CN103630711B - 照相模组用测试座 - Google Patents

照相模组用测试座 Download PDF

Info

Publication number
CN103630711B
CN103630711B CN201310328354.4A CN201310328354A CN103630711B CN 103630711 B CN103630711 B CN 103630711B CN 201310328354 A CN201310328354 A CN 201310328354A CN 103630711 B CN103630711 B CN 103630711B
Authority
CN
China
Prior art keywords
cover frame
goods
base
great demand
camera module
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201310328354.4A
Other languages
English (en)
Chinese (zh)
Other versions
CN103630711A (zh
Inventor
金光壹
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MECA TECH SYSTEMS Co Ltd
Original Assignee
MECA TECH SYSTEMS Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MECA TECH SYSTEMS Co Ltd filed Critical MECA TECH SYSTEMS Co Ltd
Publication of CN103630711A publication Critical patent/CN103630711A/zh
Application granted granted Critical
Publication of CN103630711B publication Critical patent/CN103630711B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B43/00—Testing correct operation of photographic apparatus or parts thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Studio Devices (AREA)
  • Connecting Device With Holders (AREA)
CN201310328354.4A 2012-08-24 2013-07-31 照相模组用测试座 Expired - Fee Related CN103630711B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2012-0093307 2012-08-24
KR1020120093307A KR101199018B1 (ko) 2012-08-24 2012-08-24 카메라 모듈용 테스트 소켓

Publications (2)

Publication Number Publication Date
CN103630711A CN103630711A (zh) 2014-03-12
CN103630711B true CN103630711B (zh) 2018-04-06

Family

ID=47564228

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201310328354.4A Expired - Fee Related CN103630711B (zh) 2012-08-24 2013-07-31 照相模组用测试座

Country Status (2)

Country Link
KR (1) KR101199018B1 (ko)
CN (1) CN103630711B (ko)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101316818B1 (ko) * 2013-05-15 2013-10-10 프라임텍 주식회사 카메라모듈 검사용 소켓
EP3035282A4 (en) * 2013-09-11 2017-07-05 Sony Corporation Image processing device and method
KR101448961B1 (ko) 2013-09-30 2014-10-14 프라임텍 주식회사 Ⅴｃｍ 모듈 검사용 소켓
KR101442035B1 (ko) 2013-10-01 2014-09-25 디플러스(주) 카메라 모듈 테스트 장치
KR101357020B1 (ko) 2013-11-27 2014-02-05 주식회사 티씨에스 전자부품 테스트용 소켓
CN104062472A (zh) * 2014-07-03 2014-09-24 苏州创瑞机电科技有限公司 Fpc光学芯片模组自动测试插座
WO2016039493A1 (ko) * 2014-09-11 2016-03-17 주식회사 엔티에스 카메라모듈 검사장치
KR101611525B1 (ko) 2015-01-05 2016-04-14 디플러스(주) 제품 테스트 소켓
KR102400659B1 (ko) * 2015-06-15 2022-05-20 엘지이노텍 주식회사 카메라 모듈 검사 방법
KR101689521B1 (ko) 2015-08-26 2017-01-03 디플러스(주) 테스트 소켓
KR101786787B1 (ko) * 2015-12-29 2017-10-17 주식회사 엔티에스 카메라모듈 테스트소켓
KR101758844B1 (ko) * 2016-01-06 2017-07-26 에이엠티 주식회사 카메라 모듈 검사용 소켓
KR101887071B1 (ko) 2016-09-01 2018-09-10 리노공업주식회사 검사장치의 슬라이더 조작기구
CN108632602A (zh) * 2017-03-20 2018-10-09 宁波舜宇光电信息有限公司 摄像模组测试媒介模块、测试拼板及测试板
KR102047466B1 (ko) * 2017-04-27 2019-11-22 (주)이즈미디어 카메라모듈 검사용 소켓유닛
KR101897105B1 (ko) * 2017-05-24 2018-09-11 주식회사 엔티에스 카메라 모듈 유동방지형 테스트 소켓
KR102219472B1 (ko) * 2020-04-16 2021-02-24 디플러스(주) 제품 테스트 소켓

