CN104105975A - Electrode pattern test apparatus - Google Patents
Electrode pattern test apparatus Download PDFInfo
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- CN104105975A CN104105975A CN201380008145.XA CN201380008145A CN104105975A CN 104105975 A CN104105975 A CN 104105975A CN 201380008145 A CN201380008145 A CN 201380008145A CN 104105975 A CN104105975 A CN 104105975A
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- electrode pattern
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
- H01J9/42—Measurement or testing during manufacture
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
Disclosed is an electrode pattern test apparatus capable of performing an electrical test on an electrode pattern formed on a high resolution glass panel in a stable and quick manner. The electrode pattern test apparatus performs an electrical test simultaneously on an active area and on a fan out area of an electrode pattern through a single scanning, thus not only detecting whether the electrode pattern is open or short-circuited but also detecting an open point or a short point in a quick and accurate manner. As a result, time taken for testing an electrode pattern is shortened to achieve improved production efficiency of a glass panel.
Description
Technical field
The present invention relates to a kind of electrode pattern proving installation, relate more specifically to a kind ofly can carry out to the electrode pattern that forms the electrode pattern proving installation of electric test on the face glass of flat panel TV, for detection of described electrode pattern be whether open circuit or short circuit.
Background technology
Conventionally, the electrode pattern such as data line and gate line is to form on the face glass of flat panel TV.
In 42 inches of traditional PDP, live width and spacing are respectively 50 μ m and 300 μ m, but line length reaches 1m, this makes in not only online formation but also in other manufacture processes such as thermal process, the circuit of etween the lines can be establish road by cable or electrical short.Therefore, the electrode pattern between test most of manufacturing (electrode pattern be whether establish road by cable or electrical short) for improving output, be necessary.
In test electrode pattern, common use test pin piece.According to contact-type test, be arranged on a plurality of probes in testing needle piece and two end in contact of electrode pattern, take check target pattern and adjacent electrode whether as establish road by cable or electrical short.According to non-contact type test, probe only with a side contacts of electrode, to apply electric power, and the opposite side of electrode receives electric power and contact probe not.
Yet, traditional electrode pattern proving installation only can detecting electrode pattern be whether establish road by cable or electrical short, but open circuit point or the short dot in electrode pattern can not be detected.
With reference to Fig. 1, the structure of the traditional electrode pattern forming will be described on face glass.
Fig. 1 shows the electrode pattern forming on traditional face glass.
With reference to Fig. 1, traditional electrode pattern 500 comprises: for a plurality of pad portion 510 with probe contact, the zone of action 520 being connected with pad portion 510, and be used for output to be assigned to the fan-shaped region 530 of scattering being connected with zone of action 520 of other parts.A plurality of electrode patterns 500 that form in zone of action 520 are parallel to each other, but the electrode pattern 500 forming in the fan-shaped region 530 of scattering is to form like this: the spacing between electrode pattern 500 reduces, and it is parallel that electrode pattern 500 again becomes in the direction towards face glass 50 ends, output is assigned to other parts.
As mentioned above, the electrode pattern 500 of traditional glass panel 50 is different in zone of action 520 from fan-shaped formation of scattering in region 530, makes zone of action 520 and the fan-shaped region 530 of scattering by using traditional electrode pattern proving installation separately to be tested.Therefore, by traditional electrode pattern means, come test electrode pattern can need a lot of time.
Summary of the invention
< goal of the invention >
Therefore, the object of this invention is to provide a kind of contact-type electrode pattern proving installation, described contact-type electrode pattern proving installation not only can detecting electrode pattern be whether establish road by cable and electrical short, and open circuit point and the short dot in electrode pattern can be detected.
Another object of the present invention is to provide a kind of contact-type electrode pattern device of test electrode pattern in zone of action and the fan-shaped region of scattering simultaneously.
Another object of the present invention is to provide a kind of non-contact type electrode pattern proving installation, described contact-type electrode pattern proving installation by single pass not only can detect electrode pattern be whether establish road by cable or electrical short, and fan-shaped open circuit point and the short dot scattering in region can be detected.
Another object of the present invention is to provide a kind of non-contact type electrode pattern proving installation, described contact-type electrode pattern proving installation in the fan-shaped region of scattering, not only can detect electrode pattern be whether establish road by cable or electrical short, and open circuit point and short dot can be detected, and electrode pattern in zone of action, not only can be detected simultaneously and be whether establish road by cable or electrical short, open circuit point and short dot can also be detected.
