CN110988738A - Multi-interface open-short circuit test circuit and device - Google Patents
Multi-interface open-short circuit test circuit and device Download PDFInfo
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Abstract
The invention provides a multi-interface open-short circuit test circuit and a device, wherein the circuit comprises a first connector, a second connector and a display module; the display module is used for being connected with a second interface of the circuit board to be tested through a second connector; the first connector is used for receiving the display data signal that the mobile industry processor interface sent, and loop through first interface with the display data signal, second interface and second connector transmission to display module assembly, whether can loop through first connector through detecting the display data signal, first interface, the second interface transmits to display module assembly, whether appear welding abnormal conditions in order to measure the accurate measurement to detect between first interface and the second interface through judging whether display module assembly appears the black screen phenomenon promptly, do benefit to the measurement judgement of producing line staff to the circuit board that awaits measuring, need not to set up a plurality of LED lamp pearls again, and the cost is tested in the saving, and the detection efficiency is promoted.
Description
Technical Field
The invention relates to the technical field of test circuits, in particular to a multi-interface open-short circuit test circuit and a multi-interface open-short circuit test device.
Background
Along with the continuous development of electronic consumer products, consumers prefer electronic consumer products with high screen occupation ratio, light weight, thinness and high endurance, and in order to meet the requirements of high screen occupation ratio, light weight and high endurance, the related design must be compact to avoid more spaces, so that the main FPC (Flexible Printed Circuit) connected with the display screen at present only plays a role in transmitting display signals and also plays a role in transmitting other non-display signals on the mainboard. Therefore, people pay more and more attention to the welding quality of the FPC connector, when the FPC connector has poor soldering, tin connection or open circuit and other welding abnormalities, some functional failures of products can be caused, such defects are more and difficult to detect, the traditional method for testing the poor welding of the FPC connector is to confirm the open circuit or short circuit conditions of a circuit and a circuit part by serially connecting LED (Light Emitting Diode) lamps, but because the pins of each FPC connector are required to be serially connected with one LED lamp, the measurement cost is high, judgment is difficult, the LED lamps are easy to damage, and material waste is caused.
Disclosure of Invention
Therefore, it is necessary to provide a multi-interface open/short circuit testing circuit and device for solving the problem that the conventional open/short circuit testing device detects an open circuit or a short circuit by serially connecting LED lamps, which results in high cost and is difficult to determine.
A multi-interface open-short circuit test circuit comprises a first connector, a second connector and a display module; the first connector is respectively used for being connected with a mobile industry processor interface of a display signal source and a first interface of a circuit board to be tested, and the display module is used for being connected with a second interface of the circuit board to be tested through the second connector; the first connector is used for receiving a display data signal sent by the interface of the mobile industry processor and transmitting the display data signal to the display module through the first interface, the second interface and the second connector in sequence.
The multi-interface open-short circuit test circuit is characterized in that the first connector is respectively connected with the interface of the mobile industrial processor and the first interface of the circuit board to be tested, the display module is connected with the second interface of the circuit board to be tested through the second connector, the interface of the mobile industrial processor of the display signal source is used for outputting display data signals, when abnormal welding exists between the first interface and the second interface of the circuit board to be tested, such as open circuit or short circuit, the display module cannot normally receive the display data signals, the display module cannot normally display, when the welding between the first interface and the second interface of the circuit board to be tested is normal, the display module can normally display, and thus, whether abnormal welding between the first interface and the second interface of the circuit board to be tested can be accurately measured by judging whether the display module can normally display, and measurement and judgment of the circuit board to be tested by production line staff are facilitated, and need not to set up a plurality of LED lamp pearls, practice thrift the test cost, promote detection efficiency.
In one embodiment, the pin number of the first connector is equal to the pin number of the first interface; the pin number of the second connector is equal to the pin number of the second interface.
In one embodiment, when the number N of pins of the first connector is less than the number M of interfaces of the mobile industry processor interface, the N pins of the first connector are used for being connected with N interfaces of the mobile industry processing interface in a one-to-one correspondence manner, and the display module is used for being connected with the remaining M-N interfaces of the mobile industry processing interface.
In one embodiment, when the number of pins of the first connector is equal to the number of ports of the mobile industry processor interface, the pins of the first connector are used for one-to-one connection with the mobile industry processor interface.
