CN104105975B - Electrode pattern proving installation - Google Patents
Electrode pattern proving installation Download PDFInfo
- Publication number
- CN104105975B CN104105975B CN201380008145.XA CN201380008145A CN104105975B CN 104105975 B CN104105975 B CN 104105975B CN 201380008145 A CN201380008145 A CN 201380008145A CN 104105975 B CN104105975 B CN 104105975B
- Authority
- CN
- China
- Prior art keywords
- electrode pattern
- sensor
- probe
- electric signal
- contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
- H01J9/42—Measurement or testing during manufacture
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
Disclose a kind of electrode pattern proving installation, described electrode pattern proving installation can perform electric test to stablize also mode fast to the electrode pattern formed on high resolving power face glass.Described electrode pattern proving installation performs electric test by single pass on the zone of action of electrode pattern and fan region simultaneously, thus not only with fast and accurately mode detect described electrode pattern be whether open circuit or short circuit, and detect open circuit point or short dot.Therefore, shorten the time required for test electrode pattern, to realize the raising of the production efficiency of face glass.
Description
Technical field
The present invention relates to a kind of electrode pattern proving installation, relate more specifically to a kind of electrode pattern proving installation that can perform electric test to the electrode pattern that formed on the face glass of flat panel TV, for detect described electrode pattern be whether open circuit or short circuit.
Background technology
Usually, the electrode pattern of such as data line and gate line is formed on the face glass of flat panel TV.
In traditional 42 inches of PDP, live width and spacing are 50 μm and 300 μm respectively, but line length reaches 1m, this makes in not only online formation but also in other manufacture processes of such as thermal process, and circuit between the lines can be opens or electrical short.Therefore, electrode pattern between test most of manufacturing (electrode pattern be whether opens or electrical short) be necessary for raising output.
In test electrode pattern, usually use testing needle block.According to contact-type test, be arranged on two end in contact of multiple probe in testing needle block and electrode pattern, with check target pattern and adjacent electrode whether for opens or electrical short.According to non-contact type test, probe only with a side contacts of electrode, to apply electric power, and the opposite side of electrode receives electric power and not contact probe.
But, traditional electrode pattern proving installation only can detecting electrode pattern be whether opens or electrical short, but the open circuit point in electrode pattern or short dot can not be detected.
With reference to Fig. 1, the structure of the traditional electrode pattern formed on glass panels will be described.
Fig. 1 shows the electrode pattern formed on traditional face glass.
With reference to Fig. 1, traditional electrode pattern 500 comprises: for multiple pad portion 510 of probes touch, the zone of action 520 that is connected with pad portion 510, and be used for output to be assigned to the fan region 530 be connected with zone of action 520 of other parts.The multiple electrode patterns 500 formed in zone of action 520 are parallel to each other, but the electrode pattern 500 formed in fan region 530 is formed like this: the spacing between electrode pattern 500 reduces, and electrode pattern 500 again becomes parallel in the direction towards face glass 50 end, so that output is assigned to other parts.
As mentioned above, the electrode pattern 500 of conventional glass panel 50 is different in zone of action 520 from the formation in fan region 530, and zone of action 520 and fan region 530 are separately tested by using traditional electrode pattern proving installation.Therefore, use traditional electrode pattern means to carry out test electrode pattern and can need a lot of time.
Summary of the invention
< goal of the invention >
Therefore, the object of this invention is to provide a kind of contact-type electrode pattern proving installation, described contact-type electrode pattern proving installation can not only detecting electrode pattern be whether opens and electrical short, and the open circuit point in electrode pattern and short dot can be detected.
Another object of the present invention be to provide a kind of can the simultaneously contact-type electrode pattern device of test electrode pattern in zone of action and fan region.
Another object of the present invention is to provide a kind of non-contact type electrode pattern proving installation, described contact-type electrode pattern proving installation by single pass can not only detect electrode pattern be whether opens or electrical short, and the open circuit point in fan region and short dot can be detected.
Another object of the present invention is to provide a kind of non-contact type electrode pattern proving installation, described contact-type electrode pattern proving installation can not only detect in fan region electrode pattern be whether opens or electrical short, and open circuit point and short dot can be detected, and can not only detect in zone of action simultaneously electrode pattern be whether opens or electrical short, open circuit point and short dot can also be detected.