< technical scheme >
According to the contact-type electrode pattern proving installation of one exemplary embodiment of the present invention, comprise: the first probe, described the first probe is configured to contact the electrode pattern on face glass, to apply electric signal to electrode pattern; First sensor part, described first sensor part can receive the electric signal that is applied to electrode pattern and is transmitted by electrode pattern by described the first probe with non-contact method, the electrode pattern being used in detected activity region be whether establish road by cable or electrical short, and be used for open circuit point or the short dot of the electrode pattern in detected activity region; The second probe, described the second probe is configured to contact the electrode pattern on face glass, to apply electric signal to electrode pattern; And second Sensor section, described the second Sensor section can receive the electric signal that is applied to electrode pattern and is transmitted by electrode pattern by described the second probe with non-contact method, be used for detecting the fan-shaped electrode pattern scattering in region and be whether establish road by cable or electrical short, and be used for detecting open circuit point and the short dot in the fan-shaped electrode pattern scattering in region.
For example, can be formed for by thering is the sensor array of a plurality of sensors of longitudinally arranging along electrode pattern the Sensor section in test activity region, make each sensor opsition dependent receive the electric signal transmitting by electrode pattern, the electrode pattern of take in detected activity region whether as electrical short or establish road by cable, and the open circuit point in the electrode pattern in detected activity region and short dot.
For example, first sensor is partly installed as this first sensor part can be moved along electrode pattern.
For example, the second Sensor section is installed as this second Sensor section can be moved along the direction perpendicular to direction of scanning.
For example, the second Sensor section is formed by sensor array.
According to the non-contact type electrode pattern proving installation of one exemplary embodiment of the present invention, comprise: the first probe, described the first probe is configured to the fan-shaped electrode pattern scattering in region of face glass, apply electric signal by non-contact method; With first sensor part, described first sensor part can receive the electric signal that is applied to electrode pattern and is transmitted by the fan-shaped electrode pattern scattering in region by described the first probe with non-contact method, take detect the fan-shaped electrode pattern scattering in region whether as electrical short or establish road by cable.
For example, first sensor is partly installed as this first sensor part can be moved along the direction perpendicular to direction of scanning.
For example, by thering is the sensor array of a plurality of sensors of longitudinally arranging along electrode pattern, form first sensor part, make each sensor opsition dependent receive the electric signal transmitting by electrode pattern, take detect the fan-shaped electrode pattern scattering in region whether as electrical short or establish road by cable, and detect open circuit point and the short dot of the fan-shaped electrode pattern in region that scatters.
On the other hand, non-contact type electrode pattern proving installation also comprises: the second probe, and the pad portion that described the second probe is configured to form with electrode pattern place on face glass contacts, to apply electric signal to the electrode pattern in zone of action; With the second Sensor section, described the second Sensor section can receive the electric signal that is applied to electrode pattern and is transmitted by the electrode pattern in zone of action by described the second probe with non-contact method, the electrode pattern of take in detected activity region whether as electrical short or establish road by cable, and the open circuit point of the electrode pattern in detected activity region and short dot.
For example, by thering is the sensor array of a plurality of sensors of longitudinally arranging along electrode pattern, form the second Sensor section, make each sensor opsition dependent receive the electric signal transmitting by electrode pattern, the electrode pattern of take in detected activity region whether as electrical short or establish road by cable, and the open circuit point of the electrode pattern in detected activity region and short dot.
For example, the second Sensor section is installed as this second Sensor section can be moved along electrode pattern.
< beneficial effect >
As mentioned above, contact-type electrode pattern proving installation according to an embodiment of the invention can detect by single pass fast and exactly, not only can detecting electrode pattern be whether establish road by cable or electrical short, and open circuit point and the short dot of the electrode pattern in zone of action can be detected, therefore can reduce the test duration of electrode pattern, to improve the throughput rate of face glass.
In addition, contact-type electrode pattern proving installation according to an embodiment of the invention can be by single pass while test electrode pattern in zone of action and the fan-shaped region of scattering, make further to reduce the test duration of electrode pattern, further to improve the throughput rate of face glass.
In addition, non-contact type electrode pattern proving installation according to an embodiment of the invention can detect by single pass fast and exactly, not only can detect the fan-shaped electrode pattern scattering in region and be whether establish road by cable or electrical short, and open circuit point and the short dot of electrode pattern can be detected, therefore can reduce the test duration of electrode pattern, to improve the throughput rate of face glass.
In addition, whether non-contact type electrode pattern proving installation according to an embodiment of the invention can be open circuit point and the short dot of establishing execution electrical testing road or electrical short by cable and detecting the fan-shaped electrode pattern in region that scatters to the fan-shaped electrode pattern scattering in region, and can whether be open circuit point and the short dot of establishing the electrode pattern in execution electrical testing road or electrical short detected activity region by cable to the electrode pattern in zone of action, therefore can further reduce the test duration of electrode pattern, further to improve the throughput rate of face glass.
