CN106910443A - Display panel and detection method thereof - Google Patents
Display panel and detection method thereof Download PDFInfo
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- CN106910443A CN106910443A CN201710109212.7A CN201710109212A CN106910443A CN 106910443 A CN106910443 A CN 106910443A CN 201710109212 A CN201710109212 A CN 201710109212A CN 106910443 A CN106910443 A CN 106910443A
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- 238000001514 detection method Methods 0.000 title claims abstract description 81
- 238000012360 testing method Methods 0.000 claims abstract description 196
- 239000000523 sample Substances 0.000 claims abstract description 72
- 238000000034 method Methods 0.000 claims description 46
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical group [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 claims description 18
- 238000010998 test method Methods 0.000 abstract description 11
- 239000000047 product Substances 0.000 description 17
- 238000010586 diagram Methods 0.000 description 13
- 238000013461 design Methods 0.000 description 12
- 239000000463 material Substances 0.000 description 8
- 239000002699 waste material Substances 0.000 description 8
- 230000000694 effects Effects 0.000 description 5
- 239000003990 capacitor Substances 0.000 description 4
- WABPQHHGFIMREM-BKFZFHPZSA-N lead-212 Chemical compound [212Pb] WABPQHHGFIMREM-BKFZFHPZSA-N 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 230000005684 electric field Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000014509 gene expression Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
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- 230000004048 modification Effects 0.000 description 1
- 231100000989 no adverse effect Toxicity 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000011265 semifinished product Substances 0.000 description 1
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
- G09G3/3433—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using light modulating elements actuated by an electric field and being other than liquid crystal devices and electrochromic devices
- G09G3/344—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using light modulating elements actuated by an electric field and being other than liquid crystal devices and electrochromic devices based on particles moving in a fluid or in a gas, e.g. electrophoretic devices
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- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
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- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
The invention provides a display panel and a test method of the display panel, wherein the display panel comprises: a display area and a non-display area; the display area comprises a plurality of lead groupings, each lead grouping comprising at least two leads; the non-display area comprises a first test area and a second test area; the first test area comprises a plurality of signal lines, and each signal line is electrically connected with the first end of one lead; the second test area includes a plurality of probes, each of which is connected to a second end of one of the leads. The invention performs signal detection on the panel display area in a mode of cooperation or independence of the first test area and the second test area, thereby obtaining higher detection precision and reducing the reject ratio of display panel products flowing into the market.
Description
Technical Field
The present invention relates to the field of display panel technologies, and in particular, to a display panel and a method for detecting the display panel.
Background
The display panel is composed of an internal circuit, a shell and a display screen, the circuit is sealed inside the display panel after the display panel is assembled, the effectiveness of the internal circuit of the display panel cannot be obtained from the outside, and if the circuit is short-circuited or open-circuited inside the display panel, the display panel cannot be normally used. If the display panel product with the circuit problem flows into the market, the use experience of a user is seriously influenced, and bad market reaction is caused.
At present, in order to prevent the display panel from being introduced into the market, it is necessary to detect the lines of the display panel before entering the market. The existing display panel line detection is to perform line detection after the line, the shell and the display screen are attached to detect whether the pixel display of the display panel can be normally used, and the detection mode is also called as point screen test. However, in this type of product inspection, the display panel detected to have a wiring problem needs to be removed and recycled. Normally, other parts except the line are directly discarded, thus causing great waste of material resources. In addition, other parts except the lines are easy to damage in the process of splitting the poor display panel, so that the division of responsibility is not facilitated, and the processing flow is increased.
Taking the display panel of the electronic paper display as an example, the electronic paper display panel is generally composed of two flexible substrates, a space between the two flexible substrates is divided into a plurality of cells by partition walls, a display medium is filled in the divided cells, and the display medium is driven by an electric field to display information. Normally, the dot screen test is performed after the electronic paper display panel is assembled. In the dot screen test, the electronic paper display panel with poor display needs to be disassembled and recycled, and the process causes material waste. If an effective detection method exists in the production process, the waste of materials can be reduced, and the product yield is improved.
Therefore, it is an urgent problem to be solved in the art to provide a simple and effective method for detecting a display panel.
Disclosure of Invention
In view of the above, the present invention provides a display panel and a testing method for the display panel, which solve the technical problem in the prior art that the reject ratio of the product is increased due to the circuit inspection after the display panel is manufactured into a finished product.
In order to solve the above technical problem, the present invention provides a display panel, including: a display area and a non-display area;
the display area comprises a plurality of lead groupings, each lead grouping comprising at least two leads;
the non-display area comprises a first test area and a second test area; wherein,
the first test area comprises a plurality of signal lines, and each signal line is electrically connected with the first end of one lead;
the second test area includes a plurality of probes, each of which is connected to a second end of one of the leads.
