CN102981094A - Panel testing device - Google Patents
Panel testing device Download PDFInfo
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- CN102981094A CN102981094A CN2012104831630A CN201210483163A CN102981094A CN 102981094 A CN102981094 A CN 102981094A CN 2012104831630 A CN2012104831630 A CN 2012104831630A CN 201210483163 A CN201210483163 A CN 201210483163A CN 102981094 A CN102981094 A CN 102981094A
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Abstract
The invention relates to the technical field of panel display, in particular to a panel testing device. The panel testing device comprises a bearing platform and a plurality of first probes arranged on the bearing platform, wherein a third distance is formed between adjacent first probes; a fourth distance is formed between two adjacent first probes along the distribution direction of the first probes; and the third distance is larger than the fourth distance.
Description
Technical field
The present invention relates to technical field of flat panel display, relate in particular to a kind of panel tester.
Background technology
Capacitive touch panels replaces traditional resistor formula touch panel day by day owing to have the advantages such as multi-point touch, transmitance height, long service life, uses at mobile phone, player, e-book, net book, personal digital assistant, panel computer.
Existing capacitive touch panels comprises substrate and is arranged at many first induction electrode tandems of substrate surface, many second induction electrode tandems.Described many first induction electrode tandems are parallel to each other and all extend along a first direction such as directions X, and described many second induction electrode tandems are parallel to each other and extend along a second direction such as Y-direction; Described many first induction electrode tandems are mutually intersected with many second induction electrode tandems respectively and are formed a plurality of point of crossing.Described many first induction electrode tandem continuous distribution, and will described many second induction electrode tandems at place, described point of crossing to cut off be a plurality of the second induction electrode unit.Described capacitive touch panels also comprises a plurality of collets and a plurality of bridge construction.Described a plurality of collets are corresponding one by one with described point of crossing, and cover that part that described the first induction electrode tandem is positioned at place, described point of crossing.Described a plurality of bridge construction is corresponding one by one with described a plurality of collets, and described bridge construction is arranged on the described collets, is used for connecting on same the second induction electrode tandem two the second adjacent sensing units.
Described capacitive touch panels also comprises many first lead-in wires that are electrically connected with described many first induction electrode tandems, many second lead-in wires that link to each other with described many second induction electrode tandems.One end of described many first lead-in wires links to each other respectively at described many first induction electrode tandems, and the other end comes together in a side of described substrate surface, forms one first splicing ear; One end of described many second lead-in wires links to each other with described many second induction electrode tandems respectively, and the other end comes together in the opposite side of substrate surface, forms one second splicing ear, and perhaps its other end comes together in described the first splicing ear.Because the quantity of the first induction electrode tandem and the second induction electrode tandem is more, so that the quantity of connected the first lead-in wire of difference and the second lead-in wire is also more, and the size of capacitive touch panels is generally 3,3.5,3.7,4 cun etc., in so limited zone, need to arrange the first so many lead-in wire and the second lead-in wire, so that it is quite little to come together in the first lead-in wire and the spacing between the second lead-in wire (or second lead-in wire) of the first splicing ear (or second splicing ear), be generally 0.2mm.After capacitive touch panels has been made described the first induction electrode tandem, the second induction electrode tandem and the first lead-in wire and the second lead-in wire, usually need to test this capacitive touch panels, whether have the defectives such as broken string or short circuit to determine this capacitive touch panels.Industry adopt at present testing apparatus pass through the probe mode with described first the lead-in wire, second the lead-in wire be connected with testing apparatus.Because described probe is arranged in a row, each probe all has certain size, and each probe must be corresponding with one first lead-in wire or the second lead-in wire, therefore, spacing between the adjacent probe is very little, causing the tester to be difficult to that the lead-in wire of first on described probe and described the first splicing ear or the second splicing ear or the second lead-in wire are carried out contraposition contacts, be that the tester may need to spend the plenty of time probe and the first lead-in wire or the second lead-in wire is carried out contraposition and contacts, strengthen tester's labour intensity and be unfavorable for too high efficiency, simultaneously also inaccurate because of the contraposition that goes between of described probe and the first lead-in wire or second easily, make described testing apparatus make false judgment, non-defective unit is judged to be defect ware.
