CN106768885B - A kind of device and test method for testing reflecting mirror resolution ratio - Google Patents
A kind of device and test method for testing reflecting mirror resolution ratio Download PDFInfo
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- CN106768885B CN106768885B CN201611163508.9A CN201611163508A CN106768885B CN 106768885 B CN106768885 B CN 106768885B CN 201611163508 A CN201611163508 A CN 201611163508A CN 106768885 B CN106768885 B CN 106768885B
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- reflecting mirror
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/005—Testing of reflective surfaces, e.g. mirrors
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Abstract
The present invention relates to a kind of devices and test method for testing reflecting mirror resolution ratio, tested reflecting mirror is placed in high-low temperature chamber, tested reflecting mirror is heated up or is cooled to target temperature, optical window, tested reflecting mirror and optical window of the directional light of parallel light tube transmitting through high-low temperature chamber, into preset lens, with the resolution ratio target plate picture of preposition sem observation parallel light tube, the resolution measurement of reflecting mirror under different temperatures is completed.In addition, the one side of optical window is in high-low temperature chamber, for another side outside high-low temperature chamber, high-low temperature chamber work surfaces externally and internally temperature of optical window in different temperatures is inconsistent, meeting parameter thermal deformation, influence measurement accuracy, it cannot even use completely, in order to guarantee the precision of measurement, heating film is plated on two surfaces inside and outside optical window, keep optical window two sides temperature consistent, eliminates thermal deformation.
Description
Technical field
The invention belongs to technical field of optical test, are related to a kind of device and test method for testing reflecting mirror resolution ratio.
Background technique
Reflecting mirror is widely used in airborne photoelectric product, is components important in photovoltaic, to photovoltaic
Image quality influences very big.At normal temperature, measuring resolution is required after reflecting mirror assembly, it is unlikely to guarantee to assemble effect
In influencing system imaging quality, there is mature test method.Airborne photoelectric product working environment is more severe, temperature range -55
DEG C~+70 DEG C, product often deforms under high/low temperature, influences the resolution ratio of reflecting mirror, reduces the image quality of system.Cause
This, it is necessary to resolution ratio of the reflecting mirror under high/low temperature is detected.There is presently no discoveries similar test method.This
Invention can solve the problem, provide a kind of new test method.
Summary of the invention
Technical problems to be solved
In order to avoid the shortcomings of the prior art, the present invention propose it is a kind of test reflecting mirror resolution ratio device and test
Method solves the test problem of reflecting mirror resolution ratio under high/low temperature.
Technical solution
A kind of device for testing reflecting mirror resolution ratio, it is characterised in that including rotating platform 5, optical platform 6, the first optical window
7, preset lens 8, high-low temperature chamber 9, standard mirror 10, the second optical window 11 and parallel light tube 12；Optical platform 6 is placed in high-low temperature chamber 9,
Rotating platform 5 is arranged on optical platform 6；An optical window, the light of optical window are respectively provided in the adjacent two side walls of high-low temperature chamber 9
Optical path can be formed with standard mirror 10 on optical platform 6；It is equipped with preset lens 8 on the outside of first optical window 7, is equipped on the outside of the second optical window 11
Parallel light tube 12；It is tested reflecting mirror when test and replaces standard mirror 10, is located in optical system for testing；The standard mirror 10 is placed in guide rail
On, it is completed to move by motor control；The tested reflecting mirror is located at rotating platform 5, is completed to move by motor control.
Heating film is plated on two surfaces inside and outside described two optical windows.
A kind of test method carrying out reflecting mirror resolution ratio under high/low temperature using described device, it is characterised in that step is such as
Under:
Step 1: tested reflecting mirror being placed in high-low temperature chamber, optical path is formed are as follows: the light of parallel light tube 12 passes through the
Two optical windows 11 are irradiated to tested reflecting mirror, and the reflected light path for being tested reflecting mirror irradiates preset lens 8 by the first optical window 7；
Step 2: high-low temperature chamber being cooled down or be warming up to the temperature of test request, while being started in the optical window on high-low temperature chamber
Or outer surface heating film, it is consistent optical window internal surface temperature or hull-skin temperature with the inside and outside temperature of high-low temperature chamber；
Step 3: the mobile tested reflecting mirror of rotating platform 5 leaves position, and standard mirror replaces tested reflection by automatically controlled guide rail
The position of mirror, in optical system for testing；
Step 4: opening parallel light tube light source, the directional light that parallel light tube issues enters preposition after the reflection of standard mirror
Mirror, if meeting the requirement of resolution ratio, illustrates optical window on high-low temperature chamber, standard according to the picture and target plate number of parallel light tube target plate
Mirror is intact, carries out mirror test；
Step 5: automatically controlled guide rail removes standard mirror, and rotating platform 5 restores tested reflecting mirror in optical system for testing；
Step 6: parallel light tube light source is opened, before the directional light that parallel light tube issues enters after tested reflecting mirror reflection
Mirror is set, according to the picture and target plate number of parallel light tube target plate, obtains the resolution ratio of tested reflecting mirror.