In one embodiment, the multi-interface open-short test circuit further comprises a third connector, and the first connector is used for connecting with the mobile industry processing interface through the third connector.
In one embodiment, the display module is further configured to connect to a communication interface of the display signal source other than the mobile industry processing interface.
In one embodiment, the display module is further configured to be connected to the communication interface through the third connector.
In one embodiment, the multi-interface open/short circuit test circuit further includes a fourth connector, and the second connector is connected to the display module through the fourth connector.
In one embodiment, the display module is further configured to be connected to the communication interface sequentially through the fourth connector and the third connector.
In one embodiment, a multi-interface open/short circuit testing device includes the multi-interface open/short circuit testing circuit described in any of the above embodiments
Drawings
FIG. 1 is a block diagram of a multi-interface open/short circuit test circuit according to an embodiment of the present invention;
FIG. 2 is a block diagram of a multi-interface open/short circuit test circuit according to another embodiment of the present invention;
FIG. 3 is a block diagram of a multi-interface open/short test circuit according to another embodiment of the present invention;
FIG. 4 is a diagram of an interface showing a signal source in an embodiment of the present invention;
fig. 5 is a pin diagram of the first connector in one embodiment of the invention.
Detailed Description
To facilitate an understanding of the invention, the invention will now be described more fully with reference to the accompanying drawings. Preferred embodiments of the present invention are shown in the drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
It will be understood that when an element is referred to as being "disposed on" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "left," "right," and the like as used herein are for illustrative purposes only and do not represent the only embodiments.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used herein in the description of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
For example, a multi-interface open short circuit test circuit is provided, which includes a first connector, a second connector and a display module; the first connector is respectively used for being connected with a mobile industry processor interface of a display signal source and a first interface of a circuit board to be tested, and the display module is used for being connected with a second interface of the circuit board to be tested through the second connector; the first connector is used for receiving a display data signal sent by the interface of the mobile industry processor and transmitting the display data signal to the display module through the first interface, the second interface and the second connector in sequence.
The multi-interface open-short circuit test circuit is characterized in that the first connector is respectively connected with the interface of the mobile industrial processor and the first interface of the circuit board to be tested, the display module is connected with the second interface of the circuit board to be tested through the second connector, the interface of the mobile industrial processor of the display signal source is used for outputting display data signals, when abnormal welding exists between the first interface and the second interface of the circuit board to be tested, such as open circuit or short circuit, the display module cannot normally receive the display data signals, the display module cannot normally display, when the welding between the first interface and the second interface of the circuit board to be tested is normal, the display module can normally display, and thus, whether abnormal welding between the first interface and the second interface of the circuit board to be tested can be accurately measured and detected by judging whether the display module can normally display, and measurement and judgment of the circuit board to be tested by production line staff are facilitated, and a plurality of LED lamp beads do not need to be arranged, so that the test cost is saved, and the detection efficiency is improved.
In one embodiment, referring to fig. 1, a multi-interface open/short circuit test circuit 10 includes a first connector 200, a second connector 300 and a display module 400; the first connector 200 is respectively used for connecting with the interface 110 of the mobile industry processor of the display signal source and the first interface 510 of the circuit board 500 to be tested, and the display module 400 is used for connecting with the second interface 520 of the circuit board 500 to be tested through the second connector 300; the first connector 510 is configured to receive a display data signal sent by the mfps interface 110, and transmit the display data signal to the display module 400 through the first interface 510, the second interface 520, and the second connector 300 in sequence.
Specifically, a Mobile Industry Processor Interface, i.e., a Mobile Industry Processor Interface (MIPI), is an open standard and a specification established for a Mobile application Processor initiated by a MIPI alliance, and the MIPI standard is widely applied to various consumer electronics products.
It should be understood that, for the display module assembly, the display module assembly needs to receive the relevant display source in order to carry out normal display, wherein the display data signal is the core signal of display source, MIPI signal when the display module assembly receives appears unusually, can lead to the display module assembly to appear the black screen state, consequently, through the circuit board that awaits measuring as the transmission line that shows data signal, when short circuit or open circuit appear between the first interface of the circuit board that awaits measuring and the second interface, then the display module assembly can't normally receive the display data signal, so that the display module assembly appears the black screen phenomenon, consequently, utilize this principle can accurately to test the open short circuit of the first interface of the circuit board that awaits measuring and second interface.
