CN112378862A - High-low temperature cone light interference measuring device and method - Google Patents
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- 238000000034 method Methods 0.000 title claims abstract description 17
- 239000013078 crystal Substances 0.000 claims abstract description 59
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- 230000003287 optical effect Effects 0.000 claims abstract description 23
- 239000005337 ground glass Substances 0.000 claims abstract description 16
- 238000005305 interferometry Methods 0.000 claims description 12
- 230000010287 polarization Effects 0.000 claims description 5
- 238000011160 research Methods 0.000 abstract description 2
- 230000000007 visual effect Effects 0.000 abstract description 2
- GQYHUHYESMUTHG-UHFFFAOYSA-N lithium niobate Chemical compound [Li+].[O-][Nb](=O)=O GQYHUHYESMUTHG-UHFFFAOYSA-N 0.000 description 10
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- 238000005259 measurement Methods 0.000 description 7
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- G—PHYSICS
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
- G01N21/23—Bi-refringence
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
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Abstract
The invention provides a high-low temperature cone light interference measuring device and a method, which comprises the steps of enabling a beam of laser with a visible wave band to sequentially pass through two plane reflectors, a polarizer, ground glass, a crystal to be measured and an analyzer which are arranged in a high-low temperature test box at an angle of 45 degrees, then emitting the laser through an observation window, and receiving a transmission light spot and a cone light interference pattern by using a transmission light screen. Adjusting the laser incidence direction by using a five-dimensional precision adjusting frame, indicating the laser incidence direction by using the position of a transmission light spot in the cone light interference pattern, and enabling the transmission light spot to be positioned at the symmetrical center of the cone light interference pattern through adjustment, wherein the laser is incident in a way of being vertical to the end face of the crystal to be measured; by translating the laser, the conoscopic interference patterns of different regions in the light-passing cross-section of the crystal can be observed. The method can measure the cone light interference patterns of the birefringent crystal at different temperatures, researches the optical properties of the birefringent crystal at high and low temperatures, such as the birefringence characteristic, the optical uniformity and the like, and has the advantages of simple operation, convenient debugging, visual result and the like.
Description
Technical Field
The invention relates to the field of optical measurement and detection, in particular to a high-low temperature conoscopic light interference measurement device and method.
Background
The conoscopic interference technique is that after a beam of divergent (or convergent) light passes through a birefringent crystal disposed between polarizers, due to the anisotropy of the crystal, the phase retardation and the intrinsic polarization direction of the laser light incident in different directions after passing through the crystal are different, which leads to inconsistent polarization state changes, so that after the divergent light passes through the polarization system, interference fringes, i.e., conoscopic interference patterns, are formed on the light screen. The conoscopic interference of the crystal relates to the properties of the crystal such as birefringence, light wave polarization, light wave interference and the like, is an intuitive and convenient method for knowing the characteristics of the crystal, and is a common method for measuring various characteristic parameters of the crystal. The cone light interference pattern can be used for explaining and researching a plurality of optical properties of the crystal, such as judging whether the crystal is uniaxial crystal or biaxial crystal, determining the orientation of a refractive index ellipsoid of the crystal, judging a light sign, measuring a light axis angle, detecting the optical uniformity of the crystal, and the like. For some birefringent crystals, an electro-optic effect, a piezoelectric effect, an elasto-optic effect, a pyroelectric effect, a refractive index temperature effect and the like exist at the same time, the birefringent characteristics of the crystals change under the influence of an external electric field, pressure, temperature and the like, and the effects can also be researched by using a cone light interference technology. In addition, in many optical applications, device performance can be tuned to optimal operating conditions using conoscopic interferograms for tuning.