< technical scheme >
Contact-type electrode pattern proving installation according to one exemplary embodiment of the present invention comprises: the first probe, and described first probe is configured to contact the electrode pattern on face glass, to apply electric signal to electrode pattern; First sensor part, described first sensor part can be received with non-contact method and be applied to electrode pattern and the electric signal transmitted by electrode pattern by described first probe, the electrode pattern be used in detected activity region be whether opens or electrical short, and be used for the open circuit point of the electrode pattern in detected activity region or short dot; Second probe, described second probe is configured to contact the electrode pattern on face glass, to apply electric signal to electrode pattern; And second Sensor section, described second Sensor section can be received with non-contact method and be applied to electrode pattern and the electric signal transmitted by electrode pattern by described second probe, be used for detecting electrode pattern in fan region be whether opens or electrical short, and be used for detecting the open circuit point in the electrode pattern in fan region and short dot.
Such as, the Sensor section for test activity region can be formed by the sensor array with the multiple sensors longitudinally arranged along electrode pattern, each sensor opsition dependent is made to receive the electric signal transmitted by electrode pattern, with the electrode pattern in detected activity region whether for electrical short or opens, and open circuit point in electrode pattern in detected activity region and short dot.
Such as, first sensor part is installed as this first sensor part can be moved along electrode pattern.
Such as, the second Sensor section is installed as this second Sensor section can be moved along the direction perpendicular to direction of scanning.
Such as, the second Sensor section is formed by sensor array.
Non-contact type electrode pattern proving installation according to one exemplary embodiment of the present invention comprises: the first probe, and described first probe is configured to apply electric signal to the electrode pattern in the fan region of face glass by non-contact method; With first sensor part, described first sensor part can be received with non-contact method and be applied to electrode pattern and the electric signal transmitted by the electrode pattern in fan region by described first probe, with detect electrode pattern in fan region whether for electrical short or opens.
Such as, first sensor part is installed as this first sensor part can be moved along the direction perpendicular to direction of scanning.
Such as, first sensor part is formed by the sensor array with the multiple sensors longitudinally arranged along electrode pattern, each sensor opsition dependent is made to receive the electric signal transmitted by electrode pattern, with detect electrode pattern in fan region whether for electrical short or opens, and detect open circuit point and the short dot of the electrode pattern in fan region.
On the other hand, non-contact type electrode pattern proving installation also comprises: the second probe, and the pad portion that described second probe is configured to be formed with electrode pattern place on glass panels contacts, to apply electric signal to the electrode pattern in zone of action; With the second Sensor section, described second Sensor section can be received with non-contact method and be applied to electrode pattern and the electric signal transmitted by the electrode pattern in zone of action by described second probe, with the electrode pattern in detected activity region whether for electrical short or opens, and the open circuit point of electrode pattern in detected activity region and short dot.
Such as, the second Sensor section is formed by the sensor array with the multiple sensors longitudinally arranged along electrode pattern, each sensor opsition dependent is made to receive the electric signal transmitted by electrode pattern, with the electrode pattern in detected activity region whether for electrical short or opens, and the open circuit point of electrode pattern in detected activity region and short dot.
Such as, the second Sensor section is installed as this second Sensor section can be moved along electrode pattern.
< beneficial effect >
As mentioned above, contact-type electrode pattern proving installation according to an embodiment of the invention can fast and detected by single pass exactly, can not only detecting electrode pattern be whether opens or electrical short, and open circuit point and the short dot of the electrode pattern in zone of action can be detected, therefore the test duration of electrode pattern can be reduced, to improve the throughput rate of face glass.
In addition, contact-type electrode pattern proving installation according to an embodiment of the invention can by single pass test electrode pattern in zone of action and fan region simultaneously, make the test duration reducing electrode pattern further, to improve the throughput rate of face glass further.
In addition, non-contact type electrode pattern proving installation according to an embodiment of the invention can fast and detected by single pass exactly, can not only detect electrode pattern in fan region be whether opens or electrical short, and open circuit point and the short dot of electrode pattern can be detected, therefore the test duration of electrode pattern can be reduced, to improve the throughput rate of face glass.
In addition, non-contact type electrode pattern proving installation according to an embodiment of the invention can to the electrode pattern in fan region be whether opens or electrical short execution electrical testing and detect open circuit point and the short dot of the electrode pattern in fan region, and can to the electrode pattern in zone of action be whether opens or the execution electrical testing of electrical short the open circuit point of the electrode pattern in detected activity region and short dot, therefore the test duration of electrode pattern can be reduced further, to improve the throughput rate of face glass further.
Accompanying drawing explanation
Fig. 1 shows the electrode pattern formed on conventional glass panel;
Fig. 2 is the schematic diagram of the contact-type electrode pattern proving installation shown according to the first embodiment of the present invention;
Fig. 3 shows the electrical testing by using contact-type electrode pattern proving installation to perform electrode pattern according to the first embodiment of the present invention;
Fig. 4 is the schematic diagram of the non-contact type electrode pattern proving installation shown according to a second embodiment of the present invention;
Fig. 5 shows the electrical testing by using non-contact type electrode pattern proving installation to perform electrode pattern according to a second embodiment of the present invention.
