CN105486687B - Touch panel inspection apparatus and method - Google Patents
Touch panel inspection apparatus and method Download PDFInfo
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- CN105486687B CN105486687B CN201510644460.2A CN201510644460A CN105486687B CN 105486687 B CN105486687 B CN 105486687B CN 201510644460 A CN201510644460 A CN 201510644460A CN 105486687 B CN105486687 B CN 105486687B
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/0006—Industrial image inspection using a design-rule based approach
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- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/10—Segmentation; Edge detection
- G06T7/11—Region-based segmentation
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- G—PHYSICS
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9513—Liquid crystal panels
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30196—Human being; Person
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Abstract
The invention discloses a touch panel inspection apparatus and method. A touch panel inspection apparatus according to an embodiment of the present invention includes: an image obtaining unit that obtains an image obtained by imaging a touch panel glass sheet (glass sheet) including a plurality of cell regions as a whole region or imaging the touch panel glass sheet divided into divided regions; an area setting unit that receives an input of a cell-to-cell (cell-to-cell) comparison area and a cycle comparison area designated for the image; and a defect detection unit that detects a defect on the glass sheet by performing at least one of a 1 st image inspection for comparing pixels in the period comparison area with a predetermined period unit in the image and a 2 nd image inspection for comparing the unit-to-unit comparison area between at least 3 unit areas in the plurality of unit areas in the image.
Description
Technical Field
The present invention relates to an apparatus and method for inspection of a touch panel.
Background
Touch panels (touch panels) are widely used as devices for giving a function capable of communicating with a computer device, such as a mobile phone, a smartphone, a tablet PC, a portable computer, or a desktop computer, to the display device by causing a user of the computer device to perform a gesture for touching the display device.
The touch panel can be manufactured by depositing sensor electrodes patterned in the X-axis direction and the Y-axis direction on a glass sheet (glass sheet). In a conventional large number of touch panel manufacturing methods, a process of cutting a glass sheet in units of cells (cells) having a size suitable for a touch panel laminated on a display panel and then disposing sensor electrodes on the glass of each cell unit is applied, but recently, in order to improve the yield of the above process, a manufacturing method of cutting a glass sheet including a plurality of cell regions into touch panels corresponding to the plurality of cell regions after forming sensor electrodes on the glass sheet has been attempted.
In the actual process of manufacturing a touch panel, foreign substances may adhere to the surface or the inside of the touch panel or cause contamination or damage, thereby causing defects in various forms on the touch panel. As a result, a step of detecting such a defect may follow. As an inspection method for such defect detection, an optical inspection method is generally used in which an image of the appearance of the touch panel is captured by an image pickup apparatus such as a camera and the image is analyzed.
However, a touch panel manufactured through a plurality of steps has various regions such as a region where a regular pattern exists, a region where an irregular pattern exists, a region where inspection for defect detection is necessary, and a region where such inspection can be omitted. The inspection conditions for each region and each pattern are not necessarily the same. Therefore, a new method for detecting defects of different forms generated in various regions with higher efficiency and higher accuracy is required.
Korean laid-open patent publication No. 2011-0020437 discloses a method of comparing the gray levels of a candidate die (die) and an average standard die to determine defects for defect inspection of a wafer, but it still needs to consider the characteristics of each of a plurality of regions on the die.
Documents of the prior art
Patent document
Patent documents: korean laid-open patent publication No. 2011-0020437
Disclosure of Invention
Problems to be solved by the invention
The invention aims to provide a touch panel inspection device which can detect defects on a touch panel more efficiently and more accurately according to the characteristics and inspection conditions of various areas on the touch panel.
The present invention aims to provide such a touch panel inspection method.
Means for solving the problems
1. A touch panel inspection device, comprising:
an image obtaining unit that obtains an image obtained by imaging a touch panel glass sheet (glass sheet) including a plurality of cell regions as a whole region or imaging the touch panel glass sheet divided into divided regions;
an area setting unit that receives an input of a cell-to-cell (cell-to-cell) comparison area and a cycle comparison area designated for the image; and
a defect detecting unit configured to detect a defect on the glass sheet by performing at least one of a 1 st image inspection and a 2 nd image inspection on the image, the 1 st image inspection being configured to compare pixels in the period comparison area with a predetermined period unit, and the 2 nd image inspection being configured to compare the cell-to-cell comparison area between at least 3 cell areas among the plurality of cell areas in the image.