Optionally, the first test area further includes a plurality of switch units, and the switch units are used for controlling the signal lines and the leads corresponding to the signal lines to be turned on or off.
Optionally, the display panel further includes a cutting line, and the cutting line is used for separating the first test area or the second test area from the display panel along the cutting line after the test is completed.
Optionally, the first test area and the second test area are disposed at two opposite or adjacent ends of the display panel.
Optionally, the probes are arranged in a line or a delta in the second test area.
Optionally, the detection signal input to the display panel by the signal line is a square wave, a sine wave or a triangular wave.
Optionally, the display panel is electronic paper.
In another aspect, the present invention further provides a method for testing a display panel, which is used for testing the display panel, and the method includes:
preparing a display panel, wherein the display panel comprises a display area and a non-display area, the display area comprises a plurality of lead wires, the non-display area comprises a first test area and a second test area, the first test area comprises a plurality of signal wires, and the second test area comprises a plurality of probes;
grouping leads on the display panel such that each of the lead groups includes at least two leads;
adding a detection signal to the display panel from a signal line connected in groups to one of the lead lines:
when at least one signal line in a group different from the signal line is detected to have signal output, determining that a short circuit exists between the lead group corresponding to the signal line and other lead groups;
and when no signal output is detected in other signal wires in a group different from the signal wire, judging that no short circuit exists between the lead wire group corresponding to the signal wire and other lead wire groups.
Optionally, the testing method further includes:
measuring the resistance between any two of the signal lines of two different groups of leads:
when a path is detected between the two signal lines, determining that a short circuit exists between the lead wire groups corresponding to the two signal lines; or,
and when the two signal lines are detected to be open-circuited, judging that no short circuit exists between the lead groups corresponding to the two signal lines.
Optionally, the testing method further includes:
shorting the probes in the same group of leads;
adding a plurality of detection signals from the signal lines to the display panel, each of the signal lines corresponding to one of the detection signals:
when the signal waveform output by the probe is detected to be a superposed signal of all the detection signals, judging that no open circuit exists in the lead group; or,
when the signal waveform output by the probe is detected to be a zero waveform, all the leads in the lead group are judged to be open circuits; or,
and when the signal waveform output by the probe is detected to be one signal or the superposed signal of more than one signal in the detection signals and does not comprise the superposed signal of all the detection signals, judging that the signal line corresponding to the undetected signal is disconnected with the probe.
Optionally, the testing method further includes:
adding a detection signal from a signal line of one of the lead groups to a display panel:
when the probes corresponding to the signal lines are detected to have signal output, judging that no open circuit exists between the signal lines and the corresponding probes; or,
and when no signal output of the probe corresponding to the signal line is detected, judging that the signal line and the corresponding probe are disconnected.
Optionally, the testing method further includes:
measuring the resistance between any two signal lines of the same lead group:
when the two signal lines are detected to be a path, judging that no open circuit exists in the lead wire groups corresponding to the two signal lines; or,
and when the two signal lines are detected to be open circuits, judging that the lead groups corresponding to the two signal lines have open circuits.
Optionally, the testing method further includes:
and after the test is finished, the switch unit of the first test area is disconnected.
Optionally, the testing method further includes:
adding a test signal from one of said probes to the display panel:
when other probes in the same lead group with the probes are detected to have signal output, judging that the short circuit exists in the lead group; or,
and when no signal output is detected by other probes in the same lead group as the probes, judging that no short circuit exists in the lead group.
Optionally, the testing method further includes:
measuring the resistance between any two of the probes within the same lead group:
when a passage is detected between the two probes, the short circuit in the lead group is judged; or,
and when an open circuit is detected between the two probes, judging that no short circuit exists in the lead group.
Compared with the prior art, the display panel and the test method of the display panel have the advantages that:
(1) according to the display panel and the test method of the display panel, the first test area and the second test area are arranged in the non-display area around the display area provided with the lead, the lead is detected before the cover plate is added to the display panel through the first test area and the second test area, the panel display area is subjected to poor detection before the display panel is finished, the reject ratio of display panel products flowing into the market can be reduced, the first test area and the second test area are arranged in the non-display area, the design structure is simple, the use is convenient and fast, and irreparable manpower and material waste caused by detection after the finished products can be avoided.
(2) According to the display panel and the test method of the display panel, the design of the switch unit is introduced into the test area of the display panel, when the test area is not required to provide or receive a detection signal, the corresponding switch unit can be closed, so that the first test area and the second test area can perform signal detection on the display area of the panel in a cooperative or independent mode, and therefore higher detection precision is obtained, and the product yield is improved.
