CN102981094B - A kind of panel tester - Google Patents
A kind of panel tester Download PDFInfo
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- CN102981094B CN102981094B CN201210483163.0A CN201210483163A CN102981094B CN 102981094 B CN102981094 B CN 102981094B CN 201210483163 A CN201210483163 A CN 201210483163A CN 102981094 B CN102981094 B CN 102981094B
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Abstract
The present invention relates to technical field of flat panel display, particularly relate to a kind of panel tester.This panel tester comprises carrying platform and is arranged at multiple first probes on carrying platform, there is between adjacent first probe one the 3rd spacing, adjacent two first probes have one the 4th spacing on the distribution arrangement of the first probe, and the 3rd spacing is greater than the 4th spacing, panel tester is for testing a panel construction, this panel construction comprises and has a smooth surface and the substrate of smooth first surface, first surface has functional area and neighboring area, neighboring area at least comprises one first periphery subregion, this the first periphery subregion is positioned at the side of functional area, and its side near functional area has one first edge, first edge and the second sides aligned parallel, first probe has the second span on the second edge bearing of trend, 3rd spacing is greater than the 4th spacing and the second span sum.
Description
Technical field
The present invention relates to technical field of flat panel display, particularly relate to a kind of panel tester.
Background technology
Capacitive touch panels is the advantage such as multi-point touch, transmitance are high, long service life owing to having, and day by day replaces traditional resistive touch panel, mobile phone, player, e-book, net book, personal digital assistant, panel computer use.
Existing capacitive touch panels comprises substrate and is arranged at many first induction electrode tandems of substrate surface, many second induction electrode tandems.Described many first induction electrode tandems are parallel to each other and all extend along a first direction such as X-direction, and described many second induction electrode tandems are parallel to each other and extend along a second direction such as Y-direction; Described many first induction electrode tandems are mutually intersected with many second induction electrode tandems and form multiple point of crossing respectively.Described many first induction electrode tandem continuous distribution, and at described point of crossing place, described many second induction electrode tandems are cut off for multiple second induction electrode unit.Described capacitive touch panels also comprises multiple collets and multiple bridge construction.Described multiple collets and described point of crossing one_to_one corresponding, and that part covering that described first induction electrode tandem is positioned at described point of crossing place.Described multiple bridge construction and described multiple collets one_to_one corresponding, and described bridge construction is arranged on described collets, for connecting in same second induction electrode tandem two the second adjacent sensing units.
Described capacitive touch panels also comprise many first of being electrically connected with described many first induction electrode tandems go between, be connected with described many second induction electrode tandems many second go between.One end of described many first lead-in wires is connected respectively at described many first induction electrode tandems, and the other end comes together in the side of described substrate surface, forms one first splicing ear; One end of described many second lead-in wires is connected with described many second induction electrode tandems respectively, and the other end comes together in the opposite side of substrate surface, form one second splicing ear, or its other end comes together in described first splicing ear.Because the quantity of the first induction electrode tandem and the second induction electrode tandem is more, make the quantity of connected first lead-in wire and the second lead-in wire respectively also more, and the size of capacitive touch panels is generally 3,3.5,3.7,4 cun etc., need to arrange the first so many lead-in wire and the second lead-in wire in so limited region, the spacing that the first lead-in wire and second coming together in the first splicing ear (or second splicing ear) is gone between (or second lead-in wire) is quite little, is generally 0.2mm.After capacitive touch panels has made described first induction electrode tandem, the second induction electrode tandem and the first lead-in wire and the second lead-in wire, usual needs are tested this capacitive touch panels, to determine whether this capacitive touch panels exists the defects such as broken string or short circuit.Industry adopts testing apparatus to pass through at present, and probe mode goes between described first, the second lead-in wire is connected with testing apparatus.Because described probe is arranged in a row, each probe all has certain size, and each probe must go between with one first or second go between corresponding, therefore, spacing between adjacent probe is very little, cause tester to be difficult to described probe to go between with first on described first splicing ear or the second splicing ear or second go between and carry out contraposition and contact, namely tester may need the cost plenty of time to go between with first to probe or second go between and carry out contraposition and contact, increase the labour intensity of tester and be unfavorable for too high efficiency, simultaneously also easy because of described probe and first go between or second contraposition that goes between inaccurate, described testing apparatus is made to make false judgment, non-defective unit is judged to be defect ware.