Specifically, the interface of the mobile industry processor includes ten interfaces, which are CLKN, CLKP, D0N, D0P, D1N, D1P, D2N, D2P, D3N, and D3P, respectively, and respectively output corresponding display data signals, and each interface of the mobile industry processor is connected with the first interface in a one-to-one correspondence manner through the first connector to transmit the display data signals. In this embodiment, the number of pins of the first interface of the circuit board to be tested is less than or equal to the number of interfaces of the interface of the mobile industry processor. In one embodiment, the pin count of the first interface is less than or equal to 10, and in one embodiment, the pin count of the first connector is less than or equal to 10. In one embodiment, the number of pins of the first connector is 5, 6 or 7, and the like.
Specifically, in the present application, a soldering condition of a connector of a Circuit Board to be tested is detected, where the Circuit Board to be tested may be an FPC (flexible Circuit Board) or a PCB (Printed Circuit Board), that is, a soldering condition of the connector on the FPC may be measured, and a soldering condition of the connector on the PCB may also be measured. It should be understood that, in the present application, the testing of the soldering state of the connector on the circuit board may be the testing of the soldering state of one connector on the circuit board, or the testing of the soldering state of a pair of connectors on the circuit board, specifically, when the testing of one connector to be tested on the circuit board is performed, the first interface of the circuit board to be tested may be a pad corresponding to the connector to be tested, and the second interface is a pin of the connector to be tested; in addition, the first interface can be a pin of a connector to be tested, the second interface is a bonding pad corresponding to the connector to be tested, and the connector to be tested is welded on the bonding pad corresponding to the circuit board to be tested. When a pair of connectors to be tested on a circuit board to be tested is tested, namely a first connector to be tested and a second connector to be tested on the circuit board to be tested are tested, the first interface is the first connector to be tested, the second interface is the second connector to be tested, the first connector and the first connector to be tested are connected through a flat cable, the second connector and the second connector to be tested are connected through the flat cable, it can be understood that the FPC usually plays a role in switching, namely two connectors to be tested and two bonding pads are usually arranged on the FPC circuit board, the two connectors to be tested are respectively the first connector to be tested and the second connector to be tested, the two bonding pads are respectively a first bonding pad and a second bonding pad, the first connector to be tested is welded on the first bonding pad, the second connector to be tested is welded on the second bonding pad, and the first bonding pad is connected with the second bonding pad through the inside of the circuit board to be tested, namely, the two connectors to be tested are correspondingly connected one by one, the first connector is connected with the first connector to be tested through a flat cable, the second connector is connected with the second connector to be tested through a flat cable, when the first connector to be tested and the second connector to be tested of the circuit board to be tested are normally welded, the display data signal can be transmitted to the display module through the first connector, the first connector to be tested, the first pad, the second connector to be tested and the second connector in sequence so as to ensure that the display module normally works, when the first interface and the second interface of the circuit board to be tested are abnormally welded, namely when the connector to be tested of the circuit board to be tested is abnormally welded, for example, when a pin of the connector to be tested is tin-connected and falsely welded, the display data signal cannot be transmitted to the display module so as to ensure that the display module has a black screen phenomenon, the abnormal welding condition of the circuit board to be detected is indicated, so that the welding condition of the first interface and the second interface on the circuit board to be detected is detected.
The multi-interface open-short circuit test circuit is characterized in that the first connector is respectively connected with the interface of the mobile industrial processor and the first interface of the circuit board to be tested, the display module is connected with the second interface of the circuit board to be tested through the second connector, the interface of the mobile industrial processor of the display signal source is used for outputting display data signals, when abnormal welding exists between the first interface and the second interface of the circuit board to be tested, such as open circuit or short circuit, the display module cannot normally receive the display data signals, the display module cannot normally display, when the welding between the first interface and the second interface of the circuit board to be tested is normal, the display module can normally display, and thus, whether abnormal welding between the first interface and the second interface of the circuit board to be tested can be accurately measured by judging whether the display module can normally display, and measurement and judgment of the circuit board to be tested by production line staff are facilitated, and need not to set up a plurality of LED lamp pearls, practice thrift the test cost, promote detection efficiency.