Accompanying drawing explanation
Fig. 1 shows the electrode pattern forming on traditional glass panel;
Fig. 2 is the schematic diagram showing according to the contact-type electrode pattern proving installation of the first embodiment of the present invention;
Fig. 3 shows the electrical testing that passes through to carry out with contact-type electrode pattern proving installation electrode pattern according to the first embodiment of the present invention;
Fig. 4 is the schematic diagram that shows non-contact type electrode pattern proving installation according to a second embodiment of the present invention;
Fig. 5 shows the electrical testing that passes through to carry out with non-contact type electrode pattern proving installation electrode pattern according to a second embodiment of the present invention.
Embodiment
The present invention can implement in many different forms, referring to the accompanying drawing that shows exemplary embodiment of the present invention, more fully describes the present invention.Yet the present invention not should be understood to be limited to the embodiment setting forth herein, and should be understood to comprise all improvement, equivalent or the replacement scheme in design of the present invention and technical scope.
Digital terms such as " first ", " second " can be used as ordinal number and represent various structural member, yet structural member should not limited by these terms.These terms are only used for making a structural member to be different from another structural member.For example, if right does not go beyond the scope, the first structural member can be named as the second structural member, is equally applicable to the second structural member and can be named as the first structural member.
The term using in the application only, for explaining specific embodiment, is not intended to limit the scope of the invention.Unless specify especially in addition, term " ", " a kind of " and " this " represent " one or more ".Term " comprises ", " comprising " etc. be feature, numeral, process, structural member, part and the combiner for indicating the application, and should be understood that these terms do not get rid of also comprise one or more different features, numeral, process, structural member, partly, combiner.
If do not provide different definition herein, described belowly comprise that all terms of technology or scientific terminology all have the equivalent of being understood by those of ordinary skills.
If be not defined clearly, the term defining in traditional dictionary be appreciated that have with correlative technology field in the meaning equivalent in meaning of taken in context, and should not idealized ground or be understood too formally.
Hereinafter, embodiments of the invention will be described.
< embodiment 1>
Fig. 2 is the schematic diagram showing according to the contact-type electrode pattern proving installation of the first embodiment of the present invention.
With reference to Fig. 2, according to the contact-type electrode pattern proving installation 100 of the first embodiment of the present invention, comprise: movable block 110, the first probe 120, first sensor part 130, the second probe 140 and the second Sensor section 150.
Movable block 110 is installed as and makes movable block 110 be placed in face glass 30 tops, as shown in Figure 3.Movable block 110 can be arranged on and can move on three axle mobile members of this movable block 110 along three direction of principal axis.The three axle mobile members that can move this movable block 110 along three direction of principal axis are to be used by traditional electrode pattern proving installation.Therefore, in order to facilitate explanation will omit the structure of three axle mobile members in drawing and description.
In order to make electrode pattern on the first probe 120 contact face glasss 30 to apply electric signal to electrode pattern 300, the first probe 120 is arranged on to movable block 110 places.For example, can use contact-type probe to be used as the first probe 120, this contact-type probe contacts to apply electric signal to electrode pattern 300 with the electrode pattern 300 on face glass 30.Electrode pattern 300 on the first probe 120 contact face glasss 30, to apply electric signal to electrode pattern 300.Preferably, can the first probe 120 be directly installed at movable block 110 places, make the first probe 120 to combine movement with movable block 110.Alternatively, the first probe 120 can be installed at testing needle piece (not shown) place, this testing needle piece is arranged on a side of movable block movably along three direction of principal axis.For example, can the first probe 120 be arranged on to testing needle piece or movable block 110 places by lead connecting method.And, can the first probe 120 be arranged on to testing needle piece or movable block 110 places by a plurality of fixed components.
First sensor part 130 receives the electric signal be applied to electrode pattern 300 and transmitted by electrode pattern 300 by the first probe 120 with non-contact method, make in zone of action 320 electrode pattern 300 establish road by cable or electrical short can be detected.By mobile member 131, first sensor part 130 can be installed to movable block 110 places, first sensor part 130 can be moved along electrode pattern 300.The mobile member 131 that can move first sensor part 130 along electrode pattern 300 is conventional components that traditional mechanical type machine adopts.Therefore, for convenient, will omit any further explanation.By thering is the sensor array of a plurality of sensors of longitudinally arranging along electrode pattern 300, form first sensor part 130 (in zone of action 320).Therefore, by opsition dependent, receive the electric signal transmitting via electrode pattern 300, the electrode pattern of first sensor part 130 in not only can detected activity region 320 300 be whether establish road by cable or electrical short, and open circuit point and the short dot of the electrode pattern 300 in zone of action 320 can be detected.