Summary of the invention
In view of this, be necessary to provide a kind of effectively to enhance productivity, reduce labour intensity and contribute to reduce the panel tester judging probability by accident.
A kind of panel tester comprises carrying platform and is arranged at multiple first probes on described carrying platform, there is between adjacent described first probe one the 3rd spacing, adjacent two first probes have one the 4th spacing on the distribution arrangement of described first probe, and described 3rd spacing is greater than described 4th spacing, described panel tester is for testing a panel construction, this panel construction comprises and has a smooth surface and the substrate of smooth first surface, described first surface has functional area and neighboring area, described neighboring area at least comprises one first periphery subregion, this the first periphery subregion is positioned at the side of described functional area, and its side near described functional area has one first edge, described first edge and the second sides aligned parallel, described first probe has the second span on described second edge bearing of trend, described 3rd spacing is greater than described 4th spacing and the second span sum.
In described panel tester provided by the invention, described carrying platform has a second surface, described second surface is smooth and smooth rectangle, described carrying platform is also provided with multiple first receiving space, the plurality of first receiving space is respectively used to collecting and fixing described multiple first probe.
In described panel tester provided by the invention, be arranged at many first functional lines on described substrate and many first lead-in wires, described first functional line is arranged in described functional area, and parallelly between many first functional lines is spacedly distributed; Described first lead-in wire is arranged on described neighboring area, and described neighboring area is around described functional area.
In described panel tester provided by the invention, described first lead-in wire comprises the Part I be connected with described first functional line and the Part II come together on described first periphery subregion, described Part II is spacedly distributed along a first direction is parallel, have the first spacing between adjacent two Part II, described Part II has one first span in a first direction.
In described panel tester provided by the invention, described first surface is relative with described second surface, described panel tester also comprises an adjustment module, described adjustment module is for adjusting described carrying platform, to change the first spacing between described first surface and second surface, described first probe is contacted with the described first Part II gone between.
In described panel tester provided by the invention, described first receiving space is along described second edge bearing of trend distribution, and adjacent two the first receiving spaces are not identical with the spacing at described second edge, two first alternate receiving spaces can be identical with the spacing between described second edge, also can not be identical.
In described panel tester provided by the invention, described first probe entirety is in bar-shaped, and its one end is contained in described first receiving space and is connected with a central processing unit by an outer electrode line, and the other end is the free end towards described first surface.
In described panel tester provided by the invention, have the 5th spacing described in alternate two between the first probe, described 5th spacing is greater than described 4th spacing.
In described panel tester provided by the invention, described first span equals the second span, and the first spacing equals the 4th spacing.
In described panel tester provided by the invention, first probe is contained in described first receiving space by a flexible member, and described first probe is when contacting the Part II of described first lead-in wire of described panel construction, can shrink to described first receiving space direction, and when described first probe terminates to contact with Part II, described first probe is expanded to its free end.
First probe of described panel tester provided by the invention contacts with the first Part II gone between of described panel construction respectively, and described first probe is connected with described central processing unit respectively by an outer electrode line, to apply to described panel construction or to collect the electric signal of described panel construction, and then test described panel construction and whether there is the defect such as short circuit or open circuit.Panel tester provided by the invention is by shifting to install described first probe, and then effectively can increase second span of described first probe on the second edge bearing of trend, the second span is made to be greater than described first span, effectively can overcome the defect that spacing between adjacent two first probes is too small, need long-time contraposition, greatly can improve the accuracy of test and greatly reduce the labour intensity of tester.Meanwhile, because the 3rd spacing N between the first probe described in adjacent two is greater than described 4th spacing d, effectively can reduce the time changing described first probe, enhance productivity.
Accompanying drawing explanation
Below in conjunction with drawings and Examples, the invention will be further described, in accompanying drawing:
Fig. 1 is the schematic diagram of the panel construction that the panel tester test of a better embodiment uses.
Fig. 2 is the elevational schematic view of the panel tester of a better embodiment.
Fig. 3 is the schematic diagram of the panel construction shown in the panel tester test pattern 1 shown in Fig. 2.
Fig. 4 is the elevational schematic view of the panel tester of another better embodiment.