Embodiment
The present invention can implement in many different forms, more fully describes the present invention referring to the accompanying drawing showing exemplary embodiment of the present invention.But the present invention not should be understood to be limited to the embodiment set forth herein, and should be understood to include all improvement in design of the present invention and technical scope, equivalent or replacement scheme.
Such as the numerical terms such as " first ", " second " can be used as ordinal number to represent various structural member, but, structural member not should limit by these terms.These terms are only used for making a structural member be different from another structural member.Such as, if right does not go beyond the scope, then the first structural member can be named as the second structural member, is equally applicable to the second structural member and can be named as the first structural member.
The term used in the application is only for explaining specific embodiment, and not intended to be limits the scope of the invention.Unless specified especially in addition, term " ", " one " and " this " represent " one or more ".Term " comprises ", " comprising " etc. be used to indicate the feature of the application, numeral, process, structural member, part and combiner, and should be understood that these terms do not get rid of also comprise one or more different feature, numeral, process, structural member, partly, combiner.
If do not provide different definition herein, all terms comprising technology or scientific terminology described below all have the equivalent be readily appreciated by those of ordinary skilled in the art.
If be not defined clearly, the term defined in traditional dictionary is appreciated that the meaning equivalent in meaning had with taken in context in correlative technology field, and should not idealized ground or be too understood formally.
Hereinafter, embodiments of the invention will be described.
< embodiment 1>
Fig. 2 is the schematic diagram of the contact-type electrode pattern proving installation shown according to the first embodiment of the present invention.
With reference to Fig. 2, the contact-type electrode pattern proving installation 100 according to the first embodiment of the present invention comprises: movable block 110, first probe 120, first sensor part 130, second probe 140 and the second Sensor section 150.
Movable block 110 is installed as and makes movable block 110 be placed in above face glass 30, as shown in Figure 3.Movable block 110 can be arranged on and can move on three axle mobile members of this movable block 110 along three direction of principal axis.The three axle mobile members that can move this movable block 110 along three direction of principal axis used by traditional electrode pattern proving installation.Therefore, the structure will omitting three axle mobile members in the accompanying drawings and the description is conveniently explained.
In order to make the first probe 120 contact electrode pattern on face glass 30 to apply electric signal to electrode pattern 300, the first probe 120 is arranged on movable block 110 place.Such as, contact-type probe can be used to be used as the first probe 120, this contact-type probe contacts to apply electric signal to electrode pattern 300 with the electrode pattern 300 on face glass 30.First probe 120 contacts the electrode pattern 300 on face glass 30, to apply electric signal to electrode pattern 300.Preferably, at movable block 110 place, the first probe 120 can be directly installed, make the first probe 120 can combine movement with movable block 110.Alternatively, can install the first probe 120 at testing needle block (not shown) place, this testing needle block is arranged on the side of movable block movably along three direction of principal axis.Such as, by lead connecting method, the first probe 120 can be arranged on testing needle block or movable block 110 place.Further, by multiple fixed component, the first probe 120 can be arranged on testing needle block or movable block 110 place.
First sensor part 130 is received with non-contact method and is applied to electrode pattern 300 and the electric signal transmitted by electrode pattern 300 by the first probe 120, and the opens of electrode pattern 300 in zone of action 320 or electrical short can be detected.First sensor part 130 can be installed to movable block 110 place by mobile member 131, first sensor part 130 can be moved along electrode pattern 300.The mobile member 131 that can move first sensor part 130 along electrode pattern 300 is conventional components that traditional mechanical type machine adopts.Therefore, any further explanation will conveniently be omitted.First sensor part 130 (in zone of action 320) is formed by the sensor array with the multiple sensors longitudinally arranged along electrode pattern 300.Therefore, the electric signal transmitted via electrode pattern 300 is received by opsition dependent, first sensor part 130 can not only electrode pattern in detected activity region 320 300 be whether opens or electrical short, and open circuit point and the short dot of the electrode pattern 300 in zone of action 320 can be detected.
Because first sensor part 130 is formed by the sensor array with the multiple sensors longitudinally arranged along the electrode pattern 300 in zone of action 320, therefore sensor can detect the electric signal transmitted via electrode pattern 300 by opsition dependent.Therefore, contact-type electrode pattern proving installation can not only detecting electrode pattern 300 be whether opens or electrical short, and the open circuit point in zone of action 320 and short dot can be detected fast and exactly.Such as, when the electrode pattern 300 in zone of action 320 is electrical short, lights from the short circuit of electrode pattern 300 and do not transmit electric signal by electrode pattern 300.Therefore, be placed in the sensor between electrode pattern 300 and the short dot of electrode pattern 300 that the first probe 120 contacts and can electric signal be detected, and the sensor after being placed in short dot can not detect electric signal.Therefore, the position that the first sensor that can't detect electric signal is placed is detected as short dot.Thus, short dot and open circuit point can be detected fast and exactly.
