CN111929565A - Test circuit board opens short-circuit device - Google Patents
Test circuit board opens short-circuit device Download PDFInfo
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- CN111929565A CN111929565A CN202010808718.9A CN202010808718A CN111929565A CN 111929565 A CN111929565 A CN 111929565A CN 202010808718 A CN202010808718 A CN 202010808718A CN 111929565 A CN111929565 A CN 111929565A
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- Prior art keywords
- chip microcomputer
- selection switch
- short circuit
- circuit board
- circuit
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/54—Testing for continuity
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
The application discloses test circuit board opens short-circuit device includes: the single-chip microcomputer control circuit comprises a single-chip microcomputer, a first multiple-selection switch and a second multiple-selection switch, wherein two groups of control interfaces of the single-chip microcomputer are respectively connected with the first multiple-selection switch and the second multiple-selection switch, the common end of the first multiple-selection switch is grounded, and the common end of the second multiple-selection switch is connected with an AD (analog-to-digital) functional pin of the single-chip microcomputer. Compared with the prior art, the method and the device solve the problem of short circuit misjudgment of the circuit welded with the IC device, reduce the outflow of defective products, and reduce the cost of manpower maintenance due to misjudgment; this application can test the short circuit of opening of 2 at least circuits simultaneously, and the practicality is strong, and the degree of accuracy is high.
Description
Technical Field
This application belongs to circuit board test technical field, specifically speaking is a test circuit board opens short circuit device.
Background
The electronic product control panel usually comprises electronic components welded on a PCB, and the circuit board often appears open circuit or short circuit in the manufacturing process in the production process, and the phenomenon of missing welding or continuous tin also often appears when welding the electronic components, and these phenomena can cause the control panel to use unusually, in order to avoid the defective products to flow out, need open circuit the short circuit test to it in order to intercept the defective products. Fig. 1 shows an existing open-short circuit test scheme, two ends of a tested object are connected to two groups of IO ports of a single chip, one IO port inputs a low level, and then the other IO port receives the low level or the high level to judge whether a path or an open circuit is formed, and then a group of lines in the middle are set to input a high level at the IO ports at two ends, two ends of an upper group of lines and a lower group of lines adjacent to the group of lines input a low level, and after a program is run, when the single chip detects that the IO ports at two ends of the group of lines receive a high level, it is described that there is no short circuit between the groups of lines, otherwise, the short circuit occurs. However, this method is not suitable for the case where IC devices are soldered on the line, and when a short circuit is tested, the high level may be pulled down when passing through the IC devices, thereby affecting the determination.
Disclosure of Invention
In view of the above-mentioned shortcomings or drawbacks of the prior art, the present application provides a testing circuit board open/short circuit device.
In order to solve the technical problem, the application is realized by the following technical scheme:
the application provides a short-circuit device is opened to test circuit board includes: the single-chip microcomputer control circuit comprises a single-chip microcomputer, a first multiple-selection switch and a second multiple-selection switch, wherein two groups of control interfaces of the single-chip microcomputer are respectively connected with the first multiple-selection switch and the second multiple-selection switch, the common end of the first multiple-selection switch is grounded, and the common end of the second multiple-selection switch is connected with an AD (analog-to-digital) functional pin of the single-chip microcomputer.
Further, the test circuit board open-short circuit device further comprises a display device, and the display device is in communication connection with the single chip microcomputer.
Further, the test circuit board open-short circuit device further comprises an alarm device, and the alarm device is in communication connection with the single chip microcomputer.
Further, in the test circuit board open/short circuit device, the single chip microcomputer is further provided with a program burning interface.
Further, in the test circuit board open/short circuit device, a 5V voltage is also connected to a connection line between the common terminal of the second one-of-more switch and the AD functional pin of the single chip microcomputer.
Further, in the above test circuit board open/short circuit device, a resistor is further connected in series to the connection line.
Further, in the test circuit board open/short circuit device, the single chip microcomputer is an AD conversion single chip microcomputer.
Compared with the prior art, the method has the following technical effects:
the method and the device solve the problem of short circuit misjudgment of the circuit welded with the IC device, reduce the outflow of defective products, and simultaneously reduce the cost of manpower maintenance due to misjudgment; this application can test the short circuit of opening of 2 at least circuits simultaneously, and the practicality is strong, and the degree of accuracy is high.
