CN102589684A - Infrared laser measurement image surface alignment device - Google Patents
Infrared laser measurement image surface alignment device Download PDFInfo
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- CN102589684A CN102589684A CN2011104151115A CN201110415111A CN102589684A CN 102589684 A CN102589684 A CN 102589684A CN 2011104151115 A CN2011104151115 A CN 2011104151115A CN 201110415111 A CN201110415111 A CN 201110415111A CN 102589684 A CN102589684 A CN 102589684A
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Abstract
The invention relates to an infrared laser measurement image surface alignment device and belongs to the technical field of photoelectric measurement. The device consists of an indication system and an alignment system, wherein the indication system indicates a laser to emit indicating laser; the indicating layer is output after passing through a reflector and a beam splitter prism to indicate laser for the position of an emergent light shaft and the image surface center; the laser to be tested is transmitted to a measurement system through the indicating direction of the indicating laser; an alignment reticle of an alignment system indicates the position of the emergent laser and indicates the laser to be tested to align at the image surface and can convert the invisible infrared laser into visible indicating light; and the laser to be tested aligns at the reticle center of the reticle so as to align at the image surface center. Through the adoption of the device, the laser to be tested can be aligned with the system optical axis and the image surface center quickly and accurately.
Description
Technical field
The present invention relates to a kind of infrared laser and measure the image planes alignment device, belong to the photoelectric measurement technical field.
Background technology
Laser has had relevant feature such as high brightness, monochromaticity are good, high directivity because of it and receives researchist's extensive concern since occurring.Along with the continuous development of laser technology, much more more and more laser be applied to people's the productive life and the every field of military war.In various application, all need test the parameters of laser beam, especially in military field, the accurate measurement of laser beam quality is most important to the evaluation of laser performance.Use in the laser beam quality method of testing at present; Photoelectric method is used in the measurement of a lot of laser beam parameters (like beam divergence angle); Be that laser passes through one or several optical system after treatment, receive laser signal, do further computational analysis again and handle by the image planes receiving trap.Produce the influence of aberration for reducing laser through optical system to test result; Usually require laser along system optical axis incident; And receive problems such as signal is imperfect for avoiding occurring the image planes receiving trap, the laser facula that requires image planes to receive is positioned at zone, image planes center.For reaching above-mentioned requirements; Carry out the laser parameter test all needs testing laser is carried out light path adjusting and the adjusting of image planes centrally aligned at every turn; Not only complex operation is time-consuming; And, influence camera properties even camera is caused damage because each adjusting all need judge whether through the image of camera collection to aim at.
Summary of the invention
In order to realize the accurate image planes alignment function to invisible infrared laser, the present invention proposes a kind of infrared laser and measures the image planes alignment device.
A kind of infrared laser is measured the image planes alignment device, and is as shown in Figure 1, and this device is by measured laser device 10, indication laser 8, first catoptron 6, second catoptron 7, first Amici prism 3, second Amici prism 4 and aim at graticule 5 and form; Wherein, measured laser device 10 places on the four-dimensional optical adjusting frame, can carry out height, level, pitching and orientation and regulate; Indication laser 8 is the green (light) laser of 532nm for wavelength; First catoptron 6 and second catoptron 7 are that diameter is the plane mirror of 2.54cm, place respectively on the two-dimension optical adjustment rack, can carry out pitching and orientation and regulate; First Amici prism 3 and second Amici prism 4 are respectively the right angle Amici prisms that is formed by two triangular prism gummeds; First Amici prism 3 is used for the incident laser beam split from measured laser device 10; A part incides CCD camera 9; Another part is radiated at through second Amici prism 4 and aims on the graticule 5, and aiming at graticule 5 is the cross-line graticule that has up-conversion and backlight of 5cm for diameter; Second Amici prism 4 be used for successively through the output laser-bounce of the indication laser 8 of first catoptron 6 and the reflection of second catoptron 7 to first Amici prism 3, and through the 3 reflection outputs of first Amici prism as outside indication.
This system work process is following:
Apparatus of the present invention guarantee that when carrying out the optical system adjustment optical axis of optical system 1 passes through the center of CCD camera 9 and the cross curve center of aiming at graticule 6, and overlap with the output beam position of indication laser 8 between optical system 1 and CCD camera 9.
