CN103076530A - Automatic open short circuit test system for CMOS (Complementary Metal-Oxide-Semiconductor Transistor) chip and test method - Google Patents
Automatic open short circuit test system for CMOS (Complementary Metal-Oxide-Semiconductor Transistor) chip and test method Download PDFInfo
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- CN103076530A CN103076530A CN2012105859474A CN201210585947A CN103076530A CN 103076530 A CN103076530 A CN 103076530A CN 2012105859474 A CN2012105859474 A CN 2012105859474A CN 201210585947 A CN201210585947 A CN 201210585947A CN 103076530 A CN103076530 A CN 103076530A
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Abstract
The invention discloses an automatic open short circuit test system for a CMOS (Complementary Metal-Oxide-Semiconductor Transistor) chip and a test method. The test system comprises a main control chip, a multiplexing module, a liquid crystal display module and a memory module, wherein the main control chip is respectively connected with the multiplexing module, the liquid crystal display module and the memory module, and the multiplexing module is connected with a CMOS chip to be tested; and the main control chip can collect signals from a pin of the CMOS chip to be tested through the multiplexing module and process the signals through software, and the signal processing results can be stored through the memory module and can be displayed through the liquid crystal display module. The test system can meet the automatic open short circuit test of various CMOS chips on the market, the test precision is increased while the test efficiency is optimized, and test standards can be set according to different CMOS chips.
Description
Technical field
The present invention relates to a kind of open-short circuit tester and method of testing, specifically relate to a kind of CMOS chip automatic open-short circuit system and method for testing, be applicable to the open-short circuit of various types of CMOS chips such as DVP interface, MIPI single channel interface, MIPI binary channels interface, MIPI four-way interface and self defined interface.
Background technology
Open-short circuit (claims again the OPEN/SHORT test, the O/S test), it mainly is the connection for test electronic device, as its name suggests, open-short circuit is tested open circuit and short circuit exactly, open-short circuit use very extensively, for example: the test pcb board, test I C nation alignment, the encapsulation of test I C, test wire rod, test FPC, the testing film switch, test connector etc., different application has again more special demand, at present, the open-short circuit tester of CMOS chip can only be tested for the product of parallel port, can't satisfying the market on the open-short circuit of increasing MIPI interface CMOS chip.
Summary of the invention
In order to solve the problems of the technologies described above, the present invention proposes a kind of CMOS chip automatic open-short circuit system and method for testing, the automatic open-short circuit of various CMOS chips on can satisfying the market, improve the precision of test when optimizing testing efficiency, can formulate testing standard according to different CMOS chips.
Technical scheme of the present invention is achieved in that
The automatic open-short circuit of a kind of CMOS chip system, comprise main control chip, multiplexing module, LCD MODULE and memory module, described main control chip respectively with described multiplexing module, described LCD MODULE is connected with described memory module, described multiplexing module is connected with CMOS chip to be measured, described main control chip can carry out signals collecting and carry out the signal processing by software by the pin of described multiplexing module to CMOS chip to be measured, can store signal processing results by described memory module, can also signal processing results be shown by LCD MODULE.
As a further improvement on the present invention, other is provided with shifting device, and described shifting device is connected with described multiplexing module, and described multiplexing module can be by the interface modes that described shifting device is selected and CMOS chip to be measured is complementary.
As a further improvement on the present invention, described interface modes is a kind of in DVP interface, MIPI single channel interface, MIPI binary channels interface, MIPI four-way interface and the self defined interface.
As a further improvement on the present invention, other is provided with communication module, and described communication module is connected with described main control chip, and described main control chip can be described main control chip power supply and the transmission of data by described communication module.
As a further improvement on the present invention, described communication module is the usb communication interface.
The method of testing of the automatic open-short circuit of a kind of CMOS chip system comprises the steps:
A, open test; at first; main control chip is given the test signal of the GND pin input 1.5V of CMOS chip to be measured by multiplexing module; then, main control chip gathers the conduction voltage drop signal of the protection diode of each pin of CMOS chip to be measured successively by multiplexing module, if the protection diode of current pin does not collect the conduction voltage drop signal; then judge current pin open circuit; otherwise, judge that then current pin is normal, by memory module storage open test information.
