CN110007215A - A kind of open circuit short circuit electric measuring method of FPC - Google Patents
A kind of open circuit short circuit electric measuring method of FPC Download PDFInfo
- Publication number
- CN110007215A CN110007215A CN201910363835.6A CN201910363835A CN110007215A CN 110007215 A CN110007215 A CN 110007215A CN 201910363835 A CN201910363835 A CN 201910363835A CN 110007215 A CN110007215 A CN 110007215A
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- circuit
- fpc
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- elongated area
- test
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
- G01R31/2812—Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
The present invention relates to FPC manufacturing fields, disclose the open circuit short circuit electric measuring method of FPC a kind of, it mainly comprises the steps that (1) FPC increases short-circuit elongated area: short-circuit elongated area being set towards plate outside direction in the golden finger of FPC, the heterogeneous networks of FPC are shorted two-by-two in the short circuit elongated area, make the series network being shorted two-by-two at a series network；(2) open test: probe is set at the pad end at the both ends of series network, tests whether the series network opens a way；(3) FPC removes short-circuit elongated area: after open test is qualified, slotting in the short-circuit elongated area of FPC, removes short-circuit elongated area or separate short-circuit elongated area with FPC, while series network is reverted to two heterogeneous networks；(4) probe is arranged at the pad end of adjacent networks in short-circuit test, and test adjacent networks are with the presence or absence of short circuit.Electric measuring method of the invention avoids the test leakage of FPC open circuit and short circuit, while maximumlly avoiding waste of material, high reliablity, and manufacturing cost is low.
Description
Technical field
The present invention relates to FPC manufacturing field more particularly to the open circuit short circuit electric measuring methods of FPC a kind of.
Background technique
The flexible circuit board (Flexible Printed Circuit) (abbreviation FPC) of conventional belt golden finger at present, will
Golden finger is asked to do on off test, to guarantee the gate oxide integrity in golden finger to plate between other routes.Due to the golden hand of FPC
Refer to and its lead line design width is generally smaller, generally in 0.07mm-0.15mm or so, can not directly be surveyed using probe
Examination, it is necessary to be provided with testing weld pad on the network that golden finger is connected and tested so that probe is arranged, for convenient for be arranged probe,
The size of testing weld pad is usually 0.3mm-1mm.
FPC product example as shown in Figure 1, routinely there is following two electrical measurement scheme.
Conventional electrical measurement scheme 1: as shown in Figure 2, Figure 3 and Figure 4, conducting resinl 30 is arranged in golden finger area 11 of the jig in FPC,
Keep golden finger short-circuit, probe is set in the pad of test 22 at this time, carries out open test, when testing result expression is not detected
When open circuit, indicate that each route is not opened a way.Then the conducting resinl of jig 30 is returned, short-circuit test is carried out, to detect phase
Whether adjacent line road is short-circuit.But there are the following problems for this electrical measurement scheme: if be consolidated network there are two golden finger, using leading
Electric glue scheme can make the network form a loop checking installation, as shown in figure 4, have open lines at one in loop at this time, the open circuit
Point 23 will be unable to be come out by electrical measurement.
Conventional electrical measurement scheme 2: as shown in Figure 1 and Figure 5, will be golden in FPC design for target FPC as shown in Figure 1
Testing weld pad 42 is arranged towards extension outside plate, and in extended segment 41 in finger end, in favor of probe is arranged for the extended segment of golden finger, from
And realize that the both ends of route are designed with testing weld pad 42, extended segment 41 is washed out by mold after the completion of test, be allowed to most
Whole FPC product separation.But this method (1) needs to increase a large amount of testing weld pad 42, and golden finger needs longer extension thus
Section 41 will be increased the waste of FPC material, reduced the utilization rate of material with reasonable layout testing weld pad.(2) extension of golden finger
Segment length is longer, increases short-circuit risks, and the short circuit of the extended segment of golden finger will cause the mistake of actual product to survey, it is good to reduce product
Rate.
Therefore, those skilled in the art is dedicated to developing the open circuit short circuit electric measuring method of novel FPC a kind of, to reduce
It accidentally surveys, test leakage, provides product yield, while FPC waste of material will not be obviously increased.
Summary of the invention
In view of the above drawbacks of the prior art, the object of the present invention is to provide the open circuit short circuit electric measuring method of FPC a kind of,
To reduce accidentally survey, test leakage, product yield is provided, while FPC waste of material will not be obviously increased.
To achieve the above object, the present invention provides the open circuit short circuit electric measuring methods of FPC a kind of, comprising the following steps:
(1) FPC increases short-circuit elongated area: short-circuit elongated area is arranged towards plate outside direction in the golden finger of FPC, at this
The different networks of FPC are shorted by short-circuit elongated area two-by-two, make the series network being shorted two-by-two at a series network；
(2) open test: probe is set at the pad end at the both ends of series network, tests whether the series network opens a way；
(3) FPC removes short-circuit elongated area: after open test is qualified, slotting in the short-circuit elongated area of FPC, by FPC
Network separated with the network of short-circuit elongated area, while series network is reverted into two heterogeneous networks；
(4) probe is arranged at the pad end of adjacent networks in short-circuit test, and test adjacent networks are with the presence or absence of short circuit.