In order to facilitate a user to connect a test circuit with a circuit board to be tested, in one embodiment, the number of pins of the first connector is equal to the number of pins of the first interface; the pin number of the second connector is equal to the pin number of the second interface. Specifically, when the pin number of the first connector is equal to the pin number of the first interface of the circuit board to be tested, each pin of the first connector can be connected with the first connector through the flat cable, and similarly, when the pin number of the second connector is equal to the pin number of the second interface of the circuit board to be tested, each pin of the second connector can be connected with the second connector through the flat cable, that is, when the user performs open short circuit test on the interface of the circuit board to be tested, the circuit board to be tested is connected with the test circuit by using the flat cable, so that the test efficiency can be improved. It should be understood that, the number of pins of the first interface is equal to the number of pins of the second interface, and when the number of pins of the first connector is equal to the number of pins of the first interface and the number of pins of the second connector is equal to the number of pins of the second interface, that is, the number of pins of the first connector is equal to the number of pins of the second connector, the first connector and the second connector can adopt flat cables of the same specification when being connected with the first interface and the second interface respectively, so that the flat cables do not need to be distinguished, thereby facilitating the connection of production line staff to a circuit board to be tested and improving the testing efficiency.
In order to enable the multi-interface open/short circuit test circuit to frequently detect the soldering condition of different types of FPC connectors to be tested, in one embodiment, please refer to fig. 2, when the number N of pins of the first connector 200 is less than the number M of interfaces of the mobile industry processor interface 110, the N pins of the first connector 200 are used for being connected with the N interfaces of the mobile industry processor interface 110 in a one-to-one correspondence manner, and the display module 400 is used for being connected with the remaining M-N interfaces of the mobile industry processor interface 110. Specifically, the interface of the mobile industry processor includes ten interfaces, which are CLKN, CLKP, D0N, D0P, D1N, D1P, D2N, D2P, D3N and D3P, respectively, and output corresponding display data signals, and the interfaces of the circuit board to be tested, that is, the types of the connectors on the circuit board to be tested, have multiple types, the pin number of which may not be ten, when the pin number N of the first connector is less than the interface number M of the interface of the mobile industry processor, if only N interfaces in the interface of the mobile industry processor are connected with the first connector, and if the remaining M-N interfaces are disconnected from the display module, no matter whether the circuit board to be tested is normally welded, the display module is in a black screen phenomenon, and therefore, the test for the open short circuit of the interface cannot be performed, therefore, when the pin number N of the first connector is less than the interface number M of the interface number of the interface of the mobile industry processor, and connecting any N interfaces in M interfaces of the mobile industrial processor with the first connector in a one-to-one correspondence manner, and connecting the residual M-N interfaces with the display assembly, so that the residual M-N interfaces are always connected with the display assembly, and therefore, when the pin number N of the first connector is less than the interface number M of the interface of the mobile industrial processor, the interface open short circuit abnormity of the circuit board to be tested is tested, and the multi-interface open short circuit test circuit meets the test of the connectors to be tested with different pin numbers. It should be understood that, for the FPC connector, the number of pins of which is usually less than or equal to ten, the testing of the FPC connector by using the MIPI interface can meet the detection of the soldering condition of the FPC connectors with different specifications and different pins.
In one embodiment, referring to fig. 1, fig. 4 and fig. 5, when the number of pins of the first connector is equal to the number of ports of the mobile industry processor interface, the pins of the first connector are used for one-to-one corresponding connection with the mobile industry processor interface. Specifically, a pin connection diagram of the first connector is shown in fig. 5, a port diagram of the mobile industry processing interface in the display signal source is shown in fig. 4, and when the number of pins of the first connector is equal to the number of ports of the mobile industry processing interface, the mobile industry processing interface only needs to be connected with the pins of the first connector in a one-to-one correspondence manner, that is, the pins of the first connector are respectively connected with the CLKN, CLKP, D0N, D0P, D1N, D1P, D2N, D2P, D3N, and D3P interfaces in the mobile industry processing interface in a one-to-one correspondence manner, so that all display data signals output by the mobile industry processor can be transmitted to the display module through the first connector, the first interface, the second interface, and the third interface, so as to detect the welding conditions of the first interface and the second interface on the circuit board to be detected.