2. The touch panel inspection apparatus of claim 1, wherein the image obtaining unit includes: an input unit for identifying the plurality of cell regions using the arrangement information of the glass sheet; and an image pickup apparatus that picks up images of the plurality of identified unit regions to obtain the image.
3. The touch panel inspection apparatus of claim 1, wherein the input further specifies an inspection area and different inspection conditions for the inspection area within the cell-to-cell comparison area, and the defect detection unit performs the 2 nd image inspection based on the inspection conditions.
4. The touch panel inspection apparatus of claim 1, wherein the input further specifies a non-inspection region for the image, and the defect detection unit further omits image inspection for the non-inspection region.
5. The touch panel inspection apparatus according to claim 1, wherein the input further specifies a plurality of divided lower regions for the image, and the defect detection unit performs the 1 st image inspection and the 2 nd image inspection in the plurality of divided lower regions, respectively.
6. The touch panel inspection apparatus according to claim 5, wherein the unit cell patterns in the plurality of divided lower regions are the same.
7. The touch panel inspection apparatus according to claim 5, wherein the unit cell pattern in each of the plurality of divided lower regions is different from the unit cell pattern in another lower region of the plurality of divided lower regions.
8. The touch panel inspection apparatus of claim 1, wherein the input further specifies a plurality of divided lower regions for the image, the relative positions of the period comparison regions are specified as the same position in at least 2 of the plurality of divided lower regions, and the relative positions of the cell-to-cell comparison regions are specified so as to be different in each of the plurality of divided lower regions.
9. The touch panel inspection apparatus of claim 1, wherein the input further specifies a plurality of divided lower regions for the image, the relative positions of the periodic comparison regions are specified so as to be different in each of the plurality of divided lower regions, and the relative positions of the cell-to-cell comparison regions are specified so as to be the same in at least 2 of the plurality of divided lower regions.
10. The touch panel inspection apparatus of claim 1, wherein the input further specifies a plurality of divided lower regions for the image, and at least 2 lower regions of the plurality of divided lower regions each include a unit cell pattern.
11. The touch panel inspection apparatus of claim 10, wherein the input further specifies a non-inspection region of each of the plurality of divided lower regions, each of the at least 2 divided lower regions includes a unit cell pattern having a same pattern in a region excluding the non-inspection region, and the defect detection unit further omits image inspection with respect to the non-inspection region.
12. The touch panel inspection apparatus of claim 1, wherein the input further specifies a plurality of divided lower regions for the image, specifies a non-inspection region for each of the plurality of divided lower regions, includes unit cell patterns having different patterns in the non-inspection region for each of at least 2 lower regions of the plurality of divided lower regions, and the defect detection unit further omits image inspection for the non-inspection region.
13. The touch panel inspection apparatus of claim 1, wherein the defect detection unit further includes an output unit that displays a position of a defect detected by at least one of the 1 st image inspection and the 2 nd image inspection.
14. The touch panel inspection apparatus of claim 13, wherein the output unit further displays an image indicating the defect in response to selection of the display.
15. A touch panel inspection method, comprising:
a step of obtaining an image obtained by imaging a touch panel glass sheet including a plurality of unit regions as a whole region or imaging the touch panel glass sheet divided into divided regions;
receiving the input of the image appointed period comparison area and the unit-to-unit comparison area; and
and detecting a defect on the glass sheet by performing at least one of a 1 st image inspection and a 2 nd image inspection on the image, wherein the 1 st image inspection is for comparing pixels in the period comparison area in a preset period unit, and the 2 nd image inspection is for comparing the unit-to-unit comparison area between at least 3 unit areas in the plurality of unit areas in the image.
16. The touch panel inspection method of claim 15, wherein the obtaining step includes: a step of identifying the plurality of unit areas by using the arrangement information of the glass sheet; and a step of obtaining the image by imaging the plurality of identified unit regions.
17. The touch panel inspection method of claim 15, wherein the input further specifies an inspection area and different inspection conditions for the inspection area within the cell-to-cell comparison area, and the 2 nd image inspection is performed based on the inspection conditions.
18. The touch panel inspection method of claim 15, wherein the input further specifies a non-inspection region for the image, and the step of detecting omits image inspection for the non-inspection region.
19. The touch panel inspection method of claim 15, wherein the input further specifies a plurality of divided lower regions for the image, and the step of detecting includes performing the 1 st image inspection and the 2 nd image inspection on the plurality of divided lower regions, respectively.
20. The touch panel inspection method of claim 19, wherein the unit cell patterns in the plurality of divided lower regions are the same.
