CN106768885A - A kind of device and method of testing for testing speculum resolution ratio - Google Patents
A kind of device and method of testing for testing speculum resolution ratio Download PDFInfo
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- CN106768885A CN106768885A CN201611163508.9A CN201611163508A CN106768885A CN 106768885 A CN106768885 A CN 106768885A CN 201611163508 A CN201611163508 A CN 201611163508A CN 106768885 A CN106768885 A CN 106768885A
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- speculum
- low temperature
- optical window
- tested
- temperature chamber
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/005—Testing of reflective surfaces, e.g. mirrors
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- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
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Abstract
The present invention relates to a kind of device and method of testing for testing speculum resolution ratio, tested speculum is placed in high-low temperature chamber, heated up or cooled to target temperature to tested speculum, optical window, tested speculum and optical window of the directional light of parallel light tube transmitting through high-low temperature chamber, into preset lens, with the resolution ratio target plate picture of preposition sem observation parallel light tube, the resolution measurement of speculum under different temperatures is completed.In addition, the one side of optical window is in high-low temperature chamber, outside high-low temperature chamber, the surfaces externally and internally temperature of optical window is inconsistent when high-low temperature chamber is operated in different temperatures for another side, meeting parameter thermal deformation, influence certainty of measurement, can not even use completely, in order to ensure the precision of measurement, the two plated surface heating film inside and outside optical window, make optical window two sides temperature consistent, eliminate thermal deformation.
Description
Technical field
The invention belongs to technical field of optical test, it is related to a kind of device and method of testing for testing speculum resolution ratio.
Background technology
Speculum is widely used in airborne photoelectric product, is parts important in photovoltaic, to photovoltaic
Image quality influence is very big.At normal temperatures, measuring resolution is required for after speculum assembling, it is unlikely to ensure to assemble effect
In influence system imaging quality, there is the method for testing of maturation.Airborne photoelectric product working environment is more severe, temperature range -55
DEG C~+70 DEG C, product often deforms under high/low temperature, influences the resolution ratio of speculum, reduces the image quality of system.Cause
This, it is necessary to resolution ratio of the speculum under high/low temperature is detected.There is similar method of testing there is presently no discovery.This
Invention can solve the problem, there is provided a kind of new method of testing.
The content of the invention
The technical problem to be solved
In order to avoid the deficiencies in the prior art part, the present invention proposes a kind of device for testing speculum resolution ratio and test
Method, solves the test problem of speculum resolution ratio under high/low temperature.
Technical scheme
A kind of device for testing speculum resolution ratio, it is characterised in that including rotation platform 5, optical table 6, the first optical window
7th, preset lens 8, high-low temperature chamber 9, standard mirror 10, the second optical window 11 and parallel light tube 12；Optical table 6 is placed in high-low temperature chamber 9,
Rotation platform 5 is arranged on optical table 6；An optical window, the light of optical window are respectively provided with two adjacent side walls of high-low temperature chamber 9
Light path can be formed with standard mirror 10 on optical table 6；The outside of first optical window 7 is provided with preset lens 8, and the outside of the second optical window 11 is provided with
Parallel light tube 12；Speculum substitution standard mirror 10 is tested during test, in optical system for testing；The standard mirror 10 is placed in guide rail
On, completed to move by motor control；The tested speculum is located at rotation platform 5, is completed to move by motor control.
Two plated surface heating film inside and outside described two optical windows.
A kind of method of testing that speculum resolution ratio under high/low temperature is carried out using described device, it is characterised in that step is such as
Under：
Step 1：Tested speculum is placed in high-low temperature chamber, light path is formed as：The light of parallel light tube 12 is by the
Two optical windows 11 irradiate and irradiate preset lens 8 by the first optical window 7 with tested speculum, the reflected light path for being tested speculum；
Step 2：High-low temperature chamber is lowered the temperature or is warming up to the temperature of test request, while starting in the optical window on high-low temperature chamber
Or outer surface heating film, optical window internal surface temperature or hull-skin temperature is consistent with the inside and outside temperature of high-low temperature chamber；
Step 3：The tested speculum of the movement of rotation platform 5 leaves position, and standard mirror replaces tested reflection by automatically controlled guide rail
The position of mirror, in optical system for testing；
Step 4：Parallel light tube light source is opened, the directional light that parallel light tube sends after the reflection of standard mirror by entering preposition
Mirror, according to the picture and target plate number of parallel light tube target plate, if meeting the requirement of resolution ratio, illustrates optical window, the standard on high-low temperature chamber
Mirror is intact, carries out mirror test；
Step 5：Automatically controlled guide rail removes standard mirror, and the tested speculum of the reduction of rotation platform 5 is in optical system for testing；
Step 6：Parallel light tube light source is opened, the directional light that parallel light tube sends after tested speculum reflection by entering preceding
Mirror is put, according to the picture and target plate number of parallel light tube target plate, the resolution ratio of tested speculum is obtained.