(3) According to the display panel and the test method of the display panel, the design of the cutting line is introduced into the test area of the display panel, and after the detection of the display area of the panel is completed, the test area without the display effect can be cut off along the cutting line by using laser, so that the area of the display panel occupied by the display area is increased, and the attractiveness of the display panel is improved.
(4) The display panel and the test method of the display panel, provided by the invention, have the advantages that the test ends of the test areas are grouped, and the leads of the display panel are tested in a grouping detection mode, so that the excessive number of test points arranged on the display panel is avoided, the complexity of the design of the display panel can be reduced, meanwhile, the reverse detection signals are added into the test areas, the detection results are obtained by analyzing the output signals, and whether the display panel is normal or not can be quickly and accurately detected.
Of course, it is not necessary for any product in which the present invention is practiced to achieve all of the above-described technical effects simultaneously.
Other features of the present invention and advantages thereof will become more apparent from the following detailed description of exemplary embodiments thereof, which proceeds with reference to the accompanying drawings.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate an embodiment of the invention and, together with the description, serve to explain the invention.
FIG. 1 is a schematic diagram of a display panel in the prior art;
fig. 2 is a schematic structural diagram of a display panel according to an embodiment of the present invention;
FIG. 3 is a schematic structural diagram of another display panel provided in the embodiment of the present invention;
FIG. 4 is a schematic structural diagram of a display panel according to another embodiment of the present invention;
FIG. 5 is a schematic structural diagram of another display panel provided in the embodiment of the present invention;
FIG. 6 is a schematic structural diagram of another display panel provided in the embodiment of the present invention;
FIG. 7 is a schematic structural diagram of another display panel provided in the embodiment of the present invention;
FIG. 8 is a flowchart illustrating a method for testing a display panel according to an embodiment of the present invention;
FIG. 9 is a flowchart illustrating a testing method for a display panel according to another embodiment of the present invention;
FIG. 10 is a flowchart illustrating a testing method for a display panel according to another embodiment of the present invention;
FIG. 11 is a flowchart illustrating a testing method for a display panel according to another embodiment of the present invention;
FIG. 12 is a flowchart illustrating a testing method for a display panel according to another embodiment of the present invention;
FIG. 13 is a flowchart illustrating a testing method for a display panel according to another embodiment of the present invention;
FIG. 14 is a flowchart illustrating a testing method for a display panel according to another embodiment of the present invention;
FIG. 15 is a flowchart illustrating a testing method for a display panel according to another embodiment of the present invention;
fig. 16 is a flowchart illustrating a testing method of a display panel according to another embodiment of the present invention.
Detailed Description
Various exemplary embodiments of the present invention will now be described in detail with reference to the accompanying drawings. It should be noted that: the relative arrangement of the components and steps, the numerical expressions and numerical values set forth in these embodiments do not limit the scope of the present invention unless specifically stated otherwise.
The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the invention, its application, or uses.
Techniques, methods, and apparatus known to those of ordinary skill in the relevant art may not be discussed in detail but are intended to be part of the specification where appropriate.
In all examples shown and discussed herein, any particular value should be construed as merely illustrative, and not limiting. Thus, other examples of the exemplary embodiments may have different values.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, further discussion thereof is not required in subsequent figures.
Examples
As shown in fig. 1, which is a schematic structural diagram of a display panel in the prior art, the display panel includes a display area 101 and a non-display area 102, the non-display area 102 includes a test area 103; in the prior art, a finished display panel is inspected, and leads 104 are laid in the display panel, attached to a cover plate of the display panel, and electrically connected to the test area 103. Whether the display of the pixels in the display panel is invalid or not is detected by an optical method by adding a test signal into the test area 103, and whether the circuit in the display panel is normal or not is judged by combining the arrangement mode of the pixels in the display panel. The detection method for the finished products of the display panel cannot search the reason of display failure, once the display failure of the display screen is detected, the whole product can only be scrapped, and if effective semi-finished product detection is not additionally arranged, the high product failure rate is caused, and meanwhile, great material waste is caused. Based on the above technical problem, the present application provides the following solutions.
As shown in fig. 2, which is a schematic structural diagram of the display panel according to this embodiment, the display panel includes: a display area 201 and a non-display area 202; the non-display area 202 is disposed around the display area 201. The display area 201 includes a plurality of lead line groupings 211, each lead line grouping 211 including at least two lead lines 212; as shown by the two lead lines included in the circle 211 in fig. 2, fig. 2 illustrates that each lead line group includes only two lead lines, but the number of lead lines included in the lead line group of the present embodiment is not limited to two, and may be three or even more.