During system works; With indication laser 8 emitted laser bundles through first catoptron 6, second catoptron 7, second Amici prism 4 and 3 outputs of first Amici prism position indication as measured laser device 10 exit portals; Adjust four-dimensional optics adjustment platform, the light beam exit portal of measured laser device 10 is overlapped with the output beam position of indication laser 8; Close the power supply of indication laser 8; Open the power switch of measured laser device 10; Observe aligning graticule 6 and whether hot spot and hot spot are arranged whether at the cross curve center; Pitching and orientation through regulating four-dimensional optical adjusting frame are regulated, and hot spot is adjusted to the cross curve center of aiming at graticule 6, have finally realized the accurate aligning of infrared laser to CCD camera 9 image planes.
Beneficial effect
The present invention proposes a kind of wide spectrum scattered laser beam angle measuring system.Obtain representation of laser facula by visible light CCD camera and Near Infrared CCD camera, realized the measurement at wavelength scattered laser beam angle arbitrarily in the wide spectrum 400nm-1700nm scope.By the resolution of optical system focal length and selected camera in the system, guaranteed that scattered laser beam angular measurement precision reaches 0.02mrad.
The present invention proposes a kind of infrared laser and measures the image planes alignment device.Testing laser can find systematic optical axis and image planes center quickly and easily through the indication laser of inside indication laser designator; Make the testing laser aiming aim at the cross groove center of graticule through fine setting again; Can accurately aim at the image planes center, can convert sightless infrared laser into visible light through up-conversion.The present invention removes beam path alignment loaded down with trivial details before each use optical system from and regulates and the image planes regulating step, and the damage to camera that possibly bring, realized testing laser and image planes quick, accurately aim at.
Description of drawings
Fig. 1 is the structural representation that a kind of infrared laser is measured the project alignment device, and this figure also is the specification digest accompanying drawing, and wherein, 10 is the measured laser device; 1 is the laser measurement optical system, and 2 are the adjustment platform, and 3 is first Amici prism; 4 is second Amici prism, and 5 for aiming at graticule, and 7 is second catoptron; 6 is first catoptron, and 8 is indication laser, and 9 is the CCD camera.
Embodiment
A kind of infrared laser is measured the image planes alignment device, and is as shown in Figure 1, and this device is by measured laser device 10, indication laser 8, first catoptron 6, second catoptron 7, first Amici prism 3, second Amici prism 4 and aim at graticule 5 and form; Wherein, measured laser device 10 places on the four-dimensional optical adjusting frame, can carry out height, level, pitching and orientation and regulate; Indication laser 8 is the green (light) laser of 532nm for wavelength; First catoptron 6 and second catoptron 7 are that diameter is the plane mirror of 2.54cm, place respectively on the two-dimension optical adjustment rack, can carry out pitching and orientation and regulate; First Amici prism 3 and second Amici prism 4 are respectively the right angle Amici prisms that is formed by two triangular prism gummeds; First Amici prism 3 is used for the incident laser beam split from measured laser device 10; A part incides CCD camera 9; Another part is radiated at through second Amici prism 4 and aims on the graticule 5, and aiming at graticule 5 is the cross-line graticule that has up-conversion and backlight of 5cm for diameter; Second Amici prism 4 be used for successively through the output laser-bounce of the indication laser 8 of first catoptron 6 and the reflection of second catoptron 7 to first Amici prism 3, and through the 3 reflection outputs of first Amici prism as outside indication.
This system work process is following:
Apparatus of the present invention guarantee that when carrying out the optical system adjustment optical axis of optical system 1 passes through the center of CCD camera 9 and the cross curve center of aiming at graticule 6, and overlap with the output beam position of indication laser 8 between optical system 1 and CCD camera 9.
During system works; With indication laser 8 emitted laser bundles through first catoptron 6, second catoptron 7, second Amici prism 4 and 3 outputs of first Amici prism position indication as measured laser device 10 exit portals; Adjust four-dimensional optics adjustment platform, the light beam exit portal of measured laser device 10 is overlapped with the output beam position of indication laser 8; Close the power supply of indication laser 8; Open the power switch of measured laser device 10; Observe aligning graticule 6 and whether hot spot and hot spot are arranged whether at the cross curve center; Pitching and orientation through regulating four-dimensional optical adjusting frame are regulated, and hot spot is adjusted to the cross curve center of aiming at graticule 6, have finally realized the accurate aligning of infrared laser to CCD camera 9 image planes.