Because first sensor part 130 is to be formed by the sensor array with a plurality of sensors of longitudinally arranging along the electrode pattern 300 in zone of action 320, so sensor can detect the electric signal transmitting via electrode pattern 300 by opsition dependent.Therefore, contact-type electrode pattern proving installation not only can detecting electrode pattern 300 be whether establish road by cable or electrical short, and can be fast and open circuit point and the short dot in zone of action 320 detected exactly.For example, when the electrode pattern 300 in zone of action 320 is electrical short, from the short circuit of electrode pattern 300, does not light and transmit electric signal by electrode pattern 300.Therefore, be placed in electrode pattern 300 that the first probe 120 contacts and the sensor between the short dot of electrode pattern 300 and electric signal can be detected, and the sensor being placed in after short dot can not detect electric signal.Therefore, can't detect the position that the first sensor of electric signal places and be detected as short dot.Thereby, can be fast and short dot and open circuit point detected exactly.
In order to make electrode pattern on the second probe 140 contact face glasss 30 to apply electric signal to electrode pattern 300, the second probe 140 is arranged on to movable block 110 places.As the first probe 120, can use to contact to apply electric signal with electrode pattern 300 on face glass 30 and be used as the second probe 140 to the contact-type probe of electrode pattern 300.Electrode pattern 300 on the second probe 140 contact face glasss 30, to apply electric signal to electrode pattern 300.Preferably, can the second probe 140 be directly installed at movable block 110 places, make the second probe 140 to combine movement with movable block 110.Alternatively, the second probe 140 can be installed at testing needle piece (not shown) place, this testing needle piece is arranged on a side of movable block movably along three direction of principal axis.For example, can the second probe 140 be arranged on to testing needle piece or movable block 110 places by lead connecting method.And, can the second probe 140 be arranged on to testing needle piece or movable block 110 places by a plurality of fixed components.
The second Sensor section 150 receives the electric signal be applied to electrode pattern 300 and transmitted by electrode pattern 300 by the second probe 140 with non-contact method, make in the fan-shaped region 330 of scattering electrode pattern 300 establish road by cable or electrical short can be detected.By mobile member 151, the second Sensor section 150 can be installed to movable block 110 places, make the second Sensor section 150 can be along perpendicular to moving according to the direction of the direction of scanning of the contact-type electrode pattern proving installation of embodiment.As moving the mobile member 131 of first sensor part 130 along electrode pattern 300, the mobile member 151 that can move along the direction perpendicular to direction of scanning the second Sensor section 150 is conventional components that traditional mechanical type machine adopts.Therefore, for convenient, will omit any further explanation.The second Sensor section 150 is to be formed by the sensor array with a plurality of sensors of arranging along direction of scanning.
Do not illustrate in the drawings: according to the contact-type electrode pattern proving installation of the present embodiment, further comprise the video camera of a side that is placed in the first probe 120 and the second probe 140, be used for confirming contacting of the first probe 120 and the second probe 140 and face glass 20.
With reference to Fig. 2 and Fig. 3, will illustrate by using the process of testing and the operating effect thereof of establishing road and electrical short by cable to electrode pattern according to the contact-type electrode pattern proving installation of the first embodiment.
Fig. 3 shows the electrical testing that passes through to carry out with contact-type electrode pattern proving installation electrode pattern according to the first embodiment of the present invention.
With reference to Fig. 2 and Fig. 3, for establish by cable road and the electrical short of the electrode pattern 300 on face glass 30 being carried out to test by using according to the contact-type electrode pattern proving installation of the first embodiment, first mobile movable block 110, make to be arranged on the first probe 120 and the second probe 140 contact electrode patterns 300 at movable block 110 places, to apply electric signal to electrode pattern 300.In this case, the first probe 120 applies electric signal to electrode pattern 300, for the electrode pattern 300 in test activity region 320, establish road and electrical short by cable, and the second probe 140 applies electric signal to electrode pattern 300, for test the fan-shaped region 330 of scattering electrode pattern 300 establish road and electrical short by cable.
As mentioned above, the electric signal that is applied to electrode pattern 300 by the first probe 120 is received with non-contact method by first sensor part 130, so as the electrode pattern 300 in detected activity region 320 establish road and electrical short by cable.In this case, first sensor part 130 is to be formed by the sensor array with a plurality of sensors of longitudinally arranging along electrode pattern 300, make the electrode pattern of first sensor part 130 in not only can detected activity region 320 300 be whether establish road by cable or electrical short, and can receive the electric signal transmitting via electrode pattern 300 by opsition dependent and carry out open circuit point and the short dot in detected activity region 320.Therefore, the electrode pattern 300 in zone of action 320 being detected establish road and electrical short by cable time, do not need extra test to detect open circuit point and short dot, the test duration of electrode pattern 300 can be reduced.
Meanwhile, the electric signal that is applied to electrode pattern 300 by the second probe 140 is received with non-contact method by the second Sensor section 150, with what detect the fan-shaped electrode pattern 300 scattering in region 330, establishes road and electrical short by cable.