Many crystal optical devices are often subjected to a wide temperature range for practical applications, particularly in the military, typically operating at temperatures in the range of-50 ℃ to 65 ℃. Due to the various effects of the crystal, temperature variations may result in variations in the crystal properties, which in turn leads to temperature instability in device performance. For example, an electro-optical Q-switch prepared by using lithium niobate crystals plays a crucial role in military pulse solid-state lasers, but in practical application, the lithium niobate electro-optical Q-switch is found to have poor low-temperature Q-switching performance, and phenomena such as light leakage and low dynamic output energy occur at low temperature. According to the principle of electro-optic Q-switching, the change of crystal birefringence and distribution thereof at low temperature is clarified, which is the key to find out the reason of low-temperature performance reduction and further improve the device performance. However, current studies on the temperature effect of crystal birefringence are focused only on the variation of maximum birefringence with temperature. For a crystal device, when the temperature changes, besides the direct influence of the temperature on the birefringence, various effects of the crystal can also influence the birefringence, so that the birefringence changes at various positions in the crystal are not consistent, and therefore, it is not significant to study the change of the maximum birefringence with the temperature. As described above, parameters such as birefringence characteristics and optical uniformity of a crystal can be studied by using a conoscopic interference technique, but the present conoscopic interference measurement is performed at normal temperature. Although the existing device for refrigerating the crystal independently has more light-passing windows, the light-passing aperture is smaller, and the cone light interference incident light is divergent light, so that the low-temperature cone light measurement requirement is difficult to meet, and no report of high-temperature and low-temperature cone light interference measurement is seen at present.
Disclosure of Invention
The invention provides a high-low temperature conoscopic interferometry device and method, which solve the problem that the conventional conoscopic interferometry can only be carried out at normal temperature.
The technical scheme for realizing the invention is as follows:
the utility model provides a high low temperature cone light interferometry device, includes visible light laser instrument and high low temperature test box, the visible light laser instrument is installed on five-dimensional accurate alignment jig, is equipped with the optics flat board in the high low temperature test box, is equipped with first plane speculum and second plane speculum on the optics flat board, has placed polarizer, ground glass, the crystal and the analyzer that await measuring along the reflection light path of second plane speculum coaxial in proper order, and high low temperature test box still is equipped with the transmission light screen outward.
The first plane reflector and the second plane reflector are arranged along 45 degrees and are perpendicular to each other. Laser emitted by the visible light laser passes through an observation window of the high-low temperature test chamber and then is incident on the first plane reflector, is incident on the second plane reflector after being reflected, passes through the polarizer, the ground glass, the crystal to be detected and the analyzer which are coaxially arranged after being reflected by the second plane reflector, and then is emitted to the transmission light screen after passing through the observation window of the high-low temperature test chamber.
The transmission directions of the polarizer and the analyzer are mutually vertical, the scattering degree of the ground glass is proper, part of laser can be directly transmitted, and part of laser forms scattered light.
The method for the device to perform high and low temperature cone light interferometry comprises the following steps:
(a) firstly, a light path is debugged in a normal temperature environment, and the pitching of a visible laser is adjusted by using a five-dimensional precise adjusting frame, so that the laser is transmitted along the horizontal direction; sequentially mounting a first plane reflector, a second plane reflector, a polarizer, ground glass, a crystal to be detected and an analyzer on an optical flat plate along a laser light path, and placing a transmission light screen at the tail end of the light path;
(b) adjusting the pitching and the position of each element, enabling laser to be incident to the center of a first plane reflector and then vertically reflected to the center of a second plane reflector, enabling the laser to sequentially pass through the centers of a polarizer, ground glass, a crystal to be detected and an analyzer which are coaxially arranged after reflection, forming a cone light interference pattern and a transmission light spot on a transmission light screen, enabling the transmission light spot to be located at the symmetrical center of the cone light interference pattern, and fixing each element on an optical flat plate after adjustment is completed;
(c) placing the optical flat plate and all elements into a high-low temperature test chamber, enabling the input and output ends of a light path to be close to an observation window of the high-low temperature test chamber, installing a visible light laser on a five-dimensional precision adjusting frame and placing the visible light laser outside the high-low temperature test chamber, and enabling the laser to pass through the observation window and then to be incident on a first plane reflector; the transmission light screen is arranged outside the high-low temperature test box and is arranged at the tail end of the light path; adjusting the five-dimensional precision adjusting frame to form a cone light interference pattern and a transmission light spot on the transmission light screen, wherein the transmission light spot is positioned at the symmetrical center of the cone light interference pattern; translating the laser light path by using a five-dimensional precision adjusting frame, and measuring the cone light interference patterns of different areas in the light passing section of the crystal to be measured;
(d) and opening the high-low temperature test chamber, setting a temperature control program, and measuring the cone light interference patterns of the crystal in different areas in the light transmission section at different temperatures.
