US9231539B2 - Amplifier, a residue amplifier, and an ADC including a residue amplifier - Google Patents
Amplifier, a residue amplifier, and an ADC including a residue amplifier Download PDFInfo
- Publication number
- US9231539B2 US9231539B2 US13/787,065 US201313787065A US9231539B2 US 9231539 B2 US9231539 B2 US 9231539B2 US 201313787065 A US201313787065 A US 201313787065A US 9231539 B2 US9231539 B2 US 9231539B2
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- Prior art keywords
- amplifier
- gain stage
- switch
- feedback capacitor
- sampling
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
- H03F3/45071—Differential amplifiers with semiconductor devices only
- H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
- H03F3/45179—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using MOSFET transistors as the active amplifying circuit
- H03F3/45183—Long tailed pairs
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/14—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit
- H03M1/16—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps
- H03M1/164—Conversion in steps with each step involving the same or a different conversion means and delivering more than one bit with scale factor modification, i.e. by changing the amplification between the steps the steps being performed sequentially in series-connected stages
Definitions
- the present invention relates to an amplifier, a residue amplifier and an ADC including a residue amplifier.
- amplifier circuits can be used in conjunction with sampling circuits to acquire and hold a signal, and to apply gain to it. Such circuits are subject to noise, and it is desirable to reduce the noise power that is sampled. Such amplifier and sampling circuit combinations may also be used to form a difference between two signals. Such amplifiers may be provided in analog to digital converters (ADC) to amplify a residue that is passed from one stage of a pipelined ADC to a subsequent stage.
- ADC analog to digital converters
- an amplifier comprising:
- controllable impedance is operable to switch between a first impedance state in which it does not affect current flow through the feedback capacitor, and a second impedance state in which it cooperates with the feedback capacitor to form a bandwidth limiting circuit.
- a method of reducing noise sampled into a sampling circuit comprising a sampling capacitor in association with a sampling switch, wherein an amplifier in association with a bandwidth limiting circuit is connected to a plate of the capacitor and is operable during a first phase to limit the noise sampled into the sampling circuit, and during a second phase of operation the amplifier acts as a charge transfer amplifier.
- FIG. 1 is a circuit diagram of an amplifier according to an embodiment of the invention.
- FIG. 2 is a schematic diagram of a stage of a pipelined analog to digital converter including a residue amplifier according to an embodiment of the invention
- FIG. 3 is a schematic diagram of a single stage differential amplifier
- FIG. 4 is a schematic diagram of an alternative single stage differential amplifier
- FIG. 5 is a diagram showing a the change to a gain block frequency response according to an embodiment of the invention.
- FIG. 1 is a circuit diagram of an amplifier constituting an embodiment of the present invention.
- the amplifier generally designated 10 , may, for example, be used as a residue amplifier between stages of a pipelined analog to digital converter. However it might also be used in other circuits where a signal needs to be acquired onto a sampling capacitor, and a gained up version of that signal is output.
- the amplifier 10 comprises an input node 12 and an output node 14 .
- the amplifier also comprise a gain block 16 having a gain block inverting input 18 , a gain block non-inverting input 20 and a gain block output 22 .
- the gain block output 22 may be directly connected to the output node 14 , as shown, or may be selectively connectable to the output node via further circuitry, such as a switch, where it is desirable to ensure that the output node 14 can present a high impedance.
- the gain block inverting input 18 is connected to the input node 12 by a sampling capacitor 30 .
- One or more signals to be sampled onto the sampling capacitor 30 can be provided to the input node 12 by way of switches, of which a first switch 32 and a second switch 34 which receive signals V 1 and V 2 at signal nodes 36 and 38 respectively, are examples.
- the amplifier also comprises a feedback capacitor 50 connected between the gain block inverting input 18 and the gain block output 22 .
- a controllable impedance 60 is also connected between the gain block inverting input 18 and the gain block output 22 .
- the controllable impedance 60 comprises a resistor 62 in series with a switch 64 .
- the switch 64 which may be formed by a field effect transistor, is switchable between a first state in which it presents a high impedance, and a second state in which it presents a low impedance.
- the switch 64 When the switch 64 is in a high impedance state substantially no current flows through the controllable impedance 60 , and hence the gain block 16 only sees the feedback capacitor 50 in its feedback loop.
- the controllable impedance 60 behaves substantially like a resistor in parallel with the feedback capacitor 50 .
- Prior art residue amplifiers are known which are similar, but where the controllable impedance is omitted, and a simple shorting switch is provided in parallel with the feedback capacitor 50 .
- FIG. 2 schematically represents an Nth stage of a pipeline converter.
