CN1847930A - Liquid crystal display panel, testing fixture and testing method therefor - Google Patents

Liquid crystal display panel, testing fixture and testing method therefor Download PDF

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Publication number
CN1847930A
CN1847930A CNA2006100752282A CN200610075228A CN1847930A CN 1847930 A CN1847930 A CN 1847930A CN A2006100752282 A CNA2006100752282 A CN A2006100752282A CN 200610075228 A CN200610075228 A CN 200610075228A CN 1847930 A CN1847930 A CN 1847930A
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CN
China
Prior art keywords
display panels
brace
signal
applying unit
signal wire
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CNA2006100752282A
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Chinese (zh)
Inventor
孙赫
林圣默
朴莹根
边昌贤
楚钟福
金一浚
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Samsung Electronics Co Ltd
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Samsung Electronics Co Ltd
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Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of CN1847930A publication Critical patent/CN1847930A/en
Pending legal-status Critical Current

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    • E—FIXED CONSTRUCTIONS
    • E04—BUILDING
    • E04C—STRUCTURAL ELEMENTS; BUILDING MATERIALS
    • E04C5/00—Reinforcing elements, e.g. for concrete; Auxiliary elements therefor
    • E04C5/07—Reinforcing elements of material other than metal, e.g. of glass, of plastics, or not exclusively made of metal
    • E—FIXED CONSTRUCTIONS
    • E04—BUILDING
    • E04G—SCAFFOLDING; FORMS; SHUTTERING; BUILDING IMPLEMENTS OR AIDS, OR THEIR USE; HANDLING BUILDING MATERIALS ON THE SITE; REPAIRING, BREAKING-UP OR OTHER WORK ON EXISTING BUILDINGS
    • E04G21/00—Preparing, conveying, or working-up building materials or building elements in situ; Other devices or measures for constructional work
    • E04G21/02—Conveying or working-up concrete or similar masses able to be heaped or cast
    • E—FIXED CONSTRUCTIONS
    • E04—BUILDING
    • E04F—FINISHING WORK ON BUILDINGS, e.g. STAIRS, FLOORS
    • E04F19/00—Other details of constructional parts for finishing work on buildings
    • E04F19/02—Borders; Finishing strips, e.g. beadings; Light coves

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  • Engineering & Computer Science (AREA)
  • Architecture (AREA)
  • Civil Engineering (AREA)
  • Structural Engineering (AREA)
  • Liquid Crystal (AREA)
  • Mechanical Engineering (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)

Abstract

The invention discloses an LCD testing device and method, which comprises the following parts: working bench with multiple signal lines and multiple LCD display panel in connection with the signal line, aphototropism tube component to supply light for LCD panel, at least one contact part to construct single examining signal for connecting piece of at least two signal lines.

Description

The testing fixture of display panels, display panels and inspection method
Technical field
The present invention relates to the testing fixture and the inspection method of display panels, display panels, in more detail, relate to and being used in by the display panels of the existence that after having removed short bar, the signal wire brace is applied the inspection signal, check the bad signal wire that has or not display panels and bad pixel, the testing fixture and the inspection method of display panels.
Background technology
Liquid crystal indicator has: be formed with the thin film transistor base plate of thin film transistor (TFT), be formed with the counter substrate and the display panels of liquid crystal layer between them of color filter layer etc. usually.In the manufacturing process of display panels, require to be used for to confirm to have or not the substrate in the manufacturing or the bad diversified inspection of display panels in each step.
In such inspection, have array test (array test), visual examination (visualinspection), integration test (gross test, G/T), final test (final test) etc.
Visual test wherein is meant following test: finish after the display panels, the short bar (shorting bar) of the signal wire by being connected with gate line and data line etc. applies the inspection signal, thereby checks and have or not the bad of signal wire or pixel.
After in the manufacturing process of display panels, having removed short bar, just can not detect and have or not the bad of signal wire or pixel, utilize testing fixture to carry out integration test afterwards with probe assembly by visual examination.Integration test is following method: after the probe that probe assembly is had is contacted with respectively the signal wire brace of independently grid brace and data brace etc., to check independently that by probe signal is applied to the signal wire brace, check the bad of bad and each pixel of having or not signal wire with this.
But, utilization has the Integrated Checkout that the testing fixture of probe assembly carries out, independently checking signal respectively for signal wire is applied, and making probe correctly be contacted with in this process of signal wire brace the essential more time, thereby inspection speed this problem that descends is being arranged.Again, the probe more weak in impact is crooked or damaged because of the repeatable operation that continues, and produces under the situation of the loose contact between probe and signal wire brace with this, and actual signal wire or bad this problem of detectability difference of each pixel are arranged.
Summary of the invention
Therefore, the present invention makes in view of the problem in the testing fixture of above-mentioned existing liquid crystal panel just, the object of the present invention is to provide a kind of display panels with structure of the bad inspection speed that can improve display panels and bad detectability.
Again, other purpose of the present invention is to provide the pick-up unit and the inspection method of the display panels of a kind of bad inspection speed that can improve display panels and bad detectability.
In order to reach above-mentioned purpose, first aspect present invention provides a kind of testing fixture of display panels, and it has: worktable, the display panels that comprises many signal line and be linked to the many signal line brace on these many signal line respectively is installed; Check and use back light unit, to the back side supply light of the described display panels installed; At least one contact portion applies single inspection signal at least 2 described signal wire braces.
Preferably: also comprise the probe portion that described many signal line brace is applied the independent check signal respectively.
Preferably: described signal wire brace comprises one of any at least in grid brace and the data brace.
Preferably: described signal wire brace comprises the grid brace, and described contact portion applies single inspection signal to the grid brace of integral body.
Preferably: described signal wire brace comprises the data brace, and described contact portion applies single inspection signal to the data brace of integral body.
Preferably: described signal wire brace is divided into a plurality of modules, and described contact portion constitutes a plurality of in the mode corresponding to these a plurality of modules.
Preferably: described contact portion comprises and contacts with described signal wire brace and apply the signal applying unit of checking signal.
Preferably: described signal applying unit is rod (bar) shape.
Preferably: described many signal line brace is the multiple row alternate configurations, and described contact portion has: the first signal applying unit is contacted with the signal wire brace of a plurality of odd numbers that are configured to row; The secondary signal applying unit is contacted with that signal wire brace with described odd number leaves certain interval and configured in parallel is the signal wire brace of a plurality of even number of row, and leaves certain compartment of terrain with the described first signal applying unit and separate side by side.
Preferably: also comprise: conveying assembly is transported to described display panels on the described worktable; First travel mechanism makes at mutually relatively move between approximated position and the separation point position described display panels and described worktable and to install or separate.
Preferably: described contact portion is provided at least one side's side of described worktable, also is included in second travel mechanism of relatively move between mutual approximated position and the separation point position described contact portion and described worktable.
Preferably: described contact portion utilizes described second travel mechanism to move to the side or the back side as the described worktable of separation point position.
Preferably: described probe portion is provided to the top of described worktable, also is included in the 3rd travel mechanism of relatively move between mutual approximated position and the separation point position described probe portion and described worktable.
Preferably: a pair of Polarizer that also comprises the top of the top that one by one is provided to described back light unit respectively and described probe portion.
In order to reach above-mentioned purpose, second aspect present invention provides a kind of testing fixture of display panels, and it has contact portion, and described contact portion has: the first signal applying unit is contacted with the signal wire brace of a plurality of odd numbers that are configured to row; The secondary signal applying unit is contacted with that signal wire brace with described odd number leaves certain interval and configured in parallel is the signal wire brace of a plurality of even number of row, and leaves certain compartment of terrain with the described first signal applying unit and separate side by side.
Preferably: being spaced apart more than the 0.5mm between described first signal applying unit and the described secondary signal applying unit.
Preferably: described signal wire brace be in grid brace and the data brace one of at least.
Preferably: described contact portion also comprises the main part of fixing described first signal applying unit and described secondary signal applying unit.
In order to reach above-mentioned purpose, third aspect present invention provides a kind of inspection method of display panels, and it has: will comprise that many signal line and the display panels that is linked to a plurality of signal wire braces on these many signal line respectively are installed on the step on the worktable; Make the signal applying unit that applies single inspection signal touch the step of the described signal wire brace more than at least two; Described signal applying unit applies single inspection signal, detects the bad step that has or not described signal wire.
Preferably: have or not in the bad step of described signal wire in detection, comprise the step of the resistance view picture of measuring described display panels.