In order to make the second probe 140 contact electrode pattern on face glass 30 to apply electric signal to electrode pattern 300, the second probe 140 is arranged on movable block 110 place.As the first probe 120, can use and contact to apply electric signal with the electrode pattern 300 on face glass 30 and be used as the second probe 140 to the contact-type probe of electrode pattern 300.Second probe 140 contacts the electrode pattern 300 on face glass 30, to apply electric signal to electrode pattern 300.Preferably, at movable block 110 place, the second probe 140 can be directly installed, make the second probe 140 can combine movement with movable block 110.Alternatively, can install the second probe 140 at testing needle block (not shown) place, this testing needle block is arranged on the side of movable block movably along three direction of principal axis.Such as, by lead connecting method, the second probe 140 can be arranged on testing needle block or movable block 110 place.Further, by multiple fixed component, the second probe 140 can be arranged on testing needle block or movable block 110 place.
Second Sensor section 150 is received with non-contact method and is applied to electrode pattern 300 and the electric signal transmitted by electrode pattern 300 by the second probe 140, and the opens of electrode pattern 300 in fan region 330 or electrical short can be detected.Second Sensor section 150 can be installed to movable block 110 place by mobile member 151, the second Sensor section 150 can be moved along the direction of the direction of scanning perpendicular to the contact-type electrode pattern proving installation according to embodiment.As moving the mobile member 131 of first sensor part 130 along electrode pattern 300, the mobile member 151 that can move the second Sensor section 150 along the direction perpendicular to direction of scanning is conventional components that traditional mechanical type machine adopts.Therefore, any further explanation will conveniently be omitted.Second Sensor section 150 is formed by the sensor array with the multiple sensors arranged along direction of scanning.
Do not illustrate in the drawings: the video camera comprising the side being placed in the first probe 120 and the second probe 140 according to the contact-type electrode pattern proving installation of the present embodiment further, be used for the contacting of confirmation first probe 120 and the second probe 140 and face glass 20.
With reference to Fig. 2 and Fig. 3, will illustrate by using the process and operating effect thereof of testing the opens of electrode pattern and the carrying out of electrical short according to the contact-type electrode pattern proving installation of the first embodiment.
Fig. 3 shows the electrical testing by using contact-type electrode pattern proving installation to perform electrode pattern according to the first embodiment of the present invention.
With reference to Fig. 2 and Fig. 3, in order to come to perform test to the opens of the electrode pattern 300 on face glass 30 and electrical short according to the contact-type electrode pattern proving installation of the first embodiment by using, first movable block 110 is moved, the first probe 120 being arranged on movable block 110 place is made to contact electrode pattern 300 with the second probe 140, to apply electric signal to electrode pattern 300.In this case, first probe 120 applies electric signal to electrode pattern 300, for opens and the electrical short of the electrode pattern 300 in test activity region 320, and the second probe 140 applies electric signal to electrode pattern 300, for testing opens and the electrical short of the electrode pattern 300 in fan region 330.
As mentioned above, the electric signal being applied to electrode pattern 300 by the first probe 120 is received, so that the opens of the electrode pattern 300 in detected activity region 320 and electrical short with non-contact method by first sensor part 130.In this case, first sensor part 130 is formed by the sensor array with the multiple sensors longitudinally arranged along electrode pattern 300, make first sensor part 130 can not only electrode pattern in detected activity region 320 300 be whether opens or electrical short, and can receive by opsition dependent the electric signal transmitted via electrode pattern 300 and come open circuit point in detected activity region 320 and short dot.Therefore, when opens and the electrical short of the electrode pattern 300 detected in zone of action 320, do not need extra test to detect open circuit point and short dot, the test duration of electrode pattern 300 can be reduced.
Meanwhile, the electric signal being applied to electrode pattern 300 by the second probe 140 is received, to detect opens and the electrical short of the electrode pattern 300 in fan region 330 with non-contact method by the second Sensor section 150.
Therefore, according to the contact-type electrode pattern proving installation of the present embodiment when movable block 110 moves along the direction perpendicular to the electrode pattern 300 in fan region 330, can detected activity region 320 and the electrode pattern 300 in fan region 330 be whether opens or electrical short, and when opens and the electrical short of electrode pattern 300 being detected, extra test is not needed to come open circuit point and the short dot of detecting electrode pattern 300, can be reduced, to improve the throughput rate of face glass 30 test duration of electrode pattern 300.
< embodiment 2>
Fig. 4 is the schematic diagram of the non-contact type electrode pattern proving installation shown according to a second embodiment of the present invention.
