CN115185113B - Display panel testing method and system - Google Patents
Display panel testing method and system Download PDFInfo
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- CN115185113B CN115185113B CN202210710040.XA CN202210710040A CN115185113B CN 115185113 B CN115185113 B CN 115185113B CN 202210710040 A CN202210710040 A CN 202210710040A CN 115185113 B CN115185113 B CN 115185113B
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- 238000012360 testing method Methods 0.000 title claims abstract description 38
- 230000000694 effects Effects 0.000 claims abstract description 57
- 238000010586 diagram Methods 0.000 claims abstract description 20
- 238000000034 method Methods 0.000 claims abstract description 19
- 238000001514 detection method Methods 0.000 claims abstract description 14
- 238000012545 processing Methods 0.000 claims abstract description 7
- 238000013523 data management Methods 0.000 claims description 7
- 230000002950 deficient Effects 0.000 claims description 7
- 238000010998 test method Methods 0.000 claims description 3
- 238000004458 analytical method Methods 0.000 description 6
- 238000007726 management method Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 230000002159 abnormal effect Effects 0.000 description 3
- 230000007547 defect Effects 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 239000003086 colorant Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
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- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Analytical Chemistry (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Controls And Circuits For Display Device (AREA)
Abstract
The application discloses a method and a system for testing a display panel, wherein the method for testing the display panel comprises the steps of lighting a motherboard, wherein the motherboard comprises a plurality of display panels, and the position of each display panel on the motherboard is recorded in the position information of the display panel to acquire the display image of the motherboard; processing the display image of the mother board, and obtaining a display effect diagram of each display panel according to the position information of the display panel; display effect maps and position information of the display panels are stored separately. By the mode, the detection efficiency can be improved, and tracing and searching of bad reasons can be facilitated.
Description
Technical Field
The application relates to the technical field of photoelectric display, in particular to a testing method and system of a display panel.
Background
In the process of manufacturing a display panel, a lighting Test (Cell Test) is generally performed on the display panel (Cell) to detect whether the display panel has abnormal display. In general, in the manufacturing process of a display panel, a whole display panel motherboard is manufactured, and then the display panel motherboard is cut to obtain a plurality of small display panels. After the lighting test is performed on the display panel, the detection result of the display panel is traced back to the corresponding position of the motherboard of the display panel, so that the process analysis is convenient. However, most of the existing statistical management methods of the lighting test result data are completed by manpower, which is not beneficial to tracing statistics.
Disclosure of Invention
The application mainly solves the technical problem of providing a testing method and a testing system for a display panel, which can improve the detection efficiency and facilitate the tracing and searching of bad reasons.
In order to solve the technical problems, the application adopts a technical scheme that: the method for testing the display panel comprises the steps of lighting a mother board, wherein the mother board comprises a plurality of display panels, and the position of each display panel on the mother board is recorded in the position information of the display panel to obtain a display image of the mother board; processing the display image of the mother board, and obtaining a display effect diagram of each display panel according to the position information of the display panel; display effect maps and position information of the display panels are stored separately.
In one embodiment, position information of each display panel on a motherboard is obtained, the position information includes an area identifier and a position identifier, the area identifier is used for identifying a panel area to which the display panel belongs, the motherboard is divided into a plurality of panel areas, and the position identifier is used for identifying position coordinates of the display panel in the panel area to which the display panel belongs.
In one embodiment, a unique identifier of each display panel is obtained, wherein the unique identifier carries the position information of the display panel, the serial number of the motherboard to which the display panel belongs, the product serial number of the motherboard and the test time.
In one embodiment, the display effect map of the display panel is named using the location information and/or unique identifier of the display panel.
In an embodiment, the display effect map of each display panel includes one or more of a red display effect map, a green display effect map, a blue display effect map, a white display effect map, or a black display effect map.
In an embodiment, the method for testing a display panel further includes determining whether a display panel has a poor display; if the display panel is poor, determining a detection area of the display panel on the motherboard by using the position information of the display panel; it is determined whether there is a failure in the motherboard.
In one embodiment, determining whether a failure of the motherboard exists comprises: judging whether the reject ratio of the display panel in the detection area on the motherboard is greater than a threshold value; in response to the defective rate of the display panel being greater than the threshold, it is determined that there is a defect in the detection area of the motherboard.
In one embodiment, illuminating the motherboard, and acquiring the display image of the motherboard includes: acquiring the distance between the camera and the motherboard and/or the shooting angle of the camera relative to the display panel; and focusing the camera based on the distance and/or the shooting angle, and shooting to obtain a display image of the motherboard.