Summary of the invention
In view of this, but be necessary to provide a kind of Effective Raise production efficiency, reduce labour intensity and help to reduce the panel tester of erroneous judgement probability.
A kind of panel tester comprises carrying platform and is arranged at a plurality of the first probes on the described carrying platform, has one the 3rd spacing between adjacent described the first probe, adjacent two first probes have one the 4th spacing at the distribution arrangement of described the first probe, and described the 3rd spacing is greater than described the 4th spacing.
In the described panel tester provided by the invention, described carrying platform has a second surface, described second surface is smooth and smooth rectangle, also be provided with a plurality of the first receiving spaces on the described carrying platform, these a plurality of first receiving spaces are respectively applied to accommodate and fix described a plurality of the first probe.
In the described panel tester provided by the invention, described panel tester is used for test one panel construction, this panel construction comprises substrate with a smooth surface and smooth first surface, is arranged at many first functional lines and many first lead-in wires on the described substrate, described first surface has functional area and neighboring area, described the first functional line is arranged in the described functional area, and parallel being spacedly distributed between many first functional lines; Described the first lead-in wire is arranged on the described neighboring area, and described neighboring area is around described functional area.
In the described panel tester provided by the invention, described neighboring area comprises one first peripheral subregion at least, this the first peripheral subregion is positioned at a side of described functional area, and its side near described functional area has one first edge, described the first lead-in wire comprises the first that is connected with described the first functional line and the second portion that comes together on the described first peripheral subregion, described second portion is spacedly distributed along a first direction is parallel, have the first spacing between adjacent two second portions, described second portion has one first span at first direction.
In the described panel tester provided by the invention, described first surface is relative with described second surface, described the first edge is parallel with the second edge, described panel tester also comprises an adjustment module, described adjustment module is used for adjusting described carrying platform, to change the first spacing between described first surface and the second surface, described the first probe is contacted with the second portion of described the first lead-in wire.
In the described panel tester provided by the invention, described the first receiving space distributes along described the second edge bearing of trend, and adjacently come that first receiving space not identical with the spacing at described the second edge, two first alternate receiving spaces can be identical with spacing between described the second edge, also can be not identical.
In the described panel tester provided by the invention, described the first probe integral body is bar-shaped, and the one end is contained in described the first receiving space and links to each other with a central processing unit by an outer electrode line, and the other end is the free end towards described first surface.
In the described panel tester provided by the invention, described the first probe has the second span at described the second edge bearing of trend, has the 5th spacing between alternate two described the first probes, described the 3rd spacing is greater than described the 4th spacing and the second span sum, and described the 5th spacing is greater than described the 4th spacing.
In the described panel tester provided by the invention, described the first span equals the second span, and the first spacing equals the 4th spacing.
In the described panel tester provided by the invention, the first probe is contained in described the first receiving space by a flexible member, and described the first probe is when the second portion of described first lead-in wire of the described panel construction of contact, can shrink to described the first receiving space direction, and when described the first probe finished to contact with second portion, described the first probe was to its free end expansion.
The first probe of described panel tester provided by the invention contacts with the first second portion that goes between of described panel construction respectively, and described the first probe links to each other with described central processing unit by an outer electrode line respectively, applying or to collect the electric signal of described panel construction to described panel construction, and then test whether described panel construction exists short circuit or the defective such as open circuit.Panel tester provided by the invention is by shifting to install described the first probe, and then can effectively increase second span of described the first probe on the second edge bearing of trend, make the second span greater than described the first span, can effectively overcome the defective that spacing between adjacent two first probes is too small, need long-time contraposition, can greatly improve the accuracy of test and greatly reduce tester's labour intensity.Simultaneously, because the 3rd spacing N between adjacent two described the first probes greater than described the 4th spacing d, can effectively reduce the time of changing described the first probe, enhance productivity.
Description of drawings
The invention will be further described below in conjunction with drawings and Examples, in the accompanying drawing:
Fig. 1 is the synoptic diagram that the panel tester of a preferred embodiments is tested the panel construction that uses.