Beneficial effect
A kind of device and method of testing for testing speculum resolution ratio proposed by the present invention, height is placed on by tested speculum
In cryogenic box, heated up or cooled to target temperature to tested speculum, and the directional light of parallel light tube transmitting passes through high/low temperature
The optical window of case, tested speculum and optical window, into preset lens, with the resolution ratio target plate picture of preposition sem observation parallel light tube, complete
The resolution measurement of speculum under different temperatures.In addition, the one side of optical window is in high-low temperature chamber, another side outside high-low temperature chamber,
The surfaces externally and internally temperature of optical window is inconsistent when high-low temperature chamber is operated in different temperatures, meeting parameter thermal deformation, influences certainty of measurement, very
To that can not use completely, in order to ensure the precision of measurement, the two plated surface heating film inside and outside optical window makes optical window two sides temperature one
Cause, eliminate thermal deformation.
Brief description of the drawings
Fig. 1 is the intact schematic diagram of check device when apparatus of the present invention are used
Fig. 2 carries out the schematic diagram of speculum for apparatus of the present invention
The speculums of 1- first, the speculums of 2- second, the speculums of 3- the 3rd, the speculums of 4- the 4th, 5- rotation platforms, 6- optics
Platform, the optical windows of 7- first, 8- preset lenses, 9- high-low temperature chambers, 10- standard mirrors, the optical windows of 11- second, 12- parallel light tubes
Specific embodiment
In conjunction with embodiment, accompanying drawing, the invention will be further described：
Specific method of testing and process are as follows：
1) test product (speculum 1, speculum 2, speculum 3 and speculum 4) is placed on automatically controlled turntable, fixes product
Product.
2) start high-low temperature chamber, high-low temperature chamber is dropped to -55 DEG C；
3) while starting the optical window inner surface heating film on high-low temperature chamber, make optical window internal surface temperature extraneous with high-low temperature chamber
Temperature is consistent.
4) standard mirror is moved to by shown position by automatically controlled guide rail, standard mirror is at 45 ° with parallel light tube and preset lens.
5) parallel light tube light source is opened, the directional light that parallel light tube sends is micro- by entering preset lens after the reflection of standard mirror
The orientation and luffing angle of preset lens are adjusted, the picture of target plate in parallel light tube is imaged on the field of view center of preset lens.Observation is parallel
The picture of light pipe target plate, records the target plate number that can be seen clearly, if meeting the requirement of resolution ratio, illustrates the light on high-low temperature chamber
Window, standard mirror are intact, can test tested speculum.
6) standard mirror is removed, as shown in Fig. 2 automatically controlled turntable rotates 45 degree, as shown in Fig. 2 the resolution of test speculum 1
Rate.
7) automatically controlled turntable is rotated successively, remaining speculum 2, speculum 3 and speculum 4 is tested, and is completed so speculum
Test.
Temperature is 70 DEG C of test：
1. high-low temperature chamber is warming up to+70 DEG C.
2. start the light window outer surface heating film on high-low temperature chamber simultaneously, make inside optical window hull-skin temperature and high-low temperature chamber
Temperature is consistent.
3. standard mirror is moved to by position shown in Fig. 1 by automatically controlled guide rail, standard mirror and parallel light tube and preset lens into
45°。
4. parallel light tube light source is opened, and the directional light that parallel light tube sends is micro- by entering preset lens after the reflection of standard mirror
The orientation and luffing angle of preset lens are adjusted, the picture of target plate in parallel light tube is imaged on the field of view center of preset lens.Observation is parallel
The picture of light pipe target plate, records the target plate number that can be seen clearly, if meeting the requirement of resolution ratio, illustrates the light on high-low temperature chamber
Window, standard mirror are intact, can test tested speculum.
5. standard mirror is removed, as shown in Fig. 2 automatically controlled turntable rotates 45 degree, as shown in Fig. 2 the resolution of test speculum 1
Rate.
6. automatically controlled turntable is rotated successively, remaining speculum 2, speculum 3 and speculum 4 is tested, and completes all speculums
Test.
Claims (3)
1. it is a kind of test speculum resolution ratio device, it is characterised in that including rotation platform (5), optical table (6), the first light
Window (7), preset lens (8), high-low temperature chamber (9), standard mirror (10), the second optical window (11) and parallel light tube (12)；Optical table (6)
It is placed in high-low temperature chamber (9), rotation platform (5) is arranged on optical table (6)；On two adjacent side walls of high-low temperature chamber (9)
An optical window is respectively provided with, the light of optical window can form light path with standard mirror (10) on optical table (6)；First optical window (7) is outward
Side is provided with preset lens (8), and the second optical window (11) outside is provided with parallel light tube (12)；Speculum substitution standard mirror is tested during test
(10), in optical system for testing；The standard mirror (10) is placed on guide rail, is completed to move by motor control；The tested reflection
Mirror is located at rotation platform (5), is completed to move by motor control.