When the optical path is debugged in the step (b), the distance between the first plane reflector and the second plane reflector is set according to the size of the observation window of the high-low temperature test chamber, so that the incident laser and the formed cone light interference pattern are not shielded after the optical flat plate and all elements are placed into the high-low temperature test chamber.
The invention has the beneficial effects that: the invention fills the blank of high and low temperature conoscopic interferometry, expands the research method of the high and low temperature performance of the birefringent crystal, can visually reflect the change conditions of the birefringence characteristics of the crystal, the optical uniformity of the crystal and the like along with the temperature according to the measurement result, and is beneficial to explaining and researching the high and low temperature performance of the crystal device. By adopting the ground glass with proper scattering degree, the transmission light spot and the interference pattern are formed at the same time, and the transmission light spot is used as an indication, so that the debugging process is simple and convenient, and the measurement result is visual.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a schematic diagram of a high and low temperature conoscopic interferometry apparatus according to the present invention.
FIG. 2 is a conoscopic interference pattern and transmitted light point locations measured in an embodiment of the present invention, the transmitted light point being located at the center of symmetry of the conoscopic interference pattern.
FIG. 3 is a conoscopic interference pattern of different regions in the light-passing cross-section of a lithium niobate crystal after being cooled from room temperature to 0 ℃ at a rate of 2 ℃/min and kept at the same temperature for 0.5h, measured in an embodiment of the present invention.
FIG. 4 is a conoscopic interference pattern of different regions in the light-passing cross-section of a lithium niobate crystal after increasing the temperature from room temperature to 60 ℃ at a rate of 2 ℃/min and maintaining the temperature for 0.5h, measured in an embodiment of the present invention.
Detailed Description
The technical solutions of the present invention will be described clearly and completely with reference to the following embodiments of the present invention, and it should be understood that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be obtained by a person skilled in the art without inventive effort based on the embodiments of the present invention, are within the scope of the present invention.
As shown in fig. 1, a high-low temperature cone light interference measuring device, including visible light laser 1 and high-low temperature test box 11, visible light laser 1 installs on five-dimensional precision adjusting bracket 2, be equipped with the dull and stereotyped 10 of optics in the high-low temperature test box 11, be equipped with first plane speculum 3 and second plane speculum 4 on the dull and stereotyped 10 of optics, first plane speculum 3 and second plane speculum 4 all place and the direction mutually perpendicular along 45, polarizer 5, ground glass 6, the crystal 7 and the analyzer 8 of awaiting measuring have coaxially placed in proper order along the reflection light path of second plane speculum 4, high-low temperature test box 11 still is equipped with transmission light screen 9 outward.
Laser emitted by the visible light laser 1 passes through an observation window 12 of a high-low temperature test box 10 and then is incident on a first plane reflector 3, is incident on a second plane reflector 4 after being reflected, passes through a polarizer 5, ground glass 6, a crystal 7 to be tested and an analyzer 8 which are coaxially arranged after being reflected by the second plane reflector 4, and then is emitted to a transmission light screen 9 after passing through the observation window 12 of the high-low temperature test box 10; the polarizer 5 is vertical to the transmission direction of the analyzer 8; the ground glass 6 is suitably scattered, and a part of laser light is directly transmitted and a part of laser light forms scattered light.