Further, the width of the short-circuit elongated area is 1mm-5mm.
Further, the diameter of the pad is more than or equal to 0.3mm.
Relative to the open circuit short circuit electric measuring method of existing FPC, the open circuit and short circuit test method of FPC of the invention are kept away
The test leakage for having exempted from FPC open circuit and short circuit, while maximumlly avoiding waste of material, high reliablity, and manufacturing cost is low.
Detailed description of the invention
Fig. 1 is an example of FPC；
Fig. 2 is the FPC of Fig. 1 using the open test schematic diagram of conventional electrical measurement scheme 1；
Fig. 3 is the FPC of Fig. 1 using the short-circuit test schematic diagram of conventional electrical measurement scheme 1；
Fig. 4 is the FPC of Fig. 1 using the open test schematic diagram of problems of conventional electrical measurement scheme 1；
Fig. 5 is the FPC of Fig. 1 using the open circuit short-circuit test schematic diagram of conventional electrical measurement scheme 2；
Fig. 6 is that the FPC of Fig. 1 uses the open test schematic diagram of electric measuring method of the invention；
Fig. 7 is that the FPC of Fig. 1 uses the removal short circuit elongated area schematic diagram of electric measuring method of the invention；
Fig. 8 is that the FPC of Fig. 1 uses the short-circuit test schematic diagram of electric measuring method of the invention.
Specific embodiment
To further illustrate that each embodiment, the present invention are provided with attached drawing.These attached drawings are that the invention discloses one of content
Point, mainly to illustrate embodiment, and the associated description of specification can be cooperated to explain the operation principles of embodiment.Cooperation ginseng
These contents are examined, those of ordinary skill in the art will be understood that other possible embodiments and advantages of the present invention.In figure
Component be not necessarily to scale, and similar component symbol is conventionally used to indicate similar component.
Now in conjunction with the drawings and specific embodiments, the present invention is further described.
As shown in Fig. 1, Fig. 6, Fig. 7 and Fig. 8, the invention discloses the open circuit short circuit electric measuring methods of FPC a kind of, to detect such as
For FPC shown in FIG. 1, flexible circuit board 10 is divided for golden finger area 11 and other regions, and flexible circuit board 10 includes a plurality of
Network specifies the network 20A and network 20B on FPC, network 20A and network 20B are that heterogeneous networks are also for convenience of description
Adjacent networks, network 20A are equipped with golden finger 21A in the golden finger area 11 of flexible circuit board 10, are equipped with pad in other regions
The golden finger 21A of the golden finger 21B and network 20A of 22A, network 20B are adjacent, comprising the following steps:
(1) FPC increases short-circuit elongated area: short-circuit elongated area is arranged towards plate outside direction in the golden finger area of FPC
50, FPC heterogeneous networks are shorted two-by-two in the short circuit elongated area 50, two gold as corresponding to heterogeneous networks 20A, 20B
Finger 21A, 21B draw to outside plate and are shorted in short-circuit elongated area 50, short-circuit elongated area 50 such as the dotted line frame institute in Fig. 5
Show, two heterogeneous networks 20A, the 20B is made to be connected into a network.To all networks equipped with golden finger, can according to its
The distribution of FPC, golden finger are connected between heterogeneous networks two-by-two to short-circuit 50 lead of elongated area.
(2) open test: probe is arranged in pad 22A, 22B at the both ends of series network, whether tests the series network
Open circuit.Whether all series networks for successively detecting FPC by this way open a way.As shown in Figure 6.
(3) FPC removes short-circuit elongated area: after open test is qualified, in 50 internal recessing of short-circuit elongated area of FPC,
Remove short-circuit elongated area 50 or separate short-circuit elongated area 50 with FPC, series network revert to two heterogeneous networks 20A,
20B, as shown in Figure 7.
(4) short-circuit test is tested for adjacent networks, is such as arranged in pad 22A, 22B of adjacent networks 20A, 20B
Probe, test adjacent networks 20A, 20B check all adjacent networks two-by-two on FPC with the presence or absence of short circuit according to this, such as scheme
Shown in 8.
Open test and short-circuit test, specifically, serially test or concurrent test can be used.Such as successively by two probes
The pad end for touching adjacent networks carries out serially test, and it is in need can also to touch one by one institute by ICT test fixture setting probe
The pad of test network carries out concurrent test.
For manufacture easy to produce, it is preferred that the width of short-circuit elongated area is 1mm-5mm, and the diameter of pad is more than or equal to
0.3mm。
The open circuit short circuit electric measuring method of FPC of the invention avoids the test leakage of FPC open circuit and short circuit, while maximized
Avoid waste of material, high reliablity, manufacturing cost is low.
Although specifically showing and describing the present invention in conjunction with preferred embodiment, those skilled in the art should be bright
It is white, it is not departing from the spirit and scope of the present invention defined by the appended claims, it in the form and details can be right
The present invention makes a variety of changes, and is protection scope of the present invention.