In order to facilitate the connection between the signal source and the multi-interface open/short circuit test circuit, in one embodiment, referring to fig. 3, the multi-interface open/short circuit test circuit 10 further includes a third connector 600, and the first connector 200 is configured to be connected to the mobile industry processing interface 110 through the third connector 600. It should be understood that, as shown in fig. 4, the display signal source has other data interfaces besides the mobile industry processing interface, where the mobile industry processing interface includes interfaces CLKN, CLKP, D0N, D0P, D1N, D1P, D2N, D2P, D3N, and D3P, and the interfaces of the mobile industry processing interface are not sequentially arranged in the display signal source, so that, by providing a third connector, the third connector is connected to the first connector, and the interface type of the third connector matches the interface type of the display signal source, the user can transmit the display data signal output by the mobile industry processing interface to the first connector by connecting the display signal source to the third connector, thereby facilitating the user to source the display signal from the multi-interface open-short circuit test circuit connection.
In order to further improve the accuracy of the multi-interface open/short circuit test circuit detection, in one embodiment, referring to fig. 3, the display module 400 is further configured to be connected to the communication interface 120 of the display signal source 100 except for the mh 110. Specifically, when the display module normally displays, in addition to the display data signal of the interface of the mobile industrial processor, the display module also needs to receive other communication signals, such as a RESET signal, a TE signal, a TP _ SCL signal, and a TP _ SDA signal, so that the display module works better, and further, the production line staff can judge whether the first interface and the second interface of the circuit board to be tested are open or short. It should be understood that the display data signal output by the mobile industrial processor is a core signal that directly affects whether the display module is black, and as long as any display data signal output by the interface of the mobile industrial processor is abnormal, the display module is black, and more communication interfaces in the display signal source except the interface of the mobile industrial processor affect the display picture of the display module, even some communication interfaces are missing, and the display of the picture of the display module is not affected.
In one embodiment, referring to fig. 3, the display module 400 is further configured to be connected to the communication interface 120 through the third connector 600. Specifically, the third connector has a first pin and a second pin, the first connector is used for interfacing with the mobile industry processor through the first pin of the third connector, and the display module is further used for interfacing with the communication interface through the second pin of the third connector. Further, in one embodiment, the display module is disposed on a test circuit board, the test circuit board is provided with a third pad, the third connector is soldered on the third pad, and the display module is connected to the third pad through an internal trace of the test circuit board, so that the third connector is connected to the communication interface. It should be understood that the third interface is matched with the interface of the display signal source, and when a user or a detector sets up the multi-interface open-short circuit test circuit, the user or the detector only needs to butt the display signal source with the third connector, so that the multi-interface open-short circuit test circuit can receive signals sent by the display signal source.
In one embodiment, referring to fig. 3, the multi-interface open/short circuit testing circuit 10 further includes a fourth connector 700, and the second connector 300 is connected to the display module 400 through the fourth connector 700. Specifically, the second connector is welded on the test circuit board, the second connector is connected with the fourth connector through the internal wiring of the test circuit board, namely the second connector is connected with the second interface through a flat cable, and the fourth connector is connected with the display assembly through the flat cable, so that the multi-interface open-short circuit test circuit can be further conveniently built.
In one embodiment, referring to fig. 4, the display module 400 is further configured to be connected to the communication interface 120 sequentially through the fourth connector 700 and the third connector 600. Specifically, the fourth connector further receives other display data sent by the communication interface of the display signal source through the third connector, that is, the display module can receive a required display signal through the fourth connector, so that the flat cable of the display module is connected with the fourth connector, so as to facilitate the setting of the display module in the test circuit.
The following is a specific embodiment, a multi-interface open-short circuit test circuit, which includes a first connector, a second connector, a third connector, a fourth connector and a display module; the first connector is used for being connected with a mobile industry processing interface of a display signal source through the third connector, the first connector is used for being connected with a first interface of a circuit board to be tested, and the display module is used for being connected with a second interface of the circuit board to be tested sequentially through the fourth connector and the second connector; the display module is further configured to be connected to the communication interface sequentially through the fourth connector and the third connector, when the number of pins N of the first connector is less than the number of interfaces M of the mobile industry processor interface, the N pins of the first connector are configured to be connected to the N interfaces of the mobile industry processor interface in a one-to-one correspondence manner, and the display module is configured to be connected to the remaining M-N interfaces of the mobile industry processor interface; when the number of the pins of the first connector is equal to the number of the ports of the mobile industry processor interface, the pins of the first connector are used for being connected with the mobile industry processor interface in a one-to-one correspondence manner; the third connector is used for receiving a display data signal sent by the interface of the mobile industry processor and transmitting the display data signal to the display module through the first connector, the first interface, the second connector and the fourth connector in sequence.