Fig. 2 is the elevational schematic view of the panel tester of a preferred embodiments.
Fig. 3 is the synoptic diagram that panel tester shown in Figure 2 is tested panel construction shown in Figure 1.
Fig. 4 is the elevational schematic view of the panel tester of another preferred embodiments.
Embodiment
For panel tester provided by the invention is described, the present invention will be described in detail below in conjunction with Figure of description.
See also Fig. 1, it is the synoptic diagram of panel construction of the panel tester test of a preferred embodiments provided by the invention.Described panel tester is used for test one panel construction 200, and this panel construction 200 comprises at least substrate 210, is arranged at many first functional lines 211 on the substrate 210, many first lead-in wires 212.Described substrate 210 has smooth and smooth first surface 213, and first surface 213 has functional area 213a and neighboring area 213b, described functional area 213a is adjacent with described neighboring area 213b, and described neighboring area 213b is around described functional area 213a.In the present embodiment, described functional area 213a is rectangular, the rectangular ring-type of described neighboring area 213b.Described neighboring area 213b comprises one first peripheral subregion 213bb at least, the described first peripheral subregion 213bb is positioned at the side of this functional area 213a, and it has one first edge 215, and this first edge 215 is positioned at the upper side near described functional area 213a of the described first peripheral subregion 213bb.Described many first functional lines 211 are arranged on the functional area 213a of described first surface 213, and parallel being spacedly distributed between many first functional lines 211.Described many first lead-in wires 212 are arranged on the described neighboring area 213b, and each described first lead-in wire 212 comprises the 212a of first that is connected with described the first functional line 211, comes together in the second portion 212b on the described first peripheral subregion 213bb.The second portion 212b of described many first lead-in wires 212 is spacedly distributed along a first direction is parallel, has the first spacing between the adjacent two second portion 212b, and in the present embodiment, the first spacing is 0.2mm, and described second portion 212b has the first span perpendicular to its bearing of trend, and this first span is 0.2mm.Comparative optimization ground is: described the first edge 215 extends along described first direction, and each described second portion 212b is mutually vertical with described the first edge 215.
See also Fig. 2, it is the elevational schematic view of the panel tester of a preferred embodiments provided by the invention.Described panel tester 100 has carrying platform 110, adjustment module (not shown), is arranged at a plurality of the first probes 120 on the described carrying platform 110.Described carrying platform 110 has second surface 111, described second surface 111 is relative with described first surface 213, in the present embodiment, described second surface 111 is smooth and smooth rectangle, it has second edge 113 corresponding and parallel with described the first edge 215, and described the second edge 113 extends along the distribution arrangement of described the first probe 120.Described adjustment module is used for regulating described carrying platform, and changes the second spacing between described first surface 213 and the described second surface 111.
Also be provided with a plurality of the first receiving space (not shown)s be used to accommodating and fix described a plurality of the first probes 120 on the described carrying platform 110.Described the first receiving space distributes along described the second edge 113 bearing of trends, and adjacent two first receiving spaces are not identical with the distance at described the second edge 113, and two first alternate receiving spaces can be identical with the distance at described the second edge, also can be not identical.Described the first probe 120 integral body are bar-shaped, and the one end is contained in described the first receiving space and links to each other with a central processing unit by an outer electrode line, and the other end is the free end 120a towards described first surface 213.The bearing of trend of described the first probe 120 at described the second edge 113 has the second span w, and in the present embodiment, described the first probe 120 is that a bottom surface radius is the right cylinder of 0.2mm, and namely described the second span w is 0.2mm.Described the first probe 120 is contained in described the first receiving space by a flexible member (not shown), and described the first probe 120 went between 212 o'clock at described first of the described panel construction 200 of contact, described the first receiving space direction was shunk in the past, and when described the first probe 120 finished to contact with described the first lead-in wire 212, described the first probe 120 was expanded to its free end 120a.