2. the device of speculum resolution ratio is tested according to claim 1, it is characterised in that：Two tables inside and outside described two optical windows
Plate heating film in face.
3. a kind of method of testing that speculum resolution ratio under high/low temperature is carried out using the described device of claim 1 or 2, its feature is existed
It is as follows in step：
Step 1：Tested speculum is placed in high-low temperature chamber, light path is formed as：The light of parallel light tube (12) passes through second
Optical window (11) irradiates and irradiates preset lens (8) by the first optical window (7) with tested speculum, the reflected light path for being tested speculum；
Step 2：High-low temperature chamber is lowered the temperature or is warming up to the temperature of test request, while starting in or beyond the optical window on high-low temperature chamber
Surface heating film, makes optical window internal surface temperature or hull-skin temperature are consistent with the inside and outside temperature of high-low temperature chamber；
Step 3：The mobile tested speculum of rotation platform (5) leaves position, and standard mirror replaces tested speculum by automatically controlled guide rail
Position, in optical system for testing；
Step 4：Parallel light tube light source is opened, the directional light that parallel light tube sends after the reflection of standard mirror by entering preset lens, root
According to the picture and target plate number of parallel light tube target plate, if meeting the requirement of resolution ratio, illustrate that optical window on high-low temperature chamber, standard mirror are complete
It is good, carry out mirror test；
Step 5：Automatically controlled guide rail removes standard mirror, and the tested speculum of rotation platform (5) reduction is in optical system for testing；
Step 6：Parallel light tube light source is opened, the directional light that parallel light tube sends after tested speculum reflection by entering preposition
Mirror, according to the picture and target plate number of parallel light tube target plate, obtains the resolution ratio of tested speculum.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201611163508.9A CN106768885B (en) | 2016-12-16 | 2016-12-16 | A kind of device and test method for testing reflecting mirror resolution ratio |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201611163508.9A CN106768885B (en) | 2016-12-16 | 2016-12-16 | A kind of device and test method for testing reflecting mirror resolution ratio |
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| CN106768885A true CN106768885A (en) | 2017-05-31 |
| CN106768885B CN106768885B (en) | 2019-02-01 |
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| CN201611163508.9A Active CN106768885B (en) | 2016-12-16 | 2016-12-16 | A kind of device and test method for testing reflecting mirror resolution ratio |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108051797A (en) * | 2017-11-20 | 2018-05-18 | 中国航空工业集团公司洛阳电光设备研究所 | A kind of environmental suitability test system of airborne photoelectric detecting devices |
| CN112255696A (en) * | 2020-10-30 | 2021-01-22 | 中国航空工业集团公司洛阳电光设备研究所 | Infrared athermalization automatic detection equipment |
| CN112378862A (en) * | 2020-11-10 | 2021-02-19 | 河南工程学院 | High-low temperature cone light interference measuring device and method |
| CN112858228A (en) * | 2021-01-22 | 2021-05-28 | 西安应用光学研究所 | Device and method for measuring transmission resolution of large-size optical window part |
| CN114485463A (en) * | 2022-01-24 | 2022-05-13 | 北京仿真中心 | Testing device and method for coated optical reflector |
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108051797A (en) * | 2017-11-20 | 2018-05-18 | 中国航空工业集团公司洛阳电光设备研究所 | A kind of environmental suitability test system of airborne photoelectric detecting devices |
| CN112255696A (en) * | 2020-10-30 | 2021-01-22 | 中国航空工业集团公司洛阳电光设备研究所 | Infrared athermalization automatic detection equipment |
| CN112255696B (en) * | 2020-10-30 | 2024-02-20 | 中国航空工业集团公司洛阳电光设备研究所 | Infrared athermalization automatic detecting equipment |
| CN112378862A (en) * | 2020-11-10 | 2021-02-19 | 河南工程学院 | High-low temperature cone light interference measuring device and method |
| CN112858228A (en) * | 2021-01-22 | 2021-05-28 | 西安应用光学研究所 | Device and method for measuring transmission resolution of large-size optical window part |
| CN112858228B (en) * | 2021-01-22 | 2023-04-28 | 西安应用光学研究所 | Device and method for measuring transmission resolution of large-size optical window part |
| CN114485463A (en) * | 2022-01-24 | 2022-05-13 | 北京仿真中心 | Testing device and method for coated optical reflector |
| CN114485463B (en) * | 2022-01-24 | 2024-01-12 | 北京仿真中心 | Testing device and method for film-coated optical reflector |
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|---|---|
| CN106768885B (en) | 2019-02-01 |
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Effective date of registration: 20200602 Address after: 471000 No. 696, Wangcheng Avenue, Luolong District, Luoyang City, Henan Province Patentee after: AVIC Luoyang Photoelectric Technology Co., Ltd Address before: 471099 Luoyang City, Henan Province West triumph Road, No. 25 Patentee before: LUOYANG INSTITUTE OF ELECTRO-OPTICAL EQUIPMENT OF AVIC |
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