In this embodiment, the adopted visible light laser is a green light laser with a wavelength of 532 nm, the crystal to be measured is a lithium niobate crystal with a size of 9mm × 9mm × 9.4mm (X × Y × Z), and light passes along the Z-axis direction.
The method for the device to perform high and low temperature cone light interferometry comprises the following steps:
(a) firstly, a light path is debugged in a normal temperature environment, and the pitching of the visible laser 1 is adjusted by using a five-dimensional precise adjusting frame 2, so that the laser is transmitted along the horizontal direction; the method comprises the following steps of sequentially mounting a first plane reflector 3, a second plane reflector 4, a polarizer 5, ground glass 6, a crystal to be detected 7 and an analyzer 8 on an optical flat plate 10 along a laser light path, and placing a transmission light screen 9 at the tail end of the light path;
(b) adjusting the pitching and the position of each element, enabling laser to be incident to the center of the first plane reflector 3 and then vertically reflected to the center of the second plane reflector 4, after reflection, sequentially passing through the centers of a polarizer 5, ground glass 6, a crystal 7 to be measured and an analyzer 8 which are coaxially arranged, and forming a cone light interference pattern and a transmission light spot on a transmission light screen 9, so that the transmission light spot is positioned at the symmetrical center of the cone light interference pattern; as shown in fig. 2, when the optical path is adjusted, the distance between the first and second plane mirrors is set according to the size of the observation window 12, so as to ensure that the incident laser and the formed cone light interference pattern are not blocked; after the adjustment is finished, fixing each element on the optical flat plate;
(c) placing an optical flat plate 10 and all elements into a high-low temperature test chamber 11, enabling an input/output end of a light path to be close to an observation window 12 of the high-low temperature test chamber 11, installing a visible light laser 1 on a five-dimensional precision adjusting frame 2, placing the visible light laser outside the high-low temperature test chamber 11, and enabling the laser to pass through the observation window 12 and then to enter a first plane reflector 3; the transmission light screen 9 is arranged outside the high-low temperature test box 10 and is arranged at the tail end of the light path; adjusting the five-dimensional precision adjusting frame 2 to form a cone light interference pattern and a transmission light spot on the transmission light screen 9; and the transmission light spot is positioned at the symmetrical center of the conical light interference pattern, and the laser is incident perpendicular to the end face of the lithium niobate crystal; measuring the conoscopic interference patterns of different areas in the light-passing section of the lithium niobate crystal by utilizing a translation light path of the five-dimensional precision adjusting frame 2;
(d) and (3) opening the high-low temperature test box 11, setting a temperature control program, and measuring the cone light interference patterns of the lithium niobate crystal in different areas in the light transmission section at different temperatures. FIG. 3 is a schematic diagram showing the interference pattern of cone light in different areas of the light-passing cross-section of the lithium niobate crystal after the temperature is decreased from room temperature to 0 ℃ at a rate of 2 ℃/min and kept constant for 0.5h, and FIG. 4 is a schematic diagram showing the interference pattern of cone light in different areas of the light-passing cross-section of the lithium niobate crystal after the temperature is increased from room temperature to 60 ℃ at a rate of 2 ℃/min and kept constant for 0.5 h.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.
Claims (6)
1. The utility model provides a high low temperature conoscopic light interferometry device which characterized in that: including visible light laser instrument (1) and high low temperature test box (11), install on five-dimensional accurate alignment jig (2) visible light laser instrument (1), be equipped with optics flat board (10) in high low temperature test box (11), be equipped with first plane speculum (3) and second plane speculum (4) on optics flat board (10), reflection light path along second plane speculum (4) has coaxially placed polarizer (5) in proper order, ground glass (6), crystal (7) and analyzer (8) await measuring, high low temperature test box (11) still are equipped with transmission light screen (9) outward.
2. The high and low temperature conoscopic interferometry apparatus according to claim 1, wherein: the first plane reflecting mirror (3) and the second plane reflecting mirror (4) are arranged along an angle of 45 degrees and are mutually vertical in direction.
