TW201244117A - Systems and methods for making at least a detachable electrical contact with at least a photovoltaic device - Google Patents

Systems and methods for making at least a detachable electrical contact with at least a photovoltaic device Download PDF

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Publication number
TW201244117A
TW201244117A TW101108763A TW101108763A TW201244117A TW 201244117 A TW201244117 A TW 201244117A TW 101108763 A TW101108763 A TW 101108763A TW 101108763 A TW101108763 A TW 101108763A TW 201244117 A TW201244117 A TW 201244117A
Authority
TW
Taiwan
Prior art keywords
photovoltaic device
contact
electrical contact
patent application
elements
Prior art date
Application number
TW101108763A
Other languages
English (en)
Chinese (zh)
Inventor
Jonas Felix Hiller
Original Assignee
Pasan Sa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pasan Sa filed Critical Pasan Sa
Publication of TW201244117A publication Critical patent/TW201244117A/zh

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02Contact members
    • H01R13/22Contacts for co-operating by abutting
    • H01R13/24Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2442Contacts for co-operating by abutting resilient; resiliently-mounted with a single cantilevered beam
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02SGENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
    • H02S50/00Monitoring or testing of PV systems, e.g. load balancing or fault identification
    • H02S50/10Testing of PV devices, e.g. of PV modules or single PV cells
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • G01R1/06727Cantilever beams
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01RELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00Connectors or connections adapted for particular applications
    • H01R2201/20Connectors or connections adapted for particular applications for testing or measuring purposes
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Photovoltaic Devices (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
TW101108763A 2011-03-23 2012-03-15 Systems and methods for making at least a detachable electrical contact with at least a photovoltaic device TW201244117A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IN804DE2011 2011-03-23

Publications (1)

Publication Number Publication Date
TW201244117A true TW201244117A (en) 2012-11-01

Family

ID=45992570

Family Applications (1)

Application Number Title Priority Date Filing Date
TW101108763A TW201244117A (en) 2011-03-23 2012-03-15 Systems and methods for making at least a detachable electrical contact with at least a photovoltaic device

Country Status (6)

Country Link
EP (1) EP2689258B1 (fr)
JP (1) JP2014509088A (fr)
KR (1) KR20140019804A (fr)
CN (1) CN103597739B (fr)
TW (1) TW201244117A (fr)
WO (1) WO2012127411A1 (fr)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI607221B (zh) 2012-07-20 2017-12-01 帕桑股份有限公司 一種用於測試光伏特裝置的測試裝置及方法
JP5912156B2 (ja) * 2014-07-28 2016-04-27 株式会社エヌ・ピー・シー 発電出力測定用治具
DE102015105975B4 (de) 2015-04-20 2019-07-11 h.a.l.m. elektronik GmbH Kontaktierungsvorrichtung sowie Verfahren zum Messen einer Kenngröße einer Solarzelle
DE102017125626A1 (de) 2017-11-02 2019-05-02 Hanwha Q Cells Gmbh Kontaktierungselement und Vorrichtung zum temporären Kontaktieren einer Solarzelle
JP2019140705A (ja) * 2018-02-06 2019-08-22 三菱電機株式会社 太陽電池測定方法および太陽電池モジュール製造方法
DE102018102840A1 (de) * 2018-02-08 2019-08-08 Wavelabs Solar Metrology Systems Gmbh Vorrichtung zur elektrischen Kontaktierung einer Solarzelle bei der Messung elektrischer Kenndaten der Solarzelle und Verfahren zur Messung elektrischer Kenndaten einer Solarzelle
CN109347437A (zh) * 2018-09-17 2019-02-15 江西展宇新能源股份有限公司 一种多主栅太阳电池测试装置
KR102347628B1 (ko) * 2019-10-15 2022-01-06 (주)티에스이 쏠라셀 검사 장치
DE102020117760A1 (de) * 2020-07-06 2022-01-13 Wavelabs Solar Metrology Systems Gmbh Kontaktiervorrichtung, Solarzellentestvorrichtung und Lichtquelle

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4640002A (en) * 1982-02-25 1987-02-03 The University Of Delaware Method and apparatus for increasing the durability and yield of thin film photovoltaic devices
JPS58158977A (ja) * 1982-02-25 1983-09-21 ユニバ−シテイ・オブ・デラウエア 薄膜太陽電池を製造する方法及び装置
CN101688893B (zh) * 2007-04-19 2012-08-08 欧瑞康太阳能股份公司(特吕巴赫) 用于薄膜太阳能电池模块的自动质量控制的测试设备
CN101926009B (zh) * 2008-01-25 2012-01-25 应用材料股份有限公司 自动化太阳能电池电连接设备
DE102008038184A1 (de) * 2008-08-19 2010-02-25 Suss Microtec Test Systems Gmbh Verfahren und Vorrichtung zur temporären elektrischen Kontaktierung einer Solarzelle
DE102008038186A1 (de) * 2008-08-19 2010-02-25 Suss Microtec Test Systems Gmbh Sonde zur temporären elektrischen Kontaktierung einer Solarzelle
CN201359613Y (zh) * 2009-01-19 2009-12-09 李毅 非晶硅太阳能电池的测试电极夹具
CN101793945B (zh) * 2010-03-12 2013-04-17 中国电子科技集团公司第四十五研究所 一种太阳能电池片的测试装置
CN101975917A (zh) * 2010-10-09 2011-02-16 中国电子科技集团公司第四十八研究所 一种用于测试晶体硅太阳能电池的电动测试台

Also Published As

Publication number Publication date
WO2012127411A1 (fr) 2012-09-27
CN103597739A (zh) 2014-02-19
EP2689258A1 (fr) 2014-01-29
CN103597739B (zh) 2016-12-14
JP2014509088A (ja) 2014-04-10
KR20140019804A (ko) 2014-02-17
EP2689258B1 (fr) 2015-07-22

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