With reference to Fig. 4, comprise movable block 210, first probe 240, first sensor part 250, second probe 220 and the second Sensor section 230 according to the non-contact type electrode pattern proving installation 200 of the present embodiment of the present invention.
Movable block 210 is installed as and makes movable block 210 be placed in above face glass 40, as shown in Figure 3.Movable block 210 can be arranged on and can move on three axle mobile members of this movable block 210 along three direction of principal axis.The three axle mobile members that can move this movable block 210 along three direction of principal axis used by traditional electrode pattern proving installation.Therefore, conveniently explain, the structure of three axle mobile members will be omitted in the drawings and in the description.
At first sensor part 250 place, the first probe 240 is directly installed, to be applied electric signal by non-contact method to the electrode pattern 400 in fan region 430.First probe 240 applies electric signal to the electrode pattern 400 in fan region 430 with non-contact method.
First sensor part 250 is received with non-contact method and is applied to electrode pattern 400 and the electric signal transmitted by the electrode pattern 400 in fan region 430 by the first probe 240, and the opens of the electrode pattern 400 in fan region 430 or electrical short can be detected.First probe 240 is installed to first sensor part 250 place.First sensor part 250 can be installed to movable block 210 place by mobile member 251, first sensor part 250 can be moved along the direction of the direction of scanning of the non-contact type electrode pattern proving installation perpendicular to the present embodiment.The mobile member 251 that can move first sensor part 250 along the direction perpendicular to direction of scanning is conventional components that traditional mechanical type machine adopts.First sensor part 250 is formed by the sensor array with the multiple sensors longitudinally arranged along electrode pattern 400.Therefore, the electric signal transmitted via electrode pattern 400 is received by opsition dependent, first sensor part 250 can not only detect electrode pattern in fan region 430 400 be whether opens or electrical short, and open circuit point and the short dot of the electrode pattern 400 in fan region 430 can be detected.
Touch the pad portion 410 that formed at electrode pattern 400 place of face glass 40 to make the second probe 220 to apply electric signal to the electrode pattern 400 in zone of action 420, the second probe 220 is arranged on movable block 210 place.Second probe 220 contacts the pad portion 410 formed in the terminal part office of the electrode pattern 400 of face glass 40, to apply electric signal to the electrode pattern 400 in zone of action 420.Preferably, at movable block 210 place, the second probe 220 can be directly installed, make the second probe 220 can combine movement with movable block 210.Alternatively, can install the second probe 220 at testing needle block (not shown) place, this testing needle block is arranged on the side of movable block movably along three direction of principal axis.Such as, by lead connecting method, the second probe 220 can be arranged on testing needle block or movable block 210 place.Further, by multiple fixed component, the second probe 220 can be arranged on testing needle block or movable block 210 place.
Second Sensor section 230 is received with non-contact method and is applied to the electrode pattern 400 in zone of action 420 and the electric signal transmitted by the electrode pattern 400 in zone of action 420 by the second probe 220, and the opens of the electrode pattern 400 in zone of action 420 or electrical short can be detected.Second Sensor section 230 can be installed to movable block 210 place by mobile member 231, the second Sensor section 230 can be moved along electrode pattern 400.As moving the mobile member 251 of first sensor part 250 along electrode pattern 400, the mobile member 231 that can move the second Sensor section 230 along electrode pattern 400 is conventional components that traditional mechanical type machine adopts.Therefore, conveniently, any further explanation will be omitted.Second Sensor section 230 is formed by the sensor array with the multiple sensors longitudinally arranged along electrode pattern 400 (in zone of action 420).Therefore, second Sensor section 230 can not only electrode pattern in detected activity region 420 400 be whether opens or electrical short, and can receive by opsition dependent open circuit point and the short dot that the electric signal transmitted via electrode pattern 400 carry out the electrode pattern 400 in detected activity region 420.
Because the second Sensor section 230 is formed by the sensor array with the multiple sensors longitudinally arranged along the electrode pattern 400 in zone of action 420, therefore sensor can detect the electric signal transmitted via electrode pattern 400 by opsition dependent.Therefore, the non-contact type electrode pattern proving installation of the present embodiment can not only detecting electrode pattern 400 be whether opens or electrical short, and the open circuit point in zone of action 420 and short dot can be detected fast and exactly.Such as, when the electrode pattern 400 in zone of action 420 is electrical short, lights from the short circuit of electrode pattern 400 and do not transmit electric signal by electrode pattern 400.Therefore, be placed in the sensor between electrode pattern 400 and the short dot of electrode pattern 400 that the second probe 220 contacts and can electric signal be detected, and the sensor after being placed in short dot can not detect electric signal.Therefore, the position that the first sensor that can't detect electric signal is placed is detected as short dot.Thus, short dot and open circuit point can be detected fast and exactly.