Therefore, according to the contact-type electrode pattern proving installation of the present embodiment at movable block 110 when moving perpendicular to fan-shaped direction of scattering the electrode pattern 300 in region 330, can detected activity region 320 with the fan-shaped electrode pattern in region 330 300 of scattering be whether establish road by cable or electrical short, and when detect electrode pattern 300 establish road and electrical short by cable time, do not need extra test to come open circuit point and the short dot of detecting electrode pattern 300, can be reduced, to improve the throughput rate of face glass 30 test duration of electrode pattern 300.
< embodiment 2>
Fig. 4 is the schematic diagram that shows non-contact type electrode pattern proving installation according to a second embodiment of the present invention.
With reference to Fig. 4, according to the non-contact type electrode pattern proving installation 200 of the present embodiment of the present invention, comprise movable block 210, the first probe 240, first sensor part 250, the second probe 220 and the second Sensor section 230.
Movable block 210 is installed as and makes movable block 210 be placed in face glass 40 tops, as shown in Figure 3.Movable block 210 can be arranged on and can move on three axle mobile members of this movable block 210 along three direction of principal axis.The three axle mobile members that can move this movable block 210 along three direction of principal axis are to be used by traditional electrode pattern proving installation.Therefore, for convenient, explain, will in accompanying drawing and explanation, omit the structure of three axle mobile members.
At first sensor part 250 places, the first probe 240 is directly installed, to apply electric signal by non-contact method to the fan-shaped electrode pattern 400 scattering in region 430.The first probe 240 applies electric signal to the fan-shaped electrode pattern 400 scattering in region 430 with non-contact method.
First sensor part 250 receives the electric signal be applied to electrode pattern 400 and transmitted by the fan-shaped electrode pattern 400 scattering in region 430 by the first probe 240 with non-contact method, make the fan-shaped electrode pattern 400 scattering in region 430 establish road by cable or electrical short can be detected.The first probe 240 is installed to first sensor part 250 places.By mobile member 251, first sensor part 250 can be installed to movable block 210 places, first sensor part 250 can be moved along the direction of the direction of scanning of the non-contact type electrode pattern proving installation perpendicular to the present embodiment.The mobile member 251 that can move along the direction perpendicular to direction of scanning first sensor part 250 is conventional components that traditional mechanical type machine adopts.First sensor part 250 is to be formed by the sensor array with a plurality of sensors of longitudinally arranging along electrode pattern 400.Therefore, by opsition dependent, receive the electric signal transmitting via electrode pattern 400, first sensor part 250 not only can detect the fan-shaped electrode pattern in region 430 400 of scattering be whether establish road by cable or electrical short, and open circuit point and the short dot of the fan-shaped electrode pattern 400 in region 430 that scatters can be detected.
For the pad portion 410 that the second probe 220 touched form at electrode pattern 400 places of face glass 40 is to apply electric signal to the electrode pattern 400 in zone of action 420, the second probe 220 is arranged on to movable block 210 places.The pad portion 410 that the second probe 220 contact forms in the terminal part office of the electrode pattern 400 of face glass 40, to apply electric signal to the electrode pattern 400 in zone of action 420.Preferably, can the second probe 220 be directly installed at movable block 210 places, make the second probe 220 to combine movement with movable block 210.Alternatively, the second probe 220 can be installed at testing needle piece (not shown) place, this testing needle piece is arranged on a side of movable block movably along three direction of principal axis.For example, can the second probe 220 be arranged on to testing needle piece or movable block 210 places by lead connecting method.And, can the second probe 220 be arranged on to testing needle piece or movable block 210 places by a plurality of fixed components.
The second Sensor section 230 receives the electric signal be applied to the electrode pattern 400 in zone of action 420 and transmitted by the electrode pattern 400 in zone of action 420 by the second probe 220 with non-contact method, make electrode pattern 400 in zone of action 420 establish road by cable or electrical short can be detected.By mobile member 231, the second Sensor section 230 can be installed to movable block 210 places, the second Sensor section 230 can be moved along electrode pattern 400.As moving the mobile member 251 of first sensor part 250 along electrode pattern 400, the mobile member 231 that can move the second Sensor section 230 along electrode pattern 400 is conventional components that traditional mechanical type machine adopts.Therefore,, for convenient, will omit any further explanation.The second Sensor section 230 is to be formed by the sensor array with a plurality of sensors of longitudinally arranging along electrode pattern 400 (in zone of action 420).Therefore, the electrode pattern of the second Sensor section 230 in not only can detected activity region 420 400 be whether establish road by cable or electrical short, and can receive open circuit point and the short dot that the electric signal transmitting via electrode pattern 400 carrys out the electrode pattern 400 in detected activity region 420 by opsition dependent.