Claims (1)
1. an infrared laser is measured the image planes alignment device, and this device is made up of measured laser device (10), indication laser (8), first catoptron (6), second catoptron (7), first Amici prism (3), second Amici prism (4) and aligning graticule (5); Wherein, measured laser device (10) places on the four-dimensional optical adjusting frame, can carry out height, level, pitching and orientation and regulate; Indication laser (8) is the green (light) laser of 532nm for wavelength; First catoptron (6) and second catoptron (7) are that diameter is the plane mirror of 2.54cm, place respectively on the two-dimension optical adjustment rack, can carry out pitching and orientation and regulate; First Amici prism (3) and second Amici prism (4) are respectively the right angle Amici prisms that is formed by two triangular prism gummeds; First Amici prism (3) is used for the incident laser beam split from measured laser device (10); A part incides CCD camera (9); Another part is radiated at through second Amici prism (4) and aims on the graticule (5), and aiming at graticule (5) is the cross-line graticule that has up-conversion and backlight of 5cm for diameter; Second Amici prism (4) be used for successively through the output laser-bounce of the indication laser (8) of first catoptron (6) and second catoptron (7) reflection to first Amici prism (3), and through first Amici prism (3) reflection output as outside indication;
This system work process is following:
Apparatus of the present invention are positioned between optical system (1) and the CCD camera (9); The optical axis that when carrying out the optical system adjustment, guarantees optical system (1) passes through the center of CCD camera (9) and the cross curve center of aiming at graticule (6), and overlaps with the output beam position of indication laser (8);
During system works; Indication laser (8) emitted laser bundle is indicated as the position of measured laser device (10) exit portal through first catoptron (6), second catoptron (7), second Amici prism (4) and first Amici prism (3) output; Adjust four-dimensional optics adjustment platform, the light beam exit portal of measured laser device (10) is overlapped with the output beam position of indication laser (8); Close the power supply of indication laser (8); Open the power switch of measured laser device (10); Observe aligning graticule (6) and whether hot spot and hot spot are arranged whether at the cross curve center; Pitching and orientation through regulating four-dimensional optical adjusting frame are regulated, and hot spot is adjusted to the cross curve center of aiming at graticule (6), have finally realized the accurate aligning of infrared laser to CCD camera (9) image planes.
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| Application Number | Priority Date | Filing Date | Title |
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| CN2011104151115A CN102589684A (en) | 2011-12-14 | 2011-12-14 | Infrared laser measurement image surface alignment device |
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| CN2011104151115A CN102589684A (en) | 2011-12-14 | 2011-12-14 | Infrared laser measurement image surface alignment device |
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Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105258710A (en) * | 2015-09-12 | 2016-01-20 | 长春理工大学 | High-precision camera principal point calibration method |
| CN105633784A (en) * | 2016-04-06 | 2016-06-01 | 深圳市吉斯迪科技有限公司 | Regulation method of laser output position and direction |
| CN107300383A (en) * | 2017-07-31 | 2017-10-27 | 天津大学 | A kind of laser optical path coupled system based on transflection prism |
| CN107478178A (en) * | 2017-09-24 | 2017-12-15 | 长春理工大学 | A kind of two-way centering laser alignment adjusting apparatus and centering method |
| CN108340071A (en) * | 2017-01-24 | 2018-07-31 | 株式会社迪思科 | Light spot shape detection device |