B, short-circuit test, at first, main control chip is given the test signal of a pin input 1.5v of CMOS chip to be measured successively by multiplexing module, then, whether main control chip is identical with input signal by multiplexing module collection and contrast output signal of other pin except the input signal pin, judge current pin and the short circuit of signal input tube pin that is gathered contrast if signal is identical, do not judge that current pin is normal if signal is identical, by memory module storage short-circuit test information;
C, the information of will opening a way and short circuit information exchange are crossed LCD MODULE and are shown.
The invention has the beneficial effects as follows: the invention provides the automatic open-short circuit of a kind of CMOS chip system; main control chip is given the GND pin input test signal of CMOS chip to be measured by multiplexing module; then; whether the protection diode of judging each pin of CMOS chip to be measured has the conduction voltage drop signal; can realize the open test of CMOS chip; main control chip is given the test signal of a pin input 1.5v of CMOS chip to be measured successively by multiplexing module; then; judge whether the input signal pin is identical with the output signal of other pin; can realize the short-circuit test of CMOS chip; especially; the interface modes that multiplexing module is complementary by shifting device selection and CMOS chip to be measured; interface modes is the DVP interface; MIPI single channel interface; MIPI binary channels interface; a kind of in MIPI four-way interface and the self defined interface; the automatic open-short circuit of various CMOS chips on can to satisfy effectively market has improved the precision of test when optimizing testing efficiency.
Description of drawings
Fig. 1 is principle of the invention schematic block diagram;
Fig. 2 is testing process synoptic diagram of the present invention.
Embodiment
As depicted in figs. 1 and 2, the automatic open-short circuit of a kind of CMOS chip system, comprise main control chip, multiplexing module, LCD MODULE and memory module, described main control chip respectively with described multiplexing module, described LCD MODULE is connected with described memory module, described multiplexing module is connected with CMOS chip to be measured, described main control chip can carry out signals collecting and carry out the signal processing by software by the pin of described multiplexing module to CMOS chip to be measured, can store signal processing results by described memory module, can also signal processing results be shown by LCD MODULE.
Preferably, other is provided with shifting device, and described shifting device is connected with described multiplexing module, and described multiplexing module can be by the interface modes that described shifting device is selected and CMOS chip to be measured is complementary.
Preferably, described interface modes is a kind of in DVP interface, MIPI single channel interface, MIPI binary channels interface, MIPI four-way interface and the self defined interface.
Preferably, other is provided with communication module, and described communication module is connected with described main control chip, and described main control chip can be described main control chip power supply and the transmission of data by described communication module.
Preferably, described communication module is the usb communication interface.
The method of testing of the automatic open-short circuit of a kind of CMOS chip system comprises the steps:
A, open test; at first; main control chip is given the test signal of the GND pin input 1.5V of CMOS chip to be measured by multiplexing module; then, main control chip gathers the conduction voltage drop signal of the protection diode of each pin of CMOS chip to be measured successively by multiplexing module, if the protection diode of current pin does not collect the conduction voltage drop signal; then judge current pin open circuit; otherwise, judge that then current pin is normal, by memory module storage open test information.
B, short-circuit test, at first, main control chip is given the test signal of a pin input 1.5v of CMOS chip to be measured successively by multiplexing module, then, whether main control chip is identical with input signal by multiplexing module collection and contrast output signal of other pin except the input signal pin, judge current pin and the short circuit of signal input tube pin that is gathered contrast if signal is identical, do not judge that current pin is normal if signal is identical, by memory module storage short-circuit test information;
C, the information of will opening a way and short circuit information exchange are crossed LCD MODULE and are shown.
The test philosophy of CMOS chip automatic open-short circuit system of the present invention and method of testing is as follows: the open test principle, because the forward conduction voltage of normal CMOS chip protection diode is between 0.4V-0.5V, in pin when open circuit, should the not conducting of protection diode, and the forward voltage signal of protection diode that therefore can be by each pin of test CMOS chip can judge whether pin opens a way; The short-circuit test principle, the pin input test signal to a CMOS chip removes to gather the signal on other pin simultaneously, if the test signal of the test signal that collects and input is consistent, then represents the input pin short circuit of this pin and test.
Above embodiment is with reference to accompanying drawing; to a preferred embodiment of the present invention will be described in detail; those skilled in the art is by carrying out modification or the change on the various forms to above-described embodiment, but do not deviate from the situation of essence of the present invention, all drops within protection scope of the present invention.
