CN103597739B - 一种用于实现至少一个与至少一个光伏器件可拆卸电接触的系统和方法 - Google Patents
一种用于实现至少一个与至少一个光伏器件可拆卸电接触的系统和方法 Download PDFInfo
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- CN103597739B CN103597739B CN201280024584.5A CN201280024584A CN103597739B CN 103597739 B CN103597739 B CN 103597739B CN 201280024584 A CN201280024584 A CN 201280024584A CN 103597739 B CN103597739 B CN 103597739B
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- 238000000034 method Methods 0.000 title claims abstract description 19
- 238000012360 testing method Methods 0.000 claims abstract description 37
- 239000000463 material Substances 0.000 claims abstract description 20
- 239000000725 suspension Substances 0.000 claims description 21
- 238000013016 damping Methods 0.000 claims description 18
- 238000004519 manufacturing process Methods 0.000 claims description 16
- 230000005611 electricity Effects 0.000 claims description 7
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 6
- 238000003754 machining Methods 0.000 claims description 6
- 239000004020 conductor Substances 0.000 claims description 5
- 230000000694 effects Effects 0.000 claims description 5
- 239000011701 zinc Substances 0.000 claims description 5
- 239000004033 plastic Substances 0.000 claims description 4
- 229920003023 plastic Polymers 0.000 claims description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 3
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 claims description 3
- 238000005266 casting Methods 0.000 claims description 3
- 238000001311 chemical methods and process Methods 0.000 claims description 3
- 229910052802 copper Inorganic materials 0.000 claims description 3
- 239000010949 copper Substances 0.000 claims description 3
- 229910052749 magnesium Inorganic materials 0.000 claims description 3
- 239000011777 magnesium Substances 0.000 claims description 3
- 238000003801 milling Methods 0.000 claims description 3
- 229910052759 nickel Inorganic materials 0.000 claims description 3
- 238000012545 processing Methods 0.000 claims description 3
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims description 2
- 238000003672 processing method Methods 0.000 claims description 2
- 229910052725 zinc Inorganic materials 0.000 claims description 2
- 239000000523 sample Substances 0.000 description 18
- 229910052751 metal Inorganic materials 0.000 description 14
- 239000002184 metal Substances 0.000 description 14
- 230000008859 change Effects 0.000 description 9
- 238000005516 engineering process Methods 0.000 description 9
- 238000013459 approach Methods 0.000 description 8
- 238000005452 bending Methods 0.000 description 5
- 239000011248 coating agent Substances 0.000 description 4
- 238000000576 coating method Methods 0.000 description 4
- 238000003384 imaging method Methods 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- 238000013461 design Methods 0.000 description 3
- 230000005489 elastic deformation Effects 0.000 description 3
- 230000007613 environmental effect Effects 0.000 description 3
- 238000001465 metallisation Methods 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 238000005299 abrasion Methods 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 238000000465 moulding Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 1
- 239000003082 abrasive agent Substances 0.000 description 1
- 230000004308 accommodation Effects 0.000 description 1
- 230000003466 anti-cipated effect Effects 0.000 description 1
- 239000013590 bulk material Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000004590 computer program Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000007850 degeneration Effects 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000005401 electroluminescence Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000004643 material aging Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 230000035882 stress Effects 0.000 description 1
- 238000001931 thermography Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2442—Contacts for co-operating by abutting resilient; resiliently-mounted with a single cantilevered beam
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06727—Cantilever beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R2201/00—Connectors or connections adapted for particular applications
- H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Photovoltaic Devices (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IN804DE2011 | 2011-03-23 | ||
| IN804/DEL/2011 | 2011-03-23 | ||
| PCT/IB2012/051316 WO2012127411A1 (fr) | 2011-03-23 | 2012-03-19 | Systèmes et procédés pour former au moins un contact électrique détachable avec au moins un dispositif photovoltaïque |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103597739A CN103597739A (zh) | 2014-02-19 |