3. The high and low temperature conoscopic interferometry apparatus according to claim 1, wherein: the polarization directions of the polarizer (5) and the analyzer (8) are mutually vertical.
4. The high and low temperature conoscopic interferometry apparatus according to claim 1, wherein: the ground glass can make a part of laser light directly transmit and a part of laser light form scattered light.
5. Method for performing high and low temperature conoscopic interferometry using the device according to any of claims 1-4, comprising the steps of:
(a) firstly, a light path is debugged in a normal temperature environment, and the pitching of the visible laser (1) is adjusted by using a five-dimensional precise adjusting frame (2) so that the laser can be transmitted along the horizontal direction; a first plane reflector (3), a second plane reflector (4), a polarizer (5), ground glass (6), a crystal to be detected (7) and an analyzer (8) are sequentially arranged on an optical flat plate (10) along a laser light path, and a transmission light screen (9) is arranged at the tail end of the light path;
(b) adjusting the pitching and the position of each element, enabling laser to be incident to the center of a first plane reflector (3) and then vertically reflected to the center of a second plane reflector (4), after reflection, sequentially passing through the centers of a polarizer (5), ground glass (6), a crystal (7) to be measured and an analyzer (8) which are coaxially arranged, forming a cone light interference pattern and a transmission light spot on a transmission light screen (9), enabling the transmission light spot to be positioned at the symmetrical center of the cone light interference pattern, and after adjustment is completed, fixing each element on an optical flat plate (10);
(c) an optical flat plate (10) and all elements are placed in a high-low temperature test chamber (11), the input and output ends of a light path are close to an observation window (12) of the high-low temperature test chamber (11), a visible light laser (1) is installed on a five-dimensional precision adjusting frame (2) and placed outside the high-low temperature test chamber (11), and the laser passes through the observation window (12) and then is incident on a first plane reflector (3); the transmission light screen (9) is arranged outside the high-low temperature test box (10) and at the tail end of the light path; adjusting the five-dimensional precision adjusting frame (2) to form a cone light interference pattern and a transmission light spot on the transmission light screen (9), wherein the transmission light spot is positioned at the symmetrical center of the cone light interference pattern; translating the laser light path by using the five-dimensional precision adjusting frame (2) to measure the cone light interference patterns of different areas in the light passing section of the crystal to be measured;
(d) and (3) opening the high-low temperature test box (11), setting a temperature control program, and measuring the cone light interference patterns of the crystal in different areas in the light passing cross section at different temperatures.
6. The method of claim 5, wherein: and (b) when the optical path is debugged in the step (b), setting the distance between the first plane reflector (3) and the second plane reflector (4) according to the size of the observation window (12) of the high-low temperature test chamber, and ensuring that the incident laser and the formed cone light interference pattern are not shielded after the optical flat plate (10) and all elements are placed in the high-low temperature test chamber (11).