- the Nth stage is shown as being preceded by an N ⁇ 1th stage and followed by an N+1th stage. It will be evident to the person skilled in the art that one of the N ⁇ 1th and the N+1th stages may be omitted.
- the signal at an input node 80 of the Nth stage is split into two signal paths.
- One path may be provided directly as a signal V 1 to signal node 36 .
- the other signal path goes to an ADC 82 which forms a digital approximation of the input signal.
- the approximation may result in an analog equivalent of the digital word being directly derivable from the ADC 82 .
- the digital output of the ADC 82 is provided as an input to a digital to analog converter 84 which provides an analog output V DAC as the signal V 2 to signal node 38 .
- V 1 and V 2 should be very similar, and the difference V 1 ⁇ V 2 is the “residue” between the analog input to the Nth stage, and the digital approximation thereof.
- the Nth stage of the pipelined ADC may convert one or several bits of the output word of the pipelined converter, and the residue is generally subject to gain when it is passed from one stage to the next as this improves linearity and noise performance of the pipelined converter.
- the residue amplifier 10 is a source of offset.
- the structure provided herein enables an offset cancellation to occur.
- the amplifier, and the sampling circuit around it, are also sources of noise.
- the present invention enables the noise performance of the residue amplifier to be improved compared to prior art circuits.
- the switches 32 and 34 are driven from clocks ⁇ 1 and ⁇ 2 and are never simultaneously “on” (for example high or “1”) or in transition at the same time, but can both be in an off (for example low or 0) state simultaneously.
- the switch 64 in the controllable impedance may also be driven from ⁇ 1 , and hence is closed.
- the amplifying action of the gain block 16 is to hold the voltage at its inverting input 18 to be the same as the voltage at its non-inverting input 20 .
- the non-inverting input 20 may be connected to reference voltage V ref , such as a mid-point between the supply rails V dd and V ss (not shown) to the gain block, to a reference voltage or to a small signal ground.
- the gain block has an input offset voltage due to imperfections in the input stage, which can be regarded as a voltage V in — off that is added to the signal at the non-inverting input.
- Closing switch 64 places this input referred offset voltage in the gain end feedback path of the amplifier, such that if the gain block has a gain of A (when the feedback loop is broken) then the input referred offset V in — off is reduced by a factor of A.
- Closing switch 64 also allows the capacitor 50 to discharge such that there is no voltage difference across it.
- ⁇ 2 is asserted and ⁇ 1 is de-asserted.
- C sample is the capacitance of the sampling capacitor 30
- C feedback is the capacitance of the feedback capacitor 50 .
- the sampling capacitor has a capacitance of 1 pF and the feedback capacitor 50 had a capacitance of 0.1 pF the residue V 2 ⁇ V 1 would be subjected to a gain of 10.
- the noise in the system is the product of the noise spectral density and the bandwidth.
- T temperature in Kelvin
- R is resistance in ohms
- the resistance can be any resistance in combination with the capacitor, such as the resistance of the input switches.
- the bandwidth varies depending on which of ⁇ 1 and ⁇ 2 and are being asserted. This is used to vary the noise performance.
- variable impedance 60 is not provided, and instead a simple switch is provided.
- the gain stage inverting input acts as a virtual earth. Noise from the impedance of the sample switches and from the amplifier front end can be sampled onto the sampling capacitor 30 .
- the noise bandwidth is constrained by a filter formed by the sampling capacitor and the series resistance of the sampling switches and the shorting switch. In general these are small.
- the gain block is an operational amplifier as shown in FIG. 3 .
- each FET 100 and 102 of the differential input stage 104 has a high impedance active load formed by transistors 106 and 108 .
- the output impedance of the amplifier is a function of the trans conductance, g m , of the transistors as
- the transconductance g m depends on the drain current. A typical value of g m may be around 330 or so.
- the bandwidth is primarily set by the bandwidth of the filter formed by the feedback capacitor 50 and the impedance of the resistor 62 .
- R L is the resistance R f of the resistor 62 in series with the output resistance R out of the gain stage and C feedback is the capacitance of the capacitor 50 .
- the amplifier acts as an inverting amplifier, so for an amplifier having a gain of A, each + ⁇ V of the non-inverting input gives rise to a ⁇ A ⁇ V at the output, and hence the current flow through the feedback capacitor is equivalent to having a capacitor of size A ⁇ C feedback (strictly (A+1) ⁇ C feedback ) but these numbers converge to the similar, i.e. less than a few present difference for A>50, which is a very modest gain for such an amplifier.
- phase ⁇ 1 when switches 32 and 64 are closed, the sampled noise becomes much reduced, and can be represented by
- the gain stage of FIG. 3 is not constrained to have active loads, and can be implemented with resistive loads indicated by resistors 120 and 121 having resistances R load as shown in FIG. 4 .