Do not illustrate in the drawings: the video camera that may further include the side being placed in the second probe 220 according to the electrode pattern proving installation of the present embodiment, be used for the contact of confirmation second probe 220 and the electrode pattern 400 on face glass 20.
With reference to Fig. 4 and Fig. 5, will illustrate by using the process and operating effect thereof of testing the opens of electrode pattern and electrical short according to the non-contact type electrode pattern proving installation of the second embodiment.
Fig. 5 shows the electrical testing by using non-contact type electrode pattern proving installation to perform electrode pattern according to a second embodiment of the present invention.
With reference to Fig. 4 and Fig. 5, in order to come to perform test to the opens of the electrode pattern 400 on face glass 40 and electrical short according to the non-contact type electrode pattern proving installation of the present embodiment by using, first movable block 210 is moved the second probe 220 contact pad part 410 for making to be arranged on movable block 210 place, to apply electric signal to the electrode pattern 400 in zone of action 420, and the first probe 240 applies electric signal to the electrode pattern 400 in fan region 420 with non-contact method.In other words, second probe 220 applies electric signal to the pad portion 410 formed at electrode pattern 400 place with contact method, for opens and the electrical short of the electrode pattern 400 in test activity region 420, and the first probe 240 applies electric signal to the electrode pattern 400 in fan region 430, for testing opens and the electrical short of the electrode pattern 400 in fan region 430.
As mentioned above, the electric signal being applied to electrode pattern 400 by the second probe 220 is received, so that the opens of the electrode pattern 400 in detected activity region 420 and electrical short with non-contact method by the second Sensor section 230.In this case, second Sensor section 220 is formed by the sensor array with the multiple sensors longitudinally arranged along electrode pattern 400, make the second Sensor section 220 by opsition dependent receive the electric signal that transmits via electrode pattern 400 can not only electrode pattern in detected activity region 420 400 be whether opens or electrical short, and open circuit point and the short dot of the electrode pattern 400 in zone of action 420 can be detected.Therefore, when opens and the electrical short of the electrode pattern 400 detected in zone of action 420, do not need extra detection test to detect open circuit point or short dot, the test duration of electrode pattern 400 can be reduced.
Simultaneously, the electric signal being applied to the electrode pattern 400 in fan region 430 by the first probe 240 with non-contact method is received, to detect opens and the electrical short of the electrode pattern 400 in fan region 430 with non-contact method by first sensor part 250.In this case, the same with the second Sensor section 220, first sensor part 250 is also formed by the sensor array longitudinally arranged along electrode pattern 400, each sensor is received by the position of electrode pattern 400 and is applied to electrode pattern 400 and thus the electric signal be passed by the first probe 240.Therefore, can not only detect electrode pattern in fan region 430 400 be whether opens or electrical short, and open circuit point and the short dot of the electrode pattern 400 in fan region 430 can be detected.Therefore, when opens and the electrical short of the electrode pattern 400 detected in fan region 430, do not need extra detection test to come open circuit point or the short dot of detecting electrode pattern 400, the test duration of electrode pattern 400 can be reduced.
As mentioned above, when movable block 210 is along time mobile perpendicular to the direction (i.e. direction of scanning) of the electrode pattern 400 in zone of action 430, the non-contact type electrode pattern device of the present embodiment to the opens of the multiple electrode patterns 400 in zone of action 420 and fan region 430 or electrical short detect.
As mentioned above, the non-contact type electrode pattern device of the present embodiment passes through single pass, not only detect electrode pattern in fan region 430 400 be whether opens or electrical short, and fast and detect open circuit point and the short dot of the electrode pattern 400 in fan region 430 exactly.
In addition, the non-contact type electrode pattern device of the present embodiment passes through single pass, electrode pattern not only in detected activity region 430 400 be whether opens or electrical short, and fast and detect open circuit point and the short dot of the electrode pattern 400 in fan region 430 exactly.
Therefore, according to the non-contact type electrode pattern proving installation of the present embodiment, when opens or the electrical short of electrode pattern 400 being detected, not needing extra detection test to detect open circuit point or short dot, the test duration of electrode pattern 400 can be reduced.
Therefore, the non-contact type electrode pattern proving installation of the present embodiment can reduce the test duration of electrode pattern 400, to improve the throughput rate of face glass 40.
In addition, the non-contact type electrode pattern device of the present embodiment detect electrode pattern in fan region 430 be whether opens or electrical short and the open circuit point of electrode pattern 400 in fan region 430 and short dot, and by the electrode pattern in single pass process simultaneously detected activity region 420 be whether opens or electrical short and the open circuit point of electrode pattern 400 in zone of action 420 and short dot.