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113358574A (en) * | 2021-04-28 | 2021-09-07 | 宁波大学 | System and method for measuring optical glass elasto-optical coefficient |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1711473A (en) * | 2002-10-30 | 2005-12-21 | I.S.L.公司 | Method for determining vanishing temperature of petroleum product crystals and device therefor |
| CN102507146A (en) * | 2011-09-29 | 2012-06-20 | 中国航空工业第六一八研究所 | Device and method for testing reflector parameters under high temperature and low temperature conditions |
| CN103018217A (en) * | 2012-11-30 | 2013-04-03 | 中国科学院福建物质结构研究所 | Non-linear optical test system under out-field induction |
| CN103018014A (en) * | 2012-12-26 | 2013-04-03 | 长春理工大学 | Measuring system for high and low-temperature modulation transfer functions of medium-wave infrared lenses |
| CN104931812A (en) * | 2015-05-15 | 2015-09-23 | 南开大学 | Electro-optical crystal electro-optical factor measure method and device |
| CN106768885A (en) * | 2016-12-16 | 2017-05-31 | 中国航空工业集团公司洛阳电光设备研究所 | A kind of device and method of testing for testing speculum resolution ratio |
-
2020
- 2020-11-10 CN CN202011246097.6A patent/CN112378862A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1711473A (en) * | 2002-10-30 | 2005-12-21 | I.S.L.公司 | Method for determining vanishing temperature of petroleum product crystals and device therefor |
| CN102507146A (en) * | 2011-09-29 | 2012-06-20 | 中国航空工业第六一八研究所 | Device and method for testing reflector parameters under high temperature and low temperature conditions |
| CN103018217A (en) * | 2012-11-30 | 2013-04-03 | 中国科学院福建物质结构研究所 | Non-linear optical test system under out-field induction |
| CN103018014A (en) * | 2012-12-26 | 2013-04-03 | 长春理工大学 | Measuring system for high and low-temperature modulation transfer functions of medium-wave infrared lenses |
| CN104931812A (en) * | 2015-05-15 | 2015-09-23 | 南开大学 | Electro-optical crystal electro-optical factor measure method and device |
| CN106768885A (en) * | 2016-12-16 | 2017-05-31 | 中国航空工业集团公司洛阳电光设备研究所 | A kind of device and method of testing for testing speculum resolution ratio |
Non-Patent Citations (13)
| Title |
|---|
| NIKOLAY SIDOROV等: "comparative investigation of LiNbO3 crystals Raman spectra in the temperature range 100–400K", 《VIBRATION SPECTROSCOPY》 * |
| NIKOLAY SIDOROV等: "comparative investigation of LiNbO3 crystals Raman spectra in the temperature range 100–400K", 《VIBRATION SPECTROSCOPY》, vol. 96, 19 February 2018 (2018-02-19), pages 19 - 25 * |
| WENXIA SIMA等: "Temperature characteristics of Pockels electro-optic voltage sensor with double crystal compensation", 《AIP ADVANCES》 * |
| WENXIA SIMA等: "Temperature characteristics of Pockels electro-optic voltage sensor with double crystal compensation", 《AIP ADVANCES》, 10 May 2016 (2016-05-10), pages 1 - 10 * |
| 商继芳等: "一种锥光干涉和近光轴调制结合测量晶体电光系数的方法", 《人工晶体学报》 * |
| 商继芳等: "一种锥光干涉和近光轴调制结合测量晶体电光系数的方法", 《人工晶体学报》, vol. 44, no. 11, 30 November 2015 (2015-11-30), pages 2927 - 2928 * |
| 张玲等: "高温度稳定性系列铌酸锂电光调 Q 开关的研制", 《人工晶体学报》, vol. 39, no. 4, pages 931 - 935 * |
| 张玲等: "高温度稳定性系列铌酸锂电光调Q开关的研制", 《人工晶体学报》 * |
| 张玲等: "高温度稳定性系列铌酸锂电光调Q开关的研制", 《人工晶体学报》, vol. 39, no. 4, 31 August 2010 (2010-08-31), pages 931 - 935 * |
| 李佳文等: "基于波长控制的LiNbO3晶体强电场传感器", 《光学技术》, vol. 45, no. 4, pages 447 - 452 * |
| 胡军等: "温度对铌酸锂电光相位调制特性的影响", 《光学与光电技术》, vol. 7, no. 5, pages 5 - 8 * |
| 高国祥等: "LiNbO3：Fe ,Zn 晶体不同温度下的扇形噪音研究", 《光电子.激光》 * |
| 高国祥等: "LiNbO3：Fe ,Zn 晶体不同温度下的扇形噪音研究", 《光电子.激光》, vol. 17, no. 2, 28 February 2006 (2006-02-28), pages 203 - 206 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113358574A (en) * | 2021-04-28 | 2021-09-07 | 宁波大学 | System and method for measuring optical glass elasto-optical coefficient |
| CN113358574B (en) * | 2021-04-28 | 2024-05-14 | 宁波大学 | System and method for measuring elasto-optical coefficient of optical glass |
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