CN103776580B - 半导体传感器器件的封装及其方法 - Google Patents

半导体传感器器件的封装及其方法 Download PDF

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Publication number
CN103776580B
CN103776580B CN201310488957.0A CN201310488957A CN103776580B CN 103776580 B CN103776580 B CN 103776580B CN 201310488957 A CN201310488957 A CN 201310488957A CN 103776580 B CN103776580 B CN 103776580B
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China
Prior art keywords
gel
lid
pressure sensor
gel layer
sensor according
Prior art date
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Application number
CN201310488957.0A
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English (en)
Chinese (zh)
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CN103776580A (zh
Inventor
L·M·希金斯三世
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NXP USA Inc
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NXP USA Inc
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Publication of CN103776580A publication Critical patent/CN103776580A/zh
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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L19/00Details of, or accessories for, apparatus for measuring steady or quasi-steady pressure of a fluent medium insofar as such details or accessories are not special to particular types of pressure gauges
    • G01L19/0061Electrical connection means
    • G01L19/0069Electrical connection means from the sensor to its support
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L19/00Details of, or accessories for, apparatus for measuring steady or quasi-steady pressure of a fluent medium insofar as such details or accessories are not special to particular types of pressure gauges
    • G01L19/06Means for preventing overload or deleterious influence of the measured medium on the measuring device or vice versa
    • G01L19/0627Protection against aggressive medium in general
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L19/00Details of, or accessories for, apparatus for measuring steady or quasi-steady pressure of a fluent medium insofar as such details or accessories are not special to particular types of pressure gauges
    • G01L19/06Means for preventing overload or deleterious influence of the measured medium on the measuring device or vice versa
    • G01L19/0627Protection against aggressive medium in general
    • G01L19/0636Protection against aggressive medium in general using particle filters
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48135Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
    • H01L2224/48137Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Measuring Fluid Pressure (AREA)
  • Pressure Sensors (AREA)
CN201310488957.0A 2012-10-22 2013-10-18 半导体传感器器件的封装及其方法 Active CN103776580B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/657,250 2012-10-22
US13/657,250 US8946833B2 (en) 2012-10-22 2012-10-22 Packaging for semiconductor sensor devices and methods

Publications (2)

Publication Number Publication Date
CN103776580A CN103776580A (zh) 2014-05-07
CN103776580B true CN103776580B (zh) 2018-01-12

Family

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Family Applications (1)

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CN201310488957.0A Active CN103776580B (zh) 2012-10-22 2013-10-18 半导体传感器器件的封装及其方法

Country Status (4)

Country Link
US (1) US8946833B2 (enExample)
EP (1) EP2722660B1 (enExample)
JP (1) JP6161201B2 (enExample)
CN (1) CN103776580B (enExample)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9476788B2 (en) * 2014-04-22 2016-10-25 Freescale Semiconductor, Inc. Semiconductor sensor with gel filled cavity
CN105300593B (zh) * 2014-07-28 2018-12-28 恩智浦美国有限公司 具有盖的封装的半导体传感器装置
DE102016201847A1 (de) * 2015-05-28 2016-12-01 Robert Bosch Gmbh Vorrichtung zur Erfassung eines Drucks eines fluiden Mediums und Verfahren zur Herstellung der Vorrichtung
US10244644B2 (en) * 2015-12-04 2019-03-26 Continental Automotive Systems, Inc. Automotive electronic device having a cover with fins to reduce gel vibration
CN108344530A (zh) * 2017-01-24 2018-07-31 英属开曼群岛商智动全球股份有限公司 力量传感器
US20180335360A1 (en) * 2017-05-16 2018-11-22 Honeywell International Inc. Ported Pressure Sensor With No Internally Trapped Fluid
US11225409B2 (en) 2018-09-17 2022-01-18 Invensense, Inc. Sensor with integrated heater
US10787361B2 (en) 2018-10-30 2020-09-29 Nxp Usa, Inc. Sensor device with flip-chip die and interposer
US11532532B2 (en) * 2019-05-08 2022-12-20 Nxp Usa, Inc. Composite media protection for pressure sensor
WO2022070571A1 (ja) * 2020-09-30 2022-04-07 株式会社村田製作所 圧力センサおよびその製造方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE29922992U1 (de) * 1999-12-30 2000-03-23 Aktiv-Sensor GmbH, 14532 Stahnsdorf Druckmesselement mit piezoresistiven Halbleiterelementen
CN1453565A (zh) * 2002-04-24 2003-11-05 B·布朗·梅尔松根有限公司 压力传感器
CN102183441A (zh) * 2011-02-18 2011-09-14 华东理工大学 一种软物质材料的表面粘附能和弹性模量的测量方法
CN102292024A (zh) * 2009-01-13 2011-12-21 于尔戈实验室 接触面压力测量系统
DE102010030960A1 (de) * 2010-07-06 2012-01-12 Robert Bosch Gmbh Verfahren zur Herstellung eines schwingungsgedämpften Bauteils