| CN108507671A (en) * | 2017-02-23 | 2018-09-07 | 中国计量大学 | A kind of optical analysis test equipment |
| CN109270513A (en) * | 2018-09-21 | 2019-01-25 | 北京因泰立科技有限公司 | A kind of 3-D scanning laser radar based on MEMS galvanometer |
| CN109687283A (en) * | 2018-12-21 | 2019-04-26 | 深圳市鸿陆技术有限公司 | A kind of debugging target surface, the system and method for Infrared laser emission head |
| CN110940486A (en) * | 2018-09-21 | 2020-03-31 | 上海永鼎光电子技术有限公司 | Light attenuation detection system and application thereof |
| CN111486782A (en) * | 2019-01-26 | 2020-08-04 | 保定长空科技有限公司 | Glass steel coating film thickness non-contact monitoring facilities |
| CN112130276A (en) * | 2020-10-19 | 2020-12-25 | 杭州奥创光子技术有限公司 | Closed-loop control light path automatic reset adjusting method, device and application thereof |
| CN112525487A (en) * | 2020-11-20 | 2021-03-19 | 成都优博创通信技术有限公司 | Laser polarized light direction detection device |
| CN113176000A (en) * | 2021-04-22 | 2021-07-27 | 哈尔滨工业大学（深圳） | System capable of measuring micron-level reflection and transmission optical phase |
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2011
- 2011-12-14 CN CN2011104151115A patent/CN102589684A/en active Pending
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105258710B (en) * | 2015-09-12 | 2017-12-29 | 长春理工大学 | A kind of high-precision principal point for camera scaling method |
| CN105258710A (en) * | 2015-09-12 | 2016-01-20 | 长春理工大学 | High-precision camera principal point calibration method |
| CN105633784A (en) * | 2016-04-06 | 2016-06-01 | 深圳市吉斯迪科技有限公司 | Regulation method of laser output position and direction |
| CN105633784B (en) * | 2016-04-06 | 2019-03-01 | 深圳市吉斯迪科技有限公司 | A kind of method of adjustment of laser output position and direction |
| CN108340071B (en) * | 2017-01-24 | 2021-06-08 | 株式会社迪思科 | Light spot shape detection device |
| CN108340071A (en) * | 2017-01-24 | 2018-07-31 | 株式会社迪思科 | Light spot shape detection device |
| CN108507671A (en) * | 2017-02-23 | 2018-09-07 | 中国计量大学 | A kind of optical analysis test equipment |
| CN108507671B (en) * | 2017-02-23 | 2020-01-17 | 中国计量大学 | Optical analysis test equipment |
| CN107300383A (en) * | 2017-07-31 | 2017-10-27 | 天津大学 | A kind of laser optical path coupled system based on transflection prism |
| CN107300383B (en) * | 2017-07-31 | 2023-05-30 | 天津大学 | Laser optical path coupling system based on transflective prism |
| CN107478178A (en) * | 2017-09-24 | 2017-12-15 | 长春理工大学 | A kind of two-way centering laser alignment adjusting apparatus and centering method |
| CN107478178B (en) * | 2017-09-24 | 2023-04-25 | 长春理工大学 | Bidirectional alignment laser centering adjustment device and centering method |
| CN109270513A (en) * | 2018-09-21 | 2019-01-25 | 北京因泰立科技有限公司 | A kind of 3-D scanning laser radar based on MEMS galvanometer |
| CN110940486A (en) * | 2018-09-21 | 2020-03-31 | 上海永鼎光电子技术有限公司 | Light attenuation detection system and application thereof |
| CN109687283A (en) * | 2018-12-21 | 2019-04-26 | 深圳市鸿陆技术有限公司 | A kind of debugging target surface, the system and method for Infrared laser emission head |
| CN109687283B (en) * | 2018-12-21 | 2024-06-11 | 深圳市鸿陆技术有限公司 | Target surface, system and method for debugging infrared laser emission head |
| CN111486782A (en) * | 2019-01-26 | 2020-08-04 | 保定长空科技有限公司 | Glass steel coating film thickness non-contact monitoring facilities |
| CN112130276A (en) * | 2020-10-19 | 2020-12-25 | 杭州奥创光子技术有限公司 | Closed-loop control light path automatic reset adjusting method, device and application thereof |
| CN112525487A (en) * | 2020-11-20 | 2021-03-19 | 成都优博创通信技术有限公司 | Laser polarized light direction detection device |
| CN112525487B (en) * | 2020-11-20 | 2023-10-17 | 成都优博创通信技术有限公司 | Laser polarization direction detection device |
| CN113176000A (en) * | 2021-04-22 | 2021-07-27 | 哈尔滨工业大学（深圳） | System capable of measuring micron-level reflection and transmission optical phase |
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Application publication date: 20120718 |