Because the second Sensor section 230 is to be formed by the sensor array with a plurality of sensors of longitudinally arranging along the electrode pattern 400 in zone of action 420, so sensor can detect the electric signal transmitting via electrode pattern 400 by opsition dependent.Therefore, the non-contact type electrode pattern proving installation of the present embodiment not only can detecting electrode pattern 400 be whether establish road by cable or electrical short, and can be fast and open circuit point and the short dot in zone of action 420 detected exactly.For example, when the electrode pattern 400 in zone of action 420 is electrical short, from the short circuit of electrode pattern 400, does not light and transmit electric signal by electrode pattern 400.Therefore, be placed in electrode pattern 400 that the second probe 220 contacts and the sensor between the short dot of electrode pattern 400 and electric signal can be detected, and the sensor being placed in after short dot can not detect electric signal.Therefore, can't detect the position that the first sensor of electric signal places and be detected as short dot.Thereby, can be fast and short dot and open circuit point detected exactly.
Do not illustrate in the drawings: according to the electrode pattern proving installation of the present embodiment, may further include the video camera of a side that is placed in the second probe 220, be used for confirming contacting of the second probe 220 and electrode pattern 400 on face glass 20.
With reference to Fig. 4 and Fig. 5, will illustrate by using process and the operating effect thereof that road and electrical short are tested of establishing by cable to electrode pattern according to the non-contact type electrode pattern proving installation of the second embodiment.
Fig. 5 shows the electrical testing that passes through to carry out with non-contact type electrode pattern proving installation electrode pattern according to a second embodiment of the present invention.
With reference to Fig. 4 and Fig. 5, for establish by cable road and the electrical short of the electrode pattern 400 on face glass 40 being carried out to test by using according to the non-contact type electrode pattern proving installation of the present embodiment, first movable block 210 is moved as making to be arranged on the second probe 220 contact pad parts 410 at movable block 210 places, to apply electric signal to the electrode pattern 400 in zone of action 420, and the first probe 240 applies electric signal to the fan-shaped electrode pattern 400 scattering in region 420 with non-contact method.In other words, the second probe 220 applies electric signal to the pad portion 410 forming at electrode pattern 400 places with contact method, for the electrode pattern 400 in test activity region 420, establish road and electrical short by cable, and the first probe 240 applies electric signal to the fan-shaped electrode pattern 400 scattering in region 430, for test the fan-shaped region 430 of scattering electrode pattern 400 establish road and electrical short by cable.
As mentioned above, the electric signal that is applied to electrode pattern 400 by the second probe 220 is received with non-contact method by the second Sensor section 230, so as the electrode pattern 400 in detected activity region 420 establish road and electrical short by cable.In this case, the second Sensor section 220 is to be formed by the sensor array with a plurality of sensors of longitudinally arranging along electrode pattern 400, make the second Sensor section 220 by opsition dependent receive electrode pattern in not only can detected activity region 420 of the electric signal that transmits via electrode pattern 400 400 be whether establish road by cable or electrical short, and open circuit point and the short dot of the electrode pattern 400 in zone of action 420 can be detected.Therefore, the electrode pattern 400 in zone of action 420 being detected establish road and electrical short by cable time, do not need extra detection to test to detect open circuit point or short dot, the test duration of electrode pattern 400 can be reduced.
Simultaneously, the electric signal that is applied to the fan-shaped electrode pattern 400 in region 430 that scatters by the first probe 240 with non-contact method is received with non-contact method by first sensor part 250, so as to detect the fan-shaped electrode pattern 400 scattering in region 430 establish road and electrical short by cable.In this case, the same with the second Sensor section 220, first sensor part 250 is also to be formed by the sensor array of longitudinally arranging along electrode pattern 400, thereby makes each sensor by the position of electrode pattern 400, receive the electric signal that is applied to electrode pattern 400 and is passed by the first probe 240.Therefore, not only can detect the fan-shaped electrode pattern in region 430 400 of scattering and be whether establish road by cable or electrical short, and open circuit point and the short dot of the fan-shaped electrode pattern 400 in region 430 that scatters can be detected.Therefore, when detect the fan-shaped electrode pattern 400 scattering in region 430 establish road and electrical short by cable time, do not need extra detection to test open circuit point or the short dot of detecting electrode pattern 400, the test duration of electrode pattern 400 can be reduced.
As mentioned above, when movable block 210 is mobile along the direction (being direction of scanning) perpendicular to the electrode pattern 400 in zone of action 430, the non-contact type electrode pattern device of the present embodiment to zone of action 420 and the fan-shaped a plurality of electrode patterns 400 that scatter in region 430 establish road by cable or electrical short detect.
As mentioned above, the non-contact type electrode pattern device of the present embodiment passes through single pass, not only detect the fan-shaped electrode pattern in region 430 400 of scattering and be whether establish road by cable or electrical short, and fast and detect exactly open circuit point and the short dot of the fan-shaped electrode pattern 400 in region 430 that scatters.
