CN103392297B - 流水线式adc级间误差校准 - Google Patents

流水线式adc级间误差校准 Download PDF

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Publication number
CN103392297B
CN103392297B CN201280009792.8A CN201280009792A CN103392297B CN 103392297 B CN103392297 B CN 103392297B CN 201280009792 A CN201280009792 A CN 201280009792A CN 103392297 B CN103392297 B CN 103392297B
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China
Prior art keywords
adc
coupled
stage
pipelined
gain
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Chinese (zh)
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CN103392297A (zh
Inventor
K·石
C·瑟图科
P·萨塔扎德
A·J·雷德芬
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Texas Instruments Inc
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Texas Instruments Inc
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1033—Calibration over the full range of the converter, e.g. for correcting differential non-linearity
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/1205—Multiplexed conversion systems
    • H03M1/123—Simultaneous, i.e. using one converter per channel but with common control or reference circuits for multiple converters
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/14—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit
    • H03M1/16—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps
    • H03M1/164—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps the steps being performed sequentially in series-connected stages

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
CN201280009792.8A 2011-02-22 2012-02-22 流水线式adc级间误差校准 Active CN103392297B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/032,457 US8451152B2 (en) 2011-02-22 2011-02-22 Pipelined ADC inter-stage error calibration
US13/032,457 2011-02-22
PCT/US2012/026022 WO2012116006A2 (en) 2011-02-22 2012-02-22 Pipelined adc inter-stage error calibration

Publications (2)

Publication Number Publication Date
CN103392297A CN103392297A (zh) 2013-11-13
CN103392297B true CN103392297B (zh) 2017-08-29

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CN201280009792.8A Active CN103392297B (zh) 2011-02-22 2012-02-22 流水线式adc级间误差校准

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US (1) US8451152B2 (enExample)
JP (1) JP6076268B2 (enExample)
CN (1) CN103392297B (enExample)
WO (1) WO2012116006A2 (enExample)

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US8941518B2 (en) * 2012-02-14 2015-01-27 Hittite Microwave Corporation Methods and apparatus for calibrating pipeline analog-to-digital converters having multiple channels
US9231539B2 (en) * 2013-03-06 2016-01-05 Analog Devices Global Amplifier, a residue amplifier, and an ADC including a residue amplifier
US8836558B1 (en) * 2013-03-15 2014-09-16 Analog Devices, Inc. Method and device for improving convergence time in correlation-based algorithms
US9154146B1 (en) 2014-06-03 2015-10-06 The Board Of Regents, The University Of Texas System Dynamic offset injection for CMOS ADC front-end linearization
CN104300981B (zh) * 2014-09-30 2018-04-27 成都市晶林科技有限公司 高速、高精度图像信号模数转换电路
CN105897265B (zh) 2014-12-12 2020-08-21 恩智浦美国有限公司 具有受控误差校准的模数转换器
US9602121B2 (en) * 2015-07-07 2017-03-21 Analog Devices, Inc. Background estimation of comparator offset of an analog-to-digital converter
CN107453756B (zh) * 2017-08-17 2020-02-04 电子科技大学 一种用于流水线adc的前端校准方法
US10284188B1 (en) 2017-12-29 2019-05-07 Texas Instruments Incorporated Delay based comparator
US10673452B1 (en) 2018-12-12 2020-06-02 Texas Instruments Incorporated Analog-to-digital converter with interpolation
US10673456B1 (en) 2018-12-31 2020-06-02 Texas Instruments Incorporated Conversion and folding circuit for delay-based analog-to-digital converter system
US11316526B1 (en) 2020-12-18 2022-04-26 Texas Instruments Incorporated Piecewise calibration for highly non-linear multi-stage analog-to-digital converter
US11387840B1 (en) 2020-12-21 2022-07-12 Texas Instruments Incorporated Delay folding system and method
US11309903B1 (en) 2020-12-23 2022-04-19 Texas Instruments Incorporated Sampling network with dynamic voltage detector for delay output
US11438001B2 (en) 2020-12-24 2022-09-06 Texas Instruments Incorporated Gain mismatch correction for voltage-to-delay preamplifier array
US11962318B2 (en) 2021-01-12 2024-04-16 Texas Instruments Incorporated Calibration scheme for a non-linear ADC
CN112910462B (zh) * 2021-01-15 2023-02-21 迈科微电子(深圳)有限公司 一种基于亚稳态检测的pipeline-SAR ADC数字级间增益校准方法
US11316525B1 (en) 2021-01-26 2022-04-26 Texas Instruments Incorporated Lookup-table-based analog-to-digital converter
JP2024505551A (ja) 2021-02-01 2024-02-06 テキサス インスツルメンツ インコーポレイテッド 非線形システムのためのルックアップテーブル
US11881867B2 (en) 2021-02-01 2024-01-23 Texas Instruments Incorporated Calibration scheme for filling lookup table in an ADC
US12101096B2 (en) 2021-02-23 2024-09-24 Texas Instruments Incorporated Differential voltage-to-delay converter with improved CMRR
CN113098511B (zh) * 2021-03-01 2023-03-21 深圳市纽瑞芯科技有限公司 一种流水线逐次逼近型模数转换器的前端自校准方法
US12206424B2 (en) * 2022-08-30 2025-01-21 Texas Instruments Incorporated Methods and apparatus to reduce inter-stage gain errors in analog-to-digital converters

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CN101741385A (zh) * 2008-11-10 2010-06-16 承景科技股份有限公司 前后级解析度可调的共享运算放大器的模数转换器

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Also Published As

Publication number Publication date
US8451152B2 (en) 2013-05-28
JP6076268B2 (ja) 2017-02-08
CN103392297A (zh) 2013-11-13
WO2012116006A2 (en) 2012-08-30
WO2012116006A3 (en) 2012-11-22
US20120212358A1 (en) 2012-08-23
JP2014506773A (ja) 2014-03-17

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