21. The touch panel inspection method of claim 19, wherein the unit cell pattern in each of the plurality of divided lower regions is different from the unit cell pattern in another lower region of the plurality of divided lower regions.
22. The touch panel inspection method of claim 15, wherein the input further specifies a plurality of divided lower regions for the image, the relative positions of the period comparison regions are specified as the same position in at least 2 of the plurality of divided lower regions, and the relative positions of the cell-to-cell comparison regions are specified so as to be different in each of the plurality of divided lower regions.
23. The touch panel inspection method of claim 15, wherein the input further specifies a plurality of divided lower regions for the image, the relative positions of the periodic comparison regions are specified so as to be different in each of the plurality of divided lower regions, and the relative positions of the cell-to-cell comparison regions are specified so as to be the same in at least 2 of the plurality of divided lower regions.
24. The touch panel inspection method of claim 15, wherein the input further specifies a plurality of divided lower regions for the image, and each of at least 2 lower regions of the plurality of divided lower regions includes a unit cell pattern.
25. The touch panel inspection method of claim 24, wherein the input further specifies a non-inspection region of each of the plurality of divided lower regions, unit cell patterns having a same pattern in a region excluding the non-inspection region are included in each of the at least 2 divided lower regions, and the stage of detecting omits image inspection for the non-inspection region.
26. The touch panel inspection method of claim 15, wherein the input further specifies a plurality of divided lower regions for the image, specifies a non-inspection region for each of the plurality of divided lower regions, includes unit cell patterns having different patterns in the non-inspection region for each of at least 2 lower regions of the plurality of divided lower regions, and omits image inspection for the non-inspection region at the stage of the inspection.
27. The touch panel inspection method of claim 15, further comprising a step of displaying a position of the defect detected by at least one of the 1 st image inspection and the 2 nd image inspection.
28. The touch panel inspection method of 27 above, further comprising a step of displaying an image indicating the defect in response to selection of the display.
ADVANTAGEOUS EFFECTS OF INVENTION
The present invention provides a touch panel inspection apparatus and method, which can easily perform an inspection based on image analysis for various regions on a touch panel according to the characteristics of the regions and inspection conditions, and thus can more efficiently and accurately detect defects on the touch panel.
Drawings
Fig. 1 is a diagram showing a touch panel inspection apparatus according to an embodiment of the present invention.
Fig. 2 is a diagram showing the arrangement of a touch panel glass sheet according to an embodiment of the present invention.
Fig. 3 is a block diagram illustrating a configuration of an image obtaining part of fig. 1 according to an embodiment of the present invention.
FIG. 4 is a diagram illustrating a user interface suitable for a user in the designation of a period comparison area and a cell-to-cell comparison area, according to one embodiment of the invention.
Fig. 5 is a diagram for explaining a designated cycle comparison area and a cell-to-cell comparison area according to an embodiment of the present invention.
Fig. 6 is a diagram for explaining an inspection region designated inside a cell-to-cell comparison region and inspection conditions different for the inspection region according to an embodiment of the present invention.
FIG. 7 is a diagram illustrating a user interface representing locations of detected defects, according to an embodiment of the present invention.
FIG. 8 is an illustration of an image representing a defect detected by lateral/longitudinal period comparison in accordance with an embodiment of the present invention.
Fig. 9 is an illustration of an image representing a defect detected by a cell-to-cell comparison method and an image representing a corresponding portion within a compared peripheral cell region, in accordance with an embodiment of the present invention.
Detailed Description
Specific embodiments of the present invention will be described below with reference to the accompanying drawings. However, this is merely an example, and the present invention is not limited thereto.
In the description of the embodiments of the present invention, a detailed description of known techniques related to the present invention will be omitted when it is determined that the gist of the present invention is not unclear. The term to be described later is defined in consideration of the function in the present invention, and may be changed depending on the intention of the user or the operator, the convention, or the like. Therefore, the definition thereof must be based on the entire contents of the present specification.
A touch panel inspection apparatus according to an embodiment of the present invention includes: an image obtaining unit that obtains an image obtained by imaging a touch panel glass sheet (glass sheet) including a plurality of cell regions as a whole region or imaging the touch panel glass sheet divided into divided regions; an area setting unit that receives an input of a cell-to-cell (cell-to-cell) comparison area and a cycle comparison area designated for the image; and a defect detecting unit that detects a defect on the glass sheet by performing at least one of a 1 st image inspection for comparing pixels in the cycle comparison area in a preset cycle unit and a 2 nd image inspection for comparing the cell-to-cell comparison area between at least 3 cell areas in the plurality of cell areas in the image, wherein the inspection based on the image analysis is easily performed by using characteristics of each area on the touch panel and an inspection condition, and therefore the defect on the touch panel can be detected more efficiently and accurately.