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100759081B1 (ko) * 2006-06-30 2007-09-19 주식회사 엔티에스 카메라모듈 검사용 소켓
KR20080105557A (ko) * 2007-05-31 2008-12-04 정영석 카메라 모듈 테스트용 소켓
KR100874851B1 (ko) * 2007-06-21 2008-12-18 (주)레이시스 휴대폰에 장착되는 카메라 모듈용 2 단 프로브 소켓
KR100901830B1 (ko) * 2008-09-20 2009-06-19 주식회사 메카텍시스템즈 플렉시블 회로기판 테스트 소켓
CN201364732Y (zh) * 2009-01-08 2009-12-16 白静 内圆固定式双面光盘盒

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101019417B1 (ko) 2008-09-03 2011-03-07 주식회사 엔티에스 카메라모듈 검사용 소켓
KR101006244B1 (ko) * 2008-09-03 2011-01-07 주식회사 엔티에스 카메라모듈 검사용 소켓
KR100898043B1 (ko) 2008-09-20 2009-05-18 주식회사 메카텍시스템즈 카메라 모듈용 테스트 소켓
KR100991162B1 (ko) 2008-11-25 2010-11-01 주식회사 엔티에스 카메라모듈의 이미지센서 검사용 소켓

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100759081B1 (ko) * 2006-06-30 2007-09-19 주식회사 엔티에스 카메라모듈 검사용 소켓
KR20080105557A (ko) * 2007-05-31 2008-12-04 정영석 카메라 모듈 테스트용 소켓
KR100874851B1 (ko) * 2007-06-21 2008-12-18 (주)레이시스 휴대폰에 장착되는 카메라 모듈용 2 단 프로브 소켓
KR100901830B1 (ko) * 2008-09-20 2009-06-19 주식회사 메카텍시스템즈 플렉시블 회로기판 테스트 소켓
CN201364732Y (zh) * 2009-01-08 2009-12-16 白静 内圆固定式双面光盘盒

Also Published As

Publication number Publication date
KR101199018B1 (ko) 2012-11-08
CN103630711A (zh) 2014-03-12

Similar Documents

Publication Publication Date Title
CN103630711B (zh) 照相模组用测试座
US6369595B1 (en) CSP BGA test socket with insert and method
KR101819706B1 (ko) 카메라모듈 테스트소켓
KR101804373B1 (ko) 블록교체형 카메라모듈 테스트소켓
KR101671798B1 (ko) 커넥터 연결을 위한 검사용 가압 지그
JP2008541415A5 (ko)
WO2020022051A1 (ja) 半導体用ｉｃソケット
CN208189625U (zh) 一种led光源的封装基板
US20170194732A1 (en) Access terminal for card socket
CN105393126A (zh) 摄像头模块检测用插口
JP6400984B2 (ja) 半導体装置検査用ソケット装置
CN104600489B (zh) Lga 插座装置、集成电路芯片组装件及相应方法
KR101928466B1 (ko) 검사용 소켓
KR20170074077A (ko) 카메라모듈 테스트소켓
TWI497838B (zh) 具有阻擋構件的測試插座
US20130084737A1 (en) Electrical connector
KR100795490B1 (ko) 반도체 소자 테스트 핸들러용 캐리어 모듈
KR101016019B1 (ko) Ｗｅｌｐ타입 패키지용 번-인 소켓
US20150323592A1 (en) Connector disengagement apparatus and inspection system for liquid crystal display module
US8062043B2 (en) Socket connector having stopping member engaging with latch
CN209658110U (zh) 一种便携式小型断路器
KR101067004B1 (ko) 반도체 패키지 캐리어
TWM303382U (en) Test jig with adjustment according to IC height
KR100570200B1 (ko) 반도체 소자 테스트 핸들러용 캐리어 모듈
CN209728120U (zh) 一种改进的单喇叭音箱pcb板测试装置

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20180406

Termination date: 20210731