Embodiment
In order to panel tester provided by the invention is described, below in conjunction with Figure of description, the present invention will be described in detail.
Refer to Fig. 1, it is the schematic diagram of the panel construction of the panel tester test of a better embodiment provided by the invention.Described panel tester is for testing a panel construction 200, and this panel construction 200 at least comprises substrate 210, many first functional lines 211 be arranged on substrate 210, many first lead-in wires 212.Described substrate 210 has smooth and smooth first surface 213, and first surface 213 has functional area 213a and neighboring area 213b, described functional area 213a is adjacent with described neighboring area 213b, and described neighboring area 213b is around described functional area 213a.In the present embodiment, described functional area 213a is rectangular, the rectangular ring-type of described neighboring area 213b.Described neighboring area 213b at least comprises one first periphery subregion 213bb, described first periphery subregion 213bb is positioned at the side of this functional area 213a, and it has one first edge 215, this first edge 215 is positioned at the side near described functional area 213a on described first periphery subregion 213bb.Described many first functional lines 211 are arranged on the functional area 213a of described first surface 213, and parallelly between many first functional lines 211 are spacedly distributed.Described many first lead-in wires 212 are arranged on described neighboring area 213b, and described in each, the first lead-in wire 212 comprises the Part I 212a be connected with described first functional line 211, the Part II 212b come together on described first periphery subregion 213bb.The Part II 212b of described many first lead-in wires 212 is spacedly distributed along a first direction is parallel, between adjacent two Part II 212b, there is the first spacing, and in the present embodiment, first spacing is 0.2mm, and described Part II 212b has the first span perpendicular on its bearing of trend, this first span is being 0.2mm.Relatively be preferably: described first edge 215 extends along described first direction, Part II 212b described in each is mutually vertical with described first edge 215.
Refer to Fig. 2, it is the elevational schematic view of the panel tester of a better embodiment provided by the invention.Described panel tester 100 has carrying platform 110, adjustment module (not shown), multiple first probes 120 be arranged on described carrying platform 110.Described carrying platform 110 has second surface 111, described second surface 111 is relative with described first surface 213, in the present embodiment, described second surface 111 is smooth and smooth rectangle, it has second edge 113 corresponding and parallel with described first edge 215, and described second edge 113 extends along the distribution arrangement of described first probe 120.Described adjustment module for regulating described carrying platform, and changes the second spacing between described first surface 213 and described second surface 111.
Described carrying platform 110 is also provided with multiple the first receiving space (not shown) for accommodating and fix described multiple first probe 120.Described first receiving space is along described second edge 113 bearing of trend distribution, and adjacent two first receiving spaces are not identical with the distance at described second edge 113, and two first alternate receiving spaces can be identical with the distance at described second edge, also can not be identical.Described first probe 120 entirety is in bar-shaped, and its one end is contained in described first receiving space and is connected with a central processing unit by an outer electrode line, and the other end is the free end 120a towards described first surface 213.Described first probe 120 has the second span w on the bearing of trend at described second edge 113, and in the present embodiment, the right cylinder of described first probe 120 to be basal diameter be 0.2mm, namely described second span w is 0.2mm.Described first probe 120 is contained in described first receiving space by a flexible member (not shown), and described first probe 120 is when contacting described first lead-in wire 212 of described panel construction 200, can shrink in described first receiving space direction in the past, and described first probe 120 and described first go between 212 terminate to contact time, described first probe 120 is expanded to its free end 120a.
Have the 3rd spacing N between adjacent two first probes 120, adjacent two first probes 120 have the 4th spacing d on described second edge 113 bearing of trend, have the 5th space D between alternate two first probes 120.Described 3rd spacing N is greater than described 4th spacing d, described 3rd spacing N is greater than the first spacing, 5th space D is greater than the 4th spacing d, relatively be preferably, described first spacing equals described 4th spacing d, first span equals the second span, and described 3rd spacing N is greater than described 4th spacing d and the second span sum.