Drawings
Other features, objects and advantages of the present application will become more apparent upon reading of the following detailed description of non-limiting embodiments thereof, made with reference to the accompanying drawings in which:
FIG. 1: the structure schematic diagram of the existing open-short circuit test scheme;
FIG. 2: the application tests the structure schematic diagram of the open-short circuit device of the circuit board.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
In the description of the present application, unless expressly stated or limited otherwise, the terms "connected," "connected," and "fixed" are to be construed broadly, e.g., as meaning permanently connected, removably connected, or integral to one another; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meaning of the above terms in the present application can be understood in a specific case by those of ordinary skill in the art.
In this application, unless expressly stated or limited otherwise, the first feature "on" or "under" the second feature may comprise direct contact of the first and second features, or may comprise contact of the first and second features not directly but through another feature in between. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.
In the description of the present embodiment, the terms "upper", "lower", "right", etc. are used in an orientation or positional relationship based on that shown in the drawings only for convenience of description and simplicity of operation, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be construed as limiting the present application. Furthermore, the terms "first" and "second" are used only for descriptive purposes and are not intended to have a special meaning.
In one embodiment of the present application, as shown in fig. 2, a test circuit board open/short circuit device includes: the single-chip microcomputer control circuit comprises a single-chip microcomputer 10, a first multiple-selection switch 50 and a second multiple-selection switch 51, wherein two groups of control interfaces of the single-chip microcomputer 10 are respectively connected with the first multiple-selection switch 50 and the second multiple-selection switch 51, the common end of the first multiple-selection switch 50 is grounded, and the common end of the second multiple-selection switch 51 is connected with an AD (analog-to-digital) functional pin of the single-chip microcomputer 10. This embodiment is through configuring two switches of selecting more and being connected with singlechip 10, can test the short circuit of opening of 2 at least circuits simultaneously, and the practicality is strong, and the degree of accuracy is high, has solved the short circuit misjudgement problem that has IC class device circuit in the circuit welding, has reduced the outflow of defective products, has also reduced simultaneously because of the misjudgement invests in the cost that the manpower overhauld.
The single chip microcomputer 10 is an AD conversion single chip microcomputer, that is, the single chip microcomputer 10 has an AD conversion function.
Further, for conveniently showing which specific line is open circuit and which line is short circuit, this embodiment still includes display device 30, display device 30 with singlechip 10 communication connection, wherein, foretell communication connection can be through the cable connection, also can be through prior art realization communication connection such as WIFI, infrared or bluetooth. With the above display device 30 configured, the present embodiment can specifically display the test results, such as open circuit of lines 1, 2, and 3, short circuit of lines 4 and 5, and short circuit of lines 6 and 7. The above description only illustrates one of the possible test results, and the number and naming manner of the above-mentioned lines may be appropriately adjusted and changed according to the circumstances, which does not limit the scope of protection of the present application. Further, the present embodiment further includes an alarm device 40, and the alarm device 40 is in communication connection with the single chip microcomputer 10. By arranging the alarm device 40, alarm prompt can be performed when a short circuit condition occurs; alternatively, different alarm sound modes can be set, for example, when a first sound is prompted, the prompt line is in a short-circuit state, when a second sound is prompted, the prompt line is in an open-circuit state, and the like. Of course, for convenient use, the alarm prompt can be set only for abnormal conditions.
The communication connection mode can also be a cable connection mode, and can also be a communication connection mode realized through the prior art such as WIFI, infrared or Bluetooth.
In this embodiment, the single chip microcomputer 10 is further provided with a program burning interface 20 for writing a program for controlling the one-out-of-multiple switch and a program for detecting an open circuit of the single chip microcomputer 10.
5V voltage is connected to the connection wire of the common end of the second one-of-many switch 51 and the AD functional pin of the single chip microcomputer 10. Furthermore, a resistor R is connected in series on the connecting wire. The resistance value of the resistor R is determined according to the internal resistance of a tested product and the full offset value of the single chip microcomputer 10AD, and the series resistor R plays a voltage dividing role in a circuit to ensure that a test feedback value is within the range of the full offset value of the AD.
In this embodiment, the first multiple-choice switch 50 and the second multiple-choice switch 51 are preferably provided with at least one interface, wherein, for example, the first multiple-choice switch 50 and the second multiple-choice switch 51 are provided with 4 interfaces, and the following description is given by way of example, wherein the first multiple-choice switch 50 is provided with a first interface 501, a second interface 502, a third interface 503 and a fourth interface 504, and the second multiple-choice switch 51 is provided with a fifth interface 511, a sixth interface 512, a seventh interface 513 and an eighth interface 514.