Beneficial effect
A kind of device and test method for testing reflecting mirror resolution ratio proposed by the present invention, is placed on height for tested reflecting mirror
In cryogenic box, tested reflecting mirror is heated up or is cooled to target temperature, the directional light of parallel light tube transmitting penetrates high/low temperature
The optical window of case, tested reflecting mirror and optical window are completed into preset lens with the resolution ratio target plate picture of preposition sem observation parallel light tube
The resolution measurement of reflecting mirror under different temperatures.In addition, the one side of optical window is in high-low temperature chamber, another side outside high-low temperature chamber,
High-low temperature chamber work surfaces externally and internally temperature of optical window in different temperatures is inconsistent, and meeting parameter thermal deformation influences measurement accuracy, very
To that cannot use completely, in order to guarantee the precision of measurement, heating film is plated on two surfaces inside and outside optical window, makes optical window two sides temperature one
It causes, eliminates thermal deformation.
Detailed description of the invention
Fig. 1 is check device intact schematic diagram when apparatus of the present invention use
Fig. 2 is the schematic diagram that apparatus of the present invention carry out reflecting mirror
The first reflecting mirror of 1-, the second reflecting mirror of 2-, 3- third reflecting mirror, the 4th reflecting mirror of 4-, 5- rotating platform, 6- optics
Platform, the first optical window of 7-, 8- preset lens, 9- high-low temperature chamber, 10- standard mirror, the second optical window of 11-, 12- parallel light tube
Specific embodiment
Now in conjunction with embodiment, attached drawing, the invention will be further described:
Specific test method and process are as follows:
1) test product (reflecting mirror 1, reflecting mirror 2, reflecting mirror 3 and reflecting mirror 4) is placed on automatically controlled turntable, fixes production
Product.
2) start high-low temperature chamber, high-low temperature chamber is dropped to -55 DEG C；
3) start the optical window inner surface heating film on high-low temperature chamber simultaneously, keep optical window internal surface temperature and high-low temperature chamber extraneous
Temperature is consistent.
4) standard mirror is moved to by shown position by automatically controlled guide rail, standard mirror and parallel light tube and preset lens are at 45 °.
5) parallel light tube light source is opened, the directional light that parallel light tube issues enters preset lens after the reflection of standard mirror, micro-
The orientation and pitch angle for adjusting preset lens make the picture of target plate in parallel light tube be imaged on the field of view center of preset lens.Observation is parallel
The picture of light pipe target plate records the target plate number that can be seen clearly, if meeting the requirement of resolution ratio, illustrates the light on high-low temperature chamber
Window, standard mirror are intact, can test tested reflecting mirror.
6) standard mirror removes, as shown in Fig. 2, automatically controlled turntable rotates 45 degree, as shown in Fig. 2, the resolution of test reflecting mirror 1
Rate.
7) automatically controlled turntable is successively rotated, remaining reflecting mirror 2, reflecting mirror 3 and reflecting mirror 4 are tested, is completed so reflecting mirror
Test.
The test that temperature is 70 DEG C:
1. high-low temperature chamber is warming up to+70 DEG C.
2. starting the optical window outer surface heating film on high-low temperature chamber simultaneously, make inside optical window hull-skin temperature and high-low temperature chamber
Temperature is consistent.
3. standard mirror is moved to position shown in Fig. 1 by automatically controlled guide rail, standard mirror and parallel light tube and preset lens at
45°。
4. opening parallel light tube light source, the directional light that parallel light tube issues enters preset lens after the reflection of standard mirror, micro-
The orientation and pitch angle for adjusting preset lens make the picture of target plate in parallel light tube be imaged on the field of view center of preset lens.Observation is parallel
The picture of light pipe target plate records the target plate number that can be seen clearly, if meeting the requirement of resolution ratio, illustrates the light on high-low temperature chamber
Window, standard mirror are intact, can test tested reflecting mirror.
5. standard mirror removes, as shown in Fig. 2, automatically controlled turntable rotates 45 degree, as shown in Fig. 2, the resolution of test reflecting mirror 1
Rate.
6. successively rotating automatically controlled turntable, remaining reflecting mirror 2, reflecting mirror 3 and reflecting mirror 4 are tested, all reflecting mirrors are completed
Test.
Claims (3)
1. a kind of device for testing reflecting mirror resolution ratio, it is characterised in that including rotating platform (5), optical platform (6), the first light
Window (7), preset lens (8), high-low temperature chamber (9), standard mirror (10), the second optical window (11) and parallel light tube (12)；Optical platform (6)
It is placed in high-low temperature chamber (9), rotating platform (5) is arranged on optical platform (6)；In the adjacent two side walls of high-low temperature chamber (9)
It is respectively provided with an optical window, the light of optical window can form optical path with standard mirror (10) on optical platform (6)；First optical window (7) is outside
Side is equipped with preset lens (8), is equipped with parallel light tube (12) on the outside of the second optical window (11)；It is tested reflecting mirror when test and replaces standard mirror
(10), it is located in optical system for testing；The standard mirror (10) is placed on guide rail, is completed to move by motor control；The tested reflection
Mirror is located at rotating platform (5), is completed to move by motor control.
