically stated otherwise, each feature is an example in a series of equivalence or similar characteristics.
As Fig. 1, fast anti-mirror Performance Test System of the present invention and method of testing comprise fast anti-mirror, multiplying arrangement, D/A module, PID module, A/D module, computing machine, monitor, detection contracting beam system, parallel light tube and catoptron.The directional light that parallel light tube is launched enters in the detector in detection contracting beam system after catoptron and fast anti-mirror reflection, by detector detect hot spot positional information and by the information transmission that detects to computing machine, computing machine outputs to A/D module after carrying out image procossing to the information received, A/D module outputs to PID module after the information received is carried out analog to digital conversion, PID module outputs to D/A module after processing the information received, D/A module outputs to multiplying arrangement after the information received is carried out digital-to-analog conversion, the DA signal of amplification outputs on fast anti-mirror by multiplying arrangement, fast anti-mirror produces corresponding deflection, regulate facula position, detector detects facula position again subsequently, again repeat said process, realize the adjustment of hot spot.
During dynamic range test, detector record original state facula mass center position, certain voltage or electric current is loaded to fast anti-mirror, allow it deflect, when fast anti-mirror deflects into extreme position, the facula mass center position of detector detection, the difference that front and back are twice converts angle information to, is namely the dynamic range of fast anti-mirror.
During linearity test, load different voltage or electric current, record the centroid position of each state hot spot to fast anti-mirror 1, the mode that these centroid positions are added up is depicted as curve, the linearity of curve characterizes linearity during fast anti-mirror execution instruction.
During resolution test, small voltage or electric current is loaded to fast anti-mirror 1, detector detection facula mass center position, when voltage or electric current to a certain extent little, when the change in location of not glossing up differentiated by detector, the angle information that before and after twice on-load voltage, detector barycenter difference converts to is the angular resolution of fast anti-mirror, the detection accuracy of this resolution and detector has direct relation, according to the service condition of fast anti-mirror 1, the focal length of detection contracting beam system 8 mates with the precision of detector, can meet the service precision of fast anti-mirror.
During response speed test, load certain voltage or electric current to fast anti-mirror, allow fast anti-mirror follow the tracks of step signal or sinusoidal signal, the execution result curve of ideal signal curve and fast anti-mirror 1 contrasts, and difference between the two characterizes the response speed of fast anti-mirror.
During closed-loop bandwidth test, carry out wide bandwidth frequency sweep to fast anti-mirror 1, the curve formed after frequency sweep carries out Fourier transform, the frequency corresponding to its point of crossing, namely thinks the closed-loop bandwidth of fast anti-mirror.
The present invention is not limited to aforesaid embodiment.The present invention expands to any new feature of disclosing in this manual or any combination newly, and the step of the arbitrary new method disclosed or process or any combination newly.

Claims (6)

1. a quick titling mirror performance testing device, is characterized in that: include fast anti-mirror, multiplying arrangement, D/A module, PID module, A/D module, computing machine, monitor, detection contracting beam system, parallel light tube, catoptron; The parallel beam that described parallel light tube is launched injects detection contracting beam system successively after catoptron and fast anti-mirror reflection; Described detection contracting beam system is connected with monitor and computing machine; The signal of described computer export inputs fast anti-mirror successively after A/D module, PID module, D/A module and multiplying arrangement.
2. a kind of quick titling mirror performance testing device according to claim 1, is characterized in that: described fast anti-mirror is the fast anti-mirror of voice coil loudspeaker voice coil or piezoelectric ceramics.
3. a kind of quick titling mirror performance testing device according to claim 1, is characterized in that: the bore of described parallel light tube and detection contracting beam system and the size of fast anti-mirror match.
4. a kind of quick titling mirror performance testing device according to claim 1, is characterized in that: the described focal length of detection contracting beam system and the performance parameter to be measured of fast anti-mirror match.
5. a kind of quick titling mirror performance testing device according to claim 1, is characterized in that: described detection contracting beam system includes high wideband detector and contracting bundle device; Described high wideband detector is high precision high frame rate CMOS camera or high bandwidth PSD.
6. a kind of quick titling mirror performance testing device according to claim 1, is characterized in that: described multiplying arrangement is voltage amplifier or current amplifier; The type of described multiplying arrangement and the driving type matching of fast anti-mirror.
CN201410496058.XA 2014-09-25 2014-09-25 Rapid tilting mirror performance testing device Pending CN104215431A (en)