Fig. 1 is a diagram illustrating a touch panel inspection apparatus according to an embodiment of the present invention.
As illustrated in fig. 1, the touch panel inspection apparatus (100) includes an image acquisition unit (110), an area setting unit (120), a defect detection unit (130), and an output unit (140). Each component of the touch panel inspection device (100) is embodied by a computer device, and may be embodied by another device operating in conjunction with such a computer device.
The image acquisition unit (110) is configured to acquire an image by imaging a touch panel glass sheet including a cell region. Each cell region may include a unit cell pattern corresponding to the cell region. The unit cell patterns may be the same or different. The glass sheet of the inspection object is not particularly limited in its kind as long as it is a glass sheet for a touch panel that can perform inspection by image analysis using an optical system. For example, the image obtaining unit (110) can obtain an image obtained by imaging the exemplary touch panel glass sheet (200) having the layout (layout) illustrated in fig. 2 as a whole region or by imaging the glass sheet in divided regions. As an example, the image acquisition unit (110) can take images of a plurality of unit areas (210-1 to 210-15) on a glass sheet (200) for a touch panel, and acquire a scanned image including images of the unit areas (210-1 to 210-15).
Therefore, the image obtaining section (110) according to an embodiment of the present invention can include an input section (112), an image pickup apparatus control section (114), an image pickup apparatus (116), and a memory (118) as illustrated in fig. 3.
The input unit (112) can receive (for example, in a file format) arrangement information of the touch panel glass sheet (200). For example, the input unit (112) can recognize the cell regions (210-1 to 201-15) on the touch panel glass sheet (200) using the layout information. Thus, the input unit (112) can acquire the position information of each of the unit areas (210-1 to 210-15) and store the position information in the memory (118).
An imaging device control unit (114) that can move the imaging device (116) so that the imaging device (116) can image the touch panel glass sheet (200) that includes the cell regions (210-1 to 210-15) as a whole region or as divided regions. For example, the image pickup device control unit (114) can determine and read the position information of each of the identified cell areas (210-1 to 210-15) from the memory (118), and move the image pickup device (116) in the X-axis and/or Y-axis direction based on the determined and read position information in such a manner that the image pickup device (116) captures the image of each of the cell areas (210-1 to 210-15). On the other hand, there may be a case where marks (270, 280) such as a reference point (260) for vapor deposition of a sensor electrode and a product number (lot number) assigned to the glass sheet (200) or each cell region are present in the periphery of the cell region on the glass sheet (200) for a touch panel, and the imaging device control unit (114) can control the marks as follows: a scanning image including the images of the cell areas (210-1 to 210-15) is obtained without imaging the mark by an imaging device (116). In this case, an additional mechanism for preventing such a mark from being recognized as a defect on the glass sheet (200) in the image analysis is not required.
The image pickup apparatus (116) is capable of picking up an image of the appearance (e.g., the surface shown in FIG. 2) of the glass sheet (200) for a touch panel under the control of the image pickup apparatus control section (114) to obtain an image representing the cell areas (210-1 to 210-15). Furthermore, the imaging apparatus (116) can save the obtained image in the memory (118). The imaging Device (116) is not particularly limited as long as it can capture an image by receiving light incident from an inspection object such as a glass sheet (200) for a touch panel, and may include a camera (for example, a CCD (Charge-Coupled Device) camera), a photosensor, and the like. Although not shown in fig. 3, a light source for irradiating light to the inspection target body may be arranged around the inspection target body for imaging by the imaging device (116). For example, a halogen Lamp such as an LED Lamp (Light Emitting Diode Lamp) or a Metal Halide Lamp (Metal Halide Lamp), a fluorescent Lamp, an incandescent bulb, or the like can be used as a Light source. Further, the arrangement of the imaging device (116) and the light source, the imaging angle of the imaging device (116), and the light irradiation angle of the light source are not particularly limited as long as appropriate imaging and appropriate light irradiation of the inspection object can be performed.
The remaining components of the touch panel inspection apparatus (100) will be described with reference to fig. 1.