In addition, the non-contact type electrode pattern device of the present embodiment passes through single pass, not only the electrode pattern in detected activity region 430 400 be whether establish road by cable or electrical short, and fast and detect exactly open circuit point and the short dot of the fan-shaped electrode pattern 400 in region 430 that scatters.
Therefore, according to the non-contact type electrode pattern proving installation of the present embodiment, when detect electrode pattern 400 establish road or electrical short by cable time, do not need extra detection to test to detect open circuit point or short dot, the test duration of electrode pattern 400 can be reduced.
Therefore, the non-contact type electrode pattern proving installation of the present embodiment can reduce the test duration of electrode pattern 400, to improve the throughput rate of face glass 40.
In addition, whether the non-contact type electrode pattern device of the present embodiment detects whether the fan-shaped electrode pattern scattering in region 430 is open circuit point and the short dot of establishing road or electrical short and the fan-shaped electrode pattern 400 in region 430 that scatters by cable, and be open circuit point and the short dot of establishing the electrode pattern 400 in road or electrical short and zone of action 420 by cable by the electrode pattern in single pass process while detected activity region 420.
Therefore, the non-contact type electrode pattern proving installation of the present embodiment can further reduce the test duration of electrode pattern 400, to improve the throughput rate of face glass 20.
In instructions, with reference to embodiment, explain the present invention.Yet, it will be apparent to one skilled in the art that and can make various improvement and distortion and not depart from the spirit or scope of the present invention described in the claims the present invention.
Claims (11)
1. the electrode pattern on face glass is carried out to a contact-type electrode pattern proving installation for electric test, described contact-type electrode pattern proving installation comprises:
The first probe, described the first probe is configured to contact the electrode pattern on face glass, to apply electric signal to described electrode pattern;
First sensor part, described first sensor part can receive described electric signal with non-contact method, described electric signal is be applied to described electrode pattern and be passed by described electrode pattern by described the first probe, the described electrode pattern being used in detected activity region be whether establish road by cable or electrical short, and be used for detecting open circuit point or the short dot of the electrode pattern in described zone of action;
The second probe, described the second probe is configured to contact the electrode pattern on described face glass, to apply electric signal to described electrode pattern; And
The second Sensor section, described the second Sensor section can receive electric signal with non-contact method, described electric signal is applied to described electrode pattern by described the second probe and transmits by described electrode pattern, be used for detecting the fan-shaped described electrode pattern scattering in region and be whether establish road by cable or electrical short, and be used for detecting open circuit point and the short dot in the described fan-shaped described electrode pattern scattering in region.
2. contact-type electrode pattern proving installation according to claim 1, wherein said first sensor is partly to be formed by the sensor array with a plurality of sensors of longitudinally arranging along described electrode pattern, make each the sensor opsition dependent in described sensor receive the electric signal transmitting by described electrode pattern, take detect described electrode pattern in described zone of action whether as electrical short or establish road by cable, and detect open circuit point and the short dot of the described electrode pattern in described zone of action.
3. contact-type electrode pattern proving installation according to claim 1, is wherein partly installed as described first sensor described first sensor part can be moved along described electrode pattern.
4. contact-type electrode pattern proving installation according to claim 1, is wherein installed as described the second Sensor section described the second Sensor section can be moved along the direction perpendicular to direction of scanning.
5. contact-type electrode pattern proving installation according to claim 1, wherein said the second Sensor section is formed by sensor array.
6. the electrode pattern on face glass is carried out to a non-contact type electrode pattern proving installation for electric test, described non-contact type electrode pattern proving installation comprises:
The first probe, described the first probe is configured to the fan-shaped described electrode pattern scattering in region of described face glass, apply electric signal by non-contact method; And
First sensor part, described first sensor part can receive described electric signal with non-contact method, described electric signal is be applied to described electrode pattern and transmitted by the described fan-shaped described electrode pattern scattering in region by described the first probe, take detect the described fan-shaped described electrode pattern scattering in region whether as electrical short or establish road by cable.
7. non-contact type electrode pattern proving installation according to claim 6, is wherein partly installed as described first sensor described first sensor part can be moved along the direction perpendicular to direction of scanning.
8. non-contact type electrode pattern proving installation according to claim 6, wherein said first sensor is partly to be formed by the sensor array with a plurality of sensors of longitudinally arranging along described electrode pattern, make each the sensor opsition dependent in described sensor receive the electric signal transmitting by electrode pattern, take detect the described fan-shaped described electrode pattern scattering in region whether as electrical short or establish road by cable, and detect open circuit point and the short dot of the described fan-shaped described electrode pattern in region that scatters.