Have the 3rd spacing N between adjacent two first probes 120, adjacent two first probes 120 have the 4th spacing d at described the second edge 113 bearing of trends, have the 5th space D between alternate two first probes 120.Described the 3rd spacing N is greater than described the 4th spacing d, described the 3rd spacing N is greater than the first spacing, the 5th space D is greater than the 4th spacing d, comparative optimization ground is, described the first spacing equals described the 4th spacing d, the first span equals the second span, and described the 3rd spacing N is greater than described the 4th spacing d and the second span sum.
See also Fig. 3, it is the synoptic diagram that panel tester 100 shown in Figure 2 is tested panel construction 200 shown in Figure 1.The first probe 120 of described panel tester 100 contacts with the first lead-in wire second portion 212b of 212 of described panel construction 200 respectively, and described the first probe 120 links to each other with described central processing unit by an outer electrode line respectively, applying or to collect the electric signal of described panel construction 200 to described panel construction, and then test whether described panel construction 200 exists short circuit or the defective such as open circuit.Panel tester 100 provided by the invention is by shifting to install described the first probe 120, and then can effectively increase second span of described the first probe 120 on the second edge 113 bearing of trends, make the second span greater than described the first span, can effectively overcome the defective that spacing between adjacent two first probes 120 is too small, need long-time contraposition, can greatly improve the accuracy of test and greatly reduce tester's labour intensity.Simultaneously, because the 3rd spacing N between adjacent two described the first probes 120 greater than described the 4th spacing d, can effectively reduce the time of changing described the first probe 120, enhance productivity.
As shown in Figure 4, it is the elevational schematic view of the panel tester of another preferred embodiments provided by the invention.Described panel tester 300 has carrying platform 310, adjustment module (not shown), a plurality of the first probe 320.Described carrying platform 310 has second surface 311, described second surface 311 is relative with described first surface 213, in the present embodiment, described second surface 311 is smooth and smooth rectangle, and it has second edge 313 corresponding and parallel with described the first edge 215.Described adjustment module is used for regulating described carrying platform 310, and changes the second spacing between described first surface 213 and the described second surface 311.
Also be provided with a plurality of the first receiving space (not shown)s be used to accommodating and fix described a plurality of the first probes 320 on the described carrying platform 310.Described the first receiving space distributes along described the second edge 313 bearing of trends, and adjacent two first receiving spaces are not identical with the distance at described the second edge 313, and two first alternate receiving spaces can be identical with the distance at described the second edge, also can be not identical.Described the first probe 320 integral body are bar-shaped, and the one end is contained in described the first receiving space and links to each other with a central processing unit by an outer electrode line, and the other end is the free end 320a towards described first surface 213.The bearing of trend of described the first probe 320 at described the second edge 313 has the second span w, and in the present embodiment, described the first probe 320 is that a bottom surface radius is the right cylinder of 0.2mm, and namely described the second span w is 0.2mm.Described the first probe 320 is contained in described the first receiving space by a flexible member (not shown), and described the first probe 120 went between 212 o'clock at described first of the described panel construction 200 of contact, described the first receiving space direction was shunk in the past, and when described the first probe 320 finished to contact with described the first lead-in wire 212, described the first probe 320 was expanded to its free end 320a.
Have the 3rd spacing N between adjacent two first probes 320, adjacent two first probes 320 have the 4th spacing d at described the second edge 313 bearing of trends, have the 5th space D between alternate two first probes 320.Described the 3rd spacing N is greater than described the 4th spacing d, described the 3rd spacing N is greater than the first spacing, described the 5th space D is greater than the 4th spacing d, comparative optimization ground is, described the first spacing equals described the 4th spacing d, the first span equals the second span, and described the 3rd spacing N is greater than described the 4th spacing d and the second span sum.
It more than is the preferred embodiments of panel tester provided by the invention; can not be interpreted as the restriction to rights protection scope of the present invention; those skilled in the art should know; without departing from the inventive concept of the premise; also can do multiple improvement or replacement; these all improvement or replacement all should be in the scope of the present invention, and namely the scope of the present invention should be as the criterion with claim.