Preferably: in the bad detection step of described signal wire, comprise the resistance separately of measuring described signal wire, judge whether the resistance separately of described signal wire belongs to the step of appropriate area.
Preferably: described signal applying unit before being contacted with described signal wire brace, comprises that also mutual electricity separates the step of described a plurality of signal wire braces.
Preferably: described signal wire brace comprises the grid brace, and described signal applying unit is contacted with whole grid brace.
Preferably: described signal wire brace comprises the data brace, and described signal applying unit is contacted with whole data brace.
Preferably: utilized described signal applying unit and the bad detection carried out is divided into a plurality of modules with described signal wire brace and carries out.
Preferably: described signal applying unit is provided to described module respectively.
Preferably: carry out utilizing described signal applying unit have or not bad detection step after, also comprise applying the step of independently checking signal to detecting bad described signal wire.
Preferably: described signal wire brace prolongs from described many signal line respectively, is the multiple row alternate configurations, applies different inspection signals between the signal wire brace of described signal applying unit to described alternate configurations.
Preferably: described signal wire brace comprises the data brace, and described signal applying unit comprises: the first signal applying unit that is contacted with the described data brace of odd number; Be contacted with the secondary signal applying unit of the described data brace of even number.
Preferably: described signal wire brace comprises the grid brace, and described signal applying unit comprises: the 3rd signal applying unit that is contacted with the described grid brace of odd number; Be contacted with the 4th signal applying unit of the described grid brace of even number.
Preferably: utilize that described signal applying unit carries out have or not bad detection step after, also comprise applying the step of independent detection signal to detecting bad described signal wire.
In order to reach above-mentioned purpose, fourth aspect present invention provides a kind of display panels, and it has: insulated substrate has the signal wire viewing area that defines and the non-display area that is formed at the outline of this viewing area that are intersected by insulation; A plurality of signal wire braces prolong from described signal wire, are formed on described non-display area, are the multiple row alternate configurations.
Preferably: described signal wire brace is one of any at least in grid brace and the data brace.
Preferably: the row interbody spacer of the signal wire brace of described alternate configurations is more than the 0.5mm.
According to the present invention, can provide a kind of and can improve the bad inspection speed of display panels and the display panels of bad detectability.
According to the present invention, can provide the testing fixture and the inspection method of the display panels of a kind of bad inspection speed that can improve display panels and bad detectability again.
Description of drawings
Fig. 1 is the front elevation that utilizes the common LCD panel device that the testing fixture of the display panels in first embodiment to the, three embodiments of the present invention checks.
Fig. 2 is the stereographic map of testing fixture of the display panels of first embodiment of the present invention;
Fig. 3 be first embodiment of the present invention display panels testing fixture want portion's stereographic map;
Fig. 4 is the exploded perspective view of contact component of testing fixture of the display panels of first embodiment of the present invention;
Fig. 5 be first embodiment of the present invention display panels testing fixture contact component in conjunction with stereographic map;
Fig. 6 is the exploded perspective view of probe member of testing fixture of the display panels of first embodiment of the present invention;
Fig. 7 be first embodiment of the present invention display panels testing fixture probe member in conjunction with stereographic map;
Fig. 8 is the control block diagram of testing fixture of the liquid crystal indicator of first embodiment of the present invention;
Fig. 9 is the stereographic map of inspection method of display panels of testing fixture of in turn having represented to utilize the display panels of first embodiment of the present invention;
Figure 10 is the stereographic map of inspection method of display panels of testing fixture of in turn having represented to utilize the display panels of first embodiment of the present invention;
Figure 11 is the stereographic map of inspection method of display panels of testing fixture of in turn having represented to utilize the display panels of first embodiment of the present invention;
Figure 12 is the stereographic map of inspection method of display panels of testing fixture of in turn having represented to utilize the display panels of first embodiment of the present invention;
Figure 13 is the stereographic map of inspection method of display panels of testing fixture of in turn having represented to utilize the display panels of first embodiment of the present invention;
Figure 14 is illustrated in the inspection method of testing fixture of the display panels that has utilized first embodiment of the present invention, and the signal applying unit is contacted with the front elevation of the display panels of the state on the signal wire brace of display panels;
Figure 15 is the thin film transistor base plate of display panels of IX-IX line of Figure 14 and the sectional view of signal applying unit;
Figure 16 is illustrated in the inspection method of display panels of testing fixture of the display panels that has utilized second embodiment of the present invention, and the signal applying unit is contacted with the front elevation of the display panels of the state on the signal wire brace of display panels;
Figure 17 is illustrated in the inspection method of display panels of testing fixture of the display panels that has utilized the 3rd embodiment of the present invention, and the signal applying unit is contacted with the front elevation of the display panels of the state on the signal wire brace of display panels;
Figure 18 is the front elevation of the display panels developed for the testing fixture of the display panels that utilizes the 4th embodiment to the six embodiments of the present invention checks;
Figure 19 is the enlarged drawing in Figure 18 ' A ' zone;
Figure 20 is the rear view of contact portion of testing fixture of the display panels of the 4th embodiment of the present invention;
Figure 21 is illustrated in the inspection method of testing fixture of the display panels that has utilized the 4th embodiment of the present invention, and the signal applying unit is contacted with the front elevation of the display panels of the state on the signal wire brace of display panels;
Figure 22 is the thin film transistor base plate of display panels of XVI-XVI line of Figure 21 and the sectional view of signal applying unit;
Figure 23 is illustrated in the inspection method of display panels of testing fixture of the display panels that has utilized the 5th embodiment of the present invention, and the signal applying unit is contacted with the front elevation of the display panels of the state on the signal wire brace of display panels;
Figure 24 is illustrated in the inspection method of display panels of testing fixture of the display panels that has utilized the 6th embodiment of the present invention, and the signal applying unit is contacted with the front elevation of the display panels of the state on the signal wire brace of display panels.
Symbol description
10,11 display panels
20,21 thin film transistor base plates
22 insulated substrates
23 gate insulating films
24 gate lines
25,26 grid braces
27 data lines
28,29 data braces
31 diaphragms
32 data brace contact openings
33 transparency electrodes
41～43,46～48 grid brace modules
51～56,61～66 data brace modules
70,71 opposite electrodes
100 frame parts
110 first frame sections
120 second frame sections
150 worktable
152 substrates
154 supports
156 fixed parts
158 resettlement sections
200 inspection back light units
250 first Polarizers
300 signals apply assembly
310 first signals apply assembly
320 first fixed parts
330 first contact components
344～349,384～389 signal applying units
350 secondary signals apply assembly
360 second fixed parts
370 second contact components
372,572 supports
374,574 linking parts
376,576 buffer part
378,578 bottoms
380,381 contact portions
391 first combined holes
392 first engagement grooves
393 second engagement grooves
394,395,396 second combined holes
397 first in conjunction with screw
398 second in conjunction with screw
500 probe assemblies
510 support plates
512 peristomes
514 supports
520 probe members
530 first probe members
570 second probe members
580 probe portions
584 probes
593 second engagement grooves
594,595,596 second combined holes
597 first in conjunction with screw
598 second in conjunction with screw
600 conveying assemblies
620 delivery boards
630 panel fixed parts
640 anchor clamps
650 control parts
700 first travel mechanisms
720 first travel mechanism's linking parts
750 second travel mechanisms
760,770 second travel mechanism's linking parts
800 the 3rd travel mechanisms
820 the 3rd travel mechanism's linking parts
850 second Polarizers
860 Polarizer fixed parts
Embodiment
Then, be used to implement the testing fixture of display panels of the present invention, display panels and the preferred embodiment of inspection method with reference to description of drawings.
Identical inscape in the numerous embodiments is that representative describes with first embodiment, omits its explanation in other embodiment.
Before the explanation of the testing fixture of the display panels of first embodiment of the present invention, at first desired common display panels is checked in explanation.Fig. 1 is the front elevation that utilizes the common LCD panel device that the testing fixture of the display panels in first embodiment to the, three embodiments of the present invention checks.
Display panels 10 comprise thin film transistor base plate 20, and thin film transistor base plate 20 opposed counter substrate 70, be bonded with each other two substrates 20,70 and be formed with the sealant (not shown) in netted gap (cell gap) and be positioned at two substrates 20,70 and sealant (not shown) between liquid crystal layer (not shown).