The method comprises the steps that D1 of wires D1-E1, D2-E2, D3-E3 and D4-E4 on a tested module X are connected with a first interface 501 of a first multi-selection switch 50 in a terminating mode, E1 is connected with a fifth interface 511 of a second multi-selection switch 51 in a terminating mode, D2 is connected with a second interface 502 of the first multi-selection switch 50 in a terminating mode, E2 is connected with a sixth interface 512 of the second multi-selection switch 51 in a terminating mode, D3 is connected with a third interface 503 of the first multi-selection switch 50 in a terminating mode, E3 is connected with a seventh interface 513 of the second multi-selection switch 51 in a terminating mode, D4 is connected with a fourth interface 504 of the first multi-selection switch 50 in a terminating mode, and E4 is connected with an eighth interface 514 of the second multi-selection switch 51 in a terminating mode. The number of the interfaces on the two one-out-of-multiple switches is not limited to 4, and more wires can be tested on the basis of the permission of the one-out-of-multiple switch interface.
The process of testing the wires in this example is as follows:
firstly, a program for controlling a multi-selection switch and a program for detecting open circuit of the single chip microcomputer 10 is written through a program burning interface 20 on the single chip microcomputer 10, the programs are input into the single chip microcomputer 10 to be controlled, 5V voltage is connected to a first multi-selection switch 51 end, the open circuit detection program is initialized and executed, the single chip microcomputer 10 controls a first multi-selection switch 50 and a second multi-selection switch 51 to be sequentially and synchronously connected with corresponding switches, (for example, when the first multi-selection switch 50 is connected to a first interface 501, the second multi-selection switch 51 is connected to a fourth interface 511, and so on, when the first multi-selection switch 50 is connected to a fourth interface 504, the second multi-selection switch 51 is connected to the fourth interface 514), at the moment, connection selection of the multi-selection switches according to the program control is sequentially formed through a grounding loop of a wire D1-E1, a D2-E2, a D3-E3, a D4-E4 and the first multi-selection switch 50, the single chip microcomputer 10 is started to read the AD conversion result, and the measured value under the state of no open circuit and open circuit is verified as the reference value according to the actual product, so that the circuit is judged to have no open circuit phenomenon when the AD reading value is lower than the reference value, and is judged to be open circuit when the AD reading value is higher than the reference value, at the moment, the single chip microcomputer 10 outputs a signal interface to be connected with the alarm device 40 to output an alarm signal, and the display device 30 displays an open circuit bit number.
After the open circuit detection is finished, the program for controlling the one-more-selection switch and the program for detecting the open circuit of the single chip microcomputer 10 are written through the program burning interface 20 of the single chip microcomputer 10 again, the program is input into the single chip microcomputer 10 to be controlled, 5V voltage is connected to the end of the first one-more-selection switch 51, the short circuit detection program is initialized and executed, when whether the short circuit phenomenon exists between the test lead D1-E1 and the other leads or not is detected, the single chip microcomputer 10 controls the second one-more-selection switch 51 to be connected to the fourth interface 511, the first one-more-selection switch 50 is sequentially connected to the second interface 502, the third interface 503 and the fourth interface 504 to be detected, when the short circuit phenomenon exists between the test lead D2-E2 and the other leads or not is detected, the single chip microcomputer 10 controls the second one-more-selection switch 51 to be connected to the sixth interface 512, the first one-more-selection switch 50 is sequentially connected to the third, by analogy, when the lead D3-E3 and the rest of the leads are tested to be short-circuited, the singlechip 10 controls the second one-out-of-multiple switch 51 to be connected to the seventh interface 513, the first one-out-of-multiple switch 50 is sequentially connected to the fourth interface 504 to be tested, the singlechip 10 is started to read the AD conversion result, the measured value under the conditions that the short circuit is not generated and the short circuit is generated is verified to be used as a reference value according to the actual product, therefore, the short circuit is judged to be not generated when the AD read value is higher than the reference value, the short circuit is judged to be generated when the AD read value is lower than the reference value (if the tested lead is short-circuited with the rest of the leads, a loop is formed), at the moment, the singlechip 10 outputs a signal interface to be.