- embodiments of the present invention always give an improvement in noise provided Rf is large enough. Typically this is achieved by making the 3 dB point of the filter formed by the feedback capacitor 50 and the resistor 62 less than one half, and generally less than one third the frequency of the gain blocks 3 dB point as measured when the output 22 is connected to the inverting input 18 . Such an arrangement is shown in FIG. 5 where gain versus frequency characteristic is schematically illustrated.
- the amplifier of the prior art, where the switch is used to connect the output node 22 to the inverting input 18 forms a substantially unity gain voltage follower as indicated by response 140 , and having a breakpoint 142 occurring at frequency f 0 .
- controllable impedance 60 co-operates with the feedback capacitor 50 to place a breakpoint in the response characteristic at a frequency f 1 which is significantly less than f 0 .
- the resistance of the controllable impedance may cause the gain of the amplifier to exceed unity during this phase of operation.
- the circuit it is also possible for the circuit to provide further improvements in noise power, to the extent that the it removes more noise power than the input stage of the amplifier introduces.
- the noise power of an amplifier is the accumulation of the noise introduced at each stage thereof, the majority of the noise can be regarded as being attributable to the input stage.
- multistage amplifiers have an improved gain over single stage amplifiers, but most of the noise is attributable to the input stage.
- Zf is the impedance of the feedback network.
- A/(Zf.g m ) is less than 3 ⁇ 4 then the noise sampled into the system can be reduced below k B T/C sample .
- the sampling capacitor or indeed the feedback capacitor need not be fixed in size. Either of these capacitors may be a variable capacitor, for example a capacitive transducer.
- V 1 and V 2 are fixed reference voltages, and then the output of the amplifier 10 depends on the relative values of the sampling and feedback capacitors.
- the feedback capacitor has to have sufficient time to discharge from the voltage across it at the end of one sample to the voltage that should be across it to compensate for any amplifier offset, but otherwise substantially 0 Volts.
- This can be achieved by selecting the impedance of the controllable impedance to be sufficiently low to achieve this, or alternatively by providing a shorting switch which can be briefly operated to discharge the capacitor at the beginning of each operating cycle.
- the controllable impedance may be implemented as a thin FET so that the “on” channel resistance is comparatively large.
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- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Amplifiers (AREA)
Abstract
Description
-
- an input node;
- an output node;
- a gain stage having a gain stage inverting input, a gain stage non-inverting input and a gain stage output;
- a feedback capacitor connected in a signal path between the gain stage output and the gain stage inverting input;
- a sampling capacitor connected between the input node and the gain stage inverting input; and
- a controllable impedance in parallel with the feedback capacitor,
V sample1 =V1−V ref equation 1
V sample2 =V2−V ref equation 2
The difference
V sample2 −V sample1 =V2−V1 equation 3
-
- 1) Autozero the amplifier during the first phase; and
- 2) Form
during phase 2.
where Csample is the capacitance of the
V 2 n=4k B Tr equation 4
where kB is Boltzmann's constant
so the noise power simplifies to
However this is not always the case and the noise power can be reduced below this value with suitable selection of components.
-
- Vgs=gate-source voltage
Ce=Cs+ACf equation 13
where Cs is the capacitance of the sampling capacitor, Cf is the capacitance of the feedback capacitor and A is the gain of the gain block.
Re=Rf/A+R out equation 14
C f R f >Cs(1+R f)/g m equation 19
G=g m· R load equation 20
Claims (20)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US13/787,065 US9231539B2 (en) | 2013-03-06 | 2013-03-06 | Amplifier, a residue amplifier, and an ADC including a residue amplifier |
DE102014102456.7A DE102014102456B4 (en) | 2013-03-06 | 2014-02-25 | A AMPLIFIER, A REST AMPLIFIER, AND AN A / D TRANSMITTER CONTAINING A REST AMPLIFIER |
CN201410080010.0A CN104038228B (en) | 2013-03-06 | 2014-03-06 | Amplifier, residue amplifier and the AD converter including residue amplifier |
Applications Claiming Priority (1)
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US13/787,065 US9231539B2 (en) | 2013-03-06 | 2013-03-06 | Amplifier, a residue amplifier, and an ADC including a residue amplifier |
Publications (2)
Publication Number | Publication Date |
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US20140253237A1 US20140253237A1 (en) | 2014-09-11 |