Thin film transistor base plate 20 roughly is divided into the non-display area of viewing area and viewing area outline.In the viewing area, as many gate lines 24 of the signal wire that prolongs in the horizontal with intersect as many data lines 27 of the signal wire of prolongation in the vertical, a plurality of pixel regions (not shown) are arranged as rectangular.
The gate line 24 that extends to non-display area from the viewing area is linked to interval between each line and is formed on while narrowing down on the grid brace 25 in the non-display area.Thereby more than 25 intensive formation grid brace modules 41 to 43 of grid brace are equipped with 3 grid brace modules 41 to 43 in the present embodiment.Grid brace 25 is provided as width and broadens than gate line 24.
The data line 27 that extends to non-display area from the viewing area is linked to interval between each line and is formed on while narrowing down on the data brace 28 in the non-display area.Thereby more than 28 intensive formation data brace modules 51 to 56 of data brace are equipped with 6 data brace modules 51 to 56 in the present embodiment.Data brace 28 is provided as width usually and broadens than data line 27.
Grid brace 25 and data brace 28 apply the signal applying unit 344 to 346,384 to 386 of assembly 300 with signal described later or the probe 584 of probe assembly 500 contacts.The single inspection signal that applies from signal applying unit 344 to 346,384 to 386 or be delivered to from the independent check signal that probe 584 applies and be linked to the gate line 24 on each grid brace 25 and be linked on the data line 27 on the data brace 28.With this, check to have or not as the bad of the gate line 24 of signal wire and data line 27 and have or not the bad of each pixel (not shown) of being provided in the viewing area.
Counter substrate 70 correspondences are formed on the top of the viewing area of thin film transistor base plate 20, generally include color filter layer (not shown).
Below, the testing fixture of the display panels of first embodiment of the present invention is described with reference to Fig. 2 to Fig. 6.Fig. 2 and Fig. 3 be respectively first embodiment of the present invention display panels testing fixture stereographic map and want portion's stereographic map, Fig. 4 and Fig. 5 be respectively first embodiment of the present invention display panels testing fixture contact component exploded perspective view and in conjunction with stereographic map, Fig. 6 and Fig. 7 be respectively first embodiment of the present invention display panels testing fixture probe member exploded perspective view and in conjunction with stereographic map, Fig. 8 is the control block diagram of testing fixture of the liquid crystal indicator of first embodiment of the present invention.
The testing fixture of the display panels of first embodiment of the present invention has: frame parts 100, be configured to accommodate or be formed in the frame parts 100 and towards the downward-sloping worktable 150 in the ground, the place ahead of frame parts 100, check and apply assembly 300, probe assembly 500 and conveying assembly 600 with back light unit 200, signal.
Frame parts 100 has first frame section 110 and second frame section 120, constitutes the basic framework of testing fixture.
Conveying assembly 600 is positioned at the front surface portion of first frame section 110.
Conveying assembly 600 has: delivery board 620 has the spatial portion that is used for accommodating at center section display panels 10; One counter plate fixed part 630, outstanding opposed from delivery board 620 towards spatial portion.End at each panel fixed part 630 has a pair of anchor clamps 640 respectively, and display panels 10 utilizes anchor clamps 640 to clamp or remove clamping.
Conveying assembly 600, in order to utilize the inspection of the next display panels 10 of testing fixture carrying from the outside, be transported to second frame section 120 from first frame section 110, and will have finished the display panels of checking 10 from second frame section 120 and be transported to first frame section 110 once more.
Contain worktable 150 in second frame section 120 adjacent with first frame section 110, described worktable 150 is installed the display panels 10 that utilizes conveying assembly 600 to transport.
Worktable 150 has substrate 152, support 154 and fixed part 156.
Substrate 152 for the convenience of operator's the review of operations, is configured to towards the ground, the place ahead of second frame section 120 downward-sloping.
At the center section of substrate 152, the support 154 of the circumference of the display panels 10 that supporting is installed is projected into top.In the resettlement section 158 of the inside that is formed at support 154, contain successively and check with the back light unit 200 and first Polarizer 250.
Checking can be when having utilized signal to apply the applying of inspection signal of assembly 300 and probe assembly 500 for the operator with back light unit 200, confirm to have or not bad as the gate line 24 of signal wire and data line 27, pixel with naked eyes, and light is supplied to display panels 10.
Side's side at the upper face of support 154 is formed with a pair of fixed part 156, and display panels 10 that install utilizes load to prevent landing towards the ground, the place ahead of second frame section 120 is downward-sloping.
Lower surface at substrate 152 is provided with the first travel mechanism's linking part 720 that links first travel mechanism 700 and worktable 150, and worktable 150 utilizes moving up and down of first travel mechanism 700.With this, worktable 150 and the conveying assembly 600 that moves to second frame section 120 are moving between approximated position and the separation point position mutually.First travel mechanism 700 can comprise the drive division (not shown) of known motor or driving cylinder etc. and constitute.First travel mechanism 700 does not make worktable 150 move up and down, and can be provided as conveying assembly 600 is moved up and down, and can be provided as worktable 150 and conveying assembly 600 are moved simultaneously yet.
Signal applies assembly 300 and leaves certain separation spacing ground configuration with two sides of support 154.The initial position that signal applies assembly 300 is not the side of support 154, can be the bottom of the substrate 152 of worktable 150.Signal applies assembly 300 and applies assembly 310 with first signal and apply assembly 350 with secondary signal and constitute.
First signal applies assembly 310 with 3 first contact components 330 each grid brace module 41 to 43 being applied single inspection signal respectively, constitute with first fixed part 320 of fixing first contact component 330 respectively.On the other hand, secondary signal applies assembly 350 with 6 second contact components 370 each data brace module 51 to 56 being applied single inspection signal respectively, constitute with second fixed part 360 of fixing second contact component 370 respectively.The number of each contact component 330,370 can increase and decrease according to the number of each signal wire brace module 41 to 43,51 to 56 of display panels 10.
Because first contact component 330 is identical with the structure of second contact component 370, so with regard to the textural element of thin portion, second contact component 370 only is described.
As Fig. 4 and shown in Figure 5, second contact component 370 comprises support 372, linking part 374, buffer part 376, along the angle of the lower surface of main part 382 and be attached with the contact portion 380 of signal applying unit 384 and bottom 378 and constitute.
Support 372 is fixed on second fixed part 360, is used to utilize first first combined hole 391 that combines with linking part 374 screw threads in conjunction with screw 397 to be formed on upper face.
Also be provided with first engagement groove 392 corresponding to first combined hole 391 in the part of the correspondence of linking part 374, support 372 and linking part 374 utilize first to combine the combination of screw 397 and mutually combine.On linking part 374, be formed with second engagement groove 393 again.The shape of support 372 and linking part 374 and combining mechanism are not limited to above-mentioned, certainly change diversely.
Lower surface at linking part 374 is combined with buffer part 376, contact portion 380 and bottom 378 successively.
On buffer part 376, contact portion 380 and bottom 378, be formed with second combined hole 394,395,396 respectively corresponding to second engagement groove 393 of linking part 374, if accommodate in conjunction with second in conjunction with screw 398, then linking part 374, buffer part 376, contact portion 380 and bottom 378 combination successively, thus constitute second contact component 370 with support 372.
Buffer part 376 produces when reducing the driving of second travel mechanisms 750 on being linked to second travel mechanism's linking part 770 and is delivered to vibrations or impact in the contact portion 380 by second fixed part 360 via support 372 and linking part 374.By reducing impact or the vibrations that under the signal applying unit 384 of contact portion 380 and situation that data brace 28 contacts, produce, just improved the contact performance between signal applying unit 384 and the data brace 28 in order to check applying of signal again.
By with the data brace module 51 to 56 that is contained in display panels 10 in any one module in the contacting of a plurality of data braces 28, the signal applying unit 384 that data line 27 is applied single inspection signal is just along the angle in the place ahead of the lower surface of main part 382 and be formed on the contact site 380.Contact portion 380 also can omit main part 382 and only constitute with signal applying unit 384, and under this situation, signal applying unit 384 constitutes and is attached directly on the buffer part 376.
Signal applying unit 384, have or not the bad of the data line 27 that is linked on each data brace 28 or each pixel by a plurality of data braces 28 that are contained in the data brace module that contacts with signal applying unit 384 51 to 56 being applied single inspection signal, checking.