According to an embodiment of the present invention, a user can provide a plurality of types of inputs (for example, an input specifying a period comparison area and a cell-to-cell comparison area for an obtained image) to an area setting section (120) for an image obtained by an image obtaining section (110). Therefore, the user can perform at least one of a plurality of types of actions using an input device (for example, a pointing device such as a mouse, a keyboard, a touch input device, and/or a sound input device) (for example, actions such as click (click), hover (hovering), and drag and drop (drag and drop) using a pointing device such as a mouse, and actions such as pressing one key or a combination of two or more keys for text input using a keyboard).
The area setting unit (120) is configured to receive such an input. Therefore, the area setting unit (120) can provide an appropriate user interface for receiving the input as described above. For example, the region setting unit (120) can receive input specifying a periodic comparison region and a cell-to-cell comparison region for the image obtained by the image obtaining unit (110). Further, the region setting unit (120) can receive an input for specifying a plurality of divided lower regions for the image obtained by the image obtaining unit (110). At this time, the unit cell patterns in the respective divided lower regions may be the same. On the other hand, the unit cell pattern in each of the divided lower regions may be different from the unit cell patterns in the other lower regions.
As an example, as illustrated in FIG. 4, the area setting section (120) can provide a user interface (400) that displays an image (410) representing one of the cell areas (210-1 to 210-15) (e.g., the cell area (210-9) arbitrarily selected by a user or the touch panel inspection apparatus (100)). Thus, the area setting unit (120) can receive an input for specifying the cycle comparison area and the cell-to-cell comparison area so that the relative positions of the cycle comparison areas in the cell areas (210-1 to 210-15) are the same as the relative positions of the cell-to-cell comparison areas.
As another example, the input received by the region setting unit (120) can specify not only a plurality of divided lower regions but also relative positions of the periodic comparison regions in at least 2 lower regions among the divided lower regions, and relative positions of the unit-to-unit comparison regions can be respectively specified so as to be different in the divided lower regions. In contrast, when a plurality of divided lower regions are specified for the obtained image, the input received by the region setting unit (120) can specify the relative positions of the periodic comparison regions so as to be different in the divided lower regions, respectively, and can specify the relative positions of the unit-to-unit comparison regions so as to be the same in at least 2 of the divided lower regions.
Then, the period comparison region and the cell pair comparison region are further specifically considered. As seen from the image 410 of FIG. 4, each of the cell regions 210-1 to 210-15 may be divided into a region 411 including an electrode pattern such as an ITO (Indium tin oxide) pattern, a metal pattern, or the like, and a region 412 not including such an electrode pattern. In addition, two holes (holes) (e.g., a camera hole through which light enters a camera built in an electronic device using the cell region and an IR hole through which infrared rays are emitted from the electronic device) (413, 414), a logo (415), a mark (mark) (416), and/or a specific mark (417) associated with the cell region can exist in the region (412) not including the electrode pattern.
One of the common ways for detecting defects from an image is to examine pixels within a period comparison area in a pixel period unit in a horizontal and/or vertical direction set in advance in an obtained image. For example, in the horizontal/vertical period comparison method, when image portions of a pixels in the X-axis direction and b pixels in the Y-axis direction are compared with image portions of the same size in the periphery and pixels at positions corresponding to each other are different, it is determined that a defect exists. However, it is difficult to uniformly apply the horizontal/vertical period comparison method to the images of the cell regions (210-1 to 210-15) in which the electrode pattern exists, the holes (413, 414), the marks (415), the marks (416), and the marks (417) exist, because if the comparison method is adopted, it is sometimes determined that a defect exists in a normal cell region.
Instead, the area setting unit (120) enables the user to specify the cycle comparison area and the unit-to-unit comparison area on the user interface (400) for the obtained image. For example, as shown in fig. 5, when the user adopts the inspection method for the horizontal/vertical period comparison setting regions (512, 513, 514, 515, 516, 517), the input of the inspection method for the cell-to-cell comparison setting regions (511, 518, 519, 520) can be supplied to the region setting unit (120). For example, the cell-to-cell comparison method can compare cell-to-cell comparison regions between 3 or more cell regions among the cell regions on the touch panel glass sheet (200) in the obtained image. For example, a cell-to-cell comparison method can be employed in which image portions corresponding to the cell region (210-2) and regions (511, 518, 519, 520) in the right and left adjacent cell regions (210-1 and 210-3) are compared in pattern, defects are detected, and the positions of the defects are identified.
Further, the input received by the region setting unit (120) may be an input for designating a non-inspection region for the obtained image. For example, the region setting unit (120) can receive an input designated so as to omit image inspection of the region (521).