The non-display area 202 includes a first test area 221 and a second test area 222; wherein, the first test region 221 includes a plurality of signal lines 223, each signal line 223 is electrically connected to a first end of one lead 212; the signal line 223 is used to input a detection signal into the display panel. Second test area 222 includes a plurality of probes 224, each probe 224 being connected to a corresponding second end of one of leads 212. By detecting the output signal of the probe 224 or the signal line 223, open and short circuit conditions of the detection circuit can be determined.
The leads 212 arranged in the display area of the display panel are used for providing line support for pixels and the like in the display panel, and signals are transmitted to the display panel through the leads, so that each pixel in the display panel can be accurately displayed, and finally, the purpose of displaying corresponding images according to input signals is achieved. Therefore, the leads keep good conductivity, and the condition that short circuit does not occur between the leads is the key point for ensuring normal display of the display panel.
In the present embodiment, the display panel is provided with a first test area 221 and a second test area 222 in a non-display area around the display area, and one end of the lead 212 is connected to the first test area 221 and the other end of the lead 212 is connected to the second test area 222. By inputting the detection signal into the first test area 221 or the second test area 222, the output result is analyzed to obtain the detection result of whether the leads 212 are open or not and whether short circuits occur between different leads 212 or not.
In this embodiment, the leads 212 in the display area are divided into different lead groups, and the detection signals are input to the lead groups, or the resistances between the lead groups and in the lead groups are detected, and the detection results are analyzed to determine whether there is a short circuit or an open circuit between the lead groups and in the lead groups. Compared with the prior art that open circuit detection is carried out on each lead wire, and whether short circuit exists between the lead wire and other lead wires is detected by combining the circuit design condition of the display panel, the complexity of the design of the detection area on the panel is greatly reduced. Meanwhile, by the lead grouping detection mode of the embodiment, the short circuit condition between each lead in the lead grouping and the leads in other groups can be reflected by whether the short circuit condition exists between the lead groupings, instead of judging the line condition through the optical display effect of the panel in the prior art, the efficiency of line detection of the display panel can be improved.
In some alternative embodiments, the first test area 221 and the second test area 222 are disposed at opposite or adjacent ends of the display panel. In this embodiment, the relative position relationship between the first test area 221 and the second test area 222 on the display panel is not limited. However, the opposite or adjacent two end positions of the first test area 221 and the second test area 222 on the display panel are beneficial to the arrangement of the detection circuit in the display panel, and the complexity of the detection circuit is reduced. Particularly, when the first test area 221 and the second test area 222 are at two opposite ends of the display panel, the leads of the display area can be straightly connected to the first test area 221 or the second test area 222, and a bent line structure is not required, thereby greatly reducing the complexity of the detection line.
As shown in fig. 3, a schematic structural diagram of another display panel provided in this embodiment is different from the display panel provided in fig. 2 in that a plurality of switch units 225 are further included in the first test area 221. The switching unit 225 is used to control the signal line 223 and the lead corresponding to the signal line 223 to be turned on or off. In fig. 3, the first test area 221 includes two signal lines 223 for illustration, but the number of the signal lines 223 in the first test area 221 is not limited in this embodiment. Of the two signals, test signals D1 and D2 may be input, respectively, and alternatively, the test signals D1 and D2 may be inverted detection signals, such as: square, sine or triangle waves, etc. After the probes in the lead grouping are short-circuited, whether the leads are open or not or the condition that one or more of the leads are open can be quickly analyzed through the output result of the reverse detection signals after the leads are superposed, and the detection result of the display panel can be conveniently and quickly obtained.
Alternatively, the switching unit 225 may include a plurality of switching tubes. The gates of the switch units 225 are connected to the switch control signal line 226, one end of each switch tube is connected to a corresponding one of the signal lines 223, and the other end is connected to a corresponding one of the leads 212. The on and off of each switching unit 225 can be controlled by inputting a control signal SW to the switching unit 225 in the switching control signal line 226.
The design of the switch unit is introduced into the first test area of the display panel, and when the test area is not needed to provide or receive a detection signal, the corresponding switch unit can be closed, so that the first test area and the second test area can perform signal detection on the display area of the panel in a cooperative or independent mode, thereby obtaining higher detection precision and improving the product yield.
As shown in fig. 4, a schematic structural diagram of another display panel provided in this embodiment is different from the display panel provided in fig. 2 in that the first test area 221 further includes a cutting line 227, and the cutting line 227 is used for separating the first test area 221 from the display panel after the test is completed. The cutting line 227 is located at a position close to the display region 201, specifically, at a position between the signal line 223 and the display region 201 in the first test region 221. The first test region 221 (including the signal line 223) can be cut out of the display panel by cutting the cutting line 227. Alternatively, the cutting line 227 may be one cutting line.