Refer to Fig. 3, it is the schematic diagram of the panel construction 200 shown in panel tester 100 test pattern 1 shown in Fig. 2.First probe 120 of described panel tester 100 go between with first of described panel construction 200 respectively 212 Part II 212b contact, and described first probe 120 is connected with described central processing unit respectively by an outer electrode line, to apply to described panel construction or to collect the electric signal of described panel construction 200, and then test described panel construction 200 and whether there is the defect such as short circuit or open circuit.Panel tester 100 provided by the invention is by shifting to install described first probe 120, and then effectively can increase second span of described first probe 120 on the second edge 113 bearing of trend, the second span is made to be greater than described first span, effectively can overcome the defect that spacing between adjacent two first probes 120 is too small, need long-time contraposition, greatly can improve the accuracy of test and greatly reduce the labour intensity of tester.Meanwhile, because the 3rd spacing N described in adjacent two between first probe 120 is greater than described 4th spacing d, effectively can reduce the time changing described first probe 120, enhance productivity.
As shown in Figure 4, it is the elevational schematic view of the panel tester of another better embodiment provided by the invention.Described panel tester 300 has carrying platform 310, adjustment module (not shown), multiple first probe 320.Described carrying platform 310 has second surface 311, described second surface 311 is relative with described first surface 213, in the present embodiment, described second surface 311 is smooth and smooth rectangle, and it has second edge 313 corresponding and parallel with described first edge 215.Described adjustment module for regulating described carrying platform 310, and changes the second spacing between described first surface 213 and described second surface 311.
Described carrying platform 310 is also provided with multiple the first receiving space (not shown) for accommodating and fix described multiple first probe 320.Described first receiving space is along described second edge 313 bearing of trend distribution, and adjacent two first receiving spaces are not identical with the distance at described second edge 313, and two first alternate receiving spaces can be identical with the distance at described second edge, also can not be identical.Described first probe 320 entirety is in bar-shaped, and its one end is contained in described first receiving space and is connected with a central processing unit by an outer electrode line, and the other end is the free end 320a towards described first surface 213.Described first probe 320 has the second span w on the bearing of trend at described second edge 313, and in the present embodiment, described first probe 320 is bottom surface radiuses is the right cylinder of 0.2mm, and namely described second span w is 0.2mm.Described first probe 320 is contained in described first receiving space by a flexible member (not shown), and described first probe 120 is when contacting described first lead-in wire 212 of described panel construction 200, can shrink in described first receiving space direction in the past, and described first probe 320 and described first go between 212 terminate to contact time, described first probe 320 is expanded to its free end 320a.
Have the 3rd spacing N between adjacent two first probes 320, adjacent two first probes 320 have the 4th spacing d on described second edge 313 bearing of trend, have the 5th space D between alternate two first probes 320.Described 3rd spacing N is greater than described 4th spacing d, described 3rd spacing N is greater than the first spacing, described 5th space D is greater than the 4th spacing d, relatively be preferably, described first spacing equals described 4th spacing d, first span equals the second span, and described 3rd spacing N is greater than described 4th spacing d and the second span sum.
It is more than the better embodiment of panel tester provided by the invention; the restriction to rights protection scope of the present invention can not be interpreted as; those skilled in the art should know; without departing from the inventive concept of the premise; also can do multiple improvement or replacement; these all improvement or replacement all should in the scope of the present invention, and namely the scope of the present invention should be as the criterion with claim.
Claims (10)
1. a panel tester, it comprises carrying platform and is arranged at multiple first probes on described carrying platform, there is between adjacent described first probe one the 3rd spacing, adjacent two first probes have one the 4th spacing on the distribution arrangement of described first probe, and described 3rd spacing is greater than described 4th spacing, described panel tester is for testing a panel construction, this panel construction comprises and has a smooth surface and the substrate of smooth first surface, described first surface has functional area and neighboring area, described neighboring area at least comprises one first periphery subregion, this the first periphery subregion is positioned at the side of described functional area, and its side near described functional area has one first edge, described first edge and the second sides aligned parallel, described first probe has the second span on described second edge bearing of trend, described 3rd spacing is greater than described 4th spacing and the second span sum.
2. panel tester as claimed in claim 1, it is characterized in that: described carrying platform has a second surface, described second surface is smooth and smooth rectangle, described carrying platform is also provided with multiple first receiving space, the plurality of first receiving space is respectively used to collecting and fixing described multiple first probe.
3. panel tester as claimed in claim 2, it is characterized in that: be arranged at many first functional lines on described substrate and many first lead-in wires, described first functional line is arranged in described functional area, and parallelly between many first functional lines is spacedly distributed; Described first lead-in wire is arranged on described neighboring area, and described neighboring area is around described functional area.