Further, when the input received by the region setting unit (120) specifies a plurality of divided lower regions with respect to the obtained image, the input may be an input specifying a non-inspection region for each of the divided lower regions. At this time, among at least 2 lower regions among the divided lower regions, each may contain a unit cell pattern (e.g., a unit cell pattern having a different pattern in a designated non-inspection region and/or a unit cell pattern having the same pattern in a region excluding the designated non-inspection region).
On the other hand, the region setting unit (120) enables a user to specify, on a user interface (400), an inspection region and different inspection conditions for the inspection region, the inspection region being divided into the cell-to-cell comparison region. For example, different kinds of patterns (e.g., an ITO pattern and a metal pattern) in the region (511) may have different inspection conditions, because some kinds of patterns function even if there is a defect, and on the other hand, other kinds of patterns may not. Therefore, as illustrated in fig. 6, the user can provide the region setting unit (120) with an input through the user interface (400) to set the inspection regions (611, 612, 613) in the pattern region and set different inspection conditions for each inspection region.
The defect detection unit (130) is configured as follows: at least one of a 1 st image inspection and a 2 nd image inspection is performed to detect a defect, the 1 st image inspection compares pixels within a period comparison area by a horizontal/vertical period comparison method in an image obtained by an image obtaining section (110), and the 2 nd image inspection compares a cell-to-cell comparison area by a cell-to-cell comparison method in the image. As an example, the defect detecting section (130) can perform at least one of the 1 st image inspection and the 2 nd image inspection on the respective images of the unit areas (210-1 to 210-15) based on the input received by the area setting section (120). The defect detection unit (130) can determine the presence or absence of a defect by using different inspection conditions for each of the inspection regions in the cell-to-cell comparison region. On the other hand, the defect detection unit (130) can omit image inspection (for example, the 1 st image inspection and the 2 nd image inspection) for the non-inspection region. Further, when the region setting unit (120) receives an input specifying a plurality of divided lower regions with respect to the image obtained by the image obtaining unit (110), the defect detecting unit (130) can perform the 1 st image inspection and the 2 nd image inspection on the lower regions, respectively.
When the defect detection unit (130) detects a defect by at least one of the 1 st image inspection and the 2 nd image inspection, the output unit (140) is configured to indicate the position of the detected defect. For example, as illustrated in FIG. 7, the output (140) can provide a user interface (700) that indicates where defects detected for the cell regions (210-1 ~ 210-15) are located.
Further, the output unit (140) can display an image of a defect in response to a user selection of a display indicating a position of the defect. In the case where the image of the cell region where the defect occurs has a considerably large capacity, displaying the image including a part of the defect is less burdensome on the touch panel inspection apparatus (100) than displaying the image.
For example, assume that the graphic display (701) shown in the user interface (700) of fig. 7 represents the position of the 1 st defect detected by the lateral/longitudinal cycle comparison method, and the graphic display (702) represents the position of the 2 nd defect detected by the cell-to-cell cycle comparison method. As can be seen from fig. 7, the 1 st defect and the 2 nd defect occur on the cell region (210-7). If the user selects the graphical display (701) on the user interface (700), the output (140) is able to display an image representing the 1 st defect in response to such user selection. For example, FIG. 8 shows an image (800) representing the 1 st defect and the peripheral portion while the table representing the unit area is being recorded. If the user selects the graphical display (702) on the user interface (700), the output (140) is capable of displaying an image representing the 2 nd defect in response to such user selection. For example, FIG. 9 shows an image (900) showing the 2 nd defect and the peripheral portion of a predetermined size, while showing the table of the unit area. Furthermore, for the convenience of the user, the output unit (140) can display an image representing the corresponding portion within the peripheral cell region compared by the cell-to-cell comparison method. For example, when the cell region (210-7) is compared with the cell regions (210-8, 210-9) by the cell-to-cell comparison method, the output unit (140) can display an image (for example, the image (910) of fig. 9) indicating a part of the cell region (210-8) and an image (for example, the image (920) of fig. 9) indicating a part of the cell region (210-9), the image indicating a part corresponding to the 2 nd defect on the cell region (210-7).
Further, another embodiment of the present invention provides a touch panel inspection method, including: a step of obtaining an image obtained by imaging a touch panel glass sheet including a plurality of unit regions as a whole region or imaging the touch panel glass sheet divided into divided regions; receiving the input of the image appointed period comparison area and the unit-to-unit comparison area; and a step of detecting a defect on the glass sheet by performing at least one of a 1 st image inspection and a 2 nd image inspection on the image, the 1 st image inspection being for comparing pixels within the period comparison area in a predetermined period unit, the 2 nd image inspection being for comparing the cell-to-cell comparison area between at least 3 cell areas among the plurality of cell areas in the image. For example, such a touch panel inspection method may be performed using a touch panel inspection apparatus according to an embodiment of the present invention (e.g., the aforementioned touch panel inspection apparatus (100)).