Claims (3)
1. the open circuit short circuit test method of FPC a kind of, it is characterised in that: the following steps are included:
(1) FPC increases short-circuit elongated area: short-circuit elongated area is arranged towards plate outside direction in the golden finger of FPC, in the short circuit
The heterogeneous networks of FPC are shorted by elongated area two-by-two, make the series network being shorted two-by-two at a series network；
(2) open test: probe is set at the pad end at the both ends of series network, tests whether the series network opens a way；
(3) FPC removes short-circuit elongated area: after open test is qualified, slot in the short-circuit elongated area of FPC, removal short circuit
Elongated area separates short-circuit elongated area with FPC, while series network is reverted to two heterogeneous networks；
(4) probe is arranged at the pad end of adjacent networks in short-circuit test, and test adjacent networks are with the presence or absence of short circuit.
2. the open circuit short circuit test method of FPC as described in claim 1, it is characterised in that: the width of the short circuit elongated area
Degree is 1mm-5mm.
3. the open circuit short circuit test method of FPC as described in claim 1, it is characterised in that: the diameter of the pad be greater than etc.
In 0.3mm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910363835.6A CN110007215B (en) | 2019-04-30 | 2019-04-30 | Open-circuit short-circuit electrical testing method for FPC |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910363835.6A CN110007215B (en) | 2019-04-30 | 2019-04-30 | Open-circuit short-circuit electrical testing method for FPC |
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| Publication Number | Publication Date |
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| CN110007215A true CN110007215A (en) | 2019-07-12 |
| CN110007215B CN110007215B (en) | 2021-05-28 |
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| CN201910363835.6A Active CN110007215B (en) | 2019-04-30 | 2019-04-30 | Open-circuit short-circuit electrical testing method for FPC |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113346264A (en) * | 2021-06-07 | 2021-09-03 | 深圳市木王智能科技有限公司 | High intensive PCB keysets |
| CN116381451A (en) * | 2023-03-03 | 2023-07-04 | 珠海芯烨电子科技有限公司 | Testing device and method for welding open-circuit single-ended planting needle based on thermosensitive piece |
| CN117687858A (en) * | 2024-01-31 | 2024-03-12 | 苏州元脑智能科技有限公司 | Method and system for detecting assembly of expansion card, electronic equipment and readable storage medium |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201066955Y (en) * | 2007-06-26 | 2008-05-28 | 比亚迪股份有限公司 | A flexible printed line board |
| CN101236310A (en) * | 2007-01-30 | 2008-08-06 | De&T株式会社 | Method and apparatus for detecting display panel |
| CN102378486A (en) * | 2010-08-09 | 2012-03-14 | 三星电机株式会社 | Printed circuit board and method for manufacturing the same |
| CN105307392A (en) * | 2015-10-16 | 2016-02-03 | 武汉华星光电技术有限公司 | Printed circuit board and electronic equipment |
| CN106658947A (en) * | 2016-12-30 | 2017-05-10 | 上海天马有机发光显示技术有限公司 | Flexible circuit board and display panel |
| CN206402518U (en) * | 2017-01-07 | 2017-08-11 | 江西凯强实业有限公司 | A kind of Wiring structure of FPC wiring boards |
-
2019
- 2019-04-30 CN CN201910363835.6A patent/CN110007215B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101236310A (en) * | 2007-01-30 | 2008-08-06 | De&T株式会社 | Method and apparatus for detecting display panel |
| CN201066955Y (en) * | 2007-06-26 | 2008-05-28 | 比亚迪股份有限公司 | A flexible printed line board |
| CN102378486A (en) * | 2010-08-09 | 2012-03-14 | 三星电机株式会社 | Printed circuit board and method for manufacturing the same |
| CN105307392A (en) * | 2015-10-16 | 2016-02-03 | 武汉华星光电技术有限公司 | Printed circuit board and electronic equipment |
| CN106658947A (en) * | 2016-12-30 | 2017-05-10 | 上海天马有机发光显示技术有限公司 | Flexible circuit board and display panel |
| CN206402518U (en) * | 2017-01-07 | 2017-08-11 | 江西凯强实业有限公司 | A kind of Wiring structure of FPC wiring boards |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113346264A (en) * | 2021-06-07 | 2021-09-03 | 深圳市木王智能科技有限公司 | High intensive PCB keysets |
| CN116381451A (en) * | 2023-03-03 | 2023-07-04 | 珠海芯烨电子科技有限公司 | Testing device and method for welding open-circuit single-ended planting needle based on thermosensitive piece |
| CN117687858A (en) * | 2024-01-31 | 2024-03-12 | 苏州元脑智能科技有限公司 | Method and system for detecting assembly of expansion card, electronic equipment and readable storage medium |
| CN117687858B (en) * | 2024-01-31 | 2024-04-30 | 苏州元脑智能科技有限公司 | Method and system for detecting assembly of expansion card, electronic equipment and readable storage medium |
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| CN110007215B (en) | 2021-05-28 |
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