9. non-contact type electrode pattern proving installation according to claim 6, also comprises:
The second probe, the pad portion that described the second probe is configured to form with described electrode pattern place on described face glass contacts, to apply electric signal to the described electrode pattern in zone of action; And
The second Sensor section, described the second Sensor section can receive described electric signal with non-contact method, described electric signal is applied to described electrode pattern by described the second probe and transmits by the described electrode pattern in described zone of action, take detect described electrode pattern in described zone of action whether as electrical short or establish road by cable, and detect open circuit point and the short dot of the described electrode pattern in described zone of action.
10. non-contact type electrode pattern proving installation according to claim 9, wherein said the second Sensor section is formed by the sensor array with a plurality of sensors of longitudinally arranging along described electrode pattern, make each the sensor opsition dependent in described sensor receive the electric signal transmitting by electrode pattern, take detect described electrode pattern in described zone of action whether as electrical short or establish road by cable, and detect open circuit point and the short dot of the described electrode pattern in described zone of action.
11. non-contact type electrode pattern proving installations according to claim 9, are wherein installed as described the second Sensor section described the second Sensor section can be moved along described electrode pattern.
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2012-0011919 | 2012-02-06 | ||
| KR1020120011917A KR101223930B1 (en) | 2012-02-06 | 2012-02-06 | Contact type electrode pattern inspection apparatus |
| KR10-2012-0011917 | 2012-02-06 | ||
| KR1020120011919A KR101300465B1 (en) | 2012-02-06 | 2012-02-06 | Non-contact type electrode pattern inspection apparatus |
| PCT/KR2013/000906 WO2013119014A1 (en) | 2012-02-06 | 2013-02-05 | Electrode pattern test apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104105975A true CN104105975A (en) | 2014-10-15 |
| CN104105975B CN104105975B (en) | 2016-03-30 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201380008145.XA Expired - Fee Related CN104105975B (en) | 2012-02-06 | 2013-02-05 | Electrode pattern proving installation |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN104105975B (en) |
| WO (1) | WO2013119014A1 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104793365A (en) * | 2015-04-23 | 2015-07-22 | 深圳市华星光电技术有限公司 | Display panel circuit detecting device and method |
| CN107564827A (en) * | 2016-07-01 | 2018-01-09 | 罗泽系统株式会社 | The wiring pattern check device and wiring pattern inspection method of plate |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103698648B (en) * | 2013-12-23 | 2016-04-06 | 合肥京东方光电科技有限公司 | Line detection apparatus |
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| KR20050064964A (en) * | 2003-12-24 | 2005-06-29 | 엘지전자 주식회사 | Electrode line inspection device for flat-display panel and method for the same |
| CN101109782A (en) * | 2006-07-20 | 2008-01-23 | 微探测株式会社 | Noncontact type single side probe device and apparatus and method for testing open or short circuits of pattern electrodes using the same |
| KR20100028275A (en) * | 2008-09-04 | 2010-03-12 | 엘지전자 주식회사 | Apparatus and method for inspecting electrode lines of falt panel display |
| WO2011021567A1 (en) * | 2009-08-17 | 2011-02-24 | 株式会社エフカム | Electrical conduction pattern inspection apparatus and inspection method |
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- 2013-02-05 CN CN201380008145.XA patent/CN104105975B/en not_active Expired - Fee Related
- 2013-02-05 WO PCT/KR2013/000906 patent/WO2013119014A1/en active Application Filing
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| KR20050064964A (en) * | 2003-12-24 | 2005-06-29 | 엘지전자 주식회사 | Electrode line inspection device for flat-display panel and method for the same |
| CN101109782A (en) * | 2006-07-20 | 2008-01-23 | 微探测株式会社 | Noncontact type single side probe device and apparatus and method for testing open or short circuits of pattern electrodes using the same |
| KR20100028275A (en) * | 2008-09-04 | 2010-03-12 | 엘지전자 주식회사 | Apparatus and method for inspecting electrode lines of falt panel display |
| WO2011021567A1 (en) * | 2009-08-17 | 2011-02-24 | 株式会社エフカム | Electrical conduction pattern inspection apparatus and inspection method |
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| CN104793365A (en) * | 2015-04-23 | 2015-07-22 | 深圳市华星光电技术有限公司 | Display panel circuit detecting device and method |
| WO2016169171A1 (en) * | 2015-04-23 | 2016-10-27 | 深圳市华星光电技术有限公司 | Detection device and detection method of display panel circuit |
| CN107564827A (en) * | 2016-07-01 | 2018-01-09 | 罗泽系统株式会社 | The wiring pattern check device and wiring pattern inspection method of plate |
Also Published As
| Publication number | Publication date |
|---|---|
| CN104105975B (en) | 2016-03-30 |
| WO2013119014A1 (en) | 2013-08-15 |
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