4. panel tester as claimed in claim 3, it is characterized in that: described first lead-in wire comprises the Part I be connected with described first functional line and the Part II come together on described first periphery subregion, described Part II is spacedly distributed along a first direction is parallel, have the first spacing between adjacent two Part II, described Part II has one first span in a first direction.
5. panel tester as claimed in claim 4, it is characterized in that: described first surface is relative with described second surface, described panel tester also comprises an adjustment module, described adjustment module is for adjusting described carrying platform, to change the first spacing between described first surface and second surface, described first probe is contacted with the described first Part II gone between.
6. panel tester as claimed in claim 5, it is characterized in that: described first receiving space is along described second edge bearing of trend distribution, and adjacent two the first receiving spaces are not identical with the spacing at described second edge, two first alternate receiving spaces can be identical with the spacing between described second edge, also can not be identical.
7. panel tester as claimed in claim 6, it is characterized in that: described first probe entirety is in bar-shaped, its one end is contained in described first receiving space and is connected with a central processing unit by an outer electrode line, and the other end is the free end towards described first surface.
8. panel tester as claimed in claim 6, it is characterized in that: have the 5th spacing between the first probe described in alternate two, described 5th spacing is greater than described 4th spacing.
9. panel tester as claimed in claim 7, it is characterized in that: described first span equals the second span, the first spacing equals the 4th spacing.
10. panel tester as claimed in claim 7, it is characterized in that: described first probe is contained in described first receiving space by a flexible member, and described first probe is when contacting the Part II of described first lead-in wire of described panel construction, can shrink to described first receiving space direction, and when described first probe terminates to contact with Part II, described first probe is expanded to its free end.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201210483163.0A CN102981094B (en) | 2012-11-23 | 2012-11-23 | A kind of panel tester |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201210483163.0A CN102981094B (en) | 2012-11-23 | 2012-11-23 | A kind of panel tester |
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| CN102981094A CN102981094A (en) | 2013-03-20 |
| CN102981094B true CN102981094B (en) | 2016-04-13 |
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| CN201210483163.0A Active CN102981094B (en) | 2012-11-23 | 2012-11-23 | A kind of panel tester |
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Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101687163B1 (en) * | 2014-10-07 | 2016-12-16 | 동우 화인켐 주식회사 | Apparatus and method for inspection of touch panel |
| CN106910443A (en) * | 2017-02-27 | 2017-06-30 | 上海天马微电子有限公司 | A kind of detection method of display panel and display panel |
| CN107402682B (en) * | 2017-07-31 | 2021-08-10 | 张家港康得新光电材料有限公司 | Touch screen and manufacturing method thereof |
| CN113484718A (en) * | 2021-06-09 | 2021-10-08 | 深圳莱宝高科技股份有限公司 | Detection circuit structure and detection method |
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| JP2005093298A (en) * | 2003-09-18 | 2005-04-07 | Nitto Denko Corp | Anisotropic conductive film for inspecting electronic part and inspection method for electronic part using it |
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| CN201955420U (en) * | 2011-01-21 | 2011-08-31 | 汕头超声显示器（二厂）有限公司 | Short circuit tester for capacitance touch screen |
| CN202956462U (en) * | 2012-11-23 | 2013-05-29 | 深圳莱宝高科技股份有限公司 | Panel testing device |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8400177B2 (en) * | 2008-09-01 | 2013-03-19 | Chimei Innolux Corporation | Device and method for testing display panel |
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2012
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| Publication number | Priority date | Publication date | Assignee | Title |
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| JPH08222299A (en) * | 1995-02-17 | 1996-08-30 | Nhk Spring Co Ltd | Conductive contactor unit |
| JP2005537481A (en) * | 2002-08-29 | 2005-12-08 | スリーエム イノベイティブ プロパティズ カンパニー | High density probe device |
| CN1764868A (en) * | 2003-03-26 | 2006-04-26 | 日本发条株式会社 | Liquid crystal panel testing device |
| JP2005093298A (en) * | 2003-09-18 | 2005-04-07 | Nitto Denko Corp | Anisotropic conductive film for inspecting electronic part and inspection method for electronic part using it |
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| CN102981094A (en) | 2013-03-20 |
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