Claims (6)
1. the automatic open-short circuit of CMOS chip system, it is characterized in that: comprise main control chip, multiplexing module, LCD MODULE and memory module, described main control chip respectively with described multiplexing module, described LCD MODULE is connected with described memory module, described multiplexing module is connected with CMOS chip to be measured, described main control chip can carry out signals collecting and carry out the signal processing by software by the pin of described multiplexing module to CMOS chip to be measured, can store signal processing results by described memory module, can also signal processing results be shown by LCD MODULE.
2. the automatic open-short circuit of CMOS chip according to claim 1 system, it is characterized in that: other is provided with shifting device, described shifting device is connected with described multiplexing module, and described multiplexing module can be by the interface modes that described shifting device is selected and CMOS chip to be measured is complementary.
3. the automatic open-short circuit of CMOS chip according to claim 2 system is characterized in that: described interface modes is a kind of in DVP interface, MIPI single channel interface, MIPI binary channels interface, MIPI four-way interface and the self defined interface.
4. the automatic open-short circuit of CMOS chip according to claim 1 system, it is characterized in that: other is provided with communication module, described communication module is connected with described main control chip, and described main control chip can be described main control chip power supply and the transmission of data by described communication module.
5. the automatic open-short circuit of CMOS chip according to claim 4 system, it is characterized in that: described communication module is the usb communication interface.
6. the method for testing such as the automatic open-short circuit of each described CMOS chip of claim 1-5 system is characterized in that: comprise the steps:
A, open test; at first; main control chip is given the test signal of the GND pin input 1.5V of CMOS chip to be measured by multiplexing module; then, main control chip gathers the conduction voltage drop signal of the protection diode of each pin of CMOS chip to be measured successively by multiplexing module, if the protection diode of current pin does not collect the conduction voltage drop signal; then judge current pin open circuit; otherwise, judge that then current pin is normal, by memory module storage open test information.
B, short-circuit test, at first, main control chip is given the test signal of a pin input 1.5v of CMOS chip to be measured successively by multiplexing module, then, whether main control chip is identical with input signal by multiplexing module collection and contrast output signal of other pin except the input signal pin, judge current pin and the short circuit of signal input tube pin that is gathered contrast if signal is identical, do not judge that current pin is normal if signal is identical, by memory module storage short-circuit test information;
C, the information of will opening a way and short circuit information exchange are crossed LCD MODULE and are shown.
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Cited By (16)
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| CN104297614A (en) * | 2014-09-16 | 2015-01-21 | 冀雅(廊坊)电子有限公司 | Short-circuit testing device and method for segment code type liquid crystal display module |
| CN104569661A (en) * | 2014-12-23 | 2015-04-29 | 深圳市九洲电器有限公司 | HDMI interface testing circuit and device |
| CN105548790A (en) * | 2015-12-09 | 2016-05-04 | 上海斐讯数据通信技术有限公司 | USB3.1 Type-C cable automatic testing method and system |
| CN105823956A (en) * | 2016-03-16 | 2016-08-03 | 昆山软龙格自动化技术有限公司 | IC open/short test system integrated in USB3.0 test card |
| CN105891657A (en) * | 2016-04-25 | 2016-08-24 | 万高(杭州)科技有限公司 | Method and apparatus for detecting chip bonding conditions of printed circuit board |
| CN106771823A (en) * | 2017-02-06 | 2017-05-31 | 湖北三赢兴电子科技有限公司 | Camera module open-short circuit device, system |