While representative embodiments of the present invention have been described in detail above, those having ordinary skill in the art to which the present invention pertains will appreciate that: the above-described embodiments can be variously modified without departing from the scope of the present invention. Therefore, the scope of the invention is not limited to the embodiments described above, and is defined not only by the claims to be described below but also by the scope equivalent to the claims.
Description of reference numerals
100: touch panel inspection device
110: image obtaining unit
112: input unit
114: image pickup apparatus control section
116: image pickup apparatus
118: memory device
120: region setting unit
130: defect detecting section
140: output unit
Claims (28)
1. A touch panel inspection device, comprising:
an image obtaining unit that obtains an image obtained by imaging a touch panel glass sheet including a plurality of cell regions as a whole region or imaging the touch panel glass sheet divided into divided regions;
an area setting unit that receives an input of at least one cycle comparison area and at least one unit-to-unit comparison area designated for each of a plurality of unit areas in the image; and
a defect detecting unit that detects a defect on the glass sheet by performing at least one of a 1 st image inspection and a 2 nd image inspection on the image, the 1 st image inspection being for comparing a pixel of a predetermined cycle unit among pixels in the cycle comparison area with pixels of the cycle unit in the periphery thereof, the 2 nd image inspection being for comparing the cell-to-cell comparison area among at least 3 cell areas among the plurality of cell areas in the image.
2. The touch panel inspection apparatus according to claim 1, wherein the image obtaining unit includes: an input unit for identifying the plurality of cell regions using the arrangement information of the glass sheet; and an image pickup apparatus that picks up images of the plurality of identified unit regions to obtain the image.
3. The touch panel inspection apparatus according to claim 1, wherein the input further specifies an inspection area and different inspection conditions for the inspection area within the cell-to-cell comparison area, and the defect detection unit performs the 2 nd image inspection based on the inspection conditions.
4. The touch panel inspection apparatus according to claim 1, wherein the input further specifies a non-inspection region for the image, and the defect detection unit further omits image inspection for the non-inspection region.
5. The touch panel inspection apparatus according to claim 1, wherein the input further specifies a plurality of divided lower regions for the image, and the defect detection unit performs the 1 st image inspection and the 2 nd image inspection in the plurality of divided lower regions, respectively.
6. The touch panel inspection apparatus according to claim 5, wherein the unit cell patterns in each of the plurality of divided lower regions are the same.
7. The touch panel inspection apparatus according to claim 5, wherein the unit cell pattern in each of the plurality of divided lower regions is different from the unit cell pattern in another lower region of the plurality of divided lower regions.
8. The touch panel inspection apparatus according to claim 1, wherein the input further specifies a plurality of divided lower regions for the image, the relative positions of the period comparison regions are specified as the same position in at least 2 of the plurality of divided lower regions, and the relative positions of the cell-to-cell comparison regions are specified so as to be different in each of the plurality of divided lower regions.
9. The touch panel inspection apparatus according to claim 1, wherein the input further specifies a plurality of divided lower regions for the image, the relative positions of the periodic comparison regions are specified so as to be different in each of the plurality of divided lower regions, and the relative positions of the cell-to-cell comparison regions are specified so as to be the same in at least 2 of the plurality of divided lower regions.
10. The touch panel inspection apparatus according to claim 1, wherein the input further specifies a plurality of divided lower regions for the image, at least 2 lower regions of the plurality of divided lower regions each containing a unit cell pattern.
11. The touch panel inspection apparatus according to claim 10, wherein the input further specifies a non-inspection region of each of the plurality of divided lower regions, each of the at least 2 divided lower regions includes a unit cell pattern having a same pattern in a region excluding the non-inspection region, and the defect detection unit further omits image inspection with respect to the non-inspection region.
12. The touch panel inspection apparatus according to claim 1, wherein the input further specifies a plurality of divided lower regions for the image, specifies a non-inspection region for each of the plurality of divided lower regions, includes unit cell patterns having different patterns in the non-inspection region in each of at least 2 of the plurality of divided lower regions, and the defect detection unit further omits image inspection for the non-inspection region.