Claims (10)
1. panel tester, it comprises carrying platform and is arranged at a plurality of the first probes on the described carrying platform, has one the 3rd spacing between adjacent described the first probe, adjacent two first probes have one the 4th spacing at the distribution arrangement of described the first probe, and described the 3rd spacing is greater than described the 4th spacing.
2. panel tester as claimed in claim 1, it is characterized in that: described carrying platform has a second surface, described second surface is smooth and smooth rectangle, also be provided with a plurality of the first receiving spaces on the described carrying platform, these a plurality of first receiving spaces are respectively applied to accommodate and fix described a plurality of the first probe.
3. panel tester as claimed in claim 2, it is characterized in that: described panel tester is used for test one panel construction, this panel construction comprises substrate with a smooth surface and smooth first surface, is arranged at many first functional lines and many first lead-in wires on the described substrate, described first surface has functional area and neighboring area, described the first functional line is arranged in the described functional area, and parallel being spacedly distributed between many first functional lines; Described the first lead-in wire is arranged on the described neighboring area, and described neighboring area is around described functional area.
4. panel tester as claimed in claim 3, it is characterized in that: described neighboring area comprises one first peripheral subregion at least, this the first peripheral subregion is positioned at a side of described functional area, and its side near described functional area has one first edge, described the first lead-in wire comprises the first that is connected with described the first functional line and the second portion that comes together on the described first peripheral subregion, described second portion is spacedly distributed along a first direction is parallel, have the first spacing between adjacent two second portions, described second portion has one first span at first direction.
5. panel tester as claimed in claim 4, it is characterized in that: described first surface is relative with described second surface, described the first edge is parallel with the second edge, described panel tester also comprises an adjustment module, described adjustment module is used for adjusting described carrying platform, to change the first spacing between described first surface and the second surface, described the first probe is contacted with the second portion of described the first lead-in wire.
6. panel tester as claimed in claim 5, it is characterized in that: described the first receiving space distributes along described the second edge bearing of trend, and adjacently come that first receiving space not identical with the spacing at described the second edge, two first alternate receiving spaces can be identical with spacing between described the second edge, also can be not identical.
7. panel tester as claimed in claim 6, it is characterized in that: described the first probe integral body is bar-shaped, the one end is contained in described the first receiving space and links to each other with a central processing unit by an outer electrode line, and the other end is the free end towards described first surface.
8. panel tester as claimed in claim 6, it is characterized in that: described the first probe has the second span at described the second edge bearing of trend, has the 5th spacing between alternate two described the first probes, described the 3rd spacing is greater than described the 4th spacing and the second span sum, and described the 5th spacing is greater than described the 4th spacing.
9. panel tester as claimed in claim 7, it is characterized in that: described the first span equals the second span, and the first spacing equals the 4th spacing.
10. panel tester as claimed in claim 7, it is characterized in that: described the first probe is contained in described the first receiving space by a flexible member, and described the first probe is when the second portion of described first lead-in wire of the described panel construction of contact, can shrink to described the first receiving space direction, and when described the first probe finished to contact with second portion, described the first probe was to its free end expansion.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210483163.0A CN102981094B (en) | 2012-11-23 | 2012-11-23 | A kind of panel tester |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210483163.0A CN102981094B (en) | 2012-11-23 | 2012-11-23 | A kind of panel tester |
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| CN102981094A true CN102981094A (en) | 2013-03-20 |
| CN102981094B CN102981094B (en) | 2016-04-13 |
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| CN105486687A (en) * | 2014-10-07 | 2016-04-13 | 东友精细化工有限公司 | Touch panel inspection device and method |
| CN106910443A (en) * | 2017-02-27 | 2017-06-30 | 上海天马微电子有限公司 | Display panel and detection method thereof |
| CN107402682A (en) * | 2017-07-31 | 2017-11-28 | 张家港康得新光电材料有限公司 | A kind of touch-screen and its preparation method |
| CN113484718A (en) * | 2021-06-09 | 2021-10-08 | 深圳莱宝高科技股份有限公司 | Detection circuit structure and detection method |
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| CN102981094B (en) | 2016-04-13 |
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