2. testing the device of reflecting mirror resolution ratio according to claim 1, it is characterised in that: two tables inside and outside described two optical windows
Plate heating film in face.
3. a kind of test method for being carried out reflecting mirror resolution ratio under high/low temperature using 2 described device of claims 1 or 2, feature are existed
In steps are as follows:
Step 1: tested reflecting mirror being placed in high-low temperature chamber, optical path is formed are as follows: the light of parallel light tube (12) passes through second
Optical window (11) is irradiated to tested reflecting mirror, and the reflected light path for being tested reflecting mirror passes through the first optical window (7) irradiation preset lens (8)；
Step 2: high-low temperature chamber being cooled down or be warming up to the temperature of test request, while being started in or beyond the optical window on high-low temperature chamber
Surface heating film is consistent optical window internal surface temperature or hull-skin temperature with the inside and outside temperature of high-low temperature chamber；
Step 3: the mobile tested reflecting mirror of rotating platform (5) leaves position, and standard mirror replaces tested reflecting mirror by automatically controlled guide rail
Position, in the optical system for testing；
Step 4: opening parallel light tube light source, the directional light that parallel light tube issues enters preset lens, root after the reflection of standard mirror
According to the picture and target plate number of parallel light tube target plate, if meeting the requirement of resolution ratio, illustrate that optical window, the standard mirror on high-low temperature chamber are complete
It is good, carry out mirror test；
Step 5: automatically controlled guide rail removes standard mirror, and rotating platform (5) restores tested reflecting mirror in optical system for testing；
Step 6: opening parallel light tube light source, the directional light that parallel light tube issues enters preposition after tested reflecting mirror reflection
Mirror obtains the resolution ratio of tested reflecting mirror according to the picture and target plate number of parallel light tube target plate.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201611163508.9A CN106768885B (en) | 2016-12-16 | 2016-12-16 | A kind of device and test method for testing reflecting mirror resolution ratio |
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| CN201611163508.9A CN106768885B (en) | 2016-12-16 | 2016-12-16 | A kind of device and test method for testing reflecting mirror resolution ratio |
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| CN106768885A CN106768885A (en) | 2017-05-31 |
| CN106768885B true CN106768885B (en) | 2019-02-01 |
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Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108051797A (en) * | 2017-11-20 | 2018-05-18 | 中国航空工业集团公司洛阳电光设备研究所 | A kind of environmental suitability test system of airborne photoelectric detecting devices |
| CN112255696B (en) * | 2020-10-30 | 2024-02-20 | 中国航空工业集团公司洛阳电光设备研究所 | Infrared athermalization automatic detecting equipment |
| CN112378862A (en) * | 2020-11-10 | 2021-02-19 | 河南工程学院 | High-low temperature cone light interference measuring device and method |
| CN112858228B (en) * | 2021-01-22 | 2023-04-28 | 西安应用光学研究所 | Device and method for measuring transmission resolution of large-size optical window part |
| CN114485463B (en) * | 2022-01-24 | 2024-01-12 | 北京仿真中心 | Testing device and method for film-coated optical reflector |
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| CN103868679A (en) * | 2014-02-28 | 2014-06-18 | 北京空间机电研究所 | Stray radiation test device for infrared optical remote sensor |
| CN104215431A (en) * | 2014-09-25 | 2014-12-17 | 中国工程物理研究院应用电子学研究所 | Rapid tilting mirror performance testing device |
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| CN101308059A (en) * | 2008-07-08 | 2008-11-19 | 中国科学院长春光学精密机械与物理研究所 | Ultraviolet optics instrument resolution tester |
| CN102507146A (en) * | 2011-09-29 | 2012-06-20 | 中国航空工业第六一八研究所 | Device and method for testing reflector parameters under high temperature and low temperature conditions |
| CN103868679A (en) * | 2014-02-28 | 2014-06-18 | 北京空间机电研究所 | Stray radiation test device for infrared optical remote sensor |
| CN104215431A (en) * | 2014-09-25 | 2014-12-17 | 中国工程物理研究院应用电子学研究所 | Rapid tilting mirror performance testing device |
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Effective date of registration: 20200602 Address after: 471000 No. 696, Wangcheng Avenue, Luolong District, Luoyang City, Henan Province Patentee after: AVIC Luoyang Photoelectric Technology Co., Ltd Address before: 471099 Luoyang City, Henan Province West triumph Road, No. 25 Patentee before: LUOYANG INSTITUTE OF ELECTRO-OPTICAL EQUIPMENT OF AVIC |
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