Signal applying unit 384 can be made of metal, but in the present embodiment, comprises softness and is easy to conducting rubber with contacting of data brace 28 and constitutes.Signal applying unit 384 by being contacted with the transparency electrode 33 (with reference to Figure 15) that is formed on the data brace contact opening 32 (with reference to Figure 15) practically, and contacts with the data brace 28 that is electrically connected on transparency electrode 33 indirectly., transparency electrode 33 is formed with step because utilizing data brace contact opening 32, so comprise that the signal applying unit 384 of rubber-like conducting rubber can be along the surface of the transparency electrode 33 that is formed with step on top and contact easily, so can make contact performance good.
In the present embodiment, signal applying unit 384 is provided as rod shape, but is not limited thereto, and also can diversely change to make the multiple easily shape of bad inspection.
Bottom 378 is positioned at the lower surface of contact portion 380, protection contact portion 380.
On the other hand, in order to measure bad as each gate line 24 of signal wire and each pixel, thereby and contact the structure of first contact component 330 that applies single inspection signal with a plurality of grid braces 25 that belong to each grid brace module 41 to 43, also identical with second contact component 370.
Be provided with at the rear that two signals apply each fixed part 320,360 of assembly 310,350 and link second travel mechanism's linking part 760,770 that second travel mechanism 750 and two signals apply assembly 310,350 respectively.Second travel mechanism 750 comprises drive divisions such as known motor or driving cylinder (not shown) and constitutes.Two signals apply assembly 310,350 with a plurality of signal wire braces 25,28 contact that belongs to each signal wire brace module 41 to 43,51 to 56 and separate.
With worktable 150 mutually near and the probe assemblies 500 that separate be positioned at the top of worktable 150.Probe assembly 500 its initial positions are provided to than the conveying assembly 600 that moves to second frame section 120 and more make and not hinder the display panels 10 that will utilize conveying assembly 600 to transport to be installed on the worktable 150 in top.
Probe assembly 500 be included in center section be formed with peristome 512 support plate 510, with along the periphery of peristome 512 and attached to the probe member on the lower surface of support plate 510 520.
Probe member 520 has: 3 first probe members 530 apply other inspection signal respectively to each the grid brace 25 in each the grid brace module 41 to 43 that is contained in display panels 10; 6 second probe members 570 apply other inspection signal respectively to each the data brace 28 that is contained in each data brace module 51 to 56.The number of each probe member 530,570 can increase and decrease according to the number of the signal wire brace module 41 to 43,51 to 56 of display panels 10.
Because first probe member 530 is identical with the structure of second probe member 570, so with regard to the textural element of thin portion, second probe member 570 only is described.
As Fig. 6 and shown in Figure 7, second probe member 570 is attached with support 572, linking part 574, buffer part 576, on the angle in the place ahead of the lower surface of main part 582 and checks that probe portion 580 and bottom 578 that signal applies with probe 584 constitute.
Support 572 adheres to the lower surface of the support plate 510 of the periphery that is fixed in peristome 512 (with reference to Fig. 3).Be formed with in the lower surface of support 572 and be used to utilize first the combination to come first combined hole (not shown) that mutually combines with linking part 574 in conjunction with screw 597.
Also be provided with in the part of the correspondence of linking part 574 and be used to utilize screw in conjunction with first engagement groove (not shown) that combines with support 572, support 572 and linking part 574 utilize first to combine the combination of screw 597 and mutually combine.Be formed with second engagement groove 593 on the forward lower part surface of linking part 574 again.The shape of support 572 and linking part 574 and combining mechanism are not limited to above-mentioned, can diversely change.
Lower surface at linking part 574 is combined with buffer part 576, probe portion 580 and bottom 578 successively.
On buffer part 576, probe portion 580 and bottom 578, be formed with second combined hole 594,595,596 respectively corresponding to second engagement groove 593 of linking part 574, if accommodate in conjunction with second in conjunction with screw 598 then linking part 574, buffer part 576, probe portion 580 and bottom 578 combination successively.
Buffer part 576 reduces at probe assembly 500 to be utilized corresponding to the control signal of control part 650 (with reference to Fig. 8) under the mobile situation of the 3rd travel mechanism 800 (with reference to Fig. 8) that is linked on the 3rd travel mechanism's linking part 820, is delivered to vibrations or impact in the probe portion 580 via support plate 510 by support 572 and linking part 574.Again, because reduce, so improved contact performance between probe 584 and the data brace 27 in of the impact or the vibrations of the probe 584 of probe portion 580 with generation when data brace 27 as the signal wire brace contacts.
In probe portion 580, give prominence to and be formed with a plurality of probes 584, described a plurality of probe 584 is along the angle in the place ahead of the lower surface of main part 582 and after one by one being contacted with on a plurality of data braces 28 of the data brace module 51 to 56 that is included in display panels 10 respectively, apply the independent check signal.
Probe portion 584 has or not bad as the data line 27 of signal wire or each pixel by checking independently that corresponding to the control signal of control part 650 ground signal puts on each the data brace 28 that belongs to data brace module 51 to 56, and checking.
Bottom 578 is positioned at the lower surface of probe portion 580, protection probe portion 580.
On the other hand, in order to measure bad as each gate line 24 of one of signal wire and each pixel, and after probe 584 one by one being contacted with a plurality of grid braces 25 that belong to each grid brace module 41 to 43, it is also identical with second probe member 570 respectively each grid brace 25 to be applied the structure of first probe member 530 of independently checking signal.
Be provided with the 3rd travel mechanism's linking part 820 of mutual binding the 3rd travel mechanism 800 (with reference to Fig. 8) and support plate 510 on the limit, two ends of the support plate 510 of probe assembly 500.The 3rd travel mechanism 800 is provided as the drive division (not shown) that comprises known motor or driving cylinder etc.Probe assembly 500 utilizes the 3rd travel mechanism 800 that drives corresponding to the control signal of control part 650, carry out rectilinear motion with respect to the vertical direction of the plate face that is installed in the display panels 10 on the worktable 150, with this with a plurality of signal wire braces 25,28 contact that belongs to each signal wire brace module 41 to 43,51 to 56 and separate.
On the top of probe assembly 500, second Polarizer 850 utilizes the second Polarizer fixed part 860 and is fixed in the front surface of second frame section 120.
As shown in Figure 8, first travel mechanism 700, second travel mechanism 750 and the 3rd travel mechanism 800 utilize control part 650 to control respectively, thereby travelling table 150, signal apply assembly 300 and probe assembly 500 respectively.
The testing fixture of the display panels of first embodiment of the invention not only possesses existing probe assembly 500, also possesses other signal and applies assembly 300.Can be before the enforcement of the integration test that has utilized probe 584, the signal applying unit 344,384 of utilizing the signal that is contacted with a plurality of signal wire braces 25,28 that belong to each signal wire brace module 41 to 43,51 to 56 simultaneously to apply assembly 300 applies single inspection signal, checks in advance with this to have or not the bad of signal wire 24,27 and each pixel.Having or not the bad result who obtains according to checking with this, learn to there is no under the condition of poor, can omit the Integrated Checkout that utilizes probe 584 to carry out.
Thereby, compare with the situation that the probe 584 that makes respectively one by one is contacted with on the signal wire 25,28, because easy activation signal applying unit 384, so can increase inspection speed.
Again, with the signal applying unit 384 that is equipped with as the bar-shaped of simple shape, after having removed short bar, also can apply and the similarly single inspection signal of short bar in visual examination, thereby following advantage is arranged: the problem of dtmf distortion DTMF that can improve the signal that in the visual examination that has utilized short bar, produces.
Thereby, compare with the situation that the probe 584 that makes respectively one by one is contacted with on the signal wire 25,28, because easy activation signal applying unit 384, so can increase inspection speed.
On the other hand, because compare with probe 584, the contact performance of the signal applying unit 384 that is made of conducting rubber etc. is good, so can reduce detectability because of this problem of loose contact variation.Again, just carry out the integration test that utilizes probe 584 to carry out because only limit to necessary situation, thus the integration test number of times that utilizes probe 584 to carry out can be reduced, thus probe 584 can be kept long-term proper property not crooked or damagedly.With this, can reduce the generation of the loose contact between probe 584 and the signal wire brace 25,28, the bad detectability that can also reduce actual signal lines 24,27 or each pixel is because of this problem of loose contact variation.