In order to solve the technical problems, the application adopts another technical scheme that: the test system of the display panel comprises a lighting tester, a camera and a data management device, wherein the lighting tester is used for lighting a motherboard, the motherboard comprises a plurality of display panels, and the position of each display panel on the motherboard is recorded in the position information of the display panel; the camera is used for acquiring a display image of the motherboard; the data management device is used for processing the display image of the mother board and obtaining a display effect diagram of each display panel according to the position information of the display panel; display effect maps and position information of the display panels are stored separately.
In an embodiment, the testing system of the display panel further comprises a control device, wherein the control device is used for controlling and adjusting the distance between the camera and the motherboard and/or the shooting angle of the camera relative to the display panel.
The beneficial effects of the application are as follows: in comparison with the prior art, the method and the device have the advantages that after the display image of the display panel motherboard is obtained, the display image is processed, the display effect diagrams of the small display panels are obtained according to the position information of the display panels, and the display effect diagrams of the display panels are stored by taking the small display panels as management units. And when the display effect graphs of the display panels are stored, the storage data carries the position information of the display panels in the mother board. The position information of the display panel can be utilized to quickly trace back which area of the mother board the display panel corresponds to, so that the process analysis of the mother board is convenient. For example, when detecting that the display panel has abnormal display, whether the corresponding area of the motherboard has a problem or not can be traced, and whether the motherboard is defective due to the manufacturing process or not can be traced.
Drawings
FIG. 1 is a schematic diagram of a testing system for a display panel according to an embodiment of the application;
FIG. 2 is a flow chart of an embodiment of a method for testing a display panel according to the present application;
FIG. 3 is a schematic top view of a motherboard of a display panel according to an embodiment of the present application;
FIG. 4 is a schematic view of panel area division of a motherboard in accordance with an embodiment of the present application;
fig. 5 is a diagram showing a positional relationship between a display panel and a motherboard in an embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and effects of the present application clearer and more specific, the present application will be described in further detail below with reference to the accompanying drawings and examples.
Referring to fig. 1 and fig. 2 in combination, fig. 1 is a schematic structural diagram of an embodiment of a testing system for a display panel according to the present application, and fig. 2 is a schematic flow chart of an embodiment of a testing method for a display panel according to the present application. In this embodiment, the display panel test system includes a lighting tester 10, a camera 20, and a data management device 30. The lighting tester 10 is used for applying voltage to a motherboard of a display panel to perform lighting test, the camera 20 is used for shooting the display effect of the motherboard, acquiring the display image of the motherboard, and the data management device 30 is used for processing and storing test result data.
As shown in fig. 2, in this embodiment, the method for testing a display panel includes the following steps:
s110: and (5) lighting the mother board and obtaining a display image of the mother board.
A motherboard is provided, the motherboard including a plurality of display panels and dividing a plurality of panel areas. The test method provided by the application can be used for detecting various display panels, namely, the mother board can be various display panels, such as an organic light-emitting diode (organic light-EmittingDiode, OLED) display panel, a liquid crystal display panel (LiquidCrystalDisplay, LCD), a Micro light-emitting diode (Micro-LED) display panel, a Mini light-emitting diode (Mini LED, mini Light Emitting Diode) display panel and the like, and is not limited herein.
The mother board is lighted, which can be placed on a stand to be detected of the lighting tester 10, and the lighting tester 10 is used for applying a design voltage to the mother board to light the mother board, so as to obtain the display images of all the display panels on the mother board after lighting. The display image of the motherboard is captured by the camera 20. The camera 20 may be a CCD (Charge Coupled Device (charge coupled device)) camera.
S120: and processing the display image of the mother board, and obtaining a display effect diagram of each display panel according to the position information of the display panel.
Wherein, the position of each display panel on the motherboard is recorded in the position information of the display panel.
S130: display effect maps and position information of the display panels are stored separately.
In this embodiment, after the display image of the motherboard is acquired, the display image is processed to obtain the display effect diagrams of the small display panels, and the display effect diagrams of the small display panels are stored in the management units. And when the display effect graphs of the display panels are stored, the storage data carries the position information of the display panels in the mother board. The position information of the display panel can be utilized to quickly trace back which area of the mother board the display panel corresponds to, so that the process analysis of the mother board is convenient. For example, when detecting that the display panel has abnormal display, whether the corresponding area of the motherboard has a problem or not can be traced, and whether the motherboard is defective due to the manufacturing process or not can be traced.
In one embodiment, position information of each display panel on the motherboard is acquired, the position information includes a region identifier for identifying a panel region to which the display panel belongs on the motherboard and a position identifier for identifying position coordinates of the display panel within the panel region to which the display panel belongs.