By setting the cutting line 227, the first test area 221 can be conveniently and quickly removed after the circuit of the display panel is detected to be normal. If the first test area 221 is kept after the line detection of the display panel is completed, the display effect in the display area is affected by the presence of the signal line in the first test area 221, and the display pixels are not arranged in the first test area 221, which does not have the display function. And the first test area 221 only plays a role of detecting whether the lines of the display panel are normal, and there is no adverse effect on the display function of the display area after the first test area 221 is cut.
In some alternative embodiments, the second test region 222 may also include a cutting line for separating the second test region 222 from the display panel along the cutting line after the test is completed. After the circuit of the display panel is detected, the second test area 222 is removed by the cutting line, so that the phenomenon of black edge at the edge of the display panel screen caused by the existence of the second test area can be avoided.
In some alternative embodiments, as shown in fig. 5, each lead 312 of the display area 201 includes at least one circuit structure formed by a resistor 501 and a capacitor 502, wherein the resistor 501 is disposed on the lead and between the first test area 221 and the second test area 222; the capacitor 502 is disposed on a branch line between the non-first test area 221 and the second test area 222, one end of the capacitor 502 is electrically connected to the lead 312, and the other end of the capacitor 502 is electrically connected to the ground 503. Because the lead 312 is provided with the circuit structure, the resistance value on the lead 312 can be detected to analyze and judge whether the lead is broken or not when the lead is detected, and the detection result can be further accurately judged by combining the detection lead for inputting the detection signal on the signal wire, so that the detection accuracy is improved.
As shown in fig. 6 and 7, fig. 6 is a schematic structural diagram of another display panel provided in the present embodiment, and fig. 7 is a schematic structural diagram of another display panel provided in the present embodiment; unlike the display panel provided in fig. 2, the probes 224 in the second test area 222 are arranged in a straight line or a delta.
Alternatively, the plurality of probes 224 included in the second test area 222 may be a block structure (e.g., a square, a circle, a triangle, etc.), or may be other structures, and the shape and structure of the probes 224 are not limited in this embodiment. The probes 224 are arranged in a straight line shape (as shown in fig. 6) or a delta shape (as shown in fig. 7), so that the overlapping or crossing of the leads is avoided, the influence of the crossing detection accuracy of the leads is avoided, and the detection accuracy of the display panel is improved.
In some alternative embodiments, the display panel is electronic paper, and usually, the dot screen test is performed after the electronic paper display panel is assembled. The electronic paper display panel which is displayed to be poor in the dot screen test needs to be disassembled and recycled, and the process can cause waste of materials. If an effective detection method exists in the production process, the waste of materials can be reduced, and the product yield is improved.
The present embodiment provides a method for testing any one of the above display panels, as shown in fig. 8, which is a schematic flow chart of the method for testing the display panel, and the method includes the following steps:
step 801, preparing a display panel, where the display panel includes a display area and a non-display area, the display area includes a plurality of leads, the non-display area includes a first test area and a second test area, the first test area includes a plurality of signal lines, and the second test area includes a plurality of probes.
Step 802, grouping leads on a display panel such that each lead group includes at least two leads. The number of leads in each lead group is not limited in this embodiment, and in some alternative embodiments, it is within the scope of this embodiment that each lead group includes three leads or even more leads than three leads. The lead of the display panel is tested by using a grouping detection mode, so that the situation that an excessive number of test points are arranged on the display panel is avoided, and the complexity of the design of the display panel can be reduced.
Step 803, add the detection signal to the display panel from the signal line connected to one lead wire group.
Step 804, judging whether other signal wires in different groups with the signal wire have no signal output, and judging whether short circuit exists between the lead wire group corresponding to the signal wire and other lead wire groups:
step 805, when detecting that at least one signal line in a different group from the signal lines has a signal output, determining that a short circuit exists between the lead group corresponding to the signal line and other lead groups;
and 806, judging that no short circuit exists between the lead group corresponding to the signal wire and other lead groups when detecting that no signal is output from other signal wires in different groups.
If short circuit occurs between the leads of different groups, a path is formed between the leads of different groups, a test signal is input into the signal line on one side, and the signal can reach another signal line on the other side through the path, so that whether short circuit occurs between the leads of different groups can be judged by detecting output signals through the grouping ends of the leads which are not added with the test signal.
Optionally, this embodiment further includes: and after the test is finished, separating the first test area from the display panel along the cutting line.