In one embodiment, a multi-interface open/short circuit testing apparatus is provided, which includes the multi-interface open/short circuit testing circuit described in any of the above embodiments. In one embodiment, the multi-interface open/short circuit test circuit includes: comprises a first connector, a second connector and a display module; the first connector is respectively used for being connected with a mobile industry processor interface of a display signal source and a first interface of a circuit board to be tested, and the display module is used for being connected with a second interface of the circuit board to be tested through the second connector; the first connector is used for receiving a display data signal sent by the interface of the mobile industry processor and transmitting the display data signal to the display module through the first interface, the second interface and the second connector in sequence. In one embodiment, the multi-interface open/short circuit testing apparatus further includes a testing circuit board, and the first connector, the second connector and the display module are disposed on the testing circuit board.
The multi-interface open-short circuit testing device is characterized in that the first connector is respectively connected with the interface of the mobile industrial processor and the first interface of the circuit board to be tested, the display module is connected with the second interface of the circuit board to be tested through the second connector, the interface of the mobile industrial processor of the display signal source is used for outputting display data signals, when abnormal welding exists between the first interface and the second interface of the circuit board to be tested, such as open circuit or short circuit, the display module cannot normally receive the display data signals, the display module cannot normally display, when the welding between the first interface and the second interface of the circuit board to be tested is normal, the display module can normally display, therefore, whether abnormal welding between the first interface and the second interface of the circuit board to be tested can be accurately measured by judging whether the display module can normally display, and measurement and judgment of the circuit board to be tested by production line staff are facilitated, and need not to set up a plurality of LED lamp pearls, practice thrift the test cost, promote detection efficiency.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. A multi-interface open short circuit test circuit is characterized by comprising a first connector, a second connector and a display module;
the first connector is respectively used for being connected with a mobile industry processor interface of a display signal source and a first interface of a circuit board to be tested, and the display module is used for being connected with a second interface of the circuit board to be tested through the second connector;
the first connector is used for receiving a display data signal sent by the interface of the mobile industry processor and transmitting the display data signal to the display module through the first interface, the second interface and the second connector in sequence.
2. The multi-interface open-short test circuit of claim 1, wherein the number of pins of the first connector is equal to the number of pins of the first interface; the pin number of the second connector is equal to the pin number of the second interface.
3. The multi-interface open-short circuit test circuit according to claim 2, wherein when the number of pins N of the first connector is smaller than the number of interfaces M of the mh interface, the N pins of the first connector are configured to be connected to N interfaces of the mh interface in a one-to-one correspondence, and the display module is configured to be connected to the remaining M-N interfaces of the mh interface.
4. The multi-interface open-short test circuit of claim 2, wherein when the number of pins of the first connector is equal to the number of ports of the mh, the pins of the first connector are used for one-to-one connection with the mh.
5. The multi-interface open-short test circuit of any one of claims 1-4, further comprising a third connector, wherein the first connector is configured to connect to the FAP interface through the third connector.
6. The multi-interface open-short circuit test circuit of claim 5, wherein the display module is further configured to connect to a communication interface of the display signal source other than the MOL processing interface.
7. The multi-interface open-short test circuit of claim 6, wherein the display module is further configured to be connected to the communication interface through the third connector.
8. The multi-interface open-short test circuit of claim 6, further comprising a fourth connector, wherein the second connector is connected to the display module through the fourth connector.
9. The multi-interface open-short circuit test circuit of claim 8, wherein the display module is further configured to be connected to the communication interface sequentially through the fourth connector and the third connector.
10. A multi-interface open-short test apparatus comprising the multi-interface open-short test circuit as claimed in any one of claims 1 to 9.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911282717.9A CN110988738A (en) | 2019-12-13 | 2019-12-13 | Multi-interface open-short circuit test circuit and device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911282717.9A CN110988738A (en) | 2019-12-13 | 2019-12-13 | Multi-interface open-short circuit test circuit and device |
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| CN110988738A true CN110988738A (en) | 2020-04-10 |
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| CN201911282717.9A Pending CN110988738A (en) | 2019-12-13 | 2019-12-13 | Multi-interface open-short circuit test circuit and device |
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