US9231539B2 true US9231539B2 (en) | 2016-01-05 |
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US13/787,065 Active 2033-05-27 US9231539B2 (en) | 2013-03-06 | 2013-03-06 | Amplifier, a residue amplifier, and an ADC including a residue amplifier |
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US (1) | US9231539B2 (en) |
CN (1) | CN104038228B (en) |
DE (1) | DE102014102456B4 (en) |
Cited By (2)
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US20200212924A1 (en) * | 2018-12-28 | 2020-07-02 | Texas Instruments Incorporated | Top plate sampling analog-to-digital converter (adc) having a dynamic comparator with a preamplifier and a clamp circuit |
US11063602B1 (en) | 2020-02-05 | 2021-07-13 | Analog Devices International Unlimited Company | Switched capacitor circuits |
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US9525409B2 (en) * | 2015-05-08 | 2016-12-20 | Analog Devices Global | Signal gate, a sampling network and an analog to digital converter comprising such a sampling network |
US9602121B2 (en) * | 2015-07-07 | 2017-03-21 | Analog Devices, Inc. | Background estimation of comparator offset of an analog-to-digital converter |
CN105162465B (en) * | 2015-08-28 | 2019-03-08 | 西安启微迭仪半导体科技有限公司 | Surplus amplifier establishes speed circuit in a kind of raising pipeline-type modulus converter |
WO2018167449A1 (en) * | 2017-03-16 | 2018-09-20 | Isotopx Ltd | An amplifier |
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US10804851B2 (en) * | 2018-04-04 | 2020-10-13 | Maxim Integrated Products, Inc. | Systems and methods for a current sense amplifier comprising a sample and hold circuit |
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CN112924745A (en) * | 2021-01-21 | 2021-06-08 | 季华实验室 | Nanopore gene sequencing micro-current detection device |
CN113551693A (en) * | 2021-07-26 | 2021-10-26 | 联合微电子中心有限责任公司 | Step-by-step self-zero-adjusting detection circuit and method |
CN115865059A (en) * | 2021-09-24 | 2023-03-28 | Oppo广东移动通信有限公司 | Comparator circuit, control method thereof, voltage comparison device and analog-to-digital converter |
US11855651B2 (en) | 2022-04-09 | 2023-12-26 | Caelus Technologies Limited | Discrete-time offset correction circuit embedded in a residue amplifier in a pipelined analog-to-digital converter (ADC) |
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US4894620A (en) * | 1988-04-11 | 1990-01-16 | At&T Bell Laboratories | Switched-capacitor circuit with large time constant |
US6384641B1 (en) * | 2001-06-04 | 2002-05-07 | Motorola, Inc. | Signal sampling circuit with high frequency noise immunity and method therefor |
US20140125407A1 (en) * | 2012-11-05 | 2014-05-08 | Analog Devices, Inc. | Bandwidth limiting for amplifiers |
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EP0747849A1 (en) | 1995-06-07 | 1996-12-11 | Landis & Gyr Technology Innovation AG | Switched capacitor integrator having switchable polarity |
US8451152B2 (en) * | 2011-02-22 | 2013-05-28 | Texas Instruments Incorporated | Pipelined ADC inter-stage error calibration |
CN102386921B (en) * | 2011-11-15 | 2014-04-09 | 北京时代民芯科技有限公司 | Mismatch calibration method for streamline ADC (Analog-to-Digital Converter) multi-bit sub DAC (Digital-to0Analog Converter) capacitor |
-
2013
- 2013-03-06 US US13/787,065 patent/US9231539B2/en active Active
-
2014
- 2014-02-25 DE DE102014102456.7A patent/DE102014102456B4/en active Active
- 2014-03-06 CN CN201410080010.0A patent/CN104038228B/en active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4894620A (en) * | 1988-04-11 | 1990-01-16 | At&T Bell Laboratories | Switched-capacitor circuit with large time constant |
US6384641B1 (en) * | 2001-06-04 | 2002-05-07 | Motorola, Inc. | Signal sampling circuit with high frequency noise immunity and method therefor |
US20140125407A1 (en) * | 2012-11-05 | 2014-05-08 | Analog Devices, Inc. | Bandwidth limiting for amplifiers |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20200212924A1 (en) * | 2018-12-28 | 2020-07-02 | Texas Instruments Incorporated | Top plate sampling analog-to-digital converter (adc) having a dynamic comparator with a preamplifier and a clamp circuit |
US10771083B2 (en) * | 2018-12-28 | 2020-09-08 | Texas Instruments Incorporated | Top plate sampling analog-to-digital converter (ADC) having a dynamic comparator with a preamplifier and a clamp circuit |
US11063602B1 (en) | 2020-02-05 | 2021-07-13 | Analog Devices International Unlimited Company | Switched capacitor circuits |
Also Published As
Publication number | Publication date |
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DE102014102456B4 (en) | 2019-03-21 |
CN104038228A (en) | 2014-09-10 |
CN104038228B (en) | 2017-08-01 |
DE102014102456A1 (en) | 2014-09-11 |
US20140253237A1 (en) | 2014-09-11 |
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