Therefore, the non-contact type electrode pattern proving installation of the present embodiment can reduce the test duration of electrode pattern 400 further, to improve the throughput rate of face glass 20.
In the description, the present invention is explained with reference to embodiment.But, it will be apparent to one skilled in the art that and can make various improvement and distortion to the present invention and not depart from the spirit or scope of the present invention described in the following claims.
Claims (10)
1. the electrode pattern on face glass is performed to a contact-type electrode pattern proving installation for electric test, described contact-type electrode pattern proving installation comprises:
First probe, described first probe is configured to contact the electrode pattern on face glass, to apply electric signal to described electrode pattern;
First sensor part, described first sensor part can receive described electric signal with non-contact method, described electric signal is applied to described electrode pattern by described first probe and is passed by described electrode pattern, the described electrode pattern be used in detected activity region be whether opens or electrical short, and be used for the open circuit point of the electrode pattern detected in described zone of action or short dot;
Second probe, described second probe is configured to contact the electrode pattern on described face glass, to apply electric signal to described electrode pattern; And
Second Sensor section, described second Sensor section can receive electric signal with non-contact method, described electric signal is applied to described electrode pattern by described second probe and is transmitted by described electrode pattern, be used for detecting described electrode pattern in fan region be whether opens or electrical short, and be used for detecting the open circuit point in the described electrode pattern in described fan region and short dot.
2. contact-type electrode pattern proving installation according to claim 1, wherein said first sensor part is formed by the sensor array with the multiple sensors longitudinally arranged along described electrode pattern, the each sensor opsition dependent in described sensor is made to receive the electric signal transmitted by described electrode pattern, with detect described electrode pattern in described zone of action whether for electrical short or opens, and detect open circuit point and the short dot of the described electrode pattern in described zone of action.
3. contact-type electrode pattern proving installation according to claim 1, is wherein installed as described first sensor part and described first sensor part can be moved along described electrode pattern.
4. contact-type electrode pattern proving installation according to claim 1, is wherein installed as described second Sensor section and described second Sensor section can be moved along the direction perpendicular to direction of scanning.
5. contact-type electrode pattern proving installation according to claim 1, wherein said second Sensor section is formed by sensor array.
6. the electrode pattern on face glass is performed to a non-contact type electrode pattern proving installation for electric test, described non-contact type electrode pattern proving installation comprises:
First probe, described first probe is configured to apply electric signal to the described electrode pattern in the fan region of described face glass by non-contact method; And
First sensor part, described first sensor part can receive described electric signal with non-contact method, described electric signal is applied to described electrode pattern by described first probe and is transmitted by the described electrode pattern in described fan region, with detect described electrode pattern in described fan region whether for electrical short or opens;
Wherein described first sensor part being installed as makes described first sensor part can move along the direction perpendicular to direction of scanning.
7. non-contact type electrode pattern proving installation according to claim 6, wherein said first sensor part is formed by the sensor array with the multiple sensors longitudinally arranged along described electrode pattern, the each sensor opsition dependent in described sensor is made to receive the electric signal transmitted by electrode pattern, with detect described electrode pattern in described fan region whether for electrical short or opens, and detect open circuit point and the short dot of the described electrode pattern in described fan region.
8. non-contact type electrode pattern proving installation according to claim 6, also comprises:
Second probe, the pad portion that described second probe is configured to be formed with the described electrode pattern place on described face glass contacts, to apply electric signal to the described electrode pattern in zone of action; And
Second Sensor section, described second Sensor section can receive described electric signal with non-contact method, described electric signal is applied to described electrode pattern by described second probe and is transmitted by the described electrode pattern in described zone of action, with detect described electrode pattern in described zone of action whether for electrical short or opens, and detect open circuit point and the short dot of the described electrode pattern in described zone of action.
9. non-contact type electrode pattern proving installation according to claim 8, wherein said second Sensor section is formed by the sensor array with the multiple sensors longitudinally arranged along described electrode pattern, the each sensor opsition dependent in described sensor is made to receive the electric signal transmitted by electrode pattern, with detect described electrode pattern in described zone of action whether for electrical short or opens, and detect open circuit point and the short dot of the described electrode pattern in described zone of action.
10. non-contact type electrode pattern proving installation according to claim 8, is wherein installed as described second Sensor section and described second Sensor section can be moved along described electrode pattern.