Referring to fig. 3-5 in combination, fig. 3 is a schematic top view of an embodiment of a motherboard according to the present application, fig. 4 is a schematic panel area division diagram of the motherboard according to an embodiment of the present application, and fig. 5 is a positional relationship diagram of a display panel and the motherboard according to an embodiment of the present application. As shown in fig. 3, the motherboard may include a plurality of panel areas, such as panel area A, B, C, D; each panel area contains a plurality of display panels, for example, the panel area a contains 16 display panels, and each display panel can be respectively numbered according to a certain rule so as to identify the display panel. The display panel selected as in fig. 4 may be identified using the symbol B34, where B is a region identifier for identifying which panel region the display panel belongs to, and 34 is a location identifier for identifying which location of the display panel in the panel region. When the area identifier and the position identifier are known, the corresponding display panel can be clearly checked. Similarly, the corresponding position of the display panel in the motherboard can also be known, as shown in fig. 5. In this way, the position on the motherboard can be traced back from the display panel quickly and accurately.
Further, the display panel can be identified, and a unique identifier is set, wherein the unique identifier carries the position information of the display panel, the serial number of the motherboard to which the display panel belongs, the product serial number of the motherboard and the test time. The ID number (unique identifier) as for display panel B34 may be 1174001001B34, where 1174 is used to identify date 2011, month 07, and 04, 001 is used to identify the product serial number, 0 is used to identify the test condition, 01 is used to identify the serial number of the motherboard, and B34 is used to identify the location of the display panel on the display motherboard. Of course, the present application is not limited to this, and the ID number may be designed as necessary.
In one embodiment, the data management device 30 may automatically correlate the position of the display panel on the motherboard according to the position information of the display panel to store the display effect map. The display effect diagram file is named by using the position information. In this way, when the subsequent document management inquiry is performed, the display effect diagram of the display panel corresponding to the position on the motherboard can be clearly known through the naming of the document. As shown in fig. 5, the document name of the display effect diagram of the display panel B34 may contain the identifier of "B34".
Further, the naming of the display effect map document can also be borrowed from the unique identifier of the display panel, for example, the display effect map document of the display panel B34 can be directly named 1174001001B34.
In an embodiment, for the same display panel, a display effect map with multiple dimensions/angles may be photographed and acquired, for example, display effects with different colors may be photographed respectively, display effects with different angles may be photographed, and so on. Different display effect maps may be separately archived in order to evaluate the display effect of the display panel from different angles. For example, the display effect map of each display panel includes one or more of a red display effect map, a green display effect map, a blue display effect map, a white display effect map, or a black display effect map.
In one embodiment, the display effect diagram of the display panel may be analyzed to determine whether there is a display failure. For example, whether the display panel has a display failure can be analyzed by comparing the display effect diagram of the display panel with a preset picture corresponding to a set voltage.
If the display panel is detected to have the display failure, the detection area of the display panel on the motherboard is determined by using the position information of the display panel, and whether the motherboard has the failure is further confirmed.
When detecting that one display panel has poor display, the display panel can trace back and determine the position of the display panel on the motherboard; and then, a detection area is defined on the motherboard by taking the position as a reference, other display panels in the detection area are detected to determine whether display defects exist, and when the defective rate of the display panels in the detection area is greater than a threshold value, the motherboard is determined to have defects. Whether the process has problems or not can be traced and analyzed, so that more accurate discovery and solving of reasons causing poor display are facilitated.
In one embodiment, the display panel testing system may further include a control device (not shown) for controlling the adjustment camera 20 to perform focusing. Specifically, a distance between the camera 20 and the motherboard and/or a shooting angle of the camera 20 relative to the display panel may be acquired, and the camera 20 is focused based on the distance and/or the shooting angle, so as to shoot and acquire a display image of the motherboard.
The distance between the camera 20 and the motherboard is affected by the focal length of the camera 20, and the camera 20 and the motherboard should acquire images with high definition within a specific distance. When the distance between the two is not within a specific range, the driving camera 20 may be controlled to move to adjust the distance between the two until focusing is achieved. In other embodiments, the adjustment master may also be driven to adjust the distance between the two until focus is achieved. In this way, the distance between the camera 20 and the motherboard can be controlled more precisely, and an image with high definition can be obtained, so that the image has high resolution, and the test result is more accurate.