As shown in fig. 9, a method for testing a display panel is provided for this embodiment, which is different from the method for testing a display panel provided in fig. 8, and the method further includes:
step 901, measuring the resistance between any two signal lines in two different lead wire groups, and determining whether there is a short circuit between the lead wire groups corresponding to the two signal lines:
step 902, when a channel is detected between two signal lines, determining that a short circuit exists between lead groups corresponding to the two signal lines;
and step 903, when the two signal lines are detected to be open-circuit, judging that no short circuit exists between the lead wire groups corresponding to the two signal lines.
Generally, a resistor is disposed on a lead of a display panel, if a short circuit occurs between different lead groups, a path is formed between the different lead groups, and a certain resistance value exists between the different lead groups, so that whether a short circuit occurs between the lead groups corresponding to two signal lines can be determined by detecting the resistance between the two signal lines based on the principle of a path or an open circuit.
In this embodiment, the sequence of the content in step 901 and the content in step 803 and step 804 in fig. 8 is not limited, in some embodiments, the content in step 901 is after the content in step 803 and step 804, and in other optional embodiments, the content in step 901 may also be before the content in step 803.
In some alternative embodiments, the resistance measurement may be performed by a resistance measuring instrument, such as a multimeter, which measures the resistance primarily according to closed-circuit ohm's law, and only detects the resistance when a closed loop is formed with the circuit under test. When the lead wire groups are connected in a short circuit mode, the two lead wires forming the short circuit are in a conducting state, and when the resistance measuring instrument is connected with the signal wires corresponding to the short circuit lead wires respectively, a closed loop is formed; conversely, if there is no short circuit between the lead segments, then only an open circuit condition exists.
As shown in fig. 10, a method for testing a display panel is provided for this embodiment, which is different from the method for testing a display panel provided in fig. 8, and the method further includes:
and 1001, short-circuiting the probes in the same lead group.
Step 1002, adding a plurality of detection signals into the display panel from the signal lines, wherein each signal line corresponds to one detection signal, and judging the open circuit condition in the lead wire grouping:
step 1003, judging whether the lead group is disconnected or not when detecting that the signal waveform output by the probe is a superposed signal of all detection signals;
step 1004, when detecting that the waveform of the signal output by the probe is zero, judging that all leads in the lead group are open circuits;
in step 1005, when the waveform of the signal output by the probe is detected to be one of the detection signals or a superimposed signal of more than one signal (excluding the superimposed signal of all the detection signals), it is determined that there is a disconnection between the signal line corresponding to the undetected signal and the probe.
In some alternative embodiments, the plurality of detection signals may be inverted signals, such as: inverted square, sine or triangle waves, etc.
If the lead has an open circuit, the inverted signal input from the signal wire can not be transmitted to the other end of the lead, namely one end of the probe; if the lead has no open circuit, the signal inputted from the signal line can be transmitted to the other end of the lead, and a superimposed signal is formed, so that the open circuit condition in the lead group can be detected by using the signal, and furthermore, the open circuit of the lead can be judged.
In this embodiment, the sequence of the content of step 1001-.
As shown in fig. 11, a method for testing a display panel is provided for this embodiment, which is different from the method for testing a display panel provided in fig. 8, and the method further includes:
step 1101, adding a detection signal to the display panel from a signal line grouped by leads, and judging whether there is a break between the probes:
step 1102, when the probes corresponding to the signal lines are detected to have signal output, judging that no open circuit exists between the signal lines and the corresponding probes;
step 1103, when detecting that the probe corresponding to the signal line has no signal output, determining that there is an open circuit between the signal line and the corresponding probe.
In this embodiment, the sequence of the content of steps 1101-1103 and the content of steps 803 and 804 in fig. 8 is not limited, in some optional embodiments, the content of steps 1101-1103 is after the content of steps 803 and 804, and in other optional embodiments, the content of steps 1101-1103 may also be before the content of steps 803.
As shown in fig. 12, a method for testing a display panel is provided for this embodiment, which is different from the method for testing a display panel provided in fig. 8, and the method further includes:
step 1201, measuring the resistance between any two signal lines of the same lead group, and judging whether the lead group corresponding to the two signal lines has an open circuit:
step 1202, when a path is detected between two signal lines, determining that no open circuit exists in a lead group corresponding to the two signal lines;
step 1203, when it is detected that the two signal lines are open-circuited, it is determined that there is an open circuit in the lead group corresponding to the two signal lines.
In this embodiment, the sequence of the content of steps 1201-1203 and the content of steps 803 and 804 in fig. 8 is not limited, in some optional embodiments, the content of steps 1201-1203 is after the content of steps 803 and 804, and in other optional embodiments, the content of steps 1201-1203 may also be before the content of step 803.