13. The touch panel inspection apparatus according to claim 1, wherein the defect detection unit further includes an output unit that displays a position of the defect detected by at least one of the 1 st image inspection and the 2 nd image inspection.
14. The touch panel inspection apparatus according to claim 13, wherein the output section further displays an image indicating the defect in response to selection of the display.
15. A touch panel inspection method, comprising:
a step of obtaining an image obtained by imaging a touch panel glass sheet including a plurality of unit regions as a whole region or imaging the touch panel glass sheet divided into divided regions;
receiving at least one period comparison area and at least one unit-to-unit comparison area input appointed for each of a plurality of unit areas in the image; and
and detecting a defect on the glass sheet by performing at least one of a 1 st image inspection and a 2 nd image inspection on the image, wherein the 1 st image inspection is used for comparing pixels of a preset period unit with pixels of the period unit around the preset period unit in pixels in the period comparison area, and the 2 nd image inspection is used for comparing the unit-to-unit comparison area among at least 3 unit areas in the plurality of unit areas in the image.
16. The touch panel inspection method of claim 15, wherein the obtaining stage comprises: a step of identifying the plurality of unit areas by using the arrangement information of the glass sheet; and a step of obtaining the image by imaging the plurality of identified unit regions.
17. The touch panel inspection method according to claim 15, wherein the input further specifies an inspection area and a different inspection condition for the inspection area within the cell-to-cell comparison area, and the 2 nd image inspection is performed based on the inspection condition.
18. The touch panel inspection method of claim 15, wherein the input further specifies a non-inspection region for the image, and the detecting step omits image inspection for the non-inspection region.
19. The touch panel inspection method according to claim 15, wherein the input further specifies a plurality of divided lower regions for the image, and the step of detecting includes performing the 1 st image inspection and the 2 nd image inspection on the plurality of divided lower regions, respectively.
20. The method of inspecting a touch panel according to claim 19, wherein the unit cell patterns in each of the plurality of divided lower regions are the same.
21. The method of inspecting a touch panel according to claim 19, wherein the unit cell pattern in each of the plurality of divided lower regions is different from the unit cell pattern in another lower region of the plurality of divided lower regions.
22. The touch panel inspection method according to claim 15, wherein the input further specifies a plurality of divided lower regions for the image, the relative positions of the period comparison regions are specified as the same position in at least 2 of the plurality of divided lower regions, and the relative positions of the cell-to-cell comparison regions are specified so as to be different in each of the plurality of divided lower regions.
23. The touch panel inspection method according to claim 15, wherein the input further specifies a plurality of divided lower regions for the image, the relative positions of the periodic comparison regions are specified so as to be different in each of the plurality of divided lower regions, and the relative positions of the cell-to-cell comparison regions are specified so as to be the same in at least 2 of the plurality of divided lower regions.
24. The touch panel inspection method according to claim 15, wherein the input further specifies a plurality of divided lower regions for the image, and each of at least 2 lower regions of the plurality of divided lower regions includes a unit cell pattern.
25. The touch panel inspection method according to claim 24, wherein the input further specifies a non-inspection region for each of the plurality of divided lower regions, unit cell patterns having the same pattern in a region excluding the non-inspection region are included in each of the at least 2 divided lower regions, and the stage of detecting omits image inspection for the non-inspection region.
26. The touch panel inspection method according to claim 15, wherein the input further specifies a plurality of divided lower regions for the image, specifies a non-inspection region for each of the plurality of divided lower regions, includes unit cell patterns having different patterns in the non-inspection region in each of at least 2 of the plurality of divided lower regions, and omits image inspection for the non-inspection region at the stage of the detection.
27. The touch panel inspection method according to claim 15, further comprising a step of displaying a position of a defect detected by at least one of the 1 st image inspection and the 2 nd image inspection.
28. The touch panel inspection method of claim 27, further comprising a stage of displaying an image representing the defect in response to selection of the display.
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| KR1020140134956A KR101687163B1 (en) | 2014-10-07 | 2014-10-07 | Apparatus and method for inspection of touch panel |
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| CN105486687A CN105486687A (en) | 2016-04-13 |
| CN105486687B true CN105486687B (en) | 2020-05-15 |
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| KR101687163B1 (en) | 2016-12-16 |
| JP6619194B2 (en) | 2019-12-11 |
| CN105486687A (en) | 2016-04-13 |
| TW201621584A (en) | 2016-06-16 |
| KR20160041313A (en) | 2016-04-18 |
| JP2016076214A (en) | 2016-05-12 |
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