Further, the shooting angle between the camera 20 and the motherboard can be obtained, so that the angles of the images obtained by each shooting are consistent, and the comparison and evaluation of the display effect are facilitated. Through the mode, standard fixed angle shooting is adopted every time, the position accuracy is high, the problem that the position of the display panel is not corresponding to an image picture can be effectively solved, the working efficiency can be effectively improved, and the result analysis efficiency can be rapidly improved.
In the above embodiment, the scheme provided by the application can systematically manage the test result of the lighting test, so that whether the motherboard is defective or not can be conveniently traced and judged based on the display effect diagram of the display panel. Moreover, the shooting angle and distance of the test image can be accurately controlled, the problem that the display panel corresponds to the display effect image and the analysis is not affected by errors is solved, the problem that the shooting angle and the position deviation greatly affect the analysis is solved, meanwhile, the labor input can be reduced, and the working efficiency is improved.
The foregoing description is only of embodiments of the present application, and is not intended to limit the scope of the application, and all equivalent structures or equivalent processes using the descriptions and the drawings of the present application or directly or indirectly applied to other related technical fields are included in the scope of the present application.
Claims (9)
1. A method for testing a display panel, comprising:
illuminating a motherboard, wherein the motherboard comprises a plurality of display panels, the position of each display panel on the motherboard is recorded in the position information of the display panel, the position information comprises a region identifier and a position identifier, the region identifier is used for identifying a panel region to which the display panel belongs, and the motherboard is divided into a plurality of panel regions; the position identifier is used for identifying the position coordinates of the display panel in the panel area;
acquiring a display image of the motherboard;
processing the display image of the motherboard, and obtaining a display effect diagram of each display panel according to the position information of the display panel;
correspondingly storing the display effect graphs and the position information of each display panel;
determining whether the display panel has poor display;
if the display panel is poor, determining a detection area of the display panel on the motherboard by using the position information of the display panel;
determining whether the motherboard has a display failure.
2. The method for testing a display panel according to claim 1, wherein,
the display panel is provided with a unique identifier, the unique identifier carries the position information of the display panel, the serial number of the motherboard, the product serial number of the motherboard and/or the test time.
3. The method for testing a display panel according to claim 2, wherein the method comprises:
and naming the display effect graph of the display panel by using the position information and/or the unique identifier of the display panel.
4. A method of testing a display panel according to any one of claims 1 to 3, comprising:
and naming the display effect graph of the display panel by using the position information of the display panel.
5. The method for testing a display panel according to claim 1, wherein,
the display effect map of each display panel includes one or more of a red display effect map, a green display effect map, a blue display effect map, a white display effect map, or a black display effect map.
6. The method of testing a display panel according to claim 1, wherein the determining whether the motherboard has a display failure comprises:
judging whether the reject ratio of the display panel in the detection area on the motherboard is greater than a threshold value;
and in response to the defective rate of the display panel being greater than the threshold, determining that the defective detection area of the motherboard exists.
7. The method of claim 1, wherein the illuminating the motherboard to obtain a display image of the motherboard comprises:
acquiring the distance between a camera and the motherboard and/or the shooting angle of the camera relative to the display panel;
and focusing the camera based on the distance and/or the shooting angle, and shooting to obtain the display image of the motherboard.
8. A test system for a display panel is characterized by comprising a lighting tester, a camera and a data management device, wherein,
the lighting tester is used for lighting a motherboard, the motherboard comprises a plurality of display panels, the position of each display panel on the motherboard is recorded in the position information of the display panel, the position information comprises a region identifier and a position identifier, the region identifier is used for identifying a panel region to which the display panel belongs, and the motherboard is divided into a plurality of panel regions; the position identifier is used for identifying the position coordinates of the display panel in the panel area;
the camera is used for acquiring a display image of the motherboard;
the data management device is used for processing the display images of the display panel mother board and obtaining display effect graphs of the display panels according to the position information of the display panels; and respectively storing the display effect graphs and the position information of the display panels; determining whether the display panel has poor display; if the display panel is poor, determining a detection area of the display panel on the motherboard by using the position information of the display panel; determining whether the motherboard has a display failure.
9. The system for testing a display panel according to claim 8, further comprising a control device for controlling and adjusting a distance between the camera and the motherboard of the display panel and/or a photographing angle of the camera with respect to the display panel.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210710040.XA CN115185113B (en) | 2022-06-21 | 2022-06-21 | Display panel testing method and system |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202210710040.XA CN115185113B (en) | 2022-06-21 | 2022-06-21 | Display panel testing method and system |
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| CN115185113B true CN115185113B (en) | 2023-11-24 |
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| Publication number | Publication date |
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| CN115185113A (en) | 2022-10-14 |
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