TW201244117A - Systems and methods for making at least a detachable electrical contact with at least a photovoltaic device - Google Patents
Systems and methods for making at least a detachable electrical contact with at least a photovoltaic device Download PDFInfo
- Publication number
- TW201244117A TW201244117A TW101108763A TW101108763A TW201244117A TW 201244117 A TW201244117 A TW 201244117A TW 101108763 A TW101108763 A TW 101108763A TW 101108763 A TW101108763 A TW 101108763A TW 201244117 A TW201244117 A TW 201244117A
- Authority
- TW
- Taiwan
- Prior art keywords
- photovoltaic device
- contact
- electrical contact
- patent application
- elements
- Prior art date
Links
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2442—Contacts for co-operating by abutting resilient; resiliently-mounted with a single cantilevered beam
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06727—Cantilever beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R2201/00—Connectors or connections adapted for particular applications
- H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Photovoltaic Devices (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
IN804DE2011 | 2011-03-23 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW201244117A true TW201244117A (en) | 2012-11-01 |
Family
ID=45992570
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW101108763A TW201244117A (en) | 2011-03-23 | 2012-03-15 | Systems and methods for making at least a detachable electrical contact with at least a photovoltaic device |
Country Status (6)
Country | Link |
---|---|
EP (1) | EP2689258B1 (fr) |
JP (1) | JP2014509088A (fr) |
KR (1) | KR20140019804A (fr) |
CN (1) | CN103597739B (fr) |
TW (1) | TW201244117A (fr) |
WO (1) | WO2012127411A1 (fr) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI607221B (zh) | 2012-07-20 | 2017-12-01 | 帕桑股份有限公司 | 一種用於測試光伏特裝置的測試裝置及方法 |
JP5912156B2 (ja) * | 2014-07-28 | 2016-04-27 | 株式会社エヌ・ピー・シー | 発電出力測定用治具 |
DE102015105975B4 (de) | 2015-04-20 | 2019-07-11 | h.a.l.m. elektronik GmbH | Kontaktierungsvorrichtung sowie Verfahren zum Messen einer Kenngröße einer Solarzelle |
DE102017125626A1 (de) | 2017-11-02 | 2019-05-02 | Hanwha Q Cells Gmbh | Kontaktierungselement und Vorrichtung zum temporären Kontaktieren einer Solarzelle |
JP2019140705A (ja) * | 2018-02-06 | 2019-08-22 | 三菱電機株式会社 | 太陽電池測定方法および太陽電池モジュール製造方法 |
DE102018102840A1 (de) * | 2018-02-08 | 2019-08-08 | Wavelabs Solar Metrology Systems Gmbh | Vorrichtung zur elektrischen Kontaktierung einer Solarzelle bei der Messung elektrischer Kenndaten der Solarzelle und Verfahren zur Messung elektrischer Kenndaten einer Solarzelle |
CN109347437A (zh) * | 2018-09-17 | 2019-02-15 | 江西展宇新能源股份有限公司 | 一种多主栅太阳电池测试装置 |
KR102347628B1 (ko) * | 2019-10-15 | 2022-01-06 | (주)티에스이 | 쏠라셀 검사 장치 |
DE102020117760A1 (de) * | 2020-07-06 | 2022-01-13 | Wavelabs Solar Metrology Systems Gmbh | Kontaktiervorrichtung, Solarzellentestvorrichtung und Lichtquelle |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4640002A (en) * | 1982-02-25 | 1987-02-03 | The University Of Delaware | Method and apparatus for increasing the durability and yield of thin film photovoltaic devices |
JPS58158977A (ja) * | 1982-02-25 | 1983-09-21 | ユニバ−シテイ・オブ・デラウエア | 薄膜太陽電池を製造する方法及び装置 |
CN101688893B (zh) * | 2007-04-19 | 2012-08-08 | 欧瑞康太阳能股份公司(特吕巴赫) | 用于薄膜太阳能电池模块的自动质量控制的测试设备 |
CN101926009B (zh) * | 2008-01-25 | 2012-01-25 | 应用材料股份有限公司 | 自动化太阳能电池电连接设备 |
DE102008038184A1 (de) * | 2008-08-19 | 2010-02-25 | Suss Microtec Test Systems Gmbh | Verfahren und Vorrichtung zur temporären elektrischen Kontaktierung einer Solarzelle |
DE102008038186A1 (de) * | 2008-08-19 | 2010-02-25 | Suss Microtec Test Systems Gmbh | Sonde zur temporären elektrischen Kontaktierung einer Solarzelle |
CN201359613Y (zh) * | 2009-01-19 | 2009-12-09 | 李毅 | 非晶硅太阳能电池的测试电极夹具 |
CN101793945B (zh) * | 2010-03-12 | 2013-04-17 | 中国电子科技集团公司第四十五研究所 | 一种太阳能电池片的测试装置 |
CN101975917A (zh) * | 2010-10-09 | 2011-02-16 | 中国电子科技集团公司第四十八研究所 | 一种用于测试晶体硅太阳能电池的电动测试台 |
-
2012
- 2012-03-15 TW TW101108763A patent/TW201244117A/zh unknown
- 2012-03-19 EP EP12715727.9A patent/EP2689258B1/fr not_active Withdrawn - After Issue
- 2012-03-19 JP JP2014500518A patent/JP2014509088A/ja active Pending
- 2012-03-19 KR KR1020137027606A patent/KR20140019804A/ko not_active Application Discontinuation
- 2012-03-19 CN CN201280024584.5A patent/CN103597739B/zh not_active Expired - Fee Related
- 2012-03-19 WO PCT/IB2012/051316 patent/WO2012127411A1/fr active Application Filing
Also Published As
Publication number | Publication date |
---|---|
WO2012127411A1 (fr) | 2012-09-27 |
CN103597739A (zh) | 2014-02-19 |
EP2689258A1 (fr) | 2014-01-29 |
CN103597739B (zh) | 2016-12-14 |
JP2014509088A (ja) | 2014-04-10 |
KR20140019804A (ko) | 2014-02-17 |
EP2689258B1 (fr) | 2015-07-22 |
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