The method and the device solve the problem of short circuit misjudgment of the circuit welded with the IC device, reduce the outflow of defective products, and simultaneously reduce the cost of manpower maintenance due to misjudgment; this application can test the open short circuit of two at least circuits simultaneously, and the practicality is strong, and the degree of accuracy is high.
The above embodiments are merely to illustrate the technical solutions of the present application and are not limitative, and the present application is described in detail with reference to preferred embodiments. It will be understood by those skilled in the art that various modifications and equivalent arrangements may be made in the present invention without departing from the spirit and scope of the present invention and shall be covered by the appended claims.
Claims (7)
1. The utility model provides a test circuit board opens short-circuit device which characterized in that includes: the single-chip microcomputer control circuit comprises a single-chip microcomputer, a first multiple-selection switch and a second multiple-selection switch, wherein two groups of control interfaces of the single-chip microcomputer are respectively connected with the first multiple-selection switch and the second multiple-selection switch, the common end of the first multiple-selection switch is grounded, and the common end of the second multiple-selection switch is connected with an AD (analog-to-digital) functional pin of the single-chip microcomputer.
2. The test circuit board open and short circuit device of claim 1, further comprising a display device, wherein the display device is in communication connection with the single chip microcomputer.
3. The test circuit board open and short circuit device of claim 1, further comprising an alarm device, wherein the alarm device is in communication connection with the single chip microcomputer.
4. The test circuit board open/short circuit device according to claim 1, wherein the single chip is further provided with a program burning interface.
5. The test circuit board open/short circuit device according to any one of claims 1 to 4, wherein a 5V voltage is further connected to a connection between the common terminal of the second one-of-many switch and the AD functional pin of the single chip microcomputer.
6. The test circuit board open-short circuit device according to claim 5, wherein a resistor is connected in series with the connection line.
7. The test circuit board open and short circuit device according to any one of claims 1 to 4, wherein the single chip microcomputer is an AD conversion single chip microcomputer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010808718.9A CN111929565A (en) | 2020-08-12 | 2020-08-12 | Test circuit board opens short-circuit device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010808718.9A CN111929565A (en) | 2020-08-12 | 2020-08-12 | Test circuit board opens short-circuit device |
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| Publication Number | Publication Date |
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| CN111929565A true CN111929565A (en) | 2020-11-13 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202010808718.9A Pending CN111929565A (en) | 2020-08-12 | 2020-08-12 | Test circuit board opens short-circuit device |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103076530A (en) * | 2012-12-28 | 2013-05-01 | 昆山丘钛微电子科技有限公司 | Automatic open short circuit test system for CMOS (Complementary Metal-Oxide-Semiconductor Transistor) chip and test method |
| CN103969545A (en) * | 2014-05-08 | 2014-08-06 | 江苏联康电子有限公司 | Device for testing open circuit and short circuit by means of chip protection diode |
| CN204256086U (en) * | 2014-10-31 | 2015-04-08 | 王文娟 | A kind of open circuit short-circuit test device of wiring board |
| CN207586343U (en) * | 2017-12-26 | 2018-07-06 | 深圳市派捷电子科技有限公司 | A kind of wiring board open-short circuit device |
| CN208421123U (en) * | 2018-08-03 | 2019-01-22 | 中国航空工业集团公司雷华电子技术研究所 | A kind of high density electrical connector assembly short-circuit test device |
-
2020
- 2020-08-12 CN CN202010808718.9A patent/CN111929565A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103076530A (en) * | 2012-12-28 | 2013-05-01 | 昆山丘钛微电子科技有限公司 | Automatic open short circuit test system for CMOS (Complementary Metal-Oxide-Semiconductor Transistor) chip and test method |
| CN103969545A (en) * | 2014-05-08 | 2014-08-06 | 江苏联康电子有限公司 | Device for testing open circuit and short circuit by means of chip protection diode |
| CN204256086U (en) * | 2014-10-31 | 2015-04-08 | 王文娟 | A kind of open circuit short-circuit test device of wiring board |
| CN207586343U (en) * | 2017-12-26 | 2018-07-06 | 深圳市派捷电子科技有限公司 | A kind of wiring board open-short circuit device |
| CN208421123U (en) * | 2018-08-03 | 2019-01-22 | 中国航空工业集团公司雷华电子技术研究所 | A kind of high density electrical connector assembly short-circuit test device |
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