| CN103597739B true CN103597739B (zh) | 2016-12-14 |
Family
ID=45992570
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201280024584.5A Expired - Fee Related CN103597739B (zh) | 2011-03-23 | 2012-03-19 | 一种用于实现至少一个与至少一个光伏器件可拆卸电接触的系统和方法 |
Country Status (6)
| Country | Link |
|---|---|
| EP (1) | EP2689258B1 (fr) |
| JP (1) | JP2014509088A (fr) |
| KR (1) | KR20140019804A (fr) |
| CN (1) | CN103597739B (fr) |
| TW (1) | TW201244117A (fr) |
| WO (1) | WO2012127411A1 (fr) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI607221B (zh) | 2012-07-20 | 2017-12-01 | 帕桑股份有限公司 | 一種用於測試光伏特裝置的測試裝置及方法 |
| JP5912156B2 (ja) * | 2014-07-28 | 2016-04-27 | 株式会社エヌ・ピー・シー | 発電出力測定用治具 |
| DE102015105975B4 (de) | 2015-04-20 | 2019-07-11 | h.a.l.m. elektronik GmbH | Kontaktierungsvorrichtung sowie Verfahren zum Messen einer Kenngröße einer Solarzelle |
| DE102017125626A1 (de) | 2017-11-02 | 2019-05-02 | Hanwha Q Cells Gmbh | Kontaktierungselement und Vorrichtung zum temporären Kontaktieren einer Solarzelle |
| JP2019140705A (ja) * | 2018-02-06 | 2019-08-22 | 三菱電機株式会社 | 太陽電池測定方法および太陽電池モジュール製造方法 |
| DE102018102840A1 (de) * | 2018-02-08 | 2019-08-08 | Wavelabs Solar Metrology Systems Gmbh | Vorrichtung zur elektrischen Kontaktierung einer Solarzelle bei der Messung elektrischer Kenndaten der Solarzelle und Verfahren zur Messung elektrischer Kenndaten einer Solarzelle |
| CN109347437A (zh) * | 2018-09-17 | 2019-02-15 | 江西展宇新能源股份有限公司 | 一种多主栅太阳电池测试装置 |
| KR102347628B1 (ko) * | 2019-10-15 | 2022-01-06 | (주)티에스이 | 쏠라셀 검사 장치 |
| DE102020117760A1 (de) * | 2020-07-06 | 2022-01-13 | Wavelabs Solar Metrology Systems Gmbh | Kontaktiervorrichtung, Solarzellentestvorrichtung und Lichtquelle |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0087776A2 (fr) * | 1982-02-25 | 1983-09-07 | University of Delaware | Procédé et dispositif pour augmenter la durée de vie et le rendement des dispositifs photovoltaiques à film mince |
| CN201359613Y (zh) * | 2009-01-19 | 2009-12-09 | 李毅 | 非晶硅太阳能电池的测试电极夹具 |
| CN101655511A (zh) * | 2008-08-19 | 2010-02-24 | 苏斯显微技术测试系统有限公司 | 用于临时电触点接通太阳能电池的探针 |
| CN101655539A (zh) * | 2008-08-19 | 2010-02-24 | 苏斯显微技术测试系统有限公司 | 用于临时电触点接通太阳能电池的方法和装置 |
| CN101688893A (zh) * | 2007-04-19 | 2010-03-31 | 奥尔利康贸易股份公司（特吕巴赫） | 用于薄膜太阳能电池模块的自动质量控制的测试设备 |
| CN101793945A (zh) * | 2010-03-12 | 2010-08-04 | 中国电子科技集团公司第四十五研究所 | 一种太阳能电池片的测试装置 |
| CN101926009A (zh) * | 2008-01-25 | 2010-12-22 | 应用材料股份有限公司 | 自动化太阳能电池电连接设备 |
| CN101975917A (zh) * | 2010-10-09 | 2011-02-16 | 中国电子科技集团公司第四十八研究所 | 一种用于测试晶体硅太阳能电池的电动测试台 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4640002A (en) * | 1982-02-25 | 1987-02-03 | The University Of Delaware | Method and apparatus for increasing the durability and yield of thin film photovoltaic devices |
-
2012
- 2012-03-15 TW TW101108763A patent/TW201244117A/zh unknown
- 2012-03-19 EP EP12715727.9A patent/EP2689258B1/fr not_active Withdrawn - After Issue
- 2012-03-19 JP JP2014500518A patent/JP2014509088A/ja active Pending
- 2012-03-19 KR KR1020137027606A patent/KR20140019804A/ko not_active Application Discontinuation
- 2012-03-19 CN CN201280024584.5A patent/CN103597739B/zh not_active Expired - Fee Related
- 2012-03-19 WO PCT/IB2012/051316 patent/WO2012127411A1/fr active Application Filing
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0087776A2 (fr) * | 1982-02-25 | 1983-09-07 | University of Delaware | Procédé et dispositif pour augmenter la durée de vie et le rendement des dispositifs photovoltaiques à film mince |
| CN101688893A (zh) * | 2007-04-19 | 2010-03-31 | 奥尔利康贸易股份公司（特吕巴赫） | 用于薄膜太阳能电池模块的自动质量控制的测试设备 |
| CN101926009A (zh) * | 2008-01-25 | 2010-12-22 | 应用材料股份有限公司 | 自动化太阳能电池电连接设备 |
| CN101655511A (zh) * | 2008-08-19 | 2010-02-24 | 苏斯显微技术测试系统有限公司 | 用于临时电触点接通太阳能电池的探针 |
| CN101655539A (zh) * | 2008-08-19 | 2010-02-24 | 苏斯显微技术测试系统有限公司 | 用于临时电触点接通太阳能电池的方法和装置 |
| CN201359613Y (zh) * | 2009-01-19 | 2009-12-09 | 李毅 | 非晶硅太阳能电池的测试电极夹具 |
| CN101793945A (zh) * | 2010-03-12 | 2010-08-04 | 中国电子科技集团公司第四十五研究所 | 一种太阳能电池片的测试装置 |
| CN101975917A (zh) * | 2010-10-09 | 2011-02-16 | 中国电子科技集团公司第四十八研究所 | 一种用于测试晶体硅太阳能电池的电动测试台 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2012127411A1 (fr) | 2012-09-27 |
| CN103597739A (zh) | 2014-02-19 |
| TW201244117A (en) | 2012-11-01 |
| EP2689258A1 (fr) | 2014-01-29 |
| JP2014509088A (ja) | 2014-04-10 |
| KR20140019804A (ko) | 2014-02-17 |
| EP2689258B1 (fr) | 2015-07-22 |
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| C14 | Grant of patent or utility model | ||
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| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20161214 Termination date: 20200319 |