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FR2764113B1 (fr) 1997-05-28 2000-08-04 Motorola Semiconducteurs Dispositif capteur et son procede de fabrication
CN1213476C (zh) 1998-06-24 2005-08-03 约翰逊·马太电子公司 具有纤维接合层的电子器件
JP2000346736A (ja) 1999-06-02 2000-12-15 Saginomiya Seisakusho Inc 半導体式圧力センサ
US6401545B1 (en) * 2000-01-25 2002-06-11 Motorola, Inc. Micro electro-mechanical system sensor with selective encapsulation and method therefor
US6732590B1 (en) * 2002-11-20 2004-05-11 Infineon Technologies Ag Pressure sensor and process for producing the pressure sensor
ITMI20070099A1 (it) * 2007-01-24 2008-07-25 St Microelectronics Srl Dispositivo elettronico comprendente dispositivi sensori differenziali mems e substrati bucati
JP2009063352A (ja) 2007-09-05 2009-03-26 Nissan Motor Co Ltd ガス物理量検出装置,燃料電池システム,車両
JP2009103602A (ja) 2007-10-24 2009-05-14 Denso Corp 圧力センサ
US20100289055A1 (en) 2009-05-14 2010-11-18 Avago Technologies Ecbu Ip (Singapore) Pte. Ltd. Silicone leaded chip carrier
US8230743B2 (en) 2010-08-23 2012-07-31 Honeywell International Inc. Pressure sensor

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE29922992U1 (de) * 1999-12-30 2000-03-23 Aktiv-Sensor GmbH, 14532 Stahnsdorf Druckmesselement mit piezoresistiven Halbleiterelementen
CN1453565A (zh) * 2002-04-24 2003-11-05 B·布朗·梅尔松根有限公司 压力传感器
CN102292024A (zh) * 2009-01-13 2011-12-21 于尔戈实验室 接触面压力测量系统
DE102010030960A1 (de) * 2010-07-06 2012-01-12 Robert Bosch Gmbh Verfahren zur Herstellung eines schwingungsgedämpften Bauteils
CN102183441A (zh) * 2011-02-18 2011-09-14 华东理工大学 一种软物质材料的表面粘附能和弹性模量的测量方法

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
气压传感器中保护材料硅凝胶的优化设计;陈思远等;《传感器世界》;20070119(第01期);21-23 *

Also Published As

Publication number Publication date
EP2722660B1 (en) 2015-12-30
EP2722660A3 (en) 2014-04-30
US20140110801A1 (en) 2014-04-24
CN103776580A (zh) 2014-05-07
JP2014085337A (ja) 2014-05-12
JP6161201B2 (ja) 2017-07-12
US8946833B2 (en) 2015-02-03
EP2722660A2 (en) 2014-04-23

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