As shown in fig. 13, a method for testing a display panel is provided for this embodiment, which is different from the method for testing a display panel provided in fig. 8, and the method further includes:
step 1301, completing testing of the display panel;
step 1302, the switch unit of the first test zone is turned off.
In this embodiment, the sequence of the content of step 1301 and the content of step 803 and step 804 in fig. 8 is not limited, in some optional embodiments, the content of step 1301 is after the content of step 803 and step 804, and in other optional embodiments, the content of step 1301 may also be before the content of step 803.
As shown in fig. 14, a method for testing a display panel is provided for this embodiment, which is different from the method for testing a display panel provided in fig. 13, and the method further includes:
step 1401, add the test signal from a probe to the display panel, and determine whether there is a short circuit in the lead group:
step 1402, when detecting that other probes grouped with the same lead of the probe have signal output, judging that the lead group has a short circuit;
and step 1403, when no signal output is detected from other probes in the same lead group as the probes, judging that no short circuit exists in the lead group.
In this embodiment, the sequence of the content in steps 1401, 1403, 1301 and the content in steps 803 and 804 in fig. 13 is not limited, in some optional embodiments, the content in steps 1401, 1403 is after the content in steps 803 and 804, and in other optional embodiments, the content in steps 1401, 1403 and 806 may also be before the content in step 803.
As shown in fig. 15, a method for testing a display panel is provided for this embodiment, which is different from the method for testing a display panel provided in fig. 13, and the method further includes:
step 1501, measuring the resistance between any two probes in the same lead group, and judging that a short circuit exists in the lead group:
step 1502, when a path is detected between the two probes, determining that a short circuit exists in the lead group;
and 1503, judging that no short circuit exists in the lead group when the two probes are detected to be open-circuit.
In this embodiment, the sequence of the content in step 1501-1503 and the content in step 1301 and the sequence of the content in step 803-804 in fig. 13 are not limited, the content in step 1501-1503 is after the content in step 803-804, and in other optional embodiments, the content in step 1501-1503 may be before the content in step 803.
As shown in fig. 16, a method for testing a display panel is provided for this embodiment, which is different from the method for testing a display panel provided in fig. 14, and the method further includes:
step 1601, measuring the resistance between any two probes in the same lead group, and judging that a short circuit exists in the lead group:
step 1602, when a path is detected between two probes, determining that a short circuit exists in a lead group;
step 1603, when an open circuit is detected between the two probes, it is determined that no short circuit exists in the lead group.
In this embodiment, the sequence of the content of steps 1601-1603 and the content of steps 803 and 804 is not limited, in some optional embodiments, the content of steps 1601-1603 is after the content of steps 803 and 804, and in other optional embodiments, the content of steps 1601-1603 may be before the content of step 803.
Optionally, in an embodiment of the method for testing a display panel, the method may further include: and after the test is finished, separating the first test area from the display panel along the cutting line.
By the embodiment, the display panel and the test method of the display panel disclosed by the invention have the following beneficial effects that:
(1) according to the display panel and the test method of the display panel, the first test area and the second test area are arranged in the non-display area around the display area provided with the lead, the lead is detected before the cover plate is added to the display panel through the first test area and the second test area, the panel display area is subjected to poor detection before the display panel is finished, the reject ratio of display panel products flowing into the market can be reduced, the first test area and the second test area are arranged in the non-display area, the design structure is simple, the use is convenient and fast, and irreparable manpower and material waste caused by detection after the finished products can be avoided.
(2) According to the display panel and the test method of the display panel, the design of the switch unit is introduced into the test area of the display panel, when the test area is not required to provide or receive a detection signal, the corresponding switch unit can be closed, so that the first test area and the second test area can perform signal detection on the display area of the panel in a cooperative or independent mode, and therefore higher detection precision is obtained, and the product yield is improved.
(3) According to the display panel and the test method of the display panel, the design of the cutting line is introduced into the test area of the display panel, and after the detection of the display area of the panel is completed, the test area without display effect can be cut off along the cutting line, so that the complicated step of disassembling the detection area is omitted, the display panel can be quickly put into the market when the normal state of the display panel is detected, and the process efficiency is improved.
(4) The display panel and the test method of the display panel, provided by the invention, have the advantages that the test ends of the test areas are grouped, and the leads of the display panel are tested in a grouping detection mode, so that the excessive number of test points arranged on the display panel is avoided, the complexity of the design of the display panel can be reduced, meanwhile, the reverse detection signals are added into the test areas, the detection results are obtained by analyzing the output signals, and whether the display panel is normal or not can be quickly and accurately detected.