| CN106899844A (en) * | 2017-02-13 | 2017-06-27 | 张家港市欧微自动化研发有限公司 | A kind of cmos sensor test system |
| CN108804261A (en) * | 2017-05-05 | 2018-11-13 | 中兴通讯股份有限公司 | The test method and device of connector |
| CN108957290A (en) * | 2018-06-27 | 2018-12-07 | 四川斐讯信息技术有限公司 | A kind of SCM Based chip method for detecting short circuit and system |
| CN110133486A (en) * | 2019-06-13 | 2019-08-16 | 上海安路信息科技有限公司 | The pin of FPGA bridges short circuit test method |
| CN110133481A (en) * | 2019-06-13 | 2019-08-16 | 上海安路信息科技有限公司 | The test method and test circuit of IO bridge joint short circuit |
| CN110988738A (en) * | 2019-12-13 | 2020-04-10 | 华显光电技术（惠州）有限公司 | Multi-interface open-short circuit test circuit and device |
| CN111028882A (en) * | 2019-11-27 | 2020-04-17 | 大连睿海信息科技有限公司 | Detection device for storage medium |
| CN111929565A (en) * | 2020-08-12 | 2020-11-13 | 上海龙旗科技股份有限公司 | Test circuit board opens short-circuit device |
| CN113726742A (en) * | 2021-07-30 | 2021-11-30 | 昆山丘钛微电子科技股份有限公司 | Test authentication method, device, electronic equipment and medium |
| CN114859210A (en) * | 2022-04-22 | 2022-08-05 | 上海研鼎信息技术有限公司 | CMOS chip open-short circuit test system and test method |
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| CN104297614A (en) * | 2014-09-16 | 2015-01-21 | 冀雅(廊坊)电子有限公司 | Short-circuit testing device and method for segment code type liquid crystal display module |
| CN104569661B (en) * | 2014-12-23 | 2018-02-06 | 深圳市九洲电器有限公司 | A kind of HDMI test circuit and device |
| CN104569661A (en) * | 2014-12-23 | 2015-04-29 | 深圳市九洲电器有限公司 | HDMI interface testing circuit and device |
| CN105548790A (en) * | 2015-12-09 | 2016-05-04 | 上海斐讯数据通信技术有限公司 | USB3.1 Type-C cable automatic testing method and system |
| CN105548790B (en) * | 2015-12-09 | 2019-08-16 | 上海斐讯数据通信技术有限公司 | A kind of USB3.1 Type-C cable automatic test approach and system |
| CN105823956A (en) * | 2016-03-16 | 2016-08-03 | 昆山软龙格自动化技术有限公司 | IC open/short test system integrated in USB3.0 test card |
| CN105891657A (en) * | 2016-04-25 | 2016-08-24 | 万高(杭州)科技有限公司 | Method and apparatus for detecting chip bonding conditions of printed circuit board |
| CN106771823A (en) * | 2017-02-06 | 2017-05-31 | 湖北三赢兴电子科技有限公司 | Camera module open-short circuit device, system |
| CN106899844A (en) * | 2017-02-13 | 2017-06-27 | 张家港市欧微自动化研发有限公司 | A kind of cmos sensor test system |
| CN108804261B (en) * | 2017-05-05 | 2023-05-19 | 中兴通讯股份有限公司 | Connector testing method and device |
| CN108804261A (en) * | 2017-05-05 | 2018-11-13 | 中兴通讯股份有限公司 | The test method and device of connector |
| CN108957290A (en) * | 2018-06-27 | 2018-12-07 | 四川斐讯信息技术有限公司 | A kind of SCM Based chip method for detecting short circuit and system |
| CN110133486B (en) * | 2019-06-13 | 2021-06-18 | 上海安路信息科技股份有限公司 | Pin bridging short circuit test method of FPGA |
| CN110133486A (en) * | 2019-06-13 | 2019-08-16 | 上海安路信息科技有限公司 | The pin of FPGA bridges short circuit test method |
| CN110133481A (en) * | 2019-06-13 | 2019-08-16 | 上海安路信息科技有限公司 | The test method and test circuit of IO bridge joint short circuit |
| CN111028882A (en) * | 2019-11-27 | 2020-04-17 | 大连睿海信息科技有限公司 | Detection device for storage medium |
| CN110988738A (en) * | 2019-12-13 | 2020-04-10 | 华显光电技术（惠州）有限公司 | Multi-interface open-short circuit test circuit and device |
| CN111929565A (en) * | 2020-08-12 | 2020-11-13 | 上海龙旗科技股份有限公司 | Test circuit board opens short-circuit device |
| CN113726742A (en) * | 2021-07-30 | 2021-11-30 | 昆山丘钛微电子科技股份有限公司 | Test authentication method, device, electronic equipment and medium |
| CN113726742B (en) * | 2021-07-30 | 2023-07-21 | 昆山丘钛微电子科技股份有限公司 | Test authentication method, device, electronic equipment and medium |
| CN114859210A (en) * | 2022-04-22 | 2022-08-05 | 上海研鼎信息技术有限公司 | CMOS chip open-short circuit test system and test method |
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Address after: No.3, Taihong Road, Kunshan high tech Industrial Development Zone, Suzhou, Jiangsu Province, 215300 Patentee after: Kunshan Qiuti Microelectronics Technology Co.,Ltd. Address before: 215300 No. 2588, Huanqing Road, Yushan Town, Kunshan City, Suzhou City, Jiangsu Province Patentee before: KUNSHAN Q TECHNOLOGY Co.,Ltd. |
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