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Cited By (9)

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Publication number Priority date Publication date Assignee Title
CN104811244A (en) * 2015-03-26 2015-07-29 中国科学院上海光学精密机械研究所 Spatial light to single-mode fiber coupling system based on laser nutation
CN106768885A (en) * 2016-12-16 2017-05-31 中国航空工业集团公司洛阳电光设备研究所 A kind of device and method of testing for testing speculum resolution ratio
CN108871559A (en) * 2018-07-13 2018-11-23 中国工程物理研究院计量测试中心 A kind of calibration method of beam quality β factor measuring system
CN109387164A (en) * 2018-11-23 2019-02-26 中国航空工业集团公司洛阳电光设备研究所 Measure the portable focal length heavy caliber device and measurement method of product optical axis deviation
CN110530612A (en) * 2019-09-04 2019-12-03 中国科学院合肥物质科学研究院 A kind of system and its test method using PSD test tilting mirror
CN110631808A (en) * 2019-09-25 2019-12-31 湖北航天技术研究院总体设计所 Portable fast-reflection mirror performance automatic test system and method
CN110715795A (en) * 2019-10-14 2020-01-21 中国科学院光电技术研究所 Calibration and measurement method for fast reflector in photoelectric tracking system
CN112834169A (en) * 2020-12-31 2021-05-25 湖北三江航天险峰电子信息有限公司 Open-loop frequency sweep test method for fast-reflection mirror
WO2024060929A1 (en) * 2022-09-22 2024-03-28 上海精测半导体技术有限公司 Photoacoustic measuring device and film thickness measuring method

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Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104811244A (en) * 2015-03-26 2015-07-29 中国科学院上海光学精密机械研究所 Spatial light to single-mode fiber coupling system based on laser nutation
CN104811244B (en) * 2015-03-26 2017-12-12 中国科学院上海光学精密机械研究所 Coupled system of the spatial light based on laser nutating to single-mode fiber
CN106768885A (en) * 2016-12-16 2017-05-31 中国航空工业集团公司洛阳电光设备研究所 A kind of device and method of testing for testing speculum resolution ratio
CN106768885B (en) * 2016-12-16 2019-02-01 中国航空工业集团公司洛阳电光设备研究所 A kind of device and test method for testing reflecting mirror resolution ratio
CN108871559A (en) * 2018-07-13 2018-11-23 中国工程物理研究院计量测试中心 A kind of calibration method of beam quality β factor measuring system
CN109387164B (en) * 2018-11-23 2020-11-24 中国航空工业集团公司洛阳电光设备研究所 Portable long-focus large-caliber device and method for measuring product optical axis deviation
CN109387164A (en) * 2018-11-23 2019-02-26 中国航空工业集团公司洛阳电光设备研究所 Measure the portable focal length heavy caliber device and measurement method of product optical axis deviation
CN110530612A (en) * 2019-09-04 2019-12-03 中国科学院合肥物质科学研究院 A kind of system and its test method using PSD test tilting mirror
CN110631808A (en) * 2019-09-25 2019-12-31 湖北航天技术研究院总体设计所 Portable fast-reflection mirror performance automatic test system and method
CN110715795A (en) * 2019-10-14 2020-01-21 中国科学院光电技术研究所 Calibration and measurement method for fast reflector in photoelectric tracking system
CN110715795B (en) * 2019-10-14 2021-06-01 中国科学院光电技术研究所 Calibration and measurement method for fast reflector in photoelectric tracking system
CN112834169A (en) * 2020-12-31 2021-05-25 湖北三江航天险峰电子信息有限公司 Open-loop frequency sweep test method for fast-reflection mirror
WO2024060929A1 (en) * 2022-09-22 2024-03-28 上海精测半导体技术有限公司 Photoacoustic measuring device and film thickness measuring method

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Application publication date: 20141217