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2012-0011917 | 2012-02-06 | ||
| KR1020120011917A KR101223930B1 (en) | 2012-02-06 | 2012-02-06 | Contact type electrode pattern inspection apparatus |
| KR1020120011919A KR101300465B1 (en) | 2012-02-06 | 2012-02-06 | Non-contact type electrode pattern inspection apparatus |
| KR10-2012-0011919 | 2012-02-06 | ||
| PCT/KR2013/000906 WO2013119014A1 (en) | 2012-02-06 | 2013-02-05 | Electrode pattern test apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104105975A CN104105975A (en) | 2014-10-15 |
| CN104105975B true CN104105975B (en) | 2016-03-30 |
Family
ID=48947736
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201380008145.XA Expired - Fee Related CN104105975B (en) | 2012-02-06 | 2013-02-05 | Electrode pattern proving installation |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN104105975B (en) |
| WO (1) | WO2013119014A1 (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103698648B (en) * | 2013-12-23 | 2016-04-06 | 合肥京东方光电科技有限公司 | Line detection apparatus |
| CN104793365A (en) * | 2015-04-23 | 2015-07-22 | 深圳市华星光电技术有限公司 | Display panel circuit detecting device and method |
| KR101823317B1 (en) * | 2016-07-01 | 2018-03-14 | 로체 시스템즈(주) | Appartus and method of inspecting wires of panel |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20050064964A (en) * | 2003-12-24 | 2005-06-29 | 엘지전자 주식회사 | Electrode line inspection device for flat-display panel and method for the same |
| CN101109782A (en) * | 2006-07-20 | 2008-01-23 | 微探测株式会社 | Noncontact type single side probe device and apparatus and method for testing open or short circuits of pattern electrodes using the same |
| KR20100028275A (en) * | 2008-09-04 | 2010-03-12 | 엘지전자 주식회사 | Apparatus and method for inspecting electrode lines of falt panel display |
| WO2011021567A1 (en) * | 2009-08-17 | 2011-02-24 | 株式会社エフカム | Electrical conduction pattern inspection apparatus and inspection method |
-
2013
- 2013-02-05 CN CN201380008145.XA patent/CN104105975B/en not_active Expired - Fee Related
- 2013-02-05 WO PCT/KR2013/000906 patent/WO2013119014A1/en active Application Filing
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20050064964A (en) * | 2003-12-24 | 2005-06-29 | 엘지전자 주식회사 | Electrode line inspection device for flat-display panel and method for the same |
| CN101109782A (en) * | 2006-07-20 | 2008-01-23 | 微探测株式会社 | Noncontact type single side probe device and apparatus and method for testing open or short circuits of pattern electrodes using the same |
| KR20100028275A (en) * | 2008-09-04 | 2010-03-12 | 엘지전자 주식회사 | Apparatus and method for inspecting electrode lines of falt panel display |
| WO2011021567A1 (en) * | 2009-08-17 | 2011-02-24 | 株式会社エフカム | Electrical conduction pattern inspection apparatus and inspection method |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2013119014A1 (en) | 2013-08-15 |
| CN104105975A (en) | 2014-10-15 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN104105975B (en) | Electrode pattern proving installation | |
| US11249610B2 (en) | Position detection device, and position detection method based on electromagnetic inductive coupling and capacitive coupling | |
| JP4921304B2 (en) | Probe card and semiconductor wafer inspection apparatus using the same | |
| CN100405069C (en) | Contactless detection device of display panel | |
| KR20100123627A (en) | Touch panel inspection apparatus | |
| WO2011021567A1 (en) | Electrical conduction pattern inspection apparatus and inspection method | |
| KR20100028275A (en) | Apparatus and method for inspecting electrode lines of falt panel display | |
| KR101810800B1 (en) | Electrical testing device | |
| CN203350556U (en) | Array substrate motherboard and array substrate lead inspection device | |
| KR101259350B1 (en) | Electrode pattern inspection apparatus having t-type sensor | |
| CN202903966U (en) | Automatic breaker test platform | |
| CN110672948B (en) | Touch panel detection equipment and system | |
| TWI510914B (en) | Touch Panel and Testing Device Thereof | |
| CN102788924B (en) | Conductive image checking device | |
| KR101223930B1 (en) | Contact type electrode pattern inspection apparatus | |
| KR101218572B1 (en) | Automatic connecting apparatus for testing plane display device | |
| KR101300465B1 (en) | Non-contact type electrode pattern inspection apparatus | |
| KR101316537B1 (en) | Non-contact array type electrode pattern inspection apparatus | |
| CN203759063U (en) | Probe test fixture | |
| KR101823317B1 (en) | Appartus and method of inspecting wires of panel | |
| CN114137770B (en) | Display panel detection system and detection method thereof | |
| JP6058325B2 (en) | Substrate inspection apparatus and substrate inspection method | |
| JP6046426B2 (en) | Substrate inspection apparatus and substrate inspection method | |
| CN101587086A (en) | Device for detecting disconnection | |
| KR101264764B1 (en) | Conductive pattern inspection device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20160330 Termination date: 20200205 |