Although some specific embodiments of the present invention have been described in detail by way of examples, it should be understood by those skilled in the art that the above examples are for illustrative purposes only and are not intended to limit the scope of the present invention. It will be appreciated by those skilled in the art that modifications may be made to the above embodiments without departing from the scope and spirit of the invention. The scope of the invention is defined by the appended claims.
Claims (15)
1. A display panel, comprising: a display area and a non-display area;
the display area comprises a plurality of lead groupings, each lead grouping comprising at least two leads;
the non-display area comprises a first test area and a second test area; wherein,
the first test area comprises a plurality of signal lines, and each signal line is electrically connected with the first end of one lead;
the second test area includes a plurality of probes, each of which is connected to a second end of one of the leads.
2. The display panel according to claim 1, wherein the first test area further comprises a plurality of switching units for controlling the signal lines and the leads corresponding thereto to be turned on or off.
3. The display panel of claim 1, wherein the display panel further comprises a cutting line for separating the first test area or the second test area from the display panel along the cutting line after the test is completed.
4. The display panel of claim 1, wherein the first test area and the second test area are disposed at opposite or adjacent ends of the display panel.
5. The display panel of claim 1, wherein the probes are arranged in a straight line or a delta in the second test area.
6. The display panel according to claim 1, wherein the detection signal inputted to the display panel by the signal line is a square wave, a sine wave, or a triangular wave.
7. The display panel according to claim 1, wherein the display panel is electronic paper.
8. A method for testing a display panel, which is used for testing any one of the display panels as claimed in claims 1 to 7, wherein the method comprises:
preparing a display panel, wherein the display panel comprises a display area and a non-display area, the display area comprises a plurality of lead wires, the non-display area comprises a first test area and a second test area, the first test area comprises a plurality of signal wires, and the second test area comprises a plurality of probes;
grouping leads on the display panel such that each of the lead groups includes at least two leads;
adding a detection signal to the display panel from a signal line connected in groups to one of the lead lines:
when at least one signal line in a group different from the signal line is detected to have signal output, determining that a short circuit exists between the lead group corresponding to the signal line and other lead groups;
and when no signal output is detected in other signal wires in a group different from the signal wire, judging that no short circuit exists between the lead wire group corresponding to the signal wire and other lead wire groups.
9. The method for testing a display panel according to claim 8, further comprising:
measuring the resistance between any two of the signal lines of two different groups of leads:
when a path is detected between the two signal lines, determining that a short circuit exists between the lead wire groups corresponding to the two signal lines; or,
and when the two signal lines are detected to be open-circuited, judging that no short circuit exists between the lead groups corresponding to the two signal lines.
10. The method for testing a display panel according to claim 8, further comprising:
shorting the probes in the same group of leads;
adding a plurality of detection signals from the signal lines to the display panel, each of the signal lines corresponding to one of the detection signals:
when the signal waveform output by the probe is detected to be a superposed signal of all the detection signals, judging that no open circuit exists in the lead group; or,
when the signal waveform output by the probe is detected to be a zero waveform, all the leads in the lead group are judged to be open circuits; or,
and when the signal waveform output by the probe is detected to be one signal or the superposed signal of more than one signal in the detection signals and does not comprise the superposed signal of all the detection signals, judging that the signal line corresponding to the undetected signal is disconnected with the probe.
11. The testing method of claim 8, further comprising:
adding a detection signal from a signal line of one of the lead groups to a display panel:
when the probes corresponding to the signal lines are detected to have signal output, judging that no open circuit exists between the signal lines and the corresponding probes; or,
and when no signal output of the probe corresponding to the signal line is detected, judging that the signal line and the corresponding probe are disconnected.
12. The testing method of claim 8, further comprising:
measuring the resistance between any two signal lines of the same lead group:
when the two signal lines are detected to be a path, judging that no open circuit exists in the lead wire groups corresponding to the two signal lines; or,
and when the two signal lines are detected to be open circuits, judging that the lead groups corresponding to the two signal lines have open circuits.
13. The testing method of claim 8, further comprising:
and after the test is finished, the switch unit of the first test area is disconnected.
14. The testing method of claim 13, further comprising:
adding a test signal from one of said probes to the display panel:
when other probes in the same lead group with the probes are detected to have signal output, judging that the short circuit exists in the lead group; or,
and when no signal output is detected by other probes in the same lead group as the probes, judging that no short circuit exists in the lead group.
15. The method for testing a display panel according to claim 13 or 14, further comprising:
measuring the resistance between any two of the probes within the same lead group:
when a passage is detected between the two probes, the short circuit in the lead group is judged; or,
and when an open circuit is detected between the two probes, judging that no short circuit exists in the lead group.
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