Below, the inspection method of display panels of the testing fixture of the display panels that has utilized first embodiment of the present invention is described with reference to Fig. 9 to Figure 13, Figure 14 and Figure 15.Fig. 9 to Figure 13 is respectively the stereographic map of inspection method of display panels of testing fixture of representing to have utilized the display panels of first embodiment of the present invention successively, Figure 14 is illustrated in the inspection method of testing fixture of the display panels that has utilized first embodiment of the present invention, the signal applying unit is contacted with the front elevation of the display panels of the state on the signal wire brace of display panels, and Figure 15 is the thin film transistor base plate of display panels of IX-IX line of Figure 14 and the sectional view of signal applying unit.
The inspection method of display panels of testing fixture of display panels of having utilized first embodiment of the present invention is from having the step via the display panels 10 of visual examination cutting-off of short-circuit rod.
Visual examination is following steps: signal wire 24,27 has been applied after certain voltage, usually, by observe the resistance view picture (not shown) that shows resistance value distribution on picture monitor, judged to have or not the bad of each signal wire 24,27.In order easily to carry out visual examination, use the short bar (not shown) that is electrically connected on respectively on the signal wire 24,27.Because short bar can apply single inspection signal to each signal wire 24,27, so not only can easily carry out visual examination, also function as follows: prevent that thin film transistor base plate 21 from destroying because of the static that produces in the manufacture process of display panels 10.
Short bar after visual examination, is removed remaining short bar by grinding between line of cut and abrasive wire, just can access with this and be separated into the independently display panels 10 (with reference to Fig. 1) of gate line 24 and data line 27 respectively.
Then, the display panels 10 that requires to check is installed on the worktable 150.
At first, as shown in Figure 2, be transported to display panels 10 first frame section 110 of testing fixture of display panels from the outside and utilize the anchor clamps 640 of panel fixed part 630 of conveying assembly 600 fixing.
Thereafter, as Fig. 2 and shown in Figure 9, conveying assembly 600 moves to second frame section 120 from first frame section 110, and display panels 10 is arranged in the top of the worktable 150 that is contained in second frame section 120.
Then, the first travel mechanism's linking part 720 that is provided to the bottom of worktable 150 utilizes and has received driving transmission, first travel mechanism 700 of drive signal and risen to top from control part 650, thereby the support 154 of worktable 150 approaches the circumference of display panels 10.
Then, as shown in figure 10, the anchor clamps 640 of immobile liquid LCD panel 10 retreat into the rear after having removed clamping.With this, Yi Bian Yi Bian the circumference of display panels 10 fully is contacted with installation on the support 154, thereby display panels 10 utilizes a pair of fixed part 156 to fix.
Then, if conveying assembly 600 moves to the original position of first frame section 110 once more, worktable 150 also drops to the original position before rising, and then installation steps are finished.
Afterwards, as Figure 11, Figure 14 and shown in Figure 15, via 2 following steps: contact applies the step of the signal applying unit 344,384 of single inspection signal and the step that the signal wire 25,28 that is contacted with signal applying unit 344,384 is respectively applied single inspection signal respectively at least two signal wires 25,28 of the display panels 10 installed successively.
At first, as shown in the figure, be linked to respectively that second travel mechanism's linking part 760,770 on each fixed part 320,360 that two signals apply assembly 310,350 utilizes second travel mechanism 750 and with respect to the substrate 152 of worktable 150 respectively on direction 1. after the vertical uplift, on direction 2., move horizontally, then on direction 3., vertically descend.With this, the signal applying unit separately 344,384 that each signal applies in a plurality of contact components 330,370 of being contained in of assembly 310,350 contacts with a plurality of signal wire braces 25,28 that belong to signal wire brace module 41 to 43,51 to 56.
Figure 15 is the sectional view along the IX-IX line cut-out of Figure 14, represents the signal applying unit 384 and a plurality of data brace 28 state of contact that belong to a data brace module 54 of second contact component 370.
If see and then be formed with gate insulating film 23 by thin film transistor base plate 20 on insulated substrate 22, gate insulating film 23 is made of the inorganics of silicon nitride etc.Be formed with data brace 28 on the top of gate insulating film 23.
Be formed with diaphragm 31 on the top of data brace 28.Diaphragm 31 mainly is the inoranic membrane that is made of silicon nitride, but also can be to constitute as one of any organic membrane in benzocyclobutene and the acrylic resin, and the duplicature that perhaps obtains with stacked organic membrane on inoranic membrane constitutes.Diaphragm 31 is removed at data brace contact opening 32.
Be formed with transparency electrode 33 on the top of diaphragm 31.Transparency electrode 33 forms by data brace contact opening 32 and links with data brace 28.At this, transparency electrode is made of ITO (indium tin oxide) or IZO (indium-zinc oxide).
On the top of transparency electrode 33, signal applying unit 384 contacts with transparency electrode 33.That is, signal applying unit 384 does not directly contact with data brace 28, but contacts indirectly by transparency electrode 33.
Afterwards, a plurality of signal wire braces 25,28 that 344,384 pairs of signal applying units are contacted with signal applying unit 344,384 respectively apply single inspection signal, thereby check the bad of bad or each pixel have or not each signal wire 24,27.
If see the process that applies of single inspection signal, then the inspection signal that produces by the inspection signal generator (not shown) that is linked on the power supply supply source (not shown) is applied to signal applying unit 344,384.Signal applying unit 344,384, pass through transparency electrode 33 with having received the inspection signal that applies, each signal wire brace 25,28 is applied single inspection signal, thereby signal wire brace 25,28 is applied to this signal the gate line 24 and data line 27 that is linked on each signal wire brace 25,28.
The inspection signal that is used for bad inspection carries out between a plurality of signal applying units 344,384 in addition.But, in same signal wire brace module 41 to 43,51 to 56, the single inspection signal that utilizes a signal applying unit 344,384 to apply is applied to the signal wire 24,27 that is linked on the signal wire brace 25,28 that belongs in each signal wire brace module 41 to 43,51 to 56.
In having or not bad inspection,, the method for directly confirming to be revealed in the image on the display panels 10 with eyes is arranged as the failure detection method of each signal wire 24,27 or pixel.But, for more accurate mensuration, mensuration is revealed in the resistance view picture on the display panels 10, the perhaps independently resistance of measured signal line 24,27, thereby judge whether the resistance value of measuring belongs to the proper resistor zone, just can detect with this to have or not the bad of each signal wire 24,27 and each pixel.
If apply bad having checked of the bad or individual pixel that has or not each signal wire 24,27 that single inspection signal carries out, then as shown in figure 11, each signal applies assembly 310,350 and utilizes second travel mechanism 750, respectively on the reverse direction of 3. direction after the vertical uplift, on the reverse direction of 2. direction, move horizontally, then on the reverse direction of 1. direction, vertically descend.With this, each signal applies assembly 310,350 and resets on the initial position.
Under the condition of poor of learning bad and each pixel that does not have signal wire 24,27 according to check result, having checked of display panels 10.
But, if in the condition of poor of bad and each pixel of learning signal wire 24,27 according to check result or require under the situation of more accurate inspection, then as Fig. 2 and shown in Figure 13, also need via following steps: the probe 584 that the probe member 520 of probe assembly 500 is had is contacted with on a plurality of signal wire braces 25,28 that belong to a plurality of signal wire braces fast 41 to 43,51 to 56, independently checks signal thereby respectively signal wire 24,27 is applied.
If from this process, then at first, as shown in figure 12, apply after assembly 310,350 resets on the original initial position at two signals, be linked to the 3rd travel mechanism's linking part 820 on the opposed both sides of support plate 510 of probe assembly 500 respectively and utilize the driving of the 3rd travel mechanism 800 and descend, thereby approach worktable 150.With this, probe assembly 500 also approaches display panels 10 with descending.
If near finishing, then as shown in figure 13, be provided in a plurality of probes 584 (with reference to Fig. 6 and Fig. 7) on each probe member 530,570 of probe assembly 500 one and contact with a corresponding signal wire brace 25,28.Keeping under the state of contact, applying by 584 pairs of each signal wire braces 25,28 of probe and independently check signal, thereby have or not the bad inspection of each signal wire 24,27 and each pixel.
Under the situation about having checked of utilizing probe 584 to carry out, if utilize the driving of the 3rd travel mechanism 800 to rise to initial position again at probe assembly 500, conveying assembly 600 is once more after first frame section 110 moves to second frame section 120, be transported to first frame section 110 with having finished the display panels of checking 10, then the inspection of display panels 10 is fully finished.
Inspection method according to the display panels of the testing fixture of the display panels that has utilized first embodiment of the present invention, by before the enforcement of the integration test that has utilized probe 584, utilize the signal that side by side is contacted with on a plurality of signal wire braces 25,28 that belong to each signal wire brace module 41 to 43,51 to 56 to apply the signal applying unit 344,384 of assembly 300 and apply single inspection signal, just can check in advance to have or not the bad of signal wire 24,27 and each pixel.With this, in having or not bad check result, do not have under the condition of poor, just can omit the integration test that utilizes probe 584 to carry out.
Thereby, compare with the situation that the probe 584 that makes respectively one by one is contacted with on the signal wire 25,28, because easy activation signal applying unit 384, so can increase inspection speed.
Again, with the signal applying unit 384 that is equipped with as the bar-shaped of simple shape, after having removed short bar, also can apply and the similarly single inspection signal of short bar in visual examination, thereby following advantage is arranged: the problem of dtmf distortion DTMF that can improve the signal that in the visual examination that has utilized short bar, produces.
On the other hand, because compare with probe 584, the contact performance of the signal applying unit 384 that is made of conducting rubber etc. is good, so can reduce detectability because of this problem of loose contact variation.Again, just carry out the integration test that utilizes probe 584 to carry out because only limit to necessary situation, thus the integration test number of times that utilizes probe 584 to carry out can be reduced, thus probe 584 can be kept long-term proper property not crooked or damagedly.With this, can reduce the generation of the loose contact between probe 584 and the signal wire brace 25,28, the bad detectability that can also reduce actual signal lines 24,27 or each pixel is because of this problem of loose contact variation.
Below, the testing fixture of display panels of second embodiment of the present invention and the inspection method of having utilized the display panels of this testing fixture are described with reference to Figure 16.Figure 16 is illustrated in the inspection method of display panels of testing fixture of the display panels that has utilized second embodiment of the present invention, and the signal applying unit is contacted with the front elevation of the display panels of the state on the signal wire brace of display panels.
The testing fixture of the display panels of second embodiment of the present invention is provided as one by one, and signal applying unit 345,385 contacts with all grid braces 25 and the data brace 28 that belong to a plurality of grid brace modules 41 to 43 and data brace module 51 to 56.With this,, identical with the testing fixture of the liquid crystal indicator of first embodiment of the present invention except first signal applies first contact component 330 of assembly 310 and second contact component 370 that secondary signal applies assembly 350 is provided as respectively one.
On the other hand, except signal applying unit 345,385 is not that gate line 24 and the data line 27 that belongs to a plurality of grid brace modules 41 to 43 and data brace module 51 to 56 applied single inspection signal respectively, but the gate line 24 and the data line 27 of integral body applied outside the single inspection signal, also the inspection method with the display panels of the testing fixture of the display panels that has utilized first embodiment of the present invention is identical to have utilized the inspection method of display panels of testing fixture of display panels of second embodiment of the present invention.
The testing fixture of the display panels by second embodiment of the present invention and the inspection method of having utilized the display panels of this testing fixture also can obtain and the testing fixture of the display panels of first embodiment of the present invention and the identical effect of inspection method of having utilized the display panels of this testing fixture.
Below, the testing fixture of display panels of the 3rd embodiment of the present invention and the inspection method of having utilized the display panels of this testing fixture are described with reference to Figure 17.Figure 17 is illustrated in the inspection method of display panels of testing fixture of the display panels that has utilized the 3rd embodiment of the present invention, and the signal applying unit is contacted with the front elevation of the display panels of the state on the signal wire brace of display panels.
The testing fixture of the display panels of the 3rd embodiment of the present invention applies on 346,386 this point of signal applying unit one by one of checking signal grid brace 25 and data brace 28 being equipped with respectively, and is identical with the testing fixture of the display panels of second embodiment of the present invention.But, the lateral length that is provided as each signal applying unit 346,386 have only with the grid brace 25 that belongs to a grid brace module 41 and data brace module 51 and length this point that data brace 28 contacts on, identical with the testing fixture of the display panels of first embodiment of the present invention.
Thereby, as shown in figure 17, utilized the inspection method of display panels of testing fixture of the display panels of the 3rd embodiment of the present invention, the signal applying unit only is contacted with the data brace 28 that belongs to particular data module 51, only the data line 27 that belongs to particular data module 51 is applied the inspection signal.With this, detect and to have or not the bad of the data line 27 that belongs to particular data module 51.Similarly, thus the signal applying unit 346 that contacts with the grid brace 25 that belongs to particular gate module 41 applies signal to be measured and to have or not the bad of the gate line 24 that belongs to particular gate module 41.Afterwards, signal applying unit 346,386 utilizes travel mechanism (not shown) to move to other grid module 42 and data module 52, inspection has or not the bad of the signal wire 24,27 that belongs to this signal wire brace module 42,52, continues inspection and has or not the bad of the signal wire 24,27 that belongs to next signal line brace module 43,53 Yi Bian move successively once more afterwards on one side.
The testing fixture of the display panels by the 3rd embodiment of the present invention and the inspection method of having utilized the display panels of this testing fixture also can obtain and the testing fixture of the display panels of the first above-mentioned embodiment and second embodiment and the identical effect of inspection method of having utilized the display panels of this testing fixture.
Below, at first with reference to Figure 18 and Figure 19 explanation with respect to before the explanation of the testing fixture of the liquid crystal panel of the 4th to the 6th embodiment of the present invention, for the testing fixture of the liquid crystal panel that is used in the 4th to the 6th embodiment of the present invention in and the display panels developed.
Figure 18 is the front elevation of the display panels developed for the testing fixture of the display panels that utilizes the 4th embodiment to the six embodiments of the present invention checks, and Figure 19 is the enlarged drawing in Figure 18 ' A ' zone.
The display panels of developing for the testing fixture of the display panels that utilizes the 4th embodiment to the six embodiments of the present invention checks 11 have thin film transistor base plate 21, with thin film transistor base plate 21 opposed counter substrate 71.
Thin film transistor base plate 21 roughly is divided into the non-display area of viewing area and the outline beyond it.In the viewing area, as many gate lines 24 of the signal wire that prolongs in the horizontal with intersect as many data lines 27 of the signal wire of prolongation in the vertical, a plurality of pixel regions (not shown) are arranged as rectangular.
The data line 27 that extends to non-display area from the viewing area is linked to interval between each line and is formed on while narrowing down on the data brace 29 in the non-display area.Data brace 29 constitutes 2 row as the different mutually row of even number and odd number, the data brace 29b alternate configurations of the data brace 29a of a plurality of odd numbers and a plurality of even number.The row interbody spacer d1 of the data brace 29a of the odd number of alternate configurations and the data brace 29b of even number, though be not limited thereto, do not associate and two signal applying unit 387a, the 387b (with reference to Figure 20) of following explanation between on the relation of desired certain intervals d2, be more than the 0.5mm, be preferably about 0.6mm.On the other hand, the maximum upper limit of row interbody spacer d1 is by the size decision of non-display area.
Data brace 29 can use aluminium, chromium, molybdenum or their alloy etc., also can multilayer.Data brace 29 is provided as width usually and broadens than data line 27 (with reference to Figure 19), is formed with data brace contact opening 32 (with reference to Figure 22) at middle section.Data brace contact opening 32 is covered by the transparency electrode 33 (Figure 22) that is made of ITO (indium tin oxide) or IZO (indium-zinc oxide).Transparency electrode 33 forms by data brace contact opening 32 and links with data brace 29.
The gate line 24 that extends to non-display area from the viewing area is linked to interval between each line and is formed on while narrowing down on the grid brace 26 in the non-display area.Grid brace 26 constitutes 2 row as the different mutually row of even number and odd number, with the grid brace 26a of a plurality of odd numbers of alternate configurations and the grid brace 26b formation of a plurality of even number.The grid brace 26a of the odd number of alternate configurations and the row interbody spacer (not shown) of the grid brace 26b of even number also the row interbody spacer d1 with the data brace 29b of the data brace 29a of the odd number of alternate configurations and even number are identical, but also can be different intervals.
Grid brace 26, with data brace 29 similarly, be provided as width and broaden than gate line 24, be formed with grid brace contact opening (not shown) at middle section.Grid brace contact opening (not shown) is covered by the transparency electrode (not shown) that is made of ITO or IZO.Transparency electrode (not shown) forms by grid brace contact opening (not shown) and links with grid brace 26.
According to the display panels 11 of embodiments of the present invention, just can constitute to have and check the testing fixture of the display panels of each 2 signal applying unit 26a of signal, 26b, 29a, 29b applying different mutually inversion driving between the adjacent signal wire 24,27 of aftermentioned with above structure.With this, have or not bad between signal wire or pixel because also can detect effectively, so can improve the bad inspection speed and the bad detectability of display panels 11.
Below, with reference to Figure 20, be the testing fixture that the center illustrates the display panels of the 4th embodiment of the present invention with difference with the testing fixture of the display panels of first embodiment of the present invention.Figure 20 is the rear view of contact portion of testing fixture of the display panels of the 4th embodiment of the present invention.
As Figure 18 and shown in Figure 19, dispose grid brace 26 and the data brace 29 that is formed in the non-display area thin film transistor base plate 21 each 2 row of display panels 11, and have interval d1 certain between row.Thereby, as shown in figure 20, in the testing fixture of the display panels of the 4th embodiment of the present invention, the contact portion 381 that secondary signal applies second contact component 370 of assembly 350 is provided as has main part 382 and a pair of signal applying unit 387, and described a pair of signal applying unit 387 has certain interval d2 in the place ahead of the lower surface of main part 382.
Signal applying unit 387 has the first signal applying unit 387a and secondary signal applying unit 387b, checks signal so that apply different mutually inversion driving between the adjacent data line 27 that belongs to each data brace module 61 to 66.Even be contacted with the transparency electrode 33 on the top of data brace 29 respectively for two signal applying unit 387a, 387b contact area is increased with different row, prevent that also two signal applying unit 387a, 387b from being linked the situation that different mutually inversion driving inspection signals is mixed mutually, the interval d2 of the first signal applying unit 387a and secondary signal applying unit 387b is more than the 0.5mm, is preferably about 0.6mm.On the other hand, main part 382 is provided as non-conductive material, so that do not mix mutually as the electric signal of the inspection signal of two signal applying unit 387a, 387b.
Similarly, the signal applying unit 347 (with reference to Figure 21) that first signal applies the contact portion (not shown) of assembly 310 also is equipped with the 3rd signal applying unit 347a and the 4th signal applying unit 347b, checks signal so that apply different mutually inversion driving between the adjacent gate lines 24 that belongs to each grid brace module 46 to 48.
On the other hand, the probe 584 of probe assembly 500 also is provided as 2 row, so that can one by one be contacted with grid brace 26 and the data brace 29 that is provided as 2 row respectively.
As Figure 21 and shown in Figure 22, utilized the inspection method of testing fixture of the display panels of the 4th embodiment of the present invention, except passing through to use to adjacent gate lines 24 and data line 27 respectively mutual different 2 signal applying units 347,387, check signal to applying different mutually inversion driving between the adjacent signal wire 24,27, check to have or not outside display panels 11 bad, identical with the inspection method of the testing fixture of the display panels that has utilized first embodiment of the present invention.Figure 21 is illustrated in the inspection method of testing fixture of the display panels that has utilized the 4th embodiment of the present invention, the signal applying unit is contacted with the front elevation of the display panels of the state on the signal wire brace of display panels, and Figure 22 is the thin film transistor base plate of display panels of XVI-XVI line of Figure 21 and the sectional view of signal applying unit.
The testing fixture of the display panels by the 4th embodiment of the present invention and the inspection method of having utilized the display panels of this testing fixture also can obtain and the testing fixture of the display panels of first embodiment of the present invention and the identical effect of inspection method of having utilized the display panels of this testing fixture.Again, check this mode of signal, following effect is arranged: also can check the bad of the short circuit that has or not between adjacent signals line 24,27 and neighbor etc. effectively by applying inversion driving.
On the other hand, if each the signal wire brace 26,29 that is formed in the non-display area of thin film transistor base plate 21 of liquid crystal display substrate 11 constitutes the above situation of 3 row, then each signal applies assembly 310,350 and can have and apply respectively the signal applying unit (not shown) that is parallel to each other more than 3 of different inspection signals mutually.Under this situation, the probe 584 of probe assembly 500 also is provided as respectively more than 3 row.
Below, with reference to Figure 23 and Figure 24 the testing fixture of display panels of the 5th embodiment of the present invention and the 6th embodiment and the inspection method of having utilized the display panels of this testing fixture are described respectively.Figure 23 and Figure 24 are illustrated in the inspection method of display panels of testing fixture of the display panels that has utilized the 5th embodiment of the present invention and the 6th embodiment, and the signal applying unit is contacted with the front elevation of the display panels of the state on the signal wire brace of display panels.
The testing fixture of the display panels of the 5th embodiment of the present invention and the 6th embodiment and the inspection method of having utilized the display panels of this testing fixture, apply the signal applying unit 348 of assembly 310 except first signal, 349 and secondary signal apply the signal applying unit 388 of assembly 350,389 with each 2 signal applying unit 348a, 348b, 349a, 349b, 388a, 388b, 389a, 389b constitutes, with this, also can easily check and have or not adjacent signals line 24,27 and neighbor between short circuit etc. bad outside, with the testing fixture of the display panels of second embodiment of the present invention and the 3rd embodiment and utilized the inspection method of display panels of this testing fixture identical.
The testing fixture of the display panels by the 5th embodiment of the present invention and the 6th embodiment and the inspection method of having utilized the display panels of this testing fixture also can obtain and the testing fixture of the display panels of the 4th embodiment of the present invention and the identical effect of inspection method of having utilized the display panels of this testing fixture.
Above embodiment can diversely change.In above-mentioned embodiment of the present invention, signal wire brace at display panels 10,11 omits grid brace 25,26, only under the situation with 28,29 formation of data brace, signal applies assembly 300 can only apply assembly 350 formations with secondary signal, and the probe member 520 of probe assembly 500 also can only constitute with second probe member 570.
On the other hand, in the above-described embodiment, contact component 330,370 and probe member 530,570 also can utilize each support 372,572 of mutual change and linking part 374,574 to come the change of location relation.Utilize change, probe member 530,570 is positioned at 2 sides of the support 154 of worktable 150, the perhaps lower surface of the substrate 152 of worktable 150, and contact component 330,370 is fixed on the support plate 510, is positioned at the top of worktable 150.
On the other hand, in the above-described embodiment, illustrated that after having removed short bar signal applying unit 344 to 349,384 to 389 is contacted with grid brace 25,26 and data brace 28,29 respectively and applies this situation of detection signal, but is not limited thereto.Promptly, also can: after having utilized the visual examination that is linked to the grid brace 25,26 that prolongs from signal wire 24,27 separately and the short bar on the data brace 28,29 and carries out, do not remove short bar, but signal applying unit 344 to 349,384 to 389 is contacted with on each signal wire brace 25,26,28,29 at once, apply bad inspection signal.
Again, probe assembly 500 and the 3rd travel mechanism 800 also can separate from the testing fixture of the display panels of above-mentioned embodiment of the present invention and be equipped with in addition.
On the other hand, the inspection method of the testing fixture of the display panels that has utilized first embodiment to the, six embodiments of the present invention has been described, the inspection method of the display panels in the above-mentioned embodiment but of the present invention is not limited thereto, and can certainly utilize the testing fixture with other structure to carry out the inspection method of display panels of the present invention.
More than, illustrate several embodiments of the present invention, if but have those of ordinary skills of the general general knowledge of the technical field of the invention, then can know and under the prerequisite that does not break away from principle of the present invention or spirit, can change present embodiment.Thereby scope of the present invention is by the scope and the equivalent decision thereof of appended claims.

Claims (34)

1. the testing fixture of a display panels wherein, has:
Worktable, it installs display panels, and this display panels comprises many signal line and the many signal line brace that links with these many signal line respectively;
Check and use back light unit that light is supplied with at its back side to the described display panels of installation;
At least one contact portion, it applies single inspection signal at least 2 described signal wire braces.
2. the testing fixture of display panels as claimed in claim 1 wherein, also comprises the probe portion that described many signal line brace is applied the independent check signal respectively.
3. the testing fixture of display panels as claimed in claim 1, wherein, described signal wire brace comprises the either party at least in grid brace and the data brace.
4. the testing fixture of display panels as claimed in claim 1, wherein, described signal wire brace comprises the grid brace, described contact portion applies single inspection signal to the grid brace of integral body.
5. the testing fixture of display panels as claimed in claim 1, wherein, described signal wire brace comprises the data brace, described contact portion applies single inspection signal to the data brace of integral body.
6. the testing fixture of display panels as claimed in claim 1, wherein, described signal wire brace is divided into a plurality of modules, and described contact portion is made of a plurality of accordingly with these a plurality of modules.
7. the testing fixture of display panels as claimed in claim 1, wherein, described contact portion comprises with described signal wire brace and contacts and apply the signal applying unit of checking signal.
8. the testing fixture of display panels as claimed in claim 7, wherein, described signal applying unit is a rod shape.
9. the testing fixture of display panels as claimed in claim 1, wherein,
Described many signal line brace is the multiple row alternate configurations,
Described contact portion has:
The first signal applying unit, its signal wire brace with a plurality of odd numbers that are configured to row contacts;
The secondary signal applying unit, itself and the described first signal applying unit are certain compartment of terrain and separate side by side, this secondary signal applying unit contacts with the signal wire of a plurality of even number, and the signal wire of these a plurality of even number and the signal wire brace of described odd number are certain spaced and parallel one row configuration.
10. the testing fixture of display panels as claimed in claim 1 wherein, also comprises:
Conveying assembly, it is transported to described display panels on the described worktable;
First travel mechanism, it makes at relatively move between approximated position and the separation point position mutually described display panels and described worktable and installs or separation.
11. the testing fixture of display panels as claimed in claim 10, wherein,
Described contact portion is provided at least one side's side of described worktable,
Also be included in second travel mechanism of relatively move between mutual approximated position and the separation point position described contact portion and described worktable.
12. the testing fixture of display panels as claimed in claim 11, wherein, described contact portion utilizes described second travel mechanism to move to the side or the back side that the separation point position is described worktable.
13. the testing fixture of display panels as claimed in claim 2, wherein, described probe portion is provided to the top of described worktable, also is included in the 3rd travel mechanism of relatively move between mutual approximated position and the separation point position described probe portion and described worktable.
14. the testing fixture of display panels as claimed in claim 13 wherein, also comprises a pair of Polarizer on the top of the top that one by one is provided to described back light unit respectively and described probe portion.
15. the testing fixture of a display panels wherein, has contact portion, described contact portion has:
The first signal applying unit, its signal wire brace with a plurality of odd numbers that are configured to row contacts;
The secondary signal applying unit, itself and the described first signal applying unit are certain compartment of terrain and separate side by side, this secondary signal applying unit contacts with the signal wire of a plurality of even number, and the signal wire of these a plurality of even number and the signal wire brace of described odd number are certain spaced and parallel one row configuration.
16. the testing fixture of display panels as claimed in claim 15, wherein, being spaced apart more than the 0.5mm between described first signal applying unit and the described secondary signal applying unit.
17. the testing fixture of display panels as claimed in claim 15, wherein, described signal wire brace is the either party at least in grid brace and the data brace.
18. the testing fixture of display panels as claimed in claim 15, wherein, described contact portion also comprises the main part of fixing described first signal applying unit and described secondary signal applying unit.
19. the inspection method of a display panels wherein, has:
The display panels of a plurality of signal wire braces that will comprise many signal line and link with these many signal line respectively is installed on the step on the worktable;
The step that the signal applying unit that applies single inspection signal is contacted with described signal wire brace more than at least two;
Described signal applying unit applies single inspection signal, detects the bad step that has or not described signal wire.
20. the inspection method of display panels as claimed in claim 19 wherein, has or not in the bad step of described signal wire in detection, comprises the step of the resistance view picture of measuring described display panels.
21. the inspection method of display panels as claimed in claim 19 wherein, in the bad detection step of described signal wire, comprises that the resistance separately of measuring described signal wire judges whether described signal wire resistance separately belongs to the step of appropriate area.
22. the inspection method of display panels as claimed in claim 19, wherein, described signal applying unit with before described signal wire brace contacts, comprises that also mutual electricity separates the step of described a plurality of signal wire braces.
23. the inspection method of display panels as claimed in claim 19, wherein, described signal wire brace comprises the grid brace, and described signal applying unit contacts with the grid brace of integral body.
24. the inspection method of display panels as claimed in claim 19, wherein, described signal wire brace comprises the data brace, and described signal applying unit contacts with the data brace of integral body.
25. the inspection method of display panels as claimed in claim 19 wherein, is utilized the bad detection of described signal applying unit that described signal wire brace is divided into a plurality of modules and is carried out.
26. the inspection method of display panels as claimed in claim 25, wherein, described signal applying unit is provided to respectively on the described module.
27. the inspection method of display panels as claimed in claim 19 wherein, after utilizing described signal applying unit detection to have or not bad detection step, also comprises applying the step of independently checking signal to detecting bad described signal wire.
28. the inspection method of display panels as claimed in claim 19, wherein, described signal wire brace is the multiple row alternate configurations from described many signal line prolongations respectively, applies different inspection signal mutually between the signal wire brace of described signal applying unit to described alternate configurations.
29. the inspection method of display panels as claimed in claim 28, wherein,
Described signal wire brace comprises the data brace,
Described signal applying unit comprises:
The first signal applying unit that contacts with the described data brace of odd number;
The secondary signal applying unit that contacts with the described data brace of even number.
30. the inspection method of display panels as claimed in claim 29, wherein,
Described signal wire brace comprises the grid brace,
Described signal applying unit also comprises:
The 3rd signal applying unit that contacts with the described grid brace of odd number;
The 4th signal applying unit that contacts with the described grid brace of even number.
31. the inspection method of display panels as claimed in claim 30 wherein, after utilizing described signal applying unit to detect to have or not bad detection step, also comprises applying the step of independent detection signal to detecting bad described signal wire.
32. a display panels wherein, also comprises:
Insulated substrate, it has the viewing area of the signal wire definition that is intersected by insulation and the non-display area that the outline in this viewing area forms;
A plurality of signal wire braces, it is from described signal wire prolongation and be formed on described non-display area, is the multiple row alternate configurations.
33. display panels as claimed in claim 32, wherein, described signal wire brace is the either party at least in grid brace and the data brace.
34. display panels as claimed in claim 32, wherein, the row interbody spacer of the signal wire brace of described alternate configurations is more than the 0.5mm.
CNA2006100752282A 2005-04-15 2006-04-17 Liquid crystal display panel, testing fixture and testing method therefor Pending CN1847930A (en)

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KR20050031528 2005-04-15
KR1020050031528A KR20060109194A (en) 2005-04-15 2005-04-15 Testing method of liquid crystal display panel
KR20050095151 2005-10-10
KR20050123420 2005-12-14

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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101169528B (en) * 2007-11-28 2010-06-09 庄添财 Liquid crystal display screen on-line manufacture process and its apparatus
CN103728505A (en) * 2012-10-15 2014-04-16 日本麦可罗尼克斯股份有限公司 Detection device
CN105974237A (en) * 2016-06-16 2016-09-28 昆山金箭机械设备有限公司 Testing mechanism of liquid crystal screen testing equipment
CN106910443A (en) * 2017-02-27 2017-06-30 上海天马微电子有限公司 A kind of detection method of display panel and display panel
CN107132233A (en) * 2017-05-25 2017-09-05 京东方科技集团股份有限公司 The checking method and system of bad coordinate position in display panel
CN108538742A (en) * 2014-08-01 2018-09-14 日东电工株式会社 Virtual terminal unit

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101169528B (en) * 2007-11-28 2010-06-09 庄添财 Liquid crystal display screen on-line manufacture process and its apparatus
CN103728505A (en) * 2012-10-15 2014-04-16 日本麦可罗尼克斯股份有限公司 Detection device
CN103728505B (en) * 2012-10-15 2016-06-22 日本麦可罗尼克斯股份有限公司 Check device
CN108538742A (en) * 2014-08-01 2018-09-14 日东电工株式会社 Virtual terminal unit
CN105974237A (en) * 2016-06-16 2016-09-28 昆山金箭机械设备有限公司 Testing mechanism of liquid crystal screen testing equipment
CN106910443A (en) * 2017-02-27 2017-06-30 上海天马微电子有限公司 A kind of detection method of display panel and display panel
CN107132233A (en) * 2017-05-25 2017-09-05 京东方科技集团股份有限公司 The checking method and system of bad coordinate position in display panel
CN107132233B (en) * 2017-05-25 2020-06-12 京东方科技集团股份有限公司 